KR20190068881A - Tester for adherence of porcelain enamel - Google Patents

Abstract

The present invention provides a tester for adherence of porcelain enamel having high reliability. According to an embodiment, the tester for adherence of porcelain enamel comprises: a device body; a specimen fixing unit disposed on an upper portion of the device body and fixing a specimen; a moving unit placed in an upper portion of the specimen fixing unit, and connected to a probe unit to move the probe unit in a direction of the specimen fixing unit; the probe unit in which a plurality of probes are arranged to be spaced on a lower surface; and a contact portion placed in a lower portion or a side surface of the specimen fixing unit, and coming in contact with the specimen when the specimen is mounted on the fixing unit. The probe unit is formed to rotate.

Description

[0001] Tester for adherence of porcelain enamel [

The present invention relates to an apparatus for evaluating the adhesion of an enamel article including a glaze layer.

An enamel product, which is a typical product that applies glaze on the surface of steel sheet, is a kind of surface treatment product which is treated with high-temperature fusing of vitreous enamel glaze on steel sheet. It has the advantages of excellent formability and toughness of steel sheet and excellent external qualities of steel, corrosion resistance, chemical resistance and heat resistance It is used in various applications such as household appliances, building exterior, tableware, chemical tank and so on.

Since the vitreous enamel glaze applied to the surface of the steel sheet in the enamel treatment process performed in the production of such products is completely different from the physical and chemical properties of the steel sheet as the base metal, it is difficult to secure the adhesion at the interface, It also causes various defects due to defects. Therefore, it is very important to evaluate the adhesion between glazes and ground iron as a method of quality assurance in these products because it is necessary to ensure the adhesion of enamel layer to these products to prevent defects of the products.

FIG. 1 shows an apparatus for evaluating the adhesion of an enamel article, and FIG. 2 shows a stepwise view of the enamel specimen struck by the evaluation apparatus of FIG. 1, the heavy material 20 is dropped at a predetermined height, and the surface of the product S is damaged through the striking member 30. Thereafter, the degree of detachment of the glaze layer on the surface of the specimen is visually observed, The adhesion index according to the degree of dropout of glaze layer is shown in comparison with the standard specimen prepared for each dropout degree.

On the other hand, Patent Document 1 discloses a method of measuring the deformed portion with 169 needles after the impact. Patent Document 1 is merely a supplement of the naked eye, and there is a problem in that it is insufficient to obtain evaluation data of high reliability and high adhesion.

(Patent Document 1) KR10-1069078 B

SUMMARY OF THE INVENTION It is an object of the present invention to provide a highly reliable glaze adhesion testing apparatus for solving the above problems.

In order to attain the above object, the present invention provides the following glazing adhesion measuring device.

According to an embodiment of the present invention, A specimen fixing unit disposed on an upper surface of the apparatus main body and fixing the specimen; A moving part which is positioned above the specimen fixing part and is connected to the probe part so as to move the probe part in the direction of the specimen fixing part; A plurality of probes disposed on a lower surface of the probe; And a contact portion located on a lower side or a side surface of the specimen fixing portion and contacting the specimen when the specimen is seated on the fixing portion, wherein the probe portion is rotatably configured.

In one embodiment, the contact portion is disposed at a lower portion of the specimen fixing portion, the contact portion is grounded, and the probe is connected to a power source, and when the probe portion contacts the specimen, .

Further, in one embodiment, the probe includes a circular lower surface, and the probes may be disposed at uniform intervals on the lower surface.

In one embodiment, the probe may be configured to be rotated at least 45 degrees.

In one embodiment of the present invention, the probe may have a spacing of less than 2.35 mm and less than 2.43 mm with a neighboring probe and may have a diameter of greater than 1.64 mm and less than 1.72 mm. In addition, the probe may be disposed on the circular surface of the 40 mm moving plate, and the probe may include 166 to 172 probes.

In one embodiment of the present invention, the plurality of probes may be disposed symmetrically with respect to the center of the lower surface of the probe.

Further, in one embodiment, it may further include an auxiliary grounding portion disposed on a side surface of the specimen fixing portion and being in contact with a side of the specimen and being grounded.

Further, in one embodiment, the apparatus may further include a grinder disposed at one side of the apparatus main body and having a grindstone to peel off the glaze of the specimen.

The present invention makes it possible to apply a method capable of transferring a specimen holder part at a certain angle in order to enlarge a measurement site, thereby saving time and economic energy as well as increasing the efficiency of the experiment and greatly improving the reliability of the measurement value.

