KR20190043372A - Organic light emitting display device and driving method - Google Patents

Abstract

Embodiments of the present invention relate to an organic light emitting diode display device and a driving method thereof and, more specifically, to an organic light emitting diode display device capable of applying a reverse bias voltage to an organic light emitting diode of each sub-pixel, and detecting whether the organic light emitting diode is short-circuited or disconnected based on a current flowing through the organic light emitting diode to which the reverse bias voltage is applied. Embodiments of the present invention also relate to a driving method of the organic light emitting diode display device.

Description

TECHNICAL FIELD [0001] The present invention relates to an organic light emitting diode (OLED) display device,

Embodiments relate to an organic light emitting display and a driving method thereof.

2. Description of the Related Art In recent years, an organic light emitting diode (OLED) display device that has been popular as a display device has advantages of high response speed, high luminous efficiency, high brightness, and wide viewing angle by using an organic light emitting diode (OLED)

Such an organic light emitting display device arranges pixels including organic light emitting diodes in a matrix form and controls the brightness of pixels selected by the scan signals according to the gradation of the data.

In such an organic light emitting diode display, there is a possibility that a foreign matter or moisture may be generated in the process of pre-shipment or after shipment of the product in the wiring of the electric connection between the organic light emitting diode and the organic light emitting diode.

In this case, the organic light emitting diode may not be short-circuited or open to serve as a diode.

In the case where the organic light emitting diode is electrically short-circuited, there is a problem that an overcurrent flows or an abnormal current may flow. In the case where the organic light emitting diode is disconnected, there is a problem that a current can not flow.

Therefore, the corresponding subpixel does not operate normally, and as a result, the image quality of the organic light emitting display device may be greatly deteriorated.

On the other hand, in recent years, a variety of electronic devices such as a virtual reality device, an augmented reality device, and the like, which require a small display device, are emerging. Accordingly, a microdisplay type organic light emitting display device having a very small size has been proposed.

However, there is a problem that it is difficult to inspect the short-circuit or disconnection of the organic light-emitting diode due to the size of the micro-display type organic light-emitting display device.

It is an object of the embodiments to provide an organic light emitting display device and a driving method capable of detecting whether an organic light emitting diode is short-circuited or disconnected.

Another object of the embodiments is to provide an organic light emitting display device and a driving method capable of detecting whether an organic light emitting diode is short-circuited or disconnected after a product is shipped using a test pad.

Another object of the embodiments is to provide an organic light emitting display device and a driving method capable of individually detecting whether or not an organic light emitting diode is short-circuited or disconnected for each of a plurality of subpixels.

Another object of the embodiments is to provide an organic light emitting display device and a driving method capable of detecting whether or not the organic light emitting diode of a subpixel is short-circuited or disconnected by one signal input.

It is still another object of the present invention to provide an organic light emitting display device and a driving method capable of easily detecting whether an organic light emitting diode of a microdisplay type organic light emitting diode is short-circuited or disconnected.

In one aspect, the present embodiments provide a pixel array in which a plurality of data lines, a plurality of gate lines and a plurality of sub-pixels defined by a plurality of sensing lines are arranged, a gate driving circuit for driving a plurality of gate lines, An organic light emitting display including a source driver circuit for driving data lines, a pixel array, a gate driver circuit, and a power circuit for supplying power to the source driver circuit can be provided.

The organic light emitting display includes a gate driver circuit, a source driver, a scan driver, a scan driver, a scan driver, a scan driver, a scan driver, and a scan driver, And a test circuit for controlling the driving circuit and the power circuit.

In such an organic light emitting diode display, a test circuit applies a reference voltage to a sensing line of at least one subpixel, measures a current flowing to the organic light emitting diode through a sensing line while a reference voltage is applied, And disconnection can be discriminated.

In the OLED display device, each of the plurality of subpixels includes an organic light emitting diode having a first electrode and a second electrode to which a base voltage is applied, a first node coupled to the data voltage, a second node coupled to the first electrode, A first transistor electrically connected between the first node of the driving transistor and the data line and supplying a data voltage to the first node of the driving transistor; A second transistor electrically connected between the two nodes and a sensing line to which a reference voltage is applied, and a storage capacitor connected between the first node and the second node of the driving transistor.

In the organic light emitting diode display, the second transistor is turned on at the time of test driving to transmit the reference voltage applied through the sensing line to the first electrode of the organic light emitting diode, A reverse bias voltage may be applied to the organic light emitting diode and a current flowing through the organic light emitting diode may be transmitted to the sensing line.

The organic light emitting display device may further include a sensing line corresponding to at least one subpixel of the plurality of sensing lines and a pad unit including at least one test pad to electrically connect the corresponding one of the at least one testpads The test mux portion may be further included.

Such an organic light emitting display may be a microdisplay type organic light emitting display formed on a silicon substrate.

In another aspect, the present embodiments relate to an organic light emitting diode comprising a test drive step of applying a reverse bias voltage to an organic light emitting diode of at least one subpixel with a reference voltage applied through a sensing line of at least one subpixel being tested A driving method of the light emitting display device can be provided.

According to the embodiments described above, it is possible to provide an organic light emitting display device and a driving method that can detect whether an organic light emitting diode is short-circuited or disconnected.

In addition, according to the embodiments, it is possible to provide an organic light emitting display device and a driving method that can detect whether an organic light emitting diode is short-circuited or disconnected after a product is shipped using a test pad.

In addition, according to the embodiments, it is possible to provide an organic light emitting display device and a driving method capable of separately detecting whether or not the organic light emitting diodes are short-circuited or disconnected for each of a plurality of subpixels.

In addition, according to the embodiments, it is possible to provide an organic light emitting display device and a driving method capable of detecting whether or not the organic light emitting diode of a subpixel is short-circuited or disconnected by one signal input.

