KR890014083U - 중간주파_증폭 검파회로 - Google Patents

중간주파_증폭 검파회로

Info

Publication number
KR890014083U
KR890014083U KR2019870022477U KR870022477U KR890014083U KR 890014083 U KR890014083 U KR 890014083U KR 2019870022477 U KR2019870022477 U KR 2019870022477U KR 870022477 U KR870022477 U KR 870022477U KR 890014083 U KR890014083 U KR 890014083U
Authority
KR
South Korea
Prior art keywords
detection circuit
medium frequency
amplification detection
amplification
frequency
Prior art date
Application number
KR2019870022477U
Other languages
English (en)
Other versions
KR900006188Y1 (ko
Inventor
배철수
Original Assignee
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자 주식회사 filed Critical 삼성전자 주식회사
Priority to KR2019870022477U priority Critical patent/KR900006188Y1/ko
Publication of KR890014083U publication Critical patent/KR890014083U/ko
Application granted granted Critical
Publication of KR900006188Y1 publication Critical patent/KR900006188Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2896—Testing of IC packages; Test features related to IC packages
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
KR2019870022477U 1987-12-19 1987-12-19 중간주파_증폭 검파회로 KR900006188Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019870022477U KR900006188Y1 (ko) 1987-12-19 1987-12-19 중간주파_증폭 검파회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019870022477U KR900006188Y1 (ko) 1987-12-19 1987-12-19 중간주파_증폭 검파회로

Publications (2)

Publication Number Publication Date
KR890014083U true KR890014083U (ko) 1989-08-10
KR900006188Y1 KR900006188Y1 (ko) 1990-07-09

Family

ID=19270505

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019870022477U KR900006188Y1 (ko) 1987-12-19 1987-12-19 중간주파_증폭 검파회로

Country Status (1)

Country Link
KR (1) KR900006188Y1 (ko)

Also Published As

Publication number Publication date
KR900006188Y1 (ko) 1990-07-09

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Legal Events

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Payment date: 20010607

Year of fee payment: 12

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