KR20180122182A - The system of data process using strain sensors applied to the body and the method of data process using the same - Google Patents

Abstract

The present invention relates to a data processing system using a strain sensor applied to a body and a processing method thereof. The data processing system includes: a strain sensor which touches skin and has the length thereof extended as the skin is stretched; a measuring part which measures the resistance of the strain sensor; and a processing part which includes a look-up table for storing data on a plurality of patterns whose resistance is changed, receives a resistance value from the measuring part, compares the patterns of a resistance change and outputs matching data. The data processing system using a strain sensor applied to the body and a data processing method using the same according to the present invention can measure the movement of a body using a strain sensor capable of being deformed with a small force and having high sensitivity, and can be utilized as a method of digitalizing the movement of a small muscle and transmitting data.

Description

BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a data processing system using a strain measuring sensor applied to a body, and a data processing method using the same. [0002]

The present invention relates to a data processing system using a strain measuring sensor applied to a body and a data processing method using the strain measuring sensor. More particularly, the present invention relates to a strain measuring method A data processing system using the sensor, and a data processing method using the same.

Various types of strain measuring sensors have been developed. Typically, strain gauges and optical fiber sensors have been developed and widely used commercially. On the other hand, the development of new technologies, such as wearable electronic devices, displays, network communication devices, portable electronic devices, etc., are increasingly demanded for human motion detection.

However, strain rate sensors, such as strain gauges and optical fiber sensors, as disclosed in Korean Laid-Open Patent Application No. 2013-0084832 (published on March 26, 2013), have a small measuring range for detecting human motion and can increase both the measuring range and the sensitivity There are many problems to be worn by people because of the complicated structure. Therefore, there is a problem in that it is difficult to measure a natural motion when the body does not feel a foreign body feeling.

Korean Patent Publication No. 2013-0084832 (disclosed on March 26, 2013)

An object of the present invention is to provide a data processing system using a strain measuring sensor applied to a body that solves the problem of difficulty in acquiring data for communication by measuring a body movement in the past and a data processing method using the same .

As a means for solving the above problems, there is provided a strain measuring apparatus comprising: a strain measuring sensor which is configured to be in contact with a skin and is configured to increase a resistance by stretching a length of the skin together with elongation of the skin; a measuring unit configured to measure a resistance of the strain measuring sensor; And a processing unit for receiving a resistance value from the measuring unit and comparing the pattern of the resistance change and outputting matched data, wherein the data processing system includes a lookup table in which data on a pattern is stored, Can be provided.

Here, the processing unit sets the reference resistance value of the resistance value of the sensor, is divided into a first resistance value when the measured resistance value is equal to or greater than the reference resistance value, and a second resistance value when the measured resistance value is less than the reference resistance value, It can be matched with stored data.

The processing unit may match the patterns stored in the look-up table with the patterns of the first resistance value and the second resistance value during the predetermined unit time, the patterns being classified into a holding time and a generation order.

Further, the strain measuring sensor is attached to the skin that is deformed by the movement of the muscles, and the processing unit sets the reference resistance value based on the maximum value and the minimum value of the resistance when relaxed and contracted according to the degree of deformation of the skin .

The processor may also be configured to include a corresponding alphabet in the look-up table with a 1: 1 pattern of resistance variations.

Furthermore, the processing unit can match the pattern of resistance change by constituting a pattern of resistance change in the look-up table with a morse code distinguished according to the holding time and the order of occurrence.

On the other hand, the strain measuring sensor can be constructed so as to be attached to a finger or an eyelid to cause a resistance change in accordance with the movement of a finger or an eyelid.

The strain measuring sensor is formed of a conductive metal on a first layer and a first layer made of a nonconductive and stretchable material and has a grain size within a predetermined range according to a measuring range, And a second layer in which the density of the crack is within a predetermined range.

Also, the second layer is created by depositing on the first layer, and can be created with a larger grain size on the first layer.

On the other hand, the second layer may be formed by adjusting the thickness of the layer deposited on the first layer so that the grain size is within a predetermined range, and the density of the crack is within a predetermined range.

Here, the grain size may be 15 nm or less when the measurement range of the elongation percentage is 100%.

Further, the thickness of the second layer may be formed to be 25 nm or less so that the grain size may be 13 nm or less.

