KR200161673Y1 - Carrier for keeping the probe card - Google Patents

Carrier for keeping the probe card Download PDF

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Publication number
KR200161673Y1
KR200161673Y1 KR2019940013834U KR19940013834U KR200161673Y1 KR 200161673 Y1 KR200161673 Y1 KR 200161673Y1 KR 2019940013834 U KR2019940013834 U KR 2019940013834U KR 19940013834 U KR19940013834 U KR 19940013834U KR 200161673 Y1 KR200161673 Y1 KR 200161673Y1
Authority
KR
South Korea
Prior art keywords
probe card
carrier
prevent
cover
present
Prior art date
Application number
KR2019940013834U
Other languages
Korean (ko)
Other versions
KR960003115U (en
Inventor
성영석
Original Assignee
김영환
현대반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김영환, 현대반도체주식회사 filed Critical 김영환
Priority to KR2019940013834U priority Critical patent/KR200161673Y1/en
Publication of KR960003115U publication Critical patent/KR960003115U/en
Application granted granted Critical
Publication of KR200161673Y1 publication Critical patent/KR200161673Y1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D85/00—Containers, packaging elements or packages, specially adapted for particular articles or materials
    • B65D85/30—Containers, packaging elements or packages, specially adapted for particular articles or materials for articles particularly sensitive to damage by shock or pressure
    • B65D85/38—Containers, packaging elements or packages, specially adapted for particular articles or materials for articles particularly sensitive to damage by shock or pressure for delicate optical, measuring, calculating or control apparatus
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65D—CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES
    • B65D85/00—Containers, packaging elements or packages, specially adapted for particular articles or materials
    • B65D85/54—Containers, packaging elements or packages, specially adapted for particular articles or materials for articles of special shape not otherwise provided for

Abstract

본 고안은 프로브카드 보관용 캐리어 관한 것으로서, 더욱 상세하게는 외부의 압력과 충격으로 인한 프로브카드의 파손을 방지하기 위한 것이다.The present invention relates to a carrier for storing a probe card, and more particularly, to prevent damage to the probe card due to external pressure and impact.

이를위해 본 고안은 프로브카드(3)의 유동을 방지하기 위해서 상부 프레임에 돌출턱(1a)이 형성된 경질의 캐리어(1)와, 상기 캐리어의 상부에 결합되며 분리되는 것을 방지하기 위해 절곡부(2a)가 일체 형성된 커버(2)로 구성된 프로브카드 보관용 캐리어이다.To this end, the present invention has a rigid carrier 1 having a protruding jaw 1a formed on the upper frame to prevent the flow of the probe card 3, and a bent portion to prevent being coupled to and separated from the upper portion of the carrier. A carrier for storing a probe card, comprising a cover 2 formed integrally with 2a).

Description

프로브카드 보관용 캐리어Probe Card Carrier

제1도는 종래 캐리어에 프로브카드가 보관된 상태의 종단면도.1 is a longitudinal sectional view of a state in which a probe card is stored in a conventional carrier.

제2도는 본 고안에 따른 캐리어에 프로브카드가 보관된 상태의 종단면도.Figure 2 is a longitudinal sectional view of the probe card is stored in a carrier according to the present invention.

* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings

1 : 캐리어 1a : 돌출턱1 carrier 1a protrusion jaw

2 : 커버 2a : 절곡부2 cover 2a bend

3 : 프로브카드 4 : 완충제3: probe card 4: buffer

본 고안은 프로브카드 보관용 캐리어 관한 것으로서, 더욱 상세하게는 외부의 압력과 충격으로 인한 프로브카드의 파손을 방지하기 위한 것이다.The present invention relates to a carrier for storing a probe card, and more particularly, to prevent damage to the probe card due to external pressure and impact.

