KR880005575U - 마이크로 웨이브 오븐의 온도 프로브 감지장치 - Google Patents

마이크로 웨이브 오븐의 온도 프로브 감지장치

Info

Publication number
KR880005575U
KR880005575U KR2019860012065U KR860012065U KR880005575U KR 880005575 U KR880005575 U KR 880005575U KR 2019860012065 U KR2019860012065 U KR 2019860012065U KR 860012065 U KR860012065 U KR 860012065U KR 880005575 U KR880005575 U KR 880005575U
Authority
KR
South Korea
Prior art keywords
sensing device
microwave oven
temperature probe
oven temperature
probe sensing
Prior art date
Application number
KR2019860012065U
Other languages
English (en)
Other versions
KR890003945Y1 (ko
Inventor
박종인
Original Assignee
주식회사금성사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사금성사 filed Critical 주식회사금성사
Priority to KR2019860012065U priority Critical patent/KR890003945Y1/ko
Publication of KR880005575U publication Critical patent/KR880005575U/ko
Application granted granted Critical
Publication of KR890003945Y1 publication Critical patent/KR890003945Y1/ko

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00Heating by electric, magnetic or electromagnetic fields
    • H05B6/64Heating using microwaves
    • H05B6/6447Method of operation or details of the microwave heating apparatus related to the use of detectors or sensors
    • H05B6/645Method of operation or details of the microwave heating apparatus related to the use of detectors or sensors using temperature sensors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2825Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Measuring Leads Or Probes (AREA)
KR2019860012065U 1986-08-11 1986-08-11 마이크로 웨이브 오븐의 온도 프로브 감지장치 KR890003945Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019860012065U KR890003945Y1 (ko) 1986-08-11 1986-08-11 마이크로 웨이브 오븐의 온도 프로브 감지장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019860012065U KR890003945Y1 (ko) 1986-08-11 1986-08-11 마이크로 웨이브 오븐의 온도 프로브 감지장치

Publications (2)

Publication Number Publication Date
KR880005575U true KR880005575U (ko) 1988-05-12
KR890003945Y1 KR890003945Y1 (ko) 1989-06-10

Family

ID=19254857

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019860012065U KR890003945Y1 (ko) 1986-08-11 1986-08-11 마이크로 웨이브 오븐의 온도 프로브 감지장치

Country Status (1)

Country Link
KR (1) KR890003945Y1 (ko)

Also Published As

Publication number Publication date
KR890003945Y1 (ko) 1989-06-10

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