KR200310810Y1 - The measuring apparatus of the coating amount on strip - Google Patents

Abstract

The present invention relates to a continuous plating amount measuring device in the width direction to enable the plating amount measurement of the plated steel sheet in real time with respect to the full width,

In the plating amount measuring device in which the γ-ray 101 generated from the radiation source 10 is scanned on the plated steel sheet S, and the secondary fluorescent X-ray 102 generated thereby is detected by the detector 20. And a plurality of radiation sources 10 and detectors 20 are installed in the width direction of the steel plate, and the radiation source 10 forms a slope on the plated steel sheet to scan the γ-rays 101 so as to scan the total reflection γ-rays. It is characterized in that it is not detected by (20).

Description

Continuous coating amount measuring device in the width direction {The measuring apparatus of the coating amount on strip}

The present invention relates to a measuring device for measuring the plating amount of a plated steel sheet in real time with respect to the full width. More specifically, a plurality of radiation sources installed in the width direction of the plated steel sheet are installed to have an inclination with respect to the plated steel sheet. The present invention relates to a widthwise continuous plating amount measuring device capable of measuring the coating amount with respect to the width and eliminating the measurement defect factor due to total reflection.

In general, the plating amount analysis method of the coated steel sheet can be largely classified into a wet method and a gamma ray analysis method.

In the wet method, the plating amount is measured by using a chemical weight difference before and after the reaction by reacting a specific solution with a plated steel sheet at regular intervals off-line. This method has a problem in that it is difficult to use online in a steelmaking facility that produces a large amount of coated steel sheet because it is performed by hand.

The method of measuring the amount of plating through gamma ray analysis is to measure the secondary fluorescent X-rays emitted from the steel sheet through a detector located on the upper surface of the steel sheet when gamma rays are incident at right angles to the surface of the steel sheet by using natural radioactive isotopes. As shown in FIG. 1, the support frame 110 is mounted on an appropriate portion on the traveling path of the plated steel sheet S and is formed in a roughly "c" shape to allow the plated steel sheet S to be located in an inner space thereof. The support frame 110 is provided with a path 130 to allow the plating amount measuring part 120 positioned at the upper and lower portions of the plated steel sheet S to move in the width direction of the plated steel sheet S. This path 130 is constituted by a conventional drive motor 140.

The plating amount measuring unit 120 has a proximity sensor 122 for detecting the presence of a plated steel sheet (S), a radiation source of radioisotopes, and a detector for detecting a fluorescent X-ray emitted from the plated steel sheet (S). Since these components are connected to the plating amount measurement control unit 150, the X-ray of a specific energy region generated from a specific atom is counted by an electronic circuit, and thus the plating amount can be measured through the increase and decrease of the counted X-rays. It is.

However, in the conventional method of measuring the amount of plating through gamma ray analysis, the plating amount measuring unit 120 having one radiation source and a detector is installed at each of the upper and lower parts of the steel sheet to measure the plating amount while moving in the width direction of the coated steel sheet S. Therefore, there is a problem in that it is not possible to find out in a timely manner the amount of coating in the width direction which continuously changes depending on the measurement time and the operating conditions.

That is, at the time of measuring a specific point in the width direction, it is impossible to simultaneously measure other points in the width direction. As shown in FIG. 2, when the plating amount measuring unit 120 is used in two modes (profile scanning mode and three point mode), the plating amount is progressed at a constant speed. The measuring unit 120 moves to the plated steel sheet S through the path of P1 for profile scanning, and at this time, the length of the moved steel sheet becomes L1, and then during the time for measuring the plating amount of one side edge E1. The moving length of the steel sheet becomes L2, and then it moves through the path of P2 to measure the plating amount of the central portion C. At this time, the length of the moved steel sheet becomes L3, and the time for measuring the plating amount of the central portion C continues. While the moving length of the steel sheet becomes L4, by this same process, the steel sheet is further moved to L5 + L6 to the other edge.

Therefore, a minimum time is required during the above-described process for measuring the plating amount of the plated steel sheet S, during which time the steel sheet moves a distance corresponding thereto, and measures only a specific point of the width of the steel sheet during the measurement. There is a problem that can only be done.

In addition, the conventional gamma ray analysis method is to enter the γ-ray at a right angle to the plated steel sheet (S), when entering at a right angle so that the total reflection is not incident to the γ-ray, that is, the plated layer and the base iron on the surface of the plated steel sheet There is a γ-ray that is reflected back to the detection unit, and in the case of total reflection, the γ-ray contains 2.7 KeV, 13.9 KeV, and 59.5 KeV intrinsic energy information of the radioisotope (Am-241) as it is. In case of re-entry, energy pulse information is separated and extracted, which is a big noise when measuring plating amount, which is a major factor in plating amount data hunting.

