KR20180080856A - Test device of submodule in a power compensator and testing method thereof - Google Patents

Abstract

A submodule test device of a power compensating apparatus can test a submodule in an assembled state. The submodule test device of the power compensating apparatus includes a power supply connected to first and second output terminals to generate a voltage to be supplied to the submodule; a sensing unit connected to first and second conductor terminals to sense a charging time and a discharging time of a capacitor element; and first measuring equipment connected to the sensing unit to determine the capacitance of the capacitor element based on the charging time of the capacitor element.

Description

Technical Field [0001] The present invention relates to a submodule test apparatus and a method of testing a submodule,

The present invention relates to a submodule test apparatus and a test method of a power compensation apparatus.

As the industry develops and the population grows, demand for power surges, but there is a limit to the production of electricity.

Accordingly, a power system for supplying power generated from a production site to a demand site stably without loss has become increasingly important.

There is a need for an FACTS (Flexible AC Transmission System) facility for improving power flow, grid voltage, and stability. The STATCOM (STATic synchronous COMpensator) facility, a type of power compensation device called third generation of FACTS facilities, is fed in parallel to the power system to compensate for reactive power and active power required in the power system.

Figure 1 shows a general power system.

1, a general power system 1 may include a power generating source 2, a power system 3, a load 4, and a plurality of power compensating apparatuses 5.

The power generation source 2 means a place or facility for generating electric power, and can be understood as a producer that generates electric power.

The power system 3 may refer to any equipment including a power line, a pylon, a lightning arrester, an insulator, and the like, for transmitting electric power generated in the electric power generating source 2 to the load 4.

The load 4 means a place or facility that consumes the power generated in the power generating source 2, and can be understood as a consumer consuming electric power.

The power compensation device 5 may be a device that is associated with the power system 3 and compensates for the active power or the reactive power according to supply or lack of active power or reactive power among the power flowing to the power system 3 .

The power compensation device 5 is a trend of increasing STATCOM equipment of the type of a MMC (Modular Multilevel Converter). The STATCOM of the multilevel converter type is composed of a plurality of submodules. These submodules consist of various internal devices and it is difficult to test them in the assembled state.

The present invention is directed to solving the above-mentioned problems and other problems.

Another object of the present invention is to provide a submodule testing apparatus and method of a power compensation apparatus that can be tested even after a submodule is assembled.

According to an aspect of the present invention to achieve the above or other objects, a submodule test apparatus of a power compensation apparatus can test a submodule after assembly is completed. Submodule includes first to fourth switching elements connected to first to fourth nodes, first to fourth diodes connected in parallel to the first to fourth switching elements, first to fourth switching elements A first to a fourth gate driver for generating a gate signal for switching the first to fourth switching elements, a resistive element connected to the first to fourth switching elements, a self-power supply connected to the first to fourth switching elements, And a capacitor element connected to the first to fourth switching elements. The capacitor pack has one side connected to a different one of the first through fourth nodes in the power pack, First and second output terminals provided to be exposed to the outside of the power pack, and first and second output terminals each having one side connected to the other one of the first to fourth nodes in the power pack Is connected to a de comprises a first and a second capacitor terminal to be installed in the first and the second conductors are respectively connected to the other side and both sides of the capacitor element.

A sub-module testing device of the power compensation device includes a power supply connected to the first and second output terminals to generate a voltage for supplying to the sub-module; A sensing unit connected to the first and second conductor terminals for sensing a charging time and a discharging time of the capacitor device; And measurement equipment connected to the sensing unit for determining the capacitance of the capacitor based on the charging time of the capacitor.

According to another aspect of the present invention, a submodule testing method of a power compensation apparatus includes: generating a voltage for supplying to the first and second output terminals of a submodule; Sensing a charging time and a discharging time of the capacitor element by being connected to the first and second conductor terminals; And determining a capacitance of the capacitor element.

Effects of the sub-module test apparatus and the test method of the power compensation apparatus according to the present invention will be described as follows.

According to at least one of the embodiments of the present invention, the first and second output terminals, a portion of the first and second conductors, and the first and second capacitor terminals may be exposed to the outside. Accordingly, the test apparatus can be easily connected to the first and second output terminals and / or the first and second capacitor terminals during the test, thereby testing the sub-module.

According to at least one of the embodiments of the present invention, it is possible to easily determine whether or not the various devices installed in the submodule, that is, the capacitor device, the resistance device, each switching device, each diode, each gate driver, and self- You can test. Thus, the present invention has the advantage of solving the conventional problems that were difficult to test after being assembled into sub-module products.

Further scope of applicability of the present invention will become apparent from the following detailed description. It should be understood, however, that the detailed description and specific examples, such as the preferred embodiments of the invention, are given by way of illustration only, since various changes and modifications within the spirit and scope of the invention will become apparent to those skilled in the art.

Figure 1 shows a general power system.
2 is a diagram illustrating a power conversion unit of a STATCOM based on a Modular Multilevel Converter (MMC) according to the present invention.
3 is a perspective view illustrating a submodule according to an embodiment of the present invention.
4 is a circuit diagram of a submodule according to an embodiment of the present invention.
5 is a diagram illustrating an MMC sub-module testing apparatus according to the first embodiment of the present invention.
6 is a flowchart illustrating a method of testing an MMC sub-module according to the first embodiment of the present invention.
7 is a flowchart illustrating a method of testing an MMC sub-module according to a second embodiment of the present invention.
FIG. 8 is a block diagram illustrating an MMC sub-module testing apparatus according to a third embodiment of the present invention.
FIG. 9 is a flowchart illustrating a method of testing an MMC sub-module according to a third embodiment of the present invention.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings, wherein like reference numerals are used to designate identical or similar elements, and redundant description thereof will be omitted. The suffix "module" and " part "for the components used in the following description are given or mixed in consideration of ease of specification, and do not have their own meaning or role. In the following description of the embodiments of the present invention, a detailed description of related arts will be omitted when it is determined that the gist of the embodiments disclosed herein may be blurred. It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory and are intended to provide further explanation of the invention as claimed. , ≪ / RTI > equivalents, and alternatives.

2 is a diagram illustrating a power conversion unit of a STATCOM based on a Modular Multilevel Converter (MMC) according to the present invention.

