KR20080087247A - Radioisotope battery - Google Patents
Radioisotope battery Download PDFInfo
- Publication number
- KR20080087247A KR20080087247A KR1020070029193A KR20070029193A KR20080087247A KR 20080087247 A KR20080087247 A KR 20080087247A KR 1020070029193 A KR1020070029193 A KR 1020070029193A KR 20070029193 A KR20070029193 A KR 20070029193A KR 20080087247 A KR20080087247 A KR 20080087247A
- Authority
- KR
- South Korea
- Prior art keywords
- radioisotope
- thin film
- layer
- semiconductor
- schottky
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 claims abstract description 76
- 239000010409 thin film Substances 0.000 claims abstract description 52
- 229910052751 metal Inorganic materials 0.000 claims abstract description 36
- 239000002184 metal Substances 0.000 claims abstract description 36
- 239000012535 impurity Substances 0.000 claims abstract description 27
- 238000000034 method Methods 0.000 claims description 7
- 230000005855 radiation Effects 0.000 description 16
- 238000004519 manufacturing process Methods 0.000 description 11
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- 239000000463 material Substances 0.000 description 4
- 230000008021 deposition Effects 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N nitrogen Substances N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 3
- 239000000615 nonconductor Substances 0.000 description 3
- 230000002265 prevention Effects 0.000 description 3
- 230000002285 radioactive effect Effects 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 230000005266 beta plus decay Effects 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 230000005262 alpha decay Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers
- H01L31/07—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by potential barriers the potential barriers being only of the Schottky type
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Electrodes Of Semiconductors (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Abstract
The present invention relates to a radioisotope cell, and more particularly, to a radioisotope cell that can be used semi-permanently in a microwatt circuit.
In addition, the radioisotope battery of the present invention comprises a Schottky junction formed by joining an impurity semiconductor thin film and a metal thin film; And a radioisotope layer bonded to any one of the impurity semiconductor thin film and the metal thin film in the Schottky junction to provide an energy source so that electromotive force is generated in the impurity semiconductor thin film.
Description
1 is a cross-sectional view showing the structure of a conventional radioisotope cell,
2 is a cross-sectional view taken in the AA direction in FIG.
3 is a cross-sectional view showing the structure of a radioisotope battery according to an embodiment of the present invention;
4 is a cross-sectional view showing the structure of a radioisotope cell according to another embodiment of the present invention;
5 is a cross-sectional view showing a multilayer structure of a radioisotope cell according to an embodiment of the present invention;
6 is a cross-sectional view showing a multilayer structure of a radioisotope cell according to another embodiment of the present invention.
*** Explanation of symbols for the main parts of the drawing ***
100: radioisotope cell 110: base plate
120: Schottky Semiconductor 130: Schottky Metal Thin Film
140: radioisotope layer 150: radiation leakage prevention layer
160: positive electrode 170: negative electrode
The present invention relates to a radioisotope cell, and more particularly, to a radioisotope cell that can be used semi-permanently in a microwatt circuit.
In general, radioisotopes are elements that emit radiation with specific energy and decay into stable isotopes. Here, in addition to the α, β-, and β + decay, there is also a so-called EC decay in which the nucleus captures the K orbital electrons. Most of these again release extra energy as alpha rays, beta rays, or gamma rays and become stable isotopes. The amount of radioisotope is expressed in terms of radioactive intensity, ie the number of breakdowns that occur in unit time. The time it takes for a radioactive element to collapse and decrease to half its initial amount is called a half-life period, which is constant for radioisotopes. It emits radiation for hundreds of years.
On the other hand, in the field of ultra-compact battery manufacturing, a microwatt-class circuit device such as an unmanned electronic device or the like is produced using an electron / hole pair generated in a semiconductor as an energy source by radiation emitted from such radioisotopes. The development of so-called radioisotope cells, which can be used semi-permanently in unmanned micromachines (MEMS), has been attempted. As one method of this, Korean Patent No. 592478 proposes a 'miniature isotope cell using a pin diode' (hereinafter, referred to as an invention). Here, the pin diode generally refers to an intrinsic semiconductor, that is, a semiconductor in which P-type and N-type are formed by implanting impurities such as trivalent element and pentavalent element into a silicon wave.
1 is a cross-sectional view showing the structure of a conventional radioisotope battery according to the above-described invention, Figure 2 is a cross-sectional view taken in the AA direction in FIG.