The present invention is to solve the above-described problems, it is possible to measure the plating amount of the plated steel sheet over the full width in real time, and also to improve the reliability of the measurement value for the plating amount measurement by eliminating the measurement defects caused by total reflection It is an object of the present invention to provide an apparatus for measuring continuous plating amount in the width direction.

1 is a schematic configuration diagram showing a conventional steel sheet plating amount measuring device

Figure 2 is a drawing of the problem of the conventional method for measuring the amount of coating steel sheet

3 is a schematic view showing a steel plate plating amount measuring mechanism by gamma rays

4 is a graph showing the relationship between energy and coefficient values for iron and zinc.

Figure 5 is a schematic diagram showing the installation position of the radiation source and detector steel plate advance direction of the width direction continuous plating amount measuring apparatus according to the present invention

Figure 6 is a schematic diagram showing the installation method for the width direction of the steel sheet of the radiation source and the detector of the present invention

7 is a configuration diagram schematically showing a width direction continuous plating amount measuring apparatus according to the present invention.

Explanation of symbols on the main parts of the drawings

10 ... radiation source 20 ... detector

22 ... Proximity sensor 50 ... Plating quantity control

S ... Plated Steel Sheet

The present invention as a technical configuration for achieving the above object, the coating amount measuring device of the plated steel sheet to scan the γ-ray generated from the radiation source to the plated steel sheet, thereby detecting the secondary fluorescent X-ray generated by the detector A plurality of radiation sources and detectors are provided in the width direction of the plated steel sheet so that the amount of plating of the plated steel sheet can be measured in the width direction in real time, and the radiation sources are prevented from being detected by the detector by total reflection γ-rays. By providing a widthwise continuous plating amount measuring device configured to scan the γ-rays by forming a slope in the plated steel sheet to remove the data hunting factor.

Hereinafter, an embodiment of the present invention will be described in detail with reference to the accompanying drawings.

First, the basic principle of gamma ray analysis is explained.

As shown in FIG. 3, when the γ-ray 101 generated from a radioisotope 1 (eg, americium Am 241) is incident on a specific material (plated steel sheet S), electrons of the specific material are excited. Let's do it. All materials do not exist in the excited atomic state but have a property to return to a stable ground state. When the transition from the excited state to the ground state emits the X-ray as much as the difference of the electron level energy out of the atom, which is called the fluorescent X-ray (102). The fluorescent X-rays 102 upon return to the ground state after excitation have their own energy values for each atom.

For example, for Fe (Fe) is 6.4 KeV, for zinc (Zn) it emits a fluorescent X-ray with an energy value of 8.6 KeV. Plating amount measurement using the gamma ray analysis method receives all the fluorescent X-rays 102 having different energy values in the detector and counts the X-rays of a specific energy region generated from specific atoms into an electronic circuit. The coating amount is determined based on the increase and decrease of the X-rays thus counted.

The detector used for the plating amount measurement mainly uses a proportional counter. The main structure of the proportional counter consists of a stable gas (eg, argon gas) and an amplifier in the counter. The gas reacts when the fluorescent X-ray 102 is incident to the detector, and ionization occurs in + and-forms.

This ionized anode photon has a strong electric field (bias voltage of 1650V), which has enough kinetic energy to accelerate to the opposite pole and cause secondary ionization of gas, and the flow of ions generated by secondary ionization is the flow of current. The amount of current is proportional to the number of photons entered into the detector window. As a result, the flow of current is proportional to the number and density of photons ionized by fluorescent X-rays inside the detector.

Photons generated in this way are amplified by the energy level discernible by the plating amount measurement control unit (see FIG. 4) through an amplifier and contain two pieces of radiation (iron and zinc) information. These two different pulse amounts make it possible to distinguish between iron and zinc, and finally the plating amount can be determined by integrating the zinc side information.

The present invention is to solve the problem of the conventional coating amount measurement method using the gamma ray analysis method by the configuration of the Salon rune device, the lack of representative of the plating data, which is a problem caused by having one plating amount measuring unit each of the upper and lower, that is, online 1 Only the point can be measured and cannot be represented by the measured value of the whole plated steel sheet in the width direction. When the total plating amount was judged, only the amount of plating at a specific point could be extracted for a predetermined time. It is to solve the representative problem of the plating amount data by extracting the plating amount data for the entire width direction in the phase.

That is, the conventional plating amount analysis method places the radiation source and the plated steel plate at right angles and reaches the detection part up to the γ-ray 103 which is totally reflected, which is the main cause of the hunting of the plating data. 45 °) to eliminate the effects of totally reflected radiation and allow only pure secondary fluorescence X-rays to reach the detector.

To this end, the present invention, as shown in Figure 5, the radiation source 10 and the detector 20 in a proper distance with respect to the advancing direction of the plated steel sheet (S) is installed so that the appropriate distance and the inclination of the radiation source 10 While forming, the γ-rays 101 are incident on the plated steel sheet S, so that the totally reflected γ-rays 103 are totally reflected at an angle corresponding to the angle of incidence and are not detected by the detector 20 while the fluorescent X-rays are Only 102 can be detected at the detector 20.