 As shown in FIG. 2, the power converter 10 of the MMC-based STATCOM may include a plurality of sub-modules 11 serially connected to each phase. Active power or reactive power may be supplied to the power system or active power or reactive power may be absorbed from the power system by the operation of the plurality of sub modules 11. [

Although Fig. 2 shows the Y-shaped power conversion section 10, a? -Type power conversion section can also be adopted in the present invention.

The plurality of sub-modules 11 provided in each phase may be defined as one valve, but the present invention is not limited thereto.

FIG. 3 is a perspective view illustrating a submodule according to an embodiment of the present invention, and FIG. 4 is a circuit diagram of a submodule according to an embodiment of the present invention.

Referring to FIG. 3, the sub-module 11 according to an embodiment of the present invention may include a power pack 13 and a capacitor pack 55.

The capacitor pack 55 may include a housing and a capacitor element 56 disposed within the housing. The capacitor element 56 stores the energy (power) input to the submodule 11, and this energy can be used as a power source for driving various devices installed in the submodule 11, .

Since the capacitor element 56 is insulated from the outside, the housing may be formed of an insulating material, but the present invention is not limited thereto.

The first and second output terminals 57 and 59 may be installed on one side of the power pack 13 so as to protrude to the outside.

The first and second output terminals 57 and 59 may be formed of a conductive material having excellent electrical conductivity.

The active power or the reactive power absorbed from the power system through the first and second output terminals 57 and 59 may be input or the energy charged in the capacitor element 56 may be output to the power system as active power or reactive power .

Thus, the first and second output terminals 57 and 59 may be referred to as first and second input terminals in other words.

The power pack 13 and the capacitor pack 55 are fastened using the first and second conductors 60 and 62 and the first and second capacitor terminals 60 and 62 are connected to the first and second conductors 60 and 62, 63 and 65 are fastened.

The first and second conductors 60 and 62 may be formed of a conductive material having an excellent electrical conductivity. The first and second conductors 60 and 62 may be formed of the same or different materials as the first and second output terminals 57 and 59.

The power pack 13 may include a housing and a plurality of devices installed in the housing.

That is, the housing of the power pack 13 may include, for example, a switching module 15, a resistance element 49, a self power supply (SPS) 51 and an interface (SMI: SubModule Interface 53) .

Each of the first and second conductors 60 and 62 may extend into the power pack 13 to form a first node 22 and a fourth node 28.

The switching module 15, the resistance element 49, the self-power supply 51, and the like provided in the housing of the power pack 13 may be electrically connected between the first node 22 and the fourth node 28. That is, one side of each of the switching module 15, the resistance element 49, and the self power supply 51 may be connected to the first node 22 and the other side may be connected to the fourth node 28.

The switching module 15 may include first through fourth switching modules 17, 19, 21, and 23.

Each of the switching modules 17, 19, 21 and 23 includes switching elements 25, 27, 29 and 31, diodes 33, 35, 37 and 39 and gate drivers 41, 43, 45 and 47 .

That is, the first switching module 17 may include a first switching device 25, a first diode 33, and a first gate driver 41. The second switching module 19 may include a second switching device 27, a second diode 35 and a second gate driver 43. The third switching module 21 may include a third switching device 29, a third diode 37, and a third gate driver 45. The fourth switching module 23 may include a fourth switching device 31, a fourth diode 39, and a fourth gate driver 47.

Each of the first to fourth switching devices 25, 27, 29 and 31 can be switched and controlled by a gate signal provided at the interface 53. [ For example, each of the first to fourth switching devices 25, 27, 29, 31 may be turned off in response to a low level gate signal and turned on in response to a high level gate signal.

Each of the first to fourth switching devices 25, 27, 29, and 31 may include an IGBT (Insulated Gate Bipolar Transistor) device, but the invention is not limited thereto.

That is, the first switching device 25 is the first IGBT, the second switching device 27 is the second IGBT, the third switching device 29 is the third IGBT, and the fourth switching device 31 is the 4 IGBTs.

In this case, the first IGBT may include a gate terminal to which the output terminal of the first gate driver 41 is connected, a collector terminal to be connected to the first node 22, and an emitter terminal to be connected to the second node 24 have. The first diode 33 may be connected between the collector terminal and the emitter terminal of the first IGBT in parallel with the first IGBT.

The second IGBT may include a gate terminal coupled to the output of the second gate driver 43, a collector terminal coupled to the first node 22, and an emitter terminal coupled to the third node 26. The second diode 35 may be connected between the collector terminal and the emitter terminal of the second IGBT in parallel with the second IGBT.

The third IGBT may include a gate terminal coupled to the output of the third gate driver 45, a collector terminal coupled to the second node 24, and an emitter terminal coupled to the fourth node 28. The third diode 37 may be connected between the collector terminal and the emitter terminal of the third IGBT in parallel with the third IGBT.

The fourth IGBT may include a gate terminal connected to the output terminal of the fourth gate driver 47, a collector terminal connected to the third node 26, and an emitter terminal connected to the fourth node 28. The fourth diode 39 may be connected between the collector terminal and the emitter terminal of the fourth IGBT in parallel with the fourth IGBT.

In such a connection structure, when the first IGBT is turned on, both the forward current and the reverse current can flow through the IGBT. When the first IGBT is turned off, the forward current flows through the first diode 33, but the reverse current can not flow through the first diode 33. [

Here, the forward current can be drawn to the first output terminal 57 and the current can be drawn to the second output terminal. The current in the reverse direction can be drawn to the second output terminal 59 and the current can be drawn to the first output terminal 57. [

As another IGBT is also turned on or turned off, a forward current or a reverse current may flow or be shut off, but a detailed description thereof can be easily understood from the description of the turn-on / turn-off of the first IGBT above, Is omitted.

In the present invention, the AC power is converted into the DC power and the DC power is converted into the AC power by the operation of the first to fourth switching modules 17, 19, 21, 23 of each of the plurality of sub modules 11 thus configured .

For example, the alternating current power input to the first and second output terminals 57 and 59 is controlled by the operation of the first to fourth switching modules 17, 19, 21, and 23 of each of the plurality of sub modules 11, And can be converted into electric power and charged to the capacitor element 56. The DC power charged in the capacitor element 56 is converted into AC power by the operation of the first to fourth switching modules 17, 19, 21, 23 of each of the plurality of submodules 11, Can be supplied.

