KR920006745U - 고장표시회로 - Google Patents

고장표시회로

Info

Publication number
KR920006745U
KR920006745U KR2019900014575U KR900014575U KR920006745U KR 920006745 U KR920006745 U KR 920006745U KR 2019900014575 U KR2019900014575 U KR 2019900014575U KR 900014575 U KR900014575 U KR 900014575U KR 920006745 U KR920006745 U KR 920006745U
Authority
KR
South Korea
Prior art keywords
display circuit
fault display
fault
circuit
display
Prior art date
Application number
KR2019900014575U
Other languages
English (en)
Other versions
KR930001736Y1 (ko
Inventor
임병서
Original Assignee
삼성전관 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전관 주식회사 filed Critical 삼성전관 주식회사
Priority to KR2019900014575U priority Critical patent/KR930001736Y1/ko
Publication of KR920006745U publication Critical patent/KR920006745U/ko
Application granted granted Critical
Publication of KR930001736Y1 publication Critical patent/KR930001736Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G01R13/0218—Circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019900014575U 1990-09-19 1990-09-19 고장표시회로 KR930001736Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019900014575U KR930001736Y1 (ko) 1990-09-19 1990-09-19 고장표시회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900014575U KR930001736Y1 (ko) 1990-09-19 1990-09-19 고장표시회로

Publications (2)

Publication Number Publication Date
KR920006745U true KR920006745U (ko) 1992-04-22
KR930001736Y1 KR930001736Y1 (ko) 1993-04-12

Family

ID=19303622

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900014575U KR930001736Y1 (ko) 1990-09-19 1990-09-19 고장표시회로

Country Status (1)

Country Link
KR (1) KR930001736Y1 (ko)

Also Published As

Publication number Publication date
KR930001736Y1 (ko) 1993-04-12

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Legal Events

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E701 Decision to grant or registration of patent right
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