KR20120004751A - Image sensor and method for operating thereof in a semiconductor device - Google Patents

Abstract

PURPOSE: An image sensor and a method for operating thereof in a semiconductor device are provided to effectively correct a multi dead pixel. CONSTITUTION: A memory(245) stores the Bayer low data of a pixel array. A window configuration unit(210) constitutes the window of the predetermined size in pixel array. Operation units(215,220,230) detect a dead pixel which is generated from the pixel array through the window. Corresponding to the generation of the dead pixel, the operation unit corrects and calculates the saved Bayer low data. A processor(240) updates an operation value of the correction operation in real time.

Description

Image sensor and method for operating method in a semiconductor device

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device, and in particular, an image signal processing (ISP) of an image sensor (IS) (hereinafter referred to as an 'IS') in a semiconductor device. It is about.

In general, an image sensor is a semiconductor device that converts light, which is an analog signal, into an electrical signal. Currently, not only digital cameras, but also mobile phones, smart phones, camera phones, PDA (Personal Digital Assistant) terminal, such as a camera module is equipped with a function that can take the image is popularized. In such a camera system, an image sensor is formed by arranging a plurality of pixels in a two-dimensional structure, and pixels, as described above, differentiate an optical signal, which is an analog signal, according to brightness and convert it into an electrical signal.

Such image sensors are used in a wide range of fields, from home appliances such as digital cameras and mobile phones, to endoscopes used in hospitals, and to satellite telescopes around the earth. Among the various image sensors, IS produced by CMOS manufacturing technology In addition, it is easy to drive and implement various scanning methods, and it is possible to reduce the size of the product by implementing a circuit for signal processing with a simple structure, and to reduce the manufacturing cost and power consumption by using a compatible CMOS technology. It also has the advantage of being very low.

On the other hand, in general, IS, as described above, a plurality of pixels are implemented as a plurality of pixel arrays (pixel array) as a two-dimensional structure, in such a pixel array, IS does not normally react to light due to various factors during the manufacturing process of the IS Bad pixels may occur. In other words, the IS may generate pixels that do not operate normally due to various reasons during the manufacturing process. Such defective pixels may not react normally to light, and the image output from the IS including abnormal defective pixels may be different from the actual image. Will display another distorted image. The defective pixels that do not respond normally to light may appear brighter or darker than the actual image, and the visually significant difference between the pixels and the surrounding pixels is greater than the preset threshold.

Therefore, the performance of the IS depends on the number of bad pixels included in the plurality of pixel arrays. In particular, an error due to bad pixels in the IS may appear as small spots or lines on the screen, where an IS having such a partial error is present. If all of the chips are determined to be defective chips, there is a problem that the production yield of the IS is reduced.

Therefore, there is a need for a method for improving the performance of the IS by detecting a bad pixel in the pixel array of the IS and correcting the detected bad pixel. In particular, currently, methods for detecting and correcting defective pixels generated in the pixel array of the IS have been proposed, but the proposed methods do not effectively support the correction of the bad pixels, and also require a large memory to correct the bad pixels. There is a problem. Accordingly, there is a need for a method for effectively correcting defective pixels of the IS, and in particular, improving performance of the IS by increasing correction coverage of the defective pixels with minimal memory usage.

The present invention provides an image sensor for detecting and correcting a defective pixel in a pixel array of an image sensor, and a method of operating the image sensor for detecting and correcting the defective pixel.

In the semiconductor device of the present invention for achieving the above object, the image sensor, the memory for receiving and storing the bayer raw data (pixel raw data) of the pixel array (pixel array); A window constructing unit configured to form a window having a predetermined size in the pixel array; An operation unit configured to detect generation of a dead pixel in the pixel array through the window and perform a correction operation on the stored Bayer row data in response to the generation of the dead pixel; And a processor configured to control the correction operation, store Bayer row data and data information corresponding to the window, and update and store the operation value of the correction operation together with the memory in real time. During a correction operation on a clock, the correction operation is performed on the stored Bayer row data using an operation value of a previous clock of the predetermined clock previously stored in the memory.

