KR20230100525A - A x-ray detector comprising automatic exposure control sensors and a method for operating the same - Google Patents

Abstract

Provided are an X-ray detector which automatically corrects an automatic exposure control (AEC) area based on an image acquired by using the AEC sensor and an operating method thereof. To this end, the X-ray detector according to one embodiment of the present invention may: detect the X-ray which has penetrated a target object by using the AEC sensor array; acquire a first dimensional (1D) image by digitizing the dose of the detected X-ray into a signal value; identify a symmetric point from the first dimensional image based on the signal value of each pixel of the first dimensional image; and adjust the location of the plurality of AEC sensing areas such that the plurality of AEC sensing areas may be symmetric around the identified symmetric point.

Description

X-ray detector including AEC sensor and its operating method {A X-RAY DETECTOR COMPRISING AUTOMATIC EXPOSURE CONTROL SENSORS AND A METHOD FOR OPERATING THE SAME}

The present disclosure relates to an X-ray detector including an automatic exposure control (AEC) sensor and an operating method thereof. Specifically, the present disclosure relates to an X-ray detector that corrects an AEC sensing area based on an image representing a dose of X-rays detected using an AEC sensor array, and an operation method thereof.

An X-ray detector is a device that acquires an image from an X-ray imaging device. The X-ray detector detects the transmitted X-rays after X-rays emitted by an X-ray source (or X-ray tube) pass through an object (eg, a patient), and converts the detected X-rays into electrical signals. It is a device that generates an X-ray image by outputting it. In the case of Room DR, various automation functions such as automatic X-ray source-X-ray detector alignment or AEC (Automatic Exposure Control) are added according to the progress of shooting automation, so that the radiographer's work and plays a role in reducing the quality deviation of the captured image. The AEC sensor is installed in the bucky of the room X-ray device (Room DR) and detects the amount of X-rays emitted from the X-ray source in real time and converts the cumulative dose value into a voltage value and outputs it. The X-ray detector may transmit an X-ray blocking signal for blocking X-ray emission of the X-ray source to the X-ray source when the output voltage value exceeds a predetermined threshold value. Through this, it is possible to maintain a constant dose of X-rays reaching the X-ray detector and maintain uniform image quality regardless of various imaging protocols, differences among patients, or differences between imaging regions.

A typical AEC sensor is manufactured in the form of an ion chamber using air and placed on the front of the X-ray detector. After applying an appropriate voltage to the ion chamber, air ions ionized by X-rays are collected, and the resultant charge is converted into voltage, amplified and accumulated. The ion chamber AEC sensor compares a voltage value that increases in real time with a voltage value corresponding to a preset target dose, and stops X-ray emission by an X-ray source when the two values match.

In order for the AEC sensor to operate the AEC function without problems, the selected AEC sensor needs to be accurately positioned on the target part. In the case of Room DR, the AEC sensor panel is located inside the bucky, so it is precisely aligned with the X-ray detector, and also with the X-ray source, such as electronic control system or mechanical matching method. sorted through In addition, since the patient's anatomical part must be matched to the AEC sensor, crosshair-shaped light irradiation is used. In particular, in the case of the stand bucky, the AEC sensor area is marked on the surface so that the radiologist can refer to it to position the patient. That is, in order to use the AEC function, it is very important to align the X-ray source-patient-AEC sensor-X-ray detector.

Recently, mobile X-ray detectors or portable X-ray detectors are popular and widely used. In the case of a mobile X-ray detector including an AEC sensor, since the X-ray detector is located on the back of a patient during X-ray imaging, a radiologist must visually check the outside of the X-ray detector and the anatomical structure of the patient. Therefore, in the case of a mobile X-ray detector, alignment between an X-ray source, a patient, an AEC sensor, and an X-ray detector may not be accurately achieved. If the alignment accuracy between the X-ray source-patient-AEC sensor-X-ray detector is low, the possibility of malfunction increases, and if the degree of misalignment is large, there is a risk of accidents such as over-irradiation of X-rays.

As a way to solve the above problem, a method of attaching a position detection sensor to the AEC sensor, determining the relative position with the X-ray source, and proceeding with prior notification or post-correction according to the alignment state may also be considered. However, in the case of a position detection sensor, there are limitations in that it is an expensive part and its accuracy and reliability are not high.

The present disclosure provides an X-ray detector for automatically correcting an AEC sensing area based on an image obtained using an AEC sensor and an operating method thereof. An embodiment of the present disclosure provides an X-ray detector that adjusts the position of an AEC sensing region based on an image representing a dose of X-rays detected using an AEC sensor array.

In order to solve the above technical problem, the present disclosure provides an X-ray detector including an AEC (Automatic Exposure Control) sensor and correcting an AEC sensing area. An X-ray detector according to an embodiment of the present disclosure includes a plurality of pixels, a plurality of photodetector elements for detecting X-rays, detects X-rays transmitted through an object, and converts the dose of the detected X-rays into a signal value. An AEC sensor array that quantifies and outputs an AEC sensor array, a memory that stores at least one instruction, and at least one processor that executes the at least one instruction stored in the memory, wherein the at least one The processor acquires a 1D image based on the signal value output through the AEC sensor array, identifies a symmetric point from the 1D image based on the signal value of each pixel of the 1D image, and identifies the symmetric point. Positions of the plurality of AEC sensing regions may be adjusted so that the plurality of AEC sensing regions are symmetrical about the symmetrical point.

In one embodiment of the present disclosure, the AEC sensor array may be a line-type sensor array composed of a plurality of photodetector elements arranged in a first direction among the plurality of photodetector elements.

In one embodiment of the present disclosure, the AEC sensor array includes a plurality of AEC sensors, and at least one AEC sensor of the plurality of AEC sensors may be disposed at a position within the plurality of AEC sensing areas.

In one embodiment of the present disclosure, the at least one processor calculates an average value of differences in signal values from pixels spaced apart around each of a plurality of pixels included in the one-dimensional image, and A minimum value among average values calculated for each pixel may be searched, and a position of a pixel having the searched minimum value among the plurality of pixels may be identified as the symmetry point.

In one embodiment of the present disclosure, the at least one processor detects a plurality of edge points based on signal values of a plurality of pixels of the one-dimensional image, and a pair of corresponding edge points among the plurality of detected edge points. (pair) may be obtained, the location of the center point of the obtained pair of boundary points may be calculated, and the location of the calculated center point may be identified as the symmetry point.

In one embodiment of the present disclosure, the AEC sensor array includes a first AEC sensor array and a second AEC sensor array disposed in a parallel line form, and the at least one processor uses the first AEC sensor array to The symmetrical point may be identified using a sum of a signal value for each pixel of the acquired first 1D image and a signal value for each pixel of the second 1D image obtained using the second AEC sensor array.

In one embodiment of the present disclosure, the AEC sensor array is composed of a plurality of arrays, and the at least one processor identifies a plurality of symmetrical points from the one-dimensional image obtained using the plurality of AEC sensor arrays, and the plurality of AEC sensor arrays. A symmetric axis is obtained by connecting the symmetric points of , and the positions of the plurality of AEC sensing areas can be changed so that the plurality of AEC sensing areas disposed on the left and right with respect to the symmetry axis are symmetrical about the symmetry axis.

In one embodiment of the present disclosure, the at least one processor obtains the location of the central point of the plurality of AEC sensing areas disposed on the left and right around the identified symmetrical point, and the obtained location of the central point is the location of the symmetrical point. Positions of the plurality of AEC sensing regions may be changed to coincide with .

In one embodiment of the present disclosure, the at least one processor reads out X-rays detected through a plurality of AEC sensors included in the AEC sensor array at a preset sampling rate, The 1D image may be acquired in real time, a symmetrical point may be identified in real time according to the obtained 1D image, and positions of a plurality of AEC sensing areas may be adjusted.

In one embodiment of the present disclosure, the X-ray detector further includes a communication interface, and the at least one processor adjusts the dose of X-rays detected in the plurality of AEC sensing areas to a preset cut-off threshold (cut-off threshold). off threshold), and as a result of the comparison, if the dose of the detected X-ray exceeds the cut-off threshold, the communication interface may be controlled to transmit an X-ray blocking signal to the X-ray source control unit.

Another embodiment of the present disclosure in order to solve the above technical problem, an X-ray detector including an AEC sensor provides a method for correcting an AEC sensing area. The method includes the steps of acquiring a one-dimensional (1D) image by detecting X-rays passing through an object using an AEC sensor array and digitizing the dose of the detected X-rays as a signal value; Identifying a symmetric point from the one-dimensional image based on the signal value of each pixel of the image, and determining the locations of the plurality of AEC sensing areas so that the plurality of AEC sensing areas are symmetrical about the identified symmetric point. Adjustments may be included.

In one embodiment of the present disclosure, the AEC sensor array may be a line-type sensor array composed of a plurality of photodetector elements arranged in a first direction among a plurality of photodetector elements constituting the X-ray detector.

In one embodiment of the present disclosure, at least one AEC sensor among a plurality of AEC sensors included in the AEC sensor array may be disposed at a position within the plurality of AEC sensing areas.

In one embodiment of the present disclosure, the identifying of the symmetrical point may include calculating an average value of differences between signal values of pixels spaced apart from each other around the plurality of pixels included in the one-dimensional image; The method may include searching for a minimum value among average values calculated for each pixel, and identifying a location of a pixel having the searched minimum value among the plurality of pixels as the symmetrical point.

In one embodiment of the present disclosure, the identifying of the symmetric point may include detecting a plurality of edge points based on signal values of a plurality of pixels of the one-dimensional image, and corresponding ones of the plurality of edge points detected. The method may include acquiring a pair of boundary points, calculating a location of a center point of the pair of obtained boundary points, and identifying the location of the calculated center point as the symmetry point.

In one embodiment of the present disclosure, the AEC sensor array includes a first AEC sensor array and a second AEC sensor array disposed in the form of parallel lines, and the identifying of the symmetrical point uses the first AEC sensor array. The symmetrical point may be identified using the sum of the signal value for each pixel of the first 1D image obtained through the above process and the signal value for each pixel of the second 1D image obtained using the second AEC sensor array.

In one embodiment of the present disclosure, the step of identifying the symmetrical point is the step of identifying a plurality of symmetrical points from the one-dimensional image obtained using a plurality of AEC sensor arrays, and a symmetric axis by connecting the plurality of symmetrical points. ), and in the step of adjusting the positions of the plurality of AEC sensing areas, the plurality of AEC sensing areas disposed on the left and right with respect to the axis of symmetry are symmetrical about the axis of symmetry. position can be changed.

In one embodiment of the present disclosure, the adjusting of the positions of the plurality of AEC sensing areas may include acquiring positions of central points of the plurality of AEC sensing areas disposed on left and right sides of the identified symmetrical point; The method may include changing locations of the plurality of AEC sensing regions so that a location of a center point coincides with a location of the symmetrical point.

In one embodiment of the present disclosure, the method may include comparing doses of X-rays detected in the plurality of AEC sensing regions with a predetermined cut-off threshold, and as a result of the comparison, the detected X-rays The method may further include transmitting an X-ray blocking signal to an X-ray source control unit when the dose exceeds the cut-off threshold.

In order to solve the above-described technical problem, another embodiment of the present disclosure provides a computer-readable recording medium recording a program for execution on a computer.

