KR20040008740A - Measuring device of waviness contrast of LCD glasses - Google Patents

Measuring device of waviness contrast of LCD glasses Download PDF

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Publication number
KR20040008740A
KR20040008740A KR1020020042416A KR20020042416A KR20040008740A KR 20040008740 A KR20040008740 A KR 20040008740A KR 1020020042416 A KR1020020042416 A KR 1020020042416A KR 20020042416 A KR20020042416 A KR 20020042416A KR 20040008740 A KR20040008740 A KR 20040008740A
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South Korea
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glass substrate
light
waviness
lcd glass
lcd
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KR1020020042416A
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Korean (ko)
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KR100503212B1 (en
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김상열
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학교법인대우학원
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/133302—Rigid substrates, e.g. inorganic substrates

Abstract

PURPOSE: An apparatus for measuring waviness of an LCD glass substrate is provided to reinforce the contrast between light and shade of waviness patterns of an LCD glass substrate, thereby easily identifying waviness of the LCD glass substrate and quantizing evaluation of the waviness. CONSTITUTION: A light system(20) applies light to an LCD(Liquid Crystal Display) glass substrate(10). A plurality of optical fibers(21) have front ends in parallel with a direction of waviness of the LCD glass substrate at predetermined gaps. A light source(22) of the light system applies light to one ends of the optical fibers. A reflecting mirror(23) is installed at a rear of the light source. A condenser lens(24) is installed in front of the light source. The thickness of light applied to the LCD glass substrate is smaller than a space period of the waviness of the LCD glass substrate.

Description

엘시디 유리기판의 굴곡측정장치{ Measuring device of waviness contrast of LCD glasses }Measuring device of waviness contrast of LCD glasses}

본 발명은 평판형 영상표시장치의 정밀도를 측정하는 장치에 관한 것으로, 특히 LCD(liquid crystal display) 유리기판에서 관찰되는 굴곡(waviness)을 측정하는 엘시디 유리기판의 굴곡측정장치에 관한 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device for measuring the accuracy of a flat panel type display, and more particularly, to an apparatus for measuring an LCD glass substrate for measuring waviness observed in a liquid crystal display (LCD) glass substrate.

일반적으로, 평판형 영상표시장치는 40인치 내지 60인치 이상의 대형 스크린에서 사용되는 PDP와 30인치까지의 소형에서 사용되는 LCD가 있다.In general, flat panel display devices include PDPs used in large screens of 40 inches to 60 inches and LCDs used in small sizes up to 30 inches.

LCD 방식에서 사용되는 유리기판은 두께가 0.7mm 이고 면적이 1m×1m 평방미터 이상의 유리판을 원재료로 사용하는데, 이 유리기판은 용융상태의 액체유리로부터 만들어 진다.The glass substrate used in the LCD method uses a glass plate having a thickness of 0.7 mm and an area of 1 m × 1 m or more as a raw material, which is made from molten liquid glass.

유리기판은 제조되는 공정에서 웨이브니스(굴곡,waviness)라는 결이 액체유리의 흐름방향과 나란하게 형성되는데, 이러한 결은 유리기판을 투과하는 빛의 편광상태로 반영되므로 LCD 방식의 영상표시장치에서는 화면상에 형성되는 물결무늬를 통해 직접적으로 악영향을 주게 되므로 LCD 평판소자의 성능을 저하시키는 주요 원인이 되고 있다.In the process of manufacturing the glass substrate, the waveiness (waviness) is formed in parallel with the flow direction of the liquid glass. This texture is reflected in the polarization state of the light passing through the glass substrate. Since the wave pattern formed on the screen directly adversely affects the performance of the LCD flat panel device.

따라서, 이러한 웨이브니스의 강도를 분석하는 것은 LCD 방식의 영상표시장치의 생산공정에서 중요한 역할을 하게 된다.Therefore, analyzing the intensity of the wave plays an important role in the production process of the LCD display device.

