KR20230055327A - Touch display device - Google Patents

Abstract

Embodiments of the present disclosure relate to a touch display device that enables a short circuit between touch routing wirings, due to a defect in a process of disposing the touch routing wirings, to be prevented by varying at least one part among a thickness and inclination of an insulating layer disposed in an area wherein the touch routing wiring is disposed and an area other than thereof in a non-active area of a display panel. The touch display device comprises: a plurality of light emitting elements; a sealing layer; a plurality of touch electrodes; a plurality of touch routing wirings; a touch insulating layer; and a flattened layer.

Description

Touch display device {TOUCH DISPLAY DEVICE}

Embodiments of the present disclosure relate to a touch display device.

The display device recognizes a touch of a user's finger or pen on the display panel and performs input processing based on the recognized touch in order to provide various functions to the user.

The display device may include, for example, a plurality of touch electrodes disposed on a display panel. The display device may sense a user's touch by driving a plurality of touch electrodes and detecting a change in capacitance generated when the user touches the display panel.

The display device may include various components for image display in addition to components for touch sensing. There is a need for a method capable of implementing touch electrodes on a display panel to improve touch sensing performance without deteriorating image display performance of a display device.

Embodiments of the present disclosure may provide a method capable of preventing a defect in a touch routing wire from occurring in a process of arranging a touch routing wire for driving a touch electrode.

In embodiments of the present disclosure, a plurality of light emitting elements disposed in an active area of a display panel, an encapsulation layer disposed on the plurality of light emitting elements, a plurality of touch electrodes disposed on the encapsulation layer, and a plurality of touch electrodes A plurality of touch routing wires electrically connected to at least one and disposed extending to a pad area located outside the encapsulation layer, a touch insulating layer disposed in at least a partial area under the plurality of touch routing wires, and an active area; It includes a planarization layer located between the pad regions and located below the touch insulating layer, and the inclination angle of the first side surface of the planarization layer facing the pad region overlapping the plurality of touch routing wires is such that the plurality of touch routing wires are disposed. The touch display device may be provided with a smaller inclination angle than the inclination angle of the second side surface located in at least a partial area other than the area.

In embodiments of the present disclosure, a plurality of touch electrodes disposed in an active area of a display panel, a plurality of touches electrically connected to at least one of the plurality of touch electrodes and extended to a pad area positioned outside the active area Routing wires, a plurality of display signal lines extending from the outside of the active area to the pad area, and a plurality of touch routing wires and display signal lines disposed outside the active area while overlapping at least a portion of the plurality of display signal lines. It is possible to provide a touch display device including a flattening layer, wherein an inclination angle of a first side surface overlapping the touch routing wires and facing the pad area is smaller than an inclination angle of a second side surface overlapping the plurality of display signal lines and facing the pad area. there is.

According to the embodiments of the present disclosure, by adjusting the inclination of the insulating layer located under the touch routing wire in the area where the touch routing wire extends to and is placed in the pad area, due to defects in the process of disposing the touch routing wire, touch routing It is possible to prevent a short circuit between wires from occurring.

1 is a diagram schematically illustrating a configuration of a touch display device according to embodiments of the present disclosure.
2 is a diagram illustrating an example of a circuit structure of a subpixel included in a touch display device according to embodiments of the present disclosure.
3 to 5 are diagrams illustrating examples of a touch sensor structure included in a touch display device according to embodiments of the present disclosure.
6 is a diagram illustrating an example of a structure of a touch electrode included in a touch sensor structure of a touch display device according to embodiments of the present disclosure.
FIG. 7 is a diagram illustrating an example in which the structure of the touch sensor shown in FIG. 5 is implemented by the structure of the touch electrode shown in FIG. 6 .
8 is a diagram illustrating an example of a structure of an electrode constituting a touch sensor structure of a touch display device according to embodiments of the present disclosure.
FIG. 9 is a diagram showing an example of arrangement relationship between electrodes shown in FIG. 8 and components included in subpixels.
FIG. 10 is a view showing an example of a cross-sectional structure of portion AA′ shown in FIG. 9 .
11 to 13 are diagrams illustrating specific examples in which a touch sensor structure of a touch display device according to embodiments of the present disclosure is implemented in an active area of a display panel.
14 is a diagram illustrating a specific example in which a touch sensor structure of a touch display device according to embodiments of the present disclosure is implemented in a peripheral area of a boundary between an active area and a non-active area of a display panel.
15 is a diagram illustrating a specific example in which a touch sensor structure of a touch display device according to embodiments of the present disclosure is implemented between a dam of an active area and a non-active area of a display panel.
16 and 17 are diagrams illustrating specific examples in which a touch sensor structure of a touch display device according to embodiments of the present disclosure is implemented in a non-active area including a pad area of a display panel.
18 and 19 are diagrams showing examples of the cross-sectional structure of the portion CC' and the cross-sectional structure of the portion DD' shown in FIG. 16 .

DETAILED DESCRIPTION Some embodiments of the present disclosure are described in detail below with reference to exemplary drawings. In adding reference numerals to components of each drawing, the same components may have the same numerals as much as possible even if they are displayed on different drawings. In addition, in describing the present disclosure, when it is determined that a detailed description of a related known configuration or function may obscure the gist of the present disclosure, the detailed description may be omitted. When "comprises", "has", "consists of", etc. mentioned in this specification is used, other parts may be added unless "only" is used. In the case where a component is expressed in the singular, it may include the case of including the plural unless otherwise explicitly stated.

Also, terms such as first, second, A, B, (a), and (b) may be used in describing the components of the present disclosure. These terms are only used to distinguish the component from other components, and the nature, sequence, order, or number of the corresponding component is not limited by the term.

In the description of the positional relationship of components, when it is described that two or more components are "connected", "coupled" or "connected", the two or more components are directly "connected", "coupled" or "connected". ", but it will be understood that two or more components and other components may be further "interposed" and "connected", "coupled" or "connected". Here, other components may be included in one or more of two or more components that are “connected”, “coupled” or “connected” to each other.

In the description of the temporal flow relationship related to components, operation methods, production methods, etc., for example, "after", "continued to", "after", "before", etc. Alternatively, when a flow sequence relationship is described, it may also include non-continuous cases unless “immediately” or “directly” is used.

On the other hand, when a numerical value or corresponding information (eg, level, etc.) for a component is mentioned, even if there is no separate explicit description, the numerical value or its corresponding information is not indicated by various factors (eg, process factors, internal or external shocks, noise, etc.) may be interpreted as including an error range that may occur.

Hereinafter, various embodiments of the present disclosure will be described in detail with reference to the accompanying drawings.

1 is a diagram schematically illustrating a configuration of a touch display device 100 according to embodiments of the present disclosure. 2 is a diagram illustrating an example of a circuit structure of a subpixel (SP) included in the touch display device 100 according to embodiments of the present disclosure.

Referring to FIG. 1 , the touch display device 100 includes a display panel 110, a gate driving circuit 120 for driving the display panel 110, a data driving circuit 130, and a controller 140. can do. The touch display device 100 may further include a component for touch sensing in addition to a component for driving the display.

The display panel 110 may include an active area AA in which a plurality of subpixels SP are disposed, and a non-active area NA positioned outside the active area AA. A plurality of gate lines GL and a plurality of data lines DL may be disposed on the display panel 110 . A plurality of subpixels SP may be positioned in an area where the gate line GL and the data line DL intersect.

The gate driving circuit 120 may be controlled by the controller 140 . The gate driving circuit 120 may control driving timing of the plurality of subpixels SP by sequentially outputting scan signals to the plurality of gate lines GL disposed on the display panel 110 .

The gate driving circuit 120 may include one or more Gate Driver Integrated Circuits (GDICs). The gate driving circuit 120 may be positioned on only one side of the display panel 110 or on both sides depending on a driving method.

Each gate driver integrated circuit (GDIC) may be connected to the bonding pad of the display panel 110 using a tape automated bonding (TAB) method or a chip on glass (COG) method. Alternatively, each gate driver integrated circuit (GDIC) may be implemented as a GIP (Gate In Panel) type and directly disposed on the display panel 110 . Alternatively, each gate driver integrated circuit (GDIC) may be integrated and disposed on the display panel 110 . Alternatively, each gate driver integrated circuit (GDIC) may be implemented in a Chip On Film (COF) method mounted on a film connected to the display panel 110 .

The data driving circuit 130 may receive image data DATA from the controller 140 and convert the image data DATA into an analog data voltage Vdata. The data driving circuit 130 outputs the data voltage Vdata to each data line DL according to the timing at which the scan signal is applied through the gate line GL so that each subpixel SP corresponds to image data. brightness can be expressed.

The data driving circuit 130 may include one or more Source Driver Integrated Circuits (SDICs). Each source driver integrated circuit (SDIC) may include a shift register, a latch circuit, a digital-to-analog converter, an output buffer, and the like.

Each source driver integrated circuit (SDIC) may be connected to the bonding pad of the display panel 110 using a tape automated bonding (TAB) method or a chip on glass (COG) method. Alternatively, each source driver integrated circuit (SDIC) may be directly disposed on the display panel 110 . Alternatively, each source driver integrated circuit (SDIC) may be integrated and disposed on the display panel 110 . Alternatively, each source driver integrated circuit (SDIC) may be implemented in a chip on film (COF) method. In this case, each source driver integrated circuit (SDIC) may be mounted on a film connected to the display panel 110 and electrically connected to the display panel 110 through wires on the film.

The controller 140 may supply various control signals to the gate driving circuit 120 and the data driving circuit 130 and control driving of the gate driving circuit 120 and the data driving circuit 130 .

The controller 140 may be mounted on a printed circuit board or a flexible printed circuit. The controller 140 may be electrically connected to the gate driving circuit 120 and the data driving circuit 130 through a printed circuit board or a flexible printed circuit.

The controller 140 may control the gate driving circuit 120 to output a scan signal according to timing set in each frame. The controller 140 converts image data received from the outside (eg, host system) according to the data signal format used by the data driving circuit 130 and transfers the converted image data DATA to the data driving circuit 130. can be printed out.

The controller 140 includes various types of video data DATA including a vertical synchronization signal VSYNC, a horizontal synchronization signal HSYNC, an input data enable signal DE, and a clock signal CLK. A timing signal may be received from the outside (eg host system).

The controller 140 may generate various control signals using various timing signals received from the outside and output them to the gate driving circuit 120 and the data driving circuit 130 .

For example, the controller 140 may include a gate start pulse (GSP), a gate shift clock (GSC), and a gate output enable signal (GOE) to control the gate driving circuit 120 . : Gate Output Enable) and the like can be output to the gate driving circuit 120 .

The gate start pulse GSP may control operation start timing of one or more gate driver integrated circuits GDIC constituting the gate driving circuit 120 . The gate shift clock (GSC) is a clock signal commonly input to one or more gate driver integrated circuits (GDIC), and can control the shift timing of the scan signal. The gate output enable signal GOE may designate timing information of one or more gate driver integrated circuits GDIC.

In addition, the controller 140, in order to control the data driving circuit 130, a source start pulse (SSP: Source Start Pulse), a source sampling clock (SSC: Source Sampling Clock), and a source output enable signal (SOE: Various data control signals DCS including Source Output Enable) and the like may be output to the data driving circuit 130 .

The source start pulse SSP may control data sampling start timing of one or more source driver integrated circuits SDIC constituting the data driving circuit 130 . The source sampling clock SSC may be a clock signal that controls sampling timing of data in each of one or more source driver integrated circuits SDIC. The source output enable signal SOE may control output timing of the data driving circuit 130 .

The touch display device 100 includes a power management integrated circuit that supplies various voltages or currents to a display panel 110, a gate driving circuit 120, and a data driving circuit 130, or controls various voltages or currents to be supplied. can include more.

Each subpixel SP may be an area defined by the intersection of the gate line GL and the data line DL, and depending on the type of the touch display device 100, a liquid crystal layer may be disposed or light may be emitted. A device may be placed.

For example, when the touch display device 100 is an organic light emitting display device, organic light emitting diodes (OLEDs) and various circuit elements may be disposed in a plurality of subpixels (SP). By controlling the current supplied to the organic light emitting diode (OLED) by various circuit elements, each subpixel (SP) can express brightness corresponding to image data.

Alternatively, in some cases, a light emitting diode (LED), a micro light emitting diode (μLED), or a quantum dot light emitting diode (QLED) may be disposed in the subpixel SP.

Referring to FIG. 2 , each of the plurality of subpixels SP may include a light emitting element ED. The subpixel SP may include a driving transistor DRT that controls driving current supplied to the light emitting element ED.

The subpixel SP may include at least one circuit element other than the light emitting element ED and the driving transistor DRT to drive the subpixel SP.

For example, the subpixel SP includes a first transistor T1 , a second transistor T2 , a third transistor T3 , a fourth transistor T4 , a fifth transistor T5 , and a storage capacitor Cstg. can include

The example shown in FIG. 2 shows a 6T1C structure in which 6 transistors and 1 capacitor are disposed, but embodiments of the present disclosure are not limited thereto. Although the example shown in FIG. 2 shows a case where the transistors are P-type, at least some of the transistors disposed in the sub-pixel SP may be N-type.

Also, the transistor disposed in the subpixel SP may include, for example, a semiconductor layer made of low temperature polysilicon (LTPS) or a semiconductor layer made of an oxide semiconductor. In some cases, a transistor including a semiconductor layer made of low-temperature polycrystalline silicon and a transistor including a semiconductor layer made of an oxide semiconductor may be mixed and disposed in the subpixel SP.

The first transistor T1 may be electrically connected between the data line DL and the first node N1. The first transistor T1 may be controlled by the first scan signal Scan1 supplied through the first gate line GL1. The first transistor T1 may control application of the data voltage Vdata to the first node N1.

