KR20120048350A - Automatic test system for micro controller unit and method thereof - Google Patents

Abstract

PURPOSE: An automatic MCU(Micro Controller Unit) test system and a method thereof are provided to automatically test an MCU through a standardized automatic test method. CONSTITUTION: A software design information extracting unit(100) extracts design information about software. A TTCN-3(Testing and Test Control Notation-version 3) test system(200) generates a TTCN-3 test case by using the extracted software design information. The TTCN-3 test system compares a result value which is received from a target system to a prediction output value. The TTCN-3 test system determines a test result of the target system.

Description

AUTOMATIC TEST SYSTEM FOR MICRO CONTROLLER UNIT AND METHOD THEREOF

The present invention relates to a microcontroller unit (MCU) test automation method, and more particularly to a microcontroller unit for implementing a test environment close to a real system and automatically testing the microcontroller unit (MCU) through a standardized automated test method. (MCU) test automation system and method thereof.

Recently, due to the increased complexity of the software in the system development stage, a lot of time and effort is required in the test execution environment and test case design, and the possibility of errors in the test stage is also increasing.

As a result, standardization of software platform and development environment is gradually progressed to reduce the occurrence of errors due to software complexity and improve software reusability at the system development stage. As a result, due to the standardization of the software platform and the development environment, the system design stage reduced time and effort much, but the test stage for verifying the system caused many errors and problems, and the test was difficult.

Therefore, standardized automated test techniques are urgently needed to test the system stably and effectively, and it is important to construct a test environment closer to the real system for reliable and effective system verification.

Accordingly, an object of the present invention is to provide a microcontroller unit (MCU) test automation system and method for implementing a test environment close to a real system and automatically testing the microcontroller unit (MCU) through a standardized automated test method. It is.

According to an embodiment of the present invention for solving this problem, the MCU test automation system, in the test automation system for the MCU included in the target system, by analyzing the XML file of the standardized software design information for the software Software design information extraction unit for extracting the TTCN-3 test case using the extracted software design information, and compares the result value received from the target system with the expected output value obtained from the TTCN-3 test case TTCN-3 test system for determining a test result of the target system, and a communication interface connected between the TTCN-3 test system and the target system.

The software design information may include an input / output variable of the software component and a data type of the variable.

The TTCN-3 test system may include: a test case generator configured to generate a TTCN-3 test case using the extracted software design information; and using the TTCN-3 test case, obtain an expected output value of the test data; And a TTCN-3 tester configured to determine whether the target system is suitable by transmitting test data to the target system and then comparing the result value received from the target system with the expected output value.

The communication interface unit includes a software module connected to and communicated with the TTCN-3 test system, and a plurality of hardware modules connected to a plurality of MCUs included in the target system to perform communication through the software module. can do.

The plurality of MCUs may form a network with each other and perform internal communication.

At least one of the plurality of MCUs may be an MCU for testing an internal network.

According to another embodiment of the present invention, in the test automation method for the MCU included in the target system, extracting the design information for the software by analyzing the XML file of the standardized software, the extracted software design information Generating a TTCN-3 test case using the TTCN-3 test case; obtaining an expected output value for test data using the TTCN-3 test case; delivering the test data to the target system and then receiving a result value from the target system. And comparing the received result value with an expected output value to determine a test result of the target system.

As described above, according to the present invention, a test environment may be configured close to a real system at the stage of developing an embedded system to effectively test the function of the entire system in advance. In addition, the target system for testing is composed of real hardware to improve the reliability of the test results, and not only can test organically multiple MCUs like the actual embedded system, but also effectively test the network used inside the system. Can be.

And, test cases are automatically generated through standardized software design documentation, reducing the time and effort required to build a test environment.

1 is a view for explaining the configuration of a microcontroller unit test automation system according to an embodiment of the present invention.
2 is a view showing the configuration of a TTCN-3 test system according to an embodiment of the present invention.
3 is a diagram illustrating a configuration of a communication interface according to an embodiment of the present invention.
Figure 4 is a flow chart for explaining a microcontroller unit test automation method according to an embodiment of the present invention.

DETAILED DESCRIPTION Embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art may easily implement the present invention.

1 is a view for explaining the configuration of a microcontroller unit test automation system according to an embodiment of the present invention. As shown in FIG. 1, the microcontroller unit test automation system according to an exemplary embodiment of the present invention includes a software design information extracting unit 100, a TTCN-3 test system 200, a communication interface unit 300, and a target system 400. It is implemented as a Hardware In the Loop (HIL) system using real hardware based on standardized software design specification.

First, the software design information extraction unit 100 analyzes an XML file that is a standard software design specification and extracts information for generating a test case of a TTCN-3 (Testing and Test Control Notation-Version 3) standard format. TTCN-3 is a programming language used for testing communication protocols and web services.

For example, when the test target is a vehicle microcontroller unit, the software design information extracting unit 100 analyzes an AUTOSAR XML file, which is a standard software specification, and extracts information for generating a test case of a TTCN-3 standard format. .

