KR20140071526A - Delay locked loop circuit and operation method for the same - Google Patents
Delay locked loop circuit and operation method for the same Download PDFInfo
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- KR20140071526A KR20140071526A KR20120127348A KR20120127348A KR20140071526A KR 20140071526 A KR20140071526 A KR 20140071526A KR 20120127348 A KR20120127348 A KR 20120127348A KR 20120127348 A KR20120127348 A KR 20120127348A KR 20140071526 A KR20140071526 A KR 20140071526A
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Abstract
Description
The present invention relates to a semiconductor design technology, and more particularly, to a delay locked loop (DLL) circuit. More particularly, the present invention relates to a technique for efficiently using an operation delay amount of a delay locked loop to be.
In general, a delay locked loop (DLL) circuit is used to provide an internal clock whose phase precedes a reference clock obtained by converting an external clock.
That is, since the internal clock used in the semiconductor device is a clock in which the external clock is buffered, immediately after input to the semiconductor device, the external clock and the internal clock have the same phase. However, the internal clock is delayed while operating the internal circuits of the semiconductor device (meaning a clock buffer, a transmission line, etc.), resulting in a phase difference from the external clock. In this way, if the phase difference generated between the internal clock and the external clock is maintained, a normal synchronization operation can not be performed between the semiconductor device and arbitrary devices outside the semiconductor device.
Therefore, the delay locked loop (DLL) circuit compensates in advance the phase difference between the internal clock and the external clock, which is expected to occur due to the internal circuits of the semiconductor device, in the semiconductor device so that the internal clock output to the outside of the semiconductor device becomes an external clock And is used to maintain the synchronization state.
As described above, the delay locked loop (DLL) circuit controls the phase of the internal clock to be ahead of the external clock by a predetermined time in advance in order to compensate the phase difference between the external clock and the internal clock in advance.
Meanwhile, a delay locked loop (DLL) circuit can be generally divided into a delay locked loop (DLL) circuit that operates in a single manner and a delay locked loop (DLL) circuit that operates in a dual mode, have. In this case, a delay locked loop (DLL) circuit that operates as a single has an advantage of occupying a relatively small area as compared with a delay locked loop (DLL) circuit that operates as a dual, And has a disadvantage that the delay fixing operation speed is slow.
1 is a block diagram showing a configuration of a delay locked loop (DLL) circuit operating in a dual mode according to the related art.
Referring to FIG. 1, a delay locked loop (DLL) circuit operating in a dual mode according to the related art includes a
The
The first
The second
The first
The second
The first delayed
The second delayed
The clock
The
The operation of the delay locked loop (DLL) circuit according to the prior art based on the above-described configuration will be described below.
FIG. 2 is a graph illustrating the operation of a delay locked loop (DLL) circuit according to the prior art shown in FIG. 1 and its problem.
2, the maximum delay length adjustable in each of the first
Therefore, the rising edge b of the first feedback clock FB_CLK1 occurs at a time when 4.4 ns from the rising edge a of the source clock REF_CLK has elapsed, and the second feedback clock FB_CLK2 is generated at the rising edge The phase of the clock FB_CLK1 is inverted.
When the delay fixing operation is started in this state, the
However, the second feedback clock FB_CLK2 has the
The second delay locked clock DLL_CLK2 generated through the operation of the
However, in the operation of the delay locked loop (DLL) operating in the dual mode according to the related art described above, the
An embodiment of the present invention relates to a delay locked loop (DLL) circuit that operates in a dual mode in which a delay amount of a delay fixing operation is efficiently used, Loop (DLL) circuit.
According to an aspect of the present invention, there is provided a delay locked loop circuit comprising: a first delay circuit for delaying a first internal clock corresponding to a first edge of a source clock by a variable delay, Delay locked loop; A second delay locked loop for variably delaying a second internal clock corresponding to a second edge of the source clock to output a second delay locked clock as a second delay fixed clock for achieving delay lock; And initializing the first delay locked loop in response to the activation of an input control signal indicating that the first and second delay locked loops are not both delay locked. And a clock input multiplexer for inputting the second delay locked clock instead of the first internal clock to the first delay locked loop.
According to another aspect of the present invention, there is provided a method for controlling a source clock or a second delay locked clock by varying a source clock or a second delay locked clock according to whether an input control signal is activated, A first delay locked loop for delaying and outputting the first delay locked loop as a first delay locked clock and reflecting the delay path of the source clock to the first delay locked clock to generate the first feedback clock; And a variable delay circuit for variably delaying the phase-inverted source clock to output a delayed path between the source clock and the second feedback clock as the second delay locked clock, A second delay locked loop for generating a second feedback clock; And an operation control section for activating the input control signal in response to both of the first and second delay locked loops reaching a limit delay amount.