The second transistor T2 may be electrically connected between the second node N2 and the third node N3. The second node N2 may be a gate node of the driving transistor DRT. The third node N3 may be a drain node or a source node of the driving transistor DRT. The second transistor T2 may be controlled by the second scan signal Scan2 supplied through the second gate line GL2. The second transistor T2 may perform an operation of compensating for a change in the threshold voltage of the driving transistor DRT.

The third transistor T3 may be electrically connected between the line to which the reference voltage Vref is supplied and the first node N1. The third transistor T3 may be controlled by the emission control signal EM supplied through the emission control line EML. The third transistor T3 may control discharge of the first node N1 or application of the reference voltage Vref to the first node N1.

The fourth transistor T4 may be electrically connected between the third node N3 and the fifth node N5. The fifth node N5 may be a node electrically connected to the light emitting element ED. The fourth transistor T4 may be controlled by the emission control signal EM supplied through the emission control line EML. The fourth transistor T4 may control timing at which driving current is supplied to the light emitting element ED.

The fifth transistor T5 may be electrically connected between a line to which the reference voltage Vref is supplied and the fifth node N5. The fifth transistor T5 may be controlled by the second scan signal Scan2 supplied through the second gate line GL2. The fifth transistor T5 may control discharge of the fifth node N5 or application of the reference voltage Vref to the fifth node N5.

The driving transistor DRT may be electrically connected between the fourth node N4 and the third node N3. The fourth node N4 may be electrically connected to a line to which the first driving voltage VDD is supplied. The first driving voltage VDD may be, for example, a high potential driving voltage. The fourth node N4 may be a source node or a drain node of the driving transistor DRT.

The driving transistor DRT may be controlled by a voltage difference between the voltage of the second node N2 and the voltage of the fourth node N4. The driving transistor DRT may control the driving current supplied to the light emitting element ED.

The driving transistor DRT may include a back gate electrode electrically connected to the fourth node N4 . Current output of the driving transistor DRT may be stably achieved by the back gate electrode electrically connected to the source node of the driving transistor DRT. For example, the back gate electrode may be disposed using a metal layer to block external light from being incident into the channel of the driving transistor DRT.

The light emitting element ED may be electrically connected between the fifth node N5 and a line to which the second driving voltage VSS is supplied. The second driving voltage VSS may be, for example, a low potential driving voltage.

The light emitting element ED includes a first electrode E1 electrically connected to the fifth node N5, a second electrode E2 to which the second driving voltage VSS is applied, and a second electrode E1 and a second electrode E1. A light emitting layer EL disposed between the electrodes E2 may be included.

The light emitting element ED may exhibit brightness according to a driving current supplied by the driving transistor DRT. The driving timing of the light emitting element ED may be controlled by the fourth transistor T4.

Briefly describing the driving timing of the subpixel SP shown in FIG. 2 , the turn-on level second scan signal Scan2 may be supplied through the second gate line GL2. Since the transistor disposed in the subpixel SP is a P type, the turn-on level may be a low level.

The second transistor T2 and the fifth transistor T5 may be turned on by the turn-on level of the second scan signal Scan2.

Since the second transistor T2 is turned on, the second node N2 and the third node N3 may be electrically connected. A voltage obtained by reflecting the threshold voltage of the driving transistor DRT in the first driving voltage VDD may be applied to the second node N2 through the second transistor T2. Through this process, a change in the threshold voltage of the driving transistor DRT may be compensated for.

Since the fifth transistor T5 is turned on, the reference voltage Vref may be applied to the fifth node N5. A fifth node N5 may be initialized.

After that, the first scan signal Scan1 of the turn-on level may be supplied through the first gate line GL1.

The first transistor T1 may be turned on by the first scan signal Scan1 having a turn-on level.

Since the first transistor T1 is turned on, the data voltage Vdata may be applied to the first node N1.

The first driving voltage VDD, in which the data voltage Vdata and the threshold voltage of the driving transistor DRT are reflected, may be applied to both ends of the storage capacitor Cstg.

Thereafter, the turn-on level emission control signal EM may be supplied through the emission control line EML.

The third transistor T3 and the fourth transistor T4 may be turned on.

Since the third transistor T3 is turned on, the voltage of the first node N1 can be changed to the reference voltage Vref. A voltage of the second node N2 coupled to the first node N1 may be changed according to a change in voltage of the first node N1.

A voltage in which the threshold voltage of the driving transistor DRT and the data voltage Vdata are reflected in the first driving voltage VDD is applied to the second node N2, and the first driving voltage is applied to the fourth node N4. (VDD) may be applied. The difference between the voltage of the second node N2 and the voltage of the fourth node N4 may be a voltage in which the data voltage Vdata and the threshold voltage of the driving transistor DRT are reflected. A driving current corresponding to the data voltage Vdata may be supplied by the driving transistor DRT.

Since the fourth transistor DRT is turned on, the driving current supplied by the driving transistor DRT can be supplied to the light emitting element ED.

The light emitting element ED represents brightness according to driving current, and the subpixel SP including the light emitting element ED may display an image corresponding to image data.

Also, according to embodiments of the present disclosure, a touch sensor structure may be implemented in the display panel 110 displaying an image to provide a function of sensing a user's touch on the display panel 110 .

3 to 5 are diagrams illustrating examples of a touch sensor structure included in the touch display device 100 according to embodiments of the present disclosure.

Referring to FIG. 3 , the touch display device 100 may include a plurality of touch electrode lines TEL and a plurality of touch routing lines TL disposed on the display panel 110 . The touch display device 100 may include a touch driving circuit 150 that drives a plurality of touch electrode lines TEL and a plurality of touch routing wires TL.

Each of the plurality of touch electrode lines TEL may be electrically connected to the touch driving circuit 150 through a touch routing line TL. The touch driving circuit 150 may be disposed separately or, in some cases, integrated with a circuit for driving a display. For example, the touch driving circuit 150 may be integrated with the data driving circuit 130 .

Each of the plurality of touch electrode lines TEL may include a plurality of touch electrodes TE electrically connected to each other along one direction. Also, each of the plurality of touch electrode lines TEL may include a plurality of touch electrode connection patterns CL electrically connecting the plurality of touch electrodes TE to each other.

For example, each of the plurality of X-touch electrode lines (X-TEL) electrically connects the plurality of X-touch electrodes (X-TE) and the plurality of X-touch electrodes (X-TE) arranged along the first direction to each other. It may include a plurality of X-touch electrode connection patterns (X-CL) connected to .

Each of the plurality of Y-touch electrode lines (Y-TEL) includes a plurality of Y-touch electrodes (Y-TE) and a plurality of Y-touch electrodes (Y-TE) arranged along a second direction crossing the first direction. may include a plurality of Y-touch electrode connection patterns (Y-CL) electrically connecting them to each other.

The X-touch electrode line X-TEL and the Y-touch electrode line Y-TEL may be disposed on different layers. Alternatively, the X-touch electrodes X-TE and Y-touch electrodes Y-TE may be disposed on the same layer. In this case, one of the X-touch electrode connection pattern X-CL and the Y-touch electrode connection pattern Y-CL may be disposed on a different layer from the touch electrode TE.

For example, the touch electrode TE may have a rectangular shape, but is not limited thereto.

The touch electrode TE may be made of a transparent conductive material and disposed without interfering with the image display function of the display panel 110 .

Alternatively, the touch electrode TE may be made of an opaque metal. In this case, the touch electrode TE may have an open area corresponding to the light emitting area of the light emitting device ED disposed on the display panel 110 . For example, the touch electrode TE may be implemented in a mesh shape and disposed avoiding the light emitting area.

In a structure in which a plurality of X-touch electrode lines (X-TEL) and a plurality of Y-touch electrode lines (Y-TEL) are disposed to cross each other, the touch driving circuit 150 touches a touch through a touch routing wire (TL). Touch sensing may be performed while driving the electrode line TEL.

For example, one of the X-touch electrode line X-TEL and the Y-touch electrode line Y-TEL may be a touch driving electrode to which a touch driving signal is applied. Another one of the X-touch electrode line X-TEL and the Y-touch electrode line Y-TEL may be a touch sensing electrode from which a touch sensing signal is detected.

The touch driving circuit 150 detects a change in mutual capacitance that occurs when a user touches a state in which different signals are applied to the X-touch electrode line (X-TEL) and the Y-touch electrode line (Y-TEL). can be detected.

The touch driving circuit 150 may transfer sensing data according to the detected change in mutual capacitance to the touch controller. The touch controller may detect whether a touch occurs on the display panel 110 and touch coordinates based on sensing data received from the touch driving circuit 150 .

The touch electrode lines TEL disposed on the display panel 110 may be divided and disposed in multiple areas in the active area AA.

Since the touch electrode lines TEL are divided and disposed for each area, the load of the touch electrode lines TEL can be reduced. When the area of the display panel 110 increases, the load of the touch electrode line TEL can be reduced and touch sensing performance can be improved.

Referring to FIG. 4 , the active area AA of the display panel 110 may include a plurality of sub areas SAA that are divided by a boundary in a first direction and a boundary in a second direction.

The active area AA may include at least two or more sub areas SAA separated by a first boundary BL1 along the first direction. The active area AA may include at least two or more sub areas SAA separated by a second boundary BL2 along the second direction.

For example, the first sub area SAA1 and the second sub area SAA2 may be divided by the first boundary BL1. The third sub area SAA3 and the fourth sub area SAA4 may be divided by the first boundary BL1.

The first sub area SAA1 and the third sub area SAA3 may be divided by the second boundary BL2 . The second sub area SAA2 and the fourth sub area SAA4 may be divided by the second boundary BL2.

4 shows an example in which the active area AA is divided into four sub areas SAA, but the active area AA has a plurality of sub areas by a first boundary BL1 and a second boundary BL2. (SAA).

The touch electrode lines TEL disposed in each of the plurality of sub areas SAA may be disposed separately from the touch electrode lines TEL disposed in the other sub areas SAA.

The touch electrode lines TEL disposed in each of the plurality of sub areas SAA may be independently driven.

For example, the first X-touch electrode line X-TEL-1 disposed in the first sub area SAA1 is connected to the first touch driving circuit through the first X-touch routing line X-TL-1. (151) and can be electrically connected. The first Y-touch electrode line Y-TEL-1 may be electrically connected to the first touch driving circuit 151 through the first Y-touch routing line Y-TL-1.

The second X-touch electrode line X-TEL-2 disposed in the second sub-region SAA2 is connected to the second touch driving circuit 152 through the second X-touch routing line X-TL-2. can be electrically connected with The second Y-touch electrode line Y-TEL-2 may be electrically connected to the second touch driving circuit 152 through the second Y-touch routing line Y-TL-2.

The first X-touch electrode line X-TEL- 1 and the first Y-touch electrode line Y-TEL- 1 may be driven by the first touch driving circuit 151 . The second X-touch electrode line X-TEL- 2 and the second Y-touch electrode line Y-TEL- 2 may be driven by the second touch driving circuit 152 . The touch electrode lines TEL in the third and fourth sub areas SAA3 and SAA4 are similar to the touch electrode lines TEL disposed in the first and second sub areas SAA1 and SAA2. It is arranged in a structure and can be driven in a similar way.

Since the touch electrode line TEL disposed in the first sub area SAA1 and the touch electrode line TEL disposed in the second sub area SAA2 are electrically separated from each other and driven by a different touch driving circuit 150, A load for touch sensing may be reduced and performance of touch sensing may be improved.

Also, in some cases, the touch electrode lines TEL disposed in two or more sub areas SAA may be driven by the same touch driving circuit 150 . For example, the touch electrode line TEL disposed in the first sub area SAA1 and the touch electrode line TEL disposed in the second sub area SAA2 may be driven by the same touch driving circuit 150 . . The touch electrode line TEL disposed in the third sub area SAA3 and the touch electrode line TEL disposed in the fourth sub area SAA4 may be driven by the same touch driving circuit 150 . Alternatively, as another example, the touch electrode lines TEL disposed in the first subregion SAA1 , the second subregion SAA2 , the third subregion SAA3 , and the fourth subregion SAA4 are the same as the touch driving circuit. (150). Even in this case, since the touch electrode lines TEL disposed in each sub-region SAA are disposed in a structure separated from each other, the load of the touch electrode lines TEL is reduced and touch sensing performance can be improved.

As described above, in a structure in which the touch electrode lines TEL are separately disposed in each of the plurality of sub areas SAA, a part of the touch routing line TL may be disposed in the active area AA.

For example, the first X-touch routing line X-TL-1 electrically connected to the first X-touch electrode line X-TEL-1 of the first sub-region SAA1 and the second sub-region ( The second X-touch routing line X-TL-2 electrically connected to the second X-touch electrode line X-TEL-2 of SAA2) may be disposed in the non-active area NA.

The second Y-touch routing wire Y-TL-2 electrically connected to the second Y-touch electrode line Y-TEL-2 of the second sub area SAA2 is in the non-active area NA. can be placed.

A portion of the first Y-touch routing line Y-TL-1 electrically connected to the first Y-touch electrode line Y-TEL-1 of the first sub-region SAA1 is in the active area AA. can be placed.

A portion of the first Y-touch routing line Y-TL-1 may be disposed in the second sub area SAA2. The first Y-touch routing line Y-TL-1 passes through the second sub-region SAA2 to the first Y-touch electrode line Y-TEL-1 disposed in the first sub-region SAA1. can be electrically connected.