도 1에 도시된 바와 같이, LCD 용 유리기판(101)의 웨이브니스를 관찰하는 종래의 방법은 Xe-arc 램프를 광원(102)으로 하고 약 1-2m 떨어진 곳에 관찰하고자하는 유리기판을 광원(102)과 수직으로 위치시킨 다음 유리기판(101)의 반대쪽에 있는 스크린(103)으로 투영된 투과광의 세기를 육안으로 관찰하는 방법이다.As shown in FIG. 1, the conventional method of observing the waveiness of the glass substrate 101 for LCD uses a Xe-arc lamp as the light source 102 and a glass substrate to be observed about 1-2m away. 102 is positioned perpendicular to the surface, and then the intensity of the transmitted light projected onto the screen 103 on the opposite side of the glass substrate 101 is visually observed.

유리기판에 의한 웨이브니스(104)는 스크린에 1-2mm 간격의 물결무늬와 비슷한 나란한 무늬로 나타나는데, 이러한 물결무늬의 존재여부를 육안으로 식별하고 그 강도를 주관적으로 판단하게 되므로 웨이브니스가 적은 경우에는 물결무늬를 쉽게 관찰하기 어려운 문제점이 있었다.Waves 104 due to glass substrates appear on the screen in side by side pattern similar to the wave pattern of 1-2mm intervals. If the waveness is small because the presence of such waves is visually identified and the strength is subjectively judged. There was a problem that it is difficult to easily observe the wave pattern.

즉, 사람이 느끼는 빛의 세기는 실제 빛의 세기와 비례하지 않으며 전체적으로 밝은 배경에서 상대적으로 약간 덜 밝은 물결형태의 무늬를 사람의 시각에만 의존하여서는 그 명암대조를 정량적으로 파악하기 어려우며, 개인차나 개인의 신체 컨디션에 따라서도 크게 차이가 나므로 평가의 객관화가 어려운 실정이다.In other words, the intensity of light that a person feels is not proportional to the actual intensity of light, and it is difficult to quantitatively determine the contrast of the contrast based only on the human's perspective, which is a pattern of wave patterns that are relatively lighter on a light background as a whole. The physical condition is also very different depending on the physical condition of the evaluation is difficult.

종래의 이러한 방식으로는 품질제어 및 평가의 표준화를 이룰 수 없어 대량생산이 어려운 문제점이 있었다.In the conventional method, quality control and evaluation cannot be standardized, so mass production is difficult.

또한, 광원으로 사용하고 있는 Xe-arc 램프는 다량의 자외선을 방출하게 되므로 자외선에 노출되어 쉽게 피로감을 느끼며 눈에 악영향을 미치는 문제점이 있었다.In addition, since the Xe-arc lamp used as a light source emits a large amount of ultraviolet light, it is easily exposed to ultraviolet light, causing fatigue and adversely affecting the eyes.

이에 본 발명은 상기한 바의 제반 문제점들을 해소하기 위해 안출된 것으로, 다수개의 점광원들을 굴곡의 무늬방향과 나란하게 선형으로 배열하여 굴곡 무늬의 명암대비를 강화함으로써 엘시디 유리기판의 굴곡을 용이하게 식별할 수 있도록 하는 엘시디 유리기판의 굴곡측정장치를 제공함에 그 목적이 있다.Accordingly, the present invention has been made to solve the above-mentioned problems, and it is easy to bend the LCD glass substrate by strengthening the contrast of the curved pattern by arranging a plurality of point light sources linearly in parallel with the curved pattern direction. It is an object of the present invention to provide a bend measuring device for LCD glass substrate to be identified.

상기한 바의 목적을 달성하기 위한 본 발명은, 원형배열 끝단에서 빛을 입사받아 반대편 선형배열 끝단에서 방출되는 빛을 LCD 유리기판에 조사하고 LCD 유리기판의 굴곡 무늬방향과 나란하게 배열되는 복수개의 광섬유와, 상기 광섬유의 원형배열 끝단에 빛을 조사하는 광원과, 상기 광원의 후면에 구비되는 반사거울, 상기 광원의 전면에 구비되는 집속렌즈, LCD 유리기판을 투과한 빛을 투영하는 스크린을 포함하고 있다.In order to achieve the above object, the present invention provides a plurality of light rays that are incident on a circular array end and irradiated with light emitted from the opposite linear array end to the LCD glass substrate, and arranged in parallel with the curved pattern direction of the LCD glass substrate. An optical fiber, a light source for irradiating light to an end of the circular array of the optical fiber, a reflective mirror provided at the rear of the light source, a focusing lens provided at the front of the light source, and a screen for projecting light transmitted through the LCD glass substrate Doing.

