KR20040001368A - The method of PBN film forming by CVD - Google Patents

The method of PBN film forming by CVD Download PDF

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KR20040001368A
KR20040001368A KR1020020036533A KR20020036533A KR20040001368A KR 20040001368 A KR20040001368 A KR 20040001368A KR 1020020036533 A KR1020020036533 A KR 1020020036533A KR 20020036533 A KR20020036533 A KR 20020036533A KR 20040001368 A KR20040001368 A KR 20040001368A
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gas
reaction
pbn
cvd
thin film
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장민석
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장민석
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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B19/00Driving, starting, stopping record carriers not specifically of filamentary or web form, or of supports therefor; Control thereof; Control of operating function ; Driving both disc and head
    • G11B19/20Driving; Starting; Stopping; Control thereof
    • G11B19/2009Turntables, hubs and motors for disk drives; Mounting of motors in the drive
    • G11B19/2027Turntables or rotors incorporating balancing means; Means for detecting imbalance
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B2220/00Record carriers by type
    • G11B2220/20Disc-shaped record carriers
    • G11B2220/25Disc-shaped record carriers characterised in that the disc is based on a specific recording technology
    • G11B2220/2537Optical discs

Abstract

PURPOSE: A method of forming PBN(Pyrolitic Boron Nitride) film by using the CVD(Chemical Vapor Deposition) is provided to define the range of reaction gas charge ratio, reaction temperature and reaction pressure of a carrier gas, which is enough for producing the PBN film, by an experiment. CONSTITUTION: In producing a PBN film in a CVD reaction chamber, BCl3, B2H6 or NH3 gas is used as the main reaction gas, and N2 or H2 gas is used as the carrier gas. In the process of producing the PBN film, the reaction temperature is set to 700 °C-2300 °C, and the reaction pressure of the carrier gas is set to 0.01 torr-20 torr.

Description

기상증착에 의한 PBN 박막제조 방법{The method of PBN film forming by CVD}PBN thin film manufacturing method by vapor deposition {The method of PBN film forming by CVD}

본 발명은 BCl3혹은 B2H6가스와 NH3가스를 고온, 저압 하에서 반응시켜 내화학성 및 열전도성이 뛰어나며 절연성이 우수한 PBN(Pyrolitic Boron Nitride) 코팅막(Coated Film)을 제조하는 방법에 관한 것으로서 이때 Carrier Gas로서 N2혹은 H2Gas를 사용 할 수도 있다.The present invention relates to a method of manufacturing PBN (Pyrolitic Boron Nitride) coated film (PBN) having excellent chemical resistance and thermal conductivity and excellent insulation by reacting BCl 3 or B 2 H 6 gas with NH 3 gas at high temperature and low pressure. At this time, N 2 or H 2 Gas may be used as the carrier gas.

미래로 갈수록 반도체 Device의 집적도가 증대됨에 따라 전공정 설비중 매엽식(Single-wafer 방식)이 차지하는 비율이 증대되고 Wafer Size 또한 200mm에서 300mm로 대구경화 되면서 Wafer 제작 시 불량률 저하 및 수율 향상에 많은 연구가 진행되고 있다.As the integration of semiconductor devices increases toward the future, the proportion of single-wafer type in the pre-processing equipment increases and the wafer size is also large from 200mm to 300mm. Is going on.

