KR900014894A - M. O. F. Automatic imaging detector - Google Patents

M. O. F. Automatic imaging detector Download PDF

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Publication number
KR900014894A
KR900014894A KR1019890004013A KR890004013A KR900014894A KR 900014894 A KR900014894 A KR 900014894A KR 1019890004013 A KR1019890004013 A KR 1019890004013A KR 890004013 A KR890004013 A KR 890004013A KR 900014894 A KR900014894 A KR 900014894A
Authority
KR
South Korea
Prior art keywords
circuit
imaging detector
automatic imaging
automatic
alarm
Prior art date
Application number
KR1019890004013A
Other languages
Korean (ko)
Other versions
KR920000725B1 (en
Inventor
신명균
Original Assignee
신명균
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 신명균 filed Critical 신명균
Priority to KR1019890004013A priority Critical patent/KR920000725B1/en
Publication of KR900014894A publication Critical patent/KR900014894A/en
Application granted granted Critical
Publication of KR920000725B1 publication Critical patent/KR920000725B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments

Abstract

내용 없음.No content.

Description

M. O. F. 자동 결상 검출기M. O. F. Automatic imaging detector

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

첨부도는 본 발명의 회로도.The attached figure is a circuit diagram of the present invention.

Claims (1)

CT출력 및 CT센서회로-비교 검출회로-보상회로-NAND회로-타이머회로-표시, 경보, 복귀 회로로 구성된 M. O. F. 자동 결상 검출기.M. O. F. Automatic imaging detector consisting of CT output and CT sensor circuit-comparison detection circuit-compensation circuit-NAND circuit-timer circuit-display, alarm and return circuit. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019890004013A 1984-09-06 1989-03-29 M.o.f. auto-detecting system KR920000725B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019890004013A KR920000725B1 (en) 1984-09-06 1989-03-29 M.o.f. auto-detecting system

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP59-186705 1984-09-06
JP60-69564 1985-04-01
KR1019890004013A KR920000725B1 (en) 1984-09-06 1989-03-29 M.o.f. auto-detecting system

Publications (2)

Publication Number Publication Date
KR900014894A true KR900014894A (en) 1990-10-25
KR920000725B1 KR920000725B1 (en) 1992-01-21

Family

ID=19284862

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890004013A KR920000725B1 (en) 1984-09-06 1989-03-29 M.o.f. auto-detecting system

Country Status (1)

Country Link
KR (1) KR920000725B1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100280034B1 (en) * 1998-03-06 2001-02-01 신명균 Extra-voltage voltage phase fault circuit
KR20020009150A (en) * 2000-07-24 2002-02-01 김무룡 The manufacturing technology for single unit voltmeter
KR100832327B1 (en) * 2006-12-29 2008-05-26 엘에스산전 주식회사 Electronic watt-hour meter with phase fail detection built-in and method thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100280034B1 (en) * 1998-03-06 2001-02-01 신명균 Extra-voltage voltage phase fault circuit
KR20020009150A (en) * 2000-07-24 2002-02-01 김무룡 The manufacturing technology for single unit voltmeter
KR100832327B1 (en) * 2006-12-29 2008-05-26 엘에스산전 주식회사 Electronic watt-hour meter with phase fail detection built-in and method thereof

Also Published As

Publication number Publication date
KR920000725B1 (en) 1992-01-21

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