KR20100101372A - Appratus and method for testing touch sensing panel - Google Patents

Abstract

PURPOSE: An apparatus and method for testing touch sensing panel are provided to determine the fault of a contact sensor panel based on the measured capacitance. CONSTITUTION: A measuring unit(141) is connected to a sensing electrode and a wiring pattern through a sensing channel. The electrostatic capacity of the wiring pattern and sensing electrode is measured at each sensing channel. A determining unit(142) determines whether the electrostatic capacity is within a critical range. If the electrostatic capacity is over the critical range in at least one sensing channel, the determining unit determines the contact sensing channel is fault.

Description

APPLICATION AND METHOD FOR TESTING TOUCH SENSING PANEL

Disclosed is a touch sensing panel inspection apparatus and method. In particular, disclosed is a touch sensing panel inspection apparatus and method capable of inspecting whether a defect occurs in a sensing electrode and a wiring pattern included in a touch sensing panel.

Recently, due to the emergence of various information devices, interest in input devices capable of controlling such information devices has been amplified.

In particular, many researches have been conducted on input devices based on touch input, such as touch screens and touch keys.

When a touch occurs, a touch sensing device such as a touch screen or a touch key may provide a user with an intuitive input interface by identifying a location where the touch occurs and controlling an operation of the electronic device according to the touch.

In general, the touch sensing apparatus may include a touch sensing panel composed of sensing electrodes and wiring patterns.

Normally, inspection is performed to see if a defect has occurred in the touch sensing panel.

However, it is difficult for the naked eye to accurately check whether the touch sensing panel is defective. In particular, the sensing electrodes included in the touch sensing panel may have a transparent color. When a defect occurs in the sensing electrode, there may be a limit in visually identifying whether the defect occurs.

Therefore, a study on an inspection method that can accurately determine whether the touch sensing panel is defective is necessary.

The present invention provides a touch sensing panel inspection apparatus and method capable of accurately determining whether a touch sensing panel is defective by measuring capacitance of sensing electrodes and wiring patterns included in the touch sensing panel and determining whether the touch sensing panel is defective. .

In addition, by measuring the time constant based on the voltage response pattern for the sensing electrode included in the touch sensing panel to determine whether the touch sensing panel failure, the touch sensing panel inspection device that can accurately determine whether the touch sensing panel failure; To provide a method.

According to an embodiment of the present invention, a touch sensing panel inspection apparatus may include a measuring unit measuring capacitance of a sensing electrode and a wiring pattern included in a touch sensing panel, and whether the touch sensing panel is defective based on the measured capacitance. It includes a judgment unit for judging.

In addition, the touch sensing panel inspection apparatus according to another embodiment of the present invention is a measuring unit for measuring the time constant based on the voltage response pattern for the sensing electrode included in the touch sensing panel and the contact based on the measured time constant It includes a determination unit for determining whether the sensing panel is defective.

In addition, the touch sensing panel inspection method according to an embodiment of the present invention measuring the capacitance of the sensing electrode and the wiring pattern included in the touch sensing panel and whether the touch sensing panel is defective based on the measured capacitance Determining the steps.

In addition, the method for inspecting a touch sensing panel according to another embodiment of the present invention includes measuring a time constant based on a voltage response pattern of a sensing electrode included in the touch sensing panel and sensing the touch based on the measured time constant. And determining whether the panel is defective.

By measuring the capacitance of the sensing electrode and the wiring pattern included in the touch sensing panel, by providing a touch sensing panel inspection apparatus and method that can determine whether the touch sensing panel failure, it is possible to accurately determine whether the touch sensing panel failure Can be.

In addition, by providing a touch sensing panel inspection apparatus and method for measuring the time constant based on the voltage response pattern for the sensing electrode included in the touch sensing panel to determine whether the touch sensing panel is defective, You can judge accurately.

On the other hand, by providing a touch sensing panel inspection apparatus and method that can determine whether a failure occurs by each sensing channel of the touch sensing panel, or by distinguishing the sensing electrode and the wiring pattern from each other, to improve the yield of the production and manufacturing process of the touch sensing panel Can contribute to heightening.

Hereinafter, with reference to the accompanying drawings will be described embodiments of the present invention; However, the present invention is not limited or limited by the embodiments. In addition, the same reference numerals given in each drawing represent the same members.

1 is a view showing a touch sensing panel inspection apparatus according to an embodiment of the present invention.