The capacitor element 56 may be installed in the housing of the capacitor pack 55. Specifically, one side of the capacitor element 56 is connected to the first conductor 60 (or the first node 22) and the other side of the capacitor element 56 is connected to the second conductor 62 (or the fourth node 28). The capacitor element 56 is connected to the first and second output terminals 57 and 59 so that the power converted by the first to fourth switching modules 17, 19, 21 and 23 of the sub- .

The resistor element 49 is installed in the housing of the power pack 13, but may be connected in parallel with the capacitor element 56. That is, the resistor element 49 may also be connected at one side to the first conductor 60 (or the first node 22) and the other side to the second conductor 62 (or the fourth node 28) .

When a voltage is applied to the first and second output terminals 57 and 59 in the state where there is no initially charged voltage in the capacitor element 56, an overcurrent occurs. The resistor element 49 stabilizes the overcurrent so that the capacitor element 56 can be stably charged. In addition, the resistor element 49 has a discharging function, and it is possible to discharge the voltage charged in the capacitor element 56 during operation of the sub-module 11 or during operation stoppage.

The self power supply 51 can drive the interface 53 and the respective switching modules 17, 19, 21 and 23 by using the voltage as a supply source when the capacitor element 56 is charged with a constant voltage. For example, when the capacitor element 56 is charged with a voltage of at least 1400 V, the self power supply 51 generates and supplies 24 V of power to the interface 53 and the respective switching modules 17, 19, 21 and 23 , The interface 53 and the respective switching modules 17, 19, 21, and 23 can be driven by this power supply.

The above 1400V and 24V are only examples, and the present invention is not limited thereto.

To this end, although not shown, first and second power lines may be provided between the first and second outputs of the self-power supply 51 and the first and second inputs of the interface 53. The first and second power supply lines are connectable to the first and second output terminals of the self-power supply 51.

Thus, when the first and second power supply lines are coupled to the first and second output ends of the self-power supply 51, the first and second power supply lines are connected to the first and second output ends of the self- And can be electrically connected.

When the first and second power supply lines are decoupled from the first and second output terminals of the self power supply 51, the first and second power supply lines are electrically connected to the first and second output terminals of the self power supply 51 Lt; / RTI >

As will be described later, instead of disassociating the first and second power lines with the first and second outputs of the self-power supply 51, a second measuring instrument (85 of Fig. 9) May be connected to the first and second output terminals of the self power supply 51. [ The second measuring instrument (see 85 in FIG. 9) may include a variable resistor for adjusting the current flowing in the self-power supply 51 and may be connected to the self-power supply 51 based on information obtained from the self- And the like can be tested.

The interface 53 can manage and / or control all the devices installed in the sub-module 11 as a whole.

For example, when the interface 53 is driven by the supply power supplied from the self power supply 51, a gate signal for controlling each switching control module can be generated based on the set value supplied from the host controller. The switching elements 25, 27, 29, and 31 included in the respective switching modules 17, 19, 21, and 23 may be turned on / off in response to the gate signal.

The interface 53 communicates with each switching module 17, 19, 21, 23, the capacitor element 56, the resistance element 49 and the self-power supply 51, The status information of each of the device 49 and the self power supply 51 can be provided.

The interface 53 determines whether the sub module 11 has failed or not based on the various states of the information. If the sub module 11 is determined to have failed, the interface 53 controls the Bypass Switch 61 So that the bypass switch 61 is made conductive and the corresponding sub module 11 is not used.

The interface 53 may adjust the gate signal to be supplied to each of the switching modules 17, 19, 21, and 23 based on such state information and an instruction value provided from the host controller, but the present invention is not limited thereto.

All of the above-described devices are rated according to their specifications. Thus, each type of apparatus must be operated according to a predetermined rating standard, so that the function as a submodule of the power compensation apparatus can be smoothly performed.

Therefore, post test for the submodule 11 assembled with various devices is very important.

However, in the related art, since there are no terminals for connecting the test apparatuses in the sub-module 11 assembled with various apparatuses, it was impossible to test these various apparatuses.

In the present invention, the first and second output terminals 57 and 59, a part of the first and second conductors 60 and 62, and the first and second capacitor terminals 63 and 65 may be exposed to the outside. Accordingly, the test device is easily connected to the first and second output terminals 57 and 59 and / or the first and second capacitor terminals 63 and 65 during the test to perform the test on the sub-module 11 can do.

In the present invention, various devices installed in the submodule 11, that is, the capacitor element 56, the resistance element 49, the respective switching elements 25, 27, 29 and 31, and the diodes 33 and 35 37, and 39, the gate drivers 41, 43, 45, and 47, and the self power supply 51 can be easily tested. Accordingly, the present invention can solve the conventional problems that were difficult to test after being assembled with the product of the sub-module 11. [

Hereinafter, a test apparatus and a test method for testing various devices installed in the sub module 11 constructed as described above will be described.

1st Example : The capacitor element 56 and Resistance element (49) Test

5 is a diagram illustrating a sub-module testing apparatus of the power compensation apparatus according to the first embodiment of the present invention.

As shown in Fig. 5, the sub module 11 is assembled and completed, and it is not necessary to disassemble the sub module 11 in order to test the detailed devices of the sub module 11. Fig. That is, the first and second output terminals 57 and 59, the first and second capacitor terminals 63 and 65 are exposed so that various devices for testing can be connected to the outside of the sub-module 11. Therefore, a desired test can be performed by connecting various devices for testing to these first and second output terminals 57, 59 and the first and second capacitor terminals 63, 65.

The first output terminal 57 of the submodule 11 may be connected to the second node 24 which connects the first switching device 25 and the third switching device 29 as described above. The second output terminal 59 of the submodule 11 may be connected to the third node 26 connecting the second switching device 27 and the fourth switching device 31. [

4 and 5, the sub-module testing apparatus of the power compensation apparatus according to the first embodiment of the present invention includes a power supply 71, a watt resistor 73, a measuring instrument 79, a first sensing unit 81, a second sensing unit 83, and a controller 80.

The control unit 80 controls the power supply 71, the measuring equipment 79 and the submodule 11 as a whole so that the submodule 11 can be tested.

For example, the control unit 80 may control the power supply 71 so that a high voltage is supplied to the sub-module 11.

For example, the control unit 80 comprehensively processes and diagnoses all judgment results determined by the measuring equipment 79, stores the measures to be taken in the database, notifies the user through the display unit or voice, .