Since a portion of the first Y-touch routing line Y-TL-1 is disposed in the second sub area SAA2, the second X-touch electrode line X-TEL- disposed in the second sub area SAA2. 2) and at least one of the second Y-touch electrode line Y-TEL-2 may be disposed separately from an area where the first Y-touch routing line Y-TL-1 is disposed. 4 illustrates an example in which the second Y-touch electrode line Y-TEL-2 is separated and disposed in the second sub area SAA2 due to the arrangement of the first Y-touch routing line Y-TL-1. indicate

As such, when the touch electrode lines TEL are divided and disposed in each sub-region SAA, the number of touch routing lines TL connected to the touch electrode lines TEL may increase. Since the number of touch routing lines TL increases, the non-active area NA may increase due to the arrangement of the touch routing lines TL. However, the first Y-touch routing line Y-TL-1 is electrically connected to the first Y-touch electrode line Y-TEL-1 of the first sub-area SAA1 through the active area AA. Therefore, the addition of a separate area for the arrangement of the first Y-touch routing line Y-TL-1 in the non-active area NA may not be required. A touch sensor structure divided into sub areas SAA may be implemented without increasing the non-active area NA due to the addition of the first Y-touch routing line Y-TL-1.

The touch sensor structure divided into a plurality of sub areas SAA may be divided into an upper touch sensor unit and a lower touch sensor unit based on the first boundary BL1 . Also, the touch sensor structure may be divided into a left touch sensor unit and a right touch sensor unit based on the second boundary BL2. Here, the lower touch sensor unit may be located closer to the pad to which the touch routing line TL is connected than the upper touch sensor unit. That is, a distance between the lower touch sensor unit and an area where the pad to which the touch routing line TL is connected is disposed may be smaller than a distance between the upper touch sensor unit and an area where the pad is disposed.

In addition, since the area of the second Y-touch electrode line Y-TEL-2 is reduced by the first Y-touch routing line Y-TL-1, the first Y-touch electrode line Y-TEL-2 Sensitivity deviation of touch sensing may be prevented by making the area of 1) the same as or similar to that of the second Y-touch electrode line Y-TEL-2.

Referring to FIG. 5 , the first Y-touch routing line Y-TL-1 is disposed in at least a part of the area of the first sub area SAA1 corresponding to the area in the second sub area SAA2. At least one first dummy electrode DME1 separated from the Y-touch electrode line Y-TEL-1 may be disposed.

The first dummy electrode DME1 may be electrically separated from the first Y-touch electrode line Y-TEL-1.

A width of the area where the first dummy electrode DME1 is disposed may be the same as or similar to that of the first Y-touch routing line Y-TL-1. Alternatively, the width of the area where the first dummy electrode DME1 is disposed is equal to or similar to the width of the area in the second sub area SAA2 where the second Y-touch electrode line Y-TEL-2 is not disposed. can do. In addition, the distance between the two parts of the first Y-touch electrode line Y-TEL-1 disposed on both sides of the first dummy electrode DME1 is the first Y-touch routing line Y-TL-1. The distance between the two parts of the second Y-touch electrode line Y-TEL-2 disposed on both sides of may be the same as or similar to that of the distance between the two parts.

The area of the first Y-touch electrode line Y-TEL-1 disposed in the first sub area SAA1 is the area of the second Y-touch electrode line Y-TEL-2 disposed in the second sub area SAA2. ) may be substantially equal to the area of

Even if the first Y-touch routing line Y-TL-1 is disposed passing through the first sub-area SAA1, the first Y-touch electrode line Y-TEL-1 of the first sub-area SAA1 It is possible to prevent or reduce the occurrence of a deviation between the touch sensitivity caused by and the touch sensitivity caused by the second Y-touch electrode line Y-TEL-2 of the second sub area SAA2.

According to the exemplary embodiments of the present disclosure, the active area AA is divided into a plurality of sub areas SAA and the touch electrode line TEL is disposed in each of the plurality of sub areas SAA to sense a touch. Even if the area of the active area AA is increased by reducing the load of the electrode line TEL, touch sensing performance may be improved.

In addition, the touch electrode line TEL disposed in each sub-region SAA has the same or similar area so that the touch electrode line TEL disposed in each sub-region SAA has a deviation in touch sensitivity. It can be prevented.

Each of the plurality of touch electrodes TE included in the touch electrode line TEL may have a rectangular shape as in the above-described example, but may have various structures to improve touch sensing performance.

6 is a diagram illustrating an example of a structure of a touch electrode TE included in a touch sensor structure of a touch display device 100 according to embodiments of the present disclosure.

Referring to FIG. 6 , an X-touch electrode (X-TE) included in an X-touch electrode line (X-TEL) and a Y-touch electrode (Y-TE) included in a Y-touch electrode line (Y-TEL) ) shows an example of the form. 6 is a diagram for explaining an example of a structure of a touch electrode TE, wherein an X-touch electrode line X-TEL and a Y-touch electrode line Y-TEL cross each other, and an X-touch electrode ( X-TE) and the Y-touch electrode (Y-TE) are disposed on the same layer as an example.

The X-touch electrode (X-TE) and the Y-touch electrode (Y-TE) may have a similar shape.

If the shape of the touch electrode TE is described using the X-touch electrode X-TE as an example, the X-touch electrode X-TE includes at least one body part X-TE-a and a plurality of It may include a wing part (X-TE-b).

The body portion X-TE-a of the X-touch electrode X-TE may be disposed along the first direction or the second direction, and FIG. 6 illustrates the body portion of the X-touch electrode X-TE. (X-TE-a) represents an example disposed along the second direction.

The wing portion X-TE-b of the X-touch electrode X-TE may be disposed along a direction crossing the body portion X-TE-a, and FIG. 6 shows the X-touch electrode X -TE) shows an example in which the wing portion (X-TE-b) is disposed along the first direction.

The width of the body portion X-TE-a of the X-touch electrode X-TE may be the same as the width of the wing portion X-TE-b of the X-touch electrode X-TE. Alternatively, the width of the body portion X-TE-a of the X-touch electrode X-TE may be greater than that of the wing portion X-TE-b of the X-touch electrode X-TE.

The body portion X-TE-a of the X-touch electrode X-TE may be alternately disposed with the body portion Y-TE-a of the Y-touch electrode Y-TE in the first direction. there is.

The wing portion X-TE-b of the X-touch electrode X-TE may be alternately disposed with the wing portion Y-TE-b of the Y-touch electrode Y-TE in the second direction. there is.

The wing portion (X-TE-b) of the X-touch electrode (X-TE) and the wing portion (Y-TE-b) of the Y-touch electrode (Y-TE) may be disposed in an interdigitated manner. An area where the outer edges of the X-touch electrodes X-TE and the outer edges of the Y-touch electrodes Y-TE face each other may increase. Also, the length of the boundary between the X-touch electrode X-TE and the Y-touch electrode Y-TE may increase. Performance of touch sensing based on a change in mutual capacitance between the X-touch electrode (X-TE) and the Y-touch electrode (Y-TE) may be improved.

The X-touch electrode (X-TE) and the Y-touch electrode (Y-TE) may be disposed using electrodes disposed on the same layer. One of the X-touch electrode (X-TE) and the Y-touch electrode (Y-TE) is connected by an electrode disposed on the same layer as the touch electrode (TE), and the other is connected by an electrode disposed on the same layer as the touch electrode (TE). can be connected by electrodes disposed on

For example, the Y-touch electrode Y-TE connected along the second direction may be connected by an electrode disposed on the same layer as the touch electrode TE.

The X-touch electrodes X-TE connected along the first direction may be electrically connected by the X-touch electrode connection pattern X-CL disposed on a different layer from the touch electrode TE.

For example, the X-touch electrodes X-TE and Y-touch electrodes Y-TE may be disposed using the first touch sensor metal TSM1. The X-touch electrode connection pattern X-CL may be disposed using the second touch sensor metal TSM2.

The second touch sensor metal TSM2 may be disposed on a layer different from that of the first touch sensor metal TSM1 .

The X-touch electrode X-TE and the X-touch electrode connection pattern X-CL may be electrically connected to each other through the contact hole CH.

As such, the touch electrode line TEL may be implemented using the layer on which the first touch sensor metal TSM1 is disposed and the layer on which the second touch sensor metal TSM2 is disposed.

The boundary between the X-touch electrode (X-TE) and the Y-touch electrode (Y-TE) is increased by the structure in which the touch electrode (TE) includes a body portion (TE-a) and a wing portion (TE-b). This can improve the sensitivity of touch sensing. Also, the performance of touch sensing may be improved by reducing a load due to the structure of the touch electrode lines TEL separately disposed for each sub area SAA of the active area AA.

FIG. 7 is a diagram illustrating an example in which the touch sensor structure shown in FIG. 5 is implemented by the structure of the touch electrode TE shown in FIG. 6 . FIG. 7 illustratively illustrates a touch sensor structure implemented in an area indicated by 501 shown in FIG. 5 .

Referring to FIGS. 6 and 7 , the active area AA may be divided into four sub areas SAA1 , SAA2 , SAA3 , and SAA4 by a first boundary BL1 and a second boundary BL2 , for example. can The touch electrode lines TEL disposed in each of the four sub-regions SAA1 , SAA2 , SAA3 , and SAA4 may be disposed separately from each other.

The touch electrode lines TEL disposed in each sub area SAA may include a plurality of X-touch electrode lines X-TEL and a plurality of Y-touch electrode lines Y-TEL.

Each of the plurality of X-touch electrode lines X-TEL may include a plurality of X-touch electrodes X-TE. Each of the plurality of Y-touch electrode lines Y-TEL may include a plurality of Y-touch electrodes Y-TE. The X-touch electrode X-TE and the Y-touch electrode Y-TE may constitute one sensing unit SU.

The plurality of X-touch electrodes X-TE included in the X-touch electrode line X-TEL may be electrically connected by the X-touch electrode connection pattern X-CL.

For example, the plurality of X-touch electrodes X-TE may be formed of the first touch sensor metal TSM1. The X-touch electrode connection pattern X-CL may be formed of the second touch sensor metal TSM2 disposed on a layer different from the layer on which the first touch sensor metal TSM1 is disposed.

The X-touch electrode connection pattern X-CL is disposed along the first direction and may be electrically connected to the X-touch electrode X-TE through the contact hole CH. A plurality of X-touch electrodes X-TE may be electrically connected along the first direction to form an X-touch electrode line X-TEL.

For example, the X-touch electrode connection pattern X-CL may be disposed in an area overlapping the wing portion X-TE-b of the X-touch electrode X-TE. The X-touch electrode connection pattern X-CL may not be disposed in an area overlapping the wing portion Y-TE-b of the Y-touch electrode Y-TE. A portion of the X-touch electrode connection pattern X-CL may overlap the body portion Y-TE-a of the Y-touch electrode Y-TE.

The width Wa1 of the wing portion (X-TE-b) of the X-touch electrode (X-TE) located in the area overlapping the X-touch electrode connection pattern (X-CL) is The width Wa2 of the wing portion (X-TE-b) of the X-touch electrode (X-TE) positioned in an area that does not overlap with -CL may be larger than Wa2.

The width Wa1 of the wing portion (X-TE-b) of the X-touch electrode (X-TE) positioned in the area overlapping the X-touch electrode connection pattern (X-CL) is ) may be greater than the width Wa3 of the wing portion Y-TE-b.

Since the X-touch electrode connection pattern (X-CL) overlaps the wide wing portion (X-TE-b) of the wing portion (X-TE-b) of the X-touch electrode (X-TE), The width or number of the X-touch electrode connection patterns X-CL may increase. The X-touch electrodes X-TE may be electrically connected while reducing the resistance of the X-touch electrode connection pattern X-CL.

In the area where the X-touch electrode connection pattern (X-CL) is not disposed, the width of the wing portion (X-TE-b) of the X-touch electrode (X-TE) and the width of the Y-touch electrode (Y-TE) Since the width of the wing portion (Y-TE-b) is relatively small, the touch sensing performance is improved by maintaining a structure in which the boundary between the X-touch electrode (X-TE) and the Y-touch electrode (Y-TE) is increased. can be improved

The X-touch electrode line X-TEL may be electrically connected to the X-touch electrode contact pad X-CP at the boundary between the active area AA and the non-active area NA.

For example, the X-touch electrode X-TE made of the first touch sensor metal TSM1 may be disposed to extend into the non-active area NA. An X-touch electrode contact pad X-CP made of the second touch sensor metal TSM2 may be disposed in an area overlapping the extended X-touch electrode X-TE. The extended X-touch electrode X-TE and the X-touch electrode contact pad X-CP may be electrically connected through the contact hole CH.

Alternatively, X-touch electrode contact pads X-CP made of the extended portion of the X-touch electrodes X-TE disposed in the non-active area NA and the second touch sensor metal TSM2 are combined to form an X-touch electrode contact pad X-CP. - It can also be called a touch electrode contact pad (X-CP).

The X-touch electrode contact pad X-CP may be electrically connected to the X-touch routing line X-TL in the non-active area NA. The X-touch electrode line X-TEL may be electrically connected to the X-touch routing line X-TL through the X-touch electrode contact pad X-CP. The X-touch routing line X-TL may be formed of at least one of the first touch sensor metal TSM1 and the second touch sensor metal TSM2.

A plurality of Y-touch electrodes Y-TE included in the Y-touch electrode line Y-TEL may be directly connected to each other.

For example, the plurality of Y-touch electrodes Y-TE may be formed of the first touch sensor metal TSM1. A plurality of Y-touch electrodes Y-TE may be connected along the second direction and constitute a Y-touch electrode line Y-TEL.

Of the plurality of Y-touch electrode lines Y-TEL, the Y-touch electrode lines Y-TEL disposed in the second sub area SAA2 and the fourth sub area SAA4 are different from the active area AA. - It may be electrically connected to the Y-touch routing line (Y-TL) disposed in the non-active area (NA) at the boundary of the active area (NA).

For example, the second Y-touch electrode line Y-TEL-2 is connected to the second Y-touch routing line Y-TL-2 at the boundary between the active area AA and the non-active area NA. can be electrically connected. The second Y-touch routing wire Y-TL-2 may be formed of at least one of the first touch sensor metal TSM1 and the second touch sensor metal TSM2.

Among the plurality of Y-touch electrode lines Y-TEL, the Y-touch electrode lines Y-TEL disposed in the first sub area SAA1 and the third sub area SAA3 are Y-touch electrode lines Y-TEL in the active area AA. - Can be electrically connected to the touch routing wire (Y-TL).

