KR20240034973A - Jig used in electromagnetic wave shielding performance measuring device - Google Patents

Abstract

A jig used in an electromagnetic wave shielding performance measuring device according to various embodiments of the present invention for realizing the above-described tasks is disclosed. The jig may include a first housing, a second housing connected to the first housing, a circular aperture structure provided between the first housing and the second housing, and a sample provided in contact with the circular aperture structure. there is.

Description

Jig used in electromagnetic wave shielding performance measurement device {JIG USED IN ELECTROMAGNETIC WAVE SHIELDING PERFORMANCE MEASURING DEVICE}

The present invention relates to an electromagnetic wave shielding performance measuring device, and more specifically, an integrated jig that can be used in an integrated manner in response to samples of various sizes used when measuring electromagnetic wave shielding performance in various areas, and an electromagnetic wave performance measuring device including the same. It's about.

As the operating speed of information and communication devices continues to accelerate and the integration of components increases, the problem of electromagnetic interference (EMI), that is, electronic interference occurring within the devices, continues to increase.

Electromagnetic interference (EMI) is a phenomenon that causes unnecessary electromagnetic signals to interfere with the detection and interpretation of desired signals or deteriorates the performance of equipment. It is an essential issue that must always be considered when using electrical and electronic equipment.

These EMI problems are expanding not only to commercial devices, but also to industrial and military devices. In addition, EMI problems are becoming more difficult to solve due to broadband noise sources occurring in various frequency bands.

To avoid malfunctions, electronic devices must be effectively shielded so that they do not affect and are not affected by other devices. Therefore, in order to effectively solve the electromagnetic interference problem, electromagnetic wave shielding technology is essential.

Shielding refers to a technology that uses specific materials to prevent electromagnetic waves existing in one area from passing to another area. For effective electromagnetic wave shielding, it is important to have high electromagnetic wave attenuation with high conductivity or high permeability.

Shielding Effectiveness (SE) is defined as a measure of shielding performance, which means the ratio of incident electromagnetic waves to transmitted electromagnetic waves passing through the shielding material. Measuring the shielding effect can quantify information about how much electromagnetic waves are attenuated by the shielding mechanism of the material that is the measurement sample.

Meanwhile, metal materials with well-known electrical properties have been used to shield electromagnetic waves. However, in recent years, plastic materials and composite materials that are cheaper, lighter, and easier to process than metal materials have been developed and are widely used as interior and exterior materials of products. In other words, the utilization of more diverse and difficult-to-predict materials is increasing in the field of shielding, and as a result, reliable methods for measuring the shielding effectiveness of materials are required.

Shielding effectiveness varies depending on the type and thickness of the shielding material, measurement frequency, distance and shape between the power source and the shielding film. The electromagnetic wave shielding effect of metallic materials can be easily derived theoretically by Schelkunoff's theory. On the other hand, in the case of composite materials, unlike metallic materials, the electrical properties cannot be clearly known, so the electromagnetic wave shielding effect of the material cannot be theoretically predicted, and the performance can only be determined through measurement.

Regarding the measurement of shielding effectiveness, there are various standardized measurement methods such as the Coaxial TEM Cell method, ASTM ES7-83 method, ASTM D4935 method, Free-space (Anechoic Chamber) method, and Nested Reverberation Chamber method.

In particular, the ASTM D4935 measurement method can more easily mount samples of a wider variety of materials (e.g., metal, conductive plastic, insulating material, etc.), and has high measurement reproducibility and accuracy, making it the most widely used internationally. This is a standard measurement method for the shielding material used.

However, since the operating frequency range of this ASTM D4935 measurement method is 30MHz to 1.5GHz, measurements at higher frequencies must be performed using different jigs and samples. For example, the electromagnetic shielding measurement in the 1.5GHz to 10GHz band measures electromagnetic shielding according to the GPC7 standard, and the electromagnetic shielding measurement in the 1GHz to 18GHz band measures the Flanged Circular Coaxial Transmission Line Holder in the ASTM 4935 standard according to the characteristics of 1-18GHz. You can reduce the dimensions and measure the shielding rate by citing ASTM ES7-83.