종래에는 제1도에 도시한 바와같이 연질의 캐리어(5)상부에 프로브카드(3)를 올려 놓고 상기 프로브카드(3)의 끝단과 캐리어(5)의 상면에 테이프(6)를 부착하여 프로브카드를 캐리어에 고정시킨 상태에서 상기 캐리어를 경질의 박스(7)에 삽입하여 보관 및 이동을 하였다.Conventionally, as shown in FIG. 1, the probe card 3 is placed on the soft carrier 5, and the tape 6 is attached to the end of the probe card 3 and the upper surface of the carrier 5 to attach the probe. The carrier was inserted into the rigid box 7 while the card was fixed to the carrier for storage and movement.

그러나 이러한 종래 캐리어는 외부의 충격으로 부터 프로브카드를 보호하기 위해서는 경질의 박스가 반드시 필요하므로서 부품수가 많아짐은 물론 테이프의 접착제가 녹아내릴 경우 프로브카드(3)가 녹아내린 접착제에 의해 오염되어 누설전류가 발생되었으며 장시간 보관시 테이프(6)의 부착력이 저하되므로서 프로브카다가 캐리어로 부터 이탈되어 상기 프로브카드(3)에 고정된 프로브침(3a)이 파손되는 등의 문제점이 있었다.However, such a conventional carrier requires a hard box to protect the probe card from external shocks, so that the number of parts increases, and when the adhesive of the tape is melted, the probe card 3 is contaminated by the melted adhesive to leak the leakage current. There was a problem such that the probe needle is separated from the carrier and the probe needle (3a) fixed to the probe card (3) is damaged because the adhesive force of the tape (6) is reduced during long time storage.

본 고안은 상기한 문제점을 해결하기 위해 안출한 것으로서, 외부의 충격에 의한 프로브카드의 프로브침 파손방지는 물론 프로브카드의 수명을 연장시키도록 하는데 그 목적이 있다.The present invention has been made to solve the above problems, the purpose of preventing the damage of the probe needle of the probe card by the external shock as well as to extend the life of the probe card.

상기한 목적을 달성하기 위한 본 고안의 형태에 따르면, 프로브카드의 유동을 방지하기 위해서 상부 둘레면에 돌출턱이 형성된 경질의 캐리어와, 상기 캐리어의 상부에 결합되며 결합시 분리되는 것을 방지하기 위해 절곡부가 일체 형성된 연질의 커버로 구성된 프로브카드 보관용 캐리어가 제공된다.According to a form of the present invention for achieving the above object, in order to prevent the flow of the probe card and the hard carrier formed with a projection jaw on the upper circumferential surface, in order to prevent being separated when combined with the upper portion of the carrier Provided is a carrier for storing a probe card, comprising a soft cover integrally formed with a bent portion.

이하, 본 고안을 일실시예로 도시한 첨부도면 제2도를 참조하여 상세히 설명하면 다음과 같다.Hereinafter, with reference to Figure 2 of the accompanying drawings showing the present invention as an embodiment in detail as follows.

제2도는 본 고안에 따른 캐리어에 프로브카드가 보관된 상태의 종단면도로서, 본 고안은 경질의 캐리어(1)상부 둘레면에 돌출턱(1a)이 형성되어 있고 상기 캐리어의 상측 개방부를 폐쇄시키기 위한 연질의 커버(2) 저면 둘레에 절곡부(2a)가 형성되어 있으며 상기 커버를 캐리어에 결합시 프로브카드(3)의 상면과 밀착되어 프로브카드의 유동방지는 물론 정전기 발생을 방지하기 위해서 커버의 저면에 부착된 완충제(4)로 구성된다.2 is a longitudinal cross-sectional view of the probe card is stored in the carrier according to the present invention, the present invention is formed with a projection jaw (1a) on the upper circumferential surface of the rigid carrier (1) to close the upper opening of the carrier A bent portion (2a) is formed around the bottom surface of the soft cover (2) for the cover to be in close contact with the upper surface of the probe card (3) when the cover is coupled to the carrier to prevent the flow of the probe card as well as to prevent static electricity It consists of a buffer (4) attached to the bottom of the.