Also, when the density of the crack is 1 * 10 ^{^ 7} / m or more, the width of the crack may be 5 * 10 ^-8 m / piece or less.

The second layer may be composed of platinum.

The second layer may also be deposited using sputtering.

In addition, the method includes the steps of positioning a strain measuring sensor on the skin, measuring a resistance change depending on a strain of the strain measuring sensor, and comparing the resistive value with a resistance change pattern to output matched data. A data processing method using a strain measurement sensor can be provided.

The method may further include the step of distinguishing the measured resistance value from the first resistance value and the second resistance value based on the reference resistance value.

The data processing system using the strain measuring sensor applied to the body according to the present invention and the data processing method using the strain measuring body according to the present invention can measure the motion of the body using the strain measuring sensor which can be deformed with a small force and has high sensitivity, It can be utilized as a method of transmitting the data of small muscle movements.

1 is a block diagram showing a concept of a data processing system using a strain measuring sensor applied to a body according to the present invention.
2 is a graph showing the concept of patterning resistance values measured according to the present invention.
Fig. 3 is a diagram showing a result of matching with Morse code by applying to eyes and fingers.
4 is a flowchart of a data processing method using a strain measuring sensor applied to a body according to another embodiment of the present invention.
5 is a perspective view of a strain measuring sensor.
6 is a photograph of a crack generated in the second layer of the strain measuring sensor in an enlarged manner.
7 is a photograph showing cracks generated in the second layer of the strain measuring sensor.
8 is a view showing the concept of crack structure and resistance change.
Fig. 9 is a diagram showing the grain size of the second layer.
10 is a graph showing the relationship between the grain size of the second layer, the crack size, the maximum strain and the thickness.
11 is a view showing strain rate-stress of a strain measuring sensor.
12 is a diagram showing a change in resistance when the strain measuring sensor is repeatedly stretched.
Fig. 13 shows the resistance change according to the deformation of the strain measuring sensor.
14 is a view showing the grain size when the second layer is made of different materials.
15 is a flowchart of a method of manufacturing a strain measuring sensor.
16 is a cross-sectional view schematically showing a state in which a strain measuring sensor is manufactured.

Hereinafter, a data processing system using a strain measuring sensor applied to a body according to an embodiment of the present invention and a data processing method using the same will be described in detail with reference to the accompanying drawings. In the following description of the embodiments, the names of the respective components may be referred to as other names in the art. However, if there is a functional similarity and an equivalence thereof, the modified structure can be regarded as an equivalent structure. In addition, reference numerals added to respective components are described for convenience of explanation. However, the contents of the drawings in the drawings in which these symbols are described do not limit the respective components to the ranges within the drawings. Likewise, even if the embodiment in which the structure on the drawing is partially modified is employed, it can be regarded as an equivalent structure if there is functional similarity and uniformity. Further, in view of the level of ordinary skill in the art, if it is recognized as a component to be included, a description thereof will be omitted.

1 is a block diagram showing a concept of a data processing system using a strain measuring sensor 100 applied to a body according to the present invention.

A data processing system using a strain measuring sensor 100 applied to a body according to the present invention includes a plurality of sensor units, a measuring unit 200, a processing unit 300, and an output unit 400, .

Each of the plurality of sensor units is configured to include a strain measuring sensor 100, and the sensor 100 is attached to the body so as to measure the movement of the body. The plurality of sensors 100 are attached to the wearer's body directly attached to the surface of the body or worn on each part of the body, and configured so that the body deforms with movement. Each of the sensors 100 is configured to be able to bend and stretch, and is configured to measure the degree of tension by varying resistance values as it is bent and stretched. The plurality of sensors 100 may be attached to the surface of the body so that the sensor 100 can be deformed even with a small force so that the user does not feel a sense of foreign body when the user's deformation is performed. The sensor 100 is configured to be able to measure both joint-level and face-level movements. Therefore, the facial muscles can be configured to be deformed by the muscles moving with the smallest force. For example, when the eyelids move due to the movement of a part of the facial muscles, the muscles can be deformed to such a degree of motion. On the other hand, the plurality of sensor units can be configured with various sizes and various strengths. In other words, when applied to muscles at the level of the face, it is composed of a smaller and more sensitive sensor 100. Since a force much greater than muscle at the level of the face is applied to parts such as a knee or an elbow, have.