In addition, according to the embodiments, it is possible to provide an organic light emitting display device and a driving method that can easily detect whether an organic light emitting diode of a microdisplay type is short-circuited or disconnected.

1 is a system configuration diagram of an organic light emitting diode display according to embodiments.
FIG. 2 is a schematic view illustrating a structure of a microdisplay type organic light emitting diode display according to embodiments. Referring to FIG.
FIG. 3 is a sub-pixel structure of an organic light emitting diode display according to embodiments.
4 is another subpixel structure of the organic light emitting diode display according to the embodiments.
5 is a cross-sectional view illustrating a pixel structure of an organic light emitting display device of a microdisplay type according to embodiments.
6 is a diagram illustrating a short circuit and a short circuit phenomenon of an organic light emitting diode in a subpixel of an organic light emitting diode display according to embodiments.
FIG. 7 shows another example of the structure of an organic light emitting display according to the embodiments.
FIGS. 8 and 9 are views for explaining an open-circuit and a short-circuit inspection operation of the organic light emitting diode with respect to the subpixel of the organic light emitting diode display according to the embodiments.
FIG. 10 shows a detailed structure of an organic light emitting diode display according to embodiments.
11 is a flowchart of a method of driving an organic light emitting display according to embodiments.

Hereinafter, some embodiments of the present invention will be described in detail with reference to exemplary drawings. In the drawings, like reference numerals are used to denote like elements throughout the drawings, even if they are shown on different drawings. In the following description of the present invention, a detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear.

In describing the components of the present invention, terms such as first, second, A, B, (a), and (b) may be used. These terms are intended to distinguish the components from other components, and the terms do not limit the nature, order, order, or number of the components. When a component is described as being "connected", "coupled", or "connected" to another component, the component may be directly connected or connected to the other component, Quot; intervening " or that each component may be " connected, " " coupled, " or " connected " through other components.

1 is a system configuration diagram of an organic light emitting diode display according to embodiments.

Referring to FIG. 1, an OLED display 100 according to embodiments includes a plurality of data lines DL and a plurality of gate lines GL, a plurality of data lines DL, A pixel array PXL including a plurality of subpixels SP defined by a plurality of gate lines GL, a source driver circuit SDC driving a plurality of data lines DL, A gate driving circuit GDC for driving the gate lines GL of the liquid crystal display device and a controller CONT for controlling the source driving circuit SDC and the gate driving circuit GDC.

The controller CONT supplies various control signals DCS and GCS to the source driver circuit SDC and the gate driver circuit GDC to control the source driver circuit SDC and the gate driver circuit GDC.

The controller CONT starts scanning according to the timing implemented in each frame and switches the input image data inputted from the outside according to the data signal format used in the source driving circuit SDC, ), And controls the data driving at a proper time according to the scan.

The controller CONT may be a timing controller used in a conventional display technology or a control device including a timing controller to perform other control functions.

The controller CONT may be implemented as a separate component from the source driver circuit SDC, integrated with the source driver circuit SDC, and implemented as an integrated circuit.

The source driver circuit SDC receives the video data Data from the controller CONT and supplies the data voltages to the plurality of data lines DL to drive the plurality of data lines DL. Here, the source driver circuit SDC is also referred to as a data driver circuit.

Such a source driver circuit (SDC) may be implemented including at least one source driver integrated circuit (SDIC).

Each source driver circuit integrated circuit (SDIC) may include a shift register, a latch circuit, a digital to analog converter (DAC), an output buffer, and the like.

Each source driver circuit integrated circuit (SDIC) may further include an analog to digital converter (ADC), as the case may be.

The gate drive circuit GDC sequentially supplies the scan signals to the plurality of gate lines GL to sequentially drive the plurality of gate lines GL. Here, the gate drive circuit GDC is also referred to as a scan drive circuit.

Such a gate drive circuit GDC may be implemented by including at least one gate driver integrated circuit (GDIC).

Each gate driver circuit integrated circuit GDIC may include a shift register, a level shifter, and the like.

The gate drive circuit GDC sequentially supplies a scan signal of an On voltage or an Off voltage to the plurality of gate lines GL under the control of the controller CONT.

When a specific gate line is opened by the gate drive circuit GDC, the source driver circuit SDC converts the image data (DATA) received from the controller CONT into an analog data voltage, ).

The source driver circuit SDC may be located only on one side (for example, on the upper side or the lower side) of the pixel array PXL and on both sides of the pixel array PXL in accordance with the driving system, : Upper side and lower side).

The gate drive circuit GDC may be located only on one side (e.g., the left side or the right side) of the pixel array PXL and may be disposed on both sides of the pixel array PXL depending on the driving system, For example, left and right).

The types and the number of the circuit elements constituting each subpixel SP can be variously determined depending on the providing function, the design method, and the like.

On the other hand, the pixel array PXL may exist in a display panel using a glass substrate or the like, and the source driver circuit SDC and the gate driver circuit GDC may be electrically connected to the display panel in various ways.

That is, in the OLED display 100, transistors, various electrodes and various signal lines are formed on a glass substrate to form a pixel array PXL, and the integrated circuits corresponding to the driving circuits are connected to a printed circuit And is electrically connected to the display panel through a printed circuit. Such an existing structure is suitable for medium and large-sized display devices.

In recent years, however, there is an increasing demand for small display devices such as virtual reality (VR) devices and Augmented Reality (AR) devices.

The organic light emitting diode display 100 according to the embodiments may be a small display device having a structure suitable for being applied to electronic devices such as a virtual reality device and an augmented reality device, or having excellent display performance. The small display device may be an organic light emitting display of a micro display type which is manufactured in a very small size.

In this case, for example, the pixel array PXL, the source driver circuit SDC, the gate drive circuit GDC, and the controller CONT may be arranged on a silicon substrate (silicon semiconductor substrate).

