KR20230139167A - Apparatus for inspecting of laminate floor - Google Patents

Abstract

The laminate floor inspection device is a laminate floor inspection device that inspects defects in a laminate floor, and includes an illumination means for irradiating light to the laminate floor; photographing means for photographing an image of the laminate floor using reflected light and/or transmitted light of light irradiated to the laminate floor from the illumination means; abnormality detection means for detecting an abnormality included in the reinforced floor from a characteristic quantity distribution situation obtained by processing image data of an image captured by the photographing means; and storage means for maintaining, as a pattern map, the characteristic quantity distribution situation indicating the part with no abnormality and the abnormal part of the reinforced floor. The abnormality detection means detects an abnormality of the reinforced floor based on the pattern map. detecting, the storage means further retains image data of defective products and/or characteristic quantities obtained by processing image data of defective products, and said abnormality detection means sets a threshold based on the characteristic quantities obtained by processing image data of defective products. An abnormality is detected by using the value.

Description

Laminated floor inspection device {APPARATUS FOR INSPECTING OF LAMINATE FLOOR}

The present invention relates to a laminate floor inspection device for detecting abnormal parts of a laminate floor.

In the production line for manufacturing or processing laminate flooring, visible light or ultraviolet light is irradiated to the laminate floor and the transmitted or reflected light is used to photograph the surface and exterior of the laminate floor with a camera. The images obtained are used to detect abnormalities in the laminate floor (inclusion of foreign substances). , contamination, cracks, etc. (hereinafter also referred to as defects) are being used.

In a conventional inspection device, an inspection standard (hereinafter also referred to as a threshold value) corresponding to each type of abnormality is established based on a limited number of defective product samples to detect abnormal parts of the laminate floor using characteristic quantities obtained by image processing a captured image. was set, and judgment of good/bad was performed accordingly.

According to the above method, in order to set a threshold value for abnormality detection for the above-mentioned feature quantity, a sample for distinguishing good products from defective products is required for each type of abnormality. Usually, it is not easy to obtain limit samples that can distinguish between good and defective products, so the threshold value is set by estimating the unevenness based on the available samples. However, if the actual unevenness is different from the assumed one, the optimal threshold value is set. There were cases where the value could not be set.

As described above, in situations where there are not enough samples, such as when a new device is installed or a new item is added to the inspection target, inspection cannot be performed with appropriate precision, and in some cases, the inspection device cannot be operated. There was a problem that couldn't be solved.

For this reason, when inspecting a new item, it is also common to copy and use existing inspection standards for similar items, but this poses problems in terms of inspection precision, efficiency in inspection standard adjustment, etc.

In consideration of the above situation, the present invention provides a laminate floor inspection device that can automatically perform defect inspection with high precision using an external image of the laminate floor.

In one embodiment, a laminate floor inspection device is a laminate floor inspection device that inspects defects in a laminate floor, and includes an illumination means for irradiating light to the laminate floor; photographing means for photographing an image of the laminate floor using reflected light and/or transmitted light of light irradiated to the laminate floor from the illumination means; abnormality detection means for detecting an abnormality included in the reinforced floor from a characteristic quantity distribution situation obtained by processing image data of an image captured by the photographing means; and storage means for maintaining, as a pattern map, the characteristic quantity distribution situation indicating the part with no abnormality and the abnormal part of the reinforced floor. The abnormality detection means detects an abnormality of the reinforced floor based on the pattern map. detecting, the storage means further retains image data of defective products and/or characteristic quantities obtained by processing image data of defective products, and said abnormality detection means sets a threshold based on the characteristic quantities obtained by processing image data of defective products. An abnormality is detected by using the value.

An abnormality detection means of the laminate floor inspection device detects an abnormality of the laminate floor using a threshold value set based on the pattern map.

The laminate floor inspection device according to the present invention can perform high-precision inspection from the initial state of the inspection device, which has the effect of increasing inspection accuracy and efficiency.

