KR900006790A - Test circuit with protection circuit of test input terminal in semiconductor chip - Google Patents

Test circuit with protection circuit of test input terminal in semiconductor chip

Info

Publication number
KR900006790A
KR900006790A KR1019880013264A KR880013264A KR900006790A KR 900006790 A KR900006790 A KR 900006790A KR 1019880013264 A KR1019880013264 A KR 1019880013264A KR 880013264 A KR880013264 A KR 880013264A KR 900006790 A KR900006790 A KR 900006790A
Authority
KR
South Korea
Prior art keywords
test
circuit
input terminal
semiconductor chip
protection circuit
Prior art date
Application number
KR1019880013264A
Other languages
Korean (ko)
Other versions
KR910003203B1 (en
Inventor
김영원
Original Assignee
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자 주식회사 filed Critical 삼성전자 주식회사
Priority to KR1019880013264A priority Critical patent/KR910003203B1/en
Publication of KR900006790A publication Critical patent/KR900006790A/en
Application granted granted Critical
Publication of KR910003203B1 publication Critical patent/KR910003203B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
KR1019880013264A 1988-10-10 1988-10-10 Test circuit using protecting circuit in i.c. chip KR910003203B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019880013264A KR910003203B1 (en) 1988-10-10 1988-10-10 Test circuit using protecting circuit in i.c. chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019880013264A KR910003203B1 (en) 1988-10-10 1988-10-10 Test circuit using protecting circuit in i.c. chip

Publications (2)

Publication Number Publication Date
KR900006790A true KR900006790A (en) 1990-05-08
KR910003203B1 KR910003203B1 (en) 1991-05-22

Family

ID=19278409

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019880013264A KR910003203B1 (en) 1988-10-10 1988-10-10 Test circuit using protecting circuit in i.c. chip

Country Status (1)

Country Link
KR (1) KR910003203B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102386473B1 (en) * 2020-11-05 2022-04-13 광운대학교 산학협력단 Wafer-level test method and apparatus of RF beamforming IC

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102386473B1 (en) * 2020-11-05 2022-04-13 광운대학교 산학협력단 Wafer-level test method and apparatus of RF beamforming IC

Also Published As

Publication number Publication date
KR910003203B1 (en) 1991-05-22

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Legal Events

Date Code Title Description
A201 Request for examination
N231 Notification of change of applicant
G160 Decision to publish patent application
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20050407

Year of fee payment: 15

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