In accordance with an aspect of the present invention, a method of operating an image sensor includes: receiving and storing bayer raw data of a pixel array; Reading the stored Bayer row data to form a window having a predetermined size in the pixel array, and storing Bayer row data and data information corresponding to the window; Detecting and correcting occurrence of a dead pixel in the pixel array through the window; And updating and storing the correction value of the dead pixel in real time, wherein the correcting includes updating the real pixel to compensate for the bad pixel data (BPC) with respect to the stored Bayer row data using the previously stored correction value. : Perform Bad Pixel Compensation and Bayer Noise Reduction (BNR) in parallel.

The present invention effectively performs correction of multi-dead pixels occurring in the pixel array.

1 is a view schematically showing a dead pixel correction unit structure of an image sensor in a semiconductor device.
FIG. 2 schematically illustrates a structure of a dead pixel corrector of an image sensor in a semiconductor device according to an embodiment of the present disclosure.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings. It should be noted that in the following description, only parts necessary for understanding the operation according to the present invention will be described, and descriptions of other parts will be omitted so as not to distract from the gist of the present invention.

The present invention relates to a bad pixel generated in a plurality of pixel arrays, namely a multi dead pixel, in an image signal processing (ISP) in a semiconductor device. The present invention proposes an image sensor for detecting and correcting an error, and an operation method for correcting a dead pixel that is a bad pixel of the image sensor. Here, in the embodiment of the present invention, the correction pixel value output from the dead pixel correction unit at the ISP of the image sensor (IS) (hereinafter, referred to as 'IS') is processed by minimizing memory usage. Compensates for the multi-dead pixels generated in the shared pixel architecture, minimizing the use of line memory to reduce the size of the chip implementing the image sensor.

According to an embodiment of the present invention, the IS effectively supports the correction of the multi-dead pixels generated in the pixel array at the ISP of the IS, and in particular, increases the correction coverage of the dead pixel correction unit for correcting the multi-dead pixels. In this case, the correction effect of the multi-dead pixels is improved, and the use of memory for the correction of the multi-dead pixels is minimized. Here, in an embodiment of the present invention, when a dead pixel, which is a bad pixel, occurs in the pixel array of the IS, a correction is performed, the corrected pixel value is updated in memory in real time, and a dead pixel correction of the dead pixel correction unit. By performing a bad pixel compensation (BPC) and Bayer Noise Reduction (BNR) function in parallel to improve the correction effect of the multi-dead pixels.

Further, in an embodiment of the present invention, the dead pixel correction unit uses a line memory for pixel correction in a Bayer raw data processing area at an ISP of the IS, wherein the dead pixel correction unit includes a bad pixel compensation function, Bayer noise reduction function, and Gr-Gb function. In addition, in an embodiment of the present invention, a function of an on-fly error correction operation for effectively correcting multi-dead pixels generated in a shared pixel structure and a single pixel structure, and for real-time correction To improve. Here, in the embodiment of the present invention, the line memory is required for each function of the dead pixel correction unit of the IS to minimize the memory usage, thereby reducing the chip size and chip manufacturing cost of the IS.

In other words, in the embodiment of the present invention, when the dead pixel correction unit processes the Bayer row data in the bayer domain, as described above, the bad pixel compensation function, the Bayer noise reduction function, and the Gr-Gb function may be performed. In order to improve the chip size of IS caused by using each line memory to store the output data of each function by configuring a window for each function, Dead pixel correction minimizes image distortion of each function of the dead pixel corrector.

That is, in an embodiment of the present invention, in order to reduce the chip size of the IS, a single number of memories corresponding to the bad pixel compensation function, the Bayer noise reduction function, and the Gr-Gb function, respectively, of the dead pixel correction unit is provided. If a dead pixel is generated in the pixel array, the generated dead pixel is corrected, and the correction value of the dead pixel correction is updated and stored in real time. In the case of multi-dead pixel correction, pixel values read from the memory for the bad pixel compensation function, the Bayer noise reduction function, and the window configuration in the Gr-Gb function are reflected in half of the pixel values. Becomes

Here, as the correction value of the dead pixel correction is updated in real time to the memory, the pixel value updated from the memory when the dead pixel correction unit, the Bayer noise reduction function, and the Gr-Gb function are executed, that is, the memory. The function of the dead pixel corrector is minimized by configuring the window by reading the pixel value reflected from the correction. In this case, when the memory corresponding to the bad pixel compensation function, the Bayer noise reduction function, and the Gr-Gb function of each of the dead pixel correction unit is implemented as one memory without a real time update through the above-described memory controller, the dead pixel correction unit Since the correction is not reflected in the pixel value read from the memory for the bad pixel compensation function, the Bayer noise reduction function, and the GrGbC function, the function of each function of the dead pixel corrector may be degraded. . However, in the embodiment of the present invention, by performing the real-time update to the pixel value reflecting the correction through the memory control unit as described above, the functional degradation of each function of the dead pixel correction unit is minimized.