This disclosure may be readily understood in combination with the detailed description that follows and the accompanying drawings, wherein reference numerals denote structural elements.
1 is an external view showing the configuration of an X-ray imaging apparatus according to an embodiment of the present disclosure.
2 is a perspective view of an X-ray detector according to an embodiment of the present disclosure.
3 is a diagram illustrating an X-ray imaging apparatus including a mobile X-ray detector according to an embodiment of the present disclosure.
4 is a diagram illustrating an operation of an X-ray detector adjusting a position of an AEC sensing region based on an image obtained through an AEC sensor array according to an embodiment of the present disclosure.
5 is a block diagram showing components of an X-ray detector according to an embodiment of the present disclosure.
6 is a diagram illustrating structures of a photodetector element and an AEC sensor array among components of an X-ray detector according to an embodiment of the present disclosure.
7A is a diagram illustrating an arrangement structure of an AEC sensor array of an X-ray detector according to an embodiment of the present disclosure.
7B is a diagram illustrating an arrangement structure of an AEC sensor array of an X-ray detector according to an embodiment of the present disclosure.
8 is a flow chart illustrating an operating method of an X-ray detector according to an embodiment of the present disclosure.
9 is a diagram illustrating an operation of identifying a symmetrical point from a one-dimensional image by an X-ray detector according to an embodiment of the present disclosure.
10 is a flowchart illustrating an operating method for identifying a symmetrical point from a 1D image by an X-ray detector according to an embodiment of the present disclosure.
11 is a diagram illustrating an operation of identifying a symmetrical point from a one-dimensional image by an X-ray detector according to an embodiment of the present disclosure.
12 is a flowchart illustrating an operating method for identifying a symmetrical point from a 1D image by an X-ray detector according to an embodiment of the present disclosure.
13 is a diagram for explaining an operation of obtaining a one-dimensional image by an X-ray detector using a plurality of AEC sensor arrays according to an embodiment of the present disclosure.
14 is a diagram illustrating an operation of adjusting positions of a plurality of AEC sensing regions based on a symmetrical point by an X-ray detector according to an embodiment of the present disclosure.
15 is a diagram illustrating an operation of adjusting positions of a plurality of AEC sensing regions based on a symmetry point by an X-ray detector according to an embodiment of the present disclosure.
16 is a flowchart illustrating an operation method of an X-ray detector, an X-ray emitter, and a workstation according to an embodiment of the present disclosure.

The terms used in the embodiments of this specification have been selected from general terms that are currently widely used as much as possible while considering the functions of the present disclosure, but they may vary depending on the intention or precedent of a person skilled in the art, the emergence of new technologies, and the like. . In addition, in a specific case, there is also a term arbitrarily selected by the applicant, and in this case, the meaning will be described in detail in the description of the corresponding embodiment. Therefore, the term used in this specification should be defined based on the meaning of the term and the overall content of the present disclosure, not a simple name of the term.

Singular expressions may include plural expressions unless the context clearly dictates otherwise. Terms used herein, including technical or scientific terms, may have the same meaning as commonly understood by one of ordinary skill in the art described herein.

When it is said that a certain part "includes" a certain element throughout the present disclosure, it means that it may further include other elements, not excluding other elements unless otherwise stated. In addition, terms such as "...unit" and "...module" described in this specification mean a unit that processes at least one function or operation, which is implemented as hardware or software or a combination of hardware and software. can be implemented

The expression "configured to (or configured to)" used in the present disclosure means, depending on the situation, for example, "suitable for", "having the capacity to" ", "designed to", "adapted to", "made to", or "capable of" can be used interchangeably. The term "configured (or set) to" may not necessarily mean only "specifically designed to" hardware. Instead, in some contexts, the phrase "a system configured to" may mean that the system "is capable of" in conjunction with other devices or components. For example, the phrase "a processor configured (or configured) to perform A, B, and C" may include a dedicated processor (e.g., an embedded processor) to perform those operations, or by executing one or more software programs stored in memory; It may mean a general-purpose processor (eg, CPU or application processor) capable of performing corresponding operations.

In addition, in the present disclosure, when an element is referred to as "connected" or "connected" to another element, the element may be directly connected or directly connected to the other element, but in particular the opposite It should be understood that, as long as no description exists, it may be connected or connected via another component in the middle.

In the present disclosure, an 'object' is an object to be photographed, and may include a human, an animal, or a part thereof. For example, the object may include a body part (organ or organ) or a phantom.

In the present disclosure, 'X-ray' is an electromagnetic wave having a wavelength of 0.01 to 100 Å, and has the property of penetrating an object, so it is a medical device for imaging the inside of a living body or non-destructive inspection equipment for general industry etc. can be widely used in general.

In the present disclosure, an 'X-ray detector' detects X-rays emitted by an X-ray source (or X-ray tube) and transmitted through an object, and converts the detected X-rays into electric signals It is a device configured to convert to and measure an electrical signal. An X-ray detector according to an embodiment of the present disclosure, by using a thin film transistor (TFT) active matrix substrate on which a plurality of pixels for accumulating signal charges according to the incident amount of X-rays are arranged, signal charges are stored in a plurality of pixels. It may be a Flat Panel Detector (FPD) that detects an X-ray signal by accumulating each one and acquires X-ray image data of the object using the detected X-ray signal. However, the X-ray detector of the present disclosure is not limited to the FPD.

In the present disclosure, an 'Automatic Exposure Control (AEC) sensor' is a sensor configured to detect X-rays passing through an object, quantify a signal value representing a dose of the detected X-rays, and output the digitized value. An AEC sensor according to an embodiment of the present disclosure may be configured as an integrated sensor included in an X-ray detector.

In the present disclosure, an 'AEC sensing area' is an area set to perform an AEC function. The AEC sensing area may be set to perform an AEC function of detecting the dose of X-rays penetrating an object on the imaging surface of the X-ray detector and blocking the X-rays when the dose of the detected X-rays exceeds a preset threshold. there is.

Hereinafter, with reference to the accompanying drawings, embodiments of the present disclosure will be described in detail so that those skilled in the art can easily carry out the present disclosure. However, the present disclosure may be implemented in many different forms and is not limited to the embodiments described herein.

Hereinafter, embodiments of the present disclosure will be described in detail with reference to the drawings.

1 is an external view showing the configuration of an X-ray imaging apparatus 1000 according to an embodiment. In FIG. 1, a room X-ray imaging device (Room DR) will be described as an example.

Referring to FIG. 1 , an X-ray imaging apparatus 1000 includes an X-ray detector 100 that detects X-rays passing through an object P, and an X-ray emitter 200 that generates X-rays and radiates them to the object P ), and a workstation 300 receiving commands from the user and providing information. In addition, the X-ray imaging apparatus 1000 may include a control unit 330 that controls the X-ray imaging apparatus 1000 according to an input command and a communication unit 340 that communicates with an external device.

Some or all of the components of the control unit 330 and the communication unit 340 may be included in the workstation 300 or provided separately from the workstation 300 .

The X-ray radiator 200 may include an X-ray source that generates X-rays and a collimator that adjusts an X-ray irradiation area generated from the X-ray source.

A guide rail 30 may be installed on the ceiling of an examination room in which the X-ray imaging apparatus 1000 is disposed, and the X-ray emitter 200 is connected to the moving carriage 40 moving along the guide rail 30 so that the object ( The X-ray irradiator 200 can be moved to a position corresponding to P), and the mobile carriage 40 and the X-ray irradiator 200 are connected through a collapsible post frame 50 to form the X-ray irradiator 200. The height can be adjusted.

The workstation 300 may be provided with an input unit 310 for receiving user commands and a display unit 320 for displaying information.

The input unit 310 may receive commands for controlling a photographing protocol, photographing conditions, photographing timing, and position of the X-ray emitter 200 . The input unit 310 may include a keyboard, mouse, touch screen, voice recognizer, and the like.

The display unit 320 may display a screen for guiding a user's input, an X-ray image, a screen indicating a state of the X-ray imaging apparatus 1000, and the like.

The control unit 330 may control photographing timing and photographing conditions of the X-ray emitter 200 according to a command input from the user, and may generate a medical image using image data received from the X-ray detector 100. can Also, the controller 330 may control the position or posture of the X-ray emitter 200 or the mounting parts 14 and 24 on which the X-ray detector 100 is mounted according to the photographing protocol and the position of the object P.

The control unit 330 may include a memory storing a program for performing the above-described operation and an operation to be described later, and a processor for executing the stored program. The controller 330 may include a single processor or a plurality of processors. In the latter case, the plurality of processors may be integrated on a single chip or may be physically separated.

The X-ray imaging apparatus 1000 communicates with an external device (eg, an external server 2000, a medical device 3000, and a portable terminal 4000 (eg, a smart phone, a tablet PC, wearable device, etc.) to transmit or receive data.

The communication unit 340 may include one or more components enabling communication with an external device, and may include, for example, at least one of a short-distance communication module, a wired communication module, and a wireless communication module.

In addition, the communication unit 340 receives a control signal from an external device and transfers the received control signal to the controller 330 so that the controller 330 controls the X-ray imaging apparatus 1000 according to the received control signal. It is also possible to do

In addition, the controller 330 may transmit a control signal to the external device through the communication unit 340 to control the external device according to the control signal of the controller 330 . For example, the external device may process data of the external device according to a control signal of the control unit 330 received through the communication unit 340 .

In addition, the communication unit 340 may further include an internal communication module enabling communication between components of the X-ray imaging apparatus 1000 . A program capable of controlling the X-ray imaging apparatus 1000 may be installed in the external device, and this program may include instructions for performing some or all of the operations of the controller 330.

The program may be pre-installed in the portable terminal 4000, or the user of the portable terminal 4000 may download and install the program from a server providing applications. A server providing an application may include a recording medium in which a corresponding program is stored.

On the other hand, the X-ray detector 100 may be implemented as a fixed X-ray detector fixed to the stand 20 or table 12, detachably mounted to the mounting parts 14 and 24, or usable at any position. It may be implemented as a mobile x-ray detector or a portable x-ray detector. A mobile X-ray detector or a portable X-ray detector may be implemented as a wired type or a wireless type according to a data transmission method and a power supply method.

The X-ray detector 100 may or may not be included as a component of the X-ray imaging apparatus 1000 . In the latter case, the X-ray detector 100 may be registered with the X-ray imaging apparatus 1000 by a user. In addition, in both cases, the X-ray detector 100 may be connected to the controller 330 through the communication unit 340 to receive a control signal or transmit image data.

A sub user interface 80 may be provided on one side of the X-ray radiator 200 to provide information to the user and receive commands from the user, and the input unit 310 and the display unit 320 of the workstation 300 may be provided. Some or all of the functions performed by may be performed in the sub user interface 80.

When all or some of the components of the control unit 330 and the communication unit 340 are provided separately from the workstation 300, they may be included in the sub user interface 80 provided in the X-ray radiator 200.

The X-ray imaging device 1000 shown in FIG. 1 is a room X-ray imaging device connected to the ceiling of an examination room, but the X-ray imaging device 1000 is a C-arm type X-ray device, a mobile X-ray device, etc. It may include an X-ray device of various structures within a range obvious to the person.

2 is an external view of the X-ray detector 100.

Referring to FIG. 2 , the X-ray detector 100 may be implemented as a mobile X-ray detector. In this case, the X-ray detector 100 may operate wirelessly by including a battery that supplies power, and as shown in FIG. 2, the charging port 102 is connected by a separate power supply and cable C. It may be connected and operated.

