KR20180075826A - Split type TFT element structure for large scale display and processing method of bad TFT thereof - Google Patents
Split type TFT element structure for large scale display and processing method of bad TFT thereof Download PDFInfo
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Abstract
Description
본 발명은 대화면 디스플레이 기술에 관한 것으로, 더욱 상세하게는 대화면 디스플레이의 능동 구동을 위한 화소 설계에 있어서 수율을 높이기 위한 대화면 디스플레이용 분할형 TFT 소자 구조 및 그의 불량 TFT 처리 방법에 관한 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention [0002] The present invention relates to a large-screen display technology, and more particularly, to a split-type TFT device structure for a large-screen display for improving yield in pixel design for active driving of a large-
비디오 월, 퍼블릭 디스플레이 등과 같은 대화면 디스플레이의 경우, 화소 면적이 크다. 능동 매트릭스 전류 구동 방식의 경우, 화면 면적에 비례하여 전류량이 증가하게 된다. 이를 위해서 TFT의 크기를 크게 설계해야 하기 때문에, 이로 인해 TFT의 불량이 발생할 확률도 높아진다.In the case of a large-screen display such as a video wall, a public display, etc., the pixel area is large. In the case of the active matrix current driving method, the amount of current increases in proportion to the screen area. For this purpose, the size of the TFT must be designed to be large, thereby increasing the probability that the TFT is defective.
도 1은 기존의 대화면 디스플레이의 TFT 소자 구조를 보여주는 도면이다.1 is a view showing a TFT element structure of a conventional large-screen display.
도 1을 참조하면, 기존의 대화면 디스플레이의 TFT 소자 구조(T)는 게이트(10), 소스(20) 및 드레인(30)으로 구성된다. 기존의 대화면 디스플레이의 TFT 소자 구조(T)는 폭이 W이고 길이가 L인 채널을 갖는 단일 TFT이다.1, the TFT element structure T of a conventional large-screen display is composed of a
TFT 소자 구조(T)를 단일 TFT로 크게 설계할 경우, 이물질 등에 의해 화소 불량이 발생할 확률이 높다.When the TFT element structure T is designed largely as a single TFT, there is a high probability that pixel defects occur due to foreign substances or the like.
더욱이 대화면 디스플레이의 경우, 중소형 디스플레이에 비하여 이물질 등에 의해 화소 불량이 발생할 경우, 수율이 급격히 떨어지는 문제점을 안고 있다. 이로 인해 대화면 디스플레이의 경우 생산 비용 증가로 가격 경쟁력을 확보하기 매우 어려운 문제점을 안고 있다.Furthermore, in the case of a large-screen display, when a pixel defect occurs due to foreign substances or the like compared to a small / medium display, the yield is rapidly deteriorated. As a result, in the case of large-screen display, it is very difficult to secure price competitiveness due to an increase in production cost.
따라서 본 발명의 목적은 대화면 디스플레이의 화소 설계에 있어서, 불량 화소에 따른 수율 저하를 개선할 수 있는 대화면 디스플레이용 분할형 TFT 소자 구조 및 그의 불량 TFT 처리 방법을 제공하는 데 있다.SUMMARY OF THE INVENTION It is therefore an object of the present invention to provide a divided TFT element structure for a large-screen display and a defective TFT processing method thereof, which can improve the yield reduction according to defective pixels in pixel design of a large-
본 발명의 다른 목적은 대화면 디스플레이의 화소 설계에 있어서, 화소의 불량이 발생된 부분만을 사용하지 않고 나머지 부분을 사용할 수 있는 대화면 디스플레이용 분할형 TFT 소자 구조 및 그의 불량 TFT 처리 방법을 제공하는 데 있다.Another object of the present invention is to provide a divided TFT element structure for a large-screen display and a defective TFT processing method thereof, which can use the remaining portion without using only the defective pixel portion in the pixel design of the large- .
상기 목적을 달성하기 위하여, 본 발명은 복수의 단위 TFT가 병렬된 연결된 대화면 디스플레이용 TFT 소자 구조를 제공한다.In order to achieve the above object, the present invention provides a TFT element structure for a connected large-screen display in which a plurality of unit TFTs are arranged in parallel.