In other words, the ASTM D4935 measurement method is easy to measure up to 1.5 GHz, but at frequencies exceeding 1.5 GHz, measurement may be limited due to the blocking characteristics of the coaxial line. In order to increase the measurable blocking frequency, the size of the jig (holder) must be adjusted. should become smaller.

In other words, in measuring electromagnetic shielding, since the size of the sample is different depending on the frequency band, there is the inconvenience of having to replace and attach a new jig every time a measurement is made.

Republic of Korea Patent Publication No. 10-2002-0088849

The problem to be solved by the present invention is to solve the above-mentioned problems, and includes an integrated jig that can be utilized in response to samples of various sizes used when measuring electromagnetic wave shielding performance in various areas, and electromagnetic wave performance measurement including the same. This is to provide a device. In other words, the purpose is to provide an integrated jig that can be varied depending on the size of the sample.

The problems to be solved by the present invention are not limited to the problems mentioned above, and other problems not mentioned can be clearly understood by those skilled in the art from the description below.

A jig used in an electromagnetic wave shielding performance measuring device according to an embodiment of the present invention to solve the above-mentioned problems is disclosed. The jig may include a first housing, a second housing connected to the first housing, a circular aperture structure provided between the first housing and the second housing, and a sample provided in contact with the circular aperture structure. there is.

In an alternative embodiment, the sample may include a reference sample and a measurement sample, and the jig may have a coaxial line structure, but the internal conductor may be discontinuous.

In an alternative embodiment, the circular aperture structure may be provided with a variable size to correspond to samples of various sizes.

In an alternative embodiment, the circular aperture structure may be configured by connecting a plurality of blades, and the size of the outer diameter and inner diameter may change according to a change in relative position between the plurality of blades.

In an alternative embodiment, the plurality of blades may be provided to overlap each other, each may rotate based on an individual rotation axis, and the inner diameter formed through the plurality of blades may have a circular shape.

In an alternative embodiment, each of the plurality of blades may include a connection rail provided in the shape of a groove having a length of a certain length or more and a connection fixing part movably provided on the connection rail.

In an alternative embodiment, the jig includes an internal conductor provided to correspond to the center of the inner diameter of the circular aperture structure, and the internal conductor includes a plurality of center coupling modules having various sizes to be detachably provided. It can be characterized.

In another embodiment of the present invention, it is disclosed in a circular aperture structure included in a jig used in an electromagnetic wave shielding performance measuring device. The circular aperture structure may include a plurality of blades that overlap each other and are rotatable about individual rotation axes, and the size of the outer diameter and inner diameter may change depending on the relative position change between the plurality of blades. there is.

Other specific details of the invention are included in the detailed description and drawings.

According to various embodiments of the present invention, the purpose is to provide an integrated jig that can be used in an integrated manner in response to samples of various sizes used when measuring electromagnetic wave shielding performance in various areas and an electromagnetic wave performance measuring device including the same.

The effects of the present invention are not limited to the effects mentioned above, and other effects not mentioned will be clearly understood by those skilled in the art from the description below.

Various aspects are described with reference to the drawings below, where like reference numerals are used to collectively refer to like elements. In the examples below, for purposes of explanation, numerous specific details are set forth to provide a comprehensive understanding of one or more aspects. However, it will be clear that such aspect(s) may be practiced without these specific details.
1 shows a system in which an electromagnetic wave shielding performance measurement device related to an embodiment of the present invention can be implemented.
Figure 2 is an example diagram to explain that the size of a sample is different depending on the frequency band related to an embodiment of the present invention.
Figure 3 is an exemplary cross-sectional view of an electromagnetic wave shielding performance measuring device combined with a jig related to an embodiment of the present invention.
Figure 4 is an exemplary diagram illustrating a jig related to an embodiment of the present invention.
Figure 5 is an exemplary diagram showing a plurality of blades constituting a jig related to an embodiment of the present invention.
Figure 6 is an exemplary diagram showing that the sizes of the outer diameter and inner diameter of a jig related to an embodiment of the present invention are adjusted.
Figure 7 is an exemplary cross-sectional view of an electromagnetic wave shielding performance measuring device combined with a jig related to another embodiment of the present invention.