In the present specification, the term " Micro " may mean that the size of the display device is small, and that the manufacturing process is finely made even if the size of the display device is not small.

An electronic device utilizing an organic light emitting display device of a microdisplay type will be described below.

FIG. 2 is a schematic view illustrating a structure of a micro organic light emitting display according to embodiments. Referring to FIG.

2, a microdisplay type organic light emitting diode display 200 according to embodiments of the present invention may have a backplane structure including a pixel array (PXL) and various driving circuits on a silicon substrate 210 .

The silicon substrate 210 may be p-type or n-type. In the present specification, "p" means a hole and "n" means an electron.

The silicon substrate 210 may include a pixel array region (PAZ) in which the pixel array PXL is arranged and a circuit region (CZ) in which various driving circuits are disposed.

The circuit region CZ of the silicon substrate 210 may be located around the pixel array region PAZ of the silicon substrate 210. [ For example, the circuit zone CZ may be on one or both sides or three sides of the pixel array zone PAZ, and may surround the periphery of the pixel array zone PAZ.

Not only a plurality of subpixels SP are arranged on the pixel array PXL of the silicon substrate 210 but also signal lines for supplying various signals and voltages to a plurality of subpixels SP may be arranged have.

These signal lines may include data lines for transmitting a data voltage corresponding to a video signal, and gate lines for transmitting a scan signal (gate signal).

Further, the signal wirings disposed on the pixel array PXL may further include a driving voltage line for transmitting a driving voltage, and may further include a sensing line or the like for transmitting a reference voltage or for voltage sensing .

The signal wirings disposed on the pixel array PXL may be electrically connected to the driving circuits disposed on the circuit region CZ of the silicon substrate 210. [

The driving circuits disposed on the circuit region CZ of the silicon substrate 210 include the source driving circuits SDC1 and SDC2 for driving the data lines, the gate driving circuit GDC for driving the gate lines, And a controller CONT for controlling the operation of the gate driver circuits GDC and SDC1 and the gate driver circuit GDC.

The driving circuits disposed on the circuit area CZ provide various signals and voltages necessary for driving the sub pixels SP arranged in the pixel array PXL to other circuits SDC1, SDC2, GDC, CONT Or a power circuit (PSC) for supplying the data to the pixel array 210 and the like.

Here, the power circuit (PSC) may include a power generator such as a DC-DC converter.

The driving circuits disposed on the circuit area CZ of the silicon substrate 210 may further include at least one interface for signal input / output, power supply, or communication with other electronic components.

These interfaces may include, for example, one or more of a Low-Voltage Differential Signaling (LVDS) interface, a Mobile Industry Processor Interface (MIPI), a serial interface, and the like.

A pad portion PAD having a plurality of pads may be disposed on the circuit region CZ of the silicon substrate 210 in order to electrically connect drive circuits with other electronic components outside the silicon substrate 210.

The plurality of pads of the pad portion PAD may be used for signal input / output, power supply or communication. 2, the pad portion PAD is disposed only on one side of the silicon substrate 210. However, the position of the pad portion PAD may be variously adjusted and may be disposed in various positions. However, in the case where the pad portion PAD is disposed on the edge side of the silicon substrate 210, it is easy to design the electrical connection with other electronic components and drive circuits.

The organic light emitting display device 200 of the microdisplay type includes the source drive circuits SDC1 and SDC2 as well as the pixel array PXL, the gate drive circuit GDC, the controller CONT and the power circuit PSC. And the like are all formed on the silicon substrate 210, the size of the device can be reduced, and the fabrication process can be performed easily and quickly.

On the other hand, the gate drive circuit GDC may exist only on one side with respect to the pixel array PXL, or on both sides (left side and right side or upper side and lower side).

Further, the source driver circuits SDC1 and SDC2 may exist only on one side with respect to the pixel array PXL, or on both sides (upper side and lower side, or left side and right side).

In Fig. 2, for example, two source driver circuits SDC1 and SDC2 are arranged above and below the pixel array PXL.

In this case, the two source driver circuits SDC1 and SDC2 can alternately drive the plurality of data lines DL. For example, the first source driver circuit SDC1 may drive data lines DL for odd-numbered pixels (or subpixels), and the second source driver circuit SDC2 may drive data lines DL for odd-numbered pixels (or subpixels) Lt; RTI ID = 0.0 > DL. ≪ / RTI >

If one source driver circuit (SDC) is disposed on one side (for example, the upper side) of the pixel array PXL in the organic light emitting display device 200 of the microdisplay type, the controller CONT controls the pixel array PXL, (For example, the lower side). That is, the position of the controller CONT can be variously adjusted.

All or part of the micro-display type organic light emitting diode display 200 according to the embodiments described above can be manufactured in a process of manufacturing a silicon wafer.

In this respect, all or part of the organic light emitting diode display 200 of the micro display type according to the embodiments can be regarded as an integrated circuit which is produced through a silicon wafer manufacturing process (semiconductor process).

Therefore, all or part of the organic light emitting diode display 200 of the micro display type according to the embodiments can be referred to as a display integrated circuit.

As described above, the organic light emitting display device 200 of the micro display type according to the embodiments has the advantage that it can be manufactured precisely, easily, and conveniently because the organic light emitting display device 200 is made entirely or partially through the silicon wafer manufacturing process.

On the other hand, the pixel array PXL including the transistors on the pixel array region PAZ on the silicon substrate 210 and the driver circuits including the transistors on the circuit region CZ on the silicon substrate 210 are fabricated in the same process .

FIG. 3 is a sub-pixel structure of an organic light emitting diode display according to embodiments.

3, each sub-pixel SP includes an organic light emitting diode OLED, a driving transistor DRT for driving the organic light emitting diode OLED, A first transistor T1 electrically connected between the first node N1 of the driving transistor DRT and the data line DL and a second transistor N2 electrically connected between the first node N1 and the second node N1 of the driving transistor DRT, And a capacitor Cst electrically connected between the first and second electrodes N1 and N2.