상기 복수의 단위 TFT 각각은, 소스/드레인이 이웃하는 다른 단위 TFT의 소스/드레인과 전기적으로 연결되며, 게이트를 공유한다.Each of the plurality of unit TFTs is electrically connected to the source / drain of the other unit TFT adjacent to the source / drain, and shares the gate.
상기 복수의 단위 TFT의 개수는 2개 이상이다.The number of the plurality of unit TFTs is two or more.
상기 복수의 단위 TFT는 채널의 폭(W)이 채널의 길이(L) 보다 크다.The width W of the plurality of unit TFTs is larger than the length L of the channel.
상기 복수의 단위 TFT는 균일한 채널의 폭을 가질 수 있다.The plurality of unit TFTs may have a uniform channel width.
본 발명은 또한, 복수의 단위 TFT가 병렬된 연결된 대화면 디스플레이용 TFT 소자 구조를 제조하는 단계; 및 상기 복수의 단위 TFT 중에서 불량이 발생된 단위 TFT가 있는 경우, 상기 불량이 발생된 단위 TFT의 단위 TFT와의 병렬 연결을 해제하는 단계;를 포함하는 대화면 디스플레이용 분할형 TFT 소자 구조의 불량 TFT 처리 방법을 제공한다.The present invention also provides a method of manufacturing a TFT, comprising: fabricating a TFT element structure for a connected large-screen display in which a plurality of unit TFTs are arranged in parallel; And a step of releasing parallel connection with the unit TFT of the defective unit TFT when there is a defective unit TFT among the plurality of unit TFTs, ≪ / RTI >
그리고 상기 해제하는 단계에서, 상기 불량이 발생된 단위 TFT의 소스/드레인을 이웃하는 다른 단위 TFT의 소스/드레인과 연결을 끊는다.In the releasing step, the source / drain of the defective unit TFT is disconnected from the source / drain of the neighboring unit TFT.
본 발명에 따르면, 대화면 디스플레이의 화소 설계에 있어서, 화소를 구성하는 TFT를 복수의 단위 TFT로 분할하고 서로 병렬로 연결하고, 단위 TFT들 중에서 불량이 발생된 단위 TFT가 존재할 경우, 불량이 발생된 해당 TFT만의 병렬 연결을 해제함으로써, 해당 TFT가 불량화소가 되는 것을 방지할 수 있다.According to the present invention, in the pixel design of the large-screen display, when a TFT constituting a pixel is divided into a plurality of unit TFTs and connected in parallel with each other, and a unit TFT in which a defect is generated exists among the unit TFTs, It is possible to prevent the TFT from becoming a defective pixel by releasing the parallel connection of only the TFT.
따라서 대화면 디스플레이의 화소 설계에 있어서, 불량 화소에 따른 수율 저하를 개선할 수 있다.Therefore, in the pixel design of the large-screen display, it is possible to improve the yield reduction depending on the defective pixel.
그리고 대화면 디스플레이의 화소 설계에 있어서, 화소의 불량이 발생된 부분만을 사용하지 않고 나머지 부분을 사용할 수 있는 이점이 있다.In the pixel design of the large screen display, there is an advantage that the remaining portion can be used without using only the portion where the defective pixel occurs.
도 1은 기존의 대화면 디스플레이의 TFT 소자 구조를 보여주는 도면이다.
도 2는 본 발명의 실시예에 따른 대화면 디스플레이의 분할형 TFT 소자 구조를 보여주는 도면이다.
도 3은 도 2의 대화면 디스플레이의 분할형 TFT 소자 구조에 있어서, 불량이 발생된 단위 TFT의 처리 방법을 보여주는 도면이다.1 is a view showing a TFT element structure of a conventional large-screen display.
2 is a view showing a structure of a divided TFT element of a large screen display according to an embodiment of the present invention.
3 is a view showing a method of processing a defective unit TFT in the divided TFT element structure of the large screen display of Fig.
하기의 설명에서는 본 발명의 실시예를 이해하는데 필요한 부분만이 설명되며, 그 이외 부분의 설명은 본 발명의 요지를 흩트리지 않는 범위에서 생략될 것이라는 것을 유의하여야 한다.In the following description, only parts necessary for understanding embodiments of the present invention will be described, and descriptions of other parts will be omitted to the extent that they do not disturb the gist of the present invention.
