KR20150029424A - Appapatus for three-dimensional shape measurment and method the same - Google Patents

Appapatus for three-dimensional shape measurment and method the same Download PDF

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KR20150029424A
KR20150029424A KR20130108614A KR20130108614A KR20150029424A KR 20150029424 A KR20150029424 A KR 20150029424A KR 20130108614 A KR20130108614 A KR 20130108614A KR 20130108614 A KR20130108614 A KR 20130108614A KR 20150029424 A KR20150029424 A KR 20150029424A
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unit
image
dimensional shape
processing unit
light
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KR20130108614A
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KR101555027B1 (en
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김성무
전선호
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김성무
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Abstract

The present invention relates to a three-dimensional shape measuring apparatus and a three-dimensional shape measuring method, wherein the three-dimensional shape measuring apparatus comprises: a stage unit; a light projection unit generating and projecting a light and a lattice image; a screen unit receiving and reflecting the light and the lattice image formed by the light projection unit; a camera unit to capture an image reflected by the screen unit through the surface of an object to be measured; and an image processing unit calculating the captured image into a three-dimensional shape. According to the present invention, the three-dimensional shape measuring apparatus and the three-dimensional shape measuring method are capable of controlling a phase change due to the displacement of the object, and accurately measure the object three-dimensionally. In addition, the three-dimensional shape measuring apparatus and the three-dimensional shape measuring method in accordance to the present invention are capable of conveniently imaging the three-dimensional shape using a camera, an embedded software, and an application software installed previously in a cell phone; thereby performing efficient management in terms of costs, time, and spaces.

Description

[0001] APPARATUS FOR THREE-DIMENSIONAL SHAPE MEASUREMENT AND METHOD THE SAME [0002]

The present invention relates to a three-dimensional shape measurement and method, and more particularly, to a three-dimensional shape measurement apparatus and method capable of measuring various shapes using a camera portion and software of a cellular phone.

As the accuracy, resolution and reliability of equipment are increased, 3D shape measurement technology has been used in measuring technology of precision parts in industrial field. In addition, recent 3D shape measurement technology is becoming more important in various fields besides engineering field.

The method of measuring the shape of the surface of an object can be divided into a contact type and a non-contact type. However, there is a disadvantage that the contact type can damage the product by directly obtaining the data through the surface contact of the probe and the measurement product, and the measurement method using the non-contact type is increasing.

As the non-contact method, there are various methods such as a laser line scanning method, a phase shifting method, a Fourier transform method, and a fringe reflection method.

Conventionally, a method of projecting a pattern due to the development of a computer has been used. However, there has been a problem in accuracy and repeatability depending on the type of the object to be measured. There was a problem of spatial restriction.

Korean Patent No. 10-1196219

An object of the present invention is to solve the above problems and to provide a three-dimensional shape system capable of improving the accuracy and repeatability of inspection.

It is another object of the present invention to provide a method for easily generating a shape model of an object to be measured by using a mobile phone capable of measuring a precise three-dimensional shape.

A three-dimensional shape measuring apparatus according to the present invention includes a stage unit, a light projection unit for generating and projecting light and a grid image, a screen unit for receiving and reflecting light and a grid image formed by the light projection unit, A camera unit for capturing an image reflected through the surface of the measurement object, and an image processing unit for calculating the captured image in a three-dimensional shape.

Further, the camera unit can capture an image reflected through the surface of the measured object using a camera provided in a mobile phone.

Further, the image processing unit uses internal and external software of the mobile phone, and can process the captured image received from the camera provided in the mobile phone into a three-dimensional shape.

The stage unit may further include a driving unit that can seat the object to be measured and can move the object to be measured.

Further, the lattice image irradiated by the light projection unit may have a sinusoidal pattern using computer programming, and the light projection unit may further include a control unit capable of adjusting the intensity of light irradiated to the screen unit and adjusting the distance of the lattice image can do.

The image processing unit may also acquire surface shape data of the object to be measured by phase extraction and surface reconstruction through Fourier transform by data processing. Specifically, the image processing unit may be a first-order A second processor for obtaining a phase map by the inverse Fourier transform, and a third processor for acquiring a three-dimensional image by phase extraction and phase spreading.

The camera unit may further include an adjustable movable means for changing a distance or an angle with respect to the measured object, and may further include a wide angle lens for measuring a wide area.