Figure 1 is a block diagram showing a laminate floor inspection device according to Example 1.
Fig. 2A is a histogram showing the distribution of characteristic quantities of each pixel in an image of a reinforced floor taken with no abnormalities. This is a histogram showing an example of a characteristic quantity distribution.
Fig. 2B is a histogram showing the distribution of feature quantities for an image taken when a reinforced floor with an abnormality of foreign matter incorporation was photographed.
Figure 2C is a histogram showing the distribution of feature quantities for an image when a reinforced floor with a pinhole abnormality is photographed.
Figure 3A is a diagram showing a pattern map for a uniformly formed product.
Figure 3B is a diagram showing a pattern map for a product with coarse formation.
Figure 3C is a diagram showing a pattern map for a thin product.
Figure 4 is a flowchart showing an example of a method for setting an inspection threshold of a laminate floor inspection device according to Example 1.
Figure 5A is a diagram showing the relationship between a pattern map and an inspection threshold during initial setup of the laminate floor inspection device according to Example 1.
Figure 5B is a diagram showing the relationship between a pattern map and an inspection threshold when starting up the laminate floor inspection device according to Example 1.
Figure 5C is a diagram showing the relationship between a pattern map and an inspection threshold during verification after inspection by the laminate floor inspection device according to Example 1.
Figure 6 is a block diagram showing a configuration example of an inspection system according to Example 2.
Fig. 7A is a diagram showing a pattern map based on feature quantities acquired by the first inspection device.
Fig. 7B is a diagram showing a pattern map based on the feature quantity acquired by the second inspection device.
FIG. 7C is a diagram showing a new pattern map that integrates the pattern maps created by the first inspection device and the second inspection device.

The present invention described below can be modified in various ways and can have various embodiments. Specific embodiments will be illustrated in the drawings and described in detail in the detailed description.

However, this is not intended to limit the present invention to specific embodiments, and should be understood to include all transformations, equivalents, and substitutes included in the spirit and technical scope of the present invention. In describing the present invention, if it is determined that a detailed description of related known technologies may obscure the gist of the present invention, the detailed description will be omitted.

The terms used in this application are only used to describe specific embodiments and are not intended to limit the invention. Singular expressions include plural expressions unless the context clearly dictates otherwise. In this application, terms such as “comprise” or “have” are intended to designate the presence of features, numbers, steps, operations, components, parts, or combinations thereof described in the specification, but are not intended to indicate the presence of one or more other features. It should be understood that this does not exclude in advance the possibility of the existence or addition of elements, numbers, steps, operations, components, parts, or combinations thereof.

Additionally, terms such as first and second may be used to separately describe various components, but the components should not be limited by the terms. The above terms are used only for the purpose of distinguishing one component from another.

In addition, when at least two different embodiments are described in the present application, all or part of the components of each embodiment can be merged and used interchangeably without departing from the technical spirit of the present invention. .

<Example 1>

(Configuration of the laminate floor inspection device)

Figure 1 is a block diagram showing a configuration example of the laminate floor inspection device 1 according to this embodiment. The laminate floor inspection device 1 detects abnormalities in the laminate floor 9 by photographing the laminate floor 9, processing the acquired image, and comparing the characteristic quantities obtained with pre-registered inspection standards, and detects abnormalities in the laminate floor 9 as a result. It has a function to output. Here, the “feature quantity” is, for example, the luminance, brightness, saturation, color, etc. possessed by each pixel of the acquired image data. In this embodiment, the luminance value is used as an example.

The laminate floor inspection device 1 has a visible light source 31 that irradiates white light and an infrared light source 32 that irradiates infrared light on one surface of the laminate floor 9 as an illumination means.

Additionally, the laminate floor inspection device 1 has a camera 4 as an imaging means. The camera 4 is arranged to photograph the reinforced floor 9 by light irradiated from the visible light source 31 and/or the infrared light source 32 and transmitted straight through or reflected by the reinforced floor 9.

In addition, the reinforced floor inspection device 1 has an abnormality detection unit 5 that detects abnormalities included in the reinforced floor 9 based on the output signal of the camera 4. The abnormality detection unit 5 detects an abnormality in the reinforced floor 9 based on a threshold set by the control panel 2, which will be described later. The abnormality detection unit 5 of this embodiment corresponds to the “abnormality detection means.”

The laminate floor inspection device 1 has a control panel 2 that performs operations such as setting inspection standards (including changes, hereinafter the same) and creating an inspection program (including modifications, the same hereinafter). The control panel 2 can also be used for registration and updating of feature quantity pattern maps, product information, defective product information, and inspection device information held in the storage device 6, which will be described later.