이하에서 설명되는 본 명세서 및 청구범위에 사용된 용어나 단어는 통상적이거나 사전적인 의미로 한정해서 해석되어서는 아니 되며, 발명자는 그 자신의 발명을 가장 최선의 방법으로 설명하기 위해 용어의 개념으로 적절하게 정의할 수 있다는 원칙에 입각하여 본 발명의 기술적 사상에 부합하는 의미와 개념으로 해석되어야만 한다. 따라서 본 명세서에 기재된 실시예와 도면에 도시된 구성은 본 발명의 바람직한 실시예에 불과할 뿐이고, 본 발명의 기술적 사상을 모두 대변하는 것은 아니므로, 본 출원시점에 있어서 이들을 대체할 수 있는 다양한 균등물과 변형예들이 있을 수 있음을 이해하여야 한다.The terms and words used in the present specification and claims should not be construed as limited to ordinary or dictionary meanings and the inventor is not limited to the meaning of the terms in order to describe his invention in the best way. It should be interpreted as meaning and concept consistent with the technical idea of the present invention. Therefore, the embodiments described in the present specification and the configurations shown in the drawings are merely preferred embodiments of the present invention, and are not intended to represent all of the technical ideas of the present invention, so that various equivalents And variations are possible.
이하, 첨부된 도면을 참조하여 본 발명의 실시예를 보다 상세하게 설명하고자 한다.Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.
도 2는 본 발명의 실시예에 따른 대화면 디스플레이의 분할형 TFT 소자 구조를 보여주는 도면이다.2 is a view showing a structure of a divided TFT element of a large screen display according to an embodiment of the present invention.
도 2를 참조하면, 화소 구동 회로가 내장된 능동형 매트릭스 전류 구동 백플레인 설계에 있어서, 본 실시예에 따른 대화면 디스플레이의 분할형 TFT 소자 구조(T; 이하 '분할형 TFT 소자 구조'라 한다)는 복수의 단위 TFT(T1,T2,…, Tn)가 병렬된 연결된 구조를 갖는다. 여기서 복수의 단위 TFT는(T1,T2,…, Tn) 제1 단위 TFT(T1), 제2 단위 TFT(T2),…, 제n 단위 TFT(Tn)를 포함한다.Referring to FIG. 2, in the active matrix current-driven backplane design in which the pixel driving circuit is incorporated, the divided TFT element structure T (hereinafter referred to as a divided TFT element structure) of the large- The unit TFTs T1, T2, ..., Tn are connected in parallel. Here, the plurality of unit TFTs includes (T1, T2, ..., Tn) a first unit TFT T1, a second unit TFT T2, , And an n-th unit TFT (Tn).
본 실시예에 따른 분할형 TFT 소자 구조(T)는, 도 1의 기존의 TFT 소자 구조(T')와 비교하여, 폭이 W이고 길이가 L인 채널인 TFT로 구현하는 데 있어서, 채널의 폭이 W/n, 길이가 L인 단위 TFT(T1,T2,…, Tn)를 n개 병렬로 연결된 형태로 구현한 것이다. 여기서 n은 2 이상의 자연수를 의미한다. 즉 복수의 단위 TFT(T1,T2,…, Tn)의 개수는 2개 이상이다. 바람직하게는 복수의 단위 TFT의 개수는 3개 내지 5개일 수 있다.The divided TFT element structure T according to this embodiment is different from the conventional TFT element structure T 'in Fig. 1 in that it is implemented as a TFT having a width W and a length L, N unit TFTs (T1, T2, ..., Tn) having a width W / n and a length L are connected in parallel. Here, n means a natural number of 2 or more. That is, the number of the plurality of unit TFTs (T1, T2, ..., Tn) is two or more. Preferably, the number of the plurality of unit TFTs may be three to five.
본 실시예에 따른 분할형 TFT 소자 구조(T)는 채널의 폭(W)이 채널의 길이(L) 보다는 크다. 복수의 단위 TFT(T1,T2,…, Tn)는 균일한 채널의 폭(W/n)을 갖도록 설계될 수 있다.In the divided TFT element structure T according to this embodiment, the width W of the channel is larger than the length L of the channel. The plurality of unit TFTs T1, T2, ..., Tn may be designed to have a uniform channel width W / n.
