KR20140041012A - Multi 3-dimension camera using multi pattern beam and method of the same - Google Patents

Abstract

The present invention relates to a three-dimensional imaging device using a plurality of pattern beams. The three-dimensional imaging device using the pattern beams includes an image camera obtaining a two-dimensional image about an object; a plurality of pattern beam emitting units emitting a pattern beam to the object; a pattern collection unit collecting pattern change on the radiated pattern beam; and a signal processing unit generating a three-dimensional image by calculating depth information by each part of the two-dimensional image according to the collected pattern change information.

Description

TECHNICAL FIELD [0001] The present invention relates to a three-dimensional imaging apparatus and method using a multi-pattern beam,

The present invention relates to a three-dimensional image photographing apparatus using a multi-pattern beam, which observes a change of each single pattern beam generated by irradiating a predetermined pattern beam onto a plurality of objects and a change of an overlapping pattern between the multiple pattern beams, The present invention relates to an apparatus and method for generating a three-dimensional image by extracting a depth value based on a pattern change and reflecting the derived depth value on a two-dimensional image.

The 3-dimensional image is more realistic than the 2-dimensional image, and the utilization rate is gradually increasing as the next generation image system of the multimedia age.

Such a 3D image will be primarily implemented and used as 3DTV and stereoscopic movies, and it is expected to be usefully applied to a remote control image, a training simulation, a stereoscopic image communication, and the like.

The most basic method to reproduce 3D stereoscopic images is to obtain images using two cameras, such as two eyes, and to show each of these images in both eyes, which is called binocular or stereoscopic stereoscopic image.

Such a camera for acquiring stereoscopic images is called a binocular camera or a stereoscopic camera.

In the binocular stereoscopic image using the above-described stereoscopic image acquisition camera, only the stereoscopic images captured are inevitably viewed manually, and motion parallax for viewing other stereoscopic images is not given according to the motion of the viewer However, it is widely used because of the simplicity of a binocular camera system.

In order to obtain stereoscopic images of natural and clear quality as in the human eye, stereoscopic cameras require at least three basic functions of the human vision function, namely binocular parallax control function, focus control function, (vergence control) function must be designed and implemented so that it is controlled automatically and organically.

Currently, most of the stereoscopic cameras used in the production of three-dimensional images are manually operated or are preset in predetermined distances and shot in a limited area, so an automated system is required.

In other words, it takes a lot of time to take a picture and is inconvenient for a moving picture, and the accuracy of adjusting and aligning the main time of the left and right cameras is lowered so that the three-dimensional image can not be reproduced. And the like.

Therefore, it is urgently required to manufacture a binocular stereoscopic camera in which the main time is automatically controlled so as to avoid viewing fatigue and camera operation is convenient.

As a result of these demands, studies on Binocular stereoscopic cameras have been conducted in many universities in the United States such as Columbia and Carnegie-Mellon universities. At Curtin University in Australia, researchers are studying underwater cameras using horizontal axis camera research.

The AEA, a nuclear research institute in the UK, developed a SD (Standard Definition) telescopic horizontal moving axis stereoscopic camera, in which the focus and the time of the camera are controlled manually.

In Japan, universities, NHK, Ikegami camera companies and other companies are studying binocular and multi-view stereoscopic cameras under the auspices of the government. Here, 3D-HDTV camera with HDTV image quality for broadcast-type cross-axis type is produced and the horizontal axis camera is under development.

Philips research institute in the Netherlands has also developed a cross-axis method and has recently been developing horizontal coax.

In order to calculate depth information of an object plane for obtaining a three-dimensional image, a plurality of pattern beams are administered to an object, the degree of diffusion of each pattern beam diffused by the distance and the degree of overlap between pattern beams are measured, An apparatus for calculating depth information of an object plane, and an apparatus for constructing a three-dimensional image of an object by reflecting the calculated depth information on a 2D image of the object.