For example, the control unit 80 may drive the gate drivers 41, 43, 45, and 47 in the submodule 11 to transmit gate signals to the corresponding switching devices for testing (see the second embodiment) .

The power supply 71 can generate a high voltage for application to the submodule 11. The power supply 71 is capable of generating a forward high voltage, but it is not limited thereto. The watt resistor 73 is connected between the power supply 71 and the first output terminal 57 of the submodule 11 to prevent an overcurrent from being supplied from the power supply 71. Therefore, a wattage resistor 73 may be connected between the power supply 71 and the first output terminal 57 of the submodule 11 to prevent such overcurrent.

The first test input line 75 is connected to the first output terminal of the power supply 71 and the first test input line is connected to the first output terminal 57 of the submodule 11 . The first test input line is connectable to the first output terminal 57 of the submodule 11.

A second test input line 77 is connected to the second output terminal of the powerplane and this second test input line can be connected to the second output terminal 59 of the submodule 11. The second test input line is connectable to the second output terminal 59 of the submodule 11.

The first sensing unit 81 is connected to the first and second test input lines or the first and second output terminals 57 and 59 so that a voltage value or a current value input to the sub- have.

The second sensing unit 83 is connected to the first and second capacitor terminals 63 and 65 so that the charging time and the discharging time of the capacitor device 56 can be sensed.

The measuring instrument 79 is connected to the capacitor element 56 based on the voltage value or the current value sensed by the first sensing part 81 and the charging time and discharging time of the capacitor element 56 sensed by the second sensing part 83. [ ) And the resistance element 49 can be determined.

For example, the measuring device 79 may determine whether the current test is proceeding well based on the voltage value or the current value sensed from the first sensing unit 81. For example, when the high voltage supplied from the power supply 71 or its high voltage is different from the voltage value or the current value sensed from the first sensing unit 81 by the current flowing through the Watt resistor 73, the power supply 71, It may be judged that there is an abnormality in the connection between the measuring equipment 79 or between the first and second test input lines and the first and second output terminals 57 and 59 and the like.

For example, the measuring instrument 79 may calculate the capacitance value of the capacitor element 56 based on the charging time of the capacitor element 56 sensed by the second sensing portion 83. That is, the capacitance value C of the capacitor element 56 can be calculated by the following equation (1).

Here, R is the resistance value of the resistance element 49 already determined in the standard, and? Is the charging time of the capacitor element 56.

Therefore, by substituting the charge time of the sensed capacitor element 56 into Equation 1, the actual capacitance value for the capacitor element 56 installed in the current submodule 11 can be calculated.

The measuring instrument 79 compares the capacitance value C of the capacitor element 56 calculated as described above with the capacitance value predetermined for the capacitor element 56 to determine whether or not the capacitor element 56 has an abnormality with respect to the capacitor element 56 It can be judged.

For example, if the capacitance value C of the capacitor element 56 thus calculated is different from the capacitance value determined in advance for the capacitor element 56, the capacitor element 56 may be judged to be abnormal have.

In addition, the measuring instrument 79 can calculate the resistance value of the resistance element 49 based on the discharge time sensed by the second sensing portion 83. [ That is, the resistance value R of the resistance element 49 can be calculated by the following equation (2).

Here, C is a capacitance value of the capacitor element 56 already determined in the standard, and? Is a discharge time of the capacitor element 56.

Therefore, by substituting the discharge time of the sensed capacitor element 56 into the equation (2), the actual resistance value for the resistance element 49 provided in the current submodule 11 can be calculated.

The measuring instrument 79 can compare the resistance value of the resistance element 49 calculated as described above with the resistance value specified by the standard for the resistance element 49 to determine whether or not the resistance element 49 is abnormal .

For example, when the calculated resistance value of the resistance element 49 is different from the resistance value specified for the resistance element 49, the resistance element 49 may be judged to be abnormal.

6 is a flowchart illustrating a submodule testing method of the power compensation apparatus according to the first embodiment of the present invention.

Referring to FIGS. 4 to 6, the measuring device may be set first (S111). That is, for the test, the power supply 71, the watt resistor 73, the measuring equipment 79, the first sensing unit 81, the second sensing unit 83, May be connected to the module (11). That is, the first and second test input lines are respectively connected to the first and second output terminals 57 and 59 of the submodule 11, and the first and second test input lines or the first and second output lines And a second sensing unit 83 may be provided on the first and second capacitor terminals 63 and 65. [

Subsequently, a high voltage from the power supply 71 may be supplied to the sub-module 11 through the first and second output terminals 57 and 59 (S113). Here, although the high voltage is a forward high voltage, it is not limited thereto.

The first sensing unit 81 senses a voltage or current input from the power supply 71 to the sub-module 11 and transmits the sensed voltage or current to the measuring equipment 79.

4, the first output terminal 57, the second node 24, the first diode 33, the first node 22, the first conductor 60, the capacitor element A current flow path through which current flows to the first node 56, the second conductor 62, the fourth node 28, the fourth diode 39, the third node 26 and the second output terminal 59, Can be formed.

Thereby, the capacitor element 56 can be gradually charged with a voltage.

The power supply 71 may supply a high voltage to the sub-module 11 for a certain period of time so that the charging time of the capacitor element 56 can be measured (S115).

A high voltage may be supplied to the submodule 11 for a certain period of time to increase the voltage charged in the capacitor element 56. [

The second sensing unit 83 senses the charging time of the capacitor element 56 and transmits it to the measuring equipment 79 (S117).

The measuring instrument 79 may calculate the capacitance value of the capacitor element 56 using Equation 1 based on the charging time of the capacitor element 56 transmitted from the second sensing portion 83 in operation S119.

The measuring instrument 79 can compare the calculated capacitance value with the capacitance value of the corresponding capacitor element 56 determined in advance to determine whether the corresponding capacitor element 56 is abnormal or not (S121).

For example, if the calculated capacitance value is equal to the capacitance value previously determined by the standard, the corresponding capacitor can be judged as having no abnormality.

For example, when the calculated capacitance value differs from the capacitance value determined in advance by the standard, the capacitor may be judged to be abnormal.

The control unit 80 can check whether a predetermined time has elapsed (S123).

If the predetermined time has elapsed, the power supply 71 can cut off the high voltage being supplied (S125).