As shown in FIG. 1 and FIG. 2, according to the description in the preceding invention, "First, the N-
However, according to the conventional radioisotope cell described above, forming a radioisotope layer between the positive electrode and the negative electrode means that the radioisotope is deposited on the surface of the intrinsic semiconductor formed between the N- and P-semiconductor regions. In this deposition process, when the radioisotope layer is formed on the surface of the N-semiconductor region and the P-semiconductor region beyond the intrinsic semiconductor region, the radioisotope layer on which the N-semiconductor region and the P-semiconductor region are deposited is deposited. There is a structural problem that the short (short) through. That is, as shown in FIG. 2, it means that the radioisotope is to be precisely deposited only in the region indicated by the
SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems. Instead of using a fin semiconductor as a current generating source, a Schottky junction is used, but the radioisotope layer is deposited on only one of a metal and a semiconductor. An object of the present invention is to provide a radioisotope cell for preventing a short circuit through the radioisotope layer.
Radioisotope battery according to an embodiment of the present invention to achieve the above object is a Schottky junction formed by bonding an impurity semiconductor thin film and a metal thin film; And a radioisotope layer including a radioisotope layer bonded to any one of an impurity semiconductor thin film and a metal thin film in the Schottky junction and providing an energy source so that electromotive force is generated in the impurity semiconductor thin film.
In the above-described configuration, the radioisotope battery is preferably a multi-layer structure consisting of at least two radioisotope layers and the impurity semiconductor thin film.
In the battery of the multilayer structure, the impurity semiconductor thin film in which the radioisotope layer is laminated on both surfaces is thicker than the impurity semiconductor thin film in which the radioisotope layer is stacked on one surface.
In addition, at least two or more surfaces of the radioisotope layer are preferably covered with the impurity semiconductor thin film.
In addition, it is preferable that any one or more of the impurity semiconductor thin film, the metal thin film, and the radioisotope layer covers a layer formed thereunder.
In addition, the radioisotope layer is preferably made of Ni-63, it may be used as an electrode itself.
Hereinafter, with reference to the accompanying drawings will be described in detail with respect to the radioisotope battery according to a preferred embodiment of the present invention.
Figure 3 is a stage showing the structure of a radioisotope cell according to an embodiment of the present invention.
As shown in Figure 3, the radioisotope cell according to the present invention (hereinafter referred to as 'battery') (100) is a
In the above-described configuration, the
In addition, although the Sr-90 or Co-60 may be used as the
Meanwhile, in the above description, the side formed on the metal is described as the positive electrode and the side formed on the semiconductor as the negative electrode. However, this will be changed depending on the concentration of the impurities doped in the semiconductor, the material of the metal, or whether the impurities are donors or accelerators. In addition, since the radioisotope is a metal, it can be used as an electrode itself. In addition, the Schottky metal
Figure 4 is a cross-sectional view showing the structure of a radioisotope cell according to another embodiment of the present invention.
As shown in FIG. 4, the
5 is a cross-sectional view illustrating a multilayer structure of a radioisotope battery according to an embodiment of the present invention, which is based on the structure of the
That is, as shown in FIG. 5, the
To describe an example of this manufacturing method, first, a silicon thin film or a gallium nitrogen thin film is deposited on the
Next, in the same manner as above, the second Schottky metal
Next, a third Schottky metal
Here, since the
6 is a cross-sectional view illustrating a multilayer structure of a radioisotope battery according to another embodiment of the present invention, which is based on the structure of the
That is, as shown in FIG. 6, the
To illustrate an example of this manufacturing method, first, a
The radioisotope cell of the present invention and its manufacturing method are not limited to the above-described embodiments and can be modified in various ways within the scope of the technical idea of the present invention.
According to the radioisotope cell of the present invention as described above and a method of manufacturing the same, instead of using a fin semiconductor as a current generating source, a Schottky junction is used, but the radioisotope layer is laminated on only one of the metal and the semiconductor. In the current flow between semiconductors, short circuiting through the radioisotope layer is prevented, thereby facilitating the manufacturing process of the battery and further facilitating the fabrication of a double-sided structure or a multilayered structure.