According to another aspect of the present invention, there is provided a method of controlling a delay locked loop circuit comprising: a first delay fixing step of variably delaying a source clock to output a first delay locked clock; A second delay fixing step of variably delaying the source clock whose phase has been inverted to output a second delay locked clock as a delay locked state; And when the delay fixing fails in the second delay fixing step following the first delay fixing step, the first delay fixing step is initialized and then the second delay fixing clock is replaced with the first delay fixing clock instead of the source clock And a third delay fixing step of outputting the first delay locked clock by applying the first delay locked loop.
The present invention relates to a delay locked loop (DLL) circuit which operates in a dual mode, wherein when a dual operation consists of first and second delay locked loop operations that operate independently of each other, (DLL) in which the operations of the first and second delay locked loops are successively connected to each other in response to the failure of the operation of the first and second delay locked loops It is possible to greatly increase the amount of the delay amount applicable to the delay fixing operation while minimizing the increase in the area.
1 is a block diagram showing the configuration of a delay locked loop (DLL) circuit operating in a dual mode according to the prior art;
FIG. 2 is a graph illustrating the operation of a delay locked loop (DLL) circuit according to the prior art shown in FIG. 1 and its problem.
3 is a block diagram illustrating a configuration of a delay locked loop (DLL) circuit that operates in a dual manner according to a first embodiment of the present invention.
4 is a block diagram illustrating a configuration of a dual-function delay locked loop (DLL) circuit according to a second embodiment of the present invention;
FIG. 5 is a graph illustrating the operation of a delay locked loop (DLL) circuit according to an embodiment of the present invention shown in FIGS. 3 and 4; FIG.
Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings. However, it should be understood that the present invention is not limited to the disclosed embodiments, but may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein, Is provided to fully inform the user.
≪ Embodiment 1 >
FIG. 3 is a block diagram showing the configuration of a delay locked loop (DLL) circuit operating in a dual mode according to a first embodiment of the present invention.
Referring to FIG. 3, a dual delay locked loop (DLL) circuit according to the first embodiment of the present invention includes a
Here, the first delay locked
The second delay locked
The clock
The first delay locked
The first delay locked
The first edge of the source clock REF_CLK may also mean the rising edge of the source clock REF_CLK and the falling edge of the source clock REF_CLK. That is, the source clock REF_CLK corresponding to the first edge of the source clock REF_CLK becomes the same clock as the source clock REF_CLK, and the rising edge of the source clock REF_CLK corresponds to the rising edge of the source clock REF_CLK Or a form in which the rising edge of the source clock REF_CLK corresponds to the falling edge of the source clock REF_CLK with a phase inverted in the phase of the source clock REF_CLK.
Note that, in the figure, the first edge of the source clock REF_CLK indicates the rising edge of the source clock REF_CLK, and the source clock REF_CLK and the source clock REF_CLK become the same clock. In this manner, when the source clock REF_CLK and the source clock REF_CLK become the same clock, the first delay locked
Specifically, the
The first
The first delayed
The second delay locked
The operation of the second delay locked
Further, the second edge of the source clock REF_CLK may mean a falling edge of the source clock REF_CLK and may mean a rising edge of the source clock REF_CLK. However, it is a concept opposite to the first edge of the source clock REF_CLK. That is, when the first edge of the source clock REF_CLK indicates the rising edge of the source clock REF_CLK, the second edge of the source clock REF_CLK indicates the falling edge of the source clock REF_CLK, The second edge of the source clock REF_CLK means the rising edge of the source clock REF_CLK when the first edge of the source clock REF_CLK indicates the falling edge of the source clock REF_CLK. Thus, in the first delay locked
For reference, the figure illustrates the case where the second edge of the source clock REF_CLK indicates the falling edge of the source clock REF_CLK, and a clock which inverts the phase of the source clock REF_CLK and a source clock REF_CLKb) become the same clock. In this manner, when the source clock REF_CLKb in which the clock phase inverted from the phase of the source clock REF_CLK is inverted becomes the same clock, the second delay locked
The
The second
The second delay
The clock
Specifically, the input control
The
The first fixed failure signal DLY_END1 activated when the variable delay amount of the first
Of course, the first fixing failure signal DLY_END1 may be kept active regardless of the toggling of the reset pulse RESETP. In this configuration, the configuration of the input control
The
The
In the delay locked loop (DLL) circuit operating in a dual manner according to the first embodiment of the present invention described above, both of the first
When the total delay amount of the first
For example, when the reference time point of the delay locked operation is the rising edge of the source clock REF_CLK, the first delay locked
Likewise, when the reference time point of the delay fixing operation is the falling edge of the source clock REF_CLK, the first delay locked
≪ Embodiment 2 >
FIG. 4 is a block diagram showing a configuration of a dual-function delay locked loop (DLL) circuit according to a second embodiment of the present invention.