The present invention provides a projection exposure apparatus comprising: a plurality of pattern beam irradiating units each irradiating an object with a predetermined pattern beam; At least one pattern light receiving unit for collecting pattern changes with respect to the irradiated pattern beam; And a signal processing unit for calculating depth information of each part of the object image according to the collected pattern change.

The pattern beam includes at least one of a point at which the position is recognized, a straight line, a curve, a figure, and an irregular pattern.

Wherein the apparatus further comprises a storage unit for storing a library or a pattern variation formula for each distance in which pattern variation information for each distance is recorded, and the signal processing unit refers to the library or the modification formula, And calculates depth information per part.

According to another aspect of the present invention, there is provided a method of calculating depth information of an image of an object using an apparatus for calculating depth information of an object, the method comprising: irradiating an object with a plurality of pattern beams; Collecting the irradiated pattern beam variation; And calculating depth information of each part of the object with reference to the library or the modification formula according to the collected pattern change.

In another aspect, the present invention provides an image processing apparatus comprising: an image camera for obtaining a two-dimensional image of an object; A pattern beam irradiating unit for irradiating a predetermined pattern beam onto the object, wherein the irradiation is a pattern beam irradiation in which pattern information is changed for each distance; At least one pattern light receiving unit for collecting pattern changes with respect to the irradiated pattern beam; A storage unit for storing a library in which pattern information for each distance is recorded; And a signal processing unit for calculating depth information of each part of the two-dimensional image according to the collected pattern change and generating a three-dimensional image, wherein the signal processing unit refers to the stored library, Dimensional depth information of each part according to the depth information.

The present invention is characterized in that a plurality of pattern beams are utilized, and a method of calculating depth information of an object plane by recognizing deformation of a pattern corresponding to a difference in depth value of an object plane by applying a single pattern beam to an object For example, refer to Application No. 10-2011-0077990, filed by the present inventor. The contents of which are incorporated herein by reference in their entirety.

When a single pattern beam is irradiated on an object, shadowing of the pattern beam due to the object may occur. By configuring a plurality of pattern beam irradiating units, a single image camera, and a plurality of pattern light receiving units, it is possible to eliminate a shadow phenomenon by irradiating objects with a plurality of pattern beams at various angles. In addition, the patterns generated by overlapping each distance by the difference of the irradiation angle of each pattern beam are different, and the depth information can be precisely calculated according to the pattern deformation by the overlapping of the pattern beams by the distance.

Further, in the apparatus of the present invention, the plurality of pattern beam irradiating portions and the plurality of pattern light receiving portions are configured to irradiate and receive two or more faces in multiple directions of the object, and to receive depth information of the multi- Can be calculated.

However, if a plurality of pattern beams, a plurality of pattern light-receiving units, and an image camera are arranged at a plurality of angles, it is possible to obtain the depth information of all the images viewed from the pattern light- The depth information of the surface is further calculated to reconstruct a three-dimensional image at various angles, thereby constructing a 360-degree three-dimensional image in some cases.

According to convention, various features of the drawings may not be shown by actual measurement. Thus, the dimensions of the various features may optionally be enlarged or reduced for simplicity. Also, some of the figures may be simplified for simplicity. Accordingly, the drawings may not show all components of the presented device (e.g., device) or method. Finally, like reference numerals may be used to indicate similar features throughout the description and drawings.

According to the embodiment of the present invention, a plurality of pre-designed pattern beams are projected from an object at various positions or at various angles and a single or a plurality of pattern light receiving portions are disposed and used. Or the depth information of the object at various angles to improve the accuracy of the depth value of the object and preferably to generate a three dimensional depth value in all directions 360 degrees, Dimensional image of the object of the image of the object of the two-dimensional image can be made into a three-dimensional image.