Referring to FIG. 1, a touch sensing panel 110 and a touch sensing panel inspection device 140 are shown.

In general, the touch sensing panel 110 includes at least one sensing electrode 111, 112, 113, and 114, at least one wiring pattern 121, 122, 123, and 124 and at least one as shown in FIG. 1. Bonding pads 131, 132, 133, and 134 may be included.

Here, the at least one sensing electrode (111, 112, 113, 114) means all electrodes that can generate a change in capacitance in accordance with the contact. For example, the at least one sensing electrode 111, 112, 113, 114 may be an ITO electrode.

In addition, the at least one wiring pattern 121, 122, 123, and 124 electrically connects the at least one sensing electrode 111, 112, 113, and 114 to the at least one bonding pad 131, 132, 133, and 134. As a conductive wire, it can be formed of any material having electrical conductivity. For example, the at least one wiring pattern 121, 122, 123, and 124 may be formed of silver.

Hereinafter, a connection relationship between at least one sensing electrode 111, 112, 113, and 114, at least one wiring pattern 121, 122, 123, and 124 and at least one bonding pad 131, 132, 133, and 134 will be described. Let's explain.

First, in the present specification, at least one sensing electrode 111, 112, 113, and 114 is sensed as sensing electrode 1 111, sensing electrode 2 112, sensing electrode 3 113, and sensing electrode 4 114, respectively. At least one wiring pattern is named wiring pattern 1 121, wiring pattern 2 122, wiring pattern 3 123, and wiring pattern 4 124, respectively, and at least one bonding pad 131 and 132. , 133 and 134 will be referred to as bonding pad 1 131, bonding pad 2 132, bonding pad 3 133 and bonding pad 4 134, respectively.

As illustrated in FIG. 1, the sensing electrode 1 111 may be connected to the bonding pad 1 131 through the wiring pattern 1 121, and the sensing electrode 2 112 may be bonded through the wiring pattern 2 122. It may be connected to the pad 2 132.

The sensing electrode 3 113 may be connected to the bonding pad 3 133 through the wiring pattern 3 123, and the sensing electrode 4 114 may be connected to the bonding pad 4 134 through the wiring pattern 4 124. Can be connected.

The touch sensing panel inspecting apparatus 140 according to an embodiment of the present invention includes a measuring unit 141 and a determining unit 142.

The measuring unit 141 may include at least one sensing electrode 111, 112, 113, and 114 included in the touch sensing panel 110 and at least one sensing electrode 111, 112, 113, and 114. The capacitance of the wiring patterns 121, 122, 123, and 124 is measured.

The determination unit 142 determines whether the touch sensing panel 110 is defective based on the measured capacitance.

According to an embodiment of the present invention, the measuring unit 141 includes at least one sensing electrode 111, 112, 113, 114 and at least one wiring connected to each of the sensing channels for each sensing channel of the touch sensing panel 110. The capacitance of the patterns 121, 122, 123, and 124 may be measured.

At this time, according to an embodiment of the present invention, the measuring unit 141 may measure the sum of the capacitance of the sensing electrode and the capacitance of the wiring pattern for each sensing channel.

For example, the sensing channel 1, the channel connecting the sensing electrode 1 111 and the wiring pattern 1 121 is connected to the sensing channel 2, the sensing electrode 2 112 and the wiring pattern 2 122, and the channel connecting the sensing pattern 2, sensing electrode. Assume that the channel to which the 3113 and the wiring pattern 3 123 are connected is the sensing channel 3 to which the sensing channel 3 and the sensing electrode 4 114 and the wiring pattern 4 124 are connected.

The measurement unit 141 may contact the bonding pad 1 131 and measure the sum of the capacitance of the sensing electrode 1 111 connected to the sensing channel 1 and the capacitance of the wiring pattern 1 121.

In addition, the measurement unit 141 may contact the bonding pad 2 132 to measure the sum of the capacitance of the sensing electrode 2 112 connected to the sensing channel 2 and the capacitance of the wiring pattern 2 122. .

In addition, the measuring unit 141 may contact the bonding pad 3 133 to measure the sum of the capacitance of the sensing electrode 3 113 connected to the sensing channel 3 and the capacitance of the wiring pattern 3 123. .

In addition, the measurement unit 141 may contact the bonding pad 4 134 and measure the sum of the capacitance of the sensing electrode 4 114 connected to the sensing channel 4 and the capacitance of the wiring pattern 4 124. .