According to an embodiment of the present invention, when the Bayer row data is received, the input Bayer row data is stored in the line memory for the window configuration, and the Bayer row data stored in the line memory is read to configure the window, and then the parallel Bayer row data read at the same time is input to perform the bad pixel compensation function and the Bayer noise reduction function. In addition, after performing the arithmetic function on the Bayer row data, that is, the pixel data in the bad pixel compensation function and the Bayer noise reduction function of the dead pixel corrector, if the dead pixel is generated and the correction function is performed, the Gr-Gb function Outputs the correction value through the Gr-Gb offset correction using the arithmetic value of the bad pixel compensation function, and if the correction function is not performed because no dead pixel occurs, the Gr-Gb function uses the Bayer noise reduction function -Output the correction value through Gb offset correction. Here, when the dead pixel is generated and the correction function is performed, at the same time, the pixel value corrected in real time through the memory update is stored in the memory, and the pixel value stored in the memory is then compensated for the next bad pixel by the dead pixel correction unit. Used to calculate the dead pixel's correction coverage. Next, the dead pixel correction unit in the semiconductor device will be described in more detail with reference to FIG. 1.

1 is a diagram schematically illustrating a structure of a dead pixel corrector of an image sensor in a semiconductor device. 1 is a diagram schematically illustrating a structure in which a dead pixel corrector for performing correction of a dead pixel generated in a pixel array includes a memory for each function.

Referring to FIG. 1, the dead pixel corrector of the image sensor may include an input unit 105 to which Bayer row data is input as pixel data, a memory 1 145 to store Bayer row data input to the input unit 105, and The window array unit 1110 configured to read Bayer row data, that is, pixel data, stored in the memory 1 145 to form a window in the pixel array, and the window array configured by the window configuration unit 1110 in the pixel array. And a calculation unit 1 115 that performs calculation of a bad pixel compensation function on the generated Bayer row data of the dead pixel.

The dead pixel corrector of the image sensor may further include a memory row 150 storing Bayer row data on which the calculation of the bad pixel compensation function is performed by the operation unit 1 115, and a Bayer row stored in the memory 2 150. Bayer noise for the Bayer row data in which dead pixels are not generated in the pixel array through the window constructing unit 2 120 that reads data to form a window in the pixel array and the window configured by the window constructing unit 2 120. And a calculation unit 2 (125) for performing the calculation of the reduction function.

The dead pixel corrector of the image sensor may further include a memory row 3 155 for storing Bayer row data on which Bayer noise reduction is performed by the operation unit 2 125, and a bayer row stored in the memory 3 155. Window configuration unit 2 (120) which reads data and configures a window in the pixel array, and Gr-Gb offset with the Gr-Gb function for Bayer row data of the pixel array through the window configured by the window configuration unit 2 (120). And an output unit 140 for correcting the pixel value corrected by the Gr-Gb offset correction of the calculation unit 3 135.

Here, the window constructing unit 1 110 reads pixel data which is Bayer row data stored in the memory 1 145 to form a window for detecting a dead pixel in the pixel array. The operation unit 1 115 detects a dead pixel generated in the pixel array through the configured window, performs a bad pixel compensation operation, and outputs an operation value of the bad pixel compensation operation.

In addition, the window configuration unit 2 120 reads Bayer row data stored in the memory 2 150 like the window configuration unit 2 120 to configure a window for detecting occurrence of a dead pixel in the pixel array. do. In addition, since the dead pixel is not generated in the pixel array through the configured window, the operation unit 2 125 performs a Bayer noise reduction operation on Bayer row data of the pixel array, and performs the Bayer noise reduction operation. Output the operation value.

The window constructing unit 3 130 reads Bayer row data stored in the memory 3 155 to form a window for performing the Gr-Gb function on the pixel array. The calculation unit 3 135 performs Gr-Gb offset correction on Bayer row data of the pixel array through the configured window, and outputs a correction value of the Gr-Gb offset correction as a corrected pixel value. The window constructer 1110, the window constructer 2120, and the window constructer 3130 constitute windows of the same size in a pixel array of Bayer row data stored in each memory, for example, an N × N window. It is preferable to configure a, and may configure windows of various sizes and windows of different sizes according to the performance of the image sensor.