Inside the case 104 forming the exterior of the X-ray detector 100, a detection element that detects X-rays and converts them into image data, a memory that temporarily or non-temporarily stores image data, and an X-ray imaging device 1000 A communication module for receiving a control signal from or transmitting image data to the X-ray imaging apparatus 1000 and a battery may be provided. In addition, image correction information of the detector and unique identification information of the X-ray detector 100 may be stored in the memory, and the stored identification information may be transmitted together when communicating with the X-ray imaging apparatus 1000.

3 is a diagram illustrating an X-ray imaging apparatus 1000 including a mobile X-ray detector 100 according to an embodiment of the present disclosure.

Referring to FIG. 3 , the X-ray imaging apparatus 1000 may include a mobile X-ray detector 100 . The mobile X-ray detector 100 is a movable or portable X-ray detector that can perform X-ray imaging regardless of a photographing location. The X-ray imaging apparatus 1000 shown in FIG. 3 may be an embodiment of the X-ray imaging apparatus 1000 shown in FIG. 1 . Among components included in the X-ray imaging apparatus 1000 shown in FIG. 3 , the same reference numerals as those in FIG. 1 are used, and overlapping descriptions are omitted.

The X-ray imaging apparatus 1000 shown in FIG. 3 guides the path of X-rays generated by the X-ray detector 100, an X-ray source 210 that generates X-rays, and irradiated by the X-ray source 210. X-ray irradiation unit 200 including a collimator 220 that adjusts the X-ray irradiation area by adjusting the X-ray irradiation area, the main unit 302 including a control unit 330 that controls the overall operation of the X-ray imaging apparatus 1000, and the X-ray It may include a high voltage generator 350 generating a high voltage applied to the source 210, a moving unit 360 provided with wheels for moving the X-ray imaging apparatus 1000, and a table 370.

The main unit 302 may further include a manipulation unit providing a user interface for manipulating the X-ray imaging apparatus 1000 . In FIG. 3, the control unit is illustrated as being included in the main unit 302, but is not limited thereto. For example, as shown in FIG. 1 , the input unit 310 and the display unit 320 of the X-ray imaging apparatus 1000 may be provided on one side of the workstation 300 (see FIG. 1 ).

The X-ray imaging apparatus 1000 may be implemented in a mobile type as well as the ceiling type described above. Although the X-ray detector 100 in FIG. 3 is shown as a table type disposed on a table 390, it is obvious that it can be implemented as a stand type as a mobile type or portable type.

FIG. 4 shows a plurality of AEC sensing regions SR1, SR2, It is a diagram showing an operation of adjusting the position of SR3).

Referring to FIG. 4 , the X-ray detector 100 may include an AEC sensor array 120. The AEC sensor array 120 may include a plurality of AEC sensors arranged along the first direction DR1 . The plurality of AEC sensors are sensors configured to detect X-rays transmitted through the object 10 and quantify the dose of the detected X-rays into signal values and output the result. A plurality of AEC sensors according to an embodiment of the present disclosure may be configured to sense visible light converted from X-rays by a scintillator, convert the visible light into an electrical signal, and output the converted voltage value. can In one embodiment of the present disclosure, the plurality of AEC sensors may be configured as some of the plurality of photodetector elements included in the X-ray detector 100 . However, it is not limited thereto. The plurality of AEC sensors may be implemented as, for example, a pixel related AEC (AEC) or an AEC related photo diode (AEC), but is not limited thereto.

In FIG. 4 , the AEC sensor array 120 is shown as a sensor array structure in the form of one line, but is not limited thereto. In one embodiment of the present disclosure, the X-ray detector 100 may include a plurality of AEC sensor arrays arranged in parallel lines.

The X-ray detector 100 may obtain a one-dimensional (1-Dimensional) image 400 representing the dose of X-rays detected using the AEC sensor array 120 as a signal value. The 1D image 400 may include information about signal values of pixels respectively corresponding to a plurality of AEC sensors included in the AEC sensor array 120 . In the embodiment shown in FIG. 4 , the one-dimensional image 400 includes a first pixel p ₁ representing a numerical value of a dose of X-rays detected by a first AEC sensor included in the AEC sensor array 120, 2 A second pixel (p ₂ ) representing the numerical value of the X-ray dose detected by the AEC sensor, a third pixel (p ₃ ) representing the numerical value of the X-ray dose detected by the third AEC sensor, and a fourth AEC A fourth pixel (p ₄ ) indicating a numerical value of the dose of X-rays detected by the sensor, and a fifth pixel (p ₅ ) indicating a numerical value of the dose of X-rays detected by the fifth AEC sensor may be included. . The first pixel (p ₁ ) to the fifth pixel (p ₅ ) are only for convenience of description, and pixels included in the 1D image 400 are not limited to the illustrated 5 pixels.

The X-ray detector 100 may identify a symmetrical point SP from the 1D image 400 based on a signal value for each pixel of the 1D image 400 . The 'symmetric point (SP)' may be a center point at which signal values of each of a plurality of pixels included in the 1D image 400 are symmetrical left and right. In one embodiment of the present disclosure, the X-ray detector 100 calculates an average value of differences in signal values from pixels spaced apart based on each of a plurality of pixels included in the one-dimensional image 400, and the calculated average value By searching for the minimum value of , the symmetry point SP can be identified. Referring to the embodiment shown in Figure 4, the X-ray detector 100 calculates the average value of the difference between the signal value and the other spaced apart pixels for each of the plurality of pixels (p ₁ to p ₅ ), and calculates A pixel (p ₃ in the embodiment shown in FIG. 4 ) having the smallest average may be searched for. The X-ray detector 100 may identify the location of the searched third pixel p ₃ on the imaging surface of the X-ray detector 100 as a symmetrical point SP.

In another embodiment of the present disclosure, the X-ray detector 100 detects a plurality of pixels corresponding to edge points in the one-dimensional image 400, and selects a pair of corresponding edge points among the identified plurality of pixels. obtained, and the central point of the obtained pair of boundary points may be identified as a symmetrical point (SP).

The X-ray detector 100 may adjust the positions of the plurality of AEC sensing regions SP1 , SP2 , and SP3 around the identified symmetrical point SP. The 'AEC sensing area' detects the dose of X-rays passing through an object on the imaging surface of the X-ray detector, and blocks the X-rays when the dose of the detected X-rays exceeds a preset threshold. It is an area set up to perform a function. In one embodiment of the present disclosure, the plurality of AEC sensing areas SP1, SP2, and SP3 are areas preset by an input received from a user (eg, a radiologist or doctor) or set to an initial setting value (default). It may be an area determined according to In one embodiment of the present disclosure, the X-ray detector 100 has a central point C of the first AEC sensing region SR1 and the second AEC sensing region SR2 disposed on the left and right around the identified symmetrical point SP. Location information of is acquired, and the locations of the first AEC sensing region SR1 and the second AEC sensing region SR2 may be changed so that the location of the center point C coincides with the location of the symmetry point SP. Referring to the embodiment shown in FIG. 4 , the X-ray detector 100 changes the position of the first AEC sensing region SR1 to SR1' and the position of the second AEC sensing region SR2 to SR2'. can In an embodiment of the present disclosure, the X-ray detector 100 has the same displacement value as the displacement values of the first AEC sensing region SR1 and the second AEC sensing region SR2 at the position of the third AEC sensing region SR3. can be changed. Referring to the embodiment shown in FIG. 4 , the X-ray detector 100 may change the position of the third AEC sensing region SR3 to SR3'.

In the case of a general mobile X-ray detector including an AEC sensor, since the X-ray detector is located on the back of the patient when taking X-rays, the user (for example, a radiologist or doctor) can see the outside of the X-ray detector and the patient's view through the eyes. Anatomical structures should be identified. Accordingly, the location of the mobile X-ray detector may be inaccurately arranged, and alignment between the X-ray source, the patient, the AEC sensor, and the X-ray detector may not be achieved. If the alignment accuracy between the X-ray source-patient-AEC sensor-X-ray detector is low, the possibility of malfunction increases, and if the degree of misalignment is large, there is a risk of accidents such as over-irradiation of X-rays. In particular, in the case of a mobile X-ray detector, since the X-ray detector located behind the patient is not visible, prediction of an X-ray dose may fail and an X-ray image having sufficient quality for reading may not be obtained.

As a way to solve this problem, a method of attaching a position detection sensor to the AEC sensor, determining a relative position with an X-ray source, and proceeding with prior notification or post-correction according to an alignment state may also be considered. However, in the case of a position detection sensor, there are limitations in that it is an expensive part and its accuracy and reliability are not high.

The X-ray detector 100 according to an embodiment of the present disclosure obtains a one-dimensional image 400 representing a numerical value of a dose of X-rays transmitted through an object 10 using the AEC sensor array 120, and A symmetrical point (SP) is identified from the dimensional image 400, and the positions of the plurality of AEC sensing regions (SR1, SR2, SR3) are adjusted around the symmetrical point (SP), thereby solving the X-ray over-irradiation problem of the patient in advance. and provide technical effects of obtaining high-quality X-ray images. In addition, the X-ray detector 100 according to an embodiment of the present disclosure may prevent retake due to a failure in predicting an X-ray dose and reduce an average dose of X-rays irradiated during imaging.

5 is a block diagram showing components of the X-ray detector 100 according to an embodiment of the present disclosure.

Referring to FIG. 5 , the X-ray detector 100 may include a photodetector 110 , an AEC sensor array 120 , a processor 130 , a memory 140 , and a communication interface 150 . Components shown in FIG. 5 are only according to one embodiment of the present disclosure, and components included in the X-ray detector 100 are not limited to those shown in FIG. 5 . The X-ray detector 100 may not include some of the components shown in FIG. 5 and may further include components not shown in FIG. 5 . For example, when the X-ray detector 100 is implemented as a mobile X-ray detector, the X-ray detector 100 may further include a battery.

The photodetector 110 and the AEC sensor array 120 will be described with reference to FIGS. 5 and 6 together.

The photodetector 110 detects X-rays that have been irradiated onto an object by an X-ray emitter 200 (see FIG. 1) (eg, an X-ray tube) and have passed through the object, and generates a signal corresponding to the intensity of the detected X-rays. electrical signals can be generated. The photodetection element 110 may be configured in plurality. The plurality of photodetector elements 110 may configure pixels arranged in an N×M two-dimensional shape. The photodetector 110 may include a scintillator 112 , a photodiode 114 , and a thin film transistor 116 .

The scintillator 112 is configured to convert X-rays transmitted through an object into visible light. The scintillator 112 may react with X-rays incident on the X-ray detector 100 to emit photons having a wavelength in the visible ray region (eg, a wavelength of 300 to 800 nm). In one embodiment of the present disclosure, when the photodetector 110 directly converts and detects X-rays into charges, the scintillator 112 is replaced with a photon counting detector. It can be. The scintillator 112 may be composed of, for example, Gadolinium Oxysulfide (GoS, Gadox), Cesium Iodide (CsI), or amorphous Silicon (a-Si). It is not limited to this.