At this time, according to an embodiment of the present invention, the determination unit 142 determines whether the capacitance measured for each sensing channel is included within a predetermined threshold range, and at least one sensing channel of the sensing channels. When the capacitance measured at deviates from the selected threshold range, it may be determined that the touch sensing panel 110 is defective.

For example, the capacitance measured by the measuring unit 141 is called C ₁ , the capacitance measured by the sensing channel 2 is called C ₂ , and the capacitance measured by the sensing channel 3 is called C ₃ , Assume that the capacitance measured on sense channel 4 is C ₄ .

Assume that the upper limit of the selected critical range is C _max and the lower limit is C _min .

At this time, according to one embodiment of the present invention, the selected threshold range is a static electricity calculated by measuring the capacitance of the sensing electrodes and wiring patterns included in the plurality of touch sensing panels other than the touch sensing panel 110. Dose distribution range.

For example, the selected threshold range may be calculated by measuring capacitances of sensing electrodes and wiring patterns included in a plurality of touch sensing panels, and using the average and standard deviation of the measured capacitances. That is, the selected threshold range means a capacitance condition range for determining that the sensing electrode and the wiring pattern are normal.

The determination unit 142 determines whether C ₁ , C ₂ , C ₃ , and C ₄ fall within a range of C _min and C _max .

If, as a result of the determination by the determination unit 142, any one of the capacitance C ₁ , C ₂ , C ₃ , C ₄ is out of the range of C _min and C _max , the determination unit 142 is the touch sensing panel 110 ) Can be determined to be defective.

In this case, according to the exemplary embodiment of the present disclosure, the touch sensing panel inspecting apparatus 140 may further include a display unit 143 that displays a result of determining whether the touch sensing panel 110 is defective.

In addition, according to an embodiment of the present invention, the display unit 143 may display a determination result on whether the capacitance measured for each sensing channel is included within the selected threshold range.

For example, when the determination unit 142 determines that C ₁ is out of the range of C _min and C _max among C ₁ , C ₂ , C ₃ , and C ₄ , the display unit 143 indicates that a failure occurs in the sensing channel 1. Can be displayed.

As a result, the touch sensing panel inspecting apparatus 140 according to an embodiment of the present invention outputs a sensing channel in which a failure occurs through the display unit 143, so that when a failure occurs in a specific sensing channel continuously, Only production processes or production lines can be modified to more effectively eliminate manufacturing defects.

In addition, according to an embodiment of the present invention, the determination unit 142 is measured in the at least one sensing channel when the capacitance measured in at least one sensing channel of the sensing channel is out of the predetermined threshold range. The capacitance may be compared with the defective condition of the sensing electrode and the defective condition of the wiring pattern to determine whether the sensing electrode and the wiring pattern connected to the at least one sensing channel are defective.

In this case, the defective condition of the sensing electrode refers to a distribution range of capacitance calculated statistically by measuring capacitances of sensing electrodes included in a plurality of other touch sensing panels other than the touch sensing panel 110, and the wiring pattern. The defective condition of means a distribution range of capacitance calculated statistically by measuring capacitances of wiring patterns included in a plurality of other touch sensing panels other than the touch sensing panel 110.

In this regard, the operation of the determination unit 142 will be described in detail, for example.

First, assume that the lower limit of the selected threshold range is 80 and the upper limit is 100.

And, if the sensing electrode is not bad, assume that the capacitance distribution range is 50 for the lower limit and 60 for the upper limit.

And, if the wiring pattern is not bad, assume that the capacitance distribution range is 30 lower limit and 40 upper limit.

If the measurement unit 141 measures the capacitance of the sensing channel 1, and it is determined that C ₁ is 20, the determination unit 142 determines that the touch sensing panel 110 is defective, The wiring pattern 1 121 may be determined to be defective by comparing C ₁ and the defective condition of the sensing electrode and the defective condition of the wiring pattern.

This is because the wiring pattern 1 121 is connected to the side closer to the measurement unit 141, so that if a crack or the like occurs in the wiring pattern 1 121, C ₁ is in the capacitance distribution range of the normal wiring pattern. This is because it can be measured with a value smaller than the lower limit.

On the other hand, when the measurement unit 141 measures the capacitance of the sensing channel 1, and it is determined that C ₁ is 45, the determination unit 142 determines that the touch sensing panel 110 is defective, The sensing electrode 1 121 may be determined to be defective by comparing C ₁ with a defective condition of the sensing electrode and a defective condition of the wiring pattern.

