KR20150120596A - Dynamic frequency hopping and scanning method and system for compensating impact of frequency change of on-chip oscillater on circuit performance - Google Patents

Dynamic frequency hopping and scanning method and system for compensating impact of frequency change of on-chip oscillater on circuit performance Download PDF

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Publication number
KR20150120596A
KR20150120596A KR1020140046296A KR20140046296A KR20150120596A KR 20150120596 A KR20150120596 A KR 20150120596A KR 1020140046296 A KR1020140046296 A KR 1020140046296A KR 20140046296 A KR20140046296 A KR 20140046296A KR 20150120596 A KR20150120596 A KR 20150120596A
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South Korea
Prior art keywords
clock
divider
frequency
factor
oscillator
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KR1020140046296A
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Korean (ko)
Inventor
김윤태
윤찬혁
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(주)멜파스
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Priority to KR1020140046296A priority Critical patent/KR20150120596A/en
Publication of KR20150120596A publication Critical patent/KR20150120596A/en

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01—Details
    • H03K3/011—Modifications of generator to compensate for variations in physical values, e.g. voltage, temperature
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/03—Astable circuits

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)

Abstract

A dynamic frequency hopping and scanning method and system are disclosed for compensating for the effect of frequency variation of an on-chip oscillator on circuit performance. A dynamic frequency hopping and scanning system includes a free running oscillator configured to generate a clock of a frequency that reflects a reference factor at a reference frequency and a divider factor at a frequency of the clock provided by the frequent oscillator, And a clock divider that provides a clock.

Description

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a dynamic frequency hopping and scanning method and a dynamic frequency hopping and scanning method and system for compensating an influence of a frequency change of an on-

Embodiments of the present invention are directed to a dynamic frequency hopping and scanning method and system for compensating for the effect of frequency variation of an on-chip oscillator on circuit performance.

A conventional magnetic sensing system uses a crystal oscillator implemented as a clock source outside a sensing system when a predetermined frequency is required. A crystal oscillator is a crystal oscillator that generates a stable oscillation frequency by using a quartz oscillator that uses a piezoelectric crystal phenomenon of quartz crystals as a control element of the oscillation frequency, and can obtain a very stable frequency. On the other hand, There is a problem of raising the unit price of a system using an external crystal oscillator.

A free running oscillator included in the oscillator is used as a clock source. However, even if the frequency of the oscillator is frequently changed according to the temperature, the frequency is changed dynamically to provide a dynamic frequency Hopping and scanning method and system.

A free running oscillator configured to generate a clock of a frequency that reflects a reference factor at a reference frequency; And a clock divider that reflects the divider factor to the frequency of the clock provided by the frequent oscillator and provides a frequency-modified clock.

According to an aspect of the present invention, the divider factor includes one of a plurality of different divider factors predetermined based on an inverse number of the reference factor.

According to another aspect of the present invention, the dynamic frequency hopping and scanning system may further include a processor for determining an optimum value of the divider factor based on a result of the processing using the frequency-changed clock.

According to another aspect of the present invention, the dynamic frequency hopping and scanning system further includes a divider control unit for dynamically changing the value of the divider factor to the optimum value.

According to another aspect, the frequency-modified clock is provided as a reference clock of an apparatus for processing electromagnetic sensing, and the resultant value includes an output value of the apparatus.

According to another aspect, the clock divider generates and provides a plurality of clocks of different frequencies by reflecting a plurality of divider factors of different values at a frequency of a clock provided by the frequent oscillator, Is set based on the reciprocal of the reference factor. - the processor may determine the optimum value of the divider factor to be used in the clock divider by using the results of the processes using each of the plurality of clocks.

Generating a clock of a frequency reflecting a reference factor to a reference frequency in a free running oscillator; And reflecting the divider factor to the frequency of the clock provided by the frequent oscillator in the clock divider to provide a frequency-modified clock.

The free running oscillator included in the oscillator is used as a clock source. However, even if the frequency of the oscillator is changed according to the temperature, it is possible to dynamically change the frequency to provide the performance of the electromagnetic type sensing unit.

1 is a block diagram illustrating an internal structure of a dynamic frequency hopping and scanning system according to an embodiment of the present invention.
Figure 2 is a flow diagram illustrating a dynamic frequency hopping and scanning method in one embodiment of the present invention.
3 is a diagram showing an example of a pattern according to an embodiment of the present invention.
4 is a view showing an example of a pattern according to another embodiment of the present invention.
5 is a view showing an example of a pattern according to another embodiment of the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.