특히 Wafer 제작 시 Wafer를 지탱해주는 Susceptor의 Chuck기능적인 측면에서 기존의 방법은 Clamp Type인 단순 기계적 접촉방식 이기 때문에 접촉면의 절단 버림으로 인한 수률저하, 접촉 시 나올 수 있는 미립자로 인한 불량률 상승 등으로 인해 많은 어려움을 겪어왔고 따라서 최근에는 비접촉방식인 ESC(ElectroStaticChuck)방식에 많은 연구가 집중되고 있고 이런 ESC방식에는 정전기를 유도하기 위해 필연적으로 도체상에 절연물질의 박막이 필요하다. 이런 요구에 부응하는 우수한 절연박막중의 하나가 PBN(Pyrolitic Boron Nitride)이다.In particular, the conventional method in terms of the chuck function of the susceptor that supports the wafer when manufacturing the wafer is a simple mechanical contact method, which is a clamp type. Recently, many researches have been focused on the ESC (ElectroStaticChuck) method, which is a non-contact method, and this ESC method necessarily requires a thin film of insulating material on the conductor to induce static electricity. One of the excellent insulating thin films that meets this demand is PBN (Pyrolitic Boron Nitride).

특히 Wafer제작 과정은 가열, 냉각, 가스투입, Plasma사용 등 많은 공정으로 이루어져 있기 때문에 Wafer를 지탱해주는 Susceptor는 열전달이 우수 해야하며 내화학성이 뛰어나고 Wafer의 전기적 쇼트방지와 정전기유도를 위해 절연성이 우수한 재질이 필요하다. PBN은 열전달이 우수하면서 내화학성, 고기계적강도, 고절연성을 가짐으로 해서 Suceptor제작이나 전기적 쇼트위험성이 없는 Heater제작에 매우 우수한 재질이다.In particular, since the wafer manufacturing process consists of many processes such as heating, cooling, gas injection, and plasma use, the susceptor supporting the wafer should have excellent heat transfer, excellent chemical resistance, and excellent insulation for preventing electrical shorts and inducing static electricity of the wafer. This is necessary. PBN has excellent heat transfer, chemical resistance, high mechanical strength, and high insulation, making it a very good material for the manufacture of heaters without the risk of suceptors or electrical shorts.

그러나 PBN박막제조법은 학술적이 아닌 공업적으로 사용할 수 있도록 기상증착법에 의한 박막형성기술이 현시점에서 부족한 점이 많다.However, PBN thin film manufacturing method has a lot of current shortage of thin film formation technology by vapor deposition method to be used industrially, not academic.

따라서 본 발명은 공업적으로 유용한 PBN박막 제조에 관한 것으로 여러 분야의 제조산업에 유용하게 적용될 수 있다.Therefore, the present invention relates to the production of industrially useful PBN thin film can be usefully applied to the manufacturing industry of various fields.

본 발명의 목적은 카본, 세라믹, 금속류 등의 표면이 열 전달이 우수하면서 고 기계적 강도, 내화학성, 절연성 등이 필요한 경우 이런 물성을 만족시킬 수 있는 박막형성 기술로서 BCl3혹은 B2H6가스와 NH3가스를 고온, 저압 하에서 반응시켜 내화학성 및 열전도성이 뛰어나며 절연성이 우수한 PBN(Pyrolitic Boron Nitride) 코팅막(Coated Film)을 제조하는 방법에 관한 것으로서 이때 Carrier Gas로서 N2혹은 H2Gas를 사용 할 수도 있는데 이들 가스가 반응하여 PBN박막을 형성할 수 있는 반응가스 투입비, 반응온도, 반응압 등을 실험을 통해 범위를 지정함에 있다.An object of the present invention is BCl 3 or B 2 H 6 gas as a thin film formation technology that can satisfy these properties when the surface of carbon, ceramics, metals, etc. is excellent in heat transfer and high mechanical strength, chemical resistance, insulation, etc. are required And a method of manufacturing PBN (Pyrolitic Boron Nitride) coated film having excellent chemical resistance, thermal conductivity and excellent insulation by reacting NH 3 gas at high temperature and low pressure. In this case, N 2 or H 2 Gas is used as carrier gas. These gases can also be used to specify the reaction gas input ratio, reaction temperature, reaction pressure, etc. that can form PBN thin film through experiments.

그림1이 PBN박막을 형성시킬 수 있는 CVD장치의 개략도 이다.Figure 1 is a schematic diagram of a CVD apparatus capable of forming a PBN thin film.