That is, the determination unit 142, since the C ₁ greater than the upper limit value of the capacitance distribution range of the normal wiring pattern, the wiring pattern has been formed properly, because it is a value less than the lower limit value of the threshold range, the C ₁ of the selection, the sense It may be determined that a failure occurs in the electrode 1 121.

As described above, it is possible to find a step having a high defective rate in the production process by judging by discriminating the elements in which the failure occurs in the sensing electrode and the wiring pattern. That is, if a defect occurs more frequently in the wiring pattern than the sensing electrode, the yield of the entire product may be increased by modifying the wiring pattern manufacturing process to lower the defective rate. Therefore, the inspection apparatus and method according to the present embodiment may contribute to increasing the production yield of the product in addition to simply determining whether the product is defective.

In addition, according to an embodiment of the present invention, the measuring unit 141 and the determining unit 142 may be implemented as one chip.

That is, in the embodiment of FIG. 1, the measuring unit 141 and the determining unit 142 are divided into separate components, but in another exemplary embodiment of the present invention, the measuring unit 141 and the determining unit 142 are divided into one component. Can be implemented as a chip.

In the above, referring to FIG. 1, an embodiment of the present invention for the touch sensing panel inspecting apparatus 120 that measures capacitance and determines whether the touch sensing panel 110 is defective based on the measured capacitance is described in detail. Explained.

However, unlike the above-described embodiment, the touch sensing panel inspecting apparatus 120 according to another embodiment of the present invention is based on a voltage response pattern for at least one sensing electrode 111, 112, 113, 114. After measuring the time constant, it may be determined whether the touch sensing panel 110 is defective using the time constant. Therefore, hereinafter, the touch sensing panel inspection apparatus 120 according to another embodiment of the present invention will be described in detail.

First, at least one sensing electrode 111, 112, 113, and 114 and at least one wiring pattern 121, 122, 123, and 124 included in the touch sensing panel 110 may be represented by an RC circuit. In this regard, one of the at least one sensing electrode 111, 112, 113, and 114 and the at least one wiring pattern 121, 122, 123, and 124 is represented by an RC circuit. 2 is shown.

2 is a diagram illustrating an equivalent circuit for a sensing electrode and a wiring pattern according to an exemplary embodiment of the present invention.

Hereinafter, the equivalent circuit illustrated in FIG. 2 will be described using the sensing electrode 1 111 and the wiring pattern 1 121.

As illustrated in FIG. 2, the sensing electrode 1 111 and the wiring pattern 1 121 may be represented as an RC primary circuit.

Here, the resistor R 210 refers to the resistance of the wiring pattern 1 121, and the capacitor C 220 refers to the capacitance of the sensing electrode 1 111.

A graph shown at 240 is a graph showing a change in voltage V 230 across the capacitor C 220 when power is supplied to the circuit shown in FIG. 2.

The voltage V 230 across the capacitor C 220 varies depending on the size of the time constant, and the time to reach a steady state varies. In general, the larger the time constant, the voltage V 230 across the capacitor C 220 is increased. It takes a lot of time to reach the steady state.

Accordingly, the magnitudes of time constants for the response curve 1 (241), the response curve 2 (242), and the response curve 3 (243) at 240 are the response curve 1 (241), the response curve 2 (242), and the response curve 3 ( 243).

If the wiring pattern 1 121 is defective or the sensing electrode 1 111 is defective, the resistance of the wiring pattern 1 121 does not belong to the resistance value range of the normal wiring pattern or the power failure of the sensing electrode 1 111 is performed. When the capacitance is not within the range of the capacitance of the normal sensing electrode, the time constant value for the circuit shown in FIG. 2 is a range of time constant values that can be derived when the wiring pattern 1 121 and the sensing electrode 1 111 are normal. May not belong.

Therefore, the touch sensing panel inspecting apparatus 120 according to an exemplary embodiment of the present invention may be configured based on a voltage response pattern of at least one sensing electrode 111, 112, 113, and 114 included in the touch sensing panel 110. After measuring the time constant, it may be determined whether the touch sensing panel 110 is defective by using the measured time constant.

In this regard, the measurement unit 141 measures the time constant based on a voltage response pattern for at least one sensing electrode 111, 112, 113, and 114 included in the touch sensing panel 110.

