KR840003488U - Circuit connection inspection circuit - Google Patents

Circuit connection inspection circuit

Info

Publication number
KR840003488U
KR840003488U KR2019820009009U KR820009009U KR840003488U KR 840003488 U KR840003488 U KR 840003488U KR 2019820009009 U KR2019820009009 U KR 2019820009009U KR 820009009 U KR820009009 U KR 820009009U KR 840003488 U KR840003488 U KR 840003488U
Authority
KR
South Korea
Prior art keywords
circuit
connection inspection
circuit connection
inspection circuit
inspection
Prior art date
Application number
KR2019820009009U
Other languages
Korean (ko)
Other versions
KR840002351Y1 (en
Inventor
박천용
Original Assignee
삼성전자공업주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자공업주식회사 filed Critical 삼성전자공업주식회사
Priority to KR2019820009009U priority Critical patent/KR840002351Y1/en
Publication of KR840003488U publication Critical patent/KR840003488U/en
Application granted granted Critical
Publication of KR840002351Y1 publication Critical patent/KR840002351Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
KR2019820009009U 1982-11-13 1982-11-13 The detective circuit of circuit connection KR840002351Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019820009009U KR840002351Y1 (en) 1982-11-13 1982-11-13 The detective circuit of circuit connection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019820009009U KR840002351Y1 (en) 1982-11-13 1982-11-13 The detective circuit of circuit connection

Publications (2)

Publication Number Publication Date
KR840003488U true KR840003488U (en) 1984-07-25
KR840002351Y1 KR840002351Y1 (en) 1984-11-13

Family

ID=72147492

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019820009009U KR840002351Y1 (en) 1982-11-13 1982-11-13 The detective circuit of circuit connection

Country Status (1)

Country Link
KR (1) KR840002351Y1 (en)

Also Published As

Publication number Publication date
KR840002351Y1 (en) 1984-11-13

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