The photodiode 114 is configured to receive photons emitted by the scintillator 112 and convert them into electrical signals. The photo diode 114 may provide the converted electrical signal to the processor 130 . The photodiode 114 may be formed in the form of a substrate on which a plurality of pixels are arranged in a two-dimensional (eg, N×M) shape. A plurality of pixels formed on the substrate of the photodiode 114 generates electric charge according to visible light, a photoelectric conversion unit that stores the generated electric charge, and a switching element that is connected to the photoelectric conversion unit and detects the electric charge accumulated in the photoelectric conversion unit. can include In one embodiment, the photoelectric conversion unit may include a PIN diode, but is not limited thereto. In one embodiment of the present disclosure, the switching element may be composed of a thin film transistor (TFT) 116 . However, it is not limited thereto.

The AEC sensor array 120 may include a plurality of AEC sensors 122 . The AEC sensor array 120 may be formed in a line-shaped array structure in which a plurality of AEC sensors 122 are arranged along a first direction.

In one embodiment of the present disclosure, the AEC sensor array 120 may include a plurality of sensor arrays disposed in parallel along the first direction. The structure of the plurality of AEC sensor arrays 120 will be described in detail with reference to FIG. 7B.

The plurality of AEC sensors 122 are configured to detect X-rays that have passed through the object, digitize the dose of the detected X-rays as a signal value, and output the result. The plurality of AEC sensors 122 may be configured as an integrated sensor included in the X-ray detector 100 . The plurality of AEC sensors 122 according to an embodiment of the present disclosure may be configured as a part of the plurality of photodetector elements 110 and may have the same structure as the plurality of photodetector elements 110 . For example, the plurality of AEC sensors 122 may include a scintillator 112 , a photodiode 114 , and a thin film transistor 116 in the same manner as the photodetector 110 . The plurality of AEC sensors 122 may detect visible light converted from X-rays by the scintillator, convert the visible light into an electrical signal through a photodiode, and output a converted voltage value. The plurality of AEC sensors 122 may be implemented as, for example, pixel related AECs (AECs) or AEC related photo diodes (AECs), but are not limited thereto.

Structures and operations of the photodetector 110 and the AEC sensor array 120 will be described in detail with reference to FIG. 6 .

The processor 130 may execute program codes or one or more instructions stored in the memory 140 . The processor 130 may be composed of hardware components that perform arithmetic, logic and input/output operations and signal processing. The processor 130 may include, for example, a central processing unit, a microprocessor, a graphic processing unit, application specific integrated circuits (ASICs), digital signal processors (DSPs), and digital signal processors (DSPDs). Signal Processing Devices), PLDs (Programmable Logic Devices), and FPGAs (Field Programmable Gate Arrays).

Although the processor 130 is shown as one element in FIG. 5, it is not limited thereto. In one embodiment, the processor 130 may be composed of one or a plurality of one or more.

In one embodiment of the present disclosure, the processor 130 may include an AI processor that performs artificial intelligence (AI) learning. In this case, the AI processor may perform inference using an artificial intelligence model. The AI processor may be manufactured in the form of a dedicated hardware chip (eg, Neural Processing Unit (NPU)) for artificial intelligence (AI), or an existing general-purpose processor (eg, CPU or application processor) or graphics It can be built as part of a dedicated processor (eg GPU).

The memory 140 may be, for example, a flash memory type, a hard disk type, a multimedia card micro type, or a card type memory (eg SD or XD memory). etc.), RAM (RAM, Random Access Memory) SRAM (Static Random Access Memory), ROM (ROM, Read-Only Memory), EEPROM (Electrically Erasable Programmable Read-Only Memory), PROM (Programmable Read-Only Memory), or It may be composed of at least one type of storage medium among optical disks.

Instructions or program codes for performing functions or operations of the X-ray detector 100 may be stored in the memory 140 . In one embodiment, at least one of instructions readable by the processor 130, an algorithm, a data structure, a program code, and an application program may be stored in the memory 140. can Instructions, algorithms, data structures, and program codes stored in memory 140 may be implemented in a programming or scripting language, such as C, C++, Java, assembler, or the like, for example.

In the following embodiment, the processor 130 may be implemented by executing instructions or program codes of a program stored in the memory 140 .

The processor 130 may acquire a 1-Dimensional image by digitizing the X-ray dose detected through the AEC sensor array 120 as a signal value. The 1D image may include information about signal values of pixels respectively corresponding to the plurality of AEC sensors 122 included in the AEC sensor array 120 . In one embodiment of the present disclosure, the processor 130 reads out the electrical signal representing the dose of X-rays detected by the plurality of AEC sensors 122 at a preset sampling rate, thereby A one-dimensional image can be obtained in real time. For example, the processor 130 may obtain a 1D image in real time by performing sampling once at a time of 100 μs or less. However, the time of 100 μs is an example, and the sampling time is not limited to the above example.

The processor 130 may identify a symmetry point from the 1D image based on the signal value of each pixel of the 1D image. A 'symmetric point' may be a central point at which signal values of each of a plurality of pixels included in a 1D image are symmetrical. The processor 130 may identify a symmetrical point by detecting a pixel pair having a minimum difference value between pixels corresponding to the initial symmetrical point in the 1D image and acquiring a location of a center point of the detected pixel pair. In one embodiment of the present disclosure, the processor 130 calculates an average of difference values of signal values with left and right pixels based on each of a plurality of pixels included in the 1D image, and searches for a minimum value of the calculated average value. The symmetrical point can be identified by moving the location of the initial symmetrical point based on the location of the central point of the left and right pixels having the searched minimum value. A specific embodiment in which the processor 130 identifies a symmetrical point using a difference between signal values of left and right pixels will be described in detail with reference to FIGS. 9 and 10 .

In another embodiment of the present disclosure, the processor 130 detects a plurality of pixels corresponding to edge points among a plurality of pixels included in the one-dimensional image, and obtains a pair of corresponding edge points among the plurality of pixels. and the center point of the obtained pair of boundary points can be identified as a symmetry point. A specific embodiment in which the processor 130 identifies a symmetric point by detecting a plurality of pixels corresponding to the boundary point will be described in detail with reference to FIGS. 11 and 12 .

When the AEC sensor array 120 is composed of a plurality of sensor arrays arranged in parallel, the processor 130 converts the signal value for each pixel of the 1D image obtained through each of the plurality of AEC sensor arrays 120 to the corresponding pixel. It is summed according to , and a symmetric point can be identified based on the summed signal value for each pixel. A specific embodiment in which the processor 130 identifies a symmetry point from the sum of signal values for each pixel of the one-dimensional image obtained through each of the plurality of AEC sensor arrays 120 will be described in detail with reference to FIG. 13 .

The processor 130 may adjust the locations of the plurality of AEC sensing regions around the identified symmetry points. The 'AEC sensing area' detects the dose of X-rays passing through an object on the imaging surface of the X-ray detector, and blocks the X-rays when the dose of the detected X-rays exceeds a preset threshold. It is an area set up to perform a function. In one embodiment of the present disclosure, the plurality of AEC sensing areas may be areas preset by an input received from a user (eg, a radiologist or a doctor). However, it is not limited thereto, and the plurality of AEC sensing areas may be default areas. In one embodiment of the present disclosure, the processor 130 obtains location information of a central point of a plurality of AEC sensing areas disposed on the left and right around the identified symmetric point, and the plurality of AECs so that the location of the center point coincides with the location of the symmetric point. The position of the sensing region may be changed. A specific embodiment in which the processor 130 adjusts the positions of the plurality of AEC sensing regions around a symmetrical point will be described in detail with reference to FIGS. 14 and 15 .

As the 1D image is generated in real time, the processor 130 may identify a symmetrical point in real time and adjust the positions of the plurality of AEC sensing areas.

The processor 130 measures a voltage signal representing the dose of X-rays detected by the plurality of AEC sensors 122 disposed in the plurality of AEC sensing areas among the plurality of AEC sensors 122 included in the AEC sensor array 120. and can be monitored in real time. The processor 130 compares the values of the voltage signals output by the plurality of AEC sensors 122 disposed at the locations of the plurality of AEC sensing areas with a preset cut-off threshold, and the comparison result voltage An X-ray blocking signal may be generated when the value of the signal exceeds the cut-off threshold. The processor 130 may transmit an X-ray blocking signal to an X-ray source controller in the workstation 300 (see FIG. 1) or the X-ray radiator 200 (see FIGS. 1 and 3) through the communication interface 150.

As the X-ray irradiation by the X-ray irradiator 200 is terminated, the processor 130 may obtain X-ray image data by performing read-out. The processor 130 may generate X-ray image data of the object by using the electrical signal obtained from the photodetector 110 . The processor 130 according to an embodiment of the present disclosure includes an amplifier circuit that amplifies an analog signal obtained from the photodiode 114 of the photodetector 110 and converts the amplified analog signal into a digital signal. It may include an analog / digital conversion chip (Analog Digital Converter Chip; ADC chip). Since the lead-out operation of the X-ray detector 100 is a technique widely known to those skilled in the art, a detailed description thereof will be omitted.

The communication interface 150 is configured to perform data communication with the workstation 300 (see FIG. 1) or the X-ray radiator 200 (see FIGS. 1 and 3) through a wired or wireless communication network. In one embodiment, the communication interface 150 may transmit an X-ray blocking signal to the workstation 300 or the X-ray radiator 200 under the control of the processor 130 .

The communication interface 150 may perform data communication with the workstation 300 or the X-ray radiator 200 using, for example, a communication cable or wired data communication such as a wired LAN. However, it is not limited thereto, and when the X-ray detector 100 is implemented as a mobile detector, the communication interface 150 may be a wireless LAN, Wi-Fi, Bluetooth, or zigbee. , WFD (Wi-Fi Direct), BLE (Bluetooth Low Energy), WiBro (Wireless Broadband Internet, WiMAX), WiMAX (World Interoperability for Microwave Access, WiMAX), SWAP (Shared Wireless Access Protocol), WiGig (Wireless Gigabit) Alliance, WiGig) and RF communication may be configured to perform data communication using at least one wireless data communication network.

FIG. 6 is a diagram illustrating structures of a photodetector 110 and an AEC sensor array 120 among components of the X-ray detector 100 according to an embodiment of the present disclosure.

The X-ray detector 100 shown in FIG. 6 may be an embodiment of the X-ray detector 100 of FIG. 5 . The X-ray detector 100 of FIG. 6 may be an indirect detector.

Referring to FIG. 6 , the X-ray detector 100 includes a scintillator (not shown), a photodetection device 110, a photodetector substrate 111, an AEC sensor array 120, a bias driver 160, a gate driver ( 170), and a signal processing unit 180.

A scintillator 112 (see FIG. 5 ) may receive X-rays emitted from an X-ray source and convert the X-rays into visible light. Since the scintillator 112 is the same as the scintillator 112 shown in FIG. 5, duplicate descriptions are omitted.

The photodetector substrate 111 receives light from the scintillator and converts it into an electrical signal. The photodetector substrate 111 may include gate lines GL, data lines DL, a plurality of photo diodes 114 , a plurality of thin film transistors 116 , and bias lines BL.

The gate lines GL may be formed in a first direction DR1 , and the data lines DL may be formed in a second direction DR2 crossing the first direction DR1 . The first direction DR1 and the second direction DR2 may be perpendicular to each other. In the embodiment shown in FIG. 6 , the X-ray detector 100 may include 4 gate lines GL and 4 data lines DL. However, the number of gate lines GL and data lines DL included in the present X-ray detector 100 is not limited to the above example.

