KR20180045370A - Apparatus and method for testing analog signal of industrial inverter - Google Patents

Abstract

According to an embodiment of the present invention an apparatus for testing an inverter controller comprises: an input signal generation unit for generating an input signal which is an analog signal, and supplying the input signal to an inverter controller for testing; a communication unit for receiving an output signal including an offset and a voltage gain of the inverter controller for testing operated by the input signal; and an offset and gain calculation unit for calculating an offset and a gain of the inverter controller for testing by using at least two voltage sizes of the output signal and at least two voltage sizes of the input signal. By accurately calculating an offset and a gain of an analog input unit to store the same in a nonvolatile memory of the controller, the analog signal received in the controller can be accurately restored.

Description

[0001] APPARATUS AND METHOD FOR TESTING ANALOG SIGNAL OF INDUSTRIAL INVERTER [0002]

The present invention relates to an inverter controller test apparatus and method.

Generally, an industrial inverter controller has an analog input circuit and an output circuit.

The input of the analog circuit can be divided into an analog signal used for control and an analog signal used by the user. The resistance value and the amplifier used in such an analog circuit include an error within a certain limit, and the offset value and the gain value are changed by this error.

If the control signal such as the output current or voltage contains such an error, the output torque and speed of the motor may vibrate. If there is an offset between the offset value and the gain value in the analog signal of the user interface unit, a consistent use environment can not be provided.

Therefore, even if the circuit is designed in the same way, errors and amplification ratios of resistance values used when manufacturing a plurality of controllers may be changed. Therefore, offset and gain values should be measured and corrected for each controller.

Korean Patent Registration No. 10-1606537 (entitled "Sensing Offset Compensation Method of Inverter")

SUMMARY OF THE INVENTION It is an object of the present invention to provide an apparatus and method for testing an inverter controller capable of solving the conventional problems.

According to an aspect of the present invention, there is provided an apparatus for testing an inverter, comprising: an analog signal generation unit for generating an input signal that is an analog signal and supplying the input signal to a test inverter controller; A communication unit for receiving an output signal including an offset and a voltage gain of the test inverter controller operated according to the input signal; And an offset and gain calculator for calculating an offset and a gain of the test inverter controller using a voltage magnitude of two or more of the output signals and a voltage magnitude of two or more of the input signals.

In one embodiment, the inverter controller testing apparatus includes a signal command unit for providing a command for sequentially controlling the magnitude of the input signal to the analog signal generating unit, And generates the input signal.

In one embodiment, the offset and gain calculator calculates an offset and a voltage gain of the inverter controller for test using Equation (1) below.

[Equation 1]

Offset = (Vx2 x Vy1 - Vx1 x Vy2) / (Vx2 - Vx1)

Gain = (Vy2 - Vy1) / (Vx2 - Vx1)

Here, Vx1 and Vx2 are voltage magnitudes of input signals having different sizes, and Vy1 and Vy2 are voltage magnitudes of output signals having different magnitudes.

In one embodiment, the offset and gain calculator calculates an offset and a voltage gain of the test inverter controller using a least squares method when the input signal is three or more.

The inverter controller testing terminal according to an embodiment of the present invention generates an input signal that is at least one analog signal and then supplies the input signal to the inverter controller for testing and then uses the output signal of the inverter controller for testing according to the input signal And an application program for calculating the offset and gain of the test inverter controller is stored.

A method of testing an inverter according to an embodiment of the present invention includes: providing a first input signal, which is an analog signal, to a test inverter controller; Receiving and storing a first output signal of the test inverter controller operated based on the first input signal; Providing a second input signal that is an analog signal to the test inverter controller; Receiving and storing a second output signal of the test inverter controller operated based on the second input signal; Calculating offset and voltage gains of the test inverter controller by applying each input signal and each output signal to Equation (1) below; And transmitting the calculated offset and voltage gain to the test inverter controller.