For example, the first Y-touch electrode line Y-TEL-1 may be electrically connected to the first Y-touch routing line Y-TL-1 in the active area AA.

The first Y-touch routing line Y-TL-1 may be disposed in the non-active area NA and the second sub area SAA2. The first Y-touch routing line Y-TL-2 includes the first Y-touch electrode line Y-TEL-1 disposed in the first sub-area SAA1 passing through the second sub-area SAA2 and can be electrically connected.

The first Y-touch routing wire Y-TL-1 may be formed of, for example, the first touch sensor metal TSM1. In some cases, the second touch sensor metal TSM2 is disposed in an area overlapping the first Y-touch routing wire Y-TL-1 and makes contact with the first Y-touch routing wire Y-TL-1. It is electrically connected through the hole CH to reduce the resistance of the first Y-touch routing line Y-TL-1.

As the first Y-touch routing line Y-TL-1 is disposed in the second sub area SAA2, the second Y-touch electrode line Y-TEL-2 disposed in the second sub area SAA2. ) may be disposed separately on both sides of the first Y-touch routing wire Y-TL-1.

Two parts of the second Y-touch electrode line Y-TEL-2 are connected to the second Y-touch routing line Y-TL-2 at the boundary between the active area AA and the non-active area NA. and can be electrically connected to each other.

Also, two parts of the second Y-touch electrode line Y-TEL-2 may be electrically connected to each other by the second Y-touch electrode connection pattern Y-CL-2 disposed in the active area AA. there is.

The second Y-touch electrode connection pattern Y-CL-2 may be made of, for example, the second touch sensor metal TSM2.

Two portions of the second Y-touch electrode line Y-TEL-2 may be electrically connected to each other by at least one second Y-touch electrode connection pattern Y-CL-2. For example, the second Y-touch electrode connection pattern Y-CL-2 is disposed in an area adjacent to the upper boundary of the sensing unit SU and an area adjacent to the lower boundary of the sensing unit SU, and the second Y-touch electrode connection pattern Y-CL-2 It may be electrically connected to the touch electrode line Y-TEL-2.

Since the two parts of the second Y-touch electrode line Y-TEL-2 that are separated from each other are connected at multiple points by the second Y-touch electrode connection pattern Y-CL-2, the second Y-touch electrode line Y-TEL-2 -It is possible to prevent the load from increasing due to the separated structure of the touch electrode line (Y-TEL-2).

The first Y-touch routing line Y-TL-1 is electrically connected to the first Y-touch electrode line Y-TEL-1 in the first sub-region SAA1 through the second sub-region SAA2. can be connected

Since the first Y-touch routing line Y-TL-1 passes through the second sub area SAA2 and extends to the first sub area SAA1, the first Y-touch routing line Y-TL-1 A portion may be disposed on the first boundary BL1.

A point at which the first Y-touch routing line Y-TL-1 is connected to the first Y-touch electrode line Y-TEL-1 may be located inside the first sub-region SAA1. The point at which the first Y-touch routing line Y-TL-1 is connected to the first Y-touch electrode line Y-TEL-1 is between the first sub area SAA1 and the second sub area SAA2. It may not be located on the border.

The first Y-touch routing line Y-TL-1 passes through the second sub area SAA2 and is electrically connected to the first Y-touch electrode line Y-TEL-1 disposed in the first sub area SAA1. Therefore, in a structure in which the touch electrode line TEL is divided into a plurality of sub areas SAA, the touch routing line TL can be disposed without increasing the non-active area NA.

Since the area of the second Y-touch electrode line Y-TEL-2 decreases as the first Y-touch routing line Y-TL-1 is disposed in the second sub-region SAA2, the area of the second Y-touch electrode line Y-TEL-2 decreases. The area of the first Y-touch electrode line Y-TEL-1 located in the area corresponding to the touch electrode line Y-TEL-2 is the area of the second Y-touch electrode line Y-TEL-2. can be the same as or similar to

For example, the first Y-touch electrode line Y-TEL-1 may be separated into two parts and disposed similarly to the second Y-touch electrode line Y-TEL-2.

Two parts of the first Y-touch electrode line Y-TEL-1 may be electrically connected to each other by the first Y-touch electrode connection pattern Y-CL-1. A load increase due to a structure in which the first Y-touch electrode line Y-TEL-1 is separated may be prevented by the first Y-touch electrode connection pattern Y-CL-1.

At least one first dummy electrode DME1 may be disposed between two portions of the first Y-touch electrode line Y-TEL- 1 .

The first dummy electrode DME1 may be electrically separated from the first Y-touch electrode line Y-TEL-1 and the first Y-touch routing line Y-TL-1.

A boundary between the first dummy electrode DME1 and the first Y-touch routing line Y-TL- 1 may be different from the boundary between the first sub-region SAA1 and the second sub-region SAA2 . A boundary between the first dummy electrode DME1 and the first Y-touch routing line Y-TL- 1 may be located inside the first sub-region SAA1 .

The first dummy electrode DME1 may be disposed in the second sub area SAA2 to correspond to a portion of the first Y-touch routing line Y-TL- 1 disposed in the first sub area SAA1. . The width of the first dummy electrode DME1 may be the same as or similar to that of the first Y-touch routing line Y-TL-1.

Due to the arrangement of the first Y-touch routing wire Y-TL-1 in the second sub-region SAA2, the area of the second Y-touch electrode line Y-TEL-2 is reduced to correspond to the reduced area. An area of the first Y-touch electrode line Y-TEL-1 disposed in the first sub-region SAA1 may be reduced. As the area of the first Y-touch electrode line Y-TEL- 1 decreases, the electrode located in the remaining area may become the first dummy electrode DME1.

The touch sensitivity of the touch electrode line TEL disposed in the first sub area SAA1 and the touch sensitivity caused by the touch electrode line TEL disposed in the second sub area SAA2 are maintained at the same or similar level, and the active A structure in which a part of the touch routing line TL is disposed in the area AA may be implemented.

Since the Y-touch routing line Y-TL is disposed along the second direction, a portion of the Y-touch routing line Y-TL may be positioned on the first boundary BL1.

Since the second boundary BL2, which is a boundary in the second direction, divides the first subregion SAA1 and the third subregion SAA3, and the second subregion SAA2 and the fourth subregion SAA4, the second boundary BL2 divides the second subregion SAA1 and SAA3. The Y-touch routing line Y-TL disposed along may not be disposed on the second boundary BL2.

The first Y-touch routing line Y-TL-1 extends from the boundary between the active area AA and the non-active area NA to the non-active area NA, and the second Y-touch routing line ( Y-TL-2). In an area where the first Y-touch routing line Y-TL-1 and the second Y-touch routing line Y-TL-2 intersect, the two may be disposed on different layers.

As described above, according to the embodiments of the present disclosure, the touch sensor capable of reducing the load by the touch electrode line TEL due to the structure in which the touch electrode line TEL is divided and disposed in a plurality of sub areas SAA. A structure may be provided. In addition, since a part of the touch routing line TL is disposed in the active area AA, the touch sensing performance can be improved without increasing the non-active area NA due to the arrangement of the touch routing line TL. may be provided.

As in the above example, the touch electrode TE constituting the touch electrode line TEL may be made of a transparent conductive material or an opaque metal material. When the touch electrode TE is made of an opaque metal material, the touch electrode TE has an open shape in an area corresponding to the light emitting area of the subpixel SP so as not to degrade the image display performance of the display panel 110 . can The shape of the touch electrode TE including the open portion may vary according to the type of the subpixel SP.

8 is a diagram illustrating an example of a structure of an electrode constituting a touch sensor structure of the touch display device 100 according to embodiments of the present disclosure. FIG. 8 illustratively illustrates the structure of an electrode constituting a touch sensor structure in an area indicated by 701 shown in FIG. 7 .

8 illustrates an example of a specific structure of electrodes constituting the body portion TE-a and the wing portion TE-b of the touch electrode TE described above. The electrode shown in FIG. 8 is cut in a certain direction and may form the body part TE-a and the wing part TE-b of the touch electrode TE. Also, the structure of the touch routing line TL electrically connected to the touch electrode TE may be the same as the structure of the electrode shown in FIG. 8 .

Referring to FIG. 8 , a structure in which a display signal line (DSL) for supplying a signal for driving a display to the display panel 110 is disposed and a structure in which a touch electrode (TE) is disposed is illustrated as an example.

The display signal lines DSL may include a plurality of first display signal lines DSL1 disposed in a first direction and a plurality of second display signal lines DSL2 disposed in a second direction.

The first display signal line DSL1 may be, for example, a gate line GL or an emission control line EML. The second display signal line DSL2 may be, for example, a data line DL or a line supplying at least one of the first driving voltage VDD, the reference voltage Vref, and the second driving voltage VSS. .

The touch electrode TE may include, for example, a first portion TE_f disposed along a first direction, a second portion TE_s disposed along a second direction, and a third direction different from the first and second directions. It may include a third portion TE_t disposed along .

The electrode constituting the touch electrode TE is cut in the first direction as indicated by 801 or cut in the first direction to form the X-touch electrode TE or the Y-touch electrode Y-TE. It can be cut in the second direction like a part.

The electrodes including the first part TE_f, the second part TE_s, and the third part TE_t are cut in the first direction or the second direction, so that the aforementioned touch electrode TE is the body part TE-a. ) or wing part (TE-b) can be configured.

Similar to the touch electrode TE, the touch routing line TL may include at least a portion of the first part TE_f, the second part TE_s, and the third part TE_t, and may include a first direction or a second part TE_t. can be cut in either direction.

As the touch electrode TE includes a first portion TE_f, a second portion TE_s, and a third portion TE_t disposed in different directions, the touch electrode TE has a plurality of open portions. can include The shape of the open portion of the touch electrode TE may vary and may be determined according to the shape of the light emitting area of the subpixel SP disposed on the display panel 110 .

FIG. 9 is a diagram illustrating an example of arrangement relationship between an electrode constituting a touch sensor structure and elements included in a subpixel SP in the touch display device 100 according to embodiments of the present disclosure. FIG. 9 illustratively illustrates the structure of electrodes constituting the touch sensor structure in the area indicated by 702 shown in FIG. 7 . FIG. 10 is a view showing an example of a cross-sectional structure of portion A-A′ shown in FIG. 9 .

Referring to FIGS. 9 and 10 , the light emitting area of the light emitting element ED disposed in the subpixel SP may be located in an area overlapping the open portion of the touch electrode TE.

The light emitting region of the light emitting element ED may refer to an area in which the light emitting layer EL and the second electrode E2 are overlapped and disposed on the first electrode E1 of the light emitting element ED. Also, the light emitting area of the light emitting element ED may mean an area where the bank BNK is not disposed among the areas where the first electrode E1 of the light emitting element ED is disposed.

9 shows an example of a form in which light emitting regions of a red subpixel SP_r, a green subpixel SP_g, and a blue subpixel SP_b are arranged, but the form of a subpixel SP constituting one pixel and The size may vary depending on the display panel 110 .

The first part TE_f, the second part TE_s, and the third part TE_t of the touch electrode TE may be disposed avoiding the emission area of the subpixel SP.

The touch electrode TE may be positioned between light emitting regions of adjacent subpixels SP to prevent or minimize the influence of the touch electrode TE on an image displayed according to a viewing angle.

As the touch electrode TE is disposed while avoiding the emission area of the subpixel SP, it may be disposed overlapping with a specific structure located in the subpixel SP.

For example, the first part TE_f of the touch electrode TE disposed along the first direction is electrically connected between the first electrode E1 of the light emitting element ED and the thin film transistor TFT in the subpixel SP. It may be disposed while overlapping with at least a portion of the contact hole (CH) for direct connection.

Referring to <EX 1> of FIGS. 9 and 10 , a multi-buffer layer MB may be disposed on the substrate SUB. The substrate SUB may include, for example, a first polyimide layer PI1 , an interlayer polyimide layer IPD, and a second polyimide layer PI2 . The multi-buffer layer MB may have a structure in which a plurality of insulating layers are stacked.

A light blocking metal layer (BSM) may be disposed on the multi-buffer layer (MB). The light blocking metal layer BSM may constitute the display signal line DSL or may constitute a part of the storage capacitor Cstg disposed in the subpixel SP.

An active buffer layer AB may be disposed on the light blocking metal layer BSM.

An active layer ACT may be disposed on the active buffer layer AB. The active layer ACT may be made of a semiconductor material.

The active layer ACT may form a channel of the thin film transistor TFT. In addition, the active layer ACT may be a conductor and form a part of the display signal line DSL or the storage capacitor Cstg.

A gate insulating layer GI may be disposed on the active layer ACT.

A gate metal layer (GAT) may be disposed on the gate insulating layer (GI). The gate metal layer (GAT) may constitute a gate electrode of the thin film transistor (TFT) or may constitute a display signal line (DSL) or the like.

A first interlayer insulating layer ILD1 may be disposed on the gate metal layer GAT.

A display auxiliary electrode layer TM may be disposed on the first interlayer insulating layer ILD1. The display auxiliary electrode layer TM may be used in various ways to form a part of the display signal line DSL or the storage capacitor Cstg.

A second interlayer insulating layer ILD2 may be disposed on the display auxiliary electrode layer TM.

A source-drain metal layer SD may be disposed on the second interlayer insulating layer ILD2. The source-drain metal layer SD may constitute a source electrode and a drain electrode of the thin film transistor TFT, or may constitute a display signal line DSL or the like.

A planarization layer PLN may be disposed on the source-drain metal layer SD.