1 is a schematic view of an apparatus for evaluating the adhesion of a conventional enamel article.
Fig. 2 is a photograph of a stepped view of the enamel specimen struck by the evaluation apparatus of Fig.
3 is a schematic view of an apparatus for evaluating glaze adhesion of an embodiment of the present invention.
Fig. 4 is an enlarged view of a fixing portion and a probe portion of the embodiment of Fig. 3;
FIG. 5 is a state diagram showing a state in which the probe unit of FIG. 4 is moved.
6 is a bottom view of the probe unit of Fig. 3;
7 is a photograph showing a state in which glaze adhesion is evaluated according to an embodiment of the present invention.

Conventional test equipment for evaluating the adhesion characteristics of glaze including conventional glaze adhesion has a limitation in securing the reliability of the experiment by indexing the adhesion characteristics by visual observation during measurement and increasing the number of experiments in order to overcome this The efficiency of experiment decreased and the cost of experiment increased.

     Therefore, in order to solve such a problem, in the present invention, by decreasing the measurement error and improving the reliability of the experimenter by indexing the adhesion evaluation and controlling the measurement angle in the same specimen, the adhesion of all parts of the glazed- The present invention provides a glaze adhesion evaluation device capable of maximizing the glaze adhesion.

In particular, when the glaze adhesion device proposed in the present invention is used, it is possible to analyze enamel adhesion characteristics, which are the main cause of quality defects in enamel products, at various angles in a short period of time, thereby remarkably improving in terms of time, The glaze adhesion can be evaluated.

Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings.

FIG. 3 is a schematic view of a glaze adhesion evaluation apparatus according to an embodiment of the present invention. FIG. 4 is an enlarged view of a fixing unit and a probe unit of the embodiment of FIG. 3, A state diagram is shown.

3 to 5, the apparatus 100 for evaluating glaze adhesion of an embodiment of the present invention includes an apparatus main body 110; A specimen fixing unit 150 disposed on the upper surface 113 of the apparatus main body 110 and fixing the specimen S; A moving part 120 located above the specimen fixing part 150 and connected to the probe part 130 to move the probe part 130 in the direction of the specimen fixing part 150; A plurality of probes 133 spaced apart from each other on a bottom surface thereof; And a contact part 155 located on the lower side or the side surface of the specimen fixing part 150 and contacting the specimen S when the specimen S is seated on the fixing part 150, And is rotatably connected through a rotation unit 131. [ The rotating part 131 may be configured to rotate the measuring part 130 by at least 45 degrees about the moving part 120. When the measuring part 130 is rotated by 45 degrees or more, It is possible to stably measure the entire region of the sample S.

The apparatus body 110 includes an upper body 112 having a moving part 120 and a probe 130 and a lower body 111 to which the control panel 117 and the fixing part 150 are connected do. A grinder 190, to which the grindstone 191 is rotatably connected, is connected to the side surface of the apparatus main body 110. The grinder 190 can be used for peeling off the glaze layer of the specimen S. [

A fixing portion 150 is disposed on the upper surface 113 of the lower body 111 of the apparatus body 110 and a moving portion 120 and a connecting portion The probes 133 can be brought into contact with the specimen S disposed on the upper surface of the fixing portion 150 by moving the probe 130 downwardly, Since the ground is grounded by the contact portion 155, whether or not the probe 133 is energized is changed depending on whether the glaze of the specimen S has fallen. Therefore, the glaze adhesion evaluation apparatus 100 of the present invention can judge whether or not the electric current is applied at each point of the specimen S, and whether or not the electric current is applied can determine whether the glaze layer, that is, the enamel layer, Judgment is possible.

The control panel 117 is connected to a driving unit (not shown) provided inside the moving unit 120 or a driving unit (not shown) provided inside the rotating unit 131 to control the automatic movement of the measuring unit 130 And is configured to control the measurement of the power supply / cutoff and energization of the measurer 133. And may be configured to supply power to the grinder 190, or to control power supply / disconnection to the electromagnet when the fixing portion 150 includes an electromagnet.

The upper body 1112 extends in a substantially 'A' shape at one side of the lower body 111 and the measuring unit 130 and the moving unit 120 are disposed at the end side. The measuring unit 130 is connected to the lower part of the moving unit 120 and the measuring unit 130 and the moving unit 120 are connected by the rotating unit 131. The measuring unit 130 and the moving unit 120 may be disposed coaxially and the rotating unit 131 may rotate the measuring unit 130 with respect to the moving unit 120. [ As shown in FIG. 4, the rotation unit 131 may be scaled to indicate the degree of rotation, and the user may determine the degree of rotation based on the scale. However, Of course it is possible.

