KR20200099740A - Apparatus, system and method for analyzing component - Google Patents

Abstract

The present invention relates to a component analysis apparatus, a system, and a method. An object of the present invention is to provide the component analysis apparatus which secures ease of use and a certain measurement condition, and the component analysis system and method capable of enhancing reliability of component spectrum classification and component characteristic analysis from a synthesized spectrum. The component analysis apparatus includes: a housing; a light source connected to the housing to be disposed in a space separated from a sample by an input light transmitting plate connected to the housing and irradiating light to the sample through the input light transmitting plate; and a detector connected to the housing so as to be disposed in the space separated from the sample by an output light transmitting plate connected to the housing, and detecting the light transmitted through the sample and the output light transmitting plate by being irradiated from the light source and converting the same into an electrical signal.

Description

Component analysis device, system and method {APPARATUS, SYSTEM AND METHOD FOR ANALYZING COMPONENT}

The present invention relates to a component analysis device, system, and method, and more particularly, to a component analysis device, system, and method for analyzing the presence, concentration, etc. of a substance by using the optical properties of the substance.

Spectroscopy is a method of non-destructively analyzing the components of a sample by grasping the optical properties of each wavelength band according to the state of the sample. The spectroscopic analysis method is easier to construct a component analysis system than other non-destructive methods when a specific wavelength that can express the state of the sample is determined, and the analysis results are more convenient to interpret.

The near-infrared region mainly used in the spectroscopy method corresponds to an electromagnetic wave in the range of 780 nm to 2,500 nm as a part of infrared rays adjacent to the visible region. Near-infrared spectroscopy is an analysis of near-infrared rays absorbed by molecules, and is a field of molecular spectroscopy on the interaction between electromagnetic waves and substances.

Infrared and near-infrared rays excite the vibration of molecules, and molecules that absorb near-infrared or infrared rays vibrate at a specific frequency and amplitude like a vibration dipole. At this time, when the energy that causes the vibration of the molecule matches the energy of light, the molecule absorbs the light and transitions to a high energy level, and the vibration frequency does not change, but the amplitude increases. However, if the energy causing the vibration of the molecule and the energy of the light do not match, the light is reflected.

The functional groups of molecules constituting organic matter have a unique absorption band (reference vibration band) in the infrared region. For example, a substance that absorbs infrared rays contains components composed of O-H, C-H, N-H, and S-H groups. By using these properties, infrared rays are irradiated to an organic material and the degree to which infrared rays are absorbed or reflected can be measured, thereby measuring the components contained in the organic material.

However, when infrared rays are irradiated onto an organic substance, the absorption of light is too strong and quantification is difficult, so that the wavelength in the near infrared region is mainly used. In the near-infrared region, light absorption due to moisture is weak, and the optical properties of functional groups constituting organic materials are compressed, so that the physicochemical properties of organic materials can be confirmed.

In the near-infrared wavelength region, harmonic absorption or combined absorption wavelength appears relative to the reference absorption wavelength induced in the infrared wavelength region. Absorption of harmonics occurs at a wavelength that is approximately 1/2 or 1/3 times the reference absorption wavelength. For example, if the reference absorption of the C-H stretch occurs in the infrared region of 3,380 nm, the first harmonic appears in the near infrared region of 1,690 nm, and the second harmonic appears in the near infrared region of 1,126 nm.

In the case of polyatomic functional groups constituting an organic material, absorption becomes more complex. If the number of constituent atoms is n, the number of reference absorption bands rises to 3n-6, and harmonic absorption is also more complex.

When two or more absorptions occur simultaneously, combined absorption occurs in the near-infrared region. In this way, the absorption spectrum peculiar to the material appears in the near-infrared region due to the absorption of harmonics and coupling absorption of the reference absorption band. For example, if the reference absorption wavelength of the C-H stretch is 2,960 nm and the reference absorption wavelength of the C-H band is 6,849 nm in the infrared region, the combined absorption wavelength appears in the near-infrared region of 2,262 nm.

Therefore, if an organic substance is irradiated with near-infrared rays and the amount of energy absorbed at each frequency is quantified, it is possible to measure its component content by a quantitative chemical method.

The near-infrared spectrum shows a complex shape by overlapping absorption spectra of several components. Differentiation is a commonly used method to find a spectrum for each component by separating the absorption bands from overlapping spectra. Usually, the first derivative or the second derivative is most often used. Differential treatment allows the peaks of the original spectrum to be divided and the absorption peaks that overlap each other can be separated.

In the near-infrared spectrum, since harmonic absorption and combined absorption of the reference absorption in the infrared region are synthesized, the shape of the spectrum is not complicated in a simple substance, but in a composite substance, the absorption spectrum is combined for each component to show a fairly complex shape.

In near-infrared spectroscopy, a calibration process is performed to predict component characteristics by multivariate analysis of complex spectra. There are many methods for multivariate analysis, such as multiple regression analysis, discriminant analysis, canonical correlation analysis, principal component analysis, atomic analysis, cluster analysis, etc., but mainly used are multiple regression analysis, principal component regression analysis, and PLS regression analysis.

First, Multiple Linear Regression (MLR) is the most widely used multivariate analysis method, and a prediction model is created by selecting multiple wavelengths from the spectrum.

In order to select a small number of wavelengths and create a highly accurate prediction model, the number of samples must be large enough. In addition, when explanatory variables having a high correlation with each other are included in the regression equation, a problem of multicollinearity occurs in which the prediction accuracy is remarkably decreased. Therefore, in order to create a highly accurate prediction model with fewer explanatory variables, variable selection methods such as the total variable method, the variable increase method, the variable reduction method, and the variable designation method are used.

Next, Principal Component Regression (PCR) is a method developed to solve the problem of multicollinearity and the need for a large number of samples in multiple regression analysis. Principal component regression analysis uses the principal components extracted from the original variable as explanatory variables to obtain a multiple regression equation.

Principal components can concentrate information on principal components much less than the original explanatory variable, thus reducing the number of samples required for regression analysis. In addition, since the main components are orthogonal to each other, there is no concern of multicollinearity.

On the other hand, PLS (Partial Least Square) regression analysis assumes an error in both the explanatory variable and the objective variable, unlike the general regression analysis that assumes an error for each explanatory variable. In PLS regression analysis, potential factors are extracted and used as explanatory variables. The difference from principal component analysis is that explanatory variables and objective variables are used together when extracting. PLS regression analysis can obtain higher prediction accuracy than principal component regression analysis because the regression equation is calculated using the total information of the variable. Also, similar to the principal component analysis, problems such as multicollinearity and number of samples can be solved.

Conventional spectral component analysis devices using visible or near-infrared rays use a tungsten-halogen lamp as a light source, and a grating that disperses light to detect light in a band of about 400 nm to 2500 nm with a monochromator, and a mirror Fourier transform monochromator using drive is applied.