1 is a view for explaining an embodiment of generating a three-dimensional image using a three-dimensional image photographing apparatus according to an embodiment of the present invention.
2 is a block diagram illustrating a three-dimensional image photographing apparatus according to an exemplary embodiment of the present invention.
3A is a view for explaining a pattern beam according to an embodiment of the present invention.
FIG. 3B illustrates a pattern beam based on a pattern in which short lines are randomly arranged as a pattern beam of the present invention.
4 and 5 are views for explaining various embodiments for calculating depth information using a pattern beam according to an embodiment of the present invention.
6 is a flowchart illustrating a three-dimensional image capturing method according to an embodiment of the present invention.
FIG. 7 through FIG. 12 illustrate examples of obtaining shadow image enhancement and multi-angle image three-dimensional information using a multi-pattern irradiator according to an exemplary embodiment of the present invention.

Hereinafter, preferred embodiments according to the present invention will be described in detail with reference to the accompanying drawings.

In the following description of the present invention, detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear. The terminologies used herein are terms used to properly represent preferred embodiments of the present invention, which may vary depending on the user, the intent of the operator, or the practice of the field to which the present invention belongs. Therefore, the definitions of these terms should be based on the contents throughout this specification. Like reference symbols in the drawings denote like elements.

1 is a diagram illustrating a system 110 for generating a three-dimensional image using a three-dimensional image capturing apparatus according to an embodiment of the present invention.

A three-dimensional image pickup apparatus according to an embodiment of the present invention can acquire a two-dimensional image of a subject (object) and impart depth information to each part of the obtained two-dimensional image to process the three-dimensional image.

The apparatus for photographing a three-dimensional image according to an embodiment of the present invention may be divided into a photographing unit 110, a signal processing unit 120, and an image output unit 130.

The photographing unit 110 may include a first pattern beam irradiating unit 111, a pattern light receiving unit 112, an image camera 113, and a second pattern beam irradiating unit 114 according to an embodiment of the present invention . The pattern beam irradiating unit is not limited to two, but may be a larger number in order to obtain more information of the object and more accurate information of the depth. Also, there may be more than one of the pattern light receiving unit and the image camera.

To this end, the three-dimensional image photographing apparatus according to an embodiment of the present invention can acquire the two-dimensional image using an image camera 113, which is a general camera.

In addition, the plurality of pattern beam irradiators 111 and 114 can irradiate the object with various patterns.

The pattern beam irradiated on the object may include at least one of a shape, a number, a character, a net structure, a tree structure, and a star (e.g., a line, a rectangle, a triangle, a circle and a polygon) star structure, and the like, or may be a plurality of beam irradiation units. The pattern shown in Fig. 7 may be an example. The pattern beam may also be a light source of a wavelength that does not interfere with the signal of the image camera, but temporal modulation.

The pattern beam collected through the pattern light receiving portion 112 collects the degree to which the pattern beam is distorted, deformed, or superimposed by the object, and the signal processing portion 120 calculates the degree of distortion based on the collected distortion, So that depth information of each part of the two-dimensional image can be calculated.

The depth information of each part thus calculated can be reflected in the two-dimensional image and can be generated as a three-dimensional image. The pattern light receiving unit 112 and the image camera 113 used at this time may be plural. The generated three-dimensional image can be displayed on the video output device 130.

By varying the position or angle of each pattern beam irradiating unit, pattern light receiving unit, or image camera, it is possible to increase the accuracy of the depth information or to generate and integrate object information of various angles.

According to an embodiment of the present invention, by projecting a plurality of pre-designed pattern beams onto an object, depth information on the object can be collected to quickly and accurately make a two-dimensional image into a three-dimensional image.

2 is a block diagram illustrating a three-dimensional image photographing apparatus 200 according to an embodiment of the present invention.

The apparatus 200 may include an image camera 210, a pattern beam irradiating unit 220, a pattern receiving unit 230, and a signal processing unit 240.

The image camera 210 may obtain a two-dimensional image of the object.

The pattern beam irradiating unit 220 may irradiate a pattern beam to the object corresponding to the image camera 210.

The pattern beam to be irradiated may include at least one of a point, a line (straight line, a curve), a figure (a rectangle, a triangle, a circle, a polygon and a variation thereof), an irregular pattern (a net structure, a tree structure, Images (abstraction, people, animals, and trees, etc.), or combinations thereof. In addition, the irradiated pattern beam can be regularly or irregularly arranged.

