KR920015760U - Memory device inspection circuit - Google Patents

Memory device inspection circuit

Info

Publication number
KR920015760U
KR920015760U KR2019910000175U KR910000175U KR920015760U KR 920015760 U KR920015760 U KR 920015760U KR 2019910000175 U KR2019910000175 U KR 2019910000175U KR 910000175 U KR910000175 U KR 910000175U KR 920015760 U KR920015760 U KR 920015760U
Authority
KR
South Korea
Prior art keywords
memory device
inspection circuit
device inspection
circuit
memory
Prior art date
Application number
KR2019910000175U
Other languages
Korean (ko)
Other versions
KR970007073Y1 (en
Inventor
김관우
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019910000175U priority Critical patent/KR970007073Y1/en
Publication of KR920015760U publication Critical patent/KR920015760U/en
Application granted granted Critical
Publication of KR970007073Y1 publication Critical patent/KR970007073Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31715—Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
KR2019910000175U 1991-01-09 1991-01-09 Test circuit of memory device KR970007073Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019910000175U KR970007073Y1 (en) 1991-01-09 1991-01-09 Test circuit of memory device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019910000175U KR970007073Y1 (en) 1991-01-09 1991-01-09 Test circuit of memory device

Publications (2)

Publication Number Publication Date
KR920015760U true KR920015760U (en) 1992-08-17
KR970007073Y1 KR970007073Y1 (en) 1997-07-15

Family

ID=19309545

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019910000175U KR970007073Y1 (en) 1991-01-09 1991-01-09 Test circuit of memory device

Country Status (1)

Country Link
KR (1) KR970007073Y1 (en)

Also Published As

Publication number Publication date
KR970007073Y1 (en) 1997-07-15

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