The configuration of the sensor 100 will be described in detail with reference to FIG.

The measuring unit 200 is configured to be able to measure the resistance of the sensor 100 in real time by applying a voltage to each of the plurality of sensors 100. Since the resistance of each of the plurality of sensors 100 is varied by the deformation of each of the plurality of sensors 100, the resistance can be measured. On the other hand, it is constituted to be able to measure resistance by applying electrical energy of different magnitudes according to the size of the sensor 100.

The processing unit 300 is configured to process the continuously measured resistance value and to digitize it. The analog signal generated continuously from the sensor 100 can be digitized. The reference value can be set and divided into resistance values corresponding to the number of reference values +1. At this time, the resistances are divided into a plurality of resistances, and the resistances can be patterned according to the duration and the order of occurrence of the resistances. In addition, the processing unit 300 may be configured to include a look-up table, and a unique data value corresponding to the patterned value of the resistance value in a 1: 1 manner may be stored in the look-up table. For example, it can be an alphabet or MORSE code. The processing of the resistance value will be described in detail with reference to FIGS. 2 and 3. FIG.

The output unit 400 is configured to receive the matched data using the pattern of the resistance change in the processing unit 300 and output the matched data. The output unit 400 may be output with various values recognizable by the user such as time, hearing, etc., and may be output by generating a signal for switching to another visualization or audition. However, since the configuration of the output unit 400 is widely used, a detailed description thereof will be omitted.

2 is a graph showing the concept of patterning resistance values measured according to the present invention.

As shown, resistance values vary continuously in various sizes due to body movements. The resistance value may vary depending on the length of the strain measuring sensor 100. In this case, since the elongation of the human body varies depending on the site, it is preferable to pattern the relative strain of the resistance rather than the absolute resistance value.

2 (a) shows a graph in which the reference resistance value is one, and FIG. 2 (b) shows a graph in which the resistance is distinguished in the case of two reference resistance values.

A graph of the relative resistance strain is displayed according to the value measured in the resistor. When one reference resistance value is determined based on the resistance value, a first resistor value R1 in a high range and a second resistance value R1 in a low range And a resistance value R2. Therefore, the time at which the first resistance value R1 and the second resistance value R2 are respectively maintained can be distinguished. In addition, the data may be varied depending on the holding time of each resistance value and the sequence that occurs sequentially. In addition, when two or more reference resistance values are set, one more interval is added. In the case of FIG. 2 (b), the reference resistance value is composed of a first reference resistance value and a second reference resistance value, The first resistance value R1, the second resistance value R2, and the third resistance value in the highest order. At this time, the resistance value is divided according to the change rate of the resistance value (the ratio of the initial resistance value to the resistance value when the sensor 100 is deformed), but it can also be determined according to the absolute resistance value range.

The processing unit 300 may be configured to analyze a pattern during a predetermined time interval and to convert the pattern into normalized data by re-recognizing the pattern after a predetermined time interval. The processing unit 300 may include a lookup table corresponding to a plurality of patterns .

Fig. 3 is a diagram showing a result of matching with Morse code by applying to eyes and fingers.

As shown in the figure, the look-up table includes a Morse code, and the change of the resistance value due to the motion of the eyes and the hand can be converted into the Morse code by setting the predetermined time interval.

If the resistance value is changed by the eye or the movement of the hand, it is distinguished by the first resistance value R1 and the second resistance value R2, and it is distinguished by Dash and Dot according to the duration time of each resistance value, And then output it to the corresponding alphabet.

At this time, since the strain on the finger is large, the reference resistance value is set near 50%, which is relatively larger than the resistance strain applied to the eyelid 100. In the case of eyelids, the reference resistance value is set near 25% The value R1 and the second resistance value R2 are distinguished from each other. On the other hand, these values are merely examples and can be applied in various values.

In the above example, the resistance value is matched with the Morse code. However, the resistance value may be matched with various data such as binary, ternary, and the like depending on the resistance strain.

4 is a flowchart of a data generation method using a strain measurement sensor applied to a body according to another embodiment of the present invention

As shown in the figure, a data processing method using a strain measuring sensor applied to a body according to the present invention includes a step (S1000) of measuring a strain measurement sensor, a step S2000 of measuring a resistance change, a step S3000 ), A matching step S4000, and an outputting step S5000.

