KR910012295U - 액정 TV의 모듀울(Module) 테스트 장치 - Google Patents

액정 TV의 모듀울(Module) 테스트 장치

Info

Publication number
KR910012295U
KR910012295U KR2019890019747U KR890019747U KR910012295U KR 910012295 U KR910012295 U KR 910012295U KR 2019890019747 U KR2019890019747 U KR 2019890019747U KR 890019747 U KR890019747 U KR 890019747U KR 910012295 U KR910012295 U KR 910012295U
Authority
KR
South Korea
Prior art keywords
lcd
test device
module test
module
test
Prior art date
Application number
KR2019890019747U
Other languages
English (en)
Other versions
KR930001815Y1 (ko
Inventor
정해동
Original Assignee
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자 주식회사 filed Critical 삼성전자 주식회사
Priority to KR2019890019747U priority Critical patent/KR930001815Y1/ko
Publication of KR910012295U publication Critical patent/KR910012295U/ko
Application granted granted Critical
Publication of KR930001815Y1 publication Critical patent/KR930001815Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
KR2019890019747U 1989-12-23 1989-12-23 액정 TV의 모듀울(Module) 테스트 장치 KR930001815Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019890019747U KR930001815Y1 (ko) 1989-12-23 1989-12-23 액정 TV의 모듀울(Module) 테스트 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019890019747U KR930001815Y1 (ko) 1989-12-23 1989-12-23 액정 TV의 모듀울(Module) 테스트 장치

Publications (2)

Publication Number Publication Date
KR910012295U true KR910012295U (ko) 1991-07-30
KR930001815Y1 KR930001815Y1 (ko) 1993-04-15

Family

ID=19293850

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019890019747U KR930001815Y1 (ko) 1989-12-23 1989-12-23 액정 TV의 모듀울(Module) 테스트 장치

Country Status (1)

Country Link
KR (1) KR930001815Y1 (ko)

Also Published As

Publication number Publication date
KR930001815Y1 (ko) 1993-04-15

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