Various embodiments and/or aspects are disclosed with reference to the drawings. In the following description, for purposes of explanation, numerous specific details are set forth to facilitate a general understanding of one or more aspects. However, it will be appreciated by those skilled in the art that this aspect(s) may be practiced without these specific details. The following description and accompanying drawings set forth in detail certain example aspects of one or more aspects. However, these aspects are illustrative and some of the various methods in the principles of the various aspects may be utilized, and the written description is intended to encompass all such aspects and their equivalents. Specifically, as used herein, “embodiment,” “example,” “aspect,” “example,” etc. are not to be construed as indicating that any aspect or design described is better or advantageous over other aspects or designs. Maybe not.

Hereinafter, regardless of the reference numerals, identical or similar components will be assigned the same reference numbers and duplicate descriptions thereof will be omitted. Additionally, in describing the embodiments disclosed in this specification, if it is determined that detailed descriptions of related known technologies may obscure the gist of the embodiments disclosed in this specification, the detailed descriptions will be omitted. In addition, the attached drawings are only intended to facilitate understanding of the embodiments disclosed in this specification, and the technical idea disclosed in this specification is not limited by the attached drawings.

Although first, second, etc. are used to describe various elements or components, these elements or components are of course not limited by these terms. These terms are merely used to distinguish one device or component from another device or component. Therefore, it goes without saying that the first element or component mentioned below may also be a second element or component within the technical spirit of the present invention.

Unless otherwise defined, all terms (including technical and scientific terms) used in this specification may be used with meanings that can be commonly understood by those skilled in the art to which the present invention pertains. Additionally, terms defined in commonly used dictionaries are not interpreted ideally or excessively unless clearly specifically defined.

Additionally, the term “or” is intended to mean an inclusive “or” and not an exclusive “or.” That is, unless otherwise specified or clear from context, “X utilizes A or B” is intended to mean one of the natural implicit substitutions. That is, either X uses A; X uses B; Or, if X uses both A and B, “X uses A or B” can apply to either of these cases. Additionally, the term “and/or” as used herein should be understood to refer to and include all possible combinations of one or more of the related listed items.

Additionally, the terms “comprise” and/or “comprising” mean that the feature and/or element is present, but exclude the presence or addition of one or more other features, elements and/or groups thereof. It should be understood as not doing so. Additionally, unless otherwise specified or the context is clear to indicate a singular form, the singular terms herein and in the claims should generally be construed to mean “one or more.”

When a component is said to be “connected” or “connected” to another component, it is understood that it may be directly connected to or connected to that other component, but that other components may also exist in between. It should be. On the other hand, when a component is said to be “directly connected” or “directly connected” to another component, it should be understood that there are no other components in between.

The suffixes “module” and “part” for the components used in the following description are given or used interchangeably only for the ease of preparing the specification, and do not have distinct meanings or roles in and of themselves.

When an element or layer is referred to as “on” or “on” another element or layer, it means that it is not only directly on top of, but also intervening with, the other element or layer. Includes all intervening cases. On the other hand, when a component is referred to as “directly on” or “directly on,” it indicates that there is no intervening other component or layer.

Spatially relative terms such as “below”, “beneath”, “lower”, “above”, “upper”, etc. are used as a single term as shown in the drawing. It can be used to easily describe a component or its correlation with other components. Spatially relative terms should be understood as terms that include different directions of the element during use or operation in addition to the direction shown in the drawings.

For example, if a component shown in a drawing is turned over, a component described as “below” or “beneath” another component would be placed “above” the other component. You can. Accordingly, the illustrative term “down” may include both downward and upward directions. Components can also be oriented in different directions, so spatially relative terms can be interpreted according to orientation.

The purpose and effects of the present invention, and technical configurations for achieving them, will become clear by referring to the embodiments described in detail below along with the accompanying drawings. In explaining the present invention, if it is determined that a detailed description of a known function or configuration may unnecessarily obscure the gist of the present invention, the detailed description will be omitted. In addition, the terms described below are terms defined in consideration of the functions in the present invention, and may vary depending on the intention or custom of the user or operator.

However, the present invention is not limited to the embodiments disclosed below and may be implemented in various different forms. These embodiments are merely provided to ensure that the present invention is complete and to fully inform those skilled in the art of the scope of the disclosure to which the present invention pertains, and that the present invention is only defined by the scope of the claims. . Therefore, the definition should be made based on the contents throughout this specification.