Accordingly, the voltage charged in the capacitor element 56 can be discharged by the resistor element 49. [

The second sensing unit 83 senses the discharge time of the capacitor element 56 and transmits the sensed discharge time to the measuring equipment 79 (S127).

The measuring instrument 79 may calculate the resistance value of the resistance element 49 using Equation 2 based on the discharging time of the capacitor element 56 transmitted from the second sensing portion 83 in operation S129.

The measuring instrument 79 can compare the calculated resistance value with the resistance value of the resistance element 49 determined in advance to determine whether or not the resistance element 49 is abnormal (S131).

For example, when the calculated resistance value is equal to the resistance value previously determined by the standard, the resistance element 49 can be judged as having no abnormality.

For example, when the calculated resistance value differs from the resistance value previously determined by the standard, the resistance element 49 may be judged to be abnormal.

The determination result is displayed through a display unit (not shown) of the measuring equipment 79 to inform the user of the abnormality of the capacitor element 56 and the resistance element 49.

Second Example : Switching elements 25, 27, 29 and 31, diodes 33, 35, 37 and 39, Gate driver (41, 43, 45, 47), an interface (53) test

The structure of the test apparatus according to the second embodiment is the same as that shown in Fig.

7 is a flowchart illustrating a submodule testing method of a power compensation apparatus according to a second embodiment of the present invention.

Referring to FIGS. 4, 5 and 7, a measurement self-calibration may be set for testing (S141).

This set measurement apparatus is as shown in Fig. In comparison with the first embodiment, in the second embodiment, under the control of the control unit 80, each switching element 25, 27, 29, 31 in the submodule 11 is operated to perform switching operation, The gate drivers 41, 43, 45, 47 connected to the gate drivers 27, 29, 31 are driven.

The control unit 80 controls the power supply 71 to supply the positive high voltage to the first and second output terminals 57 and 59 of the submodule 11 (S143). At this time, the first to fourth switching elements 25, 27, 29, 31 may be kept in a turned off state.

In this case, a current flow path through which current flows to the first output terminal 57, the first diode 33, the capacitor element 56, the fourth diode 39 and the second output terminal 59 may be formed . Accordingly, the capacitor element 56 can be charged (increased) in voltage.

In addition, the second sensing unit 83 senses the voltage of the capacitor element 56 and transmits the sensed voltage to the measuring instrument 79.

The measuring instrument 79 can determine the abnormality of the first diode 33 and the fourth diode 39 through the voltage state of the capacitor element 56 transmitted from the second sensing unit 83 (S145) .

For example, when the voltage of the capacitor element 56 transmitted from the second sensing unit 83 is increased as predetermined, the first diode 33 and the fourth diode 39 may be judged as not abnormal.

For example, when the voltage of the capacitor element 56 transmitted from the second sensing portion 83 is not increased as predetermined, the first diode 33 and the fourth diode 39 may be judged as abnormal

The control unit 80 controls the second gate driver 43 through the interface 53 in the submodule 11 to control the second switching device 27 to be turned on in step S147.

Current flows through the first output terminal 57, the first diode 33, the second switching element 27 and the second output terminal 59 when the second switching element 27 is turned on. Can be formed.

At this time, the current does not pass through any load in the sub-module 11, and flows to the power supply 71 at a predetermined limit current. In this case, the protection function set in the power supply 71 is activated, so that a voltage drop occurs in the power supply 71. [

Therefore, whether or not the second switching device 27 is turned on can be determined through the detection of the voltage drop from the power supply 71 (S149). The voltage drop of the power supply 71 can be sensed by the first sensing unit 81 and transmitted to the measuring equipment 79. When the measuring instrument 79 receives the detection signal for the voltage drop from the power supply 71, it can be judged that the second switching element 27 is turned on based on the detection signal for the voltage drop.

The interface 53 in the submodule 11 can receive the feedback signal for the state of the second gate driver 43 from the second gate driver 43 and transmit it to the measuring equipment 79. Therefore, the measuring equipment 79 can judge the abnormality of the second gate driver 43 on the basis of the feedback signal of the state of the second gate driver 43 transmitted from the interface 53.

For example, if the feedback signal has a low level, the second gate driver 43 is determined to be abnormal, and if the feedback signal has a high level, the second gate driver 43 can be determined that there is no abnormality.

After the second switching device 27 turns on and the abnormality of the second gate driver 43 is determined, the controller 80 controls the third gate driver 45 through the interface 53 of the sub- And controls the third switching device 29 to be turned on (S151).

At this time, the second switching element 27 can also be kept in the turned-on state.

When the third switching element 29 is turned on, the current flows through the first output terminal 57, the third switching element 29, the capacitor element 56, the second switching element 27 and the second output terminal 59 A current flow path can be formed.

In this case, the voltage charged in the capacitor element 56 can be discharged (reduced). The second sensing unit 83 senses the voltage state of the capacitor element 56 and transmits the sensed voltage state to the measuring instrument 79.

The measuring device 79 may determine whether the third switching device 29 is turned on or off based on the voltage state of the capacitor device 56 transmitted from the second sensing unit 83 at step S153.

For example, when the voltage of the capacitor element 56 transmitted from the second sensing portion 83 is reduced to a predetermined value, the third switching element 29 can be determined to be turned on.

For example, when the voltage of the capacitor element 56 transmitted from the second sensing portion 83 is not decreased to a preset value, the third switching element 29 turn-on may be judged as abnormal

The interface 53 in the submodule 11 can receive the feedback signal for the state of the third gate driver 45 from the third gate driver 45 and transmit it to the measuring equipment 79. [ Therefore, the measuring equipment 79 can judge whether or not the third gate driver 45 is abnormal based on the feedback signal of the state of the third gate driver 45 transmitted from the interface 53.

For example, if the feedback signal has a low level, the third gate driver 45 is judged to be abnormal, and if the feedback signal has a high level, the third gate driver 45 can be judged as having no abnormality.

Next, the controller 80 controls the second gate driver 43 through the interface 53 to control the second switching element 27 to be turned off (S155).

At this time, the third switching device 29 can be kept in a turned-on state.

Thus, a current flow path through which current flows through the first output terminal 57, the third switching element 29, the fourth diode 39, and the second output terminal 59 can be formed. At this time, as the current does not pass through any load in the submodule 11, the limit current set in the power supply 71 flows and a voltage drop occurs in the power supply 71. [

Accordingly, whether or not the second switching device 27 is turned off can be determined through the detection of the voltage drop of the power supply 71 (S157).

