KR920015712U - Semiconductor integrated circuit using redundancy test - Google Patents

Semiconductor integrated circuit using redundancy test

Info

Publication number
KR920015712U
KR920015712U KR2019910000491U KR910000491U KR920015712U KR 920015712 U KR920015712 U KR 920015712U KR 2019910000491 U KR2019910000491 U KR 2019910000491U KR 910000491 U KR910000491 U KR 910000491U KR 920015712 U KR920015712 U KR 920015712U
Authority
KR
South Korea
Prior art keywords
integrated circuit
semiconductor integrated
redundancy test
redundancy
test
Prior art date
Application number
KR2019910000491U
Other languages
Korean (ko)
Other versions
KR940005119Y1 (en
Inventor
안영창
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019910000491U priority Critical patent/KR940005119Y1/en
Publication of KR920015712U publication Critical patent/KR920015712U/en
Application granted granted Critical
Publication of KR940005119Y1 publication Critical patent/KR940005119Y1/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/30—Accessing single arrays
    • G11C29/34—Accessing multiple bits simultaneously
KR2019910000491U 1991-01-15 1991-01-15 Semiconductor ic with easy redundancy test KR940005119Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019910000491U KR940005119Y1 (en) 1991-01-15 1991-01-15 Semiconductor ic with easy redundancy test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019910000491U KR940005119Y1 (en) 1991-01-15 1991-01-15 Semiconductor ic with easy redundancy test

Publications (2)

Publication Number Publication Date
KR920015712U true KR920015712U (en) 1992-08-17
KR940005119Y1 KR940005119Y1 (en) 1994-07-29

Family

ID=19309784

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019910000491U KR940005119Y1 (en) 1991-01-15 1991-01-15 Semiconductor ic with easy redundancy test

Country Status (1)

Country Link
KR (1) KR940005119Y1 (en)

Also Published As

Publication number Publication date
KR940005119Y1 (en) 1994-07-29

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Legal Events

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