As such, the dead pixel correction unit of the image sensor illustrated in FIG. 1 includes the memories 145, 150, and 155 for each function, that is, the defective pixel compensation function, the Bayer noise reduction function, and the Gr-Gb function. Implementing chip size and chip manufacturing cost can be increased. In order to solve this problem, an embodiment of the present invention implements one memory for each function of the above-described dead pixel correction unit, that is, one for the bad pixel compensation function, the Bayer noise reduction function, and the Gr-Gb function. Memory of includes.

In other words, in an embodiment of the present invention, Bayer row data input at the ISP of the IS corresponding to an operating clock is stored in a memory for window configuration, and the window is configured by reading data stored in the memory. The dead pixels generated in the pixel array are detected through the configured window to perform the bad pixel compensation function and the Bayer noise reduction function in a parallel structure, and then perform the Gr-Gb function to perform the dead pixels generated in the pixel array at a predetermined operation clock. To correct. At this time, the corrected pixel value of the predetermined operation clock is updated and stored in the memory in real time, and the corrected pixel value of the predetermined operation clock stored in the memory is stored in the pixel array at the next operation clock of the predetermined operation clock. It is used to perform the bad pixel compensation function to correct the dead pixels. Next, the dead pixel correction of the image sensor in the semiconductor device according to the exemplary embodiment of the present invention will be described in more detail with reference to FIG. 2.

2 is a diagram schematically illustrating a structure of a dead pixel corrector of an image sensor in a semiconductor device according to an embodiment of the present disclosure. 2 is a diagram schematically illustrating a structure in which a dead pixel corrector for performing correction of dead pixels generated in a pixel array includes one memory for each function.

Referring to FIG. 2, the dead pixel correcting unit of the image sensor may include an input unit 205 to which Bayer row data is input as pixel data, and a single number of memory units to store Bayer row data input to the input unit 205. 245, a window constructing unit 210 configured to read Bayer row data stored in the memory 245, that is, pixel data to form a window in the pixel array, and a window configured by the window constructing unit 210. And a calculation unit 1 (215) for performing a bad pixel compensation function on the Bayer row data of the dead pixel.

The dead pixel corrector of the image sensor may be configured to perform a Bayer noise reduction function on Bayer row data in which no dead pixel is generated in the pixel array through a window configured by the window configuration unit 210. 220, and a compensation unit 225 for performing a correction function by receiving the output of the operation unit 1 215 and the output of the operation unit 2 220, and as a result of performing the correction function output from the compensation unit 225, That is, the comparator 250 confirms whether the corrected pixel value is the pixel value on which the correction function is normally performed, and uses the output of the comparator 250 to perform Gr-Gb function on the Bayer row data of the pixel array. A calculation unit 3 230 for performing a Gb offset correction, an output unit 335 for outputting a corrected pixel value by the Gr-Gb offset correction of the calculation unit 3 230, and the image sensor as described above. And a processor 240 for controlling and handling the calibration operation of the pixel correction.

Here, the processor 240 stores the input Bayer row data, and the Bayer row data corresponding to the window configured by the window configuration unit 210 in the pixel array and the Bayer row data corresponding to the window. Store data information. In this case, Bayer row data corresponding to the window is also stored in the memory 245. The processor 240 corrects the dead pixel correction unit by using the operation value of the bad pixel compensation operation output by the operation unit 1 215 and the operation value of the Bayer noise reduction operation output by the operation unit 2 220. Control the function.

In addition, the processor 240 outputs the Bayer row data and the data information corresponding to the stored window to the compensation unit 225 as described above. The compensator 225 confirms the Bayer row data corresponding to the window and the correction of the Bayer row data corresponding to the generation of the dead pixel in the pixel array through the data information, and compensates the defective pixel with the result of the check. Outputs the operation value of the operation, or outputs the operation value of the Bayer noise reduction operation. Here, when the dead pixel is generated in the pixel array through the Bayer row data corresponding to the window and the correction function is performed, the compensator 225 calculates an operation value of the bad pixel compensation operation as a result of performing the correction function. If the dead pixel does not occur, the operation value of the Bayer noise reduction operation is output as a result of performing the correction function. At this time, the operation value of the bad pixel compensation operation and the operation value of the Bayer noise reduction operation are updated and stored and managed in real time in the processor 240 or the memory 245.