1 is a block diagram illustrating an internal structure of a dynamic frequency hopping and scanning system according to an embodiment of the present invention. The dynamic frequency hopping and scanning system 100 according to the present embodiment provides a reference clock using a free running oscillator 110. In the embodiment of FIG. 1, (Not shown) to provide a reference clock to a sensing receiver 150 of an electromagnetic type.

Although FIG. 1 illustrates an embodiment for providing a reference clock to an electromagnetic sensing apparatus, the dynamic frequency hopping and scanning system 100 according to the present embodiment operates in the same manner for all devices using a reference clock To provide a reference clock.

The dynamic frequency hopping and scanning system 100 includes an oscillator 110, a clock divider 120, a divider control unit 130 and an MCU 140 as shown in FIG. . ≪ / RTI > The MCU 140 may be implemented in the form of custom logic as needed.

Frequently, oscillator 110 may be designed to operate at a higher operating speed than the operating speed (frequency) that dynamic frequency hopping and scanning system 100 desires to provide to sensing system 150 of electromagnetic type. For example, the frequency (e.g., 560 KHz * 32 = 17.92 MHz) of a predetermined multiple (for example, 32 times) of the required frequency (560 KHz) can be frequently set to the operating frequency of the oscillator 110. In other words, often the oscillator 110 can provide a clock of a frequency corresponding to a predetermined multiple of the required frequency.

 The clock divider 120 can divide-by-32 the frequency of the frequency (17.92 MHz) frequently provided by the oscillator 110 and generate a clock of the required frequency (560 KHz).

At this time, when the environment such as the temperature of the chip is changed, the frequency (17.92 MHz) set in the oscillator 110 frequently changes, and accordingly the frequency (560 KHz) of the clock provided by the clock divider 120 changes. In the electromagnetic sensing system, performance deterioration due to frequency variation is significant, and performance degradation occurs when the promised frequency (560 KHz) changes.

Thus, the clock device 120 according to the present embodiment frequently does not divide the frequency of the clock of the oscillator 110 by a fixed divider factor (32 in the above example) at all times, but rather various divider factors (for example, 30 to 34), and can generate clocks of various frequencies. In this case, even if the frequency of the clock provided by the oscillator 110 frequently changes, a desired frequency (in this case, a frequency similar to 560 KHz in this case) can be obtained through the clock divider 120.

For example, if 17.92 MHz is changed to 18.48 MHz with a temperature change, the divider factor divided by 32 will be 577.5 KHz instead of 560 KHz, degrading the performance of the electromagnetic sensing system. However, when the divider factor 33 is used, the result obtained by dividing 18.48 MHz by 33 is 560 KHz, and a clock having a desired frequency can be obtained.

The clock divider 120 generates clocks of various frequencies by using various divider factors and outputs the clocks of various frequencies to the sensing unit 150 of the electromagnetic system because the clock divider 120 can not know whether the frequency of the oscillator 110 has increased or decreased frequently in an actual setting environment, The clock of the desired frequency can be indirectly selected.

There are a variety of criteria for determining the optimum frequency (divider factor). For example, a divider factor that maximizes the output value of the electromagnetic sensing unit 150 can be selected. Therefore, a scanning operation for periodically changing the value of the divider factor and confirming the output value is required, and such a scanning operation can be referred to as a dynamic frequency hopping and scanning method.

At this time, the MCU 140 can determine the divider factor based on the output value of the electromagnetic sensing unit 150. The divider control unit 130 controls the frequency of the clock provided by the oscillator 110 according to the determined divider factor So that the clock divider 120 can be controlled.

Such a dynamic frequency hopping and scanning method can also be used as a method for correcting on a chip without correcting the stylus when the resonance frequency of the electromagnetic stylus (or touch pan) is defective as a manufacturing defect. For example, an electromagnetic stylus device can include a dynamic frequency hopping and scanning system and can calibrate the resonance frequency based on the clock provided by the clock divider 120. [

In addition, the dynamic frequency hopping and scanning method can be utilized in various fields such as an electromagnetic sensor, as well as an analog sensor operating at a given frequency.

Figure 2 is a flow diagram illustrating a dynamic frequency hopping and scanning method in one embodiment of the present invention. The dynamic frequency hopping and scanning method according to the present embodiment can be performed by the components of the dynamic frequency hopping and scanning system 100 or the dynamic frequency hopping and scanning system 100 described with reference to FIG.

Often in step 210, the oscillator 110 may generate a clock of a frequency that reflects a reference factor at a reference frequency. Here, the reference frequency may be a frequency (for example, the above-mentioned 560 KHz) to be provided by the dynamic frequency hopping and scanning system 100. In addition, the reference factor may be a predetermined value such as 32 described above.