A three-dimensional shape measuring method according to the present invention includes the steps of placing a workpiece on a stage unit, projecting light and a lattice image on a light projection unit, projecting the light and lattice image projected on the light projection unit on a screen unit Capturing an image reflected on the surface of the object to be measured in the screen unit in a camera unit, and calculating the captured image in a three-dimensional shape in an image processing unit.

The details of other embodiments are included in the detailed description and drawings.

The three-dimensional shape measuring apparatus according to the present invention has an effect of adjusting the phase change according to the displacement of the object to be measured and showing accuracy in measuring the object three-dimensionally.

In addition, the present invention can easily image a three-dimensional shape using a camera already installed in a mobile phone, internal software, application software, and the like, thereby effectively managing cost, time, and space.

1 is a conceptual diagram of a three-dimensional shape measuring apparatus according to an embodiment of the present invention.
2 is a conceptual diagram of a three-dimensional shape measuring apparatus using a mobile phone according to an embodiment of the present invention.
3 is a graph of a sinusoidal pattern according to an embodiment of the present invention.
4 is a conceptual diagram for measuring distortion aberration according to an embodiment of the present invention.
FIG. 5 is a graph showing a conceptual diagram and experiment according to displacement and phase of a three-dimensional shape measuring apparatus according to an embodiment of the present invention.
6 is a flowchart of a three-dimensional shape measuring method according to an embodiment of the present invention.

Hereinafter, an apparatus and method for measuring a three-dimensional shape according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings. It is to be understood, however, that the terminology or words of the present disclosure should not be construed as limited to conventional or preliminary, and that the inventor may properly define the concept of a term to describe its invention in its best possible manner And should be construed in accordance with the meaning and concept consistent with the technical idea of the present invention.

Therefore, the embodiments described in the present specification and the configurations shown in the drawings are only the most preferred embodiments of the present invention and do not represent all the technical ideas of the present invention. Therefore, It is to be understood that equivalents and modifications are possible.

1 and 2 are conceptual diagrams of a three-dimensional shape measuring apparatus according to an embodiment of the present invention.

1 and 2, a three-dimensional shape measuring apparatus 10 according to an embodiment of the present invention includes a stage unit 100, a light projection unit 200 for generating and projecting light and a grid image A screen unit 300 for receiving and reflecting the light and the lattice image formed by the light projector unit 200, a screen unit 300 for capturing an image reflected on the surface of the object S at the screen unit 300, A camera unit 400 and an image processing unit 500 for calculating the captured image in a three-dimensional shape.

The stage unit 100 provides a space in which the object S can be placed. According to the embodiment, the object S to be measured is a glass substrate and a small object, but it can be applied to objects having various shapes for three-dimensional measurement.

The stage unit 100 may further include a driving unit to allow the object S to move.

The driving unit corresponds to a moving device capable of measuring a displacement and can be moved on a plane in the X and Y axes so that the measured object S placed on the stage unit 100 is accurately measured three- Help.

The stage unit 100 may be configured to be capable of rotating at least 90 to 360 degrees so as to detect all surfaces of the object S while minimizing movement of other units such as the camera unit 400 have.

Therefore, it is possible to adjust the displacement of the X and Y axes according to the object S in real time or rotate 360 degrees so as to enter the field of view of the camera unit 400, So that it can be adjusted so as to be driven in a state in which an accurate moving distance and a reflection angle are set.

The driving unit may further be configured to further move the vertical axis as needed to easily adjust the distance from the camera unit 400. [

The size of the stage unit 100 can be variously formed. In the case of a three-dimensional device using a mobile phone, it is appropriate to match the surface shape and size of a relatively small object. Therefore, Or less.

The light projection unit 200 is disposed adjacent to the stage unit 100 and serves to project the light and the grid image to the screen unit 300.

The light projection unit 200 uses a grid pattern reflection method as a process of first projecting light and images on the screen unit 300 and then analyzing the light and images to the camera unit 400. This is a method for objects with a high reflectance, such as a three-dimensional shaped body or a transparent glass, which is difficult to measure by a conventional lattice projection method.

According to this method, it is possible to project the grating on a flat screen without projecting the grating directly onto the object, and to acquire the information regularly reflected from the object, so that the data can be processed.

Therefore, the lattice image irradiated by the optical projection unit 200 of the present invention can use a lattice pattern having a sinusoidal wave.

As a method for creating a sinusoidal pattern, there is a method using an interferometer. However, a method of making a sinusoidal pattern capable of modulating the period and intensity of reproduction of a pattern using a computer is simple and accurate in terms of accuracy.