Additionally, the laminate floor inspection device 1 has a storage device 6 in which various data including a feature quantity pattern map described later are stored. Typically, it is a large capacity storage device such as HDD. In addition to the feature quantity pattern map, information such as product information to be inspected and defective product information (image data, etc.) for each product to be inspected may be held. Additionally, the storage device 6 in this embodiment corresponds to the “storage means”.

The reinforced floor 9 is formed as and is conveyed in the direction of the arrow in FIG. 1. The reinforced floor 9 may be, for example, in the shape of a plate made of wood. In addition, in this embodiment, the lighting means and the photography means are fixed and the laminate floor 9 is moved. The laminate floor 9 is fixed and the lighting means and the photography means are moved according to the size of the laminate floor 9. You can also do it.

The camera 4 is, for example, a line sensor camera equipped with a CCD image sensor in which 4096 light-receiving elements are arranged in series.

In each light-receiving element of the camera 4, light is converted into electric charge according to the amount of light received. In addition, in this embodiment, the camera 4 is equipped with four CCD image sensors for each color component of R, G, B, and IR, and the charge output from each light receiving element is used as an output signal (shooting data) by the abnormality detection unit 5. ) is entered. In addition, a plurality of cameras may be provided in the width direction of the laminate floor 9, depending on the width of the laminate floor 9, so that the entire width of the laminate floor 9 can be captured.

The abnormality detection unit 5 includes a red signal processing unit 51, a green signal processing unit 52, and a blue signal processing unit 53, which process the captured data output from the camera 4 for each R, G, B, and IR component, respectively. It has an infrared signal processing unit 54. The red signal processing unit 51 performs shading correction on the R component signal (R signal) of 1 line (4096 pixels) output from the camera 4 and corrects unevenness of the output level for each light receiving element. Likewise, the green signal processing unit 52 is a G component signal (G signal), the blue signal processing unit 53 is a B component signal (B signal), and the infrared signal processing unit 54 is an IR component signal (IR signal). Shading correction is performed respectively. In this embodiment, the luminance value of each pixel after shading correction output from each signal processing unit is used as a characteristic quantity and has a range of, for example, 0 to 255.

Additionally, the abnormality detection unit 5 may perform normalization so that the output pixel value corresponding to the non-abnormal part of the reinforced floor 9 is the median of the range (0 to 255). In this case, the standardized pixel value becomes smaller as the degree of decrease in the output pixel value (amount of light received by the camera) increases, and becomes larger as the degree of increase in the output pixel value (amount of light received by the camera) increases, thus determining the degree of variation in the output pixel value. has a correlation with

Additionally, the abnormality detection unit 5 includes a detection determination unit 55 that detects abnormalities included in the reinforced floor 9 according to preset inspection standards. In this embodiment, as will be described later, abnormalities are detected and strengthened by determining whether the luminance value of the image of the reinforced floor 9 obtained from the camera 4 is distributed beyond the threshold value corresponding to each preset abnormality. The type of abnormality present in the floor 9 is determined. Additionally, the inspection standards are appropriately read from the storage device 6 as needed.

Additionally, the abnormality detection unit 5 is provided with an output unit 56 that outputs information regarding the inspection. The information output destination is typically a display device, but it can also output information to a printing device, output a message or alert from a speaker, send a message by e-mail or the like to a user terminal, or transmit information to an external computer. .

In this way, by outputting information about the abnormal part, the user (inspector) can understand the details of the abnormality in detail, determine whether the abnormality should be considered a defect (defect), or determine the manufacturing or operating conditions of the production facility. This can be helpful for feedback, etc.

The memory device 6 is provided with a pattern map storage unit 61, an inspection standard storage unit 62, an inspection program storage unit 63, and a defective product information storage unit 64.

The pattern map storage unit 61 has a function of holding the feature quantity distribution data obtained by processing the image of the reinforced floor 9 as a pattern map. The pattern map is created and held for each type of feature quantity according to the product to be inspected, the type of abnormality detected as the abnormality.

Hereinafter, the feature pattern map will be described in detail based on FIGS. 2 and 3.

Figure 2A shows the distribution of luminance values of each pixel in an image of a predetermined range (for example, 1000 lines, i.e. 1000 x 4096 pixels in this embodiment) of the reinforced floor 9 taken in a state without any abnormalities. It is a histogram representing . The horizontal axis represents the luminance value (0 to 255), and the vertical axis represents the number of pixels with each luminance value. When the reinforced floor 9 is a good reinforced floor, the luminance value obtained from the image data of the good product (i.e., no abnormal part) is such that the luminance value representing the bonded part becomes the peak (i.e., mode), as shown in FIG. 2A. Distributed in mountain form.