In step 220, the clock divider 120 may reflect the divider factor to the frequency of the clock, which is often provided by the oscillator 110, to provide a frequency-modified clock. At this time, the divider factor may include one of a plurality of different divider factors predetermined based on the reciprocal of the reference factor. For example, when the reference factor is 32, the divider factor is set to a predetermined value (for example, 1/30, 1/31, 1/32, 1/33 and 1 / 34). Here, 'reflecting' the factor to the frequency may be multiplying the value of the frequency by a factor. The values of these factors can be variously preset. The clock provided by the clock divider 120 may be transmitted to a device requiring a reference clock, such as the sensing receiver 150 of the electromagnetic type described with reference to FIG.

In step 230, the processing unit may determine the optimal value of the divider factor based on the result of the processing using the frequency-changed clock. Here, the processing unit may correspond to the MCU 140 described with reference to FIG. Here, the result value of the process may be the output value of the device requiring the reference clock.

In step 240, the divider control unit 130 may dynamically change the value of the divider factor to the optimum value. After step 240, step 220 may be performed again. For example, the clock divider 120 may reflect the frequency of the clock frequency again provided by the oscillator 110 to reflect the divider factor whose value has been changed to the optimum value.

In another embodiment, the clock divider 120 generates and provides a plurality of clocks at different frequencies by reflecting a plurality of divider factors of different values at the frequency of the clock, often provided by the oscillator, It is possible. In this case, the processing unit may determine the optimal value of the divider factor to be used in the clock divider, using the results of the processes using each of the plurality of clocks,

As described above, according to embodiments of the present invention, a free running oscillator included in the oscillator is used as a clock source, and even if the frequency of the oscillator is frequently changed according to temperature, The performance of the electromagnetic type sensing unit can be assured.

The dynamic frequency hopping and the system and method according to the embodiments of the present invention described above may be used in a touch key or a sensing apparatus using the following pattern. The above-described pattern may be a pattern capable of both capacitive sensing and magnetic sensing. For example, the pattern may include a touch key included in a device such as a smart phone to recognize both a capacitive touch using a user's finger and an electromagnetic touch using a touch pen . At this time, the dynamic frequency hopping and system according to embodiments of the present invention can be utilized to provide a reference clock to a sensing receiver of the electromagnetic type of the touch key.

3 is a diagram showing an example of a pattern according to an embodiment of the present invention.

A pattern that can realize both the sensing of the capacitance type and the sensing of the electromagnetic type may include patterns corresponding to each method. In the embodiment of FIG. 3, a capacitive touch pattern of a top layer 310 and a touch pattern of an electromagnetic type of a bottom layer 320 are formed at the lower end of a touch area, (magnetic touch pattern) is included.

The capacitive touch pattern of the top layer 310 may be a pattern used to recognize a touch of an object such as a finger according to a change in capacitance.

The electromagnetic touch pattern of the bottom layer 320 may be a pattern for recognizing a touch of an object such as an electromagnetic touch pen in a touch key. For example, an electromagnetic touch pattern may be implemented using a device such as a spiral inductor, and may be based on electrostatic charge induced through electromagnetic induction, such as touch pen, can do.

As described above, the above-described pattern can minimize the area occupied by a pattern in a touch key or the like by arranging the electrostatic capacity type touch pattern and the electromagnetic type touch pattern so as to overlap with each other. For example, when such a pattern is used for a touch key, the area of the electrostatic capacity type touch pattern and the electromagnetic type touch pattern can correspond to the area of the sensing area of the touch key.

4 is a view showing an example of a pattern according to another embodiment of the present invention.

4, the pattern according to the embodiment of FIG. 4 may further include a selection device 410, a voltage terminal 420, and a signal terminal 430. FIG. The voltage terminal 420 may be a terminal for applying a DC voltage to the electromagnetic touch pattern.

At this time, the selection element 410 is connected to one end of the electromagnetic touch pattern and is connected to the selection element 410 through the voltage terminal 420 in accordance with the operation selection signal SEL input to the selection element 410 through the signal terminal 430 The voltage can be applied as a touch pattern of an electromagnetic type. For example, when the touch panel is operated in a capacitive touch mode, the circuit portion connected to the pattern according to the present embodiment is configured such that the select element 410 applies a DC voltage to the electromagnetic touch pattern through the operation select signal SEL .

When a DC voltage is applied to a touch pattern of the electromagnetic type, the touch pattern of the electromagnetic type blocks the noise coming from the bottom of the electromagnetic type touch pattern, so that the static pattern The noise for the change of the capacity can be reduced.

5 is a view showing an example of a pattern according to another embodiment of the present invention.

