KR20240113543A - 광 계측 방법, 광 계측 장치, 데이터 처리 장치 및 프로그램 - Google Patents

광 계측 방법, 광 계측 장치, 데이터 처리 장치 및 프로그램 Download PDF

Info

Publication number
KR20240113543A
KR20240113543A KR1020247020918A KR20247020918A KR20240113543A KR 20240113543 A KR20240113543 A KR 20240113543A KR 1020247020918 A KR1020247020918 A KR 1020247020918A KR 20247020918 A KR20247020918 A KR 20247020918A KR 20240113543 A KR20240113543 A KR 20240113543A
Authority
KR
South Korea
Prior art keywords
frequency
display
interest
sampling frequency
stimulus value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020247020918A
Other languages
English (en)
Korean (ko)
Inventor
사토시 마스다
Original Assignee
코니카 미놀타 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 코니카 미놀타 가부시키가이샤 filed Critical 코니카 미놀타 가부시키가이샤
Publication of KR20240113543A publication Critical patent/KR20240113543A/ko
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00Measuring the characteristics of individual optical pulses or of optical pulse trains
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/42Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/433Modulation spectrometry; Derivative spectrometry
    • G01J3/4338Frequency modulated spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/50Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
    • G01J3/506Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors measuring the colour produced by screens, monitors, displays or CRTs
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00Diagnosis, testing or measuring for television systems or their details
    • H04N17/04Diagnosis, testing or measuring for television systems or their details for receivers

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
KR1020247020918A 2022-01-11 2022-12-23 광 계측 방법, 광 계측 장치, 데이터 처리 장치 및 프로그램 Pending KR20240113543A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2022002147 2022-01-11
JPJP-P-2022-002147 2022-01-11
PCT/JP2022/047667 WO2023136102A1 (ja) 2022-01-11 2022-12-23 光計測方法、光計測装置、データ処理装置及びプログラム

Publications (1)

Publication Number Publication Date
KR20240113543A true KR20240113543A (ko) 2024-07-22

Family

ID=87279027

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020247020918A Pending KR20240113543A (ko) 2022-01-11 2022-12-23 광 계측 방법, 광 계측 장치, 데이터 처리 장치 및 프로그램

Country Status (4)

Country Link
JP (1) JPWO2023136102A1 (https=)
KR (1) KR20240113543A (https=)
CN (1) CN118525190A (https=)
WO (1) WO2023136102A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025173637A1 (ja) * 2024-02-15 2025-08-21 コニカミノルタ株式会社 光計測装置、色計測システム、色の評価方法及びプログラム

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050103979A1 (en) 2003-11-13 2005-05-19 Photo Research, Inc. Temporal source analysis using array detectors

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011163947A (ja) * 2010-02-10 2011-08-25 Seiko Epson Corp 光特性測定方法およびその装置
JP2014185881A (ja) * 2013-03-22 2014-10-02 Seiko Epson Corp 測定装置、及び測定方法
WO2019069634A1 (ja) * 2017-10-05 2019-04-11 コニカミノルタ株式会社 二次元フリッカ測定装置、二次元フリッカ測定システム、二次元フリッカ測定方法、及び、二次元フリッカ測定プログラム
KR102728065B1 (ko) * 2019-11-07 2024-11-07 코니카 미놀타 가부시키가이샤 플리커 계측 장치 및 계측 방법
CN115667861A (zh) * 2020-06-01 2023-01-31 柯尼卡美能达株式会社 光波形测量装置及测量方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050103979A1 (en) 2003-11-13 2005-05-19 Photo Research, Inc. Temporal source analysis using array detectors

Also Published As

Publication number Publication date
WO2023136102A1 (ja) 2023-07-20
JPWO2023136102A1 (https=) 2023-07-20
CN118525190A (zh) 2024-08-20

Similar Documents

Publication Publication Date Title
KR102810517B1 (ko) 광 계측 장치, 광 계측 방법, 데이터 처리 장치 및 프로그램
JP6308777B2 (ja) 寿命予測方法、寿命予測プログラム及び寿命予測装置
US9163985B2 (en) Spectral characteristic measurement apparatus and spectral characteristic measurement method
US11651747B2 (en) Flicker measurement device and measurement method
FI125675B (en) Method, hardware, and computer program product for testing video playback quality
KR20240113543A (ko) 광 계측 방법, 광 계측 장치, 데이터 처리 장치 및 프로그램
JP2005242308A (ja) Lcd過駆動の自動キャリブレーションのための装置および方法
WO2021246125A1 (ja) 光波形計測装置及び計測方法
CN109147642A (zh) 显示屏gamma校正方法及其装置
CN112634800A (zh) 快速自动测试发光二极管显示屏刷新频率的方法及系统
CN112129492A (zh) 基于发光二极管的简易光源频闪测试仪的校准方法及校准系统
CN114047841B (zh) 屏幕刷新定位方法、装置、显示设备和存储介质
KR20240134356A (ko) 디스플레이 광 계측 장치 및 광 계측 방법, 데이터 처리 장치 그리고 프로그램
KR20240118866A (ko) 디스플레이 광 계측 장치 및 광 계측 방법, 데이터 처리 장치 그리고 프로그램
CN114034924B (zh) 控制信号功率测量装置、系统、方法及可读存储介质
CN119905050B (zh) 显示设备的测试方法、装置、终端设备及计算机程序产品
KR102959133B1 (ko) 측광 장치 및 교정 시스템, 교정 방법 그리고 프로그램
WO2020136051A1 (en) Laser scanning microscope arrangement
JP2000295298A (ja) アイ開口率自動測定方法及びその装置
JP6168763B2 (ja) 試験測定装置及び試験測定装置における方法
EP0436752A1 (en) Optical interference signal extractor
CN120404067A (zh) Ppg漏光自检方法、可穿戴设备及计算机可读存储介质
WO2025173637A1 (ja) 光計測装置、色計測システム、色の評価方法及びプログラム
Chaplin et al. Measurement of perceived flicker in VDU products
KR20120065231A (ko) 플리커 측정 장치 및 그의 플리커 측정 방법

Legal Events

Date Code Title Description
A201 Request for examination
E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

D21 Rejection of application intended

Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D21-EXM-PE0902 (AS PROVIDED BY THE NATIONAL OFFICE)

PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902