따라서, 다수개의 광섬유를 유리기판의 굴곡 무늬방향과 나란하게 배열하고 유리기판에 조사되는 빛의 굵기를 유리기판의 굴곡의 공간주기보다 작게 하여 굴곡 무늬의 명암대비를 강화할 수 있게 되는 것이다.Therefore, the plurality of optical fibers are arranged in parallel with the curved pattern direction of the glass substrate and the thickness of the light irradiated onto the glass substrate is made smaller than the space period of the curved glass substrate to enhance the contrast of the curved pattern.

도 1은 종래의 기술에 따른 엘시디 유리기판의 굴곡측정장치를 나타낸 개략적 구성도,1 is a schematic configuration diagram showing a bend measuring device of an LCD glass substrate according to the prior art,

도 2는 본 발명에 따른 엘시디 유리기판의 굴곡측정장치의 일실시예를 나타낸 구성도,Figure 2 is a block diagram showing an embodiment of the bending measurement apparatus of the LCD glass substrate according to the present invention,

도 3은 본 발명의 일실시예의 조사장치를 나타낸 일측면도,3 is a side view showing an irradiation apparatus of an embodiment of the present invention;

도 4는 본 발명의 일실시예의 A-A선을 따라 절개한 횡단면도,Figure 4 is a cross-sectional view cut along the line A-A of an embodiment of the present invention,

도 5와 도 6은 본 발명의 스크린에 투영된 굴곡의 무늬를 나타낸 사진,5 and 6 are photographs showing the pattern of the curve projected on the screen of the present invention,

도 7은 본 발명의 다른 일실시예의 조사장치를 나타낸 평면도이다.7 is a plan view showing a irradiation apparatus of another embodiment of the present invention.

* 도면의 주요부분에 대한 부호의 설명 *Explanation of symbols on the main parts of the drawings

10 : LCD 유리기판 20,20' : 조사장치10: LCD glass substrate 20,20 ': Irradiation device

21 : 광섬유 22 : 광원21: optical fiber 22: light source

23 : 반사거울 24 : 집속렌즈23: reflection mirror 24: focusing lens

25 : 실린더렌즈 26 : 슬릿25: cylinder lens 26: slit

27 : 조사케이스 28 : 관통구멍27: irradiation case 28: through hole

30 : 스크린30: screen

이하 본 발명의 바람직한 실시예를 첨부된 도면을 참조하여 상세히 설명한다.Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

도 2는 본 발명에 따른 엘시디 유리기판의 굴곡측정장치의 일실시예를 나타낸 구성도이고, 도 3은 본 발명의 일실시예의 조사장치를 나타낸 일측면도이며, 도 4는 본 발명의 일실시예의 A-A선을 따라 절개한 횡단면도, 도 5와 도 6은 본 발명의 스크린에 투영된 굴곡의 무늬를 나타낸 사진이다.Figure 2 is a block diagram showing an embodiment of the bending measurement apparatus of the LCD glass substrate according to the present invention, Figure 3 is a side view showing an irradiation apparatus of an embodiment of the present invention, Figure 4 is an embodiment of the present invention 5 and 6 are photographs showing the pattern of bending projected on the screen of the present invention.

본 발명에 따른 엘시디 유리기판의 굴곡측정장치는, LCD 유리기판(10)에 빛을 조사하는 조사장치(20)와, LCD 유리기판(10)을 투과한 빛을 투영하는 스크린(30)을 포함한다.An apparatus for measuring curvature of an LCD glass substrate according to the present invention includes an irradiation device 20 for irradiating light to the LCD glass substrate 10 and a screen 30 for projecting light transmitted through the LCD glass substrate 10. do.