In comparison with FIG. 4, the pattern according to the embodiment of FIG. 5 may further include a shield layer of an optional layer 510. The shielding layer may be located at the lower end of the electromagnetic touch pattern. At this time, when the shielding layer is implemented as a solid plane, energy loss due to eddy current may occur when a magnetic field is generated in an electromagnetic touch pattern. Accordingly, the shielding layer may be implemented in the form of a predetermined shield pattern as in the embodiment of FIG.

Since the shielding layer is also located at the lower end of the electromagnetic touch pattern, the electrostatic capacitive touch pattern, the electromagnetic touch pattern, and the shielding layer are overlapped and thus the area occupied by the pattern according to the present embodiment is Can be minimized. For example, when such a pattern is used for a touch key, the area of the electrostatic capacity type touch pattern, the electromagnetic type touch pattern, and the shielding layer may correspond to the area of the sensing area of the touch key.

 Although the capacitive touch pattern and the electromagnetic type touch pattern described with reference to the drawings are implemented in a rectangular shape, the shape of the touch pattern is not limited to a square. For example, various touch patterns may be available, such as circular or octagonal shapes.

As described above, the above-described patterns can be used to realize both sensing of the capacitive type and sensing of the electromagnetic type in the touch key included in the sensing device.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments. For example, it is to be understood that the techniques described may be performed in a different order than the described methods, and / or that components of the described systems, structures, devices, circuits, Lt; / RTI > or equivalents, even if it is replaced or replaced.

Therefore, other implementations, other embodiments, and equivalents to the claims are also within the scope of the following claims.

Claims (13)

A free running oscillator configured to generate a clock of a frequency that reflects a reference factor at a reference frequency; And
A clock divider that reflects a divider factor at a frequency of the clock provided by the frequent oscillator,
Wherein the dynamic frequency hopping and scanning system comprises: < RTI ID = 0.0 > a < / RTI > The method according to claim 1,
Wherein the divider factor includes one of a plurality of different divider factors predetermined based on an inverse number of the reference factor. The method according to claim 1,
A processor for determining an optimum value of the divider factor based on a result of the processing using the clock whose frequency is changed;
Further comprising: a frequency hopping and scanning system. The method of claim 3,
A divider control unit for dynamically changing the value of the divider factor to the optimal value,
Further comprising: a frequency hopping and scanning system. The method of claim 3,
The frequency-changed clock is provided as a reference clock of an apparatus for processing electromagnetic sensing,
Wherein the result value comprises an output value of the device. The method of claim 3,
Wherein the clock divider comprises:
Generating and providing a plurality of clocks of different frequencies by reflecting a plurality of divider factors of different values at a frequency of the clock provided by the frequent oscillator, wherein the different values are based on a reciprocal of the reference factor Set. -,
Wherein,
And determines the optimal value of the divider factor to be used in the clock divider by using the results of the processes using each of the plurality of clocks. 7. An apparatus comprising the dynamic frequency hopping and scanning system of any one of claims 1 to 6 for correcting a resonance frequency based on a clock provided by the clock divider of the dynamic frequency hopping and scanning system. Generating a clock of a frequency reflecting a reference factor to a reference frequency in a free running oscillator; And
Reflecting the divider factor at the frequency of the clock provided by the frequent oscillator in the clock divider, thereby providing a frequency-modified clock
Wherein the dynamic frequency hopping and scanning method comprises the steps < RTI ID = 0.0 > of: < / RTI > 9. The method of claim 8,
Wherein the divider factor comprises one of a plurality of different divider factors predetermined based on an inverse number of the reference factor. 9. The method of claim 8,
Determining an optimal value of the divider factor based on a result of the processing using the clock whose frequency has been changed by the processing unit
Further comprising the step of: 11. The method of claim 10,
Dynamically changing the value of the divider factor to the optimal value in a divider control unit
Further comprising the step of: 11. The method of claim 10,
The frequency-changed clock is provided as a reference clock of an apparatus for processing electromagnetic sensing,
Wherein the result value comprises an output value of the device. 11. The method of claim 10,
The step of providing the frequency-
Generating and providing a plurality of clocks of different frequencies by reflecting a plurality of divider factors of different values at a frequency of the clock provided by the frequent oscillator, wherein the different values are based on a reciprocal of the reference factor Set. -,
Wherein determining the optimal value of the divider factor comprises:
Wherein the optimal value of the divider factor to be used in the clock divider is determined using the results of the processes using each of the plurality of clocks.
KR1020140046296A 2014-04-17 2014-04-17 Dynamic frequency hopping and scanning method and system for compensating impact of frequency change of on-chip oscillater on circuit performance KR20150120596A (en)

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