Such a conventional spectral component analysis apparatus uses a lamp that consumes a high current as a light source, and the lamp scans all wavelength bands, not only visible or near infrared rays, so due to the scanning of the wavelength band not used for measurement. There is a problem of consuming more than the current and voltage required for measurement. For this reason, a high-capacity battery is used for scanning the entire wavelength band, thereby increasing the overall weight of the device, thereby causing many restrictions on portability and movement of the device.

In addition, the conventional component analysis apparatus has a problem in that the diffraction feet must be balanced and external impact must be minimized. Therefore, it is difficult to measure while moving because it must be kept in a fixed state for stable operation of the device, and normal analysis is possible through a calibration process after a certain time elapses after the movement. In particular, the diffracted foot is driven by a step motor to obtain monochromatic light, and errors may accumulate in the equilibrium state and position setting for each band due to repeated driving, which may cause a malfunction.

Conventional component analysis devices are mostly used in laboratories due to the above-described problems, and it is very difficult to manufacture them as portable products that are easy to move and simple to operate. Since the device is very sensitive, it is also difficult to distribute it as a field component analysis device.

In order to improve this problem, a component analysis device that performs monochrome using an interference filter has been developed. A component analysis device using an interference filter extracts the monochromatic light into narrow-band light through a plurality of interference filters having different wavelength bands among light transmitted through a sample, and then analyzes a specific component through spectrum analysis of the extracted wavelength band. A component analysis apparatus using an interference filter includes a step motor that precisely rotates the interference filter to monochromate light transmitted through a sample for each wavelength band.

However, in the conventional component analysis apparatus using an interference filter, since a plurality of interference filters and a step motor for rotating the interference filter must be mechanically, electrically, and optically connected, the device structure is complicated and the manufacturing cost is increased.

As disclosed in Korean Patent Publication No. 10-1690073 (Prior Patent Document 1), a portable component analysis device using a modularized small spectrometer has also been developed. A conventionally used modular compact spectrometer includes a diffractometer having a fine size inside, and a light receiving device that detects light diffracted at different angles for each wavelength. These small spectrometers are highly affected by changes in the measurement environment and noise directly or indirectly caused by this. Therefore, the structural design must be performed so that the measurement conditions are constant, but if the measurement object is placed outside, even if the external noise is completely blocked by the light blocking member, the reliability of the measurement value may be significantly lowered by the object surface condition, measurement angle, manufacturing tolerance, etc. .

Korean Registered Patent Publication No. 10-1690073

The present invention is to solve the above-described problems, and is provided with a sample receiving unit configured to be inserted into a sample to be measured without a separate sample container or detachably configured to enter and exit a sample, so that the convenience of use and the component analysis that secures a certain measurement condition An object of the present invention is to provide an apparatus and a component analysis system and method capable of enhancing the reliability of component spectrum classification and component characteristic analysis from a synthesized spectrum based on a reference component spectrum and an estimated model of a sample to be measured.

The subject of the present invention is not limited to the problems mentioned above, and other problems that are not mentioned will be clearly understood by those skilled in the art from the following description.

A component analysis device according to an embodiment of the present invention for solving the above problem includes a housing; A light source connected to the housing to be disposed in a space separated from the sample by an input light transmitting plate connected to the housing, and irradiating light to the sample through the input light transmitting plate; And a detector connected to the housing so as to be disposed in a space separated from the sample by an output light transmitting plate connected to the housing, and detecting light that is irradiated from a light source and transmitted through the sample and the output light transmitting plate and converts it into an electrical signal.

According to an embodiment of the present invention, it may further include a sample receiving portion connected to the housing to form a sample receiving space at a position through which the optical axis from the light source to the detector passes.

According to an embodiment of the present invention, the sample receiving portion may be detachably connected to the housing.

According to an embodiment of the present invention, the input light transmitting plate and the output light transmitting plate may be integrally formed with the sample receiving portion.

According to an embodiment of the present invention, the sample receiving unit may include a light blocking member that blocks light entering the sample receiving space from the outside.

According to an embodiment of the present invention, a temperature sensor for measuring the temperature of the sample may be further included.

According to an embodiment of the present invention, a humidity sensor for measuring the humidity of a sample may be further included.

The component analysis system according to another embodiment of the present invention for solving the above problems provides a signal for controlling one or more of the above-described component analysis device and a light source setting value including luminance, wavelength, emission timing, and emission period to the light source. Includes a light source control module that transmits, a detector control module that transmits a signal for controlling one or more of a detector setting value including a detection timing, a detection period, and a detection range of the detector, and temperature, humidity, sample type, and estimated components. A measurement condition setting module that determines a light source setting value and a detector setting value based on one or more of the measurement condition values, and generates an estimated spectrum based on the measurement condition value, and an electrical signal received from the detector. And a spectrum generation module for generating a synthesized spectrum, and a spectrum comparison module for determining component characteristics of a sample by comparing the synthesized spectrum and the estimated spectrum.

According to an embodiment of the present invention, a light source includes two or more light-emitting elements that irradiate light of different wavelength bands, and the light source control module may control two or more light-emitting elements to emit light alternately.

According to an embodiment of the present invention, the light source includes a light-emitting element with adjustable luminous intensity, and the light source control module may control the light-emitting element to emit light according to a preset luminous intensity pattern.

According to an embodiment of the present invention, the detector control module may control the detector by setting one or more ranges of luminous intensity and wavelength of light to be detected.

According to an embodiment of the present invention, the spectrum generation module generates a preliminary synthesis spectrum using the measured signal according to an initial condition value predetermined by the measurement condition setting module, and the measurement condition setting module generates a sample type through the preliminary synthesis spectrum. And an estimated component can be determined.

According to an embodiment of the present invention, the measurement condition setting module divides two or more estimated components into a reference substance having the highest estimation accuracy and a comparison substance having relatively low estimation accuracy based on a sample type and an estimated component, and One or more of a light source setting value and a detector setting value may be determined based on a reference wavelength band in which a peak value appears in a component spectrum of a set reference material and a comparison wavelength band in which a peak value appears in a component spectrum of a preset comparison material.

According to an embodiment of the present invention, the spectrum comparison module may generate an estimated spectrum in the reference wavelength band and the comparison wavelength band by using the component spectrum of the reference material and the component spectrum of the comparison material according to a predetermined estimated condition value. .

According to an embodiment of the present invention, an estimation condition correction module may further include an estimation condition correction module for correcting an estimation condition value such that an error between the synthesized spectrum and the estimation spectrum in the reference wavelength band and the comparison wavelength band is reduced within a predetermined range.

According to an embodiment of the present invention, the measurement condition setting module divides two or more estimated components into a reference substance having the highest estimation accuracy and a comparison substance having relatively low estimation accuracy based on a sample type and an estimated component, and One or more of a light source setting value and a detector setting value may be determined based on a maximum wavelength band having the largest absorbance difference and a minimum wavelength band having the smallest difference in absorbance in the set component spectrum of the reference material and the component spectrum of the comparison material.