Accordingly, the surface of the stage unit 100 on which the sine wave pattern is projected, the surface of the stage unit 100 on which the object S is located, and the surface of the camera unit 400 that receives light can be set to be regularly reflected.

3 is a graph of a sinusoidal pattern according to an embodiment of the present invention.

The sinusoidal wave pattern shown in FIG. 3 projected on the measured object S can be expressed as Equation 1 in a manner that has information on the intensity of light on the projection plane.

Figure pat00001

a (x, y): Average intensity of the sinusoidal pattern pattern

b (x, y): Contrast △: Phase shift amount

φ (x, y): initial phase value to be measured

The light projection unit 200 may further include a control unit capable of adjusting the intensity of light irradiated to the screen unit 300 and adjusting the distance of the grid image.

A light source irradiated from the light projection unit 200 may use a laser, and a light source and a lattice image may be projected by separately mounting a sine wave pattern using an LED light source in an illumination unit 201 provided in a mobile phone. Also, the smartphone 20 can be utilized as the light projection unit 200 more easily and quickly.

When the lighting unit 201 installed in the smartphone 20 is used by using the smartphone 20, it is not equipped with a separate light source related equipment, so that it is easy to carry and can obtain immediate information in real time.

With the recent development of the smartphone 20, it is possible to achieve faster information processing and effects similar to those of a conventional projector.

The camera unit 400 can be disposed above the stage unit 100 so as to accurately photograph the object S placed on the stage unit 100. [

The camera unit 400 serves to capture an image reflected by the screen unit 300 through the surface of the object S to be measured.

The sinusoidal pattern appearing on the screen unit 300 is projected from the object S by the grid pattern reflection method and the image reflected back onto the projected pattern can be captured in the camera unit 400. [

The camera unit 400 may include moving means capable of adjusting the distance to the subject S or the angle of reflection, and further includes a wide-angle lens 401 for measuring a wide area .

A CCD camera can be used as the camera unit 400, and distortion can be corrected by extracting a phase using the lattice distortion reflected from the surface of the object S and reconstructing the surface.

FIG. 4 is a conceptual diagram for correcting distortion aberration according to viewing angles (0 degrees, 50 degrees, 76 degrees) according to an embodiment of the present invention.

In order to measure a large area, it is necessary to use a wide-angle lens having a large viewing angle. However, since distortion aberration occurs as large as that, a viewing angle and distance between the object and the camera may be required.

Specifically, when the viewing angle required by the lens system increases, the influence of the aberration increases, and when the distance between the object to be measured S and the camera unit 400 increases, the interval of the effective sine wave pattern projected onto the object S becomes small . Further, as the number of sinusoidal cycles increases, the resolution of the camera that accepts the CCDs decreases. Therefore, an appropriate interval between the CCD pixel size, the FOV and the f / number of the optical system must be adjusted between each camera unit 400 and the stage unit 100 do.

It is necessary to adjust the distortion aberration according to the type of the object to be measured S by a method in which an appropriate adjustment is made. In the case of a conventional fixed object S to be used, the distortion aberration can be easily adjusted Method can be used.

The lens of the camera unit 400 can use the wide-angle lens 401 to photograph a wide area and can have a minimum resolution value of the object plane height step for recognizing and processing an accurate sinusoidal pattern.

In the following, an example for representing the minimum step height difference value of the object plane is shown.

In the measurement system, the phase resolution was measured as the repetitive noise of the experimentally obtained phase from the repeated measurements at an uncertainty value of about 0.1 pixel (when the magnification of the optical system was 100: 1).

Figure pat00002

k: camera optical system, f / number

Figure pat00003
: Camera CCD pixel size

N.A: Camera optical system numerical aperture

Δφ: Minimum phase resolution of display and measurement system

Using the above equation (2), a value that can have an appropriate resolution in the embodiment was calculated.

Figure pat00004

In the embodiment, the minimum step height difference value is 0.053 mu m (error range 0.003 mu m), and it is possible to measure the three-dimensional shape with better resolution.

The camera unit 400 can be measured using a camera mounted in a mobile phone. Specifically, the camera in the smartphone 20 can be installed on the stage unit 100 according to the embodiment, and the image reflected through the object S can be captured. The image reflected by the object S can be precisely captured by adjusting the set values of the camera unit installed in the smartphone 20. [

According to the embodiment, an appropriate reference surface displacement value is set according to the arrangement of the three-dimensional measurement optical system and the calculation formula for the phase change according to the displacement of the measured object S, thereby reducing the distortion and correcting the accurate phase Can be set.

