KR920009930U - Integrated circuit fault detection circuit by operating current - Google Patents

Integrated circuit fault detection circuit by operating current

Info

Publication number
KR920009930U
KR920009930U KR2019900018247U KR900018247U KR920009930U KR 920009930 U KR920009930 U KR 920009930U KR 2019900018247 U KR2019900018247 U KR 2019900018247U KR 900018247 U KR900018247 U KR 900018247U KR 920009930 U KR920009930 U KR 920009930U
Authority
KR
South Korea
Prior art keywords
fault detection
operating current
integrated circuit
detection circuit
circuit fault
Prior art date
Application number
KR2019900018247U
Other languages
Korean (ko)
Other versions
KR930007965Y1 (en
Inventor
최승욱
Original Assignee
금성산전 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성산전 주식회사 filed Critical 금성산전 주식회사
Priority to KR2019900018247U priority Critical patent/KR930007965Y1/en
Publication of KR920009930U publication Critical patent/KR920009930U/en
Application granted granted Critical
Publication of KR930007965Y1 publication Critical patent/KR930007965Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019900018247U 1990-11-26 1990-11-26 Ic trouble detecting circuit using acting current KR930007965Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019900018247U KR930007965Y1 (en) 1990-11-26 1990-11-26 Ic trouble detecting circuit using acting current

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900018247U KR930007965Y1 (en) 1990-11-26 1990-11-26 Ic trouble detecting circuit using acting current

Publications (2)

Publication Number Publication Date
KR920009930U true KR920009930U (en) 1992-06-17
KR930007965Y1 KR930007965Y1 (en) 1993-11-27

Family

ID=19305888

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900018247U KR930007965Y1 (en) 1990-11-26 1990-11-26 Ic trouble detecting circuit using acting current

Country Status (1)

Country Link
KR (1) KR930007965Y1 (en)

Also Published As

Publication number Publication date
KR930007965Y1 (en) 1993-11-27

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Legal Events

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E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
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FPAY Annual fee payment

Payment date: 20040923

Year of fee payment: 12

EXPY Expiration of term