The organic light emitting diode OLED may include a first electrode (e.g., an anode electrode or a cathode electrode), an organic light emitting layer (OEL), and a second electrode (e.g., a cathode electrode or an anode electrode).

The first electrode of the organic light emitting diode OLED may be electrically connected to the second node N2 of the driving transistor DRT. A base voltage EVSS may be applied to the second electrode of the organic light emitting diode OLED.

Here, the base voltage EVSS may be a kind of common voltage applied to all the sub-pixels SP.

The driving transistor DRT drives the organic light emitting diode OLED by supplying the driving current Ioled to the organic light emitting diode OLED.

The driving transistor DRT has a first node N1, a second node N2, and a third node N3.

The first node N1 of the driving transistor DRT is a node corresponding to a gate node and may be electrically connected to a source node or a drain node of the first transistor T1.

The second node N2 of the driving transistor DRT may be electrically connected to the first electrode of the organic light emitting diode OLED and may be a source node or a drain node.

The third node N3 of the driving transistor DRT may be electrically connected to the driving voltage line DVL for supplying the driving voltage EVDD as a node to which the driving voltage EVDD is applied, Lt; / RTI >

Here, the driving voltage EVDD may be a kind of common voltage applied to all the sub-pixels SP.

The first transistor T1 may be turned on and off by receiving the first scan signal SCAN1 through the gate line to the gate node.

The first transistor T1 is turned on by the first scan signal SCAN1 to transfer the data voltage Vdata supplied from the data line DL to the first node N1 of the driving transistor DRT .

The first transistor T1 is also referred to as a switching transistor.

The capacitor Cst is electrically connected between the first node N1 and the second node N2 of the driving transistor DRT so that the data voltage Vdata corresponding to the video signal voltage, You can keep it for hours.

The second transistor T2 is electrically connected between the second node N2 of the driving transistor DRT and the sensing line SL so that the second scan signal SCAN2 is applied to the gate node, .

The drain node or the source node of the second transistor T2 is electrically connected to the sensing line SL and the source or drain node of the second transistor T2 is connected to the second node N2 of the driving transistor DRT. And can be electrically connected.

The second transistor T2 may be turned on during a display driving period and may be turned on during a sensing driving period for sensing a characteristic value of the driving transistor DRT or a characteristic value of the organic light emitting diode OLED, Can be turned on.

Also, the second transistor T2 may be turned on in a test mode for detecting a short circuit or disconnection of the organic light emitting diode OLED.

The second transistor T2 is turned on by the second scan signal SCAN2 in response to the drive timing so that the reference voltage VSS supplied to the sensing line SL is supplied to the second node of the drive transistor DRT, (N2).

The second transistor T2 is turned on by the second scan signal SCAN2 in accordance with another driving timing so that the voltage of the second node N2 of the driving transistor DRT is connected to the sensing line SL You can deliver it.

In this case, a sensing portion (e.g., an analog digital converter or the like) that can be electrically connected to the sensing line SL can measure the voltage of the second node N2 of the driving transistor DRT through the sensing line SL have.

In other words, the second transistor T2 controls the voltage state of the second node N2 of the driving transistor DRT or the voltage of the second node N2 of the driving transistor DRT to the sensing line SL. . ≪ / RTI >

The capacitor Cst is not a parasitic capacitor (for example, Cgs or Cgd) which is an internal capacitor existing between the first node N1 and the second node N2 of the driving transistor DRT, And may be an external capacitor designed intentionally outside the driving transistor DRT.

Each of the driving transistor DRT, the first transistor T1 and the second transistor T2 may be an n-type transistor or a p-type transistor.

Each sub-pixel structure illustrated in FIG. 3 is only an example for explanation, and in some cases, the sensing line SL and the second transistor T2 may be omitted.

In some cases, it may further include one or more transistors, or may further include one or more capacitors.

Also, in some cases, or each of the plurality of subpixels may have the same structure, and some of the plurality of subpixels may have a different structure.

4 is another subpixel structure of the organic light emitting diode display according to the embodiments.

The subpixel structure of FIG. 4 is a variation of the 3T1C structure of FIG.

In FIG. 3, the first scan signal SCAN1 and the second scan signal SCAN2 are configured to receive a separate gate signal. In this case, the first scan signal SCAN1 and the second scan signal SCAN2 may be respectively applied to the gate node of the first transistor T1 and the gate node of the second transistor T2 through different gate lines have.

However, in FIG. 4, the first scan signal SCAN1 and the second scan signal SCAN2 are configured to receive the same gate signal. In this case, the first scan signal SCAN1 and the second scan signal SCAN2 may be commonly applied to the gate node of the first transistor T1 and the gate node of the second transistor T2 through the same gate line .

4, the gate node of the first transistor T1 and the gate node of the second transistor T2 are connected to the same gate line GL to receive the scan signal SCAN in the same manner .

5 is a cross-sectional view illustrating a pixel structure of an organic light emitting display device of a microdisplay type according to embodiments.

FIG. 5 shows an example of a pixel structure in which red (R) green (G) and blue (B) subpixels constitute one pixel.

In FIG. 5, the silicon substrate 210 may be a p-type substrate or an n-type substrate. For example, the silicon substrate 210 may be a p-type substrate.

An insulating layer ISO is formed on the silicon substrate 210 and a gate electrode G and a source electrode S and a drain electrode D disposed in the insulating layer ISO are disposed.

And a driving transistor DRT is formed on the silicon substrate 210. [

The source and drain of the driving transistor DRT may be formed at positions corresponding to the source electrode S and the drain electrode D in the silicon substrate 210. [

The gate of the driving transistor DRT is disposed in the insulating layer ISO and disposed at a position corresponding to the gate electrode G. [

The gate, source, and drain of the driving transistor DRT may be electrically connected to the gate electrode G, the source electrode S, and the drain electrode D through a contact hole, respectively.