In addition, the present invention by installing a plurality of radiation source 10 and a detector 20 corresponding to the radiation source 10 as shown in Figure 6 in the width direction of the plated steel sheet (S), so as to measure the total plating amount in the width direction at the same time do.

FIG. 7 schematically illustrates a mounting configuration of such a radiation source and a detector, which is mounted at an appropriate portion on a traveling path of the plated steel sheet S and is formed in a roughly “c” shape to form a plated steel sheet S in an inner space thereof. It is provided with a support frame 110 to be located, the support frame 110 is equipped with a plurality of radiation sources 10 and the detector 20 to be located at the upper and lower portions of the plated steel sheet (S), respectively.

At this time, the radiation source 10 and the detector 20 is preferably installed in a plurality of predetermined intervals in the width direction of the plated steel sheet (S), the proximity sensor 22 to determine the presence or absence of the plated steel sheet support frame ( 110 is installed in the center of each. This eliminates the need for the profile mode and the three point measurement mode used to measure the plated steel plated amount on the continuous line used in the conventional plating amount measuring method having only one radiation source and a detector. When the plated steel sheet is brought into the support frame 110 on-line, the proximity sensor 22 transmits an incoming signal to the plating amount measurement control unit 50 to start the measurement.

By this signal, in each of the radiation sources 10 arranged in a line in the width direction of the plated steel sheet, the γ-rays 101 are projected onto the plated steel sheet S. In this case, each radiation source array is used to measure the plating amount of the plated steel sheet. It is set appropriately in the width direction. Since the detectors are arranged in a line in the width direction of the plated steel sheet corresponding to each radiation source, the secondary fluorescent X-rays 102 generated by the plated steel sheet excited by the γ-rays 101 are detected by the detector 20. It becomes acceptable.

A fluorescent X-ray 102 containing energy information about iron and zinc reaching each detector 20 generates an electric current through an ionization reaction inside the detector 20, and this current causes an amplifier (not shown). It is amplified through and transmitted to the plating amount measurement control unit 50 in the form of a pulse to determine the plating amount.

Of course, the detector 20 and the proximity sensor 22 are supplied with power from the plating amount measurement controller 50 as well as transmit the data to the controller 50.

In this way, the radiation source and the detection unit, which are configured as multiple, can integrate the profile mode and the three point measurement mode by the plating amount measurement method used in the related art. In addition, the problem that the conventional measuring method was unable to determine the plating amount at different points when using one mode can be solved by continuously measuring the radiation source and the detector in the width direction. As a result, the present invention has the effect of extracting the plating amount of the full width plated steel sheet in real time on-line.

In addition, the present invention is to make a predetermined angle to each other in the arrangement of the plated steel sheet (S) and the radiation source 10, even if the γ-rays 101 generated from the radiation source is totally reflected by the plated steel sheet by maintaining a constant angle The total reflection γ-ray does not return to the detector.

That is, when the radiation source is americium (Am-241), the γ-ray containing the intrinsic energy information of 2.7 KeV, 13.9 KeV, and 59.5 KeV is totally reflected by the plated steel sheet and is incident on the detector. Spectral analysis of zinc with an energy peak of 8.6 KeV makes it more difficult to hunt for plating amount data extraction, but the present invention maintains the radiation source and the plated steel plate at a constant angle to produce secondary fluorescence X-rays produced from the plated steel plate. Only 102 is received by the detector 20, and the totally reflected gamma rays are not received by the detector.

As described above, according to the widthwise continuous plating amount measuring apparatus according to the present invention, both the widthwise real-time plating amount measurement problem and the plating amount data hunting problem due to total gamma ray total reflection are solved.

That is, the real-time plating amount measurement in the width direction is performed by arranging a plurality of radiation sources and detectors in a line in the width direction in one frame, and for the data hunting problem due to total gamma ray reflection, the radiation source and the plated steel plate are maintained at a constant angle. Only the differential fluorescence X-rays can be measured by the detector.

Claims (1)

Measurement of the plating amount of the plated steel sheet in which the γ-ray 101 generated by the radiation source 10 is scanned onto the plated steel sheet S, and the secondary fluorescent X-rays 102 generated by the detector 20 are detected by the detector 20. In the apparatus, A plurality of radiation sources 10 and detectors 20 are installed in the width direction of the plated steel sheet S to measure the plating amount of the plated steel sheet in the width direction in real time. The radiation source 10 prevents the total reflection γ-rays from being detected by the detector 2 so as to incline the plated steel sheet S to scan the γ-rays 101 so as to eliminate data hunting factors due to gamma ray total reflection. Width direction continuous plating amount measuring device, characterized in that configured.