The determination unit 142 determines whether the touch sensing panel 110 is defective based on the measured time constant.

According to an embodiment of the present invention, the measurement unit 141 measures the time constant based on a voltage response pattern for at least one sensing electrode 111, 112, 113, and 114 for each sensing channel of the touch sensing panel 110. can do.

In addition, according to an embodiment of the present invention, the measuring unit 141 includes at least one sensing electrode 111, 112, 113, and 114 and at least one wiring pattern 121, 122, 123, and 124 for each sensing channel. The voltage response pattern may be extracted by supplying a predetermined voltage to the circuit and measuring a voltage change of the at least one sensing electrode 111, 112, 113, and 114 according to the supplied voltage. In this case, the voltage response pattern may be a transient response generated by supplying a voltage to an equivalent circuit represented by a resistor and a capacitor.

For example, the measurement unit 141 may supply power to the sensing channel 1 to measure the time constant of the sensing channel 1 based on the voltage response pattern of the sensing electrode 1 111.

In addition, the measurement unit 141 may supply power to the sensing channel 2 to measure the time constant of the sensing channel 2 based on the voltage response pattern of the sensing electrode 2 112.

In addition, the measurement unit 141 may supply power to the sensing channel 3 to measure the time constant of the sensing channel 3 based on the voltage response pattern of the sensing electrode 3 113.

In addition, the measurement unit 141 may supply power to the sensing channel 4 to measure the time constant of the sensing channel 4 based on the voltage response pattern of the sensing electrode 4 114.

In this case, according to an embodiment of the present invention, the determination unit 142 determines whether the time constant measured for each sensing channel is within a selected threshold range, and the time constant measured in at least one sensing channel of the sensing channels. When is out of the selected threshold range, it may be determined that the touch sensing panel 110 is bad.

For example, the measurement unit 141 is measured the time constant for the sensing channel 1 τ _1, was measured time constants for the sensing channel 2 to τ _2, measured the time constant for the sensing channel 3 with τ _3, sensing channel 4 Suppose the time constant for is measured as τ ₄ .

And, suppose that the upper limit of the selected threshold range is τ _max , and the lower limit is τ _min .

In this case, according to one embodiment of the present invention, the predetermined threshold range is statistically calculated based on a voltage response pattern for sensing electrodes included in a plurality of touch sensing panels other than the touch sensing panel 110. It may be a distribution range.

For example, the selected threshold range may be calculated by measuring time constants of sensing electrodes and wiring patterns included in a plurality of touch sensing panels, and using the average and standard deviation of the measured time constants. That is, the selected threshold range means a time constant condition range for determining that the sensing electrode and the wiring pattern are normal.

The determination unit 142 determines whether τ ₁ , τ ₂ , τ ₃ , and τ ₄ fall within a range of τ _min and τ _max .

If, as a result of the determination by the determination unit 142, any time constant among τ ₁ , τ ₂ , τ ₃ , and τ ₄ is out of the ranges of τ _min and τ _max , the determination unit 142 may contact the touch sensing panel 110. It can be judged that this is defective.

In this case, according to an embodiment of the present invention, the touch sensing panel 110 may further include a display unit 143 that displays a determination result regarding whether the touch sensing panel 110 is defective.

In addition, according to an embodiment of the present invention, the display unit 143 may display a determination result on whether the time constant measured for each sensing channel is included within the selected threshold range.

For example, when the determination unit 142 determines that τ ₁ is out of the range of τ _min and τ _max among τ ₁ , τ ₂ , τ ₃ , and τ ₄ , the display unit 143 indicates that a failure occurs in the sensing channel 1. Can be displayed.

As a result, the touch sensing panel inspecting apparatus 140 according to an embodiment of the present invention outputs a sensing channel in which a failure occurs through the display unit 143, so that when a failure occurs continuously in a specific sensing channel, the corresponding sensing channel By modifying only the production process or production line of the manufacturing defect can be more effectively eliminated.

In addition, according to an embodiment of the present invention, the measuring unit 141 and the determination unit 142 may be implemented as one chip.

3 is a flowchart illustrating a method for inspecting a touch sensing panel according to an embodiment of the present invention.

In operation S310, the capacitance of the sensing electrode and the wiring pattern included in the touch sensing panel is measured.

In step S320, it is determined whether the touch sensing panel is defective based on the capacitance measured in step S310.