The first electrode E1 of the light emitting device ED may be disposed on the planarization layer PLN. The first electrode E1 of the light emitting element ED may be electrically connected to the thin film transistor TFT positioned under the planarization layer PLN through a contact hole CH formed in the planarization layer PLN. The thin film transistor TFT electrically connected to the first electrode E1 of the light emitting element ED may be, for example, a driving transistor DRT, and the light emission timing of the light emitting element ED as shown in FIG. It may be a transistor that controls

A bank BNK may be disposed on the planarization layer PLN and the first electrode E1 of the light emitting device ED. The bank BNK may be disposed to cover an edge portion of the first electrode E1 of the light emitting element ED.

The light emitting layer EL of the light emitting device ED and the second electrode E2 may be disposed on a portion of the first electrode E1 exposed by the bank BNK and on the bank BNK. A portion of the first electrode E1 exposed by the bank BNK may correspond to the emission area.

An encapsulation layer ENCAP may be disposed on the second electrode E2 of the light emitting element ED. The encapsulation layer ENCAP may include a plurality of layers. The encapsulation layer ENCAP may include at least one inorganic layer and at least one organic layer.

For example, the encapsulation layer ENCAP may include a first inorganic encapsulation layer PAS1 , an organic encapsulation layer PCL, and a second inorganic encapsulation layer PAS2 .

The inorganic encapsulation layers PAS1 and PAS2 may be formed of, for example, an inorganic insulating material capable of low-temperature deposition such as silicon nitride (SiNx), silicon oxide (SiOx), silicon oxynitride (SiON), or aluminum oxide (Al2O3). . The organic encapsulation layer PCL may be formed of, for example, an organic insulating material such as acrylic resin, epoxy resin, polyimide, polyethylene, or silicon oxycarbon (SiOC).

The encapsulation layer ENCAP may seal the light emitting device ED and protect the light emitting device ED from external moisture and air.

A touch sensor structure for touch sensing may be implemented on the encapsulation layer ENCAP.

For example, the touch buffer layer TBUF may be disposed on the encapsulation layer ENCAP. The touch buffer layer TBUF may be an inorganic layer. In some cases, the touch buffer layer TBUF may not be disposed, but the touch buffer layer TBUF may be disposed to facilitate disposition of the touch sensor metal TSM on the encapsulation layer ECNAP.

A touch insulating layer TILD may be disposed on the touch buffer layer TBUF.

Although not shown in the example of FIG. 10 , the second touch sensor metal TSM2 constituting the touch electrode connection pattern CL may be disposed between the touch buffer layer TBUF and the touch insulating layer TILD.

The touch insulating layer TILD may be an inorganic layer. Alternatively, the touch insulating layer TILD may be an organic layer.

When the touch insulating layer TILD is an organic layer, the thickness of the touch insulating layer TILD may be greater than that of the touch buffer layer TBUF.

In addition, when the touch insulating layer TILD is an organic layer, a touch insulating buffer layer TIBUF may be further disposed between the touch insulating layer TILD and the touch buffer layer TBUF as shown in <EX 2> of FIG. 10 . there is. As such, two or more buffer layers may be disposed between the encapsulation layer ENCAP and the touch insulating layer TILD.

The touch insulation buffer layer TIBUF may be disposed between the touch insulation layer TILD and the second touch sensor metal TSM2. The touch insulation buffer layer TIBUF may be an inorganic layer. The touch insulation buffer layer TIBUF may be made of the same material as the touch buffer layer TBUF.

At least a portion of the touch insulation layer TILD may be disposed to contact a top surface of the touch insulation buffer layer TIBUF.

Since the touch insulation buffer layer TIBUF made of an inorganic layer is disposed between the touch insulation layer TILD and the second touch sensor metal TSM2, adhesion of the touch insulation layer TILD, which is an organic layer, may be more easily performed.

The touch insulating buffer layer TIBUF may have a thickness smaller than that of the touch insulating layer TILD and may be similar to the thickness of the touch buffer layer TBUF.

The touch electrode TE may be disposed on the touch insulating layer TILD. The first touch sensor metal TSM1 is disposed on the touch insulating layer TILD and may constitute a touch electrode TE. In addition, the first touch sensor metal TSM1 is disposed on the touch insulating layer TILD and may constitute a touch routing wire TL.

FIG. 10 illustratively illustrates a cross-sectional structure of a portion of the touch electrode TE shown in FIG. 9 where the first portion TE_f is disposed. The first portion TE_f of the touch electrode TE may be disposed on the touch insulating layer TILD.

The first portion TE_f of the touch electrode TE may be disposed avoiding the light emitting area of the light emitting element ED. The first portion TE_f of the touch electrode TE overlaps at least a portion of the contact hole CH for electrical connection between the first electrode E1 of the light emitting element ED and the thin film transistor TFT. can be placed in

The first portion TE_f of the touch electrode TE may be disposed in the first direction and disposed between adjacent display signal lines DSL or may be disposed while overlapping a portion of the display signal line DSL.

Since the touch electrode TE is positioned in an area overlapping the contact hole CH and disposed avoiding the light emitting area of the light emitting device ED, the touch sensor structure does not impede the image display function of the display panel 110. can be implemented.

The touch protection layer TPAS is disposed on the touch electrode TE made of the first touch sensor metal TSM1 and may protect the touch electrode TE.

As described above, each part of the electrode constituting the touch electrode TE or the touch routing line TL is disposed in an area that does not overlap with the light emitting area of the light emitting element ED disposed in the subpixel SP, and is disposed in the light emitting area. Since it is disposed at a position that minimizes obstruction of the viewing angle, the touch sensor structure can be implemented while preventing or minimizing degradation of image display performance of the display panel 110 .

Hereinafter, a specific example in which the touch sensor structure shown in FIG. 5 is implemented by the touch electrode TE and the touch routing line TL having the aforementioned electrode structure will be described. Also, as described above, the touch electrode TE may have various structures other than the aforementioned electrode structure, and the embodiments of the present disclosure may be applied to all of the various electrode structures.

11 to 13 are diagrams illustrating specific examples in which the touch sensor structure of the touch display device 100 according to embodiments of the present disclosure is implemented in the active area AA of the display panel 110 .

11 illustrates an example of a structure of a touch electrode TE disposed in an area where the sub area SAA is divided in the active area AA of the display panel 110 . 12 shows an example of the structure of the touch routing line TL and the dummy electrode DME disposed in the active area AA. 13 illustrates an example of a boundary between the touch routing line TL and the dummy electrode DME in the active area AA.

Referring to FIG. 11 , the active area AA of the display panel 110 may be divided into a plurality of sub areas SAA by a first boundary BL1 and a second boundary BL2 . The touch electrode lines TEL disposed in each of the plurality of sub areas SAA may be disposed separately from each other. In FIG. 11 , a schematic diagram showing the overall structure of the display panel 110 shows only the portion made of the first touch sensor metal TSM1 for convenience of illustration.

Some of the touch electrode lines TEL disposed in the plurality of sub areas SAA are touch routing lines TL disposed in the non-active area NA at the boundary between the active area AA and the non-active area NA. ) and electrically connected.

The other part of the touch electrode lines TEL disposed in the plurality of sub areas SAA passes through the active area AA from the non-active area NA and the touch routing line TL disposed in the active area AA. can be electrically connected.

The touch electrode TE constituting the touch electrode line TEL may include at least one body part TE-a and a plurality of wing parts TE-b.

The touch electrode line TEL and the touch routing line TL may be implemented by cutting electrodes including the first part TE_f, the second part TE_s, and the third part TE_t along a certain direction. there is.

For example, an electrode may be cut at a boundary between the X-touch electrode line X-TEL and the Y-touch electrode line Y-TEL. An electrode may be cut at a boundary between the touch routing line TL, the dummy electrode DME, and the touch electrode line TEL. Also, an electrode may be cut at the boundary of the sub area SAA.

Referring to FIG. 11 , the electrode may be cut along the first direction at the first boundary BL1. An electrode may be cut along the second direction at the second boundary BL2 .

Electrodes are cut at the first boundary BL1 and the second boundary BL2, and the first sub-region SAA1, the second sub-region SAA2, the third sub-region SAA3, and the fourth sub-region SAA4 are formed. The touch electrode lines TEL disposed on each may be distinguished.

The X-touch electrode line X-TEL and the Y-touch electrode line Y-TEL disposed in each sub-region SAA may also be implemented by cutting electrodes in the first direction or the second direction.

The distance between the touch electrodes TE at the boundary of the sub area SAA may be the same as or similar to the distance between the touch electrodes TE in the sub area SAA. By making the intervals between the cut electrodes substantially the same, a difference in visibility according to an area of the display panel 110 may not occur.

The touch routing line TL and the dummy electrode DME may also be implemented by cutting electrodes in a manner similar to that of the touch electrode line TEL.

Referring to FIG. 12 , a portion indicated by 1201 represents an example of an area in the first sub area SAA1 where the first dummy electrode DME1 is disposed. A portion indicated by 1202 indicates an example of an area in the second sub area SAA2 where the first Y-touch routing line Y-TL-1 is disposed.

An electrode disposed in the second sub area SAA2 is cut, and a first Y-touch routing line Y-TL-1 may be disposed.

The first Y-touch routing line Y-TL-1 may be positioned between the second Y-touch electrode line Y-TEL-2 in the second sub-region SAA2.

An electrode disposed in the first sub-region SAA1 is cut, and at least one first dummy electrode DME1 may be disposed. At least one first dummy electrode DME1 has an area corresponding to the area in the first sub area SAA1 where the first Y-touch routing line Y-TL-1 is disposed in the second sub area SAA2. can be located in

The first dummy electrode DME1 may be positioned between the first Y-touch electrode line Y-TEL-1 in the first sub-region SAA1. As shown in FIG. 12 , the first dummy electrodes DME1 may be separated and disposed so that a defect does not occur even if a portion of the first dummy electrode DME1 is short-circuited.

A first dummy electrode DME1 electrically separated from the first Y-touch electrode line Y-TEL-1 between the first Y-touch electrode lines Y-TEL-1 of the first sub-region SAA1. can be located. A first Y-touch routing wire electrically separated from the second Y-touch electrode line Y-TEL-2 between the second Y-touch electrode lines Y-TEL-2 of the second sub area SAA2. (Y-TL-1) may be located.

The first dummy electrode DME1 and the first Y-touch routing line Y-TL-1 may be disposed to correspond to each other. The width of the area where the first dummy electrode DME1 is disposed may be the same as or similar to the width of the area where the first Y-touch routing line Y-TL-1 is disposed. That is, the lower touch sensor unit has an area through which the first Y-touch routing wire (Y-TL-1) of the upper touch sensor unit passes, and the upper touch sensor unit has a first Y-touch routing wire disposed in the lower touch sensor unit. A first dummy electrode DME1 may be provided in an area corresponding to (Y-TL-1).

In the second sub area SAA2, an electrode portion between the first Y-touch routing line Y-TL-1 and the second Y-touch electrode line Y-TEL-2 is cut, and at least one second dummy is cut. An electrode DME2 may be disposed.

The second dummy electrode DME2 may be electrically separated from the first Y-touch routing line Y-TL-1 and the second Y-touch electrode line Y-TEL-2.

The first dummy electrode DME1 may be positioned in the first sub area SAA1 corresponding to the area in the second sub area SAA2 where the second dummy electrode DME2 is disposed. A portion of the first dummy electrode DME1 may be disposed to correspond to the second dummy electrode DME2 .

The second dummy electrode DME2 may be disposed to prevent or reduce visibility deterioration due to the arrangement of the touch electrode line TEL. Alternatively, the second dummy electrode DME2 may be disposed to prevent a short circuit between the first Y-touch routing line Y-TL-1 and the second Y-touch electrode line Y-TEL-2. .

The first dummy electrode DME1 is disposed in the first sub area SAA1 and the second sub area SAA2 corresponding to each other, or the first Y-touch routing line Y-TL-1 and the second dummy electrode DME1 are disposed. An electrode DME2 may be disposed. In each of the first sub-region SAA1 and the second sub-region SAA2 , the area in which the Y-touch electrode line Y-TEL is disposed may have the same or similar area. The distance between the two parts of the first Y-touch electrode line Y-TEL- 1 separated from both sides of the first dummy electrode DME1 in the first sub area SAA1 is the second sub area SAA2. ) may be the same as or similar to the interval between the two parts of the second Y-touch electrode line Y-TEL-2 that are separately disposed on both sides of the first Y-touch routing wire Y-TL-1. there is.

The first dummy electrode DME1 and the second dummy electrode DME2 may be cut and disposed similarly to the touch electrode line TEL or the touch routing line TL. Similar to the touch electrode line TEL, the dummy electrode DME may be cut and disposed in the first direction or the second direction.

Alternatively, at least one of the first dummy electrode DME1 and the second dummy electrode DME2 may be cut and disposed in a direction different from the direction in which the touch electrode line TEL and the touch routing line TL are cut. there is.

As an example, the touch electrode line TEL and the touch routing wire TL may be disposed after the electrodes are cut in the first direction or the second direction, as in the above-described example. On the other hand, the first dummy electrode DME1 and the second dummy electrode DME2 may be cut and disposed along a third direction different from the first and second directions. Both sides of each of the first dummy electrode DME1 and the second dummy electrode DME2 may be cut along a third direction different from the first and second directions.

For example, an electrode may be cut in an oblique direction at a boundary between the dummy electrode DME and the touch electrode line TEL or touch routing line TL, and the dummy electrode DME may be disposed. Both sides of the dummy electrode DME may be cut in an oblique direction. When the boundary of the dummy electrode DME is cut in an oblique direction, the area of the end of the dummy electrode DME may be larger than the area of the end of the touch electrode line TEL or the end of the touch routing line TL. .

A boundary between the touch electrode lines TEL and a boundary between the touch electrode lines TEL and the touch routing wiring TEL may have electrodes cut along the first direction or the second direction. there is.

The boundary between the dummy electrode DME and the touch electrode line TEL, the boundary between the dummy electrode DME and the touch routing line TL, and the boundary between the dummy electrodes DME are different from the first direction and the second direction. It may be cut along three directions (eg, diagonal directions).