이와 같은 복수의 단위 TFT(T1,T2,…, Tn) 각각은, 소스/드레인(20,30)이 이웃하는 다른 단위 TFT(T1,T2,…, Tn)의 소스/드레인(20,30)과 전기적으로 연결되며, 게이트(10)를 공유한다.Each of the plurality of unit TFTs T1, T2, ..., Tn has the source /
이와 같이 본 실시예에서 분할형 TFT 소자 구조(T)로 구현한 이유는, TFT 소자 구조에 있어서, 일부 영역의 불량으로 전체가 불량 화소로 처리되는 문제를 해소하기 위한 것이다.The reason why the TFT element structure is implemented in the divided TFT element structure (T) in this embodiment is to solve the problem that the TFT element structure is entirely treated as a defective pixel due to a defect in a part of the area.
즉 본 실시예에 따른 분할형 TFT 소자 구조(T)는 복수의 단위 TFT(T1,T2,…, Tn)가 병렬로 연결된 구조를 갖기 때문에, 복수의 단위 TFT(T1,T2,…, Tn) 중에서 불량이 발생된 단위 TFT가 존재할 수 있다. 이 경우 불량이 발생된 단위 TFT의 병렬로 연결된 상태를 해제함으로써, 불량이 발생된 단위 TFT를 포함하는 분할형 TFT 소자 구조(T)는 불량이 발생된 단위 TFT를 제외한 나머지 양품의 단위 TFT로 구동이 가능하다.That is, the divided TFT element structure T according to this embodiment has a structure in which a plurality of unit TFTs T1, T2, ..., Tn are connected in parallel, There may be a unit TFT in which a defect is generated. In this case, by releasing the state in which the defective unit TFTs are connected in parallel, the divided TFT element structure T including the defective unit TFT is driven by the unit TFT of the remaining good defects except for the defective unit TFT This is possible.
이로 인해 불량이 발생된 단위 TFT를 포함하는 분할형 TFT 소자 구조 전체가 불량 화소로 처리되는 문제를 해소할 수 있다.As a result, the problem that the whole divided TFT element structure including the defective unit TFT is treated as a defective pixel can be solved.
도 3은 도 2의 대화면 디스플레이의 분할형 TFT 소자 구조(T)에 있어서, 불량이 발생된 단위 TFT(T2)의 처리 방법을 보여주는 도면이다.3 is a view showing a processing method of a unit TFT T2 in which a defect is generated in the divided TFT element structure T of the large screen display of Fig.
도 3을 참조하면, 본 실시예에 따른 대화면 디스플레이용 분할형 TFT 소자 구조(T)의 불량 TFT 처리 방법은 복수의 단위 TFT(T1,T2,…, Tn)가 병렬된 연결된 대화면 디스플레이용 TFT 소자 구조(T)를 제조하는 단계와, 복수의 단위 TFT(T1,T2,…, Tn) 중에서 불량이 발생된 단위 TFT(T2)가 있는 경우, 불량이 발생된 단위 TFT(T2)의 다른 단위 TFT와의 병렬 연결을 해제하는 단계를 포함한다.Referring to FIG. 3, the method for processing a defective TFT in the divided TFT element structure T for a large screen display according to the present embodiment is characterized in that a TFT element for large-screen display, in which a plurality of unit TFTs T1, T2, A step of forming a structure T and a step of forming a unit TFT having a defective one of the plurality of unit TFTs T1, T2, ..., Tn, Lt; RTI ID = 0.0 > a < / RTI >
해제하는 단계에서, 불량이 발생된 단위 TFT(T2)의 소스/드레인(20,30)을 이웃하는 다른 단위 TFT의 소스/드레인(20,30)과 연결을 끊는다. 연결을 끊는 방법으로는 레이저를 이용한 커팅 방법이 사용될 수 있다. 여기서 불량이 발생된 단위 TFT(T2)로는 제2 단위 TFT를 예시하였다.The source /
이와 같이 본 실시예에 따르면, 불량이 발생된 단위 TFT를 포함하는 분할형 TFT 소자 구조 전체가 불량 화소로 처리되는 문제를 해소할 수 있기 때문에, 대화면 디스플레이의 화소 설계에 있어서, 불량 화소에 따른 수율 저하를 개선할 수 있다.As described above, according to the present embodiment, it is possible to solve the problem that the whole divided type TFT element structure including the defective unit TFT is treated as a defective pixel. Therefore, in the pixel design of the large screen display, Degradation can be improved.