[Equation 1]

Offset = (Vx2 x Vy1 - Vx1 x Vy2) / (Vx2 - Vx1)

Gain = (Vy2 - Vy1) / (Vx2 - Vx1)

Here, Vx1 and Vx2 are voltage magnitudes of input signals having different sizes, and Vy1 and Vy2 are voltage magnitudes of output signals having different magnitudes.

A method of testing an inverter controller according to an exemplary embodiment of the present invention includes: providing K input signals generated with different voltages to an inverter controller for testing; Receiving and storing K output signals of the test inverter controller operated based on each of the K input signals; Applying the K output signals to a least squares method to calculate an offset and a voltage gain of the test inverter controller; And transmitting the calculated offset and voltage gain to the test inverter controller.

In the process of manufacturing the industrial inverter controller, the offset and gain of the analog input unit are precisely calculated and stored in the nonvolatile memory of the controller, so that the analog signal input to the controller can be precisely restored.

Accordingly, it is possible to reduce the distortion of the output current of the motor due to the measurement error of the control parameter used for the motor control such as the output current and the voltage, and to reduce the torque ripple.

It also provides a consistent analog input environment for users who want to give frequency commands with voltage (-10 ~ 10V) or current (0 ~ 20mA). The software memory capacity of the controller under test can be reduced by the presence of the software in the test section for calculating the offset and gain of the circuit.

1 is a diagram showing a method of testing an analog input circuit of an industrial inverter controller according to an embodiment of the present invention.
2 is a block diagram illustrating an inverter controller testing apparatus according to another embodiment of the present invention.
3 is a flowchart illustrating a method of testing an inverter controller according to an embodiment of the present invention.
4 is a flowchart illustrating a method of testing an inverter controller according to another embodiment of the present invention.

It is noted that the technical terms used herein are used only to describe specific embodiments and are not intended to limit the invention. It is also to be understood that the technical terms used herein are to be interpreted in a sense generally understood by a person skilled in the art to which the present invention belongs, Should not be construed to mean, or be interpreted in an excessively reduced sense. Further, when a technical term used herein is an erroneous technical term that does not accurately express the spirit of the present invention, it should be understood that technical terms that can be understood by a person skilled in the art are replaced. In addition, the general terms used in the present invention should be interpreted according to a predefined or prior context, and should not be construed as being excessively reduced.

Also, the singular forms "as used herein include plural referents unless the context clearly dictates otherwise. In this application, the term "comprising" should not be construed as necessarily including the various elements or steps described in the specification, and some of the elements or portions thereof may not be included, Or < / RTI > additional elements or steps.

Further, the suffix "part" for a component used in the present specification is given or mixed in consideration of ease of specification, and does not have a meaning or role that is different from itself.

Furthermore, terms including ordinals such as first, second, etc. used in this specification can be used to describe various elements, but the elements should not be limited by the terms. The terms are used only for the purpose of distinguishing one component from another. For example, without departing from the scope of the present invention, the first component may be referred to as a second component, and similarly, the second component may also be referred to as a first component.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings, wherein like reference numerals refer to like or similar elements throughout the several views, and redundant description thereof will be omitted.

In the following description, well-known functions or constructions are not described in detail since they would obscure the invention in unnecessary detail. It is to be noted that the accompanying drawings are only for the purpose of facilitating understanding of the present invention, and should not be construed as limiting the scope of the present invention with reference to the accompanying drawings.

1 is a block diagram illustrating an inverter controller testing apparatus according to an embodiment of the present invention.

Referring to FIG. 1, an inverter controller testing apparatus 100 according to an embodiment of the present invention includes an analog signal generating unit 110, a communication unit 120, and an offset and gain calculator 130. The inverter controller testing apparatus 100 may further include a signal command unit for providing a command for sequentially controlling the magnitude of the input signal to the input signal generating unit 110, The magnitude of the input signal can be varied.

The input signal generating unit 110 generates analog signals of different sizes based on the command.