A plurality of thin film transistors (TFTs) 116 may be arranged in a matrix form along the first and second directions DR1 and DR2 . Each of the plurality of thin film transistors 116 may be electrically connected to one of the gate lines GL and one of the data lines DL. A gate electrode of the thin film transistor 116 may be electrically connected to the gate line GL, and a source electrode of the thin film transistor 116 may be electrically connected to the data line DL. In the embodiment shown in FIG. 6 , the X-ray detector 100 may include 16 thin film transistors 116 arranged in 4 rows and 4 columns. However, this is an example, and the number of thin film transistors 116 is not limited to the above example.

The photodiodes 114 may be arranged in a matrix form along the first and second directions DR1 and DR2 to correspond one-to-one with the thin film transistors 116 . Each of the plurality of photodiodes 114 may be electrically connected to one of the plurality of thin film transistors 116 . The N-side electrode of the photodiode 114 may be electrically connected to the drain electrode of the thin film transistor 116 . Each of the plurality of photodiodes 114 may receive a bias voltage from the bias driver 160 through the bias line BL. An electric field is generated in the semiconductor layer of the photodiode 114 by the application of a bias voltage, and charges (electron-hole pairs) generated in the semiconductor layer by photoelectric conversion are positive (+) on one side and negative (-) on the other. ), and the charge may be accumulated in the photodiode 114. In the embodiment shown in FIG. 6 , the X-ray detector 100 may include 16 photodiodes 114 arranged in 4 rows and 4 columns. However, this is an example, and the number of photodiodes 114 is not limited to the above example.

The bias lines BL may be electrically connected to the plurality of photodiodes 114 . Each of the bias lines BL may be electrically connected to P-side electrodes of each of the plurality of photodiodes 114 disposed along one direction. For example, the bias lines BL may be formed substantially parallel to the second direction DR2 and electrically connected to the plurality of photodiodes 114 . In another embodiment of the present disclosure, the bias lines BL may be formed substantially parallel to the first direction DR1 and electrically connected to the photodiodes 114 . In the embodiment shown in FIG. 6 , the X-ray detector 100 may include four bias lines BL formed along the second direction DR2 . However, this is an example, and the number of bias lines BL is not limited to the above example.

The bias driver 160 may be electrically connected to the bias lines BL and apply a driving voltage to the bias lines BL. The bias driver 160 may selectively apply a reverse bias voltage or a forward bias voltage to the photo diode 114 . A reference voltage may be applied to the N-side electrode of the photodiode 114 . The reference voltage may be applied through the signal processing unit 180 . The bias driver 160 may apply a voltage lower than the reference voltage to the P-side electrode of the photodiode 114 in order to apply a reverse bias voltage to the photodiode 114 . In addition, the bias driver 160 may apply a voltage higher than the reference voltage to the P-side electrode of the photodiode 114 in order to apply a forward bias voltage to the photodiode 114 .

The gate driver 170 is electrically connected to the gate lines GL and can apply gate signals to the gate lines GL. For example, when gate signals are applied to the gate lines GL, the thin film transistors 116 may be turned on by the gate signals. On the other hand, when the gate signals are not applied to the gate lines GL, the thin film transistors 116 may be turned off.

The signal processor 180 is electrically connected to the data lines DL. When light received from the photodetector substrate 111 is converted into an electrical signal, the converted electrical signal may be read out to the signal processing unit 180 through the data line DL.

During the operating time of the X-ray detector 100 , the bias driver 160 may apply a reverse bias voltage to the photodiode 114 .

While the plurality of thin film transistors 116 are turned off, each of the plurality of photodiodes 114 may receive light from the scintillator and generate electron-hole pairs to accumulate charges. . The amount of charge accumulated in each of the photodiodes 114 may correspond to the amount of X-ray light.

Thereafter, the gate driver 170 may sequentially apply gate signals along the second direction DR2 through the gate lines GL. When the thin film transistor 116 is turned on by applying the gate signal to the gate line GL, photocurrent may flow to the signal processing unit 180 through the data line DL due to charges accumulated in the photodiode 114. .

The signal processor 180 may convert the received light currents into image data. The signal processing unit 180 may output to the outside. The image data may be an analog signal or a digital signal corresponding to the photocurrent.

Some of the plurality of photodetector elements 110 may be AEC sensors 122 . In the embodiment shown in FIG. 6 , four photodetector devices 110 arranged along the first direction DR1 in the second row among the plurality of photodetector devices 110 may operate as the AEC sensor 122 . Four AEC sensors 122 may constitute an AEC sensor array 120 .

In one embodiment of the present disclosure, the gate driver 170 generates a gate signal at a high sampling rate through a gate line GL connected to the plurality of AEC sensors 122 included in the AEC sensor array 120. can be authorized. The gate driver 170 may apply a gate signal to the plurality of AEC sensors 122 at a higher sampling rate than the gate signal applied to the plurality of photodetector devices 110 . When the thin film transistor 116 included in each of the plurality of AEC sensors 122 is turned on as a gate signal is applied through the gate line GL, the photocurrent is generated by the charge accumulated in the photodiode 114 and the data line DL ) to the signal processing unit 180. The signal processing unit 180 may obtain image data by reading out light current output from the plurality of AEC sensors 122 at a high sampling rate. In one embodiment of the present disclosure, the signal processing unit 180 outputs the photocurrent output by the plurality of AEC sensors 122 at a higher sampling rate than the sampling rate for reading out the photocurrent output by the plurality of photodetector devices 110. The resulting photocurrent can be read out.

The signal processing unit 180 converts the photocurrent value proportional to the dose of X-rays detected by the plurality of AEC sensors 122 into digits, converts it into image data, and outputs the image data. The processor 130 (see FIG. 5 ) may obtain a 1D image using image data output by the signal processing unit 180 .

6 shows that the gate driver 170 applies a gate signal not only to the plurality of photodetector elements 110 but also to the plurality of AEC sensors 122 included in the AEC sensor array 120. The embodiment is not limited to that shown in FIG. 6 . In another embodiment of the present disclosure, a gate signal may be applied to the plurality of AEC sensors 122 included in the AEC sensor array 120 by a separate gate driver instead of the gate driver 170 .

6 , the signal processing unit 180 obtains a one-dimensional image using signal values output by not only the plurality of photodetector elements 110 but also the plurality of AEC sensors 122 included in the AEC sensor array 120. However, the embodiment of the present disclosure is not limited to that shown in FIG. 6 . In another embodiment of the present disclosure, the signal values output by the plurality of AEC sensors 122 included in the AEC sensor array 120 are output to a separate signal processing unit instead of the signal processing unit 180, and the other signals A one-dimensional image may be acquired by the processing unit.

In an embodiment different from the embodiment shown in FIG. 6, switching elements such as thin film transistors 116 are not disposed in the plurality of AEC sensors 122 included in the AEC sensor array 120, and are short-circuited with wires. , signal charges generated by the plurality of AEC sensors 122 may be immediately transferred to the processor 130 . In this case, when X-rays are detected, the plurality of AEC sensors 122 may directly transfer signal charge to the processor 130 through wires.

FIG. 7A is a diagram illustrating an arrangement structure of an AEC sensor array 120 of an X-ray detector 100 according to an embodiment of the present disclosure.

Referring to FIG. 7A , the X-ray detector 100 may include a plurality of photodetector elements 110 and a plurality of AEC sensors 122 . The plurality of AEC sensors 122 may be formed in the same structure as the plurality of photodetector elements 110 . In one embodiment of the present disclosure, the plurality of AEC sensors 122 may be configured as a portion of the plurality of photodetection elements 110 . However, it is not limited thereto. Since the plurality of AEC sensors 122 are the same as those described in FIGS. 5 and 6, overlapping descriptions are omitted.

The AEC sensor array 120 may include a plurality of AEC sensors 122 arranged along the first direction DR1 .

A plurality of AEC sensing regions SR1 , SR2 , and SR3 may be included on the imaging surface of the X-ray detector 100 . The plurality of AEC sensing regions SR1, SR2, and SR3 are regions configured to perform an AEC function. When the dose of X-rays detected by the photodetector 110 or the AEC sensor 122 disposed in the plurality of AEC sensing regions SR1, SR2, and SR3 exceeds a preset cut-off threshold, an X-ray blocking signal is generated. It may be transmitted to the X-ray irradiation unit 200 (see FIGS. 1 and 3). In one embodiment of the present disclosure, the plurality of AEC sensing regions SR1 , SR2 , and SR3 may be preset regions according to an input received from a user (eg, a radiologist or a doctor). However, it is not limited thereto, and the plurality of AEC sensing areas SR1, SR2, and SR3 may be default areas.

Although the X-ray detector 100 is illustrated as including three AEC sensing regions SR1, SR2, and SR3 in FIG. 7A, the number of AEC sensing regions SR1, SR2, and SR3 of the present disclosure is not limited to three. In another embodiment of the present disclosure, the number of AEC sensing regions may be one or a plurality of two or more.

At least one AEC sensor 122 among the plurality of AEC sensors 122 included in the AEC sensor array 120 may be disposed at a position within the plurality of AEC sensing regions SR1 , SR2 , and SR3 . In the embodiment shown in FIG. 7A , at least one AEC sensor 122 among the plurality of AEC sensors 122 included in the AEC sensor array 120 includes a first AEC sensing area SR1 and a second AEC sensing area ( SR2) can be placed in a location. At least one AEC sensor 122 disposed at a location within the first AEC sensing region SR1 and the second AEC sensing region SR2 is incident on the first AEC sensing region SR1 and the second AEC sensing region SR2. It is possible to detect X-rays, convert the dose of the detected X-rays into electrical signals, and quantify and output them.

7B is a diagram illustrating an arrangement structure of a plurality of AEC sensor arrays 120-1 and 120-2 of the X-ray detector 100 according to an embodiment of the present disclosure.

The X-ray detector 100 according to the embodiment shown in FIG. 7B is the same as the X-ray detector 100 shown in FIG. 7A except that it includes a plurality of AEC sensor arrays 120-1 and 120-2. Therefore, overlapping descriptions of the plurality of photodetector elements 110, the plurality of AEC sensors 120, and the plurality of AEC sensing regions SR1, SR2, and SR3 will be omitted.

Referring to FIG. 7B , the X-ray detector 100 may include a first AEC sensor array 120-1 and a second AEC sensor array 120-2. The first AEC sensor array 120-1 and the second AEC sensor array 120-2 may be formed in lines parallel to each other along the first direction DR1 and spaced apart from each other by a predetermined distance.

Each of the first AEC sensor array 120-1 and the second AEC sensor array 120-2 may include a plurality of AEC sensors 122. Some of the plurality of AEC sensors 122 included in each of the first AEC sensor array 120-1 and the second AEC sensor array 120-2 are positioned within the plurality of AEC sensing areas SR1, SR2, and SR3 can be placed. In the embodiment shown in FIG. 7B , at least one AEC sensor 122 among the plurality of AEC sensors 122 included in the first AEC sensor array 120-1 includes the first AEC sensing region SR1 and the second AEC sensor 122. It may be disposed in the AEC sensing region SR2. Similarly, at least one AEC sensor 122 among the plurality of AEC sensors 122 included in the second AEC sensor array 120-2 has a first AEC sensing area SR1 and a second AEC sensing area SR2. can be placed within.

At least one AEC sensor 122 disposed at a location within the first AEC sensing region SR1 and the second AEC sensing region SR2 is incident on the first AEC sensing region SR1 and the second AEC sensing region SR2. It is possible to detect X-rays, convert the dose of the detected X-rays into electrical signals, and quantify and output them.