On the other hand, the contact metal CM disposed in the insulating layer ISO may be connected to the source electrode S or the drain electrode D through the contact hole of the insulating layer ISO. Where the contact metal CM may be a sensing line SL.

On the other hand, the first electrode E1 of the organic light emitting diode OLED may be disposed on the insulating layer ISO. The first electrode E1 may be electrically connected to the contact metal CM through the contact hole of the insulating layer ISO. Here, the first electrode E1 may be an anode electrode of the organic light emitting diode OLED.

The light emitting layer EL may be disposed on the first electrode E1 and the second electrode E2 may be disposed on the light emitting layer EL. Here, the second electrode E2 may be a cathode electrode of the organic light emitting diode OLED.

The organic light emitting diode OLED is formed by the first electrode E1, the light emitting layer EL and the second electrode E2.

A protection layer ICS may be disposed on the second electrode E2 and a color filter layer CF may be disposed on the protection layer ISC. Here, the color filter layer CF is formed to realize subpixels of red (R) green (G) and blue (B). A red filter, a green filter, and a blue filter.

A protective cover (COV) may be disposed on the color filter layer CF. At this time, the protective cover (COV) can be attached by the adhesive layer (ADH).

In Fig. 5, an example of a microdisplay type organic light emitting display device is shown, in which the light emitting layer EL is configured to emit light of a single color. The color filter layer CF allows light emitted from the light emitting layer EL to emit red (R) green (G) and blue (B) light corresponding to each subpixel. At this time, the light emitting layer (EL) can emit white light.

However, as another example, a plurality of different light emitting layers emitting light of red (R) green (G) and blue (B) are arranged corresponding to the subpixels, And blue (B) light. In this case, the color filter layer CF may be omitted.

In FIG. 5, three subpixels corresponding to the red (R) green (G) and blue (B) constitute one pixel, but four subpixels may constitute one pixel. For example, four subpixels may be subpixels that emit red (R) green (G), blue (B), and white (W) light.

In such a microdisplay type organic light emitting diode display, since various circuit elements of the subpixel including the driving transistor DRT are formed on the silicon substrate 210, the organic light emitting diode OLED can be formed through the deposition method have.

6 is a diagram illustrating a short circuit and a short circuit phenomenon of an organic light emitting diode in a subpixel of an organic light emitting diode display according to embodiments.

Foreign matter or moisture may be generated in a process before the product shipment or after the product is shipped to the electrical connection wiring connected between the first electrode and the second electrode constituting the organic light emitting diode (OLED) and the organic light emitting diode.

In this case, the organic light emitting diode (OLED) may be shorted or open and may not function as a diode.

When the organic light emitting diode (OLED) is short-circuited, an overcurrent flows or an abnormal current flows, so that the corresponding subpixel does not operate normally.

Also, when the organic light emitting diode (OLED) is disconnected, no current flows or a very small level of current flows and the corresponding subpixel does not operate normally.

Therefore, the image quality of the organic light emitting diode display 100 may be significantly reduced.

In this specification, the disconnection of the organic light emitting diode (OLED) is not limited to the case where the electrical connection between the first electrode and the second electrode is completely cut off, and the electrical connection between the first electrode and the second electrode is incomplete, And a case in which the required current can not be flowed.

In particular, as shown in FIG. 5, in the organic light emitting diode display of the microdisplay type, since the organic light emitting diode OLED is formed through the deposition method, the organic light emitting diode OLED may be short-circuited or broken.

Also, since the microdisplay type organic light emitting diode display is manufactured to a very small size, it is not easy to inspect the open circuit and the short circuit of the organic light emitting diode (OLED).

Accordingly, the OLED display 100 according to the embodiments can easily detect short-circuit and disconnection of the organic light-emitting diode.

FIG. 7 shows another example of the structure of an organic light emitting display according to the embodiments.

As shown in FIG. 2, the organic light emitting diode display 700 of FIG. 7 is a microdisplay type organic light emitting display. However, the organic light emitting diode display 700 of FIG. 7 further includes a test circuit TC and at least one test mux portion TMUX1 and TMUX2 on the silicon substrate 710. FIG.

The OLED display 700 of FIG. 7 may further include a test pad for detecting a short circuit and a disconnection of the organic light emitting diode OLED in the pad portion PAD.

In FIG. 7, for example, the pad portion PAD may further include a test pad including at least one test sensing pad TSP1, TSP2, a test mux select pad TMSP, and a test mode setting pad TMP.

The test circuit TC is a circuit for detecting short-circuit and disconnection of the organic light-emitting diode. The test circuit TC activates at least one test mux portion TMUX1 and TMUX2 in the test period according to the test mode setting signal.

Here, the test mode setting signal may be applied as a user command or via a test mode setting pad TMP. The test circuit TC may also generate a test mode setting signal at a predetermined time.

Then, the test circuit TC controls the gate drive circuit GDC in the test period and transmits the test data pre-designated to the source drive circuits SDC1 and SDC2.

The test circuit TC also transmits a pixel selection signal to at least one test mux portion TMUX1, TMUX2.

The test circuit TC can generate a pixel selection signal in accordance with a predetermined procedure in the test period. When a test mux select signal is received via the test mux select pad TMSP, Signal may be generated.

The test circuit TC outputs the power circuit PSC so that the drive voltage EVDD and the base voltage EVSS of the predetermined voltage level in the test mode are supplied to or blocked from the plurality of subpixels SP of the pixel array PXL Can be controlled.

The power circuit PCS cuts off the drive voltage EVDD supplied to the pixel array PXL in the test mode under the control of the test circuit TC. The power circuit PCS also supplies the base voltage EVSS to the tester low voltage TEVSS having a voltage level higher than the reference voltage VSS.