그림 1Pic 1

NH3(99.9995%)가스가 316 Stainless Steel을 통해 Chamber로 투입됐고 BCl3(99.999%) 혹은 B2H6(99.999%)가스와 N2(99.999%) 혹은 H2(99.999%) 가스는 Chamber 투입직전 l개의 같은 316 Stainless Steel통해 투입되도록 설계되었다.NH 3 (99.9995%) gas was introduced into the chamber through 316 Stainless Steel, and BCl 3 (99.999%) or B 2 H 6 (99.999%) gas and N 2 (99.999%) or H 2 (99.999%) gas It is designed to be fed through 1 identical 316 stainless steel just before loading.

가스흐름 속도는 MFC(Mass Flow Controller)에 의해 조정 가능하고 BCl3와NH3의 흐름속도는 15-1000SCCM(Standard Cubic Centimetre per Minute), N2혹은 H2가 150SCCM이상 사용 되었고 원하는 반응압에 따라 변경 될 수 있었다.Gas flow rate can be adjusted by Mass Flow Controller (MFC), and the flow rate of BCl 3 and NH 3 is 15-1000SCCM (Standard Cubic Centimetre per Minute), N 2 or H 2 is used more than 150SCCM. Could be changed.

반응챔버내의 반응가스전압(Total gas pressure)는 배출구쪽에 붙은 pressure control valve로 원하는 압력을 반응동안 자동으로 일정하게 유지할 수 있었고 실험 반응가스 전압범위는 0.01-20torr이었다.The total gas pressure in the reaction chamber was automatically maintained at a constant pressure during the reaction by a pressure control valve attached to the outlet. The experimental reaction gas voltage range was 0.01-20torr.

가열은 Graphite Heater을 사용했고 챔버 내부 반응온도는 700-2300℃로 변경시키면서 실험했고 원하는 온도가 실험동안 자동으로 조절, 유지될 수 있었고 반응 후 발생하는 NH4Cl과 유해가스를 차단하기 위해 Filter와 Wet Scrubber를 진공펌프 전후에 장착했다. 또한 연결부위의 진공도를 유지하기 위해 과열 방지목적으로 냉각수 흐름장치도 장착했다.Filter and heat is made to use the temperature inside the reaction chamber is made to experiments while changing 700-2300 ℃ blocking NH 4 Cl and harmful gas generated after the desired temperature was to be automatically adjusted, while keeping the reaction experiment Graphite Heater The wet scrubber was mounted before and after the vacuum pump. In order to maintain the degree of vacuum at the joints, a coolant flow system is also installed to prevent overheating.

아래의 구체적인 실시예를 통하여 본 발명을 상세히 설명하지만, 본 발명의 범위가 이에 제한되는 것은 아니다.The present invention will be described in detail with reference to the following specific examples, but the scope of the present invention is not limited thereto.

실시예 1.Example 1.

밀도가 1.75g/cm2인 Graphite 원판(직경:3cm, 두께:1cm)을 알콜과 아세톤으로 세척한 다음 질소가스로 불어 완전 건조한다. 이 세척된 증착 대상물을 ZIG를 사용하여 반응챔버에 넣고 진공(0.01torr 이하)을 유지하면서 분당 10℃로 700℃까지 승온하고 700℃가 계속 유지되는 상태에서 Leak을 Check하여 이상이 없으면 N2가스 밸브를 열어 100cm2/min로 투입시키면서 자동제어에 의해 반응챔버 압이 5torr로일정하게 유지 되도록 한다. 이어 NH3자 60cm2/min, BCl3가 90cm2/min로 2시간 동안 일정한 흐름으로 투입 되게 함으로서 반응이 진행 되도록 한다.Graphite discs with a density of 1.75 g / cm 2 (diameter: 3 cm, thickness: 1 cm) are washed with alcohol and acetone and blown with nitrogen gas to dry completely. Put the washed object deposited in the reaction chamber by using the ZIG If no abnormality is found by the Leak Check in a state in which the temperature was raised up to a vacuum, while maintaining (or less 0.01torr) 700 ℃ per minute to 10 ℃ and maintain a 700 ℃ N 2 gas Open the valve and inject it at 100cm 2 / min, and keep the reaction chamber pressure at 5torr by automatic control. Subsequently, the reaction was carried out by allowing NH 3 to 60 cm 2 / min and BCl 3 to be injected at a constant flow for 2 hours at 90 cm 2 / min.