According to an embodiment of the present invention, the spectrum comparison module may generate an estimated spectrum in the maximum wavelength band and the minimum wavelength band by using the component spectrum of the reference material and the component spectrum of the comparison material according to a predetermined estimated condition value. .

According to an embodiment of the present invention, an estimation condition correction module may further include an estimation condition correction module for correcting an estimation condition value such that an error between the synthesized spectrum and the estimation spectrum in the maximum wavelength band and the minimum wavelength band is reduced within a predetermined range.

A component analysis method according to another embodiment of the present invention for solving the above problem includes the steps of setting a measurement condition value; Determining a light source setting value and a detector setting value based on the measurement condition value; Operating a light source and a detector to generate a synthesized spectrum; Generating an estimated spectrum based on the measurement condition value; And comparing the synthesized spectrum and the estimated spectrum to determine component properties of the sample.

According to the component analysis device according to the present invention, it is possible to perform analysis with high reliability by minimizing internal and external noise generated during measurement by spectral analysis of a sample under certain conditions, and calibrating the measured values by repeatedly performing measurements under certain conditions. .

In addition, the wavelength band that is advantageous for characteristic analysis is selected from the reference component spectrum of the measurement target sample, and through repeated measurements based on the simplified estimation model, the time required for variable analysis in the correlation analysis is shortened and sufficient reliability is secured. It can be miniaturized with a simple structure by using only a light source and a detector in the corresponding wavelength band without using a monochromator or interference filter. Because of its excellent portability, continuous monitoring is possible in a wide area, and it is suitable for on-site analysis as it can continuously improve the estimation model through repeated measurements to increase reliability.

However, the effects of the present invention are not limited to the effects mentioned above, and other effects not mentioned will be clearly understood by those skilled in the art from the following description.

1 is a schematic block diagram of a component analysis system according to an embodiment of the present invention.
2 is a schematic side cross-sectional view of a component analysis device according to an embodiment of the present invention.
3 is a schematic plan cross-sectional view of the component analysis device of FIG. 2.
4 is a schematic side cross-sectional view of the component analysis device of FIG. 2 in an exploded state.
5 is a schematic side cross-sectional view of the component analysis device of FIG. 2 according to a modified embodiment.
6 is a schematic block diagram of a component analysis device according to another embodiment of the present invention.
7 is a schematic block diagram of a component analysis system according to another embodiment of the present invention.
8 is a schematic block diagram of a component analysis system according to another embodiment of the present invention.
9 is a flowchart showing each step of a component analysis method according to an embodiment of the present invention.

Advantages and features of the present invention, and a method of achieving them will become apparent with reference to the embodiments described below in detail together with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, but will be implemented in various forms different from each other, and only these embodiments make the disclosure of the present invention complete, and common knowledge in the technical field to which the present invention pertains. It is provided to completely inform the scope of the invention to those who have it, and the invention is only defined by the scope of the claims.

The shapes, sizes, ratios, angles, numbers, etc. disclosed in the drawings for explaining the embodiments of the present invention are exemplary, and the present invention is not limited to the illustrated matters. In addition, in describing the present invention, when it is determined that a detailed description of related known technologies may unnecessarily obscure the subject matter of the present invention, the detailed description thereof will be omitted. When'include','have','consists of' and the like mentioned in the specification are used, other parts may be added unless'only' is used. In the case of expressing the constituent elements in the singular, it includes the case of including the plural unless specifically stated otherwise.

In interpreting the constituent elements, it is interpreted as including an error range even if there is no explicit description.

In the case of a description of the positional relationship, for example, if the positional relationship of two parts is described as'upper','upper of','lower of','next to','right' Or, unless'direct' is used, one or more other parts may be located between the two parts.

When an element or layer is referred to as “on” another element or layer, it includes all cases where another layer or other element is interposed directly on or in the middle of another element. The same reference numerals refer to the same components throughout the specification.

The size and thickness of each component shown in the drawings are illustrated for convenience of description, and the present invention is not limited to the size and thickness of the illustrated component.

Each of the features of the various embodiments of the present invention can be partially or entirely combined or combined with each other, and as a person skilled in the art can fully understand, technically various interlocking and driving are possible, and each of the embodiments may be independently implemented with respect to each other. It may be possible to do it together in a related relationship.

Hereinafter, a component analysis system according to the present invention will be described with reference to the accompanying drawings.

1 to 5, a component analysis system 1000 according to an embodiment of the present invention includes a component analysis device 1100, a user terminal 1200, and a server 1300.

The component analysis device 1100 includes a sample receiving unit 1110, a light source 1120, a detector 1130, an environmental sensor 1150, a power supply unit 1160, a display unit 1170, and a communication unit ( 1180).

The user terminal 1200 may be configured as a mobile device, for example, a smartphone. When the user terminal is configured with a smartphone, an application equipped with a management program may be installed in order to receive a service and connected to the server 1300 through this to receive a service.

The server 1300 transmits and receives data to and from the user terminal 1200 through a wired or wireless communication network. The server 1300 includes configuration information of the component analysis device 1100, a light source setting value, a detector setting value, an initial condition value, a measurement condition value, an estimated condition value, a component spectrum for a target sample, and a peak wavelength in each component spectrum. It may include a database 1310 for storing information on a maximum wavelength band and a minimum wavelength band, which will be described later in detail between the band and each component spectrum. The information stored in the database 1310 is cumulatively recorded over time of information provided through the component analysis device 1100 and the user terminal 1200, and is continuously updated by reflecting the relationship between data through repeated analysis. Can be. Accordingly, the accuracy and reliability of information stored in the database can be improved as the user continues to implement the present invention.

The sample accommodating part 1110 forms a sample accommodating space Q in which a sample to be subjected to component analysis is received and measurement is performed by the light source 1120 and the detector 1130. The sample receiving portion 1110 includes an input light transmitting plate 1111, an output light transmitting plate 1112, and a light blocking member 1114.

The sample accommodating part 1110 forms a sample accommodating space at a position through which the optical axis from the light source 1120 to the detector 1130 passes. Light not absorbed by the sample may be detected by the detector 1130 by arranging the sample receiving unit 1110 so that the optical axis of the light source 1120 placed to directly reach the light receiving unit of the detector 1130 passes through the sample receiving space. The light source 1120 is disposed in a space surrounded by an input light transmitting plate 1111 and a portion of the housing 1113 forming a space in which other components are mounted, and the detector 1130 includes the output light transmitting plate 1112 and It may be disposed in a space enclosed by other parts of the housing 1113. The transmission plates 1111 and 1112 may be disposed perpendicular to the optical axis of the light source 1120. That is, the input light transmitting plate 1111 and the output light transmitting plate 1112 may be disposed parallel to each other to face each other. Meanwhile, since the measurement results are different according to the refractive index of the transmission plates 1111 and 1112 during measurement, it is preferable to consider the refractive index and thickness when selecting a material for the transmission plates 1111 and 1112.

