KR20070050445A - 다중화된 홀로그램들과 편광 조절을 이용하여분석물로부터의 스펙트럼 선들을 측정하는 장치 - Google Patents

다중화된 홀로그램들과 편광 조절을 이용하여분석물로부터의 스펙트럼 선들을 측정하는 장치 Download PDF

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Publication number
KR20070050445A
KR20070050445A KR1020077004203A KR20077004203A KR20070050445A KR 20070050445 A KR20070050445 A KR 20070050445A KR 1020077004203 A KR1020077004203 A KR 1020077004203A KR 20077004203 A KR20077004203 A KR 20077004203A KR 20070050445 A KR20070050445 A KR 20070050445A
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KR
South Korea
Prior art keywords
light
polarization
stage
holographic
detector
Prior art date
Application number
KR1020077004203A
Other languages
English (en)
Korean (ko)
Inventor
잔 립슨
Original Assignee
씨8 메디센서스, 인크.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/187,350 external-priority patent/US7277210B2/en
Application filed by 씨8 메디센서스, 인크. filed Critical 씨8 메디센서스, 인크.
Publication of KR20070050445A publication Critical patent/KR20070050445A/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G01J3/1838—Holographic gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/447—Polarisation spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N2021/216—Polarisation-affecting properties using circular polarised light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N2021/3129—Determining multicomponents by multiwavelength light
    • G01N2021/3137—Determining multicomponents by multiwavelength light with selection of wavelengths after the sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/317—Special constructive features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/317—Special constructive features
    • G01N2021/3177—Use of spatially separated filters in simultaneous way
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/203—Filters having holographic or diffractive elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/32—Holograms used as optical elements

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
KR1020077004203A 2004-07-22 2005-07-22 다중화된 홀로그램들과 편광 조절을 이용하여분석물로부터의 스펙트럼 선들을 측정하는 장치 KR20070050445A (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US59041304P 2004-07-22 2004-07-22
US60/590,413 2004-07-22
US11/187,350 2005-07-21
US11/187,350 US7277210B2 (en) 2005-07-21 2005-07-21 Measuring spectral lines from an analyte using multiplexed holograms and polarization manipulation

Publications (1)

Publication Number Publication Date
KR20070050445A true KR20070050445A (ko) 2007-05-15

Family

ID=35786720

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020077004203A KR20070050445A (ko) 2004-07-22 2005-07-22 다중화된 홀로그램들과 편광 조절을 이용하여분석물로부터의 스펙트럼 선들을 측정하는 장치

Country Status (3)

Country Link
EP (1) EP1774374A4 (fr)
KR (1) KR20070050445A (fr)
WO (1) WO2006012514A2 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20160142375A (ko) * 2014-04-07 2016-12-12 노바 메주어링 인스트루먼츠 엘티디. 광학 위상 측정 방법 및 시스템

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8687545B2 (en) * 2008-08-11 2014-04-01 Qualcomm Incorporated Anchor carrier in a multiple carrier wireless communication system
US8670376B2 (en) * 2008-08-12 2014-03-11 Qualcomm Incorporated Multi-carrier grant design
GB201000179D0 (en) 2010-01-07 2010-02-24 Rsp Systems As Apparatus for non-invasive in vivo measurement by raman spectroscopy

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5999282A (en) * 1995-11-08 1999-12-07 Victor Company Of Japan, Ltd. Color filter and color image display apparatus employing the filter
DE19801469C2 (de) * 1998-01-16 2001-05-17 Campus Technologies Ag Zug Vorrichtung zur Erfassung oder Erzeugung optischer Signale
DE69904805T2 (de) * 1998-02-13 2003-11-06 Apa Optics Inc Multiplexer und demultiplexer für nachrichtenverbindungen mit monomodigen optischen fasern
US6181957B1 (en) * 1998-07-13 2001-01-30 California Institute Of Technology Non-invasive glucose monitor
US6542134B1 (en) * 1999-03-24 2003-04-01 Intel Corporation Projection system
US6343170B1 (en) * 2000-06-27 2002-01-29 Optichrom Inc. Optical spectrum analyzer
US6525846B1 (en) 2000-09-26 2003-02-25 Aoc Technologies, Inc. Wavelength division multiplex/demultiplexing device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20160142375A (ko) * 2014-04-07 2016-12-12 노바 메주어링 인스트루먼츠 엘티디. 광학 위상 측정 방법 및 시스템
KR20220000923A (ko) * 2014-04-07 2022-01-04 노바 메주어링 인스트루먼츠 엘티디. 광학 위상 측정 방법 및 시스템
KR20220092653A (ko) * 2014-04-07 2022-07-01 노바 엘티디. 광학 위상 측정 방법 및 시스템

Also Published As

Publication number Publication date
WO2006012514A3 (fr) 2007-02-01
EP1774374A4 (fr) 2010-03-31
WO2006012514A2 (fr) 2006-02-02
EP1774374A2 (fr) 2007-04-18

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