The offset and gain calculator 130 calculates the offset and gain of the test inverter controller using the voltage magnitude of two or more of the output signals and the voltage magnitude of two or more of the input signals.

For reference, the inverter controller 10 for testing may include a signal input unit 11, an A / D converter unit 12, a memory unit 13, and a communication unit 14.

The signal input unit 11 amplifies the input signal Vx, which is an analog signal provided from the inverter controller testing apparatus 100, with a predetermined gain and outputs an offset signal Vy.

The A / D converter unit 12 converts the output signal of the signal input unit 11 into a digital signal (Vy_AD_value).

The signal processing unit 13 divides the digital signal Vy_AD_value converted by the A / D converter unit 12 into a gain value AD_Gain of the A / D converter unit to generate a voltage value Vy_c at the input terminal of the A / D converter unit 12 ).

Vy_AD_value = Vy x AD_Gain

Vy_c = Vy_AD_value / AD_Gain

Vy_c = Vy = Gain x Vx + Offset

The input terminal voltage value Vy_c of the A / D converter unit 12 is stored in the memory and then transmitted to the inverter controller test apparatus 100 through the communication unit.

The offset and gain calculator 130 calculates the offset and voltage gain of the test inverter controller by applying the two output signals Vy1 and Vy2 output from the test inverter controller 10 to Equation 1 below.

[Equation 1]

Offset = (Vx2 x Vy1 - Vx1 x Vy2) / (Vx2 - Vx1)

Gain = (Vy2 - Vy1) / (Vx2 - Vx1)

Here, Vx1 and Vx2 are input signals having different sizes, and Vy1 and Vy2 are output signals of inverter controllers having different sizes.

The offset and gain calculator 130 may calculate the offset and the voltage gain of the inverter controller 10 using the least squares method when the number of the input signals is three or more.

More specifically, from the input signals Vx [1], Vx [2], Vx [3], ..., Vy [1], Vy [2], Vy [3] Square Method). Here, Vx [k] can be expressed as Gain_c x Vy [k] + Offset_c.

2 is a block diagram illustrating an inverter controller testing apparatus according to another embodiment of the present invention.

Referring to FIG. 2, an inverter controller testing apparatus 200 according to another embodiment of the present invention may include a portable input signal generating terminal 210 and a portable offset and gain detecting terminal 220.

The portable input signal generating terminal 210 generates and provides analog signals of different sizes to the inverter controller 10 for testing.

The portable offset and gain detection terminal 220 may include an application program for calculating an offset and a gain of the test inverter controller using the output signal of the test inverter controller according to the input signal.

The application program calculates the offset and voltage gain of the test inverter controller by applying the two output signals (Vy1, Vy2) output from the test inverter controller to Equation (1) below.

[Equation 1]

Offset = (Vx2 x Vy1 - Vx1 x Vy2) / (Vx2 - Vx1)

Gain = (Vy2 - Vy1) / (Vx2 - Vx1)

Here, Vx1 and Vx2 are input signals having different sizes, and Vy1 and Vy2 are output signals having different sizes.

In addition, if the application program has three or more input signals, the offset and voltage gains of the test inverter controller can be calculated using the least squares method.

More specifically, from the input signals Vx [1], Vx [2], Vx [3], ..., Vy [1], Vy [2], Vy [3] Square Method). Here, Vx [k] can be expressed as Gain_c x Vy [k] + Offset_c.

3 is a flowchart illustrating a method of testing an inverter controller according to an embodiment of the present invention.

Referring to FIG. 3, the inverter controller testing method (S700) according to an embodiment of the present invention provides a first input signal, which is an analog signal, to the inverter controller for testing in the inverter controller testing apparatus 100 (S701) The inverter controller tester 700 receives the first output signal Vy1 of the test inverter controller 10 operated based on the first input signal Vx1 and stores the received first output signal Vy1 in step S702, The first inverter control unit 10 supplies the second input signal Vx2 which is an analog signal to the test inverter controller 10 in step S703 and then outputs the second output signal Vy2 of the test inverter controller which is operated on the basis of the second input signal Vx2, (S704).