Figures 5 and 6 show experimental measurements relating to the displacement and phase of a three-dimensional measurement system according to an embodiment of the present invention.

Figure pat00005

p = cycle of display sinusoidal pattern

φ = angle between display surface and reference plane

θ = Angle between reference plane and camera optical axis

Figure pat00006
= Angle between the maximum object rays and the optical axis

Equation (3) is a calculation formula for the optical system arrangement of the 3D measurement system and the phase change according to the object surface displacement.

The measurement system displacement values constructed according to the embodiment of the present invention are as follows.

p = 5.6 mm to 28 mm φ = 30 ° to 80 °

θ = 45 ° to 80 °

Figure pat00007
= 9 ° to 38 °

Also, the graph shown in Fig. 6 shows the relationship of? = 30 degrees (PII),? = 60 degrees (Tz)

Figure pat00008
= 13 [deg.] (Ta), the phase value according to the reflection surface displacement of the measured object S is shown.

The image processing unit 500 may analyze the captured image in the camera unit 400 and calculate the three-dimensional shape.

The image processing unit 500 can use a computer for data processing and can extract the surface by Fourier transform and reconstruct the surface to obtain the surface shape data of the object S. [ In this case, it is possible to realize the shape information by using only one deformed grid image using the Fourier transform, and real-time data processing can be performed.

Further, it is advantageous in that it is possible to measure the moving object (S) and it is advantageous in that it does not need to consider the error caused by transferring the phase shifting grating.

Specifically, the image processing unit 500 may include a first processing unit 501, a second processing unit 503, and a third processing unit 505.

The first processing section 501 can obtain a primary pattern having phase information by Fourier transform. The image processing unit 500 may be a processing system that processes the image captured by the camera unit 400 and then converts the signal on the time axis into a frequency axis.

The second processing unit 503 can obtain a phase map through a mask filter and inverse Fourier transform. The second processing unit 503 can perform the processing of switching the primary pattern having the phase information acquired by the first processing unit 501 to the time axis after filtering through the mask filter.

The third processing unit 505 may extract a phase using the phase map acquired by the second processing unit 503 and acquire a three-dimensional image using phase spreading.

The reason why the phase spreading method is used is that the shape information obtained by the lattice projection method is represented by an arc tangent function and the shape information obtained for an object having a surface height of 2 psi or more may be discontinuous, to be. Therefore, by using the phase spread method, it is possible to reconstruct the original shape information by expanding the wrinkled phase map by using a series of algorithms.

The image processing unit 500 may be provided to implement shape information using software in a mobile phone. Specifically, the software in the smartphone 20 includes a first processing unit 501, a second processing unit 503, and a third processing unit 505 to easily receive images received by using the camera unit 400 of the smartphone 20 It can be implemented quickly.

Further, the function of the processing unit can be downloaded and installed from the external application software (application), and the latest information and functions of the software in the existing mobile phone can be downloaded.

As described above, when the illumination unit 401, the camera function, and the image processing function in the smartphone 20 are simultaneously processed by a single device, a three-dimensional image can be obtained through a quick and simple procedure.

7 is a flowchart illustrating a method of measuring a three-dimensional shape according to an embodiment of the present invention.

The step of placing the object S in the stage unit 100 is advanced (S10)

The stage unit 100 includes a driving unit that can rotate and linearly move in order to accurately measure the object S, and allows the front surface to be photographed as much as possible.

Then, the step of projecting the light and the grid image in the light projection unit 200 proceeds (S20)

The light projection unit 200 can project light and a lattice using an illumination unit already provided in a mobile phone, adjust the intensity of the light irradiated to the screen unit 300 through the control unit, and adjust the distance of the lattice image .

Then, the step of receiving the light and the grid image projected from the light projector unit 200 is performed in the screen unit 300. (S30)

The lattice image irradiated to the optical projection unit 200 can use a sinusoidal pattern using computer programing, and can be exported according to the measurement while the image for each pattern is set.

Then, it is possible to perform a step of capturing an image reflected by the screen unit 300 through the surface of the object S in the camera unit 400. (S40)

Finally, a step of computing the captured image into a three-dimensional shape using the image processing unit 500 may be performed. (S50)

The steps performed in the image processing unit 500 may be differently configured according to the first through third processing units 501, 503, and 505. In the first processing unit 501, a process of obtaining a pattern having phase information using Fourier transform is performed do.