The sample receiving part 1110 may integrally include an input light transmitting plate 1111 and an output light transmitting plate 1112 as shown in FIG. 3. Light blocking members 1114 may be provided on both sides of the transmission plates 1111 and 1112 arranged parallel to each other to block light entering the sample receiving space in the sample receiving portion 1110 from the outside. The light blocking member 1114 may be integrally formed with the transmission plates 1111 and 1112, but may be configured to be fixed to the housing 1113 while being separated from the transmission plates 1111 and 1112. In the present embodiment, a flat cross-section of the sample receiving space surrounded by the transmission plates 1111 and 1112 and the light blocking member 1114 is shown to have a rectangular shape, but may have various shapes such as a circle, a triangle, and a semicircle.

The sample receiving part 1110 may be detachably connected to the housing 1113. In a state in which the sample receiving portion 1110 is separated from the housing 1113, the sample may be inserted into the sample receiving space in the sample receiving portion 1110 and then the sample receiving portion 1110 may be coupled to the housing 1113. Although not shown, the sample receiving portion 1110 is guided by a sliding guide member formed on the sidewall of the housing 1113 and slides between the light source 1120 and the detector 1130 and is coupled to the housing 1113 or the housing 1113 ) Can be configured to be separated from. In addition, the sample receiving portion 1110 may be connected to the housing 1113 by various known detachable coupling methods.

Meanwhile, in a modified embodiment of the present invention, as shown in FIG. 5, the input light transmitting plate 1111 ′ is coupled to the light source 1120 side housing 1113 ′, and the output light transmitting plate 1112 ′ is a detector ( 1130) may be coupled to the side housing 1113'. At this time, the sample is disposed in an external space, not inside the device according to the present invention, that is, the sample is in a state in which the space between the input light transmitting plate 1111' and the output light transmitting plate 1112' can freely enter and exit. Will be located. In this case, the light blocking members 1114 ′ may be respectively connected to the housing 1113 ′ so as to be disposed on both sides of the transmission plates 1111 ′ and 1112 ′ so as to surround the space between the transmission plates 1111 ′ and 1112 ′. Through this modified embodiment, measurement can be performed by inserting the light source 1120 part and the detector 1130 part so that the part of the light source 1120 and the part of the detector 1130 are immersed in a sample such as powder, crystal, grain, liquid, etc. as a sample contained in another container. . Through this method, the sample flows naturally between the input light transmitting plate 1111 ′ and the output light transmitting plate 1112 ′ by inserting the device into the sample without having to place the sample in a separate sample receiving unit. A sample may be disposed between the optical axes between the detectors 1130. Although not shown, the openings of the sample receiving space, that is, the openings formed by the side portions of the transmission plates 1111 ′ and 1112 ′ and the light blocking member 1114 ′ to connect the sample receiving space and the external space, are provided with separate light blocking leads, etc. It can be opened and closed by operation.

The light source 1120 is connected to the housing 1113 to be disposed in a space separated from the sample by the input light transmitting plate 1111. As described above, the light source 1120 is disposed in a space formed by the housing 1113 and the input light transmitting plate 1111 to irradiate light to the sample through the input light transmitting plate 1111.

The light source 1120 irradiates light in a predetermined angle range around the optical axis at which the luminous intensity is the highest. The light source 1120 is disposed so that the optical axis passes through the transmission plates 1111 and 1112. The optical axis of the light source 1120 may be disposed perpendicular to the transmission surfaces of the transmission plates 1111 and 1112.

The light source 1120 may include two or more light emitting devices that irradiate light of different wavelength bands. When analyzing a sample with a predetermined component composition range, the wavelength band required for analysis, such as the reference wavelength band, the comparison wavelength band, the maximum wavelength band, and the minimum wavelength band, which will be described later, can be known in advance, so that light in the corresponding wavelength band can be irradiated. Light-emitting elements can be used. Through this, it is possible to significantly reduce the manufacturing cost as a device for analyzing a specific sample. Meanwhile, the light source 1120 may include one or two or more light emitting devices capable of irradiating light in some or all of the visible and near-infrared regions. Various known light emitting devices may be used as the light source 1120 in consideration of a component to be measured, a wavelength band of measurement, and the like.

The light source 1120 may include a light emitting device with adjustable luminous intensity. A separate element capable of adjusting the luminous intensity of the light source 1120 by controlling the voltage and current of the light source 1120, such as a voltage regulator, may be further included. By adjusting the luminous intensity during analysis, it is possible to effectively separate noise that occurs regularly inside and outside the device or that occurs periodically.

The detector 1130 is connected to the housing 1113 to be disposed in a space separated from the sample by the output light transmitting plate 1112. As described above, the detector 1130 is disposed in a space formed by the housing 1113 and the output light transmitting plate 1112 to detect light transmitted through the sample and the output light transmitting plate 1112 by being irradiated from the light source 1120 To convert it into an electrical signal.

The detector 1130 may be a photodiode, a modular spectrometer, or the like. The detector 1130 may include various known detection elements in consideration of a wavelength band of light to be detected, a narrowness of the wavelength band, resolution, and operation period.

As shown, the detector 1130 may be positioned opposite to the light source 1120 and disposed to face each other. Light irradiated from the light source 1120 and transmitted through the transmission plates 1111 and 1112 and the sample enters the detector 1130.

One or more environmental sensors 1150 capable of measuring analysis conditions, such as a temperature sensor 1151 and a humidity sensor 1152, may be provided in the sample accommodating part 1110 or the housing 1113. By identifying environmental factors that affect the analysis result through the environmental sensor 1150, the degree of influence of the analysis conditions on the same sample may be considered and reflected in a later estimation process. The environmental sensor 1150 may directly measure the temperature, humidity, etc. of the sample, or may measure the temperature and humidity inside the sample receiving part 1110.

The power supply unit 1160 supplies power to each component of the component analysis apparatus 1100. The power supply unit 1160 may be configured to be mechanically and electrically separable. In addition, the separated power supply unit 1160 may be replaced with an extra power supply unit. In addition, the power supply unit 1160 may be integrally configured with the component analysis device 1100. In this case, the power supply unit 1160 may be charged by receiving power by a separate charging device (not shown). For example, the power supply unit 1160 may receive power from the charging device through a wired power transmission method or a wireless power transmission method. The power supply unit 1160 may wirelessly receive power through one or more of a magnetic induction method, a magnetic resonance method, and a microwave radiation method.

The display unit 1170 displays information such as a component analysis result, an operation state, and a power supply state to the user. The display unit 1170 may display information, including light, text, images, and images, through additional output means such as sound and vibration. Further, although not shown, the display unit may be configured through an output means including a display panel of the user terminal.