Referring to FIG. 4, a dual delay locked loop (DLL) circuit according to a second embodiment of the present invention includes a
Here, the first delay locked
The second delay locked
The
The first delay locked
Here, the fact that the delay lock is established between the source clock REF_CLK and the first feedback clock FB_CLK1 means that the phases of the rising edge of the source clock REF_CLK and the rising edge of the first feedback clock FB_CLK1 are synchronized Operation and may mean to perform a delay locking operation so that the phases of the falling edge of the source clock REF_CLK and the falling edge of the first feedback clock FB_CLK1 are synchronized. This is the part that can be changed by the designer's choice.
For reference, the figure shows a case where the delay fixing operation is performed such that the rising edge of the source clock REF_CLK and the rising edge of the first feedback clock FB_CLK1 are synchronized. That is, the first delay locked
Specifically, the
The
The first
The first delayed
The second delay locked
Here, the fact that the delay lock is established between the source clock REF_CLK and the second feedback clock FB_CLK2 means that the phases of the rising edge of the source clock REF_CLK and the rising edge of the second feedback clock FB_CLK2 are synchronized with each other, Operation and may mean to perform a delay locked operation so that the phases of the falling edge of the source clock REF_CLK and the falling edge of the second feedback clock FB_CLK2 are synchronized. This is the part that can be changed by the designer's choice. However, when the delay locked operation is performed such that the rising edge of the source clock REF_CLK and the rising edge of the first feedback clock FB_CLK1 are synchronized in the first delay locked
For reference, the figure shows a case where the delay fixing operation is performed so that the rising edge of the source clock REF_CLK and the rising edge of the second feedback clock FB_CLK2 are synchronized. That is, the second delay locked
The
The second
The second delay
The
The input control
The
At this time, the first fixed failure signal DLY_END1, which is activated when the variable delay amount of the first
Of course, the first fixing failure signal DLY_END1 may be kept active regardless of the toggling of the reset pulse RESETP. In this configuration, the configuration of the input control
The
In the delay locked loop (DLL) circuit operating in a dual manner according to the second embodiment of the present invention described above, both the first
If it is assumed that the total delay amount of the first
For example, when the reference time point of the delay locked operation is the rising edge of the source clock REF_CLK, the first delay locked
Likewise, when the reference time point of the delay fixing operation is the falling edge of the source clock REF_CLK, the first delay locked
FIG. 5 is a graph illustrating the operation of a delay locked loop (DLL) circuit according to an embodiment of the present invention shown in FIG. 3 and FIG.
5, the maximum delay length adjustable in the first
Therefore, the rising edge b of the first feedback clock FB_CLK1 occurs at a time when 4.4 ns from the rising edge a of the source clock REF_CLK has elapsed, and the second feedback clock FB_CLK2 is generated at the rising edge The phase of the clock FB_CLK1 is inverted.
When the delay fixing operation is started in this state, the maximum amount of delay that the first feedback clock FB_CLK1 can reach through the delay fixing operation of the first delay locked
The second feedback clock FB_CLK2 is also supplied to the second delay locked
In this way, at the time when the delay fixing operation of the first delay locked
The delay fixing operation of the first delay locked
In this way, according to the embodiment of the present invention, in the dual fixed delay locked loop (DLL) circuit, the delay locked operation of the first delay locked
That is, in a delay locked loop (DLL) circuit operating in a dual mode according to an embodiment of the present invention, when starting the delay locked operation, the dual locked loop operates normally, And the second delay locked
It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the invention as defined in the appended claims. Will be apparent to those of ordinary skill in the art.