상기 조사장치(20)는, 각각의 일단들이 원형으로 배열되어 빛을 동시에 입사받고 각각의 타단들이 선형으로 배열되어 빛을 방출하는 복수개의 광섬유(21)와, 상기 광섬유(21)의 일단에 빛을 조사하는 광원(22)과, 상기 광원(22)의 후면에 구비되는 반사거울(23), 상기 광원(22)의 전면에 구비되는 집속렌즈(24)를 포함한다.The irradiation apparatus 20 includes a plurality of optical fibers 21 each of which one end is arranged in a circular shape and simultaneously receives light, and the other ends are arranged in a linear manner, and emits light, and one end of the optical fiber 21 is lighted. It includes a light source 22 for irradiating the light, a reflective mirror 23 provided on the rear of the light source 22, and a focusing lens 24 provided on the front of the light source 22.

상기 광섬유(21)는 다수개가 구비되고, 각각의 일단이 모아져 케이블과 같은 광섬유다발을 이루게 되며, 각각의 타단이 갈라져 선형으로 배치된다.The optical fiber 21 is provided with a plurality, each end is collected to form an optical fiber bundle, such as a cable, each other end is arranged linearly.

따라서, 원형으로 배열된 각 광섬유(21)의 끝단으로 빛이 입사되고, 입사 받은 빛을 선형으로 배열된 끝단으로 방출시키게 된다.Therefore, light is incident on the ends of each of the optical fibers 21 arranged in a circle, and the incident light is emitted to the ends arranged in a linear manner.

상기 조사장치(20)는 일측에 다수개의 관통구멍(28)이 소정간격을 두고 일렬로 형성된 조사케이스(27)를 구비하고, 상기 광섬유(21)의 일단을 상기 관통구멍(28)에 각각 배치시킴으로써 선형으로 빛을 방출할 수 있게 된다.The irradiation apparatus 20 has a plurality of through holes 28 on one side of the irradiation case 27 formed in a line at a predetermined interval, and one end of the optical fiber 21 is disposed in the through holes 28, respectively. This allows light to be emitted linearly.

상기 광섬유(21)의 선형배열은 LCD 유리기판(10)의 굴곡(waviness)의 방향과 평행하게 배치되어 굴곡 무늬를 광섬유(21)의 개수만큼 강화시키게 된다.The linear arrangement of the optical fiber 21 is disposed in parallel with the direction of the waviness of the LCD glass substrate 10 to strengthen the curved pattern by the number of optical fibers 21.

즉, 상기 다수개의 광섬유(21)를 LCD 유리기판(10)의 굴곡(waviness) 무늬방향과 나란하게 선형으로 배치하게 되면 각각의 광섬유(21)에서 방출되는 빛에 의해 굴곡(waviness)의 무늬가 서로 보강되어 하나의 광섬유(21)를 사용할 때보다 N배 강화된 굴곡(waviness) 무늬를 얻을 수 있게 된다.That is, when the plurality of optical fibers 21 are arranged linearly in parallel with the waviness pattern direction of the LCD glass substrate 10, the waviness pattern is caused by the light emitted from each optical fiber 21. By reinforcing each other, it is possible to obtain a waviness pattern that is N times stronger than when using one optical fiber 21.

여기서, 만약 다수개의 광섬유(21)를 LCD 유리기판(10)의 굴곡(waviness) 무늬방향을 가로지르는 방향으로 배치하게 되면 광섬유(21)에서 방출되는 빛에 의한 굴곡(waviness)의 무늬가 희석되는 효과가 나타난다.Here, if the plurality of optical fibers 21 are arranged in a direction crossing the waviness pattern direction of the LCD glass substrate 10, the pattern of the waviness due to the light emitted from the optical fiber 21 is diluted. Effect.

따라서, 도 5에 도시된 바와 같이, 상기 다수개의 광섬유(21)를굴곡(waviness)의 무늬방향과 나란하게 배치하여 굴곡(waviness) 무늬의 명암대비가 강화된 상태를 관찰할 수 있고, 도 6에 도시된 바와 같이 다수개의 광섬유(21)가 굴곡(waviness)의 무늬방향과 수직하게 배치되어 굴곡(waviness) 무늬의 명암대비를 감소시킨 상태를 관찰할 수 있게 된다.Accordingly, as shown in FIG. 5, the plurality of optical fibers 21 may be arranged in parallel with the pattern direction of the waviness to observe the enhanced contrast of the pattern of the waviness. As shown in FIG. 3, the plurality of optical fibers 21 are disposed perpendicular to the pattern direction of the waviness, thereby reducing the contrast of the pattern of the waviness.