In addition, since the pattern beam irradiating unit 220 may be a coherent or in-coherent light source and preferably has characteristics that do not affect the acquisition of a two-dimensional image, it is preferable to use the light in the non- You can investigate. It may also be a pattern beam having temporal modulation.

In order to form various pattern beams, the pattern beam irradiating unit 220 may include a laser diode, an LED (Light Emitting Diode), an OLED (Organic Light Emitting Diode), a phase mask device, an amplitude mask ) Element, a diffractive optical element, and a liquid crystal display (LCD) panel.

The pattern beam to be irradiated is described in detail in Fig.

3 is a view for explaining a pattern beam according to an embodiment of the present invention.

As an example, the pattern beam to be irradiated can be expressed in various patterns using a diffractive optical element.

That is, the pattern beam to be irradiated may include a multiline pattern 310, a crosshair pattern 320, a dot pattern 330, a circle pattern 340, a line square pattern 350, a cross and circle pattern 360, 370, a dot line pattern 380, a single line 390, and the like.

In addition, the pattern beam irradiating unit 220 may be configured to irradiate a pattern beam representing an image of an irregular pattern such as a net structure, a tree structure, and a star structure, an abstraction, an image of a person, an animal, and a tree, You can investigate.

Preferably, the pattern beam of the present invention may be a pattern in which a short line (-), a bent line (a), or a cross line (+) are arranged singly or in combination.

Referring again to FIG. 2, the pattern light receiving unit 230 may collect a pattern change of the irradiated pattern beam.

That is, the pattern light receiving unit 230 may collect the pattern beam that has been reflected on the object and reflected by distortion, movement, disappearance, enlargement, reduction, and the like.

For example, the pattern light receiving unit 230 may be interpreted as a camera equipped with a band pass filter, a color filter, or the like, as it is preferable to collect only pattern information.

The signal processing unit 240 may calculate depth information of each part of the two-dimensional image based on the collected pattern deformation information.

The signal processing unit 240 may calculate depth information of each part according to the collected pattern change and may provide depth information for each part of the two-dimensional image generated by the image camera 210. [ When an image of a plurality of angles is generated by using a plurality of image cameras, one object image can be generated based on the angular image, and depth information of each part can be given.

The image output apparatus can output the two-dimensional image as a three-dimensional image using the provided depth information.

That is, the image output apparatus displays the depth information by using the depth information assigned to each part of the two-dimensional image. The depth image is displayed by putting the darkness into the depth of the depth image, and the protruding part is relatively bright .

The signal processing unit 240 may use an algorithm that uses a predetermined formula to calculate depth information for each part using a variation of the pattern or an algorithm that uses a library in which deformation information is stored in order to increase the speed and accuracy of the computation Can be used.

For example, it is possible to calculate depth information by calculating formulas such as number, enlargement, reduction, loss, movement, and shape distortion of detailed patterns.

As another example, in order to speed up and accuracy of calculation, the information calculated in advance by distance is stored in a library, and the signal processor can calculate the distance value by referring to the library in the degree of pattern deformation.

The signal processing unit 240 according to an exemplary embodiment of the present invention can form and analyze a partially sampled region of interest (ROI) in the calculation process, and can calculate the deformation of the entire pattern to convert depth information, The distance value can also be calculated based on the inter-correlation.

4 to 5 are views for explaining various embodiments for calculating depth information using a pattern beam according to an embodiment of the present invention.

First, FIG. 4 shows an embodiment in which depth information is calculated for each part of an object by using a slit beam as an example of a pattern beam.

A three-dimensional image capturing apparatus according to an embodiment of the present invention captures a two-dimensional image by capturing an object 410 using an image camera 430.

In response to this, a pattern beam in the form of a slit beam is irradiated onto the object 410 through the pattern beam irradiating unit 420.

The irradiated slit beam can acquire an image as denoted by reference numeral 440 by using a separate pattern beam receiving unit 440.

