KR20100059550A - Apparatus and method for inspecting flat panel - Google Patents
Apparatus and method for inspecting flat panel Download PDFInfo
- Publication number
- KR20100059550A KR20100059550A KR1020080118359A KR20080118359A KR20100059550A KR 20100059550 A KR20100059550 A KR 20100059550A KR 1020080118359 A KR1020080118359 A KR 1020080118359A KR 20080118359 A KR20080118359 A KR 20080118359A KR 20100059550 A KR20100059550 A KR 20100059550A
- Authority
- KR
- South Korea
- Prior art keywords
- inspection
- inspection object
- image
- light pattern
- light source
- Prior art date
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Disclosed are a flat plate inspection apparatus and a method thereof. The light source unit is positioned laterally with respect to a plane including the surface of the inspection object to irradiate the inspection light pattern to the inspection object. The flat screen is installed at a position opposite to the light source unit with respect to the inspection object, and is positioned laterally with respect to a plane including the surface of the inspection object to form an image of the inspection light pattern reflected from the inspection object. The imaging unit is installed at a position opposite to the flat screen, and captures an image of the inspection light pattern formed on the flat screen to output an inspection image. The determination unit evaluates the degree of warpage of the inspection object based on the inspection image. According to the present invention, it is possible to evaluate the degree of warpage of the flat plate without optical distortion by converting the structure of the inspection system in which only the side of the inspection target plate can be taken sideways due to spatial constraints so as to enable front-side imaging. Defect detection is possible at an early stage.
Description
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a flat panel inspection apparatus and a method thereof, and more particularly, to an inspection apparatus and method for evaluating the degree of warpage of a flat plate such as a bare glass used in a flat panel display apparatus.
Flat panel display devices such as LCDs and OLEDs basically produce products in a structure of forming a thin film on the bare glass, and thus, the quality of the bare glass determines the basic quality of various flat panel display products. The size of the bare glass of products such as LCDs continues to grow, and the width of the bare glass is expected to increase to 2880 mm in the future. As the width of the bare glass increases, the possibility of the bare glass bent during the production of the bare glass increases. If the degree of warpage of the bare glass becomes greater than the quality control standard value, not only may the glass be scratched or broken in the process step after the bare glass is formed, but also the quality of the product of the flat panel display company producing the product using the bare glass. It will also affect.
The bare glass is manufactured to have a desired width, length and thickness by processing the molten glass through the forming apparatus, the molten glass is molded in the form of a glass sheet through the forming apparatus as shown in FIG. Discharged downward. At this time, the shielding space where the forming apparatus is located is maintained at a high temperature between 700 degrees Celsius and 800 degrees Celsius, and thus the inspector makes a glass sheet made by the forming apparatus through a glass window provided in the shielding space as shown in FIG. 2. Visually check for bending. However, since there is a limit to the accuracy of the measurement that can be obtained by visual inspection, attempts to measure this automatically have been made. However, the internal temperature of the shielded space is so high that, like the current operator's viewing position, the automatic measuring device has to be placed outside the shielded space, and only the side view of the glass sheet is possible through the limited sized glass window.
Regarding the automation of such a flat plate inspection apparatus, the thin film type inspection object inspection apparatus described in Korean Patent Laid-Open Publication No. 10-2006-0108829 has been proposed. However, since the device is configured to project a specific pattern on the thin film type test object and directly image the irradiated pattern, it is difficult to obtain an image that is easy to analyze in the case of transparent bare glass having high transmittance. In addition, as shown in FIG. 3, when the illumination and the camera are installed on the side of the bare glass, the difference between the distances L1 and L2 between the both ends of the glass sheet and the imaging camera is large when the glass sheet is captured. There is a problem that it is difficult to focus the lens evenly, and as a result, the accuracy of the measurement is lowered. This problem becomes larger as the size of the bare glass increases.
SUMMARY OF THE INVENTION The present invention has been made in an effort to provide a flat panel inspection apparatus and method capable of inspecting a warp state of a flat plate without optical distortion while solving a problem of defocus caused when the flat surface to be inspected is directly photographed. .
According to an aspect of the present invention, there is provided a flat plate inspection apparatus, comprising: a light source unit positioned in a lateral direction with respect to a plane including a surface of an inspection object and radiating an inspection light pattern to the inspection object; A flat screen installed at a position opposite to the light source unit with respect to the inspection object and positioned in a lateral direction with respect to a plane including the surface of the inspection object to form an image of an inspection light pattern reflected from the inspection object; An imaging unit installed at a position opposite to the flat screen and configured to photograph an image of a test light pattern formed on the flat screen to output a test image; And a determination unit for evaluating the degree of warpage of the inspection object based on the inspection image.