여기서, 선형배열을 이루는 각각의 광섬유(21)에서 방출하는 빛의 굵기, 즉 광섬유의 굵기가 굴곡(waviness)의 공간주기에 비해 작을 수록 명암대비가 강화되는 효과가 나타난다.Here, as the thickness of the light emitted from each optical fiber 21 constituting the linear array, that is, the thickness of the optical fiber is smaller than the spatial period of the waviness, the contrast is enhanced.

즉, 상기 LCD 유리기판(10)의 굴곡(waviness)들 사이의 간격인 공간주기보다 광섬유(21)로부터 LCD 유리기판(10)에 입사되는 빛의 굵기가 작게 되면 스크린(30)에 나타나는 명암대비가 커지게 된다.That is, when the thickness of light incident from the optical fiber 21 to the LCD glass substrate 10 becomes smaller than the space period which is the interval between the wavinesses of the LCD glass substrate 10, the contrast that appears on the screen 30 is reduced. Becomes large.

상기 광원(22)은 50-500W 출력을 가진 할로겐램프를 사용하고, 후면에는 반사거울(23)을 구비하며, 전면에는 집속렌즈(24)를 구비하고 있다.The light source 22 uses a halogen lamp having a 50-500W output, has a reflective mirror 23 at the rear, and a focusing lens 24 at the front.

상기 반사거울(23)과 집속렌즈(24)는 광원(22)에서 방출되는 빛을 광섬유(21)의 한쪽 끝단인 원형다발에 집속시키는 역할을 한다.The reflection mirror 23 and the focusing lens 24 focus the light emitted from the light source 22 onto a circular bundle that is one end of the optical fiber 21.

한편, 상기 스크린(30)에 투영된 LCD 유리기판(10)의 굴곡(waviness) 무늬를 CCD(전하결합소자,Charge Coupled Device)카메라로 촬영하고, 디지털 영상을 인식한 후 LCD 유리기판(10)의 굴곡의 정도를 수치화하여 이를 토대로 굴곡의 평가를 정량화할 수 있게 하는 것도 가능하다.Meanwhile, the curved pattern of the LCD glass substrate 10 projected on the screen 30 is photographed by a CCD (Charge Coupled Device) camera, and the LCD glass substrate 10 is recognized after recognizing a digital image. It is also possible to quantify the degree of curvature of and to quantify the assessment of curvature based on this.

도 6은 본 발명의 다른 일실시예의 조사장치를 나타낸 구성도이다.Figure 6 is a block diagram showing a irradiation apparatus of another embodiment of the present invention.

도 6에 도시된 바와 같이, 본 실시예에 따른 조사장치(20')는, 빛을 입사 받아 방출하는 광섬유(21)와, 상기 광섬유(21)에 빛을 조사하는 광원(22)과, 상기 광원의 후면에 구비되는 반사거울(23) 및, 상기 광원(22)의 전면에 구비되는 집속렌즈(24), 상기 광섬유(21)에서 나오는 빛의 초점을 맞추는 실린더렌즈(cylinder lens)와, 상기 실린더렌즈(25)를 통과한 빛을 슬릿빔으로 만드는 슬릿(26)을 포함하고 있다.As shown in FIG. 6, the irradiation apparatus 20 ′ according to the present embodiment includes an optical fiber 21 that receives light and emits light, a light source 22 that irradiates light onto the optical fiber 21, and A reflective mirror 23 provided at the rear of the light source, a focusing lens 24 provided at the front of the light source 22, a cylinder lens focusing light emitted from the optical fiber 21, and It includes a slit 26 for making the light passing through the cylinder lens 25 into a slit beam.

상기 광섬유(21)는 그 선단에서 방출되는 빛의 굵기가 LCD 유리기판(10)의 굴곡(waviness)의 공간주기보다 클 정도로 직경이 큰 것을 사용하고 있다.The optical fiber 21 uses a large diameter such that the thickness of the light emitted from its tip is larger than the space period of the waviness of the LCD glass substrate 10.