For example, when the function of the pattern beam light receiving unit for collecting the irradiated pattern beam is built in the image camera 430, the image camera 430 can collect the slit beam irradiated by the pattern beam irradiating unit 420 have.

Thus, the collected slit beam acquires an image 450 shown at reference numeral 440. [ By analyzing the image 450, the left part of the image camera 430 is closer to the object, and the depth information of the image camera 430 is farther to the right.

FIG. 5 illustrates a structure for calculating depth information on an object using the multiline pattern described in FIG.

Referring to FIG. 5, a reference image 520, which is a reference pattern, is compared with a measurement image 510 generated based on a partially modified beam pattern actually irradiated on an object to generate a three-dimensional image reflecting the depth information can do.

The measured image 510 and the reference image 520 can be represented by a phase-reflected mathematical formula, which can be calculated by a known 4-bucket algorithm.

Each phase value of the measurement image 510 and the reference image 520 may mean respective depth information so that the phase value calculated by the 4-bucket algorithm from the reference image 520, The depth information of the object can be calculated by comparing the phase calculated by the 4-bucket algorithm with the phase calculated by the 4-bucket algorithm.

As a result, the calculated depth information is reflected on the measured two-dimensional image to generate a three-dimensional image 530 in the form of a moire image.

Similarly, multiple dot patterns can be used. That is, when a multi-dot pattern is projected and the image is referenced, the depth value can be calculated by measuring changes in size, shape distortion, movement, number of detailed patterns, etc. of the multi-dot pattern when the object exists.

As a result, the three-dimensional image capturing apparatus according to an embodiment of the present invention acquires a two-dimensional image of a subject (object) and calculates depth information at each part of the obtained two-dimensional image using various pattern beams, Dimensional image.

A pattern is irradiated on an object by a pattern beam irradiating unit, a pattern deformed on an object is collected by a pattern beam light receiving unit, and a ROI (region of interest) of the collected pattern image is formed, Calculating a depth value of the collected ROI in terms of a distance by using an algorithm including a star pattern variation feature or an algorithm referring to a library including a pattern variation feature for each distance, And extracts a three-dimensional image of the object.

For example, the formula for distance-dependent pattern variation may be a number of detailed patterns such as points, lines, or figures existing in the ROI, a position, a size, a correlation between the detailed patterns, have. The library can be a value of some type of data, such as a graph or a chart, to increase or speed up the computation, or to increase accuracy.

6 is a flowchart illustrating a three-dimensional image capturing method according to an embodiment of the present invention.

A three-dimensional image capturing method according to an exemplary embodiment of the present invention may acquire a two-dimensional image of an object (step 601).

Next, a three-dimensional image capturing method according to an exemplary embodiment of the present invention may irradiate various types of pattern beams to the object (Step 602) and collect pattern variations of the irradiated pattern beams (Step 603 ).

The pattern beam is information capable of recognizing the position, and may be a point, a line (a straight line, a curve), a figure (a rectangle, a triangle, a circle, a polygon, Etc.), images (abstraction, human, animal, tree, etc.), and combinations thereof. In addition, the pattern beam can be regularly / irregularly arranged.

The 3D image capturing method according to an embodiment of the present invention can calculate depth information of each part of the two-dimensional image according to the collected pattern change (step 604).

In order to calculate depth information of each part of the two-dimensional image, a three-dimensional image capturing method according to an embodiment of the present invention forms a pattern in which a pattern captured according to a plurality of respective pattern beams is deformed or overlapped with a distance It is also possible to calculate the distance by analyzing the captured pattern based on the formula.

As another example, in order to calculate the depth information of each part of the two-dimensional image, the three-dimensional image capturing method according to an embodiment of the present invention refers to a library in which pattern deformation information for each distance is recorded, Depth information can be calculated.