2시간 반응 후(계속해서 반응을 원할 경우 이 조건을 원하는 시간만큼 유지함) BCl3, NH3, N2순으로 가스line을 잠그고 챔버내압을 0.01torr이하로 유지하면서 고온에서는 분당10℃정도로 온도를 내린다. 온도가 100℃이하가 되면 N2가스로 챔버내의 압력을 대기압과 같게하여 시편을 꺼낸다.After the reaction for 2 hours (if you want to keep the reaction, keep this condition for the desired time) Lock the gas line in the order of BCl 3 , NH 3 , N 2 , and keep the chamber internal pressure below 0.01torr, Get off. When the temperature is below 100 ° C, the specimen is removed by using N 2 gas to make the pressure in the chamber equal to atmospheric pressure.

증착된 시편은 외관상 흰색의 BN박막이고 증착속도는 반응가스 혼합지역에서 시편이 놓여지는 거리에 반비례 하는데 12um/hr이하의 증착속도를 보인다.The deposited specimen is a white BN thin film, and the deposition rate is inversely proportional to the distance of the specimen in the reaction gas mixing region, and the deposition rate is less than 12um / hr.

실시예 2.Example 2.

반응온도만 1500℃로 하고 실시예 1과 동일하게 진행해도 시편에 BN박막이 얻어지고 같은 방법으로 실시예 1과 동일하면서 반응온도만 800℃, 900℃, 1000℃, 1100℃, 1100℃, 1200℃, 1300℃, 1400℃, 1600℃, 1700℃, 1800℃, 1900℃, 2000℃, 2100℃, 2200℃, 2300℃로 다르게 했을 때도 BN박막이 얻어진다.Even if the reaction temperature was set at 1500 ° C., the same procedure as in Example 1 was carried out to obtain a BN thin film. The same method as in Example 1 was followed, but the reaction temperature was only 800 ° C., 900 ° C., 1000 ° C., 1100 ° C., 1100 ° C., 1200 BN thin films are also obtained when the temperature is different from 1 ° C, 1300 ° C, 1400 ° C, 1600 ° C, 1700 ° C, 1800 ° C, 1900 ° C, 2000 ° C, 2100 ° C, 2200 ° C and 2300 ° C.

실시예 3.Example 3.

실시예 1.과 동일한 조건이나 반응압을 0.01torr~20torr로 변경시켜도 같은 BN박막이 얻어진다. 이때 원하는 반응압을 조절 가능하게 하기 위해서 투입되는 NH3와 BCl3의 시간당 부피가 변경 될 수 있다.The same BN thin film can be obtained even if the same conditions and reaction pressure as in Example 1 are changed to 0.01 to 20 torr. At this time, the hourly volume of NH 3 and BCl 3 may be changed in order to control the desired reaction pressure.

실시예 4.Example 4.

실시예 1.과 동일하나 Carrier Gas로서 N2가스 대신 H2가스를 사용해도 동일한 결과를 얻을 수 있고 사용량은 N2,H2가스 모두 BCl3가스의 2배 이상을 사용하는 것이 바람직 하나 보조가스를 반듯이 사용해야만 되는 것은 아니었다Example 1. N 2 gas instead of the same one can achieve the same effect also with the H 2 gas and the amount used is N 2, H 2 gas is preferably one or both the secondary gas, which is used for more than twice the BCl 3 gas is used as the Carrier Gas I didn't have to use

실시예 5.Example 5.