The step of placing the strain measuring sensor (S1000) corresponds to a step of bringing a bending and stretchable strain measuring sensor into close contact with the body so that it can be applied to various parts of the body. The strain measuring sensor may be attached directly to the surface of the body, that is, to the skin, or to a wear part such as a glove, and to the surface of the body. The strain measuring sensor used at this time may be a high sensitivity, high strain measuring sensor using a nano crack, which will be described hereinafter with reference to FIG.

The step of measuring the resistance change (S2000) corresponds to the step of measuring the resistance by applying a voltage to the strain measuring sensor. At this time, the measured resistance can be calculated as a relative change rate based on the initial resistance value.

The step of discriminating the resistance value (S3000) corresponds to the step of setting the reference resistance value, which is an intermediate value, based on the maximum value of the resistance value and the minimum value of the resistance value, do. And may be divided into a first resistance value and a second resistance value based on a reference resistance value. On the other hand, the resistance value at this time can be a resistance change rate in ohms as well as a relative resistance change rate.

In the matching step S4000, if the measured resistance value is divided into the first resistance value and the second resistance value, it corresponds to a step of normalizing and matching the stored resistance value. The data is matched by comparing the stored data with a pattern determined by the order of occurrence of the first resistance value and the second resistance value.

The output step S5000 is a step of outputting matched data.

Hereinafter, a strain measuring sensor according to the present invention will be described in detail.

5 is a perspective view of a strain measuring sensor according to the present invention.

As shown in the figure, the strain measuring sensor 100 according to the present invention may include a first layer 10 and a second layer 20.

The first layer (10) and the second layer (20) are attached to each other and are configured to extend together when measuring the strain rate.

The first layer 10 is composed of a stretchable member so that it can receive an external force from the measurement object and can be constituted by a nonconductive member so as not to electrically affect the resistance change of the second layer 20, .

The second layer 20 is made of a conductive material and has a plurality of cracks 30 having a larger width as the length of the second layer 20 is increased. At this time, a plurality of cracks 30 are formed by attaching the second layer 20 to the first layer 10 and stretching them.

The second layer 20 is configured such that the current flow is not completely blocked even if it is stretched within the strain measurement range. That is, a plurality of cracks 30 are densely packed so as not to be electrically disconnected due to excessive elongation at one portion. On the other hand, an appropriate material can be selected to have such a characteristic, and it can be composed of a material having excellent conductivity and ductility such as gold, silver and platinum. In the present embodiment, platinum is included.

The plurality of cracks 30 are formed with a direction substantially perpendicular to the direction in which the length of the second layer 20 is elongated. Accordingly, as the width of the cracks 30 increases, the contact area decreases. Therefore, the effective cross-sectional area for determining the size of the resistance decreases and the self-resistance increases. On the contrary, the width of the cracks 30 decreases and the contact area becomes wider when returning to the original length. Therefore, the effective cross-sectional area increases and the self-resistance decreases.

The function, function and formation process of the crack 30 will be described in detail later.

The first layer 10 may be fixedly mounted on a strain measurement object. The first layer 10 is stretched depending on the length of the object to be measured. At this time, the resistance value of the second layer 20 attached to the first layer 10 may be increased and the external device may be connected to both sides of the second layer 20 to measure the resistance change .

Referring to FIG. 5 again, the second layer 20 may be attached to the first layer 10 at a predetermined distance from a point where an external force acts. Therefore, stress concentration, partial breakage, and the like that may be generated in the second layer 20 due to the action of external force can be prevented.

Also, the second layer 20 may be attached to the first layer 10 at a predetermined distance from the edge of the first layer 10. When the first layer 10 is cut, the cut surface can be roughened, and when the second layer 20 is adhered to a rough edge, it is possible to exhibit proper performance due to stress concentration or the like.

Hereinafter, the function and operation of the strain measuring sensor 100 will be described in detail with reference to FIGS.

6 is an enlarged photograph of the crack 30 generated in the second layer 20 according to the present invention.

6 (a) shows a state when the strain measuring sensor 100 is stretched by 20% in length, and FIG. 6 (b) shows a strain when the strain measuring sensor 100 is stretched by 50% have. The length of the scale bar on the upper right side is 5 μm.