According to another aspect of the present invention, there is provided a flat plate inspection method according to an embodiment of the present invention, wherein the inspection object is set at a time interval set based on a moving speed of the inspection object in a state in which the inspection object is discharged below the forming apparatus. Irradiating the inspection light pattern on the; Photographing an image of an inspection light pattern formed on a flat screen provided on a side of the inspection object corresponding to an irradiation time of the inspection light pattern; And evaluating the bending degree of the inspection object based on the distortion degree of the inspection light pattern detected from the photographed inspection image.
According to the flat panel inspection apparatus and method according to the present invention, the installation position of the automatic inspection apparatus according to the characteristics of the sealed chamber in which the flat plate such as bare glass is made (that is, the high temperature inside the sealed chamber and the narrowness of the space) By placing the flat screen between the flat plate and the camera in the presence of spatial constraints (i.e., the flat plate inspection device must be located on the side of the plate being the inspection object and outside of the sealed chamber), without distortion of the optical system. The degree of warpage of the plate can be accurately assessed, enabling defect detection at an early stage of plate production. In addition, by placing the light source and the camera emitting the inspection light in the same space outside the sealed room, there is an advantage that can be prevented from damaging the materials constituting the flat plate inspection apparatus.
Hereinafter, with reference to the accompanying drawings will be described in detail a preferred embodiment of the flat plate inspection apparatus and method according to the present invention.
4 and 5 are views showing the configuration of a preferred embodiment of a flat plate inspection apparatus according to the present invention.
4 and 5, the flat panel inspection apparatus according to the present invention includes a
The
If the bare glass manufactured by being discharged downward from the forming apparatus is the
The
The
The
8 is a flowchart illustrating a process of performing a preferred embodiment of the plate inspection method according to the present invention.
Referring to FIG. 8, in the state where the
Although the preferred embodiments of the present invention have been shown and described above, the present invention is not limited to the specific preferred embodiments described above, and the present invention belongs to the present invention without departing from the gist of the present invention as claimed in the claims. Various modifications can be made by those skilled in the art, and such changes are within the scope of the claims.
1 is a view showing a state in which a molten glass is molded in the form of a glass sheet and discharged downward of a forming apparatus through a forming apparatus in a manufacturing process of a bare glass;
2 is a view showing an example of performing a conventional visual inspection,
FIG. 3 is a view showing an example of a conventional flat inspection apparatus having a configuration in which a camera installed at a position opposed to illumination based on a bare glass directly photographs a bare glass;
4 and 5 are views showing a preferred embodiment of the flat plate inspection apparatus according to the present invention,
6 is a view showing the form of the inspection light pattern used in the flat inspection apparatus according to the present invention,
7A and 7B are views illustrating inspection images of bare glass with almost no warpage and inspection images of bare glass having a high degree of warpage, respectively, photographed by the flat plate inspection device according to the present invention; and
8 is a flowchart illustrating a process of performing a preferred embodiment of the plate inspection method according to the present invention.
Claims (6)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020080118359A KR20100059550A (en) | 2008-11-26 | 2008-11-26 | Apparatus and method for inspecting flat panel |
Applications Claiming Priority (1)
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KR1020080118359A KR20100059550A (en) | 2008-11-26 | 2008-11-26 | Apparatus and method for inspecting flat panel |
Publications (1)
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KR20100059550A true KR20100059550A (en) | 2010-06-04 |
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KR1020080118359A KR20100059550A (en) | 2008-11-26 | 2008-11-26 | Apparatus and method for inspecting flat panel |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101506716B1 (en) * | 2012-12-31 | 2015-03-31 | 엘아이지에이디피 주식회사 | Alignment Method for Bonding Substrate and Bare Glass |
KR102294899B1 (en) * | 2020-05-26 | 2021-08-27 | (주)티엘씨테크퍼스트 | System and Method for Artificial Intelligence based Detecting Defect in Sunroof Using Deep Learning |
KR102662889B1 (en) | 2023-01-31 | 2024-05-03 | 주식회사 크레셈 | Apparatus For Inspection of Particle of Copper Sheet |
-
2008
- 2008-11-26 KR KR1020080118359A patent/KR20100059550A/en not_active Application Discontinuation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101506716B1 (en) * | 2012-12-31 | 2015-03-31 | 엘아이지에이디피 주식회사 | Alignment Method for Bonding Substrate and Bare Glass |
KR102294899B1 (en) * | 2020-05-26 | 2021-08-27 | (주)티엘씨테크퍼스트 | System and Method for Artificial Intelligence based Detecting Defect in Sunroof Using Deep Learning |
KR102662889B1 (en) | 2023-01-31 | 2024-05-03 | 주식회사 크레셈 | Apparatus For Inspection of Particle of Copper Sheet |
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