The measurement unit 130 includes a disc 132 protruding downward from the rotation unit 131 and a plurality of probes 133 arranged in a predetermined pattern on the lower surface of the disc 132.

The fixing part 150 is disposed on the opposite side of the measuring part 130 and the fixing part 150 may include the magnetic material 151 to fix the test piece S to the fixing part. The fixing part 150 may be formed of a magnetic material, but it may be a structure capable of controlling magnetism like an electromagnet.

On the other hand, the contact portion 155 is provided on the lower surface of the fixing portion 150 or on the side surface to contact the specimen S placed on the fixing portion 150 to ground the specimen. The contact portion 155 is embedded in a groove formed in the bottom surface 153 of the fixing portion 150 and is configured to protrude from the bottom surface 153 of the fixing portion 150 by an elastic force. The contact portion 155 can be in continuous contact with the specimen S placed on the fixing portion 150 by arranging the spring 156 at the lower portion. The contact portion 155 is connected to the ground line 157, and thus the specimen S is also connected to the ground line 157.

A plurality of the lower surfaces of the fixing portion 150 are disposed on the contact portion 155 and are uniformly arranged in the entire region of the specimen S to stably achieve the grounding of the specimen S. However, it is also possible to further include an auxiliary ground line which can be attached to the side surface of the specimen S, since the grounding may not be achieved even if the glaze layer has a plurality of contact portions 155 in the case of good adhesion of the glaze.

FIG. 5 shows a state in which the measuring unit 130 is vertically moved by the moving unit 120. At this time, the vertical movement distance may be about 50 to 100 mm, but is not limited thereto. In addition, a shock-absorber may be separately mounted for the purpose of preventing the falling of the measuring portion due to its own weight.

5, a plurality of probes 133 disposed at a lower portion of the measuring unit 130 are brought into contact with the test piece S by lowering the measuring unit 130. [ In each probe 133, whether or not the glaze is disconnected is determined, and the adhesion of the specimen S can be judged by the probes 133 evenly arranged in the entire lower region of the measuring unit 130 . The probe 133 is provided with a (+) electrode and the glaze is generally left in the glaze due to the nature of the glaze. The glaze detachment degree can be indexed by measuring the conduction rate of each part of the test piece easily by utilizing the property that no current is applied.

 In particular, it is possible to determine the adhesion with the number of conductive probes 133 in the entire probe 133. Further, in the present invention, the probe 133 can be rotated with respect to the specimen S, including the rotating portion 131. [ Therefore, the probe can be tried at various positions in the same specimen to measure the accuracy of the tightness.

6 is a bottom view of the measuring unit 130 of the present invention. As shown in FIG. 6, the probes 133 are uniformly arranged in the entire area of the disk 132 under the measuring unit 130. At this time, the probe 133 may be arranged symmetrically with respect to the center of the measuring unit 130. The probe 133 has a predetermined diameter d and the probe 133 has a constant spacing l between the probe 133 and the neighboring probe 133.

It is necessary to adjust the diameter d and the distance l of the probe 133 of the measuring unit 130 in order to accurately measure even if it is rotated by the rotation unit 131 in the embodiment of the present invention. Table 1 shows the results of experiments on the distance l and the diameter d of the probe 133 with the case of the diameter of the disk 132 being 40 mm. As can be seen from Table 1, when the diameter d of the probe 133 is 1.64 mm or more and 1.72 mm or less (Comparative Examples 2 and 3), and the probe has a distance l from the neighboring probe to 2.35 mm When it was less than 2.43 mm (see Comparative Examples 2 and 3), it was possible to secure test reliability and workability. Also, the number of the probes 133 was also in the range of 166 to 172.

When the diameter d of the probe 133 is 1.64 mm or less, problems such as bending of the probe 133 frequently occur when the probe 133 contacts the test piece S and conducts the energization test On the other hand, when the diameter d is greater than 1.72 mm, there is no problem in terms of safety of the probe 133. However, there is a problem that mutual interference occurs with the probe 133 on the side portion The diameter d of the probe 133 is preferably 1.64 to 1.72 mm.