1 shows a system in which an electromagnetic wave shielding performance measurement device related to an embodiment of the present invention can be implemented. Figure 2 is an example diagram to explain that the size of a sample is different depending on the frequency band related to an embodiment of the present invention. Figure 3 is an exemplary cross-sectional view of an electromagnetic wave shielding performance measuring device combined with a jig related to an embodiment of the present invention. Figure 4 is an exemplary diagram illustrating a jig related to an embodiment of the present invention. Figure 5 is an exemplary diagram showing a plurality of blades constituting a jig related to an embodiment of the present invention. Figure 6 is an exemplary diagram showing that the sizes of the outer diameter and inner diameter of a jig related to an embodiment of the present invention are adjusted. Figure 7 is an exemplary cross-sectional view of an electromagnetic wave turn performance measuring device combined with a jig representing another embodiment of the present invention.

According to one embodiment of the present invention, the electromagnetic wave shielding performance measurement system 1000 may include a jig 100 and an electromagnetic wave shielding performance device 200, as shown in FIG. 1 . The above-described components are exemplary, and the fuel cell system of the present invention is not limited to the above-described components. That is, depending on the implementation aspect of the embodiments of the present invention, additional components may be included or some of the above-described components may be omitted.

In one embodiment, the electromagnetic wave shielding performance measuring device 200 may include a plurality of antennas corresponding to each measurement band. The electromagnetic wave shielding performance measuring device 200 may include a transmitting unit that generates a signal and a receiving unit that analyzes the signal. For example, the transmitting unit may include a signal generator, a power amplifier, and a directional antenna, and the receiving unit may include a signal analyzer or RF receiver, a low noise amplifier or preamplifier, a step attenuator, and a directional antenna.

In one embodiment, the jig 100 may have a flanged double ridged waveguide as its basic structure. Based on the shape of the jig 100, an electromagnetic wave shielding performance measurement system 1000 can be provided that can accurately and relatively simply measure the electromagnetic wave shielding effect.

According to the embodiment, the jig 100 is composed of a coaxial transmission line, as shown in FIG. 1, and the diameter of the coaxial line may be tapered toward both ends. A flange is formed at one end of the jig 100, and a wedge-shaped structure with a taper formed so that the distance between each other becomes smaller as it goes from the flange to each end of the jig 100 can be formed. Additionally, connectors to which cables can be connected may be connected to both ends of the jig 100. In general, a coaxial line is a transmission line that can transmit the TEM mode, and since the TEM mode has the same polarization form as the plane wave of the far field, when using a jig in the form of a coaxial line, the shielding characteristics of the far field can be easily measured. there is.

According to one embodiment, the coaxial TEM cell may be characterized in that the inner conductor (or inner core conductor) of the coaxial line is discontinuous and the outer conductor is provided in the form of a flange, as shown in FIG. 1. there is. Due to these features, samples (or specimens) of a wider variety of materials (e.g., metal, conductive plastic, and insulating material, etc.) can be easily mounted (i.e., the sample is securely fixed). In one embodiment, each flange may be formed with a plurality of threaded threaded holes into which a screw for coupling to a sample is inserted. It is desirable to provide a fixing device to securely fix the flange and the sample. For example, the fixing device may include various fixing devices such as a screw type or a clip type fastening device, but is not limited thereto.

When measuring shielding performance (or shielding effect) using the electromagnetic wave shielding performance measurement system 1000 of the present invention, two types of samples are used, specifically, two types of samples, a reference sample and a load sample. Samples may be provided. With the reference sample fixed to the flange, each port of the electromagnetic shielding measurement device 200 can be connected to the connector at both ends of the coaxial line to measure the first signal level (P1), and with the measurement sample fixed to the flange, The second signal level (P2) can be measured. In one embodiment, in order to accurately measure shielding performance, the reference sample and the measurement sample may be provided to have the same thickness. For example, if the average thickness difference between the two samples is less than 25㎛ and the thickness change between the two samples is less than 5%, the two samples can be considered to have the same thickness.