According to an embodiment of the present disclosure, in step S310, capacitance of the sensing electrode and the wiring pattern connected to each of the sensing channels may be measured for each sensing channel of the touch sensing panel.

In this case, according to an embodiment of the present invention, in step S320, it is determined whether the capacitance measured for each of the sensing channels is within a predetermined threshold range, and the outage measured in at least one sensing channel of the sensing channels. If the capacitance is out of the selected threshold range, the touch sensing panel may be determined as bad.

In addition, according to one embodiment of the present invention, the selected threshold range is calculated by measuring the capacitance of the sensing electrodes and wiring patterns included in a plurality of other touch sensing panel except the touch sensing panel statistically calculated capacitance It may be a distribution range.

4 is a flowchart illustrating a touch sensing panel inspection method according to another exemplary embodiment of the present invention.

In operation S410, the time constant is measured based on a voltage response pattern for the sensing electrode included in the touch sensing panel.

In step S420, it is determined whether the touch sensing panel is defective based on the time constant measured in step S410.

According to an embodiment of the present disclosure, in step S410, a time constant may be measured based on a voltage response pattern of the sensing electrode and the wiring pattern connected to each of the sensing channels for each sensing channel of the touch sensing panel.

In this case, according to an embodiment of the present invention, in step S420, it is determined whether the time constant measured for each sensing channel is within a predetermined threshold range, and the time constant measured in at least one sensing channel of the sensing channels is determined. If it is out of the selected threshold range, the touch sensing panel may be determined as defective.

Further, according to an embodiment of the present invention, the predetermined threshold range is statistically calculated time constant distribution based on voltage response patterns for sensing electrodes included in a plurality of other touch sensing panels except the touch sensing panel. It can be a range.

Further, according to an embodiment of the present invention, in step S410, a predetermined voltage is supplied to the sensing electrodes and the wiring patterns connected to each of the sensing channels, and the sensing electrodes and the wiring patterns are applied according to the supplied voltage. The voltage response pattern can be extracted by measuring the change in voltage.

In the above, various embodiments of the touch sensing panel inspection method according to the present invention have been described with reference to FIGS. 3 and 4. Here, since the embodiments of the touch sensing panel inspection method according to the present invention may correspond to the embodiments of the touch sensing panel inspecting apparatus described with reference to FIGS. 1 and 2, a detailed description thereof will be omitted. .

The touch sensing panel inspection method according to an embodiment of the present invention may be implemented in the form of program instructions that may be executed by various computer means and may be recorded in a computer readable medium. The computer readable medium may include program instructions, data files, data structures, etc. alone or in combination. Program instructions recorded on the media may be those specially designed and constructed for the purposes of the present invention, or they may be of the kind well-known and available to those having skill in the computer software arts. Examples of computer-readable recording media include magnetic media such as hard disks, floppy disks, and magnetic tape, optical media such as CD-ROMs, DVDs, and magnetic disks, such as floppy disks. Magneto-optical media, and hardware devices specifically configured to store and execute program instructions, such as ROM, RAM, flash memory, and the like. Examples of program instructions include not only machine code generated by a compiler, but also high-level language code that can be executed by a computer using an interpreter or the like. The hardware device described above may be configured to operate as one or more software modules to perform the operations of the present invention, and vice versa.

As described above, the present invention has been described by specific embodiments such as specific components and the like. For those skilled in the art to which the present invention pertains, various modifications and variations are possible.

Therefore, the spirit of the present invention should not be limited to the described embodiments, and all of the equivalents or equivalents of the claims as well as the claims to be described later will belong to the scope of the present invention. .

1 is a view showing a touch sensing panel inspection apparatus according to an embodiment of the present invention.

2 is a diagram illustrating an equivalent circuit of a sensing electrode and a wiring pattern according to an exemplary embodiment of the present invention.

3 is a flowchart illustrating a method for inspecting a touch sensing panel according to an embodiment of the present invention.

4 is a flowchart illustrating a touch sensing panel inspection method according to another exemplary embodiment of the present invention.