The TTCN-3 test system 200 automatically receives the XML file information from the software design information extraction unit 100 and automatically generates a TTCN-3 test case for the black box test. The TTCN-3 test case is used to generate an expected result value for the input value. The TTCN-3 test system 200 transmits an input value to the target system 400 and receives a result value performed from the target system 400. In addition, the TTCN-3 test system 200 compares the result value received from the target system 400 with the expected result value, and determines whether the target system 400 passes the test.

The communication interface 300 is for information transmission between the TTCN-3 test system 200 and the target system 400, and includes a software module 310 and a plurality of hardware modules 320.

As shown in FIG. 1, the software module 310 is located in the same physical system as the TTCN-3 test system 200, and is illustrated in FIG. 1 as being set in the same PC terminal.

The software module 310 provides an interface for controlling the plurality of MCUs 410, 420a, 420b,..., 420n included in the target system 400 through the plurality of hardware modules 320. The TTCN-3 test system 200 and the software module 310 communicate using UDP / IP.

The plurality of hardware modules 320 are connected to the software module 310 through a USB, and receive a command signal from the software module 310 registers of the plurality of MCU (410, 420a, 420b, ..., 420n) corresponding to Direct control of hardware functions. As shown in FIG. 1, one TTCN-3 test system 200 is connected to one software module 310, and one software module 310 is connected to a plurality of hardware modules 320. The hardware module 320 is configured by the number of MCUs included in the target system 400.

The target system 400 is a simplified system designed to test a function of a system under development in advance, and is configured with hardware as close as possible to increase the reliability of the tester. The target system 400 is composed of a plurality of MCUs 410, 420a, 420b, ..., 420n like an actual embedded system, and is used by the plurality of MCUs 410, 420a, 420b, ..., 420n for internal communication. The network is configured in the same way as in the real world.

In addition, the MCU included in the target system 400 may be classified into one COM TEST MCU 410 and a plurality of test MCUs 420a, 420b,..., 420n. The COM TEST MCU 410 may be a target system 400. MCU to test the internal network. Here, the plurality of MCUs 410, 420a, 420b,..., 420n included in the target system 400 form a network by an internal network bus method and perform internal communication such as CAN communication, and a plurality of MCUs 410. , 420a, 420b,..., 420n may transmit data to the TTCN-3 test system 200 through the COM TEST MCU 410.

Hereinafter, the Com Test MCU 410 will be described in more detail.

If many embedded systems include multiple MCUs, the multiple MCUs operate organically, with each MCU using a specific internal network to exchange information with each other. To improve the reliability of embedded systems, there is a need for effective testing of these internal networks.

Com Test MCU 410 is preset to support various networks such as TCP / IP, CAN, Flexeray, TTCN-3 test system 200 is the type of network to test the internal network of the target system 400 You can test the internal network as if it were a real system by executing a test case with the contents of the and test packets. The Com Test MCU 410 receives a signal from the TTCN-3 test system 200, generates a packet for testing the internal network, delivers the packet to the internal network, and analyzes traffic in the internal network as necessary.

That is, the Com Test MCU 410 which receives the type of the network and the contents of the packet through the communication interface unit 300 may transmit a plurality of other MCUs 420a, 420b, …, 420n).

2 is a view showing the configuration of a TTCN-3 test system according to an embodiment of the present invention. As shown in FIG. 2, the TTCN-3 test system 200 includes a test case generator 210 and a TTCN-3 tester 220.

The test case generator 210 receives input / output variables and data types of variables of software components, which are software design information extracted from the software design information extractor 100, and receives equivalent classes of each data type. The test case generator 210 generates a boundary value analysis test case or an equivalent split test case using the extracted information. The test case generation unit 210 generates various test case algorithms using pairwise testing or decision table techniques using the extracted information.

Since the generated test case includes only input information, the expected output value is output through the test case algorithm. If necessary, additional test information such as a deadline may be input.

As such, the TTCN-3 test case is generated from the test case generator 210, and the TTCN-3 tester 220 which receives the TTCN-3 test case automatically tests the MCU using the TTCN-3 test case. To do it.

The TTCN-3 tester unit 220 includes a TTCN-3 test component 221, a TTCN-3 codec unit 222, and an interface unit 223.

The TTCN-3 test component 221 transmits test data, i.e., an input value, to the target system 400 and receives the performed result value to determine whether the test result has passed. The TTCN-3 codec unit 222 encodes a data type suitable for a communication protocol to transmit TTCN-3 test data (input value), and also converts data received from the communication protocol, that is, a result value into a TTCN-3 data type. Play a changing role. The interface unit 223 is responsible for UDP / IP communication for exchanging information with the software module 310.

3 is a diagram illustrating a configuration of a communication interface according to an embodiment of the present invention. As shown in FIG. 3, the communication interface 300 according to an embodiment of the present invention includes one software module 310 and a plurality of hardware modules 320, and the software module 310 includes the communication interface 312. The target codec unit 314 and the control interface 316 are included.

The communication interface 312 is responsible for UDP / IP communication for transferring information between the TTCN-3 tester 220 and the software module 310. The target codec 314 is responsible for decoding the information received from the TTCN-3 tester 220 according to the appropriate type.