The offset and gain calculator 130 of the test inverter controller 10 applies the input signals Vx1 and Vx2 and the output signals Vy1 and Vy2 to the offset and gain calculator 130 according to the following equation (S705), and transmits the calculated offset and voltage gain to the inverter controller 10 for test (S706).

[Equation 1]

Offset = (Vx2 x Vy1 - Vx1 x Vy2) / (Vx2 - Vx1)

Gain = (Vy2 - Vy1) / (Vx2 - Vx1)

Here, Vx1 and Vx2 are input signals having different sizes, and Vy1 and Vy2 are output signals having different sizes.

In addition, if the test inverter controller 10 includes a plurality of signal input units, the inverter controller test apparatus 100 performs step S707 to perform the steps S701 to S705 for each signal input unit, As shown in FIG. Here, the plurality of signal input units may be represented by a plurality of channels.

4 is a flowchart illustrating a method of testing an inverter controller according to another embodiment of the present invention.

Referring to FIG. 4, an inverter controller testing method (S800) according to another embodiment of the present invention provides a first input signal, which is an analog signal, to a test inverter controller (S801) (S802) a first output signal of the test inverter controller for test (S802), and after a predetermined time, provides a second input signal, which is an analog signal, to the inverter controller for test (S803) And receives the second output signal of the test inverter controller (S804). And provides the K input signal to the test inverter controller, and receives the K output signal of the test inverter controller operated based on the K input signal (S805).

The offset and gain calculator applies the K output signals to the least square method to calculate the offset and voltage gain of the test inverter controller (S806). When the step S806 is completed, the inverter controller test apparatus 100 transmits the calculated offset and the voltage gain to the inverter controller for test.

In addition, if the test inverter controller 10 includes a plurality of signal input units, the inverter controller test apparatus 100 performs step S808 to perform the above-described steps S801 to S806 for each signal input unit, As shown in FIG. Here, the plurality of signal input units may be represented by a plurality of channels.

For reference, "part" disclosed in an embodiment of the present invention may be a computing device, and the computing device may include at least one processing unit and memory.

The processing unit may include a central processing unit (CPU), a graphics processing unit (GPU), a microprocessor, an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) And may have a plurality of cores.

The memory may be a volatile memory (e.g., RAM, etc.), a non-volatile memory (e.g., ROM, flash memory, etc.), or a combination thereof.

The computing device may also include additional storage. Storage includes, but is not limited to, magnetic storage, optical storage, and the like.

The storage may store computer readable instructions for implementing one or more embodiments disclosed herein, and may also store other computer readable instructions for implementing an operating system, application programs, and the like. The computer readable instructions stored in the storage may be loaded into memory for execution by the processing unit.

On the other hand, the computing device may include communication connection (s) that enable it to communicate with other devices (e.g., temperature measurement unit, zero calibration unit) through the network. Here, the communication connection (s) may include a modem, a network interface card (NIC), an integrated network interface, a radio frequency transmitter / receiver, an infrared port, a USB connection or other interface for connecting a computing device to another computing device . The communication connection (s) may also include wired connections or wireless connections.

Each component of the computing device described above may be connected by various interconnects (e.g., peripheral component interconnect (PCI), USB, firmware (IEEE 1394), optical bus architecture, etc.) As shown in FIG.

As used herein, terms such as " to "and the like refer generally to hardware, a combination of hardware and software, software, or computer-related entities that are software in execution. For example, an element may be, but is not limited to being, a processor, an object, an executable, an executable thread, a program and / or a computer running on a processor. For example, both the application running on the controller and the controller may be components. One or more components may reside within a process and / or thread of execution, and the components may be localized on one computer and distributed among two or more computers.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the present invention is not limited to the disclosed exemplary embodiments, but various changes and modifications may be made without departing from the scope of the present invention.