상기 실린더렌즈(25)와 슬릿(26)은 상기 광섬유(21)에서 방출되는 빛의 굵기를 LCD 유리기판(10)의 굴곡의 공간주기보다 작게 하는 역할을 한다.The cylinder lens 25 and the slit 26 serve to make the thickness of the light emitted from the optical fiber 21 smaller than the space period of the bending of the LCD glass substrate 10.

즉, 상기 광섬유(21)의 끝과 실린더렌즈(25) 및 슬릿(26)을 대략 10 cm 정도로 일직선상에 배열하고 슬릿(26)의 폭을 50-500 미크론()으로 하여 굴곡(waviness)의 무늬방향과 나란하고 굴곡(waviness)의 공간주기보다 폭이 작은 빛을 얻을 수 있게 된다.That is, the ends of the optical fiber 21 and the cylinder lens 25 and the slit 26 are arranged in a straight line about 10 cm and the width of the slit 26 is 50-500 microns ( ), Light parallel to the pattern direction of the waviness and smaller in width than the space period of the waviness can be obtained.

이상에서 설명한 바와 같이 본 발명에 따른 엘시디 유리기판의 굴곡측정장치에 의하면, 다수개의 광섬유를 유리기판의 굴곡 무늬방향과 나란하게 배열하고 유리기판에 조사되는 빛의 굵기를 유리기판의 굴곡의 공간주기보다 작게 하여 굴곡무늬의 명암대비를 강화함으로써 엘시디 유리기판의 굴곡을 용이하게 식별할 수 있고, 굴곡의 평가를 정량화하는데 기여하는 효과가 있다.As described above, according to the bend measuring device of an LCD glass substrate according to the present invention, a plurality of optical fibers are arranged in parallel with the bend pattern direction of the glass substrate and the thickness of the light irradiated onto the glass substrate is a space period of the bend of the glass substrate. By making it smaller and strengthening the contrast of the curved pattern, it is possible to easily identify the curvature of the LCD glass substrate and contribute to quantifying the evaluation of the curvature.

Claims (2)

LCD 유리기판(10)에 조사장치(20)로 빛을 조사하고 투과된 빛을 스크린(30)에 투영하여 LCD 유리기판(10) 표면의 굴곡(waviness)을 평가하는 엘시디 유리기판의 굴곡측정장치에 있어서,LCD glass substrate 10 is irradiated with the irradiation device 20 and the transmitted light is projected on the screen 30 to measure the bending (Waviness) of the LCD glass substrate 10 surface bending device of the LCD glass substrate To 상기 조사장치(20)는,The irradiation device 20, 빛을 방출하는 선단이 상기 LCD 유리기판(10)의 굴곡(waviness)의 방향과 평행한 방향으로 소정간격을 두고 복수개가 구비된 광섬유(21)와;A plurality of optical fibers 21 provided with a plurality of ends at predetermined intervals in a direction parallel to a direction of bending of the LCD glass substrate 10 to emit light; 상기 광섬유(21)의 일단에 빛을 조사하는 광원(22);을 포함하는 것을 특징으로 하는 엘시디 유리기판의 굴곡측정장치.And a light source (22) for irradiating light to one end of the optical fiber (21). 제1항에 있어서, 상기 조사장치(20)는,The method of claim 1, wherein the irradiation apparatus 20, 상기 광섬유(21)에서 나오는 빛의 초점을 맞추는 실린더렌즈(cylinderical lens)와; 상기 실린더렌즈(25)를 통과한 빛을 슬릿빔으로 만드는 슬릿(26);을 더 포함하는 것을 특징으로 하는 엘시디 유리기판의 굴곡측정장치.A cylindrical lens focusing light emitted from the optical fiber 21; And a slit (26) for making the light that passes through the cylinder lens (25) into a slit beam.
KR10-2002-0042416A 2002-07-19 2002-07-19 Measuring device of waviness contrast of LCD glasses KR100503212B1 (en)

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US8927163B2 (en) 2006-10-26 2015-01-06 Korea Institute Of Science And Technology Apparatus for portable fuel cells and operating method thereof

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US8927163B2 (en) 2006-10-26 2015-01-06 Korea Institute Of Science And Technology Apparatus for portable fuel cells and operating method thereof

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