The voltage drop of the power supply 71 can be sensed by the first sensing unit 81 and transmitted to the measuring equipment 79. Therefore, the measuring instrument 79 can judge that the second switching element 27 is turned off based on the detection signal of the voltage drop received from the power supply 71.

The control unit 80 controls the third gate driver 45 through the interface 53 to control the third switching device 29 to be turned off (S159).

At this time, the forward high voltage supplied to the power supply 71 is also cut off and is no longer supplied to the sub-module 11.

In this case, the voltage drop of the power supply 71 is not sensed. Therefore, the measuring instrument 79 can detect an abnormality of the third switching device 29 turn-off based on the voltage drop related information that is not sensed by the power supply 71 (S161).

For example, if the voltage drop of the power supply 71 is not sensed, the measuring instrument 79 may determine that the third switching element 29 is turned off.

As another example, when the voltage of the capacitor element 56 is sensed by the second sensing portion 83 and the voltage of the sensed capacitor element 56 is 0 V or a similar voltage (full discharge), the third switching element (29) Turn-off may be judged to be abnormal.

Then, the control unit 80 controls the power supply 71 to control the reverse high voltage to be supplied to the first and second outputs of the sub-module 11 (S163).

In this case, a current flow path through which current flows through the second output terminal 59, the second diode 35, the capacitor element 56, the third diode 37 and the first output terminal 57 can be formed have.

At this time, the capacitor element 56 can be charged (increased).

The second sensing unit 83 senses the voltage of the capacitor element 56 and transmits it to the measuring instrument 79. The measuring instrument 79 measures the voltage of the second diode 35 and the third diode 37 (S165)

For example, when the voltage of the capacitor element 56 is increased to a predetermined value, the second diode 35 and the third diode 37 can be judged as abnormal.

For example, when the voltage of the capacitor element 56 is not increased to a preset value, the second diode 35 and the third diode 37 may be judged to be abnormal.

The control unit 80 controls the first gate driver 41 through the interface 53 to control the first switching device 25 to be turned on in step S167.

Current flows through the second output terminal 59, the second diode 35, the first switching device 25 and the first output terminal 57 when the first switching device 25 is normally turned on. A path can be formed.

Accordingly, the voltage drop of the power supply 71 is sensed, and accordingly, the measuring device 79 can determine whether or not the first switching device 25 is abnormal according to whether the voltage is detected by the power supply 71 (S169).

In addition, the interface 53 may receive the feedback signal of the state of the first gate driver 41 from the first gate driver 41 and transmit it to the measurement equipment 79. Therefore, the measuring instrument 79 can determine whether or not the first gate driver 41 is abnormal based on the feedback signal of the state of the first gate driver 41 transmitted from the interface 53.

Then, the control unit 80 controls the fourth gate driver 47 through the interface 53 to control the fourth switching device 31 to be turned on (S171).

At this time, the first switching device 25 can be maintained in a turned-on state.

Current flows through the second output terminal 59, the fourth switching element, the capacitor voltage, the first switching element 25 and the first output terminal 57 when the fourth switching element 31 is normally turned on A current flow path can be formed.

In this case, the voltage charged in the capacitor element 56 can be reduced by discharging.

The second sensing part 83 senses the voltage state of the capacitor element 56 and transfers the voltage state of the capacitor element 56 to the measuring instrument 79. The measuring instrument 79 senses the voltage state of the capacitor element 56 transmitted from the second sensing part 83, Based on the voltage state, it is possible to determine whether the fourth switching device 31 is turned on or off (S173).

For example, when the voltage of the capacitor element 56 is reduced to a predetermined value, the turn-on of the fourth switching element 31 can be judged as not abnormal.

The control unit 80 controls the first gate driver 41 to control the first switching device 25 to be turned off (S175).

Current flows through the second output terminal 59, the fourth switching device 31, the third diode 37 and the first output terminal 57 when the first switching device 25 is normally turned off. A flow path can be formed.

In this case, a voltage drop is generated in the power supply 71 due to the limit current flowing in the power supply, and this voltage drop can be sensed and transmitted to the measuring equipment 79.

The measuring instrument 79 can determine whether the first switching element is turned off based on the voltage drop related information sensed by the power supply 71 (S177).

Then, the control unit 80 controls the fourth gate driver 47 through the interface 53 to control the fourth switching device 31 to be turned off (S179).

At this time, the reverse high voltage supplied to the power supply 71 is also cut off and is no longer supplied to the sub-module 11.

In this case, since the voltage drop is not generated in the power supply 71, the measuring device 79 detects the abnormality of the third switching device 29 turn-off based on the voltage drop related information that is not sensed from the power supply 71 (S181).

For example, when no voltage drop is detected from the power supply 71, the measuring equipment 79 may determine that the fourth switching device 31 is turned off.

As another example, when the voltage of the capacitor element 56 is sensed by the second sensing portion 83 and the voltage of the sensed capacitor element 56 is 0 V or a similar voltage (full discharge), the fourth switching element (31) turn-off may be judged to be abnormal.

The first through fourth switching devices 25, 27, 29 and 31, the first through fourth diodes 33, 35, 37 and 39 and the first through fourth gate drivers 41 , 43, 45, and 47, respectively.

The determination result is transmitted to the control unit 80. The control unit 80 comprehensively processes and diagnoses the result of the determination, and measures to be taken according to the result are stored in the database or notified to the user through the display unit or voice Can be transmitted to the host controller.

Third Example : Self Power Supply (51) Testing

FIG. 8 is a diagram illustrating a sub-module testing apparatus of a power compensation apparatus according to a third embodiment of the present invention.

The third embodiment is the same as the first embodiment and the second embodiment except that the second measuring equipment 85 is further added.

Therefore, contents not described here can be easily understood from the first and second embodiments described above.

The second measuring instrument 85 may be connected to the first and second outputs of the self-power supply 51.

The first and second outputs of the self power supply 51 are connected to the first and second inputs of the interface 53 so that the power from the self power supply 51 is supplied to the interface 53, .

The first and second power lines connected to the first and second input terminals of the interface 53 connected to the first and second output terminals of the self power supply 51 for testing the self power supply 51, Instead, a second measuring instrument 85 may be connected to the first and second outputs of the self-power supply 51.