Here, the test period low voltage TEVSS is a voltage for applying a reverse bias voltage to the organic light emitting diode OLED of the subpixel SP. Therefore, the test-device low voltage TEVSS must have a voltage level higher than the reference voltage VSS applied to the first electrode E1 which is the anode of the organic light emitting diode OLED.

Although the test circuit TC is separately shown in FIG. 7 for convenience of explanation, the test circuit TC may be integrated with the controller CONT or the source driver circuits SDC1 and SDC2. In some cases, the test circuit TC may be separated into a test control section and a sensing section and distributed to the controller CONT and the source driver circuits SDC1 and SDC2. In this case, the sensing unit may include a current measuring circuit.

In the test mode, the source driver circuits SDC1 and SDC2 receive test data from the test circuit TC and supply the test data voltage TVdata to the plurality of data lines DL, ).

Here, the test data voltage TVdata has a voltage level for turning off the driving transistor DRT.

On the other hand, in the test mode, the gate drive circuit GDC sequentially supplies the test scan signal TSCAN having the voltage level predetermined to the plurality of gate lines GL under the control of the test circuit TC, And sequentially drives the plurality of gate lines GL.

Here, the test scan signal TSCAN has a voltage level for turning on the first and second transistors T1 and T2.

Each of the at least one test mux portion TMUX1 and TMUX2 selects at least one sensing line of the plurality of sensing lines SL in response to a pixel selection signal transmitted from the test circuit TC.

Each of the at least one test mux portion TMUX1 and TMUX2 applies a reference voltage VSS to the selected sensing line to drive the corresponding sensing line.

Here, the reference voltage VSS can be applied from the test circuit TC.

Accordingly, the touch circuit TC can sense a short circuit or disconnection of the organic light emitting diode OLED by sensing a current flowing to the sensing line.

Also, the reference voltage VSS may be transmitted from a corresponding one of the plurality of test sensing pads TSP1 and TSP2 to at least one test mux portion TMUX1 and TMUX2.

When the reference voltage VSS is transmitted through the test sensing pad, the external test apparatus senses the current flowing to the sensing line through the test sensing pads TSP1 and TSP2 to judge whether the organic light emitting diode OLED is short- can do.

At least one test mux portion (TMUX1, TMUX2) may be integrated in the source driver circuit (SDC1, SDC2). Also, each of the at least one test mux portion TMUX1 and TMUX2 may include one mux and may include a plurality of muxes.

When the organic light emitting diode display is a microdisplay type, the area occupied by the pad portion PAD in the silicon substrate 710 is very large. As a result, the productivity of the organic light emitting display device is lowered and the manufacturing cost is increased.

Therefore, in the microdisplay type organic light emitting diode display, it is an important issue to reduce the number of pads included in the pad portion (PAD). Therefore, the number of the test sensing pads TSP can be minimized by using the first and second test mux portions TMUX1 and TMUX2.

Therefore, when the OLED display device is not a microdisplay type, or when the touch circuit TC is configured to directly sense a current flowing to the sensing line, at least one test mux portion TMUX1 and TMUX2 may be omitted.

FIGS. 8 and 9 are views for explaining an open-circuit and a short-circuit inspection operation of the organic light emitting diode with respect to the subpixel of the organic light emitting diode display according to the embodiments.

The structure of the subpixel shown in Fig. 8 is the same as that of the subpixel of Fig. However, the sensing line SL is electrically connected to the test sensing pad TSP.

8, the sensing line SL and the test sensing pad TSP are directly connected to each other. However, as shown in FIG. 7, the test sensing pad TSP may include at least one test mux portion And may be connected to the sensing line SL through the sense amplifiers TMUX1 and TMUX2.

Also, the sensing portion of the touch circuit TC may be connected to the sensing line SL.

Referring to Figs. 8 and 9, during the test period in which the organic light emitting diode short circuit and the disconnection are detected, the driving voltage EVDD is cut off. Therefore, the third node N3 of the driving transistor DRT becomes a floating state.

And the base voltage EVSS may be applied to the test base voltage TEVSS having a voltage level higher than the reference voltage VSS.

Since the driving voltage EVDD and the base voltage EVSS are common voltages supplied to the plurality of subpixels SP in the pixel array PXL, they can be maintained at the same state and voltage level during the test period.

Meanwhile, a test scan signal TSCAN transmitted through the gate line GL is transmitted. The test scan signal TSCAN is a signal having a voltage level for turning on the first and second transistors T1 and T2 and the first and second transistors T1 and T2 are a test scan Is turned on by the signal TSCAN.

The turned-on first transistor T1 applies the test data voltage TVdata transmitted through the data line DL to the gate of the driving transistor DRT.

The driving transistor DRT is turned off in response to the test data voltage TVdata applied to the gate and the driving voltage EVDD is in a floating state, Of the second node N2.

On the other hand, the turned-on second transistor T2 applies the reference voltage VSS to the second node N2 of the driving transistor DRT.

The reference voltage VSS is a signal for applying a reverse bias voltage to the organic light emitting diode OLED together with the test base voltage TEVSS.

For example, the reference voltage VSS applied to the first electrode E1, which is the anode of the organic light emitting diode OLED, may have a voltage level of 0V, and the second electrode E2, which is the cathode of the organic light emitting diode OLED, The test base voltage (TEVSS) applied to the electrodes may have a voltage level of 5.5V.

Therefore, if the organic light emitting diode OLED to which the reverse bias voltage is applied by the reference voltage VSS and the test base voltage TEVSS is in a normal state, only a very weak current can flow through the organic light emitting diode OLED do.

9, when the organic light emitting diode OLED is in a normal state, a current flowing through the sensing line SL is within a reference current range that can be set in advance at the time of manufacturing the organic light emitting diode OLED For example, in the range of 100 nA to 200 nA).