실시예 1과 동일하나 NH3와 BCl3의 사용 부피비를 변경시켜도 BN박막을 얻을수 있었다 하지만 BN박막 수율면에서 [NH3]/[BCl3]=1.5가 가장 좋았다.As in Example 1, BN thin films could be obtained by changing the volume ratio of NH 3 and BCl 3 , but [NH 3 ] / [BCl 3 ] = 1.5 was the best in terms of BN thin film yield.

윗 방법으로 증착된 PBN박막의 특성을 나타내면 표1과 같고The characteristics of the PBN thin film deposited by the above method are shown in Table 1.

표 1.Table 1.

성분 분석결과는 BN이 99%이상이고 B2O3등 불순물이 1%미만 이 었다.Component analysis showed that BN was over 99% and impurities such as B 2 O 3 were less than 1%.

열전달이 우수하면서도 절연성, 고기계적강도, 내화학성, 비오염성 등을 동시에 갖추는 물질은 여러 분야에서 유효하게 적용될 수 있는데 PBN박막이 바로 이런 성질을 동시에 가지고 있다.Materials that have excellent heat transfer but also have insulation, high mechanical strength, chemical resistance, and non-pollution properties can be effectively applied in various fields. PBN thin films have this property at the same time.

예로서 반도체 Wafer 제작시 서셉터는 기능적으로 Wafer를 지탱해주는 역할 뿐 만 아니라 우수한 열전달, 고기계적강도, 특히 고절연성과 내화학성을 요구한다.For example, in the manufacture of semiconductor wafers, the susceptor not only supports the wafers functionally but also requires excellent heat transfer, high mechanical strength, especially high insulation and chemical resistance.

이런 특성 때문에서 Graphite에 PBN 박막을 입힌 것으로 기존 서셉터를 대체 한다면 모든 조건을 한번에 만족시키는 우수한 서셉터가 된다.Because of this property, it is a good susceptor that satisfies all conditions at once if it replaces the existing susceptor with PBN thin film coated on Graphite.

또한 PBN박막의 고절연성을 이용하여 ESC(Electrostatic Chuck)제작에 사용될 수 있고 전기적인 쇼트 혹은 누전의 위험성이 전혀 없는 Heater제작에도 이용될 수 있다.In addition, it can be used to manufacture ESC (Electrostatic Chuck) using high insulation of PBN thin film, and can be used to manufacture Heater which has no risk of electric short or short circuit.

Claims (2)

BCl3혹은 B2H6가스와 NH3가스를 주반응 가스로 N2혹은 H2Gas를 Carrier Gas로 사용하는 CVD(기상증착)반응으로 PBN(Pyrolitic Boron Nitride) 코팅막(Coated Film)을 제조할 때 반응온도가 700℃~2300℃PBN (Pyrolitic Boron Nitride) coated film (CVD) can be prepared by CVD (vapor deposition) reaction using BCl 3 or B 2 H 6 gas and NH 3 gas as the main reaction gas as N 2 or H 2 gas as the carrier gas. When the reaction temperature is 700 ℃ ~ 2300 ℃ 제1항에 있어서 반응압이 0.01torr~20torrThe reaction pressure of claim 1 is 0.01torr ~ 20torr
KR1020020036533A 2002-06-27 2002-06-27 The method of PBN film forming by CVD KR20040001368A (en)

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KR980011883A (en) * 1996-07-23 1998-04-30 김광호 Method for forming a metal silicide layer in a semiconductor device
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KR20020031384A (en) * 1999-07-09 2002-05-01 조셉 제이. 스위니 A method of forming a silicon nitride layer on a semiconductor wafer
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KR20020017755A (en) * 2000-08-31 2002-03-07 박종섭 FeRAM having tungsten-boron-nitride amorphous oxidation barrier and method for forming the same

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