The distance l between the probes 133 is limited to 2.35 to 2.43 mm. When the distance (l) is less than 2.35 mm, the probe portion is concentrated in one place, which makes it difficult to obtain a representative value of the glaze adhesion of the specimen. On the other hand, if the gap between the probes is 2.42 mm or more It is preferable that the interval l between the probes is in the range of 2.35 to 2.43 mm since there is a problem that the area of the specimen S in which the probe does not reach increases and the accuracy of the adhesion index is lowered.

division Number of probes (ea) Probe spacing (l, mm) Diameter of probe (d, mm) Workability Experimental reliability Measuring area Comparative Example 1 156 2.40 1.70 O X X Comparative Example 2 169 2.35 1.64 X X X Inventory 1 168 2.41 1.71 O O O Inventory 2 170 2.40 1.70 O O O Inventory 3 169 2.40 1.69 O O O Honorable 4 169 2.39 1.70 O O O Comparative Example 3 180 2.43 1.89 X X O Comparative Example 4 170 2.50 1.69 X X X

    In Table 1, the workability is indicated by "○" when there is no problem in measurement when the glaze adhesion evaluation work is repeatedly performed, "X" when the work is delayed due to a problem such as probe, and the reliability of the experiment is indicated by the same test piece , When the standard deviation is less than 5%, it is indicated as ○, and when the standard deviation is 5% or more, X is shown. In the case of the measured area, if the area ratio measured under the experimental conditions in which the measurement is performed three times as a whole through the angle change test in the entire measurement area of the test piece is less than 50%, the case where the area where X is 70% Respectively.

7 is a photograph of the specimen S measured by the glaze adhesion evaluation apparatus 100 of the present invention. 7 (a) shows a case where the rotation part 131 is not rotated, a case where the measurement part 130 is rotated by 15 degrees by the rotation part 131 in the case of FIG. 7 (b) 131 of the measuring unit 130 is rotated by 45 degrees.

7 (a) to 7 (c), when the glaze adhesion evaluation apparatus 100 photographs while changing the rotation angle with respect to the same specimen S, ) A) is probed at different angles. Therefore, accurate and reliable results can be obtained in the case of performing the adhesion test while rotating the measuring part 130 including the rotating part.

While the present invention has been particularly shown and described with reference to exemplary embodiments, it is to be understood that the invention is not limited to the disclosed exemplary embodiments, but, on the contrary, is intended to cover various modifications and equivalent arrangements included within the spirit and scope of the appended claims.

100: glaze adhesion evaluation device 110:
111: lower body 112: upper body
113: upper surface 117: control panel
120: moving part 130: measuring part
131: rotating part 133: probe
150: fixing portion 153: bottom surface
155: contact portion 157: ground line
190: Grinder 191: Whetstone

Claims (9)

A device body;
A specimen fixing unit disposed on an upper surface of the apparatus main body and fixing the specimen;
A moving part which is positioned above the specimen fixing part and is connected to the probe part so as to move the probe part in the direction of the specimen fixing part;
A plurality of probes disposed on a lower surface of the probe; And
And a contact portion which is located on a lower side or a side surface of the specimen fixing portion and contacts the specimen when the specimen is placed on the fixing portion,
Wherein the probe unit is rotatable.
The method according to claim 1,
The contact portion is disposed under the specimen fixing portion, the contact portion is grounded,
Wherein the probe is connected to a power source, and whether or not the electric current is determined depending on whether or not the glaze is in close contact with the specimen when the probe contacts the specimen is determined.
The method according to claim 1,
Wherein the probe includes a circular lower surface, and the probes are disposed at uniform intervals on the lower surface.
The method according to claim 1,
Wherein the probe is rotatable at least 45 degrees.
The method of claim 3,
Wherein the probe has a spacing greater than 2.35 mm and less than 2.43 mm with the neighboring probe.
6. The method of claim 5,
The probe having a diameter of greater than 1.64 mm but less than 1.72 mm,
Wherein the probe is disposed on a round surface of the 40 mm moving plate, and the probe includes 166 to 172 probes.
The method according to claim 6,
Wherein the plurality of probes are arranged symmetrically with respect to the center of the lower surface of the probe.
3. The method of claim 2,
Further comprising an auxiliary grounding portion disposed on a side surface of the specimen fixing portion and being in contact with a side surface of the specimen and being grounded.
9. The method according to any one of claims 1 to 8,
Further comprising a grinder disposed at one side of the apparatus main body and having a grindstone to peel off the glaze of the specimen.

Images