However, if the organic light emitting diode (OLED) is short-circuited, a measurement current (for example, several μA to several mA) exceeding the reference current range flows through the sensing line SL.

Also, if the organic light emitting diode (OLED) is in a disconnected state, a measuring current (for example, less than 100 nA) below the reference current range flows through the sensing line SL.

And the current flowing through the sensing line SL can be measured in the test circuit TC. To this end, the sensing unit (not shown) of the test circuit TC may further include a current measuring circuit.

Also, the current flowing through the sensing line SL may be measured in an external test apparatus via the test sensing pad TSP.

Here, the current flowing through the sensing line SL is measured while the reference voltage VSS is applied through the sensing line SL. Therefore, the device for applying the reference voltage VSS to the sensing line SL and the device for measuring the current flowing to the sensing line SL may be the same.

Therefore, the test apparatus or the test circuit TC can perform one test drive for each sub-pixel SP to easily determine the short-circuit and disconnection of the organic light-emitting diode OLED.

Also, since the external test apparatus can selectively test the subpixels to be tested by transmitting a test mux select signal through the test mux select pads (TMSP), it is possible to selectively test the subpixels in the pixel array (PXL) (SP) can be accurately determined.

FIG. 10 shows a detailed structure of an organic light emitting diode display according to embodiments.

10 includes a plurality of sub-pixels of the pixel array PXL, a gate driving circuit GDC, at least one source driving circuit SDC1, SDC2, and at least one sub-pixel of the pixel array PXL in the OLED display of Fig. And the test mux portions TMUX1 and TMUX2.

As shown in FIG. 10, the gate drive circuit GDC sequentially applies the test scan signal TSCAN to a plurality of gate lines GL, and sequentially drives the plurality of gate lines GL.

The first source driver circuit SDC1 may drive odd-numbered data lines by applying a test data voltage TVdata to odd-numbered data lines among the plurality of data lines DL. The second source driver circuit SDC2 can drive the even-numbered data lines by applying the test data voltage TVdata to the even-numbered data lines among the plurality of data lines DL.

The two source driver circuits SDC1 and SDC2 are disposed on the upper and lower sides of the pixel array PXL to drive the odd and even data lines respectively in order to improve the driving ability of a plurality of data lines to be.

The first test mux portion TMUX1 is electrically connected to the odd sensing lines of the plurality of sensing lines SL and the second test mux portion TMUX2 is electrically connected to the even sensing conductive lines SL among the plurality of sensing lines SL Lt; / RTI >

The first test mux part TMUX1 selects and electrically connects at least one sensing line among a plurality of odd-numbered sensing lines according to a pixel selection signal applied from the test circuit TC.

The second test mux portion TMUX2 selects and electrically connects at least one sensing line of the plurality of even-numbered sensing lines according to a pixel selection signal applied from the test circuit TC.

In some cases, each of the first and second test mux portions TMUX1 and TMUX2 may electrically connect the selected sensing line SL to the corresponding test sensing pad TSP1.

As described above, the first and second test mux portions TMUX1 and TMUX2 may be integrated into at least one source driver circuit SDC1 and SDC2. In the case of an organic light emitting display device configured to measure a current flowing through a sensing line SL in a sensing portion of a test circuit TC or to be free from the size of a pad portion, (TMUX1, TMUX2) may be omitted.

7-10 illustrate an organic light emitting diode (OLED) display device and a driving method for testing short-circuiting and disconnection of an organic light emitting diode (OLED) based on a microdisplay-type OLED display device. Similarly, an organic light emitting diode (OLED) other than a microdisplay type organic light emitting display in which a pixel array (PXL) is formed on a glass substrate can similarly be tested for shorting and disconnection of the organic light emitting diode OLED.

In this case, the test circuit TC may store in the memory (not shown) whether the organic light emitting diode OLED is short-circuited or disconnected according to the measured current. At this time, information on the position of the subpixel corresponding to the pixel selection signal may be stored in the memory.

As described above, the test pad may be omitted when the test circuit TC is configured to set a test mode, generate a pixel selection signal, and test a short circuit or disconnection of the organic light emitting diode OLED.

11 is a flowchart of a method of driving an organic light emitting display according to embodiments.

In the driving method of the OLED display according to the embodiments, the test circuit TC enters the test mode according to the test mode setting signal (S1110).

At this time, the test mode setting signal may be received through the test mode setting pad TMP among the plurality of test pads of the pad unit PAD, or may be received as a separate user command. The test circuit TC may also be configured to generate a test mode setting signal at predetermined time and operating conditions.

In the test mode, the test circuit TC activates at least one test mux portion TMUX1, TMUX2.

And controls the power circuit PSC to cut off the driving voltage EVDD applied to the pixel array PXL so that the third node N3 of the driving transistor DRT becomes a floating state. And the base voltage EVSS has a voltage level of the test base voltage TEVSS higher than the reference voltage VSS.

On the other hand, the test circuit TC controls the gate drive circuit GDC and transmits a pixel selection signal to at least one test mux portion TMUX1, TMUX2.

The test circuit TC may generate a pixel selection signal in accordance with a predetermined procedure and may generate a pixel selection signal in response to the test mux selection signal when the test mux selection signal is transmitted via the test mux selection pad TMSP have.

According to the pixel selection signal, at least one of the test mux portions TMUX1 and TMUX2 selects a subpixel (or pixel) to be tested (S1120). Here, the subpixel to be tested may refer to a subpixel receiving the reference voltage VSS through the sensing line SL.

The test circuit TC transfers the test data specified in advance to the source driver circuits SDC1 and SDC2. Each of the source driver circuits SDC1 and SDC2 transmits a test data voltage TVdata having a predetermined voltage level to corresponding data lines of the plurality of data lines DL according to the received test data, Drive the lines.