The communication unit 1180 may transmit information to an external device such as a user terminal or a server through wired or wireless communication, and may receive information from the outside. For example, the communication unit 91180 may be a wireless communication protocol such as Bluetooth, Wi-Fi, or Wibro, or a wired Internet protocol such as TCP/IP. The communication method of the communication unit 1180 is not limited thereto, and a communication protocol disclosed as a standard or various communication protocols independently developed may be used.

Although the above-described component analysis device 1100 is shown as an individual device used alone, it is combined with household appliances such as refrigerators, water purifiers, washing machines, etc., or used as accessories that are detachably connected, or other users including smartphones It can be included in a variety of electronic products such as terminals or used in combination. In the embodiment of FIG. 1, the component analysis device 1100 is shown to include all of the sample receiving portion 1110, the light source 1120, the detector 1130, and the like, but according to another embodiment of the present invention shown in FIG. Like the component analysis device 4100 in the component analysis system 4000, at least one of the power supply unit 4160, the display unit 4170, and the communication unit 4180 may be included in the home appliance 4400. have. In this case, the home appliance 4400 may transmit and receive information through wired or wireless communication with the server. For reference, for convenience of description, the user terminal and the server are omitted, and the description of the same components is also omitted.

The component analysis system 1000 according to an embodiment of the present invention includes a light source control module 1210, a detector control module 1220, a measurement condition setting module 1230, a spectrum generation module 1240, and a spectrum comparison. A module 1250 and an estimated condition correction module 1260 are included.

The light source control module 1210 transmits, to the light source 1120, a signal for controlling one or more of set values of light sources including luminous intensity, wavelength, light emission timing, and light emission period.

The light source control module 1210 may control two or more light-emitting devices that irradiate light of different wavelength bands to emit light alternately. In addition, the light source control module 1210 may control the light emitting element to irradiate light for one wavelength band at a time or to simultaneously irradiate light for two or more wavelength bands.

In addition, the light source control module 1210 may control the light-emitting element capable of adjusting the luminous intensity to emit light according to a preset luminous intensity pattern. The light source control module 1210 may control the light-emitting element so that the light-emitting element continuously emit light with a constant light intensity or light by combining two or more light intensities over time. In addition, the light source control module 1210 may control the light emitting device by combining the light emission period and the rest period according to a preset pattern.

As described above, the control method of the light source 1120 may be variously selected in such a way that the reliability of the analysis result can be maximized in consideration of the type of sample, optical characteristics of components, noise characteristics, and the like. Such luminous intensity control, wavelength control, and timing control may be repeatedly performed with a certain period. It is possible to minimize the effect of temporary noise by performing a single analysis process while performing multiple periods of measurement and using the average of the measured values for each period.

The detector control module 1220 transmits a signal for controlling one or more of a detector setting value including a detection timing, a detection period, and a detection range of the detector 1130. The detector control module 1220 may control the detector 1130 to continuously perform a detection operation at a predetermined time interval. The detector control module 1220 may control the detector 1130 by setting one or more ranges of a luminous intensity and a wavelength of light to be detected. For example, it is possible to set the upper and lower limits of the detection wavelength band or the upper and lower limits of the detection luminous intensity.

The measurement condition setting module 1230 determines a light source setting value and a detector setting value based on one or more of measurement condition values including temperature, humidity, sample type, and estimated component. The measurement condition setting module 1230 compares the sample temperature and humidity data measured by the temperature sensor 1151 and the humidity sensor 1152 with the preliminary synthesis spectrum and the component spectrum in the database as described later, and the estimated sample type And the light source setting value and the detector setting value may be determined based on the estimated component.

The measurement condition setting module 1230 may set an initial condition value for obtaining a preliminary synthesis spectrum before determining the measurement condition value, that is, before estimating the sample type and the estimated component. Through the initial condition value, the refractive index of the transmission plates 1111 and 1112, noise directly or indirectly generated from the device components including the sample receiving part 1110, and the fineness of the measured value due to the difference in each component used for each product. Errors, etc. can be reflected in the final analysis result. The initial condition value can be set using the measured value and temperature/humidity data in a state in which the sample is not accommodated.

A light source setting value and a detector setting value are determined according to a predetermined initial condition value, and a preliminary synthesized spectrum is generated using the measured signal, and the measurement condition setting module 1230 is a preliminary synthesis spectrum and a component spectrum established in the database in advance. By comparing the sample type and the estimated component can be estimated primarily. The component spectrum can be obtained by using a known component analysis device, or can be generated by measuring a sample whose component composition is already known using the component analysis device of this example.

The measurement condition setting module 1230 determines two or more estimated components based on the sample type and the estimated component estimated through the analysis of the preliminary synthesis spectrum and the expected component spectrum, and the reference material having the highest estimation accuracy and the relatively low estimation accuracy. It can be classified as a comparative substance. For example, if the peak value or rate of change in a specific wavelength band for the first component appears closer to the preset component spectrum than the peak value or rate of change in a specific wavelength band for the second component, the first component is referenced. The substance and the second component can be classified as a comparative substance.

After classifying the reference material and the comparison material, the reference wavelength band in which the peak value appears in the component spectrum of the reference material and the comparison wavelength band in which the peak value appears in the component spectrum of the comparison material can be determined. One or more of the detector settings can be adjusted. Controls the light source 1120 to irradiate light within the reference wavelength band and the comparison wavelength band, or the luminous intensity of the light source 1120 or the detector 1130 based on the absorbance in the reference wavelength band and the comparison wavelength band in each component spectrum The detection light intensity of can be adjusted.

The measurement condition setting module 1230 may determine a maximum wavelength band with the largest difference in absorbance and a minimum wavelength band with the smallest difference in absorbance in the component spectrum of the reference material and the component spectrum of the comparison material. One or more of the detector settings can be adjusted. For example, if the component spectrum of the reference material and the component spectrum of the comparison material intersect on the same graph, the absorbance of the reference material is the greatest difference than the absorbance of the comparison material. The difference in absorbance of the comparative material is the largest, and the large wavelength band becomes the minimum wavelength band. When peak values do not clearly appear in the component spectrum of the reference material and the comparison material, the light source 1120 and the detector 1130 may be controlled based on the maximum wavelength band and the minimum wavelength band.

On the other hand, if the peak value in the component spectrum of the reference material is confirmed in the preliminary synthesis spectrum, but the peak value in the component spectrum of the comparison material is not clearly displayed, the light source is considered simultaneously with the reference wavelength band and the maximum and minimum wavelength bands It is also possible to control the 1120 and the detector 1130.