Figure 2B is a histogram of an image taken when a reinforced floor 9 with an abnormality of foreign matter mixed in was photographed under the same conditions. If a foreign substance is mixed, the luminance value of the relevant part is lowered, so as shown in FIG. 2B, the luminance value is adjusted to form a mountain representing the luminance value of the part with no abnormality and a small mountain with a low luminance value indicating the foreign matter part. This is distributed.

Figure 2C is a histogram of an image taken when a reinforced floor 9 with a pinhole abnormality is photographed. When there is an abnormality in the pinhole, contrary to the contamination of foreign matter, the luminance value of the relevant part increases, so as shown in Figure 2C, there is a peak representing the luminance value of the part without an abnormality and a high luminance value indicating the foreign matter part. The luminance values are distributed to form small mountains.

In this way, since there is a correlation between the presence and type of abnormality and the distribution of luminance values, it is possible to specify the presence or absence and type of abnormality from the distribution state of the luminance value.

Figure 3 is a pattern map that integrates the distribution of luminance values representing the parts without abnormal parts and various abnormal parts extracted from the image of the reinforced floor 9 into one. The horizontal axis represents the luminance value, and the vertical axis represents the amount of pixels with that luminance value. However, unlike the histogram shown in FIG. 2, the total number of pixels does not match the total number of pixels in an image of a certain resolution.

It represents the relationship between the state of the reinforced floor 9 and the distribution of luminance values (the size of the luminance value and the amount of pixels with that luminance value).

In the pattern map storage unit 61, such pattern maps are held for each color component of each product to be inspected. For example, in the case of a uniform product, it becomes a pattern map having the shape of the part shown in FIG. 3A. On the other hand, in the case of a product containing a loose joint, such as a non-woven fabric, the pattern map has a shape in which the joint portion is distorted low, as shown in FIG. 3B. Additionally, in the case of a thin product, as shown in FIG. 3C, the pattern map has a shape in which the luminance value of the bonded portion is shifted to an overall high level.

The inspection standard storage unit 62 holds inspection standards for each product subject to inspection. The inspection standard is a combination of the type of color component used for abnormality detection and the threshold value corresponding to each abnormality.

The inspection program storage unit 63 holds an inspection program corresponding to each product subject to inspection. Information for executing appropriate processing in the laminate floor inspection device 1, such as what image data to acquire according to the nature and condition of the product, and what characteristic quantities to extract for comparison with inspection standards, is held. In the defective product information storage unit 64, a defective product image for each product and a feature quantity distribution corresponding to the image are held for each type of feature quantity. Additionally, the defective product image may be an image of a sample product, an actual defective product image that is appropriately accumulated, or all of these may be held.

Additionally, these various types of information in the storage device 6 can be referenced and linked with each other, and function as a so-called relational database. For this reason, arbitrary information can be easily accessed by searching based on one viewpoint.

(How to set inspection standards)

Next, a method of setting a standard for abnormality detection based on the feature pattern map will be described based on FIGS. 4 and 5. Figure 4 is a flowchart showing an example of a method for setting the inspection threshold of the laminate floor inspection device 1. Figure 5 is a diagram showing the relationship between a pattern map and an inspection threshold. FIG. 5A shows a pattern at the time of initial setting of the laminate floor inspection device 1, FIG. 5B shows a pattern at the start of the laminate floor inspection device 1, and FIG. 5C shows a pattern at the time of verification after inspection by the laminate floor inspection device 1. It shows the relationship between the map and the inspection threshold, respectively.

As shown in FIG. 4, when starting up the laminate floor inspection device 1, first, the luminance value of each color component is extracted from each image using a defective sample image according to the type of abnormality to be detected, and the luminance value of each color component is extracted according to the type of abnormality. Obtain the distribution status of the luminance value (Step S101) For example, an image is acquired by photographing a part (cut sample) of the reinforced floor including an abnormal part with the reinforced floor inspection device 1, and the luminance value is obtained from the image. It can be extracted. Here, the acquired defective sample image and the corresponding feature quantity distribution are held in the defective product information storage unit 64.