Referring to FIG. 1, the reference sample has an outer diameter and an inner diameter and may include a circular sample (eg, a central axis) included inside the inner diameter. A circular sample equal to the diameter of the internal conductor in the reference sample is used to maintain capacitive coupling and can improve measurement accuracy. In other words, the reference sample can secure a space for signals to pass through the space between the inner diameter and the circular sample. The measurement sample may be provided in a circular shape that is completely closed.

In this case, shielding performance may be measured based on the measured first signal level and second signal level. In a specific embodiment, the shielding effect can be calculated through the following equation.

Shielding Effectiveness (SE) [dB] = 10 log(P1/P2)

That is, as described above, the shielding performance measurement system 1000 of the present invention can minimize the impact of the contact resistance value on the accuracy of measurement by holding the sample through the flange and firmly fixing it. It serves to hold the sample through the flange, but the continuity of the inner or outer conductor disappears, and the shape of the sample produced may also change. This measurement method is the most reproducible and has the advantage of being highly reliable because almost the same result can be obtained even if the measurement is repeated multiple times.

According to one embodiment, in order to measure shielding performance, it may be necessary to measure using jigs and samples of different sizes for each frequency band. Specifically, since the operating frequency range of the ASTM D4935 measurement method is 30 MHz to 1.5 GHz, measurements at higher frequencies must be performed using different jigs and samples. For example, the electromagnetic shielding measurement in the 1.5GHz to 10GHz band measures electromagnetic shielding according to the GPC7 standard, and the electromagnetic shielding measurement in the 1GHz to 18GHz band measures the Flanged Circular Coaxial Transmission Line Holder in the ASTM 4935 standard according to the characteristics of 1-18GHz. You can reduce the dimensions and measure the shielding rate by citing ASTM ES7-83.

In other words, the ASTM D4935 measurement method is easy to measure up to 1.5 GHz, but above 1.5 GHz, measurement may be limited due to the blocking characteristics of the coaxial line, and in order to increase the measurable blocking frequency, the size of the jig (holder) must be small. do.

In other words, in measuring electromagnetic wave shielding, the size of the sample is different depending on the frequency band, so there is the inconvenience of having to replace the jig and attach a new one every time a measurement is made.

In a specific embodiment, referring to FIG. 2, (a) of FIG. 2 may be a sample (e.g., reference sample) size corresponding to the ASTM D4935-10 measurement method, and (b) of FIG. 2 may be a size according to the GPC7 standard. It may be the sample size. As shown in Figure 2, in the case of the ASTM D4935-10 measurement method, it can be confirmed that the outer diameter is set to 133.096mm, the inner diameter is set to 76.2mm, and the central axis is set to 33.02mm. On the other hand, in the case of the GPC7 measurement method, it can be confirmed that the outer diameter is 15.857mm, the inner diameter is 7mm, and the central axis is 3.048mm. If you increase the measurable cutoff frequency, the jig size may have to be very small. As the size of the jig varies greatly depending on the frequency, a jig corresponding to each frequency (or sample size) must be used.

The jig 100 of the present invention may be characterized as an integrated jig capable of measuring each of a plurality of samples having various sizes depending on the frequency band. The jig 100 of the present invention can measure shielding performance by fixing each sample of various sizes through a flange.

In other words, it is possible to support shielding performance measurements for samples of various sizes (i.e., samples corresponding to various frequency bands) through one integrated jig. Hereinafter, a method of measuring shielding performance in response to samples of various sizes through one integrated jig will be described in detail.

According to the embodiment, the jig 100 of the present invention is provided between the first housing 111, the second housing 112 connected to the first housing, and the first housing 111 and the second housing 112. It may include a circular aperture structure 120 and a sample 130 provided in contact with the circular aperture structure 120.

According to one embodiment, the sample may include a reference sample and a measurement sample. The reference sample has an outer diameter and an inner diameter and may include a circular sample (eg, a central axis) included inside the inner diameter. A circular sample equal to the diameter of the internal conductor in the reference sample is used to maintain capacitive coupling and can improve measurement accuracy. In other words, the reference sample can secure a space for signals to pass through the space between the inner diameter and the circular sample. The measurement sample may be provided in a circular shape that is completely closed.