The spectrum generation module 1240 generates a synthesized spectrum for the sample by using the electrical signal received from the detector 1130. The spectrum generation module 1240 may generate a synthesized spectrum by collecting absorbance for a unit wavelength band in consideration of the resolution of the detector 1130. When the luminous intensity of light irradiated from the light source 1120 is different for each wavelength, or the value detected by the detector 1130 for light of the same luminous intensity for each wavelength is different, the difference for each wavelength can be adjusted and generated when generating a synthesis spectrum. have.

The spectrum generation module 1240 may generate a preliminary synthesis spectrum using a signal measured according to a preset initial condition value. Although it may be difficult to accurately determine the state of the sample and the composition of the sample through the preliminary synthesis spectrum, it is possible to identify the sample type and the estimated component through comparison with the component spectrum prepared in the database.

In addition, the spectrum generation module 1240 generates an estimated spectrum based on the estimated sample type, the estimated component, and a measurement condition value including temperature and humidity data. The estimated spectrum can be generated by synthesizing a component spectrum corresponding to the sample type and the estimated component. When generating an estimated spectrum by synthesizing each component spectrum, different estimated condition values may be used depending on temperature, humidity, wavelength band, estimated component, and measured luminous intensity range. For example, the estimated spectrum may be generated by summing the absorbance of each estimated component for each wavelength, and the estimated spectrum may be generated by summing the absorbance for each wavelength according to the temperature and humidity. In addition, the estimated spectrum may be generated by summing absorbance at different ratios according to the wavelength band.

The above-described synthesis spectrum is generated by using the absorbance for each wavelength of light measured by the detector 1130 on the basis of an electrical signal transmitted by the detector 1130 for a sample containing two or more components, and the component spectrum is a single component It can be generated by using the absorbance for each wavelength of light measured for.

The spectrum generation module 1240 may generate an estimated spectrum in the reference wavelength band and the comparison wavelength band by using the component spectrum of the reference material and the component spectrum of the comparison material according to a predetermined estimation condition value.

In addition, the spectrum generation module 1240 may generate an estimated spectrum in the maximum wavelength band and the minimum wavelength band by using the component spectrum of the reference material and the component spectrum of the comparison material according to a predetermined estimated condition value.

By setting some of the wavelength bands to be analyzed, such as the reference wavelength band, the comparative wavelength band, the maximum wavelength band, and the minimum wavelength band, the light source 1120 and detector 1130 settings are adjusted, and the estimated spectrum of the corresponding band By selectively generating, it is possible to improve the reliability of the measurement result by intensively performing the analysis in a wavelength band in which optical properties are strong for each component.

The spectrum comparison module 1250 compares the synthesized spectrum and the estimated spectrum to determine component characteristics of the sample. In addition, the spectrum comparison module 1250 may estimate the sample type and the estimated component by comparing the pre-synthesis spectrum with the component spectrum in the database. Hereinafter, a description of the comparison of the component spectrum and the synthesized spectrum will be included in the comparison of the estimated spectrum and the synthesized spectrum.

When generating an estimated spectrum by determining the reference wavelength band and the comparison wavelength band, the spectrum comparison module 1250 uses the reference wavelength peak value and the comparison wavelength peak value in the reference wavelength band and the comparison wavelength band of the synthesized spectrum and the estimated spectrum, respectively. Thus, the presence or absence of components and the ratio of components can be calculated. The spectrum comparison module 1250 may reconfirm the sample type and the estimated component estimated through the comparison of the preliminary synthesis spectrum and the component spectrum, and analyze the composition ratio and concentration between components in detail. For example, the peak value in the component spectrum of the reference material and the component material generated under the same conditions, the reference wavelength peak value and the comparison wavelength peak value in the estimated spectrum are compared with the peak value shown in the synthesis spectrum, and the magnitude of the peak value The composition ratio between components can be determined through the ratio and the influence of temperature and humidity. On the other hand, it is possible to additionally identify trace-containing components that were not identified in the preliminary synthesis spectrum.

In addition, when generating an estimated spectrum by determining the maximum and minimum wavelength bands, the spectrum comparison module 1250 determines the presence or absence of components and component ratios using absorbance in the maximum and minimum wavelength bands of the synthesized spectrum and the estimated spectrum. Can be calculated. In the reference material component spectrum measured under the same conditions, the absorbance in the minimum wavelength band is X ₀₀ , the absorbance in the maximum wavelength band is X ₀₁ , the absorbance in the minimum wavelength band in the comparative material component spectrum is X ₁₀ , and in the maximum wavelength band. The absorbance of X ₁₁ , the absorbance in the minimum wavelength band in the synthesis spectrum Y ₀ , the absorbance in the maximum wavelength band Y ₁ , the ratio of the reference substance in the whole sample K ₀ , the ratio of the comparison substance in the whole sample K ₁ Assuming that the composition ratio of the substance and the absorbance for the substance are proportional to each other, the result of Equation 1 below can be obtained.

The ratio of K ₀ and K ₁ can be obtained through Equation 1, that is, the composition ratio between the reference substance and the comparison substance can be obtained. If Equation 1 is changed to a proportional equation in n+1 wavelength bands for the reference material and n comparison materials, the following Equation 2 can be obtained.

Like Equation 1, the composition ratio between a total of n+1 substances can be obtained through Equation 2 above. When the absorbance of a material is not proportional to the composition ratio and changes according to the function f(K) for the composition ratio K, Equation 2 can be improved as shown in Equation 3 below.

By repeatedly performing the analysis result for each component under various composition ratios, the absorbance function f(K) for the composition ratio can be improved. For convenience of calculation, the absorbance function may be arranged in the form of a linear function for each section according to the wavelength band. In addition, it can be added as a function variable in consideration of the rate of change in absorbance according to temperature, humidity, and wavelength. At this time, the added variables may also be simplified according to each section to facilitate calculation. Meanwhile, the rate of change in absorbance according to the composition ratio, temperature, humidity, wavelength, etc. can be considered when generating the estimated spectrum by synthesizing the component spectrum as an estimated condition value. This estimated condition value may be set in consideration of various factors affecting absorbance.

The estimation condition correction module 1260 may correct the estimation condition value such that an error between the synthesized spectrum and the estimated spectrum in the reference wavelength band and the comparison wavelength band is reduced within a predetermined range. In addition, the estimation condition correction module 1260 may correct the estimation condition value such that an error between the synthesized spectrum and the estimated spectrum in the maximum wavelength band and the minimum wavelength band is reduced within a predetermined range. For example, when calibrating the estimation condition, after obtaining the synthesized spectrum and the estimated spectrum for the entire wavelength band, the estimated condition value for the rate of change in absorbance according to the wavelength band may be corrected in consideration of the ratio between the absorbance for each wavelength band. Similarly, it is possible to calibrate the estimated condition value for each element through measurement and ratio analysis of various temperature conditions, humidity conditions, and composition ratio.

