KR20180084319A - 태양전지패널 표면 오염측정장치 및 오염을 측정하는 태양전지패널 - Google Patents

태양전지패널 표면 오염측정장치 및 오염을 측정하는 태양전지패널 Download PDF

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Publication number
KR20180084319A
KR20180084319A KR1020170007243A KR20170007243A KR20180084319A KR 20180084319 A KR20180084319 A KR 20180084319A KR 1020170007243 A KR1020170007243 A KR 1020170007243A KR 20170007243 A KR20170007243 A KR 20170007243A KR 20180084319 A KR20180084319 A KR 20180084319A
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KR
South Korea
Prior art keywords
contamination
measuring
solar
light
solar cell
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KR1020170007243A
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English (en)
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KR101912708B1 (ko
Inventor
박기철
신석호
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경상대학교산학협력단
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Priority to KR1020170007243A priority Critical patent/KR101912708B1/ko
Publication of KR20180084319A publication Critical patent/KR20180084319A/ko
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Publication of KR101912708B1 publication Critical patent/KR101912708B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H01L31/042—PV modules or arrays of single PV cells
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S40/00—Components or accessories in combination with PV modules, not provided for in groups H02S10/00 - H02S30/00
    • H02S40/20—Optical components
    • H02S40/22—Light-reflecting or light-concentrating means
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/446—Photodiode
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y02E10/52—PV systems with concentrators

Abstract

본 발명은 태양전지패널 표면 오염측정장치에 관한 것으로, 베이스와, 베이스 상면의 일단에 위치하여 빛을 출력하는 발광소자와, 베이스 상면의 타단에 위치하는 수광소자와, 베이스 상면에 배치되고, 출력된 빛을 수광소자로 반사하는 반사체와, 수광소자에 센싱되는 빛의 양을 기초로 오염도를 판단하는 프로세서를 포함한다.
KR1020170007243A 2017-01-16 2017-01-16 태양전지패널 표면 오염측정장치 및 오염을 측정하는 태양전지패널 KR101912708B1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020170007243A KR101912708B1 (ko) 2017-01-16 2017-01-16 태양전지패널 표면 오염측정장치 및 오염을 측정하는 태양전지패널

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020170007243A KR101912708B1 (ko) 2017-01-16 2017-01-16 태양전지패널 표면 오염측정장치 및 오염을 측정하는 태양전지패널

Publications (2)

Publication Number Publication Date
KR20180084319A true KR20180084319A (ko) 2018-07-25
KR101912708B1 KR101912708B1 (ko) 2018-10-29

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KR (1) KR101912708B1 (ko)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113866135A (zh) * 2021-09-24 2021-12-31 深圳市华腾半导体设备有限公司 污染检测方法、分光检测方法、分光管理方法及系统
JP7078945B1 (ja) * 2022-02-02 2022-06-01 イシイ工業株式会社 太陽光発電パネル発電効率低下抑制システムおよび太陽光発電パネル発電効率低下抑制方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113866135A (zh) * 2021-09-24 2021-12-31 深圳市华腾半导体设备有限公司 污染检测方法、分光检测方法、分光管理方法及系统
JP7078945B1 (ja) * 2022-02-02 2022-06-01 イシイ工業株式会社 太陽光発電パネル発電効率低下抑制システムおよび太陽光発電パネル発電効率低下抑制方法

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Publication number Publication date
KR101912708B1 (ko) 2018-10-29

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