10, 310, 410: clock input buffer
320, 420: first delay locked loop
330, 430: second delay locked loop
380, 480: clock
20, 322, 332:
30, 332 and 432:
40, 324, 424: a first variable delay line
50, 334, 434: a second variable delay line
60, 326, and 426:
70, 336, 436: the second delayed replica model unit
360: Clock input multiplexing unit 460: Operation control unit
362, 462: Input control
366, 428:
Claims (20)
A second delay locked loop for variably delaying a second internal clock corresponding to a second edge of the source clock to output a second delay locked clock as a second delay fixed clock for achieving delay lock; And
After initializing the first delay locked loop in response to the activation of an input control signal indicating that both the first and second delay locked loops do not achieve delay locked. A clock input multiplexer for inputting the second delay locked clock instead of the first internal clock to the first delay locked loop,
And a delay locked loop circuit.
Wherein the clock input multiplexer comprises:
In response to both a first fixed failure signal indicating that the first delay locked loop is not delay locked and a second fixed failure signal indicating that the second delay locked loop is not delay locked, An input control signal output unit for activating an input signal;
A reset pulse generating unit for generating a reset pulse toggling for a set time in response to the activation of the input control signal; And
Selecting the first internal clock in an interval in which the input control signal is inactive and transferring the selected first internal clock to the first delay locked loop, selecting the second delay locked clock in the active interval, and transmitting the selected second delay locked clock to the first delay locked loop A delay lock loop circuit comprising a transfer section.
The first delay locked loop includes:
A first phase comparator for comparing a phase of the source clock with a phase of a first feedback clock;
The first internal clock is delayed by a delay amount corresponding to the output signal of the first phase comparison unit and is output as the first delay locked clock, and the first fixed failure signal is activated in response to reaching the limit delay amount A first variable delay line whose delay amount is initialized in response to the reset pulse; And
And a first delay replica model unit for reflecting the delay amount corresponding to the delay path of the source clock to the first delay locked clock and outputting it as the first feedback clock.
The second delay locked loop comprising:
A second phase comparison unit for comparing phases of the source clock and the second feedback clock;
And outputs the second internal clock as the second delay locked clock by a delay amount corresponding to the output signal of the second phase comparing unit and activates the second fixed failure signal in response to reaching the limit delay amount A second variable delay line; And
And a second delay replica model unit for reflecting the delay amount corresponding to the delay path of the source clock to the second delay locked clock and outputting it as the second feedback clock.
Wherein the first fixed failure signal is activated in response to the first variable delay line reaching a threshold delay amount and is deactivated in response to the toggling of the reset pulse,
And a fixed failure determination unit for activating a final fixed failure signal in response to activation of the first fixed failure signal in an active period of the input control signal.
And outputting the first delay locked clock as a final delay locked clock in response to the delay locked in the operation of the first delay locked loop, And a clock output multiplexer for outputting the second delay locked clock as the final delay locked clock.
The rising edge of the first internal clock is synchronized to the rising edge of the source clock, the rising edge of the second internal clock is synchronized to the falling edge of the source clock,
Wherein a delay fixing operation is performed to synchronize rising edges of the first and second feedback clocks with reference to rising edges of the source clocks.
The rising edge of the first internal clock is synchronized to the falling edge of the source clock, the rising edge of the second internal clock is synchronized to the rising edge of the source clock,
And a delay fixing operation is performed to synchronize rising edges of the first and second feedback clocks based on a falling edge of the source clock.
And a variable delay circuit for variably delaying the phase-inverted source clock to output a delayed path between the source clock and the second feedback clock as the second delay locked clock, A second delay locked loop for generating a second feedback clock; And
And an operation control section for activating the input control signal in response to the first and second delay locked loops reaching a limit delay amount,
And a delay locked loop circuit.
The operation control unit,
And to toggle a reset pulse for initiating the first delay locked loop in response to the activation of the input control signal.
The first delay locked loop includes:
A first phase comparator for comparing the phase of the source clock with the phase of the first feedback clock;
A selection and delivery unit for selecting and outputting the source clock in an inactive period of the input control signal and selecting and outputting the second delay locked clock in an active period of the input control signal;
And outputs the delayed output clock as the first delayed fixed clock by activating the first fixed failure signal in response to reaching the limit delay amount by delaying the output clock of the selective transfer unit by a delay amount corresponding to the output signal of the first phase comparing unit A first variable delay line whose delay amount is initialized in response to the reset pulse; And
And a first delay replica model unit for reflecting the delay amount corresponding to the delay path of the source clock to the first delay locked clock and outputting it as the first feedback clock.