6, a component analysis system 2000 according to another embodiment of the present invention includes at least one of a light source control module 2210 and a detector control module 2220 of the component analysis device 2100 and the user terminal 2200. Can be included in Although the light source control module 2210 and the detector control module 2220 are shown to be spanning the component analysis device 2100 and the user terminal 2200, it is not only included in the user terminal 2200 as in FIG. 1, It may be included only in the component analysis device 2100, and some functions within the module may be divided and included in both the component analysis device 2100 and the user terminal 2200. The same description as the embodiment of FIG. 1 will be omitted.

Referring to FIG. 7, a component analysis system 3000 according to another embodiment of the present invention includes a measurement condition setting module 3230, a spectrum generation module 3240, a spectrum comparison module 3250, and an estimation condition correction module 3260. ) May be included in one or more of the user terminal 3200 and the server 3300. Although the measurement condition setting module 3230, the spectrum generation module 3240, the spectrum comparison module 3250, and the estimation condition correction module 3260 are shown to span the user terminal 3200 and the server 3300, in FIG. 1 As described above, not only the user terminal 3200 but also the server 3300 may be included, and some functions within the module may be divided to be included in both the user terminal 3200 and the server 3300. In addition, a measurement condition setting module 3230, a spectrum generation module 3240, a spectrum comparison module 3250, and an estimation condition correction module 3260 are included in arbitrary components of the user terminal 3200 and the server 3300, respectively. May be.

The database 3310 may also be included in one or more of the user terminal 3200 and the server 3300. Although the database 3310 is shown to span the user terminal 3200 and the server 3300, it is possible to be included only in the user terminal 3200 as well as included only in the server 3300 as shown in FIG. , Data may be divided and included in both the user terminal 3200 and the server 3300. The same description as the embodiment of FIG. 1 will be omitted.

For reference, in the above-described embodiment, two or more of the component analysis device, the user terminal, the home appliance, and the server may transmit and receive information through a communication medium. Such a communication medium may be configured in a wired point-to-point form or a multi-branch form. As the wired communication medium, known wired communication means including Ethernet, USB, and RS-232 may be used. Further, the communication medium may be an optical communication means or a wireless communication means.

A computing system is a logical device configured to read instructions from a medium or network port, connectable to a server, and having a fixed medium. The computing system can be connected to the Internet or an intranet. The system includes a central processing unit (CPU), a disk drive, an input unit and an output unit. The data communication can be connected to a server in a local or remote location through a communication medium. Communication media may include means for transmitting and receiving data. The communication medium may be a network connection, a wireless connection or an Internet connection. The computing system may be coupled to communicate with a user or a device used by the user. The computing system may be connected to communicate with another computer through the Internet or with a computer through a server. In addition, the system may activate one or more devices connected to the network and communicate the status or results of measurements performed by the device or system.

The wireless network can be integrated with a variety of known mobile devices that can be used in systems or communication networks including cell phones, smartphones, PCs, notebooks, wearable devices, pagers, headsets, printers, PDAs. For example, mobile devices may include transceivers, antennas, processors, displays, audio transducers, electromagnetic data storage devices, memories, flash memories, integrated circuits, interfaces, coders-decoders, universal asynchronous transceivers (UARTs), and the like. have.

A wireless LAN through which a mobile user can connect to a local area network through a wireless connection may be used for wireless communication between one or more component analysis devices or component analysis systems. Wireless communication is, for example, WiBro, WiFi, ZIGBEE, Bluetooth, Ultra Wide Band, Near Field Communication (NFC), light, infrared, etc. It may include communications that propagate through electromagnetic waves such as radio and microwaves. Bluetooth products can be used to provide links and Internet connections between mobile devices.

In addition, multiple interface devices (MIDs) may be used in some wireless networks. The multi-interface device may include two independent network interfaces, such as a Bluetooth interface and an IEEE 802.11 interface. Multi-interface devices can thereby participate in two or more separate networks, including Bluetooth devices.

The computing system may be deployed as part of a computer network that includes one or more devices, such as component analysis devices. The servers may be interconnected through a communication network having multiple client computing environments such as tablet PCs, smartphones, PCs, and the like. In addition, the network computing environment can use various well-known data security protocols. Each client computing environment may have an operating system operable to support one or more computing applications such as a web browser, graphical user interface, and mobile desktop environment to gain access to the server computing environment.

A user may interact with a computing application running in a client computing environment to obtain predetermined data or computing application. Data and/or computing applications may be stored in a server computing environment to communicate with users through a client computing environment over a communication network. The user may request access rights to specific data and applications accommodated in some or all of the server computing environment. Data may be processed and stored through communication between the client computing environment and the server computing environment. The server computing environment can host computing applications, processes and applets, authentication, encryption, communication data and applications, and other server computing environments, third-party service providers, network-attached storage (NAS) and storage area networks to realize transactions. (SAN) can be connected.

Hereinafter, a method of analyzing a component of a sample using the aforementioned component analysis system will be described.

9, the component analysis method according to an embodiment of the present invention includes an initial condition value setting step (S101), a light source setting value and a detector setting value determining step (S102), and a preliminary synthesis spectrum generation step (S103). And, by comparing the component spectrum and the pre-synthesis spectrum to estimate the sample type and the estimated component (S104), setting the measurement condition value (S105), the light source setting value and the detector setting value determining step (S106), , By operating a light source and a detector to generate a synthesized spectrum (S107), generating an estimated spectrum based on a measurement condition value and an estimated condition value (S108), and comparing the synthesized spectrum and the estimated spectrum to obtain a sample type and It includes a step of determining the component composition (S109) and a step of calibrating the estimated condition (S110).

The initial condition value can be set using the measured value and temperature/humidity data in a state in which the sample is not accommodated.

First, an initial condition value is set using the spectrum and temperature and humidity data generated in a state in which the sample is not accommodated (S101). A light source setting value for driving the light source and a detector setting value for driving the detector are determined according to the set initial condition value (S102). If the type and composition of the sample is not known, the entire wavelength band can be measured within a short period of time, and the sample type and the estimated component can be identified through the estimation process in a later step.