Each of the at least one test mux portion TMUX1 and TMUX2 applies a received reference voltage VSS to the selected sensing line and drives the corresponding sensing line to perform test driving in operation S1130.

The reference voltage VSS may be transmitted in the test circuit TC or received in at least one test mux portion TMUX1, TMUX2 via the test sensing pad TSP.

Each of the at least one test mux portion TMUX1 and TMUX2 outputs a current flowing through the selected sensing line to the test circuit TC or the test sensing pad TSP during the test driving.

The test apparatus connected to the test circuit TC or the test sensing pad TSP senses the amount of current flowing to the sensing line SL to determine whether the organic light emitting diode OLED is short-circuited or disconnected.

As a result, according to the embodiments, it is possible to easily detect short-circuit or disconnection between the first electrode and the second electrode of the organic light-emitting diode even after shipment of the product.

In addition, whether the organic light emitting diode is short-circuited or disconnected for each of a plurality of subpixels can be detected by one signal input.

In addition, it is possible to easily detect whether the organic light emitting diode of the microdisplay type organic light emitting diode display is short-circuited or disconnected.

It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the inventions. , Separation, substitution, and alteration of the invention will be apparent to those skilled in the art. Therefore, the embodiments disclosed in the present invention are intended to illustrate rather than limit the scope of the present invention, and the scope of the technical idea of the present invention is not limited by these embodiments. The scope of protection of the present invention should be construed according to the following claims, and all technical ideas within the scope of equivalents should be construed as falling within the scope of the present invention.

100, 200: organic light emitting display device TC: test circuit
PXL: Organic Light Emitting Display Panel TMUX1, TMUX2: Test MUX
SDC: Source driving circuit PAD: Pad unit
GDC: Gate drive circuit
CONT: controller

Claims (11)

A pixel array in which a plurality of subpixels defined by a plurality of data lines, a plurality of gate lines, and a plurality of sensing lines are arranged;
A gate driving circuit for driving the plurality of gate lines;
A source driver circuit driving the plurality of data lines;
A power circuit for supplying power to the pixel array, the gate driving circuit, and the source driving circuit; And
Pixel driving circuit, the source driving circuit and the driving circuit are controlled so that a reverse bias voltage is applied to the organic light emitting diodes of the at least one subpixel together with a reference voltage applied through a sensing line of at least one subpixel being tested, And a test circuit for controlling the power circuit. The method according to claim 1,
The test circuit
Applying the reference voltage to the sensing line of the at least one subpixel,
Wherein the current flowing to the organic light emitting diode through the sensing line is measured while the reference voltage is applied to discriminate a short circuit and a disconnection of the organic light emitting diode. 3. The method of claim 2,
The test circuit
If the measured current exceeds a preset reference current range, the organic light emitting diode is determined to be in a short-
And determines that the organic light emitting diode is in a disconnection state if the measured current is less than the reference current range. The method according to claim 1,
Each of the plurality of sub-
The organic light emitting diode has a first electrode and a second electrode to which a base voltage is applied, a first node to which a data voltage is applied, a second node to be connected to the first electrode, and a third node to which a driving voltage is applied A first transistor electrically connected between a first node of the driving transistor and a data line and supplying the data voltage to a first node of the driving transistor; And a storage capacitor connected between a first node and a second node of the driving transistor,
The second transistor
The organic light emitting diode according to claim 1, wherein the organic light emitting diode (OLED) has a first electrode coupled to the first electrode of the organic light emitting diode And applies a reverse bias voltage to the organic light emitting diode and transmits a current flowing through the organic light emitting diode to the sensing line. 5. The method of claim 4,
The driving transistor
During the test driving,
Is maintained in an off state in accordance with the data voltage,
The driving voltage is cut off and the third node is brought into a floating state. 5. The method of claim 4,
The base voltage
And a test base voltage having a voltage level higher than the reference voltage. The method according to claim 1,
The organic light emitting display device
A pad portion including at least one test pad; And
And a test mux portion for selecting a sensing line corresponding to the at least one sub-pixel among the plurality of sensing lines and electrically connecting the sensing line to a corresponding one of the at least one test pads. 8. The method of claim 7,
The organic light emitting display device
A microdisplay type organic light emitting display device formed on a silicon substrate,
Wherein the pixel array is disposed in a pixel array region on the silicon substrate,
Wherein the gate driving circuit, the source driving circuit, the power circuit, and the test circuit are disposed on a circuit area of the silicon substrate. 9. The method of claim 8,
The test mux
Wherein the organic light emitting display is disposed at one side or both sides of the pixel array region or integrated into the source driving circuit. A method of driving an organic light emitting display including a pixel array and a test circuit in which a plurality of subpixels defined by a plurality of data lines, a plurality of gate lines, and a plurality of sensing lines are arranged,
And a test driving step of applying a reverse bias voltage to the organic light emitting diodes of the at least one sub pixel together with a reference voltage applied through the sensing line of at least one sub pixel to be tested. 11. The method of claim 10,
Each of the plurality of sub-
The organic light emitting diode has a first electrode and a second electrode to which a base voltage is applied, a first node to which a data voltage is applied, a second node to be connected to the first electrode, and a third node to which a driving voltage is applied A first transistor electrically connected between a first node of the driving transistor and a data line and supplying the data voltage to a first node of the driving transistor; And a storage capacitor connected between a first node and a second node of the driving transistor,
The test drive step
Turning off the driving transistor, blocking the driving voltage applied to the pixel array, and floating the third node;
Applying the base voltage to a test base voltage having a voltage level higher than the reference voltage; And
The second transistor is turned on to transfer the reference voltage transmitted through the sensing line to the first electrode of the organic light emitting diode to generate a ground voltage to be applied to the second electrode of the organic light emitting diode, Applying a reverse bias voltage to the organic light emitting diode, and transmitting a current flowing through the organic light emitting diode to the sensing line.

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