Thereafter, the second processing unit 503 performs filtering on the mask filter, acquires the phase map by the inverse Fourier transform of the filtered pattern, extracts the phase using the acquired phase map, and extracts the phase using the phase spreading method Finally, a three-dimensional image can be obtained.

The camera unit 400 and the image processing unit 500 can capture an image using a camera unit 400 installed in a mobile phone and can display an image using a software So that a three-dimensional shape can be obtained.

While the present invention has been described in connection with what is presently considered to be practical exemplary embodiments, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, . Therefore, it should be understood that the above-described embodiments are illustrative in all aspects and not restrictive. The scope of the present invention is defined by the appended claims rather than the detailed description and all changes or modifications derived from the meaning and scope of the claims and their equivalents are to be construed as being included within the scope of the present invention do.

10: 3D shape measuring device
S: Measured object 20: Smartphone
100: stage unit 200: light projection unit
300: Screen unit 400: Camera unit
500: image processing unit 501: first processing unit
503: second processing section 505: third processing section

Claims (17)

A stage unit;
A light projection unit for generating and projecting light and a grid image;
A screen unit for receiving and reflecting light and a grid image formed by the light projector unit;
A camera unit for capturing an image reflected on the surface of the object to be measured in the screen unit; And
And an image processing unit for calculating the captured image in a three-dimensional shape. The method according to claim 1,
Wherein the camera unit captures an image reflected through a surface of the measured object using a camera provided in a mobile phone. The method according to claim 1,
Wherein the image processing unit processes the captured image received from the camera provided in the mobile phone into a three-dimensional shape using software inside or outside the mobile phone. The method according to claim 1,
Wherein the stage unit further comprises a driving unit capable of placing the object to be measured and capable of moving the object to be measured. The method according to claim 1,
Wherein the lattice image irradiated by the light projector unit has a sinusoidal pattern using computer programing. The method according to claim 1,
Wherein the light projection unit further comprises a control unit capable of adjusting the intensity of light irradiated to the screen unit and adjusting the distance of the grid image. The method according to claim 1,
Wherein the image processing unit obtains surface shape data of the object to be measured by phase extraction and surface reconstruction through Fourier transform by data processing. 2. The apparatus of claim 1, wherein the image processing unit
A first processor for acquiring a primary pattern having phase information by Fourier transform;
A second processor for obtaining a phase map by a mask filter and an inverse Fourier transform; And
And a third processing unit for obtaining a three-dimensional image by phase extraction and phase spreading. The method according to claim 1,
Wherein the camera unit further comprises a wide-angle lens for measuring a wide area, the distance measuring unit being capable of adjusting a distance or an angle of reflection with respect to the object to be measured. Placing the object on the stage unit;
Projecting light and a grating image in a light projection unit;
Receiving light and a lattice image projected from the light projector unit in a screen unit;
Capturing in the camera unit an image reflected at the screen unit through the surface of the object to be measured; And
And calculating the captured image in a three-dimensional shape in an image processing unit. 11. The method of claim 10,
In the step of capturing the reflected image at the camera unit,
Wherein the camera unit captures an image reflected through the surface of the measured object using a camera provided in a mobile phone. 11. The method of claim 10,
In the step of calculating the three-dimensional shape in the image processing unit,
Wherein the image processing unit processes a captured image received from a camera provided in a mobile phone into a three-dimensional shape using software inside or outside the mobile phone. 11. The method of claim 10,
In the step of calculating the three-dimensional shape in the image processing unit,
And acquiring a primary pattern having phase information by Fourier transform in the first processing unit. 14. The method of claim 13,
In the step of calculating the three-dimensional shape in the image processing unit,
And acquiring a phase map by inverse Fourier transform with the mask filter in the second processing unit. 15. The method of claim 14,
In the step of calculating the three-dimensional shape in the image processing unit,
And the third processing unit further includes acquiring a three-dimensional image by phase extraction and phase spreading. 11. The method of claim 10,
In the stage where the object to be measured is placed on the stage unit,
Further comprising the step of moving the object to be measured so that the object is accurately reflected by the driving unit. 11. The method of claim 10,
In the step of projecting the light and the lattice image in the light projection unit,
Wherein the lattice image irradiated by the light projector unit has a sinusoidal pattern using computer programing.
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CN113075035A (en) * 2021-03-18 2021-07-06 歌尔股份有限公司 Tension detection system and detection method for soft template

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US5988862A (en) * 1996-04-24 1999-11-23 Cyra Technologies, Inc. Integrated system for quickly and accurately imaging and modeling three dimensional objects
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