In an embodiment, the jig 100 of the present invention may have a coaxial line structure, but may be characterized in that the internal conductor is discontinuous. Specifically, referring to FIG. 3, the jig 100 may be formed by combining the first housing 111 and the second housing 112. As the first housing 111 and the second housing 112 are combined, a flange 110 may be formed on an outer portion of the jig. The flange 110 serves to fix the sample on the inside. In one embodiment, each flange may be formed with a plurality of threaded threaded holes into which a screw for coupling to a sample is inserted. It is desirable to provide a fixing device to securely fix the flange and the sample. For example, the fixing device may include various fixing devices such as a screw type or a clip type fastening device, but is not limited thereto. The inside of the first housing 111 and the second housing 112 may be composed of a coaxial line. A flange 110 is formed at one end of the coaxial line, and a taper may be formed so that the separation distance between the two ends becomes smaller with respect to the flange 110. The signal can travel through the taper.

According to an embodiment, the inner conductor (or inner conductor) of the coaxial line may be characterized as being discontinuous. That is, the first housing 111 and the second housing 112 of corresponding shapes are coupled to each other by the flange 110, but continuity between the internal conductors and external conductors may not be maintained. The electromagnetic wave shielding performance measuring device 200 may measure the shielding performance of the measurement sample based on the first signal level corresponding to the reference sample and the second signal level corresponding to the measurement sample. According to an embodiment, the first signal level (P1) can be measured by connecting each port of the electromagnetic shielding measurement device 200 with connectors at both ends of the coaxial line while the reference sample is fixed to the flange, and the measurement sample is connected to the flange. The second signal level (P2) can be measured while fixed to .

According to one embodiment, referring to FIG. 3, the circular aperture structure 120 may be provided in contact with the sample. The circular aperture structure 120 may be provided in contact with both sides of the sample 130 . A circular aperture structure may be provided between the sample and the flange to secure the sample to the flange.

According to one embodiment of the present invention, the circular aperture structure 120 may be provided with a variable size to correspond to samples of various sizes. Specifically, as previously explained, at high frequencies, very small samples must be provided. For a specific example, in the frequency range below 1.5 GHz, a sample with an outer diameter of 133.096 mm can be used, but in the frequency range above 1.5 GHz, a sample with an outer diameter of 15.857 mm can be used. As described above, when the frequency exceeds a certain frequency, the size of the sample may become approximately 10 times smaller. As the size of the sample decreases, it becomes difficult to fix the sample to the flange.

In the present invention, the sample 130 can be fixed to the flange through the circular aperture structure 120 that varies in various sizes. In a specific embodiment, the outer diameter of the circular aperture structure 120 may be adjustable from 15.875 mm to 133.096 mm. Additionally, the inner diameter of the circular aperture structure 120 may be adjustable from 7 mm to 76.2 mm. That is, the circular aperture composition can be varied to correspond to the size of the sample corresponding to the 30 MHz to 1.5 GHz band and the sample size corresponding to the 1.5 GHz to 10 GHz band. Accordingly, it can be possible to measure shielding performance for various bands (or samples of various sizes) through one integrated jig.

According to one embodiment, the circular aperture structure 120 is constructed through a connection between a plurality of blades, and the size of the outer diameter and inner diameter may change depending on the relative position change between the plurality of blades 121. .

As shown in FIG. 4, the plurality of blades 121 are provided to overlap each other, each can rotate based on an individual rotation axis, and the inner diameter formed through the plurality of blades may be characterized in that it has a circular shape. .

More specifically, each blade may include a connecting rail 121-1 provided in the shape of a groove having a length of a certain length or more. Additionally, each of the plurality of blades 121 may include a connection fixing part 121-1 that is movable on a connection rail.

For example, referring to FIG. 5, a protruding connection fixing part 121-1 may be provided on the lower surface of the second blade 121b, and the connection fixing part 121-1 is connected to the first blade 121a. ) can be coupled to the connecting rail (121-1) formed on the first blade (121a) in the upper surface direction. Accordingly, the connection fixing part 121-1 of the second blade 121b may be movable on the connection rail 121-1 of the first blade 121a.