At the boundary of the dummy electrode DME, the dummy electrode DME may have a shape in which the electrode is cut in an oblique direction. At the boundary between the dummy electrode DME and the touch electrode line TEL or touch routing line TL, the touch electrode line TEL or touch routing line TL protrudes toward the dummy electrode DME and is cut in an oblique direction. It may include a protrusion having a shape.

By making the cutting direction of the boundary of the dummy electrode DME different from the cutting direction of the boundary of the touch electrode line TEL or touch routing line TL, a repair process may be facilitated during the inspection of the touch sensor structure.

For example, when there is a short-circuited portion between electrodes at the boundary where the electrodes are cut in the first direction or the second direction, the corresponding region is the boundary between the touch electrode line TEL or the touch electrode line TEL and the touch routing wiring ( TL), so a repair process is required to disconnect the shorted part.

If there is a short-circuited portion between electrodes at the boundary where electrodes are cut in a diagonal direction, since at least one of the short-circuited electrodes is a dummy electrode (DME), the structure of the touch sensor may not be affected even if the short-circuited portion is not disconnected. . Therefore, the inspection process can be ended without performing the repair process. In this case, the dummy electrode DME may be disposed in the active area AA in a structure connected to the touch electrode line TEL or the touch routing line TL.

As such, due to the arrangement of the dummy electrodes DME, the area of the touch electrode line TEL can be made uniform and visibility can be improved. In addition, by making the cutting direction at the boundary of the dummy electrode DME different from the cutting direction at the boundary of the touch electrode line TEL, etc., the efficiency of the inspection process can be improved.

In the above example, only the case where the dummy electrode DME is disposed in the area corresponding to the touch routing line TL or around the touch routing line TL is described, but in some cases, the dummy electrode DME may be used as a touch electrode. It may be disposed inside the line TEL or in a boundary area between the touch electrode lines TEL. Even in this case, the dummy electrodes DME may be uniformly positioned for each region.

A first Y-touch electrically connected to the first dummy electrode DME1 disposed in the first sub area SAA1 and the first Y-touch electrode line Y-TEL-1 of the first sub area SAA1. A boundary between the routing wires (Y-TL-1) may also be cut in a similar manner.

Referring to FIG. 13 , a portion indicated by 1301 represents a boundary between the first Y-touch routing line Y-TL-1 and the first dummy electrode DME1.

A boundary between the first Y-touch routing line Y-TL-1 and the first dummy electrode DME1 may have an electrode cut in an oblique direction.

Alternatively, in some cases, the boundary between the first Y-touch routing line Y-TL-1 and the first dummy electrode DME1 may be cut along the first direction. Since the plurality of first dummy electrodes DME1 are separated and disposed, only the boundary of the first dummy electrode DME1 closest to the first Y-touch routing wire Y-TL-1 is cut in an oblique direction. Maybe not.

Since the first Y-touch routing line Y-TL-1 is electrically connected to the first Y-touch electrode line Y-TEL-1 disposed in the first sub-region SAA1, the first Y- A boundary between the touch routing line Y-TL-1 and the first dummy electrode DME1 may be different from a boundary between the first sub area SAA1 and the second sub area SAA2. For example, a boundary between the first Y-touch routing line Y-TL-1 and the first dummy electrode DME1 may be located inside the first sub-region SAA1.

The first Y-touch routing line Y-TL-1 may be directly connected to the first Y-touch electrode line Y-TEL-1 inside the first sub-region SAA1. Since both the first Y-touch routing line Y-TL-1 and the first Y-touch electrode line Y-TEL-1 are made of the first touch sensor metal TSM1, they can be directly connected to each other.

Alternatively, the first Y-touch routing wire (Y-TL-1) is connected to the first Y-touch by the first Y-touch electrode connection pattern (Y-CL-1) made of the second touch sensor metal (TSM2). It may be electrically connected to the electrode line Y-TEL-1.

The first Y-touch routing line Y-TL-1 and the first Y-touch electrode line are formed by the first Y-touch electrode connection pattern Y-CL-1 positioned above the first boundary BL1. (Y-TEL-1) may be electrically connected to each other. The second Y-touch electrode line Y-TEL- disposed in the second sub area SAA2 by the second Y-touch electrode connection pattern Y-CL-2 located below the first boundary BL1. The two parts of 2) may be electrically connected to each other.

When the first Y-touch routing line Y-TL-1 and the first Y-touch electrode line Y-TEL-1 are connected by the first Y-touch electrode connection pattern Y-CL-1, In the layer where the first touch sensor metal TSM1 is disposed, the first Y-touch routing line Y-TL-1 and the first Y-touch electrode line Y-TEL-1 may be connected or separated from each other. there is.

When the first Y-touch routing wire Y-TL-1 and the first Y-touch electrode line Y-TEL-1 are separately disposed in the layer where the first touch sensor metal TSM1 is disposed, A boundary between the 1 Y-touch routing line Y-TL-1 and the first Y-touch electrode line Y-TEL-1 may have a diagonal shape. Even if the first Y-touch routing wire (Y-TL-1) made of the first touch sensor metal (TSM1) and the first Y-touch electrode line (Y-TEL-1) are short-circuited, a repair process for disconnection is required. Therefore, for convenience of the process, in the process of cutting the dummy electrode DME, the first Y-touch routing wire Y-TL-1 made of the first touch sensor metal TSM1 and the first Y-touch electrode line (Y-TEL-1) may be cut in an oblique direction.

As such, the first Y-touch routing line Y-TL-1 and the first Y-touch electrode line Y-TEL-1 may be electrically connected to each other in various forms in the first sub area SAA1. there is.

FIG. 14 shows a detailed implementation of the touch sensor structure of the touch display device 100 according to embodiments of the present disclosure in the peripheral area of the boundary between the active area AA and the non-active area NA of the display panel 110. It is a drawing showing an example. FIG. 14 illustratively shows a specific structure in which the second touch sensor metal TSM2 is disposed in the area indicated by 703 shown in FIG. 7 .

Referring to FIG. 14 , an example of the structure of the second touch sensor metal TSM2 disposed in an area including one sensing unit SU at one side boundary of the active area AA is shown.

An X-touch electrode connection pattern X-CL for connecting the X-touch electrodes X-TE may be disposed in the active area AA. The X-touch electrode connection pattern X-CL may be connected to an X-touch electrode contact pad X-CP positioned outside the active area AA. The X-touch electrode contact pad X-CP may be connected to the X-touch routing line X-TL.

At least one Y-touch electrode connection pattern Y-CL made of the second touch sensor metal TSM2 may be disposed in an area adjacent to the upper boundary and the lower boundary of the sensing unit SU.

The Y-touch electrode connection pattern Y-CL connects two parts of the Y-touch electrode line Y-TEL separated by the Y-touch routing line Y-TL or the first dummy electrode DME1 to each other. can be electrically connected.

Two or more Y-touch electrode connection patterns Y-CL may be disposed in one sensing unit SU, or may be disposed in various positions. The Y-touch electrode connection pattern (Y-CL) connects the Y-touch electrodes (Y-TE) separated from the upper and lower sides of each sensing unit (SU), so that the Y-touch electrodes (Y-TE) are separated. It can be made to have a state similar to the unstructured structure.

Since the Y-touch electrode connection pattern (Y-CL) is located on the upper and lower boundaries of the sensing unit (SU), the X-touch electrode contact pad (X-CP) connected to the X-touch electrode line (X-TEL) A separated point of may be located between adjacent Y-touch electrode connection patterns Y-CL.

For example, as indicated by 1401, the boundary between the X-touch electrode contact pads (X-CP) may be the same as the boundary of the sensing unit (SU).

Since the Y-touch electrode connection patterns (Y-CL) are disposed on both sides of the boundary of the sensing unit (SU), the boundary between the X-touch electrode contact pads (X-CP) is adjacent to the Y-touch electrode connection pattern (Y-CL). CL) can be located between.

In the layer where the second touch sensor metal TSM2 is disposed, the Y-auxiliary routing pattern ( Y-TLP) may be placed.

The Y-auxiliary routing pattern Y-TLP may be disposed separately from the X-touch electrode connection pattern X-CL and the Y-touch electrode connection pattern Y-CL. The Y-auxiliary routing pattern (Y-TLP) is electrically connected to the overlapping Y-touch routing wiring (Y-TL) and the resistance of the Y-touch routing wiring (Y-TL) disposed in the active area (AA) can reduce

The second touch sensor metal TSM2 disposed in an area overlapping the first dummy electrode DME1 is disposed in a similar shape to the first dummy electrode DME1 and may constitute a dummy pattern DMP.

An X-touch electrode connection pattern (X-CL), a Y-touch electrode connection pattern (Y-CL), and a Y-auxiliary routing pattern (Y-TLP) are disposed on the layer on which the second touch sensor metal (TSM2) is disposed. A dummy pattern DMP may be disposed in an area other than the area. By disposing the dummy pattern DMP in the area overlapping the touch electrode line TEL, a difference in visibility between the area where the touch routing line TL and the auxiliary routing pattern TLP overlap and are disposed can be prevented.

Since only the X-touch routing wiring X-TL driving the X-touch electrode line X-TEL disposed in the corresponding sub-area SAA is disposed in both boundary areas of the active area AA, the X-touch routing line X-TL is disposed. Placement of the touch routing line (X-TL) may be easy. The X-touch routing wire (X-TL) may be implemented in a form of reducing wire resistance by including at least one of the first touch sensor metal (TSM1) and the second touch sensor metal (TSM2).

15 illustrates a touch sensor structure of the touch display device 100 according to embodiments of the present disclosure implemented between the active area AA and the dam DM of the non-active area NA of the display panel 110. It is a drawing showing a specific example.

Referring to FIG. 15 , at least one dam DM may be disposed in the non-active area NA of the display panel 110 . At least one dam DM may be disposed surrounding the active area AA. At least one dam DM may be located outside the encapsulation layer ENCAP. At least one dam DM may be a part of the encapsulation layer ENCAP.

A plurality of touch routing lines TL may be positioned inside at least one dam DM in the non-active area NA. A plurality of touch routing lines TL may be positioned between the active area AA and at least one dam DM in an area other than the pad area PA.

Since the plurality of touch routing wires TL are positioned inside the at least one dam DM, the touch routing wires TL can be disposed while minimizing an increase in the non-active area NA.

At least one shield line SHL may be disposed surrounding at least a portion of the plurality of touch routing wires TL. The shield line SHL may be positioned between the outermost touch routing line TL and the dam DM.

The shield line SHL may be made of the same material as the touch routing line TL. For example, the shield line SHL may be formed of at least one of the first touch sensor metal TSM1 and the second touch sensor metal TSM2.

The shield line SHL may be grounded. Alternatively, the shield line SHL may receive a signal different from a signal supplied through the touch routing line TL.

Since the shield line SHL is disposed surrounding the outside of the touch routing line TL, it is possible to prevent or reduce external noise from affecting a signal of the touch routing line TL by blocking external noise.

At least one guard line GUL may be disposed between the touch routing line TL and the shield line SHL.

The guard line GUL may be made of the same material as the touch routing line TL. For example, the guard line GUL may be formed of at least one of the first touch sensor metal TSM1 and the second touch sensor metal TSM2 .

Since the guard line GUL is positioned between the touch routing line TL and the shield line SHL, parasitic capacitance may be prevented from being formed between the touch routing line TL and the shield line SHL. Since the parasitic capacitance between the touch routing line TL and the shield line SHL is blocked, it is possible to prevent a signal or voltage fluctuation of the shield line SHL from affecting the touch routing line TL.

The guard line GUL may receive a signal corresponding to a signal applied to a touch routing line TL positioned closest to the guard line GUL among a plurality of touch routing lines TL. The guard line GUL may receive a signal corresponding to a signal applied to an outermost touch routing line TL among a plurality of touch routing lines TL.

A signal applied to the touch routing line TL and a corresponding signal may mean a signal having the same frequency, amplitude, and phase of the signal applied to the touch routing line TL.

For example, the guard line GUL may receive the same signal as the signal applied to the touch routing wire TL positioned closest to the guard line GUL at the same timing. Parasitic capacitance may not be formed between the guard line GUL and the touch routing wire TL positioned closest to the guard line GUL. Indirect noise caused by the shield line SHL may be blocked by the guard line GUL.

As such, external noise may be blocked from directly affecting the touch routing line TL by the shield line SHL. In addition, indirect noise caused by the shield line SHL may be blocked from affecting the touch routing line TL by the guard line GUL. Noise of a signal detected through the touch routing line TL by the shield line SHL and the guard line GUL can be prevented or reduced, and signal deviation according to the position of the touch routing line TL can be prevented or reduced. there is.

At least one of the shield line SHL and the guard line GUL may be disposed separately from the non-active area NA.

For example, the shield line SHL and the guard line GUL may be separated and disposed on an extension line of the second boundary BL2, like a portion indicated by 1501 .

The touch electrode line TEL disposed in the first sub area SAA1 and the touch electrode line TEL disposed in the third sub area SAA3 may be disposed separately from each other and driven independently. There may be a slight difference in driving timing of the touch routing line TL for supplying a signal to the touch electrode line TEL disposed in each of the first sub area SAA1 and the third sub area SAA3 .

A guard line GUL supplied with a signal applied to the touch routing line TL and a corresponding signal may be disposed separately in accordance with the sub area SAA driven by the corresponding touch routing line TL.

For example, the guard line GUL positioned on the side of the first subregion SAA1 and the second subregion SAA2 of the display panel 110 is a touch routing wire TL driving the first subregion SAA1. ), it may be arranged to surround the outside of the first sub area SAA1.

The guard line GUL positioned on the side of the third sub area SAA3 and SAA4 of the display panel 110 is closest to the touch routing line TL driving the third sub area SAA3. Since they are adjacent to each other, they may be arranged to surround the outside of the third sub area SAA3.