Claims (20)

A measuring unit measuring capacitance of the sensing electrode and the wiring pattern included in the touch sensing panel; And Determination unit for determining whether the touch sensing panel is defective based on the measured capacitance Touch sensing panel inspection device comprising a. The method of claim 1, The measuring unit A capacitance connected to the sensing electrode and the wiring pattern through a sensing channel and measuring capacitance of the sensing electrode and the wiring pattern for each sensing channel; The determination unit Determining whether the capacitance falls within a predetermined threshold range, and when the capacitance measured in at least one of the sensing channels is out of the predetermined threshold range, the touch determining the touch sensing panel as a failure Detection panel inspection device. The method of claim 2, A display unit for displaying a determination result on whether the touch sensing panel is defective Touch sensing panel inspection device further comprising. The method of claim 3, The display unit And a determination result of determining whether the capacitance measured for each sensing channel falls within the predetermined threshold range. The method of claim 2, The determination unit When the capacitance measured in at least one of the sensing channels is out of the predetermined threshold range, the measured capacitance is compared with a failure condition of a sensing electrode and a failure condition of a wiring pattern, respectively, and the sensing electrode for each sensing channel. And a touch sensing panel inspecting device for determining whether the wiring pattern is defective. The method of claim 2, The selected threshold range is And a capacitance distribution range calculated statistically by measuring capacitance of sensing electrodes and wiring patterns included in a plurality of other touch sensing panels other than the touch sensing panel. A measurement unit configured to measure a time constant based on a voltage response pattern of a sensing electrode included in the touch sensing panel; And Determination unit for determining whether the touch sensing panel is defective based on the measured time constant Touch sensing panel inspection device comprising a. The method of claim 7, wherein The measuring unit A time constant is measured based on a voltage response pattern extracted from each sensing channel connected to the sensing electrode and the wiring pattern; The determination unit A touch sensing panel that determines whether the time constant is within a predetermined threshold range, and determines that the touch sensing panel is defective when the time constant measured in at least one of the sensing channels is out of the predetermined threshold range. Inspection device. The method of claim 8, A display unit for displaying a determination result on whether the touch sensing panel is defective Touch sensing panel inspection device further comprising. 10. The method of claim 9, The display unit And a determination result of determining whether the time constant measured for each sensing channel falls within the predetermined threshold range. The method of claim 8, The selected threshold range is And a time constant distribution range calculated statistically based on voltage response patterns of sensing electrodes included in a plurality of other touch sensing panels other than the touch sensing panel. The method of claim 8, The measuring unit A touch sensing panel configured to supply a predetermined voltage to the sensing electrode and the wiring pattern connected to each of the sensing channels, and extract the voltage response pattern by measuring a voltage change of the sensing electrode and the wiring pattern according to the supplied voltage. Inspection device. The method according to claim 1 or 7, The measuring unit and the determination unit is a touch sensing panel inspection device implemented by one chip. Measuring capacitance of the sensing electrode and the wiring pattern included in the touch sensing panel; And Determining whether the touch sensing panel is defective based on the measured capacitance Touch sensing panel inspection method comprising a. The method of claim 14, The measuring step Measuring capacitance of the sensing electrode and the wiring pattern connected to each of the sensing channels for each sensing channel; The determining step It is determined whether the capacitance measured for each of the sensing channels falls within a predetermined threshold range, and when the capacitance measured in at least one of the sensing channels is out of the predetermined threshold range, the touch sensing panel is removed. Method of inspection of touch sensing panel judged to be defective. The method of claim 15, The selected threshold range is And a capacitance distribution range calculated statistically by measuring capacitances of sensing electrodes and wiring patterns included in a plurality of other touch sensing panels other than the touch sensing panel. Measuring a time constant based on a voltage response pattern for a sensing electrode included in the touch sensing panel; And Determining whether the touch sensing panel is defective based on the measured time constant Touch sensing panel inspection method comprising a. The method of claim 17, The measuring step A time constant is measured based on a voltage response pattern extracted from each of the sensing channels connected to the sensing electrode and the wiring pattern; The determining step It is determined whether the time constant measured for each sensing channel falls within a predetermined threshold range, and when the time constant measured in at least one of the sensing channels is out of the predetermined threshold range, the touch sensing panel is regarded as defective. How to check the touch sensing panel. The method of claim 18, The selected threshold range is And a time constant distribution range calculated statistically based on voltage response patterns of sensing electrodes included in a plurality of other touch sensing panels other than the touch sensing panel. The method of claim 18, The measuring step, A touch sensing panel inspection for extracting the voltage response pattern by supplying a predetermined voltage to the sensing electrode and the wiring pattern connected to each of the sensing channels and measuring a voltage change of the sensing electrode and the wiring pattern according to the supplied voltage Way.

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