Next, a provisional pattern map is created by integrating the distribution of luminance values obtained in step S101, and a threshold value is set based on the provisional pattern map (step S102) (see FIG. 5A). The threshold value is set for each color component. Performed for each luminance value. Here, the set threshold value is held in the inspection standard storage unit 62.

Next, a test run is performed to determine whether the abnormality can be correctly detected based on the threshold value set in step S102. For example, instead of a cut sample, as with a normal product, one roll of laminate floor is continuously inspected by the laminate floor inspection device 1 (step S103). Through the roll test, the laminate floor 9 ), at least one roll of data regarding the distribution of luminance values extracted from the image can be obtained. Data acquired in this way can also be stored in the storage device 6.

Additionally, the test run may not necessarily be based on a roll test, but may be based on a test run of an actual line.

For example, this method is efficient when the inspection device and the laminate floor manufacturing process (device) are integrated.

Next, the information in the temporary pattern map is updated based on the distribution information of the luminance value acquired by performing the trial run in step S103, and a pattern map for inspection is created (step S104). Then, the threshold is determined based on the pattern map for inspection. The necessity of performing value correction is determined (step S105). If it is determined that there is no need to perform threshold correction, the threshold value is set as the official threshold value and the process proceeds to step S107.

On the other hand, if it is determined that it is necessary to perform threshold correction based on the pattern map for inspection, the false threshold value is corrected to become the official threshold value (step S106). Figure 5B shows the “faint threshold value” set based on the temporary pattern map. Since it was found that the threshold value of “slight contamination” overlaps with the range of the luminance value distribution indicating staining according to the inspection pattern map, the threshold value of “slight contamination” was modified to a smaller value based on the inspection pattern map. It shows an example.

In this way, when the inspection standard is set based on the formal threshold value and the laminate floor inspection device 1 is officially put into operation, data on the luminance value distribution extracted from the image of the laminate floor 9 as the inspection is performed It is acquired at any time. Therefore, the pattern map is updated appropriately based on the data acquired in this way (step S107).

In this way, as data is accumulated through inspection, the precision of the pattern map increases, so a determination of the need for modification of the inspection standard is made based on the highly accurate pattern map at an appropriate timing (step S108). Here, modification of the inspection standard is performed. If it is determined that it is not necessary, this routine is terminated.

On the other hand, in step S108, if it is determined that the inspection standard needs to be modified, the inspection standard is modified to be appropriate (step S109), and this routine ends once. Here, the judgment in step S108 and the correction in step S109 are performed, for example, as follows.

Figure 5C shows that when steps S103 to S106 are performed based on the luminance value by one color component and the actual inspection by the laminate floor inspection device 1 is performed based on the inspection standard of only the luminance value by one color component, This is a diagram showing a state in which the pattern map has been further updated based on the data acquired accordingly. According to this pattern map, it can be seen that in the luminance value of one color component, there is a risk that an abnormality of “light contamination” may be missed, or that normal formation may be detected as an abnormality of “light contamination”.

For this reason, a new inspection standard using the luminance values of different color components is set to properly detect abnormalities of “light contamination.” For example, in the above-mentioned inspection standard, when the inspection standard is set using the luminance value of the blue component for all types of abnormalities, the newly established inspection standard sets a threshold value based on the luminance value of the red component for “light contamination.” You can use it to detect abnormalities and set new inspection standards. In addition, as described above, since the inspection standard is a combination of the type of color component and the threshold value corresponding to each abnormality, even when only the threshold value is modified as in steps S103 to S106, either the color component or the threshold value is used. The case of performing correction also corresponds to modification of the inspection standard referred to here.

Additionally, steps S107 to S109 may be repeated at predetermined intervals while the laminate floor inspection device 1 is in operation. In this way, the precision of the inspection standard can be increased by accumulating inspection results. Additionally, updating the pattern map and optimizing inspection standards can be performed automatically by a program or manually by an operator.

＜Modification example＞

In the above embodiment 1, the control panel 2, the abnormality detection unit 5, and the storage device 6 were described as separate configurations, but the abnormality detection unit 5 and/or the storage device 6 are included in the control panel 2. It can also be configured as an integrated installation.

Additionally, in Example 1, the characteristic quantity was set as luminance value, but it could also be, for example, color, brightness, or saturation.