Each of the guard lines GUL located on both sides of the display panel 110 supplies a signal corresponding to the signal applied to the touch routing line TL at the timing when the signal is applied to the adjacent touch routing line TL. can receive

In a structure in which the touch electrode line TEL disposed in the active area AA is divided into sub areas SAA and driven, noise for the touch routing line TL driving each sub area SAA is more accurately blocked. can do it

The above example is an example in which the guard line GUL is separated in a structure in which the active area AA is divided into four sub areas SAA, but the guard line GUL is separated in a structure in which the sub areas SAA are divided. It can be separated and arranged in various ways according to the

In addition, the shield line SHL positioned outside the guard line GUL may also be separated and disposed corresponding to the structure in which the guard line GUL is separated.

For example, the shield line SHL may be separated and disposed on an extension line of the second boundary BL2 . Alternatively, in some cases, the shield line SHL may be disposed without being separated.

The grounded shield line SHL may be disposed to surround wires disposed in the non-active area NA to block external noise. The guard line GUL positioned adjacent to the touch routing line TL is separated and disposed to correspond to the touch routing line TL or the sub area SAA driven by the touch routing line TL, thereby reducing the parasitic capacitance between the lines. can be blocked to increase the effect of blocking noise.

At least some of the touch routing wires TL, guard lines GUL, and shield lines SHL disposed in the non-active area NA are electrically connected to pads disposed in the pad area PA to receive signals. can

16 and 17 show a detailed implementation of the touch sensor structure of the touch display device 100 according to embodiments of the present disclosure in the non-active area NA including the pad area PA of the display panel 110. It is a drawing showing an example. 18 and 19 are diagrams illustrating examples of a cross-sectional structure of a portion C-C' and a cross-sectional structure of a portion D-D' shown in FIG. 16 .

Referring to FIGS. 16 and 17 , a pad area PA in which a plurality of pads are disposed may be positioned on at least one side of the display panel 110 .

A plurality of display pads (DSP) electrically connected to wires supplying signals for display driving to the pad area PA and a plurality of touch pads (TP) electrically connected to wires supplying signals for touch sensing are can be placed.

A plurality of touch routing wires TL may extend from the active area AA to the non-active area NA and pass over the dam DM. The touch routing line TL may pass over the dam DM and be electrically connected to the touch pad TP disposed in the pad area PA.

A plurality of display signal lines DSL may be disposed extending from the active area AA to the non-active area NA. Since the display signal line DSL is located under the encapsulation layer ENCAP, it may be disposed while passing under the dam DM. In FIG. 16, a portion indicated by 1601 indicates an area where a plurality of display signal lines (DSL) are densely disposed. The display signal line DSL may be electrically connected to the display pad DSP disposed in the pad area PA.

Various wires or patterns made of the same material as the display signal line DSL or the touch routing line TL may be disposed between the dam DM and the pad area PA.

For example, an inspection line DEL for inspection of the display signal line DSL may be disposed between the dam DM and the pad area PA. The test line DEL may be made of the same material as at least a part of the material constituting the display signal line DSL. Whether or not the display signal line DSL is defective may be detected through the inspection line DEL.

A wiring protection pattern LP may be disposed between the dam DM and the pad area PA. The wire protection pattern LP may be made of the same material as at least a part of the material constituting the touch electrode TE or the touch routing wire TL. For example, the wiring protection pattern LP may be disposed on a wiring or pattern supplying various power sources (eg, VDD, VSS, Vref, etc.) for display driving to protect the corresponding wiring or pattern. In addition, the wiring protection pattern LP may constitute a part of a wiring or pattern supplying various types of power for display driving.

At least a portion of each of the display pad DSP and the touch pad TP may be disposed using a material constituting the touch electrode TE and the touch routing line TL. At least a portion of each of the display pad DSP and the touch pad TP may be disposed using a material constituting the display signal line DSL.

A pad part made of a material constituting the touch electrode TE and the touch routing line TL and a pad part made of a material constituting the display signal line DSL are electrically connected in the pad area PA to form various pads. can do.

In the pad area PA, a pad portion made of a material constituting the touch routing line TL and the like and a pad portion made of a material constituting the display signal line DSL may be electrically connected through the contact hole CH. Alternatively, various insulating layers may not be disposed to electrically connect two pad portions in the pad area PA.

For example, the portion indicated by 1602 indicates an area where the touch insulating layer TILD is not disposed between the first touch sensor metal TSM1 and the second touch sensor metal TSM2. The touch sensor metal TSM may contact a pad portion made of the same material as that of the display signal line DSL in an area where the touch insulating layer TILD is not disposed, and constitute the touch pad TP.

A planar structure in which the display pad DSP and the touch pad TP are disposed may vary according to the position of the pad area PA.

For example, referring to FIG. 17 , the pad area PA may be divided to correspond to the sub area SAA of the active area AA. For example, the pad area PA may include four pad areas PA1 , PA2 , PA3 , and PA4 .

A gate pad GP supplying a signal or voltage related to driving the gate driving circuit 120 to the first pad area PA1 , and a data pad DP supplying a signal or voltage related to driving the data driving circuit 130 to the first pad area PA1 . ) and a touch pad TP may be disposed.

The touch pad TP disposed in the first pad area PA1 drives the X-touch electrode line X-TEL disposed in the first sub area SAA1 and the second sub area SAA2. It may be electrically connected to the touch routing line (X-TL). In some cases, a portion of the touch pad TP disposed in the first pad area PA1 may include a Y-touch electrode line Y-TEL disposed in the first sub area SAA1 and the second sub area SAA2. may be electrically connected to the Y-touch routing wire (Y-TL) that drives the .

At least a part of the touch pad TP disposed in the first pad area PA1 may be disposed symmetrically with the display pad DSP. For example, the touch pad TP may be disposed symmetrically with the gate pad GP. In this case, the touch routing line TL connected to the touch pad TP may be disposed symmetrically with the display signal line DSL connected to the gate pad GP. Accordingly, as indicated by 1603 in FIG. 16 , intervals between adjacent touch routing wires TL may be differently disposed.

A data pad DP and a touch pad TP supplying signals or voltages related to driving the data driving circuit 130 may be disposed in the second pad area PA2 and the third pad area PA3 .

The touch pads TP disposed on each of the second pad area PA2 and the third pad area PA3 may be symmetrically disposed. A data pad DP may be disposed between a part and the rest of the symmetrically disposed touch pads TP.

The touch pad TP disposed in the second pad area PA2 drives the Y-touch electrode line Y-TEL disposed in the first and second sub areas SAA1 and SAA2. It may be electrically connected to the touch routing line (Y-TL). The touch pad PA disposed in the third pad area PA3 drives the Y-touch electrode line Y-TEL disposed in the third and fourth sub areas SAA3 and SAA4. It may be electrically connected to the touch routing line (Y-TL).

In some cases, a portion of the touch pad TP disposed on the second pad area PA2 drives the third sub area SAA3 and SAA4, a Y-touch routing line (Y-TL) can be electrically connected to A part of the touch pad TP disposed in the third pad area PA3 may be electrically connected to the Y-touch routing line Y-TL driving the first and second sub areas SAA1 and SAA2. can

Also, in some cases, a part of the touch pad TP disposed in the second pad area PA2 is the X-touch electrode line X-touch electrode line disposed in the first and second sub areas SAA1 and SAA2. TEL) and may be electrically connected to the X-touch routing line (X-TL). A part of the touch pad TP disposed in the third pad area PA3 drives the X-touch electrode line X-TEL disposed in the third and fourth sub areas SAA3 and SAA4. - Can be electrically connected to the touch routing wiring (X-TL).

A touch pad TP, a data pad DP, and a gate pad GP may be disposed in the fourth pad area PA4 . The pads disposed in the fourth pad area PA4 may be disposed symmetrically with the pads disposed in the first pad area PA1 .

The touch pad TP disposed in the fourth pad area PA4 drives the X-touch electrode line X-TEL disposed in the third and fourth sub areas SAA3 and SAA4. It may be electrically connected to the touch routing line (X-TL). In some cases, a portion of the touch pad TP disposed in the fourth pad area PA4 may include Y-touch electrode lines Y-TEL disposed in the third and fourth sub areas SAA3 and SAA4. It may be electrically connected to the Y-touch routing wire (Y-TL) that drives the .

When the gate driving circuit 120 is disposed on both sides of the display panel 110 , gate pads GP may be disposed in the first pad area PA1 and the fourth pad area PA4 .

The data pad DP and the touch pad TP are disposed in a distributed manner for each area inside the gate pad GP, and are electrically connected to the data line DL or the touch routing line TL disposed in the active area AA. It can be arranged to be connected to.

In addition to the above examples, the pads disposed in the pad area PA may be disposed in various structures for efficient connection with the display signal line DSL and the touch routing line TL.

Various pads disposed in the pad area PA may be disposed such that materials disposed on two or more metal layers are connected to each other in order to reduce resistance.

The touch routing line TL may be electrically connected to the auxiliary routing pattern TLP at at least one point and extend to the pad area PA.

Since the touch insulating layer TILD is not disposed in the pad area PA, the touch routing line TL may be disposed along an inclined surface of the touch insulating layer TILD in an area adjacent to the pad area PA. Since the touch insulating layer TILD may be made of an organic layer and have a constant thickness, an inclination angle of an inclined surface of the touch insulating layer TILD may be large.

In the embodiments of the present disclosure, defects in the touch routing line TL disposed on the inclined surface of the touch insulation layer TILD may occur by adjusting the inclination angle of the side surface of the touch insulation layer TILD in an area adjacent to the pad area PA. can prevent doing so.

Referring to FIG. 18 , in the planar structure shown in FIG. 16 , the cross-sectional structure of the portion C-C′ where the touch routing wire TL and the touch pad TP are disposed and the touch routing wire TL are not disposed and the display pad DSP ) shows an example of the cross-sectional structure of the D-D' part where ) is disposed.

A first planarization layer PLN1 , a touch buffer layer TBUF, and a touch insulating layer TILD may be disposed in an area adjacent to the area where the touch pad TP is disposed.

A touch routing line TL may be disposed on the touch insulating layer TILD. Since the touch routing wiring TL is disposed along the inclined surface of the touch insulating layer TILD and connected to the touch pad TP, there is a gap between the region where the touch insulating layer TILD is disposed and the region where the touch pad TP is disposed. A certain interval may exist.

For example, the gap between the touch insulating layer TILD overlapping the touch routing wire TL and the pad area PA is the touch insulating layer TILD located in an area other than the area where the touch routing wire TL is disposed. It may be larger than the gap between the and the pad area PA. By increasing the distance between the touch insulating layer TILD and the pad area PA, the touch routing line TL disposed on the touch insulating layer TILD may be disposed along a more gentle slope of the touch insulating layer TILD. A possible structure may be provided.

The second planarization layer PLN2 , the touch buffer layer TBUF, and the touch insulating layer TILD may be disposed in an area adjacent to the area where the display pad DSP is disposed. A wire protection pattern LP may be disposed on the touch insulating layer TILD.

Since the touch routing line TL is not disposed on the touch insulating layer TILD, the touch insulating layer TILD may be disposed to an area very close to the display pad DSP. A touch insulating layer TILD may be positioned on the display signal line DSL connected to the display pad DSP.

An inclination angle of a side surface of the first planarization layer PLN1 located in the area where the touch routing line TL is disposed and an inclination angle of a side surface of the second planarization layer PLN2 located in an area where the touch routing line TL is not disposed may be different.

For example, an inclination angle θ1 of a first side surface of the first planarization layer PLN1 toward the touch pad TP is an inclination angle θ1 of a second side surface of the second planarization layer PLN2 toward the display pad DSP. may be smaller than θ2.

The touch insulating layer TILD disposed on the first planarization layer PLN1 and the touch insulating layer TILD disposed on the second planarization layer PLN2 may be disposed by the same process. For example, the touch insulating layer TILD disposed in the two regions may be disposed by a full tone mask process. In this case, the touch insulating layer TILD disposed on the first planarization layer PLN1 and the second planarization layer PLN2 may be disposed with a constant thickness.

For example, the thickness Th1 of the touch insulating layer TILD disposed on the first planarization layer PLN1 may be the same as or similar to the thickness Th2 of the touch insulating layer TILD disposed on the second planarization layer PLN2. there is. A thickness Th1 of the touch insulating layer TILD overlapping the first planarization layer PLN1 may be the same as or similar to a thickness Th3 of the touch insulating layer TILD positioned outside the first planarization layer PLN1.

Since the touch insulating layer TILD is disposed on the first planarization layer PLN1 with a constant thickness, the inclination angle θ3 of the side surface of the touch insulating layer TILD disposed on the first planarization layer PLN1 is The inclination angle of the first side surface of PLN1) may be greater than or equal to θ1.

Even if the inclination angle θ3 of the side surface of the touch insulating layer TILD is greater than or equal to the inclination angle θ1 of the first side surface of the first planarization layer PLN1, the inclination angle θ1 of the first side surface of the first planarization layer PLN1 is greater than the second planarization layer PLN2. ) is smaller than the inclination angle θ2 of the second side surface, the inclination angle of the inclination surface of the touch insulation layer TILD, which is determined according to the inclination angle of the inclination surface of the planarization layer PLN, may be reduced. For example, an inclination angle of an inclined surface of the touch insulating layer TILD overlapping the first side surface of the first planarization layer PLN1 may be decreased. In addition, an inclination angle of an inclined surface of the touch insulating layer TILD positioned outside the first side surface of the first planarization layer PLN1 may be decreased. As a result, the inclination angle θ3 of the side surface of the touch insulating layer TILD may be smaller than the inclination angle θ2 of the second side surface of the second planarization layer PLN2 .