The comparison unit 250 confirms whether the output of the compensation unit 225, that is, the operation value of the bad pixel compensation operation or the Bayer noise reduction operation is a normal operation value. And the operation values that are updated and stored in real time in the processor 240 at a previous operation clock and stored. In other words, the comparator 250 compares the computed values that are updated and stored in real time to the processor 240 in real time with the computed values input from the compensator 225, and confirms the result. The calculated values are output to the calculator 3230.

The window constituting unit 210 reads pixel data, which is Bayer row data stored in the memory 245, to configure a window for detecting dead pixels in the pixel array. At this time, the window configuration unit 210, it is preferable to configure a window of a predetermined size in the pixel array of Bayer row data stored in the memory 245, for example, configure an N × N window, depending on the performance of the image sensor You can also configure a window of size.

In addition, the operation unit 1 215 and the operation unit 2 220 of the parallel structure perform the bad pixel compensation operation or the Bayer noise reduction operation through the window configured by the window configuration unit 210, respectively. In other words, when a dead pixel is generated in the pixel array through the configured window, the operation unit 1 215 detects the generated dead pixel to perform a bad pixel compensation operation, and calculates an operation value of the bad pixel compensation operation. Outputs In addition, when a dead pixel does not occur in the pixel array through the configured window, the operation unit 2 220 performs a Bayer noise reduction operation on Bayer row data of the pixel array in which the dead pixel does not occur. The operation value of the Bayer noise reduction operation is output. Here, the bad pixel compensation operation of the operation unit 1 215 and the Bayer noise reduction operation of the operation unit 2 220 are performed in parallel, that is, the operation unit 1 215 and the operation unit 2 220 are implemented in a parallel structure. .

In this case, the operation value of the bad pixel compensation operation output from the operation unit 1 215 is updated and stored in the memory 245 as a corrected pixel value in real time. That is, the operation value of the bad pixel compensation operation is updated and stored in real time in the memory 240 for each operation clock, and the operation value of the bad pixel compensation operation stored in the predetermined operation clock is calculated in the next operation clock of the predetermined operation clock. Reference is made when 1 215 detects a dead pixel occurring in the pixel array and performs a bad pixel compensation operation. When the bad pixel compensation operation of the operation unit 1 215 is performed as described above, the bad pixel compensation operation of the operation unit 1 215 is performed by referring to the operation value of the bad pixel compensation operation of the previous operation clock. The correction coverage of the dead pixel is increased.

As described above, the operation unit 3 230 receives the operation value of the bad pixel compensation operation or the operation value of the Bayer noise reduction operation from the comparator 250, and uses the input operation value to perform the pixel array. After performing the Gr-Gb offset correction operation on Bayer row data of, the operation value obtained by the Gr-Gb offset correction operation is output as the corrected pixel value of the pixel array. Here, the operation unit 3 230 receives Bayer row data of the pixel array from the processor 240 to perform the Gr-Gb offset correction operation, and the operation value of the Gr-Gb offset correction operation is It is stored and managed in the processor 240 or the memory 245.

As described above, the dead pixel correction unit of the image sensor stores the operation value of the bad pixel compensation operation in the memory 245, and the operation value of the stored bad pixel compensation operation is as described above. It is used in the calculation of bad pixel compensation of dead pixels in the operation clock. The dead pixel corrector of the image sensor outputs a pixel value corrected by the Gr-Gb offset correction, and compensates for a bad pixel at a previous operating clock during a bad pixel compensation operation of a dead pixel at the next operating clock. By using the calculation value calculated through the calculation, the correction coverage of the dead pixel of the image sensor is increased.

That is, the image sensor according to an embodiment of the present invention updates and stores the pixel value corrected at the current operating clock in real time through a memory, and then uses the stored pixel value when correcting the dead pixel at the next operating clock. Thereby increasing the correction coverage of the dead pixels in the pixel array, and also by implementing a memory for dead pixel correction functions such as bad pixel compensation, Bayer noise reduction, and Gr-Gb functions in one memory, Reduce memory size In addition, the image sensor according to the embodiment of the present invention, as described above by implementing a memory for each function of the dead pixel correction as a single memory, by reducing the storage and read operation of the data to the corresponding memory in each function Improve the operating speed of the image sensor.