8 is a flow chart illustrating an operating method of the X-ray detector 100 according to an embodiment of the present disclosure.

In step S810, the X-ray detector 100 detects X-rays that have passed through the object using an AEC (Automatic Exposure Control) sensor array, and digitizes the dose of the detected X-rays as a signal value, thereby generating a one-dimensional (1D) image. Acquire The one-dimensional image may include information about signal values of pixels respectively corresponding to the plurality of AEC sensors 122 (see FIGS. 5 and 6) included in the AEC sensor array 120 (see FIGS. 5 and 6). there is. In one embodiment of the present disclosure, the X-ray detector 100 reads out the electrical signals representing the X-rays detected by the plurality of AEC sensors 122 at a preset sampling rate. , it is possible to obtain a one-dimensional image in real time. For example, the X-ray detector 100 may acquire a one-dimensional image in real time by performing sampling once at a time of 100 μs or less. However, the time of 100 μs is an example, and the sampling time is not limited to the above example.

In step S820, the X-ray detector 100 identifies a symmetric point from the 1D image based on the signal value of each pixel of the 1D image. A 'symmetric point' may be a central point at which signal values of each of a plurality of pixels included in a 1D image are symmetrical. In one embodiment of the present disclosure, the X-ray detector 100 calculates the average value of the difference between the signal values of the pixels spaced apart based on each of the plurality of pixels included in the one-dimensional image, and calculates the minimum value of the calculated average value. By searching, the symmetry point can be identified. In another embodiment of the present disclosure, the X-ray detector 100 detects a plurality of pixels corresponding to edge points among a plurality of pixels included in the one-dimensional image, and a pair of corresponding edge points among the plurality of pixels. is obtained, and the central point of the obtained pair of boundary points can be identified as a symmetrical point.

In step S830, the X-ray detector 100 adjusts the positions of the plurality of AEC sensing regions so that the plurality of AEC sensing regions are symmetrical about the identified symmetry point. The 'AEC sensing area' detects the dose of X-rays passing through an object on the imaging surface of the X-ray detector, and blocks the X-rays when the dose of the detected X-rays exceeds a preset threshold. It is an area set up to perform a function. In one embodiment of the present disclosure, the plurality of AEC sensing areas may be areas preset by an input received from a user (eg, a radiologist or a doctor). However, it is not limited thereto, and the plurality of AEC sensing areas may be default areas.

In one embodiment of the present disclosure, the X-ray detector 100 obtains location information of a center point of a plurality of AEC sensing areas disposed on the left and right around the identified symmetrical point, and obtains location information of a plurality of center points so that the location of the symmetrical point coincides with the location of the symmetrical point. The position of the AEC sensing area of can be changed.

In another embodiment of the present disclosure, the X-ray detector 100 may include a plurality of AEC sensor arrays 120-1 and 120-2 (see FIG. 7B). In this case, the X-ray detector 100 obtains a symmetric axis by connecting the symmetrical points identified by each of the plurality of AEC sensor arrays 120-1 and 120-2, and arranges the left and right sides based on the symmetrical axis. Positions of the plurality of AEC sensing regions may be adjusted such that the plurality of AEC sensing regions are symmetrical to each other about an axis of symmetry.

9 is a diagram illustrating an operation of the X-ray detector 100 according to an embodiment of the present disclosure to identify a symmetrical point SP from a one-dimensional image 900 .

10 is a flowchart illustrating an operating method for identifying a symmetrical point (SP, see FIG. 9) from a one-dimensional image (900, see FIG. 9) by the X-ray detector 100 according to an embodiment of the present disclosure. Steps S1010 to S1030 shown in FIG. 10 embody step S820 shown in FIG. 8 . Step S1010 of FIG. 10 may be performed after step S810 shown in FIG. 8 is performed. After step S1030 of FIG. 10 is performed, step S830 shown in FIG. 8 may be performed.

Hereinafter, an embodiment in which the X-ray detector 100 identifies the symmetrical point SP will be described with reference to FIGS. 9 and 10 together.

Referring to FIG. 9 , the X-ray detector 100 detects X-rays transmitted through an object through the AEC sensor array 120, converts the dose of the detected X-rays into an electrical signal, and digitizes the converted electrical signal. A 1D image 900 may be acquired. The X-ray detector 100 may identify a symmetrical point SP from the 1D image 900 based on a signal value for each pixel of the 1D image 900 .

Referring to FIG. 10 , in step S1010, the X-ray detector 100 calculates an average value of differences in signal values from spaced apart pixels based on each of a plurality of pixels included in the one-dimensional image. Referring to FIG. 9 together, the processor 130 (see FIG. 5) of the X-ray detector 100 is a plurality of pixels included in the one-dimensional image 900 (p ₁ to p ₁₂ ) pixels spaced apart from the center, respectively. The difference between them can be calculated. The processor 130 may calculate an average of the calculated difference values for each of the plurality of pixels p ₁ to p ₁₂ . In the embodiment shown in FIG. 9 , the processor 130 generates a signal between a second pixel p ₂ spaced apart from the first pixel p ₁ in the one-dimensional image 900 and the first pixel p ₁ . The difference between the values, the difference between the signal values between the third pixel (p ₃ ) and the first pixel (p ₁ ), the difference between signal values between the fourth pixel (p ₄ ) and the first pixel (p ₁ ), . .. , difference values of signal values between the twelfth pixel p ₁₂ and the first pixel p ₁ may be calculated. The processor 130 may calculate _{an average value of differences between signal values of the second pixel p 2 to} the twelfth pixel p 12 with respect to the first pixel p ₁ . Similarly, the processor 130 calculates the difference between the signal values between the first pixel p 1 and the second pixel p ₂ spaced apart from the second pixel _{p 2 ,} the third pixel p 3 and the second pixel p ₃ . The difference between the signal values between the two pixels (p ₂ ), the difference between the signal values between the fourth pixel (p ₄ ) and the second pixel (p ₂ ), ... , the twelfth pixel (p ₁₂ ) and the second pixel Differences between signal values between (p ₂ ) may be calculated, and an average value of the difference values calculated based on the second pixel (p ₂ ) may be calculated. The processor 130 performs the same operation on the third pixel (p ₃ ) to the twelfth pixel (p ₁₂ ), so that the signal value of each of the plurality of pixels (p ₁ to p ₁₂ ) with spaced apart pixels. The average value of the difference can be calculated.

In the embodiment shown in FIG. 9, the processor 130 has been shown and described as calculating an average value for each of a total of 12 pixels including the first pixel (p ₁ ) to the twelfth pixel (p ₁₂ ). , This is an example, and the present disclosure is not limited thereto. In one embodiment of the present disclosure, the processor 130 may calculate an average value of difference values for all pixels included in the 1D image 900 .

In step S1020, the X-ray detector 100 searches for a minimum value among average values calculated for each of the plurality of pixels (p ₁ to p ₁₂ , see FIG. 9).

In step S1030, the X-ray detector 100 identifies the position of the pixel having the minimum value found among the plurality of pixels (p ₁ to p ₁₂ , see FIG. 9) as a symmetrical point. In the embodiment shown in Figure 9, the processor 130 of the X-ray detector 100 identifies the seventh pixel (p ₇ ) having the minimum value among the calculated average values, on the imaging surface of the X-ray detector 100 The location of the seventh pixel p ₇ may be identified as a symmetrical point SP.

11 is a diagram illustrating an operation of the X-ray detector 100 according to an embodiment of the present disclosure to identify a symmetrical point SP from a one-dimensional image 1100. Referring to FIG.

12 is a flowchart illustrating an operating method for identifying a symmetrical point (SP, see FIG. 11) from a one-dimensional image (1100, see FIG. 11) by the X-ray detector 100 according to an embodiment of the present disclosure. Steps S1210 to S1240 shown in FIG. 12 are steps that embody step S820 shown in FIG. 8 . Step S1210 of FIG. 12 may be performed after step S810 shown in FIG. 8 is performed. After step S1240 of FIG. 12 is performed, step S830 shown in FIG. 8 may be performed.

Hereinafter, an embodiment in which the X-ray detector 100 identifies the symmetry point SP will be described with reference to FIGS. 11 and 12 together.

Referring to FIG. 11, the X-ray detector 100 detects X-rays transmitted through an object through the AEC sensor array 120, converts the dose of the detected X-rays into electrical signals, and converts the converted electrical signals into digits. A 1D image 1100 may be acquired. The X-ray detector 100 may identify the symmetry point SP from the 1D image 900 based on the signal value of each pixel of the 1D image 1100 .

Referring to FIG. 12 , in step S1210, the X-ray detector 100 detects a plurality of edge points based on signal values of a plurality of pixels included in the one-dimensional image. A 'boundary point' refers to a point at which signal values of a plurality of pixels included in a one-dimensional image rapidly change. In one embodiment of the present disclosure, the boundary point may be determined according to an anatomical part of the object (see FIG. 10 10 ). For example, since a difference between a signal value of a pixel of a bone part and a signal value of a pixel of a lung part among parts of the object 10 is significantly greater than a difference value of a signal value of a pixel of the same part, bone A point on the boundary where the segment and the lung segment connect can be identified as the boundary point. In the embodiment shown in FIG. 11 , the processor 130 (see FIG. 5 ) of the X-ray detector 100 is the first one in which the signal value difference between pixels among the plurality of pixels included in the 1D image 1100 is significantly larger. One pixel (p ₁ ), the second pixel (p ₂ ), the third pixel (p ₃ ), and the fourth pixel (p ₄ ) may be identified as boundary points.

In step S1220, the X-ray detector 100 acquires a pair of corresponding boundary points among the plurality of detected boundary points. Referring to FIG. 11 together, the processor 130 of the X-ray detector 100 is based on signal values of a plurality of boundary points (p ₁ , p ₂ , p ₃ , p ₄ ) identified from the 1-dimensional image 1100. , boundary points corresponding to each other may be identified, and the identified boundary points may be paired. For example, the processor 130 pairs a first pixel (p 1 ) with a fourth pixel (p ₄ ) among a plurality of boundary points (p ₁ , p ₂ , p ₃ , and p ₄ ), and pairs the second pixel (p ₄ ). ₂ ) with the third pixel p ₃ , a pair of boundary points may be obtained.

In step S1230, the X-ray detector 100 calculates the location of the center point (C, see FIG. 11) of the obtained pair of boundary points. Referring to FIG. 11 together, the processor 130 of the X-ray detector 100 determines the position of the first central point of the first boundary point pair composed of the first pixel p ₁ and the fourth pixel p ₄ among the boundary point pairs. and the location of the second central point of the second boundary point pair composed of the second pixel p ₂ and the third pixel p ₃ may be identified. For example, when the locations of the first center point and the second center point are the same, the processor 130 may identify the location of the first center point as the location of the center point C. For another example, when the locations of the first center point and the second center point are different, the processor 130 may calculate the location coordinates of the center point C using the location coordinates of the first center point and the location coordinates of the second center point. there is.

In step S1240, the X-ray detector 100 identifies the position of the calculated center point (C, see FIG. 11) as a symmetrical point (SP, see FIG. 11). Referring to FIG. 11 together, the processor 130 of the X-ray detector 100 may identify the central point C as a symmetrical point SP, which is a reference point at which the plurality of AEC sensing regions SR1, SR2, and SR3 are symmetrical. there is. In one embodiment of the present disclosure, the processor 130 determines that the first AEC sensing region SR1 and the second AEC sensing region SR2 among the plurality of AEC sensing regions SR1 , SR2 , and SR3 are centered on the symmetrical point SP. Positions of the first AEC sensing region SR1 and the second AEC sensing region SR2 may be adjusted to be left-right symmetrical.