The second measuring instrument 85 may include a variable resistor to allow the current of the self-power supply 51 to vary. Therefore, it is possible to determine the abnormality of the self-power supply 51 by varying the current of the self-power supply 51 and checking the output voltage of the self-power supply 51 at that time.

Also, the second measuring equipment 85 may check the operation start time, the rating, the supply duration after the self power supply 51, and the like.

9 is a flowchart for explaining a submodule testing method of the power compensation apparatus according to the third embodiment of the present invention.

Referring to FIGS. 4, 8, and 9, the measurement apparatus may be first set (S211).

Unlike the first and second embodiments, the third embodiment may further include a second measuring instrument 85 connected to the first and second output terminals of the self-power supply 51.

The first measuring equipment 79 may be the measuring equipment of the first and second embodiments.

A high voltage can be supplied from the power supply 71 to the first and second output terminals 57 and 59 of the submodule 11 (S213).

Here, the high voltage may be a forward high voltage, but it is not limited thereto.

As the high voltage is supplied from the power supply 71, current flows through the first output terminal 57, the first diode 33, the capacitor element 56, the fourth diode 39 and the second output terminal 59 A current flow path can be formed.

As a result, the capacitor element 56 is charged and the charging voltage charged in the capacitor element 56 can be increased (S215).

It can be determined whether the charged voltage charged in the capacitor element 56 is equal to or higher than the threshold voltage (S217).

This determination can be performed by the self-power supply 51, but is not limited thereto.

The output voltage from the self-power supply 51 may not be output until the charging voltage of the capacitor element 56 becomes the threshold voltage.

When the charging voltage of the capacitor element 56 is equal to or higher than the threshold voltage, the self power supply 51 can output the output voltage (S219).

At this time, the second measuring equipment 85 checks the time from the start of charging of the capacitor element 56 to the time when the charging voltage of the capacitor element 56 becomes equal to or higher than the threshold voltage, The operation start time can be checked.

The presence or absence of abnormality in the operation start time of the self power supply 51 thus checked can be judged.

For example, when the operation start time of the self power supply 51 is equal to the operation start time specified in the specification, it can be judged that the operation start time of the self power supply 51 is normal.

For example, when the operation start time of the self-power supply 51 is different from the operation start time specified in the specification, it can be judged that the operation start time of the self-power supply 51 is abnormal.

In addition, the second measuring equipment 85 may check the output voltage output from the self-power supply 51 to determine whether there is an abnormality (S221).

For example, when the output voltage output from the self-power supply 51 is equal to the output voltage specified in the standard, the output voltage of the self-power supply 51 can be judged to be normal.

For example, when the output voltage output from the self-power supply 51 is different from the output voltage specified in the standard, it can be judged that the output voltage of the self-power supply 51 is abnormal.

The second measuring equipment 85 may vary the variable resistance to vary the current flowing through the self-power supply 51 so that the load operation of the self-power supply 51 can be performed in step S223.

The second measuring equipment 85 can determine the abnormality of the self-power supply 51 through the load operation (S225).

For example, when the self-power supply 51 is maintained within the rated power specified in each time when the current is varied, the rating of the self-power supply 51 may be judged as not abnormal.

The intensity of the high voltage supplied from the power supply 71 can be reduced or cut off, so that the charging voltage of the capacitor element 56 can be discharged and reduced.

At this time, it can be determined whether the charging voltage of the capacitor element 56 is lower than the threshold voltage (S227).

This determination can be performed by the second measuring instrument 85, but this is not limiting.

When the charging voltage of the capacitor element 56 becomes equal to or less than the threshold voltage, the second measuring instrument 85 outputs the output of the self-power supply 51 based on when the charging voltage of the capacitor element 56 becomes equal to or less than the threshold voltage The voltage supply time can be checked (S229).

The abnormality of the checked output voltage supply time can be judged.

For example, when the output voltage supply time of the self power supply 51 is equal to the supply time defined in the specification, the output voltage supply time of the checked self power supply 51 can be judged to be normal.

For example, when the output voltage supply time of the self power supply 51 is different from the supply time determined in the standard, the output voltage supply time of the checked self power supply 51 may be judged to be abnormal.

By the test method as described above, the abnormality of the output voltage of the self-power supply 51, the operation start time, the rating, and the supply duration after operation can be judged.

The determination result is transmitted to the control unit 80. The control unit 80 comprehensively processes and diagnoses the result of the determination, and measures to be taken according to the result are stored in the database or notified to the user through the display unit or voice Can be transmitted to the host controller.

In the above description, a test method for a submodule in an assembled state has been described. However, the present invention can be applied to a submodule in an assembled state after the submodule is installed in a power- It is possible to test the corresponding submodule while it is mounted on the power compensation device without being disconnected from the power compensation device.

The foregoing detailed description should not be construed in all aspects as limiting and should be considered illustrative. The scope of the present invention should be determined by rational interpretation of the appended claims, and all changes within the scope of equivalents of the present invention are included in the scope of the present invention.

11: Submodule
13: Power Pack
15, 17, 19, 21, 23: switching modules
22, 24, 26, 28: node
25, 27, 29, 31: switching elements
33, 35, 37, 39: diodes
41, 43, 45, 47: gate driver
49: Resistor element
51: Self Power Supply
53: Interface
55: Capacitor pack
56: Capacitor element
57, 59: Output terminal
60, 62: Conductor
61: Bypass switch
63, 65: Capacitor terminal
71: Power supply
73: Wattage resistance
79, 85: Measuring equipment
81, 83:
80:

Claims (18)