A plurality of cracks 30 as shown in the second layer 20 are uniformly distributed. The cracks 30 are formed in a direction substantially perpendicular to the direction in which the second layer 20 is stretched. As described above, the crack 30 is configured such that the resistance is increased by decreasing the contact area by increasing the width in the direction in which the second layer 20 is elongated during extension, and reducing the resistance by decreasing the width Lt; / RTI >

The cracks 30 are formed in a direction transverse to one side of the second layer 20, but are formed so as not to break the second layer 20. Therefore, even if the width of the crack 30 is widened, the current flowing through the second layer 20 is not completely blocked by any one of the cracks 30. A plurality of cracks 30 having a length shorter than the width of the second layer 20 are formed so that a current can pass through a portion where the crack 30 is not formed even if the second layer 20 is elongated.

FIG. 7 is a photograph of cracks 30 generated in the second layer 20 according to the present invention, and shows a state when the length is 20% elongated.

7A shows a width of the crack 30 formed on the second layer 20 in an inadequately wider form and FIG. 7B shows a width of the crack 30 formed on the second layer 20 Are formed appropriately and are formed in a uniform and dense manner.

When the width of the crack 30 is inadequately large as shown in FIG. 7 (a), the crack 30 is partially broken by one of the cracks 30. The flow of the current is cut off due to the partial rupture, and the resistance of the second layer 20, which is measured in spite of the small deformation within 5% as a whole, sharply increases. This means that if the measurement range exceeds 5% of strain, the measurement becomes impossible.

On the other hand, when the crack 30 is denser than that shown in FIG. 7 (a) as shown in FIG. 7 (b), the width of a larger number of cracks 30 is uniformly increased in spite of the same elongation (20% Various paths can be formed between the crack 30 and the crack 30 on the two layers 20 so that the current can flow stably.

The width and the density of the cracks 30 may be varied depending on the elongation of the object to be measured. For example, when the width of the crack 30 is 50 nm or more when the maximum elongation is 50% and the width of the crack 30 is elongated to the maximum strain, a rapid change in resistance occurs within the strain measurement range, which makes precise measurement difficult . Therefore, in such a case, the crack 30 preferably has a width of 50 nm or less.

8 is a view showing the concept of crack structure and resistance change. As shown, the cracks occurring on the second layer can be divided into cracks and islands, cracks are spaces between the grains, and islands are connected even if the cracks are wider .

Where R is the total resistance, and R1, R2, and Rc are the resistance of the island, the resistance between two adjacent islands, and the resistance between two adjacent cracks.

이므로, 전체 저항은 다음과 같이 나타낼 수 있다.At this time

Therefore, the total resistance can be expressed as follows.

Therefore, from the experimental results, when the elongation at 50% is obtained, R1 is about 4.94 kΩ and R2 is 2.96 kΩ /% strain (%).

Hereinafter, the size of cracks and grains (1) of the high strain rate measurement sensor 100 according to the present invention will be described in detail with reference to FIGS. 9 and 10. FIG.

9 is a view showing the size of the grain 1 of the second layer 20. 9 shows a case where cracks 30 were generated by stretching the first layer 10 to a length of 50% after the second layer 20 was formed by using platinum to have different grain sizes The appearance of the time is shown.

As shown in FIG. 3, as the size of the grain 1 increases, the size of the crack 30 generated even when the grain 1 has the same strain is different. Here, the size of the crack 30 refers to the width of the generated crack 30, and the generation position of the crack 30 is randomly generated uniformly in the entire region. At this time, the density of cracks 30 defined by the number of cracks 30 generated per unit length varies depending on the size of the grain 1. At this time, the width of each of the plurality of cracks 30 generated microscopically corresponding to the stretched length of the second layer 20 is widened. Therefore, when the density of the cracks 30 is low, that is, when the number of the cracks 30 is small, the width of the cracks 30 is widened to be stretched to the same length. On the contrary, when the number of cracks 30 is large, The width of the crack 30 can be reduced. The crack 30 generated at the initial tensioning in the second layer 20 occurs from the joint portion between the grain 1 and the grain 1 so that the density of the crack 30 is closely related to the size of the grain 1 . The larger the size of the grain (1), the lower the density of the crack (30). On the other hand, from the viewpoint of one crack 30, the width of one crack 30 must be within a predetermined range according to the elongation. If the density of the crack (30) is more than 1 * 10 ⁷ / m, the entire elongated length of the strain measuring sensor except the island is divided and occupied by each crack, and the width of one crack (30) ^-8 m or less.