Referring again to FIG. 4, each of the first to fifth blades, that is, five blades, may be connected and/or coupled to other blades through a connection fixing part and a connection rail. When connected to other blades through a connection fixture and a connection rail, each blade can rotate based on its individual rotation axis and relative position movement becomes possible. In the above description and drawings, for convenience of explanation, it is shown that the circular aperture structure 120 is formed using five blades. However, in the present invention, the circular aperture structure can be formed using a large number of blades, and accordingly, It will be apparent to those skilled in the art that the range of variability can be further improved.

In a specific embodiment, referring to FIGS. 5 and 6, when the connection fixing portion formed on each blade moves outward (e.g., toward the end of the blade) on the connection rail of another blade, the outer diameter of the circular aperture structure 120 ( The sizes of 120b) and the inner diameter 120a may be increased. That is, as shown in (a) of FIG. 6, the outer diameter 120b and the inner diameter 120a of the circular aperture structure 120 may reach their maximum values. In an embodiment, when the circular aperture structure 120 is fully expanded, the outer diameter 120b and the inner diameter 120a may be 133.096 mm and 76.2 mm, respectively.

Conversely, when the connection fixing portion formed on each blade moves inward (e.g., toward the center of the blade) on the connection rail of the other blade, the size of the outer diameter 120b and the inner diameter 120a of the circular aperture structure 120 will decrease. You can. That is, as shown in (b) of FIG. 6, the outer diameter 120b and inner diameter 120a of the circular aperture structure 120 may reach their lowest values. In an embodiment, when the circular aperture structure 120 is reduced to the minimum, the outer diameter 120b and the inner diameter 120a may be 15.875 mm and 7 mm, respectively.

Additionally, according to an embodiment, the jig 100 may include an internal conductor 140 provided to correspond to the center of the inner diameter of the circular aperture structure 120. The internal conductor 140 may be characterized in that a plurality of central coupling modules having various sizes are detachably provided. In a specific embodiment, referring to FIG. 3, the size of the internal conductor 140 may need to be changed in response to a change in the size of the sample. For example, to measure shielding performance in the 1.5GHz to 10GHz band (relatively high frequency), an internal conductor corresponding to a circumference of 3.048 mm must be provided corresponding to the size of the sample, while to measure shielding performance in the band below 1.5GHz, An internal conductor with a circumference of 33.02 mm must be provided corresponding to the size of the sample. In other words, the relatively low frequency band may require an internal conductor with a larger circumference to be provided. In this case, the present invention can change the size of the inner conductor through a specific center coupling module (i.e., a center coupling module with a diameter of 33.02 mm) that is detachably provided on the inner conductor 140. For example, as a specific central coupling module 140-1 is inserted and coupled to the internal conductor 140, the size (i.e., diameter) of the internal conductor may change. In an embodiment, each of the plurality of central coupling modules may be provided with a fitting part corresponding to the internal conductor 140 along the longitudinal direction, and the internal conductor 140 may be provided in a form fitted into the fitting part. .

In more detail, after measuring shielding performance in the 1.5 GHz to 10 GHz band (relatively high frequency), if you want to measure shielding performance in the band below 1.5 GHz, the size of the sample may change. Specifically, the size of the sample (eg, the reference sample), the outer diameter, inner diameter, and central axis may be changed from 15.857 mm, 7 mm, and 3.048 mm to 133.096 mm, 76.2 mm, and 33.02 mm, respectively.

The outer diameter and diameter of the circular aperture structure 120 may change in response to changes in the size of the sample. In this case, the central coupling module 140-1 may be coupled to the internal conductor 140 in response to a change in the size of the central axis of the sample. In one embodiment, the diameter of the internal conductor 140 may be 3.048 mm, and the diameter of the fitting portion formed in the plurality of central coupling modules may correspond to the diameter of the internal conductor 140. That is, the internal conductor 140 can be changed to have the same size as the central axis of the sample through coupling and separation of the central coupling module.

As described above, the jig 100 of the present invention includes a variable circular aperture structure 120 and an internal conductor 140 in response to changes in the size of the specimen according to various frequency bands. . This has the advantage of providing an integrated electromagnetic shielding jig even when the size of the electromagnetic shielding measurement sample changes. In other words, it is possible to provide convenience for electromagnetic shielding measurement by providing a unified, integrated jig without the need to replace and attach a new jig for each measurement that corresponds to changes in specimen size.