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070029193A KR100934937B1 (en) | 2007-03-26 | 2007-03-26 | Radioisotope battery |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070029193A KR100934937B1 (en) | 2007-03-26 | 2007-03-26 | Radioisotope battery |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20080087247A true KR20080087247A (en) | 2008-10-01 |
KR100934937B1 KR100934937B1 (en) | 2010-01-06 |
Family
ID=40149924
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020070029193A KR100934937B1 (en) | 2007-03-26 | 2007-03-26 | Radioisotope battery |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100934937B1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102024879A (en) * | 2010-11-03 | 2011-04-20 | 北京理工大学 | Method for reducing dark current of gallium arsenide isotope battery |
KR20140129404A (en) * | 2013-04-26 | 2014-11-07 | 한국전자통신연구원 | Radioisotope battery and manufacturing method for thereof |
US10699820B2 (en) | 2013-03-15 | 2020-06-30 | Lawrence Livermore National Security, Llc | Three dimensional radioisotope battery and methods of making the same |
-
2007
- 2007-03-26 KR KR1020070029193A patent/KR100934937B1/en active IP Right Grant
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102024879A (en) * | 2010-11-03 | 2011-04-20 | 北京理工大学 | Method for reducing dark current of gallium arsenide isotope battery |
US10699820B2 (en) | 2013-03-15 | 2020-06-30 | Lawrence Livermore National Security, Llc | Three dimensional radioisotope battery and methods of making the same |
KR20140129404A (en) * | 2013-04-26 | 2014-11-07 | 한국전자통신연구원 | Radioisotope battery and manufacturing method for thereof |
Also Published As
Publication number | Publication date |
---|---|
KR100934937B1 (en) | 2010-01-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100861317B1 (en) | radioisotope battery and manufacturing method for thereof | |
US8866152B2 (en) | Betavoltaic apparatus and method | |
KR101928365B1 (en) | Radioisotope battery and manufacturing method for thereof | |
US11462337B2 (en) | Series and/or parallel connected alpha, beta, and gamma voltaic cell devices | |
KR20080081189A (en) | Luminescence diode chip with current spreading layer and method for producing the same | |
US9099212B2 (en) | Low volumetric density betavoltaic power device | |
US10186339B2 (en) | Semiconductor device for directly converting radioisotope emissions into electrical power | |
AU2015346007B2 (en) | Electrical generator system | |
KR100934937B1 (en) | Radioisotope battery | |
KR100861385B1 (en) | Radioisotope battery and manufacturing method for thereof | |
Krasnov et al. | Optimization of energy conversion efficiency betavoltaic element based on silicon | |
US10685758B2 (en) | Radiation tolerant microstructured three dimensional semiconductor structure | |
KR20090038593A (en) | A method for power increase in a nuclear-cell and a high efficiency beta-cell using it | |
KR100858490B1 (en) | Apparatus for sensing energy using radioisotope battery | |
TWI470818B (en) | Solar battery | |
KR20160098915A (en) | Vertical beta voltaic battery structure and method of manufacturing thereof | |
RU2605758C1 (en) | Electric power supply source | |
KR101121022B1 (en) | Electrical power generator with bi-layrted metallielectrical power generator with bi-layrted metallic thin films and integrated electrical power generator by using same | |
KR102513298B1 (en) | Radioisotope battery | |
JPS62141756A (en) | Semiconductor storage device | |
JP6263162B2 (en) | Transistor | |
Khan | Development of Gallium Nitride and Indium Gallium Phosphide Betavoltaic and Alphavoltaic Devices for Continuous Power Generation | |
JPH0228251B2 (en) | ||
JPH05136259A (en) | Semiconductor substrate and semiconductor device | |
JPS63237462A (en) | Static type semiconductor memory and manufacture thereof |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E601 | Decision to refuse application | ||
J201 | Request for trial against refusal decision | ||
J301 | Trial decision |
Free format text: TRIAL DECISION FOR APPEAL AGAINST DECISION TO DECLINE REFUSAL REQUESTED 20080618 Effective date: 20090825 |
|
S901 | Examination by remand of revocation | ||
GRNO | Decision to grant (after opposition) | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20121005 Year of fee payment: 4 |
|
FPAY | Annual fee payment |
Payment date: 20131115 Year of fee payment: 5 |
|
FPAY | Annual fee payment |
Payment date: 20150113 Year of fee payment: 6 |
|
FPAY | Annual fee payment |
Payment date: 20151221 Year of fee payment: 7 |
|
FPAY | Annual fee payment |
Payment date: 20161216 Year of fee payment: 8 |
|
FPAY | Annual fee payment |
Payment date: 20180515 Year of fee payment: 9 |
|
FPAY | Annual fee payment |
Payment date: 20181126 Year of fee payment: 10 |
|
FPAY | Annual fee payment |
Payment date: 20191220 Year of fee payment: 11 |