Figs. 9A, 9B and 9C show the case where the size of the grain 1 is 2 nm or less, 13 nm or less, 30 nm or less, and the scale bar is 400 nm. As the size of the grain (1) increases, the grains 1 can be visually recognized from the acquired image, the number of cracks 30 is reduced, the density of the cracks 30 is lowered, and the width of the cracks 30 increases Able to know.

10 is a graph showing the relationship between the size of the grain 1 of the second layer 20, the size of the crack 30, the maximum strain, and the thickness.

10 (a), as the size of the grain (1) increases, the density of the crack (30) tends to sharply decrease when the initial size of the grain (1) is increased to 5 nm and the width of the crack Can be confirmed.

Referring to FIG. 10 (b), the maximum measurable tensile rate according to the size of the grain (1) is shown, and the range in which the high strain rate of 100% or more can be measured is confirmed to be the case where the grain (1) size is 2 nm to 13 nm. The measurable range is a range in which the width of each crack 30 gradually increases as the strain measuring sensor 100 is stretched to change the length of the strain measuring sensor 100, It becomes possible. The thickness of the second layer 20 may be adjusted by adjusting the thickness of the second layer 20 in relation to the thickness control described later. In this case, there is no meaningful conductivity and measurement is impossible. When the size of the grain (1) becomes larger than a predetermined size, a significant resistance difference occurs. In this case, the change in resistance with a change in length becomes a meaningful value from about 2 nm or more.

10 (c), the size of the grain 1 can be adjusted by controlling the thickness of the second layer 20 when the second layer 20 is deposited on the first layer 10 by sputtering, ), A second section in which the size of the grain (1) increases sharply from the thickness of 10 nm or more, and a section of the grain (1) in which the variation of the grain . A single grain 1 is adhered and grown on the first layer 10 in the thickness direction while the size of the grain 1 is increased in the first section by sputtering. In the second section, several to several grains (1) are laminated and the inter-atomic connections are rearranged through sputtering and the crane grows abruptly. In the third section, the grain 1 whose size gradually increases is stacked by hundreds or more in the thickness direction.

Referring again to FIG. 10 (b), the size of the grain 1 of the second layer 20 can be selected according to the elongation. When a measurement range of 50% elongation is required, the size of the grain 1 is about 2 to 25 nm And the thickness of the second layer 20 may be about 75 nm or less. Also, when a high strain range of 100% elongation is required, the grain 1 size is determined to be about 3 to 13 nm, and the maximum thickness of the second layer 20 may be about 25 nm.

That is, the thickness of the second layer 20 can be adjusted according to the measurement range of the strain measuring sensor 100 to determine the size of the grain 1.

11 is a graph showing a strain-stress graph of the strain measuring sensor 100 according to the present invention. Data obtained by repeatedly stretching the strain measuring sensor 100 at a strain of 50% is shown and displayed in a different color depending on the number of stretching times.

As shown in the figure, the data at the first extension is slightly different from the data at the next extension. In this case, the first elongation is the data stretched before the crack 30 is formed in the second layer 20, and the second layer 20 A plurality of cracks 30 described above are generated, and the first layer 10 is micro-deformed.

However, in the subsequent repeated use, a certain stress is applied according to the deformation as shown in the figure, and data is converged as it is repeatedly used.

As described above, in order to improve reliability, the strain measuring sensor 100 according to the present invention must be primarily elongated to generate a uniform crack 30. The cracks 30 may not be formed and the first layer 10 and the second layer 20 may be stretched so as to generate a crack 30 immediately before use.

12 is a diagram showing a change in resistance upon repeated stretching of the strain measuring sensor 100 according to the present invention.

As shown, when the strain measuring sensor 100 is repeated at an elongation of 50%, a change in resistance may occur by about 15 times. That is, even if a distortion of 10% occurs, the resistance can be operated very sensitively because a difference of three times or more occurs.

A strain gauge factor (GF = (resistance change amount / initial resistance) / strain) is a typical representative factor for the sensitivity of the strain measuring sensor 100. The GF of the strain measuring sensor 100 according to the present invention Value can have a value of 20 to 40, so that the conventional metal gauge has a GF of about 2 when measuring a strain of 5% or less and a tensile strain of 10 times or more higher than that of a conventional strainable strain measuring sensor 100 of about 0.8 GF. ≪ / RTI > Therefore, it is possible to measure strain very sensitively and it is possible to measure deformation by external force which is changed by 0.01 N unit.