In this case, a function for converting an RGB color image obtained by combining RGB signals into a format such as an HSV color model and outputting the value of each pixel after conversion can be added to the abnormality detection unit 5. Additionally, the method for converting RGB color to another color model can widely employ existing, well-known technologies.

In this way, compared to using luminance as a characteristic quantity, inspection can be performed with colors closer to human visual function, and at the same time, indices appropriate for abnormality detection can be extracted depending on the type and degree of abnormality.

In addition, in Example 1, the irradiated light from the visible light source 31 for transmission was white visible light, but lighting means such as LEDs with a limited wavelength range were used, or wavelength ranges were limited using a wavelength filter. You can also use it.

Additionally, instead of the transmission infrared light source 32, a light source that irradiates ultraviolet rays may be used. In this case, the camera 4 is provided with a sensor that is sensitive to ultraviolet rays.

Additionally, in Example 1, the feature quantity extraction and anomaly detection process were performed for each image of a plurality of lines, but it is not necessarily necessary to do this, and the feature quantity extraction and anomaly detection process may be performed for each line. there is. Additionally, the camera 4 was a line sensor camera with light-receiving elements arranged in series, but it can also be an area sensor camera with sensors arranged vertically and horizontally.

In addition, in Example 1, the reinforced floor 9 is photographed using the visible light source 31 for transmission and the infrared light source 32 for transmission, but this can also be performed using a reflected light source. In addition, by combining these, the reinforced floor 9 can be photographed using transmitted light and reflected light. In addition, a photographing means can also be placed on the lower surface of the reinforced floor 9, and images by reflected light can be captured from each of the upper and lower surfaces of the reinforced floor 9. By performing abnormality detection and discrimination of the type of abnormality based on the characteristic quantities obtained from various images captured in this way, inspection with higher precision can be performed.

<Example 2>

(System configuration)

Next, the inspection system 11 according to this embodiment will be described. Also, in this embodiment, the point of using the feature quantity distribution situation as a pattern map and the point of setting the inspection standard based on the pattern map are the same as in Example 1, so detailed description is omitted. In addition, regarding the configuration of the inspection system 11, which exhibits the same function as the laminate floor inspection device 1 of Example 1, the purpose will be mentioned and detailed description will be omitted.

Fig. 6 is a block diagram showing a configuration example of the inspection system 11 according to this embodiment. The inspection system 11 of this embodiment is comprised of a management terminal 12, a server 13, and one or more inspection devices 14 connected to each other through a communication line.

The inspection device 14 determines whether there is an abnormality in the laminate floor, the type of abnormality, etc. by photographing the laminate floor and comparing the characteristic quantities obtained by processing the acquired image with a pre-registered inspection standard. The hardware configuration for this includes a laminate floor transport unit, camera, lighting device, RAM, CPU, etc. Additionally, an output unit such as a monitor or an input unit such as a mouse may be provided. Additionally, the “feature quantity” is, for example, luminance, brightness, saturation, color, etc. of each pixel of acquired image data.

The management terminal 12 is typically a stationary terminal equipped with an output unit 122 such as a display monitor, an input unit 121 such as a keyboard or mouse, a memory 123 such as RAM, and a processing unit 124 such as a CPU. It may be a mobile or tablet type terminal, or may be integrated with the inspection device 14.

The management terminal 12 sets the inspection standards used by the inspection device 14 (including changes, hereinafter the same), creates inspection programs (including modifications, the same hereinafter), and patterns held by the server 13. It is used for registering and updating maps, product information, defective product information, inspection device information, etc. Additionally, setting of the inspection standard is performed based on the pattern map.

The management terminal 12 also includes a manufacturing process management unit 125 that monitors the manufacturing process of the laminate floor based on a pattern map accumulated in the server 13, which will be described later. In addition, it is provided with an inspection device management unit 126 that monitors the inspection device 14 based on a pattern map accumulated in the server 13, which will be described later.

Here, monitoring of the manufacturing process refers to continuously determining whether abnormalities in the manufacturing process that affect the quality of the product occur. In addition, monitoring of the inspection device 14 refers to continuously determining whether abnormalities such as deterioration or failure occur in the physical components of the inspection device 14. Additionally, the management terminal 12 in this embodiment corresponds to “control means.”

The server 13 stores various data. For example, the information includes a pattern map, information on the product to be inspected, defective product information (image data, etc.) for each product to be inspected, and information about the inspection device 14. The server 13 in this embodiment corresponds to the “storage means”.