The light source and the detector are driven according to the determined light source setting value and the detector setting value, and a preliminary synthesized spectrum is generated by the spectrum generation module through the transmitted electrical signal (S103). The type of the sample and the estimated component may be estimated by comparing the component spectrum in the database with the preliminary synthesis spectrum (S104). As described above, the reference wavelength band and the comparison wavelength band may be determined according to the estimated component, or the maximum wavelength band and the minimum wavelength band may be determined. A measurement condition value may be set based on the estimated sample type and component composition (S105). At this time, it is preferable that the temperature and humidity reflected as the measurement condition value are continuously measured at a certain period. The light source setting value and the detector setting value can be adjusted based on the newly set measurement condition value (S106). The light source and the detector are operated according to the adjusted light source setting value and the detector setting value, and a synthesized spectrum is generated by the spectrum generation module through the transmitted electrical signal (S107). In addition, an estimated spectrum is generated by the spectrum generation module based on the measurement condition value and the estimated condition value (S108). The sample type and component composition may be determined by comparing the generated synthesized spectrum and the estimated spectrum (S109). Depending on the estimated component, the reference wavelength peak value and the comparison wavelength peak value may be compared as described above, or the composition ratio for each component may be determined using absorbance in the maximum wavelength band and absorbance in the minimum wavelength band. The estimated condition value is corrected by reflecting the analysis result (S110), and a new estimated spectrum is generated using the corrected estimated condition value and compared with the synthesized spectrum, thereby increasing the reliability of the result value for the component characteristic. Step S110 may be repeatedly performed to continuously improve the accuracy and reliability of the result, and the estimated condition value obtained through the iterative process may be updated in the database to be used for subsequent component analysis or component analysis of other users.

Although the embodiments of the present invention have been described in more detail with reference to the accompanying drawings, the present invention is not necessarily limited to these embodiments, and various modifications can be made without departing from the spirit of the present invention. . Accordingly, the embodiments disclosed in the present invention are not intended to limit the technical idea of the present invention, but to explain the technical idea, and the scope of the technical idea of the present invention is not limited by these embodiments. Therefore, it should be understood that the embodiments described above are illustrative in all respects and not limiting. The scope of protection of the present invention should be interpreted by the following claims, and all technical ideas within the scope equivalent thereto should be interpreted as being included in the scope of the present invention.

1100: component analysis device
1110: sample receiving portion
1111: input light transmitting plate
1112: output light transmitting plate
1113: housing
1114: light blocking member
1120: light source
1130: detector
1150: environmental sensor
1151: temperature sensor
1152: humidity sensor
1160: power supply
1170: display unit
1180: Ministry of Communications
1200: user terminal
1210: light source control module
1220: detector control module
1230: Measurement condition setting module
1240: spectrum generation module
1250: spectrum comparison module
1260: Estimated condition correction module
1300: server
1310: database
1000: component analysis system

Claims (19)

housing;
A light source connected to the housing so as to be disposed in a space separated from the sample by an input light transmitting plate connected to the housing, and irradiating light to the sample through the input light transmitting plate; And
A detector that is connected to the housing so as to be disposed in a space separated from the sample by an output light transmitting plate connected to the housing, and detects light transmitted from the light source and transmitted through the sample and the output light transmitting plate and converts it into an electrical signal. Component analysis device containing.
The method of claim 1,
And a sample receiving portion connected to the housing to form a sample receiving space at a position through which the optical axis from the light source to the detector passes.
The method of claim 2,
The component analysis device, characterized in that the sample receiving part is detachably connected to the housing.
The method of claim 2,
The component analysis device, characterized in that the input light transmitting plate and the output light transmitting plate are integrally formed with the sample receiving portion.
The method of claim 2,
The component analysis device, characterized in that the sample accommodating part includes a light blocking member that blocks light entering the sample accommodating space from outside.
The method of claim 1,
Component analysis device, further comprising a temperature sensor for measuring the temperature of the sample.
The method of claim 1,
Component analysis device, characterized in that it further comprises a humidity sensor for measuring the humidity of the sample.
The component analysis device according to claim 1;
A light source control module for transmitting a signal to the light source to control at least one of light source setting values including luminance, wavelength, emission timing, and emission period;
A detector control module for transmitting a signal for controlling one or more of a detection timing of the detector, a detection period, and a detector set value including a detection range;
A measurement condition setting module configured to determine the light source setting value and the detector setting value based on one or more of measurement condition values including temperature, humidity, sample type, and estimated component;
A spectrum generation module that generates a synthesized spectrum for a sample by using the electrical signal received from the detector and generates an estimated spectrum based on the measurement condition value; And
A component analysis system comprising a spectrum comparison module for comparing the synthesized spectrum and the estimated spectrum to determine component properties of a sample.
The method of claim 8,
The light source includes two or more light emitting devices that irradiate light of different wavelength bands,
The light source control module is a component analysis system, characterized in that for controlling the two or more light emitting elements to emit light alternately.
The method of claim 8,
The light source includes a light emitting device with adjustable luminous intensity,
The light source control module is a component analysis system, characterized in that for controlling the light emitting device to emit light according to a preset luminous intensity pattern.
The method of claim 8,
The detector control module controls the detector by setting at least one of a luminous intensity and a wavelength of light to be detected.
The method of claim 8,
The spectrum generation module generates a preliminary synthesis spectrum by using the measured signal according to an initial condition value predetermined by the measurement condition setting module,
The measurement condition setting module is a component analysis system, characterized in that to determine the sample type and the estimated component through the preliminary synthesis spectrum.
The method of claim 12,
The measurement condition setting module divides two or more estimated components into a reference substance having the highest estimation accuracy and a comparison substance having relatively low estimation accuracy, based on the sample type and the estimated component, and in the component spectrum of the reference substance set in advance. A component analysis system, characterized in that one or more of the light source setting value and the detector setting value are determined based on a reference wavelength band in which a peak value appears and a comparison wavelength band in which the peak value appears in a component spectrum of the comparison material set in advance. .
The method of claim 13,
The spectrum generation module generates an estimated spectrum in the reference wavelength band and the comparison wavelength band by using the component spectrum of the reference material and the component spectrum of the comparison material according to a predetermined estimated condition value. system.
The method of claim 14,
And an estimation condition correction module for correcting the estimation condition value such that an error between the synthesized spectrum and the estimated spectrum in the reference wavelength band and the comparison wavelength band is reduced within a predetermined range.
The method of claim 12,
The measurement condition setting module divides two or more estimated components into a reference substance having the highest estimation accuracy and a comparison substance having relatively low estimation accuracy based on a sample type and an estimated component, and includes a component spectrum of the reference substance set in advance. And determining at least one of the light source setting value and the detector setting value based on a maximum wavelength band having the largest absorbance difference and a minimum wavelength band having the smallest difference in absorbance in the component spectrum of the comparative material.
The method of claim 16,
The spectrum generation module generates an estimated spectrum in the maximum wavelength band and the minimum wavelength band by using the component spectrum of the reference material and the component spectrum of the comparison material according to a predetermined estimated condition value. system.
The method of claim 17,
And an estimation condition correction module for correcting the estimation condition value such that an error between the synthesized spectrum and the estimated spectrum in the maximum wavelength band and the minimum wavelength band is reduced within a predetermined range.
As a component analysis method using the component analysis system according to claim 8,
Setting a measurement condition value;
Determining a light source setting value and a detector setting value based on the measurement condition value;
Operating a light source and a detector to generate a synthesized spectrum;
Generating an estimated spectrum based on the measurement condition value; And
Comprising the step of comparing the synthesized spectrum and the estimated spectrum to determine the component properties of the sample.

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