Also, even when the sensor is repeatedly used, the resistance value of the strain measuring sensor 100 according to the strain rate is constantly changed, thereby ensuring reliability.

FIG. 13 shows the resistance change according to the strain of the strain measuring sensor 100 according to the present invention.

As shown in the figure, the resistance of the strain measuring sensor 100 increases linearly up to 50%, and the resistance of the strain measuring sensor 100 linearly increases The experimental result data are shown.

Since a plurality of cracks 30 formed in the second layer 20 are densely packed to prevent a rapid change in resistance and linearly vary the resistance according to the elongation of the length, It is easy to calculate the strain according to the relative change of resistance. In addition, resistance changes due to deformation rapidly occur, and small overshoot and small recovery time occur during the spin.

14 is a view showing the size of the grain 1 when the first layer 10 is made of different materials and the size of the grain 1 when the second layer 20 is made of different materials.

FIG. 14 shows an SEM image when the first layer 10 and the second layer 20 are made of different materials. Unlike FIG. 9, the scale bar is 10 .mu.m. As shown in the figure, the size of the grain (1) differs for each material. Unlike the above-described embodiment, a relatively large grain 1 is generated, and a very large and low density crack 30 is generated The measurement range becomes very narrow. Therefore, the thickness of the second layer 20 can be set differently depending on the material to adjust the size of the grain 1.

15 is a flowchart of a method of manufacturing a strain measuring sensor 100 according to the present invention.

As shown, the strain measuring sensor 100 according to the present invention includes a step S100 of generating a first layer, a step S200 of determining a thickness of a second layer, a step S300 of generating a second layer, And generating a crack 30 (S400).

A process of attaching and removing a mask for determining an area to which the second layer 20 is to be attached when generating the second layer 20 may be included.

The step of creating the first layer (SlOO) may be a nonconductive, stretchable member produced by a spin coating method. The polyurethane solution is dropped on the rotating slide glass to form the first layer 10 in the form of a thin film by rotation. At this time, the first layer may be formed to 200 μm or less.

A mask for determining the generation region may be attached so as to be spaced apart from the edge of the first layer 10 by a predetermined distance in order to prevent stress concentration of the second layer 20 as described above. The mask is selectively penetrated through only the area to which the second layer 20 is attached so that the second layer 20 can be selectively formed on the first layer 10.

In the step S200 of determining the thickness of the second layer, the density of nano cracks varies depending on the size of the grain 1. As a result, the range of measurable stretchability varies. Therefore, the maximum measurement range is determined, . ≪ / RTI >

The step of forming a second layer (S300) attaches the conductive second layer (20) to one surface of the first layer (10). As an example, a second layer 20 is formed using a sputtering process, wherein the sputtering may be performed for 10 to 20 mA for 200 to 300 seconds using a platinum target. And is suitable for the production of the strain measuring sensor 100 which can be measured within an elongation of 60% when the sputtering is carried out at 15 mA for 240 seconds. On the other hand, such sputtering is an example, and various processes can be adopted depending on the measurement range to be measured, and the time and current applied to sputtering can be variously applied. Meanwhile, it is possible to further include a step of adjusting the pressure and temperature to adjust the size of the grain (1) of the second layer (20).

After the second layer 20 is formed, the mask is removed.

In step S400 of generating a crack, a uniform tensile force is applied to the entire area of the second layer 20 by stretching the first layer 10 to generate a plurality of cracks 30 in a uniform distribution.

At this time, the length that is elongated when the crack 30 is generated can be extended by applying the maximum strain rate to be measured by the strain measuring sensor 100. For example, when a strain measuring sensor 100 having a measurement range of 50% or less is to be manufactured, the first layer 10 is stretched 50% to generate a plurality of cracks 30 on the second layer 20. Data on the strain rate due to repeated use can be shown in FIG.

FIG. 16 is a cross-sectional view schematically showing a strain measuring sensor 100 according to the present invention.

As shown, a first layer is formed (a), a mask is attached to the generated first layer (b), and a second layer 20 is formed using sputtering (c). Then, the mask is removed (d), and the first layer 10 is stretched to generate a uniform crack 30 in the second layer 20 (e).