13 is a view for explaining an operation of obtaining a one-dimensional image 1310 by using a plurality of AEC sensor arrays 120-1 and 120-2 by the X-ray detector 100 according to an embodiment of the present disclosure. am.

Referring to FIG. 13 , the X-ray detector 100 may include a first AEC sensor array 120-1 and a second AEC sensor array 120-2. The first AEC sensor array 120-1 and the second AEC sensor array 120-2 may be formed in the form of lines parallel to each other along the first direction and spaced apart from each other by a predetermined distance. In FIG. 13 , the X-ray detector 100 is illustrated as including two AEC sensor arrays 120-1 and 120-2, but embodiments of the present disclosure are not limited thereto. In another embodiment of the present disclosure, the X-ray detector 100 may include one AEC sensor array or a plurality of AEC sensor arrays of three or more.

Each of the first AEC sensor array 120-1 and the second AEC sensor array 120-2 may include a plurality of AEC sensors 122 (see FIG. 7B). Some of the plurality of AEC sensors 122 included in each of the first AEC sensor array 120-1 and the second AEC sensor array 120-2 are positioned within the plurality of AEC sensing areas SR1, SR2, and SR3 can be placed.

The processor 130 (see FIG. 5) of the X-ray detector 100 digitizes the dose of X-rays detected using the plurality of AEC sensors 122 included in the first AEC sensor array 120-1, A dimensional image 1300-1 may be acquired. Similarly, the processor 130 acquires the second one-dimensional image 1300-2 by digitizing the dose of X-rays detected using the plurality of AEC sensors 122 included in the second AEC sensor array 120-2. can do. Since the X-ray detector 100 obtains a one-dimensional image using the plurality of AEC sensors 122 included in the AEC sensor array, the method is the same as that described in FIGS. 5 and 8, and thus duplicate descriptions are omitted.

The X-ray detector 100 calculates the sum of the signal value for each pixel of the first 1-dimensional image 1300-1 and the signal value of each pixel of the second 1-dimensional image 1300-2, and calculates the sum of the signal values for each pixel. A summed 1D image 1310 may be obtained through In one embodiment of the present disclosure, the processor 130 of the X-ray detector 100 sums signal values of corresponding pixels of the first 1-dimensional image 1300-1 and the second 1-dimensional image 1300-2. Then, a 1D image 1310 representing the summed signal values for each pixel can be obtained. However, it is not limited thereto, and in another embodiment of the present disclosure, the processor 130 calculates an average value of signal values for each pixel of the first 1D image 1300-1 and the second 1D image 1300-2. A 1D image 1310 may be obtained using the calculated average value for each pixel.

The X-ray detector 100 may identify a symmetrical point based on a signal value of each of a plurality of pixels included in the 1D image 1310 . Since the X-ray detector 100 identifies a symmetrical point from the one-dimensional image 1310 is the same as that described in FIGS. 5 and 8 to 12, duplicate descriptions will be omitted.

14 is a diagram illustrating an operation of adjusting positions of a plurality of AEC sensing regions SR1 , SR2 , and SR3 based on a symmetrical point by the X-ray detector 100 according to an embodiment of the present disclosure.

Referring to FIG. 14 , the X-ray detector 100 may include a first AEC sensor array 120-1 and a second AEC sensor array 120-2. The first AEC sensor array 120-1 and the second AEC sensor array 120-2 may be formed in a line shape parallel to each other along the first direction DR1 and spaced apart from each other by a predetermined distance. Since descriptions of the first AEC sensor array 120-1 and the second AEC sensor array 120-2 are the same as those of FIGS. 7B and 13, overlapping descriptions are omitted.

The processor (130, see FIG. 5) of the X-ray detector 100 digitizes the dose of X-rays detected by using a plurality of AEC sensors (122, see FIG. 7B) included in the first AEC sensor array 120-1. By doing so, a 1D image may be obtained, and a first symmetrical point SP ₁ may be identified based on a signal value for each pixel of the 1D image. Similarly, the processor 130 acquires a 1D image by digitizing the dose of X-rays detected using the plurality of AEC sensors 122 included in the second AEC sensor array 120-2, and obtains a pixel of the 1D image. Based on the star signal value, the second symmetry point SP ₂ may be identified. In the embodiment of FIG. 14 , processor 130 is illustrated and described as identifying two symmetry points SP ₁ and SP ₂ , but is not limited thereto. In another embodiment of the present disclosure, the X-ray detector 100 includes a plurality of AEC sensor arrays of three or more, and the processor 130 selects three or more AEC sensor arrays from a plurality of one-dimensional images obtained from each of the plurality of AEC sensor arrays. Multiple points of symmetry can also be identified. A method for the processor 130 to identify a symmetrical point based on the signal value of each pixel of the 1D image is the same as that described in FIGS. 5, 8 to 12, and thus a duplicate description is omitted.

The X-ray detector 100 may obtain a symmetric axis SA by connecting the identified first symmetric point SP ₁ and the second symmetric point SP ₂ . The symmetry axis SA is an imaginary straight line connecting the plurality of symmetry points SP ₁ and SP ₂ , and may extend along the second direction DR2 , for example.

The X-ray detector 100 may adjust the positions of the plurality of AEC sensing regions SR1 , SR2 , and SR3 such that the plurality of AEC sensing regions SR1 , SR2 , and SR3 are symmetrical about the axis of symmetry SA. In the embodiment shown in FIG. 14 , the X-ray detector 100 may include three AEC sensing regions SR1, SR2, and SR3, but is not limited thereto. In the processor 130 of the X-ray detector 100 (see FIG. 5), the first AEC sensing area SR1 and the second AEC sensing area SR2 disposed on the left and right with respect to the axis of symmetry SA have the axis of symmetry SA. The position of the first AEC sensing region SR1 may be changed to SR1' and the position of the second AEC sensing region SR2 may be changed to SR2' so as to be symmetrical about the center. The processor 130 may change the position of the third AEC sensing region SR3 to SR3' so that the area size of the third AEC sensing region SR3 has the same area on both sides of the axis of symmetry SA.

15 is a diagram illustrating an operation of the X-ray detector 100 according to an embodiment of the present disclosure to adjust positions of a plurality of AEC sensing regions SR1, SR2, and SR3 based on a symmetry point SP.

Referring to FIG. 15 , the X-ray detector 100 includes an AEC sensor array 120, and a one-dimensional image may be acquired using the AEC sensor array 120. The X-ray detector 100 may identify a symmetry point SP based on signal values for each of a plurality of pixels included in the one-dimensional image.

The X-ray detector 100 has a central point of a first AEC sensing region SR1 and a second AEC sensing region SR2 disposed on the left and right of the plurality of AEC sensing regions SR1, SR2, and SR3 based on the symmetry point SP. Information about the location of (C) can be obtained. In one embodiment of the present disclosure, the processor 130 of the X-ray detector 100 (see FIG. 5 ) determines the location coordinate values of a plurality of pixels included in the first AEC sensing region SR1 and the second AEC sensing region SR2. ) The location coordinate value of the center point C may be calculated using the location coordinate values of corresponding pixels among the location coordinate values of a plurality of pixels included in ).

The X-ray detector 100 may change the positions of the plurality of AEC sensing regions SR1 , SR2 , and SR3 so that the obtained center point C coincides with the symmetrical point SP. The processor 130 of the X-ray detector 100 obtains information about the distance d, which is a displacement value between the location of the center point C and the location of the symmetrical point SP, and obtains information about the center point C and the symmetrical point SP. Information about the relative direction can be obtained. In one embodiment of the present disclosure, the processor 130 of the X-ray detector 100 calculates a difference between the positional coordinates of the center point C and the positional coordinates of the symmetrical point SP, and based on the difference, the distance The value of (d) can be calculated. Also, the processor 130 may obtain relative direction information between the center point C and the symmetrical point SP. In the embodiment shown in FIG. 15 , the central point C is located to the left of the symmetry point SP. However, it is not limited thereto, and the center point C may be located anywhere on the right, upper side, or lower side of the symmetry point SP. The processor 130 moves the positions of the first AEC sensing region SR1 and the second AEC sensing region SR2 disposed on the left and right around the symmetrical point SP by a distance d to SR1' and SR2', respectively. can be changed The processor 130 may change the positions of the first AEC sensing region SR1 and the second AEC sensing region SR2 to SR1' and SR2', respectively, based on relative direction information between the central point C and the symmetrical point SP. there is. In the embodiment shown in FIG. 15 , the processor 130 may move the positions of the first AEC sensing region SR1 and the second AEC sensing region SR2 in the right direction.

The X-ray detector 100 may also change the position of the third AEC sensing region SR3 by a displacement value equal to the displacement values of the first AEC sensing region SR1 and the second AEC sensing region SR2. In the embodiment shown in FIG. 15 , the processor 130 of the X-ray detector 100 may change the location of the third AEC sensing region SR3 to SR3′ by moving the location of the third AEC sensing region SR3 in the right direction by a distance d.

Through FIG. 15, an embodiment of adjusting the position of a plurality of AEC sensing regions SR1, SR2, and SR3 based on the positional relationship between one symmetrical point SP and the central point C is shown, but the embodiment of the present disclosure It is not limited to this. In another embodiment of the present disclosure, the X-ray detector 100 includes a plurality of AEC sensing areas SR1 and SR2 based on a positional relationship between a plurality of symmetry points SP or symmetry axes SA (see FIG. 14) and a central point C. , SR3) may be adjusted.

In the embodiment shown in FIGS. 14 and 15, the X-ray detector 100 adjusts the positions of the plurality of AEC sensing regions SR1, SR2, and SR3 based on the symmetry point SP or symmetry axis SA, It is possible to solve the misalignment problem of alignment between the patient's anatomical position and the X-ray detector 100 and improve alignment accuracy. Therefore, the X-ray detector 100 of the present disclosure can prevent the problem of overexposure of X-rays to a patient in advance and provide technical effects of acquiring high-quality X-ray images. In addition, the X-ray detector 100 according to an embodiment of the present disclosure may prevent re-scanning due to a failure in predicting an X-ray dose and reduce an average dose of X-rays irradiated during imaging.

16 is a flowchart illustrating an operating method of the X-ray detector 100, the X-ray emitter 200, and the workstation 300 according to an embodiment of the present disclosure.

16 is a flow of an operation performed after the X-ray detector 100 adjusts the positions of a plurality of AEC sensing regions SR1, SR2, and SR3 (see FIGS. 14 and 15) according to an embodiment of the present disclosure. shows Step S1610 of FIG. 16 may be performed after step S830 shown in FIG. 8 is performed.

In step S1610, the X-ray detector 100 monitors the amount of X-rays detected in the AEC sensing area. The X-ray detector 100 is a numerical value of an electrical signal representing the dose of X-rays detected by the AEC sensor in a plurality of AEC sensing regions SR1', SR2', and SR3' (see FIGS. 14 and 15) whose positions are adjusted. values can be monitored.

In step S1620, the X-ray detector 100 compares the monitored X-ray dose with a preset cut-off threshold.

As a result of the comparison, when the X-ray amount exceeds the cut-off threshold (step S1630), the X-ray detector 100 generates an X-ray cutoff signal. The 'X-ray blocking signal' is an electrical signal commanding to block emission and irradiation of X-rays.

