KR920009927U - Finger of semiconductor device tester - Google Patents

Finger of semiconductor device tester

Info

Publication number
KR920009927U
KR920009927U KR2019900017130U KR900017130U KR920009927U KR 920009927 U KR920009927 U KR 920009927U KR 2019900017130 U KR2019900017130 U KR 2019900017130U KR 900017130 U KR900017130 U KR 900017130U KR 920009927 U KR920009927 U KR 920009927U
Authority
KR
South Korea
Prior art keywords
finger
semiconductor device
device tester
tester
semiconductor
Prior art date
Application number
KR2019900017130U
Other languages
Korean (ko)
Other versions
KR950009612Y1 (en
Inventor
조규근
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019900017130U priority Critical patent/KR950009612Y1/en
Publication of KR920009927U publication Critical patent/KR920009927U/en
Application granted granted Critical
Publication of KR950009612Y1 publication Critical patent/KR950009612Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019900017130U 1990-11-09 1990-11-09 Finger of checker for semiconductor KR950009612Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019900017130U KR950009612Y1 (en) 1990-11-09 1990-11-09 Finger of checker for semiconductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900017130U KR950009612Y1 (en) 1990-11-09 1990-11-09 Finger of checker for semiconductor

Publications (2)

Publication Number Publication Date
KR920009927U true KR920009927U (en) 1992-06-17
KR950009612Y1 KR950009612Y1 (en) 1995-11-08

Family

ID=19305165

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900017130U KR950009612Y1 (en) 1990-11-09 1990-11-09 Finger of checker for semiconductor

Country Status (1)

Country Link
KR (1) KR950009612Y1 (en)

Also Published As

Publication number Publication date
KR950009612Y1 (en) 1995-11-08

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20041018

Year of fee payment: 10

EXPY Expiration of term