While the invention has been shown and described with reference to certain preferred embodiments thereof, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention. Therefore, the scope of the present invention should not be limited to the described embodiments, but should be determined not only by the scope of the following claims, but also by the equivalents of the claims.

Claims (16)

A memory for receiving and storing bayer raw data of a pixel array;
A window constructing unit configured to form a window having a predetermined size in the pixel array;
An operation unit configured to detect generation of a dead pixel in the pixel array through the window and perform a correction operation on the stored Bayer row data in response to the generation of the dead pixel;
And a processor for controlling the correction operation, storing Bayer row data and data information corresponding to the window, and updating and storing the calculation value of the correction operation in real time with the memory.
And the calculation unit performs the correction operation on the stored Bayer row data by using an operation value of a previous clock of the predetermined clock pre-stored in the memory.
The method of claim 1,
The operation unit may perform a bad pixel compensation (BPC) operation and a Bayer Noise Reduction (BNR) operation in parallel through the window.
The method of claim 1, wherein the operation unit,
A first operation unit configured to output a first operation value by performing a bad pixel compensation (BPC) operation on Bayer row data of the dead pixel when the dead pixel occurs in the pixel array;
A second operation unit configured to output a second operation value by performing a Bayer Noise Reduction (BNR) operation on the stored Bayer row data when the dead pixel does not occur in the pixel array;
And a third operation unit configured to perform a Gr-Gb offset correction operation on the stored Bayer row data using one of the first operation value and the second operation value.
The method of claim 3,
Receiving Bayer row data and data information corresponding to the window from the processor to confirm occurrence of the dead pixel, and calculating one of the first operation value and the second operation value corresponding to the generation of the dead pixel. Compensation unit for outputting a value; image sensor comprising a. The method of claim 3,
And a comparator for checking whether the one arithmetic value is a normal corrected arithmetic value and outputting the arithmetic value to the third arithmetic unit as the normal corrected arithmetic value.
The method of claim 5,
The comparator receives an operation value of a pre-stored correction operation updated in real time with the memory from the processor, and the one operation value corresponding to the correction operation at the predetermined clock and the operation value of the pre-stored correction operation. Check by comparing the image sensor.
The method of claim 3,
The memory may include a single number, and store the Bayer row data corresponding to an operation performed by the first operation unit, the second operation unit, and the third operation unit, respectively.
The method of claim 7, wherein
And the first operation unit, the second operation unit, and the third operation unit read the stored Bayer row data and perform corresponding operations through the window.
The method according to claim 2 or 3,
And the memory and the processor store the operation value of the bad pixel compensation operation as the operation value of the correction operation.
The method of claim 1,
The window configuration unit reads the stored Bayer row data to configure the window.
Receiving and storing Bayer raw data of a pixel array;
Reading the stored Bayer row data to form a window having a predetermined size in the pixel array, and storing Bayer row data and data information corresponding to the window;
Detecting and correcting occurrence of a dead pixel in the pixel array through the window; And
And updating and storing the correction value of the dead pixel in real time.
The correcting may include updating a bad pixel compensation (BPC) operation and a Bayer Noise Reduction (BNR) operation on the stored Bayer row data using the pre-stored correction value. Operating method of the image sensor, characterized in that performed by.
The method of claim 11, wherein the correcting step,
The occurrence of the dead pixel is confirmed using Bayer row data and data information corresponding to the stored window, and the operation value of the bad pixel compensation operation and the Bayer noise reduction operation corresponding to the occurrence of the confirmed dead pixel. Checking whether one of the calculation values is a normal correction operation; And
And performing a Gr-Gb offset correction operation on the stored Bayer row data using the checked one operation value.
The method of claim 12,
The determining of whether the normal correction operation is performed may include updating the real-time correction value and comparing the previously stored correction value with the one operation value.
The method of claim 11 or 12,
The correcting may include performing the bad pixel compensation operation on Bayer row data of the dead pixel when the dead pixel is generated in the pixel array through the window.
The method of claim 14,
In the updating and storing in real time, the operation value of the bad pixel compensation operation is stored as a correction value of the dead pixel.
The method according to claim 11 or 12, wherein
The correcting may include performing the Bayer noise reduction operation on the stored Bayer row data when the dead pixel does not occur in the pixel array through the window.

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