The second delay locked loop comprising:
A second phase comparison unit for comparing phases of the source clock and the second feedback clock;
And outputs the second delay locked clock as the second delay locked clock by delaying the source clock whose phase is inverted by a delay amount corresponding to the output signal of the second phase comparing unit, A second variable delay line; And
And a second delay replica model unit for reflecting the delay amount corresponding to the delay path of the source clock to the second delay locked clock and outputting it as the second feedback clock.
The operation control unit,
An input control signal output unit for activating the input control signal in response to activation of both the first fixing failure signal and the second fixing failure signal; And
And a reset pulse generator for toggling the reset pulse for a predetermined time in response to activation of the input control signal.
Wherein the first fixed failure signal is activated in response to the first variable delay line reaching a threshold delay amount and is deactivated in response to the toggling of the reset pulse,
And a fixed failure determination unit for activating a final fixed failure signal in response to activation of the first fixed failure signal in an active period of the input control signal.
And outputting the first delay locked clock as a final delay locked clock in response to the delay locked in the operation of the first delay locked loop, And a clock output multiplexer for outputting the second delay locked clock as the final delay locked clock.
A second delay fixing step of variably delaying the source clock whose phase has been inverted to output a second delay locked clock as a delay locked state; And
When the delay fixing is not performed in the second delay fixing step following the first delay fixing step, the first delay fixing step is initialized and then the second delay fixing clock is applied to the first delay fixing step instead of the source clock A third delay fixing step of outputting the first delay locked clock
/ RTI > wherein the delay locked loop circuit comprises:
Wherein the first delay fixing step includes:
A first comparing step of comparing a phase of the source clock with a phase of a first feedback clock;
A first delay amount adjusting step of adjusting a variable delay amount of the source clock according to a result of the operation of the first comparing step and outputting the variable delay amount as the first delay fixed clock;
A first fixed failure detection step of activating a first fixed failure signal in response to the variable delay amount adjustable in the first delay amount adjustment step being '0';
A first delay locked determination step of outputting the first delay locked clock as a final delay locked clock in response to the fact that a variable delay amount adjustable in the first delay amount adjusting step remains and delay lock is achieved in the first comparison step ; And
And a first delay modeling step of reflecting the delay path of the source clock to the first delay locked clock and outputting it as the first feedback clock.
Wherein the second delay fixing step comprises:
A second comparison step of comparing the phase of the source clock with the phase of the second feedback clock;
A second delay amount adjustment step of adjusting the variable delay amount of the clock in which the phase of the source clock is inverted according to a result of the operation of the second comparison step and outputting the adjusted variable delay amount as the second delay fixed clock;
A second fixed failure detection step of activating a second fixed failure signal in response to the variable delay amount adjustable in the second delay amount adjustment step being '0';
A second delay locked determination step of outputting the second delay locked clock as a final delay locked clock in response to the fact that a variable delay amount adjustable in the second delay amount adjusting step remains and delay lock is achieved in the second comparison step ; And
And a second delay modeling step of reflecting the delay path of the source clock to the second delay locked clock and outputting it as the second feedback clock.
Wherein the third delay fixing step comprises:
Activating an input control signal in response to both the first fixed failure signal and the second fixed failure signal being activated;
Initializing the variable delay amount adjusted in the first delay amount adjustment step to '0' in response to the activation of the input control signal; And
And applying the second delay locked clock instead of the source clock to the first delay amount adjusting step after the initializing step is completed to operate the first delay amount adjusting step again Way.
Further comprising the step of activating a final fixed failure signal in response to the variable delay amount being adjustable in the first delay amount adjusting step as a result of the operation of operating the first delay amount adjusting step again, Loop circuit.
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KR20120127348A KR20140071526A (en) | 2012-11-12 | 2012-11-12 | Delay locked loop circuit and operation method for the same |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10491223B2 (en) | 2017-12-08 | 2019-11-26 | Samsung Electronics Co., Ltd. | Memory device including a delay locked loop and operating method of the memory device |
US11177814B2 (en) | 2019-07-05 | 2021-11-16 | Samsung Electronics Co., Ltd. | Delay locked loop circuit and semiconductor memory device having the same |
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- 2012-11-12 KR KR20120127348A patent/KR20140071526A/en not_active Application Discontinuation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10491223B2 (en) | 2017-12-08 | 2019-11-26 | Samsung Electronics Co., Ltd. | Memory device including a delay locked loop and operating method of the memory device |
US11177814B2 (en) | 2019-07-05 | 2021-11-16 | Samsung Electronics Co., Ltd. | Delay locked loop circuit and semiconductor memory device having the same |
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