그리고 대화면 디스플레이의 화소 설계에 있어서, 화소의 불량이 발생된 부분만을 사용하지 않고 나머지 부분을 사용할 수 있는 이점이 있다.In the pixel design of the large screen display, there is an advantage that the remaining portion can be used without using only the portion where the defective pixel occurs.
한편, 본 명세서와 도면에 개시된 실시예들은 이해를 돕기 위해 특정 예를 제시한 것에 지나지 않으며, 본 발명의 범위를 한정하고자 하는 것은 아니다. 여기에 개시된 실시예들 이외에도 본 발명의 기술적 사상에 바탕을 둔 다른 변형예들이 실시 가능하다는 것은, 본 발명이 속하는 기술분야에서 통상의 지식을 가진 자에게는 자명한 것이다.It should be noted that the embodiments disclosed in the present specification and drawings are only illustrative of specific examples for the purpose of understanding, and are not intended to limit the scope of the present invention. It will be apparent to those skilled in the art that other modifications based on the technical idea of the present invention are possible in addition to the embodiments disclosed herein.
10 : 게이트
20 : 소스
30 : 드레인
T : 분할형 TFT 소자 구조
T1,T2,…, Tn : 단위 TFT10: Gate
20: source
30: drain
T: Split TFT device structure
T1, T2, ... , Tn: unit TFT
Claims (8)
소스/드레인이 이웃하는 다른 단위 TFT의 소스/드레인과 전기적으로 연결되며, 게이트를 공유하는 것을 특징으로 하는 대화면 디스플레이용 TFT 소자 구조.The display device according to claim 1, wherein each of the plurality of unit TFTs
And the source / drain are electrically connected to the source / drain of the neighboring unit TFT and share a gate.
상기 복수의 단위 TFT의 개수는 2개 이상인 것을 특징으로 하는 대화면 디스플레이용 TFT 소자 구조.The method according to claim 1,
Wherein the number of the plurality of unit TFTs is two or more.
상기 복수의 단위 TFT는 채널의 폭(W)이 채널의 길이(L) 보다 큰 것을 특징으로 대화면 디스플레이용 TFT 소자 구조.The method according to claim 1,
Wherein the plurality of unit TFTs have a channel width (W) greater than a channel length (L).
상기 복수의 단위 TFT의 개수는 3개 내지 5개인 균일한 채널의 폭을 갖는 것을 특징으로 하는 대화면 디스플레이용 TFT 소자 구조.5. The method of claim 4,
Wherein the number of the plurality of unit TFTs has a uniform channel width of three to five.
상기 복수의 단위 TFT 중에서 불량이 발생된 단위 TFT가 있는 경우, 상기 불량이 발생된 단위 TFT의 단위 TFT와의 병렬 연결을 해제하는 단계;
를 포함하는 대화면 디스플레이용 분할형 TFT 소자 구조의 불량 TFT 처리 방법.Fabricating a TFT element structure for a connected large-screen display in which a plurality of unit TFTs are arranged in parallel;
Releasing the parallel connection with the unit TFT of the defective unit TFT when there is a defective unit TFT among the plurality of unit TFTs;
Wherein the defective TFT device structure of the divided TFT device structure for large-screen display includes the defective TFT device structure.
상기 복수의 단위 TFT 각각은 소스/드레인이 이웃하는 다른 단위 TFT의 소스/드레인과 전기적으로 연결되며, 게이트를 공유하고,
상기 해제하는 단계에서,
상기 불량이 발생된 단위 TFT의 소스/드레인을 이웃하는 다른 단위 TFT의 소스/드레인과 연결을 끊는 것을 특징으로 하는 대화면 디스플레이용 분할형 TFT 소자 구조의 불량 TFT 처리 방법.The method according to claim 6,
Each of the plurality of unit TFTs is electrically connected to a source / drain of another unit TFT adjacent to the source / drain, shares a gate,
In the releasing step,
And the source / drain of the defective unit TFT is disconnected from the source / drain of the other unit TFT adjacent to the defective TFT.
상기 복수의 단위 TFT의 개수는 2개 이상인 것을 특징으로 하는 대화면 디스플레이용 분할형 TFT 소자 구조의 불량 TFT 처리 방법.7. The method of claim 6,
Wherein the number of the plurality of unit TFTs is two or more.
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