In step S1640, the X-ray detector 100 transmits an X-ray blocking signal to the controller 330 of the workstation 300. The X-ray detector 100 may be connected to the workstation 300 through a wired communication network or a wireless communication network and transmit an X-ray blocking signal to the workstation. In one embodiment of the present disclosure, when the X-ray detector 100 is implemented as a mobile detector, the X-ray detector 100 uses wireless LAN, Wi-Fi, Bluetooth, ZigBee ( zigbee), WFD (Wi-Fi Direct), BLE (Bluetooth Low Energy), Wibro (Wireless Broadband Internet, WiMAX), WiMAX (World Interoperability for Microwave Access, WiMAX), SWAP (Shared Wireless Access Protocol), WiGig ( The X-ray blocking signal may be transmitted to the workstation 300 using at least one wireless data communication network selected from Wireless Gigabit Alliance (WiGig) and RF communication.

In step S1650, the control unit 330 of the workstation 300 transmits an X-ray blocking signal to the X-ray radiator 200.

In step S1660, the X-ray irradiation unit 200 stops X-ray irradiation. In one embodiment of the present disclosure, the X-ray radiator 200 controls a high voltage generator (HVG) to stop generating high voltage, and X-rays transmitted from the high voltage generator to the X-ray source 210 are removed. By blocking, X-ray irradiation can be stopped.

A program executed by the X-ray detector 100 or the X-ray imaging apparatus 1000 described in this disclosure may be implemented as a hardware component, a software component, and/or a combination of hardware components and software components. . A program can be executed by any system capable of executing computer readable instructions.

Software may include a computer program, code, instructions, or a combination of one or more of the foregoing, which configures a processing device to operate as desired or processes independently or collectively. You can command the device.

Software may be implemented as a computer program including instructions stored in computer-readable storage media. Computer-readable recording media include, for example, magnetic storage media (e.g., read-only memory (ROM), random-access memory (RAM), floppy disk, hard disk, etc.) and optical reading media (e.g., CD-ROM) (CD-ROM) and DVD (Digital Versatile Disc). A computer-readable recording medium may be distributed among computer systems connected through a network, and computer-readable codes may be stored and executed in a distributed manner. The medium may be readable by a computer, stored in a memory, and executed by a processor.

A computer-readable storage medium may be provided in the form of a non-transitory storage medium. Here, 'non-temporary' only means that the storage medium does not contain a signal and is tangible, but does not distinguish between cases in which data is stored semi-permanently or temporarily in the storage medium. For example, the 'non-temporary storage medium' may include a buffer in which data is temporarily stored.

In addition, the program according to the embodiments disclosed in this specification may be included in a computer program product and provided. Computer program products may be traded between sellers and buyers as commodities.

A computer program product may include a software program and a computer-readable storage medium in which the software program is stored. For example, the computer program product includes a product in the form of a software program (eg, a downloadable application) distributed electronically through a manufacturer of an electronic device or an electronic market (eg, Samsung Galaxy Store). can do. For electronic distribution, at least a portion of the software program may be stored on a storage medium or may be temporarily created. In this case, the storage medium may be a storage medium of a server or a relay server temporarily storing a software program.

The computer program product may include the X-ray detector 100 and/or a storage medium of the X-ray detector 100 in the X-ray imaging apparatus 1000 including the X-ray detector 100 . Alternatively, when there is a third device (eg, a mobile device) communicatively connected to the X-ray detector 100, the computer program product may include a storage medium of the third device. Alternatively, the computer program product may include a software program itself transmitted from the X-ray detector 100 to the third device or from the third device to the X-ray detector 100 .

In this case, at least one of the X-ray detector 100 and the X-ray imaging apparatus 1000 may execute the computer program product to perform the method according to the disclosed embodiments. Alternatively, two or more of the X-ray detector 100 , the X-ray imaging device 1000 , and the third device may execute the computer program product to implement the method according to the disclosed embodiments in a distributed manner.

For example, when the X-ray detector 100 executes a computer program product stored in the memory 140 (see FIG. 5), another electronic device (eg, a mobile device) communicatively connected to the X-ray detector 100 is disclosed. It can be controlled to perform the method according to the embodiments.

As another example, the third device may execute a computer program product to control an electronic device communicatively connected to the third device to perform the method according to the disclosed embodiment.

When the third device executes the computer program product, the third device may download the computer program product from the X-ray detector 100 and execute the downloaded computer program product. Alternatively, the third device may perform the method according to the disclosed embodiments by executing a computer program product provided in a pre-loaded state.

As described above, although the embodiments have been described with limited examples and drawings, those skilled in the art can make various modifications and variations from the above description. For example, the described techniques may be performed in an order different from the methods described, and/or components such as the described computer systems or modules may be combined or combined in a manner different from the methods described, or other components or equivalents. Appropriate results can be achieved even if substituted or substituted by

Claims (20)

a plurality of photodetector elements constituted by a plurality of pixels and detecting X-rays;
an AEC sensor array that detects X-rays that have passed through a target object, digitizes a dose of the detected X-rays, and outputs a signal value;
a memory for storing at least one instruction; and
at least one processor to execute at least one instruction stored in the memory;
including,
The at least one processor,
Obtaining a one-dimensional image based on a signal value output through the AEC sensor array;
Identifying a symmetric point from the one-dimensional image based on the signal value of each pixel of the one-dimensional image;
Adjusting the positions of the plurality of AEC sensing regions so that the plurality of AEC sensing regions are symmetrical about the identified symmetry point, the X-ray detector.
According to claim 1,
The AEC sensor array is a line-type sensor array composed of a plurality of photodetector elements arranged in a first direction among the plurality of photodetector elements, X-ray detector.
According to claim 1,
The AEC sensor array includes a plurality of AEC sensors, and at least one AEC sensor of the plurality of AEC sensors is disposed at a position within the plurality of AEC sensing areas.
According to claim 1,
The at least one processor,
Calculate an average value of differences in signal values from pixels spaced apart from each of a plurality of pixels included in the one-dimensional image, search for a minimum value among average values calculated for each of the plurality of pixels, and The X-ray detector identifies a location of a pixel having the searched minimum value among a plurality of pixels as the symmetry point.
According to claim 1,
The at least one processor,
A plurality of edge points are detected based on signal values of a plurality of pixels of the one-dimensional image, pairs of corresponding edge points among the plurality of detected edge points are obtained, and center points of the obtained pair of edge points are obtained. Calculating the position of, and identifying the position of the calculated center point as the symmetrical point, X-ray detector.
According to claim 1,
The AEC sensor array includes a first AEC sensor array and a second AEC sensor array arranged in a parallel line form,
The at least one processor,
The symmetrical point is obtained by using the sum of signal values per pixel of the first 1D image acquired using the first AEC sensor array and signal values per pixel of the second 1D image acquired using the second AEC sensor array. to identify, the X-ray detector.
According to claim 1,
The AEC sensor array is composed of a plurality of arrays,
The at least one processor,
A plurality of symmetric points are identified from the one-dimensional image obtained using a plurality of AEC sensor arrays, a symmetric axis is obtained by connecting the plurality of symmetric points, and the plurality of symmetric axes arranged on the left and right with respect to the symmetric axis Changing the positions of the plurality of AEC sensing regions so that the AEC sensing is symmetric about the axis of symmetry, the X-ray detector.
According to claim 1,
The at least one processor,
Obtaining the location of the central point of the plurality of AEC sensing areas disposed on the left and right around the identified symmetrical point, and changing the location of the plurality of AEC sensing areas so that the obtained location of the central point coincides with the location of the symmetrical point , X-ray detector.
According to claim 1,
The at least one processor,
Obtaining the one-dimensional image in real time by reading out X-rays detected through a plurality of AEC sensors included in the AEC sensor array at a preset sampling rate;
An X-ray detector that identifies a symmetrical point in real time according to the obtained one-dimensional image and adjusts the position of a plurality of AEC sensing regions.
According to claim 1,
communication interface;
Including more,
The at least one processor,
comparing the doses of X-rays detected in the adjusted plurality of AEC sensing areas with a preset cut-off threshold;
As a result of the comparison, when the dose of the detected X-ray exceeds the cut-off threshold, the X-ray detector controls the communication interface to transmit an X-ray blocking signal to an X-ray source control unit.
In the operating method of an X-ray detector including an AEC (Automatic Exposure Control) sensor,
obtaining a one-dimensional (1D) image by detecting X-rays passing through an object using an AEC sensor array and digitizing a dose of the detected X-rays as a signal value;
identifying a symmetric point from the 1-dimensional image based on a signal value for each pixel of the 1-dimensional image; and
adjusting positions of the plurality of AEC sensing regions so that the plurality of AEC sensing regions are symmetrical about the identified symmetry point;
Including, method.
According to claim 11,
The AEC sensor array is a line-type sensor array composed of a plurality of photodetector elements arranged in a first direction among a plurality of photodetector elements constituting the X-ray detector.
According to claim 11,
At least one AEC sensor among a plurality of AEC sensors included in the AEC sensor array is disposed at a position within the plurality of AEC sensing areas.
According to claim 11,
The step of identifying the symmetry point,
Calculating an average value of differences in signal values from pixels spaced apart from each other with respect to each of the plurality of pixels included in the one-dimensional image;
searching for a minimum value among average values calculated for each of the plurality of pixels; and
identifying a location of a pixel having the searched minimum value among the plurality of pixels as the symmetry point;
Including, method.
According to claim 11,
The step of identifying the symmetry point,
detecting a plurality of edge points based on signal values of a plurality of pixels of the one-dimensional image;
acquiring a pair of corresponding boundary points among the plurality of detected boundary points;
calculating the position of the center point of the obtained pair of boundary points; and
identifying the location of the calculated center point as the symmetrical point;
Including, method.
According to claim 11,
The AEC sensor array includes a first AEC sensor array and a second AEC sensor array arranged in a parallel line form,
The step of identifying the symmetry point,
The symmetrical point is obtained by using the sum of signal values per pixel of the first 1D image acquired using the first AEC sensor array and signal values per pixel of the second 1D image acquired using the second AEC sensor array. How to identify.
According to claim 11,
The step of identifying the symmetry point,
identifying a plurality of symmetry points from the one-dimensional image acquired using a plurality of AEC sensor arrays; and
obtaining a symmetric axis by connecting the plurality of symmetric points;
including,
In the adjusting of the positions of the plurality of AEC sensing areas, the positions of the plurality of AEC sensing areas are changed so that the plurality of AEC sensing areas disposed on the left and right with respect to the axis of symmetry are symmetrical about the axis of symmetry.
According to claim 11,
The step of adjusting the positions of the plurality of AEC sensing areas,
obtaining a location of a center point of the plurality of AEC sensing areas disposed on left and right sides of the identified symmetrical point; and
changing the locations of the plurality of AEC sensing regions so that the obtained location of the central point coincides with the location of the symmetry point;
Including, method.
According to claim 11,
comparing the doses of X-rays detected in the adjusted plurality of AEC sensing areas with a preset cut-off threshold; and
Transmitting an X-ray blocking signal to an X-ray source control unit when the detected X-ray dose exceeds the cut-off threshold as a result of the comparison;
Further comprising a method.
A computer-readable recording medium in which at least one program for implementing the method according to any one of claims 11 to 19 is recorded.

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