The server 13 includes a pattern map storage unit 131, an inspection standard information storage unit 132, an inspection program storage unit 133, a defective product information storage unit 134, a product information storage unit 135, and an inspection device information storage unit. Part 136 and the like are installed.

The pattern map storage unit 131 has a function of holding the feature quantity distribution data obtained by processing the image of the reinforced floor as a pattern map. The pattern map is created and held for each type of feature quantity according to the product to be inspected, the type of abnormality detected, and the configuration of the inspection device 14 (including specifications, the same hereinafter). Additionally, if the product to be inspected has a history of inspection with an inspection device 14 of a different configuration, or is scheduled to be inspected with an inspection device 14 of a different configuration, each of those different configurations The corresponding pattern map is maintained.

The inspection standard information storage unit 132 holds inspection standards for each product subject to inspection. The inspection standard is a combination of the type of characteristic quantity used for abnormality detection and the threshold value corresponding to each abnormality. Additionally, if the product to be inspected has a history of inspection with an inspection device 14 of a different configuration, or is scheduled to be inspected with an inspection device 14 of a different configuration, each of those different configurations The corresponding inspection criteria are held.

The inspection program storage unit 133 holds an inspection program corresponding to each product subject to inspection. For example, depending on the nature and state of the product, the configuration of the inspection device 14, etc., it is necessary to perform appropriate processing on the inspection device 14, such as what image data to acquire and what feature quantities to extract for comparison with the inspection standard. Information is held.

In the defective product information storage unit 134, a defective product image for each product and a feature quantity distribution corresponding to the image are held for each type of feature quantity. Additionally, the defective product image may be an image of a sample product, an actual defective product image that is appropriately accumulated, or all of these may be held.

The product information storage unit 135 holds information about specifications for each product to be inspected, information about the manufacturing process, images of sample good products, etc. Product specifications include, for example, material, thickness, sparsity, processing method, etc.

Information regarding the inspection device 14 is held in the inspection device information storage unit 136. Specifically, the product number, specifications, operation performance, product to be inspected, maintenance information, etc. of the inspection device. Here, the specifications include, for example, the type of image to be captured (transmitted image, reflected image), the type of light source used (irradiation direction, wavelength), camera performance (mounted sensor, resolution capability), etc. Additionally, the information regarding the inspection device 14 is not limited to the inspection device 14 existing within the current inspection system 11.

These various types of information in the server 13 can be referenced and linked with each other, and function as a so-called relational database.

For this reason, it is possible to easily access arbitrary information by searching based on one viewpoint.

(Management and use of information by management terminal)

The inspection system 11 according to this embodiment may include a plurality of inspection devices 14. It may include a plurality of inspection devices 14 that target devices with the same specifications and/or the same product, or may include a plurality of inspection devices 14 that target devices with different specifications and/or different products. And, various information regarding these is held on the server 13, and the information is managed and utilized by the management terminal 12. For this reason, in this embodiment, the pattern map can be utilized as follows.

For example, when the same product is inspected by multiple inspection devices 14 (i.e., on multiple lines), the pattern map is updated according to the inspection performance for each line. FIG. 7 is a diagram showing that, when there are multiple pattern maps with the same feature amount for the same product, these pattern maps are integrated to form a new pattern map.

Figure 7A shows a pattern map based on feature quantities acquired by a first inspection device, Figure 7B shows a pattern map based on feature quantities acquired by a second inspection device, and Figure 7C integrates these two pattern maps. It represents a new pattern map.

In this way, if the pattern map is uniformly updated based on the inspection performance on multiple lines and the inspection standard is set accordingly, the inspection standard can be fed back to all of the inspection devices 14 that inspect the same product with the same characteristic amount. and can prevent imbalance in inspection quality for the same product.

In addition, by having the server 13 configured to be separate from the inspection device 14, for example, when the inspection device 14 is converted to a new one due to equipment update, the pattern map and inspection standard by the device before the update are used. It is easy to inherit and use for initial inspection.

(Manufacturing process monitoring by management terminal)

Next, a method for monitoring the laminate floor manufacturing process by the management terminal 12 will be described. The server 13 stores a pattern map for each product subject to inspection, and when inspection is performed by the inspection device 14, data regarding the distribution of luminance values extracted from the image of the laminate floor is acquired accordingly. .