Examples of features utilizing multiple pattern beams are shown in Figures 7-10. Figure 7 illustrates a pattern. Figure 8 is an example of a two-dimensional image. 9 is an image obtained from a pattern light receiving portion when a single pattern beam is irradiated. 10 is an image obtained from a pattern light receiving portion when a plurality of pattern beams are irradiated. 11 is a view showing an example of a case where a pattern image collected at different angles of a plurality of pattern light receiving units can acquire three-dimensional depth information of another angle of an object, Lt; / RTI >

12 schematically shows the positions of a plurality of pattern beams and objects.

As shown in FIG. 12, when the pattern beam is irradiated at two different positions, an image as shown in FIG. 10 in which a shadow effect is not added and a pattern beam overlap effect is added is obtained unlike the image (FIG. 9) irradiated with a single pattern. In addition, if a plurality of light receiving units of multiple angles or positions are arranged, depth information of other angles of the object can be secured, so that it is possible to generate three-dimensional information or an image of 360 degrees forward direction of the object.

The three-dimensional image capturing method according to an embodiment of the present invention can generate a three-dimensional image using the depth information of each part of the two-dimensional image (step 605).

The three-dimensional image capturing method according to an exemplary embodiment of the present invention may be implemented in the form of a program command that can be executed through various computer means and recorded in a computer-readable medium. The computer-readable medium may include program instructions, data files, data structures, and the like, alone or in combination. The program instructions recorded on the medium may be those specially designed and constructed for the present invention or may be available to those skilled in the art of computer software. Examples of computer-readable media include magnetic media such as hard disks, floppy disks and magnetic tape; optical media such as CD-ROMs and DVDs; magnetic media such as floppy disks; Magneto-optical media, and hardware devices specifically configured to store and execute program instructions such as ROM, RAM, flash memory, and the like. Examples of program instructions include machine language code such as those produced by a compiler, as well as high-level language code that can be executed by a computer using an interpreter or the like. The hardware devices described above may be configured to operate as one or more software modules to perform the operations of the present invention, and vice versa.

While the invention has been shown and described with reference to certain preferred embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims. This is possible.

Therefore, the scope of the present invention should not be limited to the described embodiments, but should be determined by the equivalents of the claims, as well as the claims.

Claims (6)

A plurality of pattern beam irradiation units each irradiating a predetermined pattern beam to the object;
At least one pattern light receiver configured to collect pattern changes of the irradiated pattern beams; And
And a signal processing unit for calculating depth information of each part of the object image according to the collected pattern change,
An apparatus for calculating depth information of an object. The method according to claim 1,
Wherein the pattern beam comprises at least one of a point at which the position is recognized, a straight line, a curve, a graphic, and an irregular pattern.
An apparatus for calculating depth information of an object. The method according to claim 1,
Further comprising a storage unit for storing a library or a pattern transformation formula for each distance,
Wherein the signal processing unit calculates depth information of each part according to the collected pattern change with reference to the library or the modification formula,
An apparatus for calculating depth information of an object. The method according to claim 1,
The plurality of pattern beam irradiators and the plurality of pattern light receivers are configured to irradiate and receive two or more surfaces in the multi-direction of the object, thereby calculating depth information of the multi-directional surfaces of the object.
An apparatus for calculating depth information of an object. As the depth information calculation method of the image of the object using the depth information calculation apparatus of the image of any one of Claims 1-4,
Irradiating the object with a plurality of pattern beams and collecting the irradiated pattern beam changes; And
Calculating depth information for each part of an object image by referring to the library or the deformation formula according to the collected pattern change.
A method for calculating depth information of an image. An image camera for acquiring a two-dimensional image of the object;
A pattern beam irradiating part for irradiating a predetermined pattern beam onto the object, wherein the irradiation is a pattern beam irradiation with a change in pattern information per distance;
A pattern light receiving unit for collecting a pattern change with respect to the irradiated pattern beam;
A storage unit which stores a library in which pattern information for each distance is recorded; And
And a signal processing unit for calculating depth information of each part of the two-dimensional image according to the collected pattern change and generating a three-dimensional image,
The signal processor is configured to calculate depth information of each part according to the collected pattern change by referring to the stored library.
Three-dimensional image shooting device.

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