First to fourth switching elements connected to the first to fourth nodes, first to fourth diodes connected in parallel to each of the first to fourth switching elements, and first to fourth switching elements A first to a fourth gate driver for generating a gate signal, a resistance element connected to the first to fourth switching elements, a self-power supply connected to the first to fourth switching elements, and an interface A capacitor pack having a power pack and a capacitor element connected to the first to fourth switching elements; and a capacitor pack having one side connected to a different one of the first through fourth nodes in the power pack, And one end of each of the first and second output terminals is connected to a different one of the first to fourth nodes in the power pack And a first and second capacitor terminals provided on the first and second conductors, respectively, the other side of which is connected to both sides of the capacitor element, the sub-module testing apparatus comprising:
A power supply coupled to the first and second output terminals to generate a voltage to be supplied to the sub-module;
A sensing unit connected to the first and second conductor terminals for sensing a charging time and a discharging time of the capacitor device; And
And a first measuring device connected to the sensing unit for determining a capacitance of the capacitor based on a charging time of the capacitor. The method according to claim 1,
Wherein the first measuring device comprises:
Calculating a capacitance value of the capacitor element based on a charging time of the capacitor element,
And determines whether the capacitor element is abnormal by comparing the calculated capacitance value with a capacitance value determined in advance by a standard. The method according to claim 1,
Wherein the first measuring device comprises:
Calculating a resistance value of the resistance element based on a discharge time of the capacitor element,
And determining whether or not the resistance element is abnormal by comparing the calculated resistance value with a resistance value determined in advance by a standard. The method according to claim 1,
Wherein the first measuring device comprises:
Determining whether there is an abnormality in the first and fourth diodes using the forward voltage supplied from the power supply,
And determining whether or not the second switching element is turned on and the second gate driver is abnormal if the second switching element is turned on by the second gate driver,
The third switching element is turned on and the third gate driver is abnormal when the third switching element is turned on by the third gate driver,
When the second switching element is turned off, determines whether the second switching element is turned off,
And determines whether the third switching element is turned off when the third switching element is turned off. 5. The method of claim 4,
Determining whether there is an abnormality in the second and third diodes by using a reverse voltage supplied from the power supply,
When the first switching device is turned on by the first gate driver, determining whether the first switching device turns on and the first gate driver is abnormal,
On and off states of the fourth switching element turn-on and the fourth gate driver when the fourth switching element is turned on by the fourth gate driver,
Wherein when the first switching element is turned off, it is determined whether the first switching element is turned off,
And determines whether the fourth switching element is turned off when the fourth switching element is turned off. The method according to claim 1,
And a second measuring device connected to first and second output terminals of the self-power supply to determine whether the self-power supply is abnormal. The method according to claim 6,
The self-
And determining whether a charge voltage charged in the capacitor element is equal to or higher than a threshold voltage by a voltage supplied from the power supply,
When the charging voltage of the capacitor element is equal to or higher than the threshold voltage,
Wherein the second measuring instrument comprises:
Determines whether the output voltage is abnormal,
And determines whether the operation start time is abnormal based on the output of the output voltage. The method according to claim 6,
The measuring equipment comprises:
A load operation according to the variable current is performed by varying a current flowing through the self power supply,
And determines whether or not the self-power supply has a rating abnormality through the load operation. The method according to claim 6,
The measuring equipment comprises:
When the voltage supplied from the power supply is cut off, determines whether the charging voltage of the capacitor element is lower than a threshold voltage,
And determines whether there is an abnormality in the output voltage supply time of the self-power supply when the charging voltage of the capacitor element is equal to or less than a threshold voltage. The method according to claim 1,
Further comprising a resistance provided between the power supply and the first output terminal to prevent an overcurrent. First to fourth switching elements connected to the first to fourth nodes, first to fourth diodes connected in parallel to each of the first to fourth switching elements, and first to fourth switching elements A first to a fourth gate driver for generating a gate signal, a resistance element connected to the first to fourth switching elements, a self-power supply connected to the first to fourth switching elements, and an interface A capacitor pack having a power pack and a capacitor element connected to the first to fourth switching elements; and a capacitor pack having one side connected to a different one of the first through fourth nodes in the power pack, And one end of each of the first and second output terminals is connected to a different one of the first to fourth nodes in the power pack A method of testing a sub-module of a power compensator for testing a sub-module including a first and a second capacitor terminal mounted on first and second conductors, the other side of which is connected to both sides of the capacitor device, ,
Generating a voltage to be supplied to the first and second output terminals of the submodule;
Sensing a charging time and a discharging time of the capacitor device connected to the first and second conductor terminals; And
And determining a capacitance of the capacitor based on the charging time of the capacitor. 12. The method of claim 11,
Wherein the step of determining the presence or absence of an abnormality of the capacitor element comprises:
Calculating a capacitance value of the capacitor element based on a charging time of the capacitor element;
And comparing the calculated capacitance value with a predetermined capacitance value to determine whether or not the capacitor element is abnormal. 12. The method of claim 11,
Calculating a resistance value of the resistance element based on a discharge time of the capacitor element; And
Further comprising the step of determining whether the resistance element is abnormal by comparing the calculated resistance value with a resistance value determined in advance as a standard. 12. The method of claim 11,
Determining whether there is an abnormality in the first and fourth diodes using a forward voltage supplied from the power supply;
When the second switching device is turned on by the second gate driver, determining whether each of the second switching device turn-on and the second gate driver is abnormal;
When the third switching device is turned on by the third gate driver, determining whether each of the third switching device turn-on and the third gate driver is abnormal;
Determining whether the second switching element is turned off when the second switching element is turned off; And
Further comprising the step of determining whether the third switching element is turned off when the third switching element is turned off. 15. The method of claim 14,
Determining whether the second and third diodes are abnormal by using a reverse voltage supplied from the power supply;
Determining whether there is an abnormality in each of the first switching element turn-on and the first gate driver when the first switching element is turned on by the first gate driver;
When the fourth switching device is turned on by the fourth gate driver, determining whether each of the fourth switching device turn-on and the fourth gate driver is abnormal;
Determining whether the first switching element is turned off when the first switching element is turned off; And
Further comprising the step of determining whether the fourth switching element is turned off when the fourth switching element is turned off. 12. The method of claim 11,
Determining whether a charging voltage charged in the capacitor element is higher than a threshold voltage by a voltage supplied from the power supply; And
Outputting an output voltage when the charging voltage of the capacitor element is equal to or greater than a threshold voltage;
Determining whether the output voltage is abnormal; And
And determining whether the operation start time is abnormal based on the output of the output voltage. 12. The method of claim 11,
Varying a current flowing through the self-power supply to perform a load operation according to the variable current; And
Further comprising the step of determining whether the self-power supply is at least rated through the load operation. 12. The method of claim 11,
Determining if the charge voltage of the capacitor element is below a threshold voltage when the voltage supplied from the power supply is interrupted; And
And determining whether the output voltage supply time of the self-power supply is abnormal if the charging voltage of the capacitor element is equal to or less than a threshold voltage.

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