The control interface 316 is connected to the plurality of hardware modules 320 and serves as an interface for controlling the plurality of MCUs 410, 420a, 420b,..., 420n through the hardware modules 320.

The hardware module 320 is a physical device capable of controlling the MCU and is connected to the software module 310 by USB. Since the hardware module 320 must be connected 1: 1 with the MCUs of the target system 400, the number of MCUs is required. The hardware module 320 may read and write registers of the connected MCU and control hardware functions. The hardware module 320 may perform a function such as Joint Test Action Group (JTAG) or Background Debug Mode (BDM) for debugging a system in an embedded system development environment. The hardware module 320 is connected to the software module 310 by USB, and distinguishes the MCU connected through the unique VID (Vender ID) and PID (Product ID). Each MCU must be physically connected to the appropriate hardware module 320 based on a standard software design.

4 is a flowchart illustrating a microcontroller unit (MCU) test automation method according to an embodiment of the present invention.

As shown in FIG. 4, the software design information extraction unit 100 analyzes an XML file that is a software design specification and extracts design information about the software (S410). The TTCN-3 test system 200 receives the extracted software design information and generates a TTCN-3 test case using the software design information (S420).

The TTCN-3 test system 200 generates an expected output value for the test data corresponding to the input value by using the TTCN-3 test case (S430). The TTCN-3 test system 200 transmits test data to the target system 400 and then receives a result value from the target system 400 (S440).

Then, the TTCN-3 test system 200 compares the result value received from the target system 400 with the expected output value obtained by using the TTCN-3 test case to determine whether the target system 400 passes the test (S450). ).

As described above, according to the exemplary embodiment of the present invention, the test environment may be configured to be close to the real system at the stage of developing the embedded system to effectively test the function of the entire system in advance. The target system for testing is composed of real hardware to improve the reliability of the test results, and not only can organically test multiple MCUs like the actual embedded system, but also effectively test the network used inside the system. have.

That is, in the embodiment of the present invention, by automatically configuring the HIL test system using real hardware based on the standardized software design specification, the reliability of the development system and the software reusability can be improved more effectively.

And, test cases are automatically generated through standardized software design documentation, reducing the time and effort required to build a test environment.

Embodiments of the present invention include a computer-readable medium having program instructions for performing various computer-implemented operations. This medium records a program for executing the microcontroller unit (MCU) test automation method described so far. The medium may include program instructions, data files, data structures, etc., alone or in combination. Examples of such media include magnetic media such as hard disks, floppy disks and magnetic tape, optical recording media such as CDs and DVDs, floppy disks and program commands such as magnetic-optical media, ROM, RAM, flash memory, and the like. Hardware devices configured to store and perform such operations. Alternatively, the medium may be a transmission medium such as an optical or metal wire, a waveguide, or the like including a carrier wave for transmitting a signal specifying a program command, a data structure, and the like. Examples of program instructions include not only machine code generated by a compiler, but also high-level language code that can be executed by a computer using an interpreter or the like.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments, Of the right.

Claims (10)

In the test automation system for the MCU included in the target system,
Software design information extraction unit for extracting the design information for the software by analyzing the XML file of the standardized software,
The TTCN-3 test case is generated using the extracted software design information, and the test result of the target system is determined by comparing the result value received from the target system with the expected output value obtained from the TTCN-3 test case. TTCN-3 test system, and
MCU test automation system including a communication interface connected between the TTCN-3 test system and the target system. The method of claim 1,
The software design information
MCU test automation system comprising input and output variables of the software component and data types of the variables. The method of claim 2,
The TTCN-3 test system,
A test case generation unit generating a TTCN-3 test case using the extracted software design information, and
The TTCN-3 test case is used to obtain an expected output value for the test data, transfer test data to the target system, and then compare the result value received from the target system with the expected output value to ensure suitability of the target system. MCU test automation system including a TTCN-3 tester to determine whether or not. The method of claim 3,
The communication interface unit,
A software module connected to and in communication with the TTCN-3 test system, and
MCU test automation system comprising a plurality of hardware modules connected to each of the plurality of MCU included in the target system, the communication through the software module. The method of claim 4, wherein
The MCU test automation system that forms a network with each other and performs internal communication. The method of claim 5,
At least one of the plurality of MCU MCU test automation system for testing the internal network MCU. In the test automation method for the MCU included in the target system,
Extracting design information about the software by analyzing XML files of standardized software;
Generating a TTCN-3 test case using the extracted software design information,
Obtaining an expected output value for test data using the TTCN-3 test case,
Passing the test data to the target system and then receiving a result value from the target system, and
And comparing the received result value with an expected output value to determine a test result of the target system. The method of claim 7, wherein
The TTCN-3 test system and the target system communicate through a communication interface unit,
The communication interface unit,
A software module connected to and in communication with the TTCN-3 test system, and
MCU test automation method comprising a plurality of hardware modules connected to each of the plurality of MCU included in the target system, the communication through the software module. The method of claim 8,
The MCU test automation method for forming a network with each of the plurality of MCU performs internal communication. 10. The method of claim 9,
At least one of the plurality of MCU is MCU MCU test automation method for testing an internal network.

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