Figure 7 shows a jig used in an electromagnetic wave shielding performance measuring device according to another embodiment of the present invention. Compared to Figure 3, the inner conductor 140 is characterized in that a second center coupling module 140-2 is further provided. The second center coupling module 140-2 may be coupled to the inner conductor 140 together with the center coupling module 140-1, and may be coupled to the inner conductor 140 alone without the center coupling module 140-1. It may be possible.

Specifically, the second center coupling module 140-2 is characterized by being able to adjust the size of the specimen or the inner diameter of the shielding range. It may be installed as a single shape in a detachable manner on the internal conductor 140, or may be formed as a structure including a plurality of blades, such as the circular aperture structure 120. That is, the second center coupling module 140-2 has the effect of adjusting the inner and outer diameters of the shielding range together with the circular aperture structure 120.

Meanwhile, the sample 130 may be combined with at least one of the circular aperture structure 120, the internal conductor 140, the central coupling module 140-1, and the second central coupling module 140-2. Alternatively, the sample 130 may be combined with the flange 110.

Above, embodiments of the present invention have been described with reference to the attached drawings, but those skilled in the art will understand that the present invention can be implemented in other specific forms without changing its technical idea or essential features. You will be able to understand it. Therefore, the embodiments described above should be understood in all respects as illustrative and not restrictive.

It is to be understood that the specific order or hierarchy of steps in the processes presented is an example of illustrative approaches. It is to be understood that the specific order or hierarchy of steps in processes may be rearranged within the scope of the present invention, based on design priorities. The appended method claims present elements of the various steps in a sample order but are not meant to be limited to the particular order or hierarchy presented.

1000: Electromagnetic shielding performance measurement system
100: Jig 200: Electromagnetic wave shielding performance measurement device
110: Flange
111: first housing
112: second housing
120: Circular aperture structure
120a: Circular aperture structure inner diameter
120b: Circular aperture structure outer diameter
121: plural blades
121a: first blade
121b: second blade
121-1: Connecting rail
121-2: Connection fixing part
130: sample
140: Inner conductor
140-1: Central combined module
140-2: Second center combination module

Claims (8)

first housing;
a second housing connected to the first housing;
a circular aperture structure provided between the first housing and the second housing; and
A sample provided in contact with the circular aperture structure;
Including,
A jig used in an electromagnetic wave shielding performance measurement device.
According to paragraph 1,
The sample was,
Includes reference samples and measurement samples,
The jig,
It has a coaxial line structure, but is characterized by a discontinuous internal conductor,
A jig used in an electromagnetic wave shielding performance measurement device.
According to paragraph 1,
The circular aperture structure is,
Characterized in that the size is variable in response to samples of various sizes,
A jig used in an electromagnetic wave shielding performance measurement device.
According to paragraph 1,
The circular aperture structure is,
It is configured through a connection between a plurality of blades, and is characterized in that the size of the outer diameter and inner diameter changes according to the relative position change between the plurality of blades.
A jig used in an electromagnetic wave shielding performance measurement device.
According to paragraph 4,
The plurality of blades are,
They are provided overlapping each other, each can rotate based on an individual rotation axis, and the inner diameter formed through the plurality of blades is characterized in that it has a circular shape,
A jig used in an electromagnetic wave shielding performance measurement device.
According to clause 4,
Each of the plurality of blades,
A connecting rail provided in the shape of a groove having a length of a certain length or more; and
A connection fixing part movably provided on the connection rail;
Including,
A jig used in an electromagnetic wave shielding performance measurement device.
According to paragraph 4,
The jig,
an internal conductor provided to correspond to the center of the inner diameter of the circular aperture structure;
Includes,
The internal conductor is characterized in that a plurality of central coupling modules having various sizes are detachably provided,
A jig used in an electromagnetic wave shielding performance measurement device.
In the circular aperture structure included in the electromagnetic wave shielding performance measurement device,
It is provided overlapping each other and includes a plurality of blades that can each rotate about an individual rotation axis,
Characterized in that the sizes of the outer diameter and inner diameter change according to the relative position change between the plurality of blades,
A circular aperture structure included in a jig used in an electromagnetic wave shielding performance measurement device.

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