Here, the manufacturing process management unit 125 compares the pattern map of the target product with the characteristic quantity distribution acquired from the inspection device 14 to determine whether the distribution of the normal bonded portion deviates from the allowable range in comparison with the pattern map. decide.

In addition, it is also possible to determine whether a new type of abnormality has been detected, that is, whether data with a characteristic quantity distribution situation that has not been conventionally assumed has been acquired.

For example, even if a conventional abnormality is not detected from the laminate floor (i.e., even if it does not exceed the threshold based on a preset inspection standard), if the characteristic quantity distribution situation of the normal joint part deviates from the standard pattern map, the product It may be thought that there is a problem with the quality of the product. In this case, a warning that an abnormality has occurred during the product manufacturing process may be issued. Additionally, by continuously performing the above processing at predetermined intervals, continuous management of the manufacturing process becomes possible.

(Inspection device monitoring by management terminal)

Additionally, a method of performing monitoring of the inspection device 14 by the management terminal 12 will be described. When performing an inspection using the same inspection device 14 for the same product, the inspection device management unit 126 compares the pattern map used for the inspection and the feature quantity distribution obtained from the inspection device 14, and It is determined whether the distribution of the joint portion deviates from the allowable range in comparison with the pattern map.

For example, if the feature quantity distribution acquired by the inspection device 14 shifts to a lower value as a whole compared to the pattern map, it is assumed that the lighting device or imaging device of the inspection device 14 is deteriorated.

Additionally, it is possible to determine whether a new type of abnormality has been detected, that is, whether data with a characteristic quantity distribution situation that has not been conventionally assumed has been acquired. For example, it is conceivable that a characteristic quantity distribution situation that was not conventionally assumed may occur due to an abnormality in the laminate floor conveyance device.

Additionally, in the above case, it is possible to consider that some abnormality has occurred in the inspection device 14 and issue a warning. Additionally, by continuously performing the above processing at predetermined intervals, continuous management of the manufacturing process becomes possible.

In addition, the monitoring of the inspection device 14 in this embodiment has been explained on the premise that the inspection device 14 is a device independent of the laminate floor manufacturing process. However, the inspection device 14 can be configured to be installed within the manufacturing process. It may be possible. In that case, the laminate floor conveyance device is shared with the manufacturing process.

＜Other＞

Each of the above embodiments merely illustratively explains the present invention, and the present invention is not limited to the above specific embodiments. The present invention is capable of various modifications and combinations within the scope of its technical idea. For example, the inspection apparatus of each of the above embodiments may be configured to be connected to a cloud server or an external management terminal through cloud computing.

As described in detail above, the laminate floor inspection device according to the present invention can perform high-precision inspection from the initial state of startup of the inspection device, which has the effect of increasing inspection accuracy and efficiency.

Meanwhile, the embodiments disclosed in these drawings are merely provided as specific examples to aid understanding, and are not intended to limit the scope of the present invention. It is obvious to those skilled in the art that in addition to the embodiments disclosed herein, other modifications based on the technical idea of the present invention can be implemented.

1...laminate floor inspection device 2...control panel
31...Visible light source for transmission 32...Infrared light source for transmission
4...camera 5...abnormality detection unit
6...Memory 9...Laminated floor
11...Inspection system 12...Management terminal
13...server 14...test device

Claims (2)

A laminate floor inspection device that inspects defects in the laminate floor,
Illumination means for irradiating light to the laminate floor;
photographing means for photographing an image of the laminate floor using reflected light and/or transmitted light of light irradiated to the laminate floor from the illumination means;
abnormality detection means for detecting an abnormality included in the reinforced floor from a characteristic quantity distribution situation obtained by processing image data of an image captured by the photographing means; and
and storage means for maintaining the characteristic quantity distribution situation representing the abnormality-free portion and the abnormal portion of the reinforced floor as a pattern map,
The abnormality detection means detects an abnormality in the reinforced floor based on the pattern map,
The storage means further stores image data of defective products and/or feature quantities obtained by processing image data of defective products,
A laminate floor inspection device wherein the abnormality detection means detects an abnormality by using a threshold value set based on a characteristic quantity obtained by processing image data of a defective product.
According to paragraph 1,
A laminate floor inspection device wherein the abnormality detection means detects an abnormality in the laminate floor using a threshold value set based on the pattern map.