Therefore, the embodiments disclosed in the present invention are not intended to limit the technical spirit of the present invention, but are intended to illustrate and not limit the scope of the technical spirit of the present invention. The scope of protection of the present invention should be construed according to the claims, and all technical ideas which are within the scope of the same should be interpreted as being included in the scope of the present invention.

10: Test inverter controller
11: Signal input section
12: A / D converter
13: Memory
14:
100: Inverter controller test device
110: input signal generating unit
120:
130: offset and gain calculator
140: Signal command section

Claims (9)

Generating an input signal that is an analog signal and supplying it to the test inverter controller An input signal generator;
A communication unit for receiving an output signal including an offset and a voltage gain of the test inverter controller operated according to the input signal;
And an offset and gain calculator for calculating an offset and a gain of the test inverter controller using a voltage magnitude of two or more of the output signals and a voltage magnitude of two or more of the input signals.
The method according to claim 1,
And a signal instruction unit for providing a command for sequentially controlling the magnitude of the input signal to the analog signal generation unit,
Wherein the analog signal generator varies the magnitude of the input signal according to the command.
The method according to claim 1,
Wherein the offset and gain calculator comprises:
An inverter controller test apparatus for calculating an offset and a voltage gain of the test inverter controller using Equation (1) below.
[Formula 1]
Offset = (Vx2 x Vy1 - Vx1 x Vy2) / (Vx2 - Vx1)
Gain = (Vy2 - Vy1) / (Vx2 - Vx1)
Here, Vx1 and Vx2 are voltage magnitudes of input signals having different sizes, and Vy1 and Vy2 are voltage magnitudes of output signals having different magnitudes.
The method of claim 3,
Wherein the offset and gain calculator comprises:
And calculates an offset and a voltage gain of the test inverter controller using a least squares method when the input signal is three or more.
An application for generating an input signal which is one or more analog signals and then transmitting the input signal to a test inverter controller and calculating an offset and a gain of the test inverter controller using the output signal of the test inverter controller according to the input signal The inverter controller test terminal in which the program is stored.
a) providing a first input signal, which is an analog signal, to a test inverter controller;
b) receiving and storing a first output signal of the test inverter controller operated based on the first input signal;
c) providing a second input signal, which is an analog signal, to the inverter controller for testing;
d) receiving and storing a second output signal of the test inverter controller operated based on the second input signal;
e) calculating the offset and voltage gain of the test inverter controller by applying each input signal and each output signal to Equation 1 below; And
f) transferring the calculated offset and voltage gain to the test inverter controller.
[Formula 1]
Offset = (Vx2 x Vy1 - Vx1 x Vy2) / (Vx2 - Vx1)
Gain = (Vy2 - Vy1) / (Vx2 - Vx1)
Here, Vx1 and Vx2 are voltage magnitudes of input signals having different sizes, and Vy1 and Vy2 are voltage magnitudes of output signals having different magnitudes.
The method according to claim 6,
Further comprising the step of performing steps a) through e) for each signal input section if the test inverter controller includes a plurality of signal input sections.
a) providing a first input signal, which is an analog signal, to a test inverter controller;
b) receiving and storing a first output signal of the test inverter controller operated based on the first input signal;
c) providing a second input signal, which is an analog signal, to the inverter controller for testing;
d) receiving and storing a second output signal of the test inverter controller operated based on the second input signal;
e) providing a K input signal to the test inverter controller;
f) receiving and storing a K-th output signal of the test inverter controller operated based on the K-th input signal;
g) applying the K output signals to the least square method to calculate the offset and voltage gain of the test inverter controller; And
h) transmitting the calculated offset and voltage gain to the test inverter controller.
9. The method of claim 8,
Further comprising the step of performing steps a) through g) for each signal input unit if the test inverter controller includes a plurality of signal input units.

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