As described above, the data processing system using the strain measuring sensor applied to the body according to the present invention and the data processing method using the same can measure the motion of the body using the strain measuring sensor which can be deformed with a small force and has a high sensitivity. Therefore, it can be utilized as a method that can transmit a simple and small muscle movement data.

While the present invention has been described in connection with what is presently considered to be practical exemplary embodiments, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, . Therefore, it should be understood that the above-described embodiments are illustrative in all aspects and not restrictive. The scope of the present invention is defined by the appended claims rather than the detailed description and all changes or modifications derived from the meaning and scope of the claims and their equivalents are to be construed as being included within the scope of the present invention do.

10: First layer
20: Second layer
30: crack
100:
200:
300:
400: Output section
S1000: Positioning the strain measuring sensor on the body
S2000: Steps to measure resistance change
S3000: distinguishing between the first resistance value and the second resistance value
S4000: matching step
S5000: Output stage

Claims (17)

A strain measuring sensor configured to increase the resistance by being stretched together as the skin is tightened against the skin;
A measuring unit configured to measure a resistance of the strain measuring sensor; And
And a processing unit for receiving a resistance value from the measuring unit and comparing the pattern of resistance change and outputting matched data, wherein the processing unit includes a lookup table in which data on a plurality of patterns whose resistance is changed is stored, Data processing system using measurement sensor. The method according to claim 1,
Wherein,
Setting a reference resistance value of the resistance value of the sensor,
Up table is divided into a first resistance value when the measured resistance value is equal to or greater than the reference resistance value and a second resistance value when the measured resistance value is less than the reference resistance value and is matched with the stored data in the look- Data processing system using measurement sensor. 3. The method of claim 2,
Wherein,
Up table and the data stored in the look-up table are matched with patterns of the first resistance value and the second resistance value for a predetermined unit time, system. The method of claim 3,
The strain measuring sensor is in close contact with the skin where deformation occurs due to the movement of muscles,
Wherein the processing unit sets a reference resistance value based on a maximum value and a minimum value of resistance when the skin is relaxed and shrunk according to the degree of deformation of the skin. 5. The method of claim 4,
Wherein,
Wherein the look-up table includes alphabets corresponding to the pattern of resistance change in a ratio of 1: 1. 5. The method of claim 4,
Wherein,
Wherein the lookup table includes a pattern of the resistance change by using a morse code that is distinguished according to the holding time and the order of occurrence so as to match the pattern of the resistance change. The method according to claim 1,
The strain measuring sensor includes:
And a resistance change depending on a motion of the finger or the eyelid is attached to the finger or the eyelid. The method according to claim 1,
The strain measuring sensor includes:
A first layer of nonconductive, stretchable material; And
The present invention is applicable to a body including a second layer formed of a conductive metal on the first layer and having a grain size within a predetermined range according to a measurement range and having a density of cracks generated in extension within a predetermined range A data processing system using a strain measuring sensor. 9. The method of claim 8,
Wherein the second layer is generated by depositing on the first layer and is generated while the grain size is increased on the first layer. 10. The method of claim 9,
Wherein the second layer is generated by adjusting the thickness of the layer deposited on the first layer so that the grain size is within a predetermined range and the density of the crack is within a predetermined range. Data processing system using sensors. 10. The method of claim 9,
Wherein the grain size is 15 nm or less when the elongation percentage is 100%. 12. The method of claim 11,
Wherein the thickness of the second layer is less than 25 nm so that the grain size may be less than 13 nm. 10. The method of claim 9,
Wherein the density of the cracks is 1 * 0 ^-7 m / piece or more. 14. The method of claim 13,
Wherein the second layer is made of platinum. ≪ RTI ID = 0.0 > 11. < / RTI > 9. The method of claim 8,
Wherein the second layer is deposited using sputtering. ≪ RTI ID = 0.0 > 8. < / RTI > Placing a strain measurement sensor on the skin;
Measuring a resistance change depending on a strain of the strain measuring sensor; And
A data processing method using a strain measuring sensor applied to a body that receives a resistance value and compares a pattern of resistance change and outputs matched data. 17. The method of claim 16,
Further comprising the step of distinguishing the measured resistance value by a first resistance value and a second resistance value with reference to a reference resistance value.

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