KR920017023U - - Google Patents

Info

Publication number
KR920017023U
KR920017023U KR910013444U KR910013444U KR920017023U KR 920017023 U KR920017023 U KR 920017023U KR 910013444 U KR910013444 U KR 910013444U KR 910013444 U KR910013444 U KR 910013444U KR 920017023 U KR920017023 U KR 920017023U
Authority
KR
South Korea
Application number
KR910013444U
Other versions
KR0134059Y1 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP3021219A external-priority patent/JP2884788B2/ja
Application filed filed Critical
Publication of KR920017023U publication Critical patent/KR920017023U/ko
Application granted granted Critical
Publication of KR0134059Y1 publication Critical patent/KR0134059Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/62—Testing of transformers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Relating To Insulation (AREA)
KR2019910013444U 1991-02-15 1991-08-23 수지모울드 변압기의 부분방전 측정장치 KR0134059Y1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP3021219A JP2884788B2 (ja) 1991-02-15 1991-02-15 樹脂モールド変圧器の部分放電測定装置
JP3-21219 1991-02-15
KR1019910012476 1991-07-22

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
KR1019910012476 Division 1991-02-15 1991-07-22

Publications (2)

Publication Number Publication Date
KR920017023U true KR920017023U (ko) 1992-09-17
KR0134059Y1 KR0134059Y1 (ko) 1999-03-30

Family

ID=26358260

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019910013444U KR0134059Y1 (ko) 1991-02-15 1991-08-23 수지모울드 변압기의 부분방전 측정장치

Country Status (1)

Country Link
KR (1) KR0134059Y1 (ko)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100473623B1 (ko) * 2002-11-12 2005-03-11 한국전기연구원 부분 방전 측정 센서 및 이를 사용한 회전기
WO2009017275A1 (en) * 2007-07-31 2009-02-05 Kp Electric Co., Ltd. Self-examination type cast resin transformer
CN115128534A (zh) * 2022-06-28 2022-09-30 苏州纳芯微电子股份有限公司 电流传感器空洞缺陷的检测方法及检测系统

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100473623B1 (ko) * 2002-11-12 2005-03-11 한국전기연구원 부분 방전 측정 센서 및 이를 사용한 회전기
WO2009017275A1 (en) * 2007-07-31 2009-02-05 Kp Electric Co., Ltd. Self-examination type cast resin transformer
CN115128534A (zh) * 2022-06-28 2022-09-30 苏州纳芯微电子股份有限公司 电流传感器空洞缺陷的检测方法及检测系统
CN115128534B (zh) * 2022-06-28 2023-12-05 苏州纳芯微电子股份有限公司 电流传感器空洞缺陷的检测方法及检测系统

Also Published As

Publication number Publication date
KR0134059Y1 (ko) 1999-03-30

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Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20011010

Year of fee payment: 4

LAPS Lapse due to unpaid annual fee