KR850002841U - 동조기기의 내구력 점검장치 - Google Patents

동조기기의 내구력 점검장치

Info

Publication number
KR850002841U
KR850002841U KR2019830008300U KR830008300U KR850002841U KR 850002841 U KR850002841 U KR 850002841U KR 2019830008300 U KR2019830008300 U KR 2019830008300U KR 830008300 U KR830008300 U KR 830008300U KR 850002841 U KR850002841 U KR 850002841U
Authority
KR
South Korea
Prior art keywords
durability
checking
tuning equipment
tuning
equipment
Prior art date
Application number
KR2019830008300U
Other languages
English (en)
Other versions
KR850001258Y1 (ko
Inventor
연제훈
Original Assignee
삼성전자주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자주식회사 filed Critical 삼성전자주식회사
Priority to KR2019830008300U priority Critical patent/KR850001258Y1/ko
Publication of KR850002841U publication Critical patent/KR850002841U/ko
Application granted granted Critical
Publication of KR850001258Y1 publication Critical patent/KR850001258Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G01R31/2824—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits testing of oscillators or resonators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Details Of Measuring And Other Instruments (AREA)
KR2019830008300U 1983-09-26 1983-09-26 동조기기의 내구력 점검장치 KR850001258Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019830008300U KR850001258Y1 (ko) 1983-09-26 1983-09-26 동조기기의 내구력 점검장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019830008300U KR850001258Y1 (ko) 1983-09-26 1983-09-26 동조기기의 내구력 점검장치

Publications (2)

Publication Number Publication Date
KR850002841U true KR850002841U (ko) 1985-05-30
KR850001258Y1 KR850001258Y1 (ko) 1985-06-19

Family

ID=70158913

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019830008300U KR850001258Y1 (ko) 1983-09-26 1983-09-26 동조기기의 내구력 점검장치

Country Status (1)

Country Link
KR (1) KR850001258Y1 (ko)

Also Published As

Publication number Publication date
KR850001258Y1 (ko) 1985-06-19

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Legal Events

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