Since the inclination angle of the inclined surface of the touch insulating layer TILD decreases, the inclined surface of the touch insulating layer TILD on which the touch routing line TL is disposed may become gentle. Due to the steeply inclined surface of the touch insulating layer TILD, it is possible to prevent a residual film from being generated in a photoresistor during a process. A short-circuit defect of the touch routing line TL disposed on the inclined surface of the touch insulating layer TILD due to the remaining film of the photoresistor may be prevented from occurring. Disconnection or crack failure of the touch routing line TL due to the steep slope of the touch insulating layer TILD may also be prevented.

Also, an inclination angle of an inclined surface of the pad protection layer PCP adjacent to the touch pad TP may be different from an inclination angle of an inclined surface of the pad protection layer PCP adjacent to the display pad DSP.

For example, the inclination angle θ4 of the inclined surface of the pad protection layer PCP disposed on the edge of the touch pad TP is less than the inclined angle θ5 of the inclined surface of the pad protection layer PCP disposed on the edge of the display pad DSP. can

Since the inclined surface of the pad protection layer (PCP) disposed on the edge of the touch pad (TP) becomes gentle, defects in the touch routing wiring (TL) passing through the pad protection layer (PCP) and connected to the touch pad (TP) occur. doing can be prevented.

The pad protection layer (PCP) disposed on the edge portion of the display pad (DSP) is disposed in an area where the touch insulation layer (TILD) is not disposed and protects the display signal line (DSL) located under the pad protection layer (PCP). can protect you

For example, at least a portion of the pad protection layer PCP may be disposed in a region between the touch insulating layer TILD and the pad area PA on the display signal line DSL. The touch insulating layer TILD may be disposed in a region between the second planarization layer PLN2 and the pad protection layer PCP on the display signal line DSL. The display signal line DSL extending from the second planarization layer PLN2 to the pad area PA may be protected by the touch insulating layer TILD and the pad protection layer PCP.

The touch pad TP and the display pad DSP may be disposed using one or more metal layers including the first touch sensor metal TSM1 constituting the touch routing line TL. For example, each of the touch pad TP and the display pad DP may be disposed such that the first touch sensor metal TSM1 , the source-drain metal layer SD, and the gate metal layer GAT are electrically connected to each other.

Each of the touch pad TP and the display pad DSP may be electrically connected to each driving circuit by being connected to a pad on the film COF on which the touch driving circuit 150 and the data driving circuit 130 are mounted.

Since each of the touch pad TP and the display pad DSP is disposed in an area where the touch insulating layer TILD is not disposed, the efficiency of the bonding process with the pad on the film COF can be improved because the step difference with the surrounding area is small. can

As such, by adjusting the inclination angle of the inclined surface of the flattening layer PLN located under the touch insulating layer TILD on which the touch routing line TL is disposed, defects in the touch routing line TL can be prevented.

Also, by lowering the inclination angle of the inclined surface of the touch insulating layer TILD, the inclined surface of the touch insulating layer TILD on which the touch routing line TL is disposed may be made more gentle.

Referring to FIG. 19 , the inclination angle θ1 of the first side surface of the first flattening layer PLN1 positioned under the touch routing line TL is the second planarizing layer ( PLN2) may be smaller than the inclination angle θ2 of the second side surface.

A touch insulating layer TILD may be disposed between the first planarization layer PLN1 and the touch routing line TL. The touch insulating layer TILD may be disposed along the inclined surface of the first planarization layer PLN1.

At least a portion of the touch insulating layer TILD positioned outside the first planarization layer PLN1 may be disposed by a half-tone mask process.

For example, the process may be performed by applying a full tone mask to an area overlapping the first planarization layer PLN1 and applying a half tone mask to an area outside the first planarization layer PLN1.

A thickness of a portion of the touch insulating layer TILD formed by the half-tone mask process may gradually decrease. For example, in the touch insulating layer TILD disposed on the first planarization layer PLN1, the thickness Th3 of the portion where the half-tone mask is applied may be smaller than the thickness Th1 of the portion where the full-tone mask is applied. . Since the touch insulating layer TILD disposed on the second planarization layer PLN2 is disposed with a full tone mask applied thereto, the thickness Th2 is equal to the thickness Th1 of the touch insulating layer TILD overlapping the first planarization layer PLN1. It is the same as or similar to , and may be greater than the thickness Th3 of the touch insulating layer TILD positioned outside the first planarization layer PLN1. Since the thickness of the touch insulating layer TILD decreases and is disposed outside the first planarization layer PLN1 , the touch insulating layer TILD may be disposed in a gently inclined structure. The inclination angle θ3 of the inclined surface of the touch insulating layer TILD located outside the first planarization layer PLN1 may be smaller than the inclination angle θ1 of the first side surface of the first planarization layer PLN1.

By lowering the inclination angle of the first side surface of the first planarization layer PLN1 and the inclination angle of the inclination surface of the touch insulation layer TILD located outside the first planarization layer PLN1, the touch routing line TL is located below the An inclined surface of the touch insulating layer TILD may be smooth as a whole.

The touch routing wiring TL disposed along the inclined surface of the touch insulating layer TILD and connected to the touch pad TP of the pad area PA is short-circuited with an adjacent touch routing wiring TL, or the touch routing wiring TL is damaged. defects can be prevented.

A brief description of the embodiments of the present disclosure described above is as follows.

In the touch display device 100 according to embodiments of the present disclosure, a plurality of light emitting elements ED disposed in an active area AA of a display panel 110 and disposed on the plurality of light emitting elements ED The encapsulation layer ENCAP, the plurality of touch electrodes TE disposed on the encapsulation layer ENCAP, and electrically connected to at least one of the plurality of touch electrodes TE and positioned outside the encapsulation layer ENCAP A plurality of touch routing lines TL disposed to extend into the pad area PA, a touch insulation layer TILD disposed in at least a partial area under the plurality of touch routing lines TL, and an active area AA ) and the pad area PA and a planarization layer PLN positioned under the touch insulating layer TILD.

Among the sides of the planarization layer PLN toward the pad area PA, the inclination angle of the first side overlapping the plurality of touch routing lines TL is at least partially other than the area where the plurality of touch routing lines TL are disposed. It may be smaller than the inclination angle of the second side surface located in the region.

An inclination angle of a side surface of the touch insulating layer TILD overlapping the first side surface of the planarization layer PLN and facing the pad area PA may be greater than or equal to an inclination angle of the first side surface of the planarization layer PLN. An inclination angle of a side surface of the touch insulating layer TILD overlapping the first side surface of the planarization layer PLN and facing the pad area PA may be smaller than an inclination angle of a second side surface of the planarization layer PLN.

Alternatively, an inclination angle of a side surface of the touch insulating layer TILD that overlaps the first side surface of the planarization layer PLN and faces the pad area PA may be smaller than the inclination angle of the first side surface of the planarization layer PLN.

A gap between the touch insulating layer TILD overlapping the first side surface of the planarization layer PLN and the pad area PA is disposed so as to overlap the second side surface of the planarization layer PLN. It may be larger than the gap between the and the pad area PA.

The touch insulating layer TILD may be disposed while surrounding the planarization layer PLN in an area between the active area AA and the pad area PA.

The touch insulating layer TILD may be disposed in an area other than the pad area PA.

The touch display device 100 may further include a pad protection layer PCP disposed to cover an edge portion of the pad disposed in the pad area PA.

The pad protection layer PCP may be made of the same material as the planarization layer PLN.

At least a portion of the pad protection layer PCP may be disposed under the plurality of touch routing lines TL.

At least a portion of the pad protection layer PCP may be disposed on the plurality of display signal lines DSL disposed under the planarization layer PLN and extended to the pad area PA.

At least a portion of the pad protection layer PCP may be disposed covering the plurality of display signal lines DSL in an area between the touch insulation layer TILD and the pad area PA.

A touch insulating layer TILD may be disposed on portions of the plurality of display signal lines DSL disposed in a region between the planarization layer PLN and the pad protection layer PCP.

The touch display device 100 may further include a touch buffer layer TBUF disposed between the planarization layer PLN and the touch insulating layer TILD.

The touch display device 100 may further include a touch insulation buffer layer TIBUF disposed between the touch buffer layer TBUF and the touch insulation layer TILD.

A thickness of the touch insulating layer TILD may be greater than a thickness of the touch buffer layer TBUF and a thickness of the touch insulating buffer layer TIBUF.

The touch insulating layer TILD may be an organic layer, and the touch buffer layer TBUF and the touch insulating buffer layer TIBUF may be inorganic layers.

The touch display device 100 according to embodiments of the present disclosure includes a plurality of touch electrodes TE and at least one of the plurality of touch electrodes TE disposed in the active area AA of the display panel 110. A plurality of touch routing wires TL electrically connected to and extending to the pad area PA positioned outside the active area AA, and extending from the outside of the active area AA to the pad area PA. The plurality of display signal lines (DSL) disposed in the same manner, and the plurality of touch routing wires (TL) outside the active area (AA) and at least a portion of the plurality of display signal lines (DSL) are overlapped with each other and are disposed. The inclination angle of the first side surface overlapping the touch routing wires TL and facing the pad area PA is smaller than the inclination angle of the second side surface overlapping the plurality of display signal lines DSL and facing the pad area PA. A planarization layer (PLN) may be included.

The touch display device 100 is positioned between the planarization layer PLN and the plurality of touch routing lines TL, and the inclination angle of the side surface overlapping the touch routing lines TL and facing the pad area PA is the planarization layer. It may further include a touch insulating layer (TILD) smaller than the inclination angle of the second side surface of (PLN).

The above description is merely an example of the technical idea of the present disclosure, and various modifications and variations may be made to those skilled in the art without departing from the essential characteristics of the present disclosure. In addition, the embodiments disclosed in this disclosure are not intended to limit the technical idea of the present disclosure, but rather to explain the scope of the technical idea of the present disclosure by these embodiments. The scope of protection of the present disclosure should be construed by the following claims, and all technical ideas within the scope equivalent thereto should be construed as being included in the scope of rights of the present disclosure.

100: touch display device 110: display panel
120: gate driving circuit 130: data driving circuit
140: controller 150: touch driving circuit

Claims (19)

a plurality of light emitting elements disposed in an active area of the display panel;
an encapsulation layer disposed on the plurality of light emitting devices;
a plurality of touch electrodes disposed on the encapsulation layer;
a plurality of touch routing wires electrically connected to at least one of the plurality of touch electrodes and extended to a pad region located outside the encapsulation layer;
a touch insulating layer disposed in at least a partial area under the plurality of touch routing wires; and
a planarization layer positioned between the active region and the pad region and positioned under the touch insulating layer;
Among the sides of the planarization layer facing the pad area, an inclination angle of a first side surface overlapping the plurality of touch routing wires is an inclination angle of a second side surface positioned in at least a partial area other than the area where the plurality of touch routing wires are disposed. Smaller touch display device.
According to claim 1,
An inclination angle of a side surface of the touch insulating layer overlapping the first side surface of the planarization layer and facing the pad region is greater than or equal to an inclination angle of the first side surface of the planarization layer.
According to claim 2,
The touch display device of claim 1 , wherein an inclination angle of a side surface of the touch insulating layer overlapping the first side surface of the planarization layer and facing the pad region is smaller than an inclination angle of the second side surface of the planarization layer.
According to claim 1,
The touch display device of claim 1 , wherein an inclination angle of a side surface of the touch insulating layer overlapping the first side surface of the planarization layer and facing the pad region is smaller than an inclination angle of the first side surface of the planarization layer.
According to claim 1,
A gap between the pad region and the touch insulating layer overlapping the first side surface of the planarization layer is greater than a gap between the pad region and the touch insulating layer overlapping the second side surface of the planarization layer. Large touch display device.
According to claim 1,
The touch insulating layer is disposed to surround the planarization layer in a region between the active region and the pad region.
According to claim 1,
The touch insulating layer is disposed in an area other than the pad area.
According to claim 1,
The touch display device further includes a pad protection layer disposed to surround an edge portion of the pad disposed in the pad area.
According to claim 8,
The touch display device of claim 1 , wherein the pad protection layer is made of the same material as the planarization layer.
According to claim 8,
At least a portion of the pad protection layer is disposed under the plurality of touch routing wires.
According to claim 8,
At least a portion of the pad protection layer is disposed under the planarization layer and is disposed on a plurality of display signal lines extending into the pad region.
According to claim 11,
At least a portion of the pad protection layer is disposed to cover the plurality of display signal lines in a region between the touch insulating layer and the pad region.
According to claim 11,
The touch display device, wherein the touch insulating layer is disposed on a portion of the plurality of display signal lines disposed in a region between the planarization layer and the pad protection layer.
According to claim 1,
The touch display device further includes a touch buffer layer disposed between the planarization layer and the touch insulating layer.
According to claim 14,
The touch display device further includes a touch insulation buffer layer disposed between the touch buffer layer and the touch insulation layer.
According to claim 15,
The touch display device of claim 1 , wherein a thickness of the touch insulating layer is greater than a thickness of the touch buffer layer and a thickness of the touch insulating buffer layer.
According to claim 15,
The touch insulating layer is an organic layer, and the touch buffer layer and the touch insulating buffer layer are inorganic layers.
a plurality of touch electrodes disposed in the active area of the display panel;
a plurality of touch routing wires electrically connected to at least one of the plurality of touch electrodes and extended to a pad area located outside the active area;
a plurality of display signal lines disposed outside the active area to extend into the pad area; and
An inclination angle of a first side surface overlapping at least a portion of the plurality of touch routing wires and the plurality of display signal lines outside the active area, overlapping the plurality of touch routing wires, and facing the pad area is A planarization layer overlapping the plurality of display signal lines and smaller than an inclination angle of a second side surface toward the pad area.
A touch display device comprising a.
According to claim 18,
A touch insulating layer disposed between the planarization layer and the plurality of touch routing wires, overlapping the touch routing wires, and having an inclination angle of a side surface facing the pad region smaller than an inclination angle of the second side surface of the planarization layer; touch display device.

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