KR20100114622A - 표면 플라즈몬 공명 센서 및 이를 이용한 특성 측정방법 - Google Patents
표면 플라즈몬 공명 센서 및 이를 이용한 특성 측정방법 Download PDFInfo
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- KR20100114622A KR20100114622A KR1020090033085A KR20090033085A KR20100114622A KR 20100114622 A KR20100114622 A KR 20100114622A KR 1020090033085 A KR1020090033085 A KR 1020090033085A KR 20090033085 A KR20090033085 A KR 20090033085A KR 20100114622 A KR20100114622 A KR 20100114622A
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- 238000002198 surface plasmon resonance spectroscopy Methods 0.000 title claims abstract description 62
- 238000000034 method Methods 0.000 title claims abstract description 15
- 239000002184 metal Substances 0.000 claims abstract description 51
- 229910052751 metal Inorganic materials 0.000 claims abstract description 51
- 239000004038 photonic crystal Substances 0.000 claims abstract description 48
- 239000010409 thin film Substances 0.000 claims abstract description 31
- 230000007547 defect Effects 0.000 claims abstract description 20
- 239000000758 substrate Substances 0.000 claims abstract description 13
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- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 229910052709 silver Inorganic materials 0.000 claims description 3
- 229910004541 SiN Inorganic materials 0.000 claims description 2
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 2
- 229910010413 TiO 2 Inorganic materials 0.000 claims description 2
- 239000002061 nanopillar Substances 0.000 claims description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
- G01N21/553—Attenuated total reflection and using surface plasmons
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
- G01N21/553—Attenuated total reflection and using surface plasmons
- G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/08—Mirrors
- G02B5/09—Multifaceted or polygonal mirrors, e.g. polygonal scanning mirrors; Fresnel mirrors
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- H01L31/02—
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N2021/258—Surface plasmon spectroscopy, e.g. micro- or nanoparticles in suspension
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- Optics & Photonics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims (13)
- 베이스 기판과;상기 베이스 기판 상에 형성된 금속 박막층과;상기 금속 박막 상에 형성된 결함을 갖는 광결정층이 구비되는 표면 플라즈몬 공명 센서.
- 제 1항에 있어서, 상기 광결정층은 금속 광결정층인 것을 특징으로 하는 표면 플라즈몬 공명 센서.
- 제 1항에 있어서, 상기 광결정층은 유전체 광결정층인 것을 특징으로 하는 표면 플라즈몬 공명 센서.
- 제 2항에 있어서, 상기 금속 광결정층 상에 형성된 결함이 있는 유전체 광결정층이 더 형성되는 것을 특징으로 하는 표면 플라즈몬 공명 센서.
- 제 1항 내지 제 4항 중 어느 한 항에 있어서, 상기 베이스 기판과 상기 금속 박막층 사이에 Cr층이 개재되는 것을 특징으로 하는 표면 플라즈몬 공명 센서.
- 제 1항 내지 제 4항 중 어느 한 항에 있어서, 상기 금속 박막층은 Au, Al, Ag 또는 Cu 중에서 선택된 어느 하나인 것을 특징으로 하는 표면 플라즈몬 공명 센서.
- 제 1항, 제 2항 또는 제 4항 중 어느 한 항에 있어서, 상기 금속 광결정층은 Au, Al, Ag 또는 Cu 중에서 선택된 어느 하나인 것을 특징으로 하는 표면 플라즈몬 공명 센서.
- 제 3항 또는 제 4항에 있어서, 상기 유전체 광결정층은 ZnO, TiO2, SiO2 또는 SiNx 중에서 선택된 어느 하나인 것을 특징으로 하는 표면 플라즈몬 공명 센서.
- 제 1항 내지 제 4항 중 어느 한 항에 있어서, 상기 광결정층은 나노 홀 또는 나노 기둥을 포함하는 것을 특징으로 하는 표면 플라즈몬 공명 센서.
- 제 1항 내지 제 4항 중 어느 한 항에 있어서, 상기 표면 플라즈몬 공명 센서는 고굴절률을 갖는 매질 상에 형성되는 것을 특징으로 하는 표면 플라즈몬 공명 센서.
- 제 10항에 있어서, 상기 고굴절률을 갖는 매질은 프리즘인 것을 특징으로 하는 표면 플라즈몬 공명 센서.
- 제 1항 내지 제 4항 중의 어느 한 항에 따른 표면 플라즈몬 공명 센서를 이용한 특성 측정방법은,입사되는 검사광이 상기 결함 부분에서 측정하고자 하는 피검체와의 반응으로 발생하는 공명각의 변화로 상기 피검체의 특성을 측정하는 것을 특징으로 하는 표면 플라즈몬 공명 센서를 이용한 특성 측정방법.
- 제 12항에 있어서, 상기 특성 측정이 상기 입사 검사광에 대한 반사광 또는 투과광을 측정하는 것을 특징으로 하는 표면 플라즈몬 공명 센서를 이용한 특성 측정방법.
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KR20100114622A true KR20100114622A (ko) | 2010-10-26 |
KR101083605B1 KR101083605B1 (ko) | 2011-11-16 |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10379111B2 (en) * | 2013-04-12 | 2019-08-13 | Nsk Ltd. | Target substance capturing device |
CN113295649A (zh) * | 2021-06-24 | 2021-08-24 | 湖北科技学院 | 一种用于病理切片检测的光子晶体 |
KR20220090929A (ko) * | 2020-12-23 | 2022-06-30 | 광운대학교 산학협력단 | 복수의 네트워크 나노구조체를 포함하는 광검출기용 기판 및 이를 이용하는 광검출기 |
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CN106199786B (zh) | 2016-08-29 | 2019-05-03 | 上海交通大学 | 金属微纳米结构及端面具有金属微纳米结构的光纤 |
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US7639362B2 (en) | 2006-07-25 | 2009-12-29 | The Regents Of The University Of Michigan | Photonic crystal sensor |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10379111B2 (en) * | 2013-04-12 | 2019-08-13 | Nsk Ltd. | Target substance capturing device |
KR20220090929A (ko) * | 2020-12-23 | 2022-06-30 | 광운대학교 산학협력단 | 복수의 네트워크 나노구조체를 포함하는 광검출기용 기판 및 이를 이용하는 광검출기 |
CN113295649A (zh) * | 2021-06-24 | 2021-08-24 | 湖北科技学院 | 一种用于病理切片检测的光子晶体 |
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