상기와 같이 구성된 본 고안은 캐리어(1)의 상부에 프로브카드(3)를 올려놓으면 상기 프로브카드(3)는 캐리어에 일체 형성된 돌출턱(1a)의 내측으로 삽입되어 유동이 방지된다.When the probe card 3 is placed on the carrier 1, the probe card 3 is inserted into the protruding jaw 1 a formed integrally with the carrier to prevent flow.

이러한 상태에서 캐리어(1)의 상부에 커버(2)를 위치시키고 상기 커버를 하부로 누르면 연질의 커버(2)둘레면에 형성된 절곡부(2a)는 경질의 캐리어(1)에 밀착 고정된다.In such a state, the cover 2 is placed on the upper part of the carrier 1 and the cover 2 is pressed downward, and the bent portion 2a formed on the surface of the soft cover 2 is tightly fixed to the hard carrier 1.

이때 상기 커버(2)의 저면에 부착된 완충제(4)는 프로브카드(3)의 상면과 밀착되므로 프로브카드의 상하유동을 방지함과 동시에 프로브카드(3)에 정전기 발생을 방지시키게 된다.In this case, the buffer 4 attached to the bottom of the cover 2 is in close contact with the upper surface of the probe card 3, thereby preventing the vertical flow of the probe card and at the same time to prevent the static electricity generated in the probe card (3).

이상에서와 같이 본 고안은 별도의 보관박스를 사용하지 않고도 외부의 충격에 의한 프로브카드의 프로브침 파손을 방지함은 물론 프로브카드에 정전기가 발생되지 않으므로 프로브카드의 수명을 연장시킬 수 있는 매우 유용한 고안이다.As described above, the present invention prevents damage to the probe needle of the probe card due to external impact without using a separate storage box, and also prevents static electricity from being generated on the probe card. It is devised.

Claims (2)

프로브카드(3)의 유동을 방지하기 위해서 상부 프레임에 돌출턱(1a)이 형성된 경질의 캐리어(1)와, 상기 캐리어의 상부에 결합되며 결합시 분리되는 것을 방지하기 위해 절곡부(2a)가 일체 형성된 커버(2)로 구성됨을 특징으로 하는 프로브카드 보관용 캐리어.In order to prevent the flow of the probe card 3, the rigid carrier 1 having a protruding jaw 1a formed on the upper frame, and the bent portion 2a to be coupled to the upper part of the carrier and prevented from being separated when combined. Probe card storage carrier, characterized in that consisting of a cover (2) formed integrally. 제1항에 있어서, 프로브카드(3)에 정전기가 발생되지 않도록 커버(2)의 저면에 완충제(4)를 부착하여서 된 프로브카드 보관용 캐리어.The carrier for storing a probe card according to claim 1, wherein a buffer (4) is attached to the bottom of the cover (2) so that static electricity is not generated in the probe card (3).
KR2019940013834U 1994-06-14 1994-06-14 Carrier for keeping the probe card KR200161673Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940013834U KR200161673Y1 (en) 1994-06-14 1994-06-14 Carrier for keeping the probe card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940013834U KR200161673Y1 (en) 1994-06-14 1994-06-14 Carrier for keeping the probe card

Publications (2)

Publication Number Publication Date
KR960003115U KR960003115U (en) 1996-01-22
KR200161673Y1 true KR200161673Y1 (en) 1999-12-01

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Family Applications (1)

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KR2019940013834U KR200161673Y1 (en) 1994-06-14 1994-06-14 Carrier for keeping the probe card

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100689629B1 (en) * 2005-04-29 2007-03-08 주식회사 파이컴 Case for safekeeping of probe card
KR101815081B1 (en) * 2014-01-08 2018-01-04 도쿄엘렉트론가부시키가이샤 Substrate inspection apparatus and probe card transferring method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100689629B1 (en) * 2005-04-29 2007-03-08 주식회사 파이컴 Case for safekeeping of probe card
KR101815081B1 (en) * 2014-01-08 2018-01-04 도쿄엘렉트론가부시키가이샤 Substrate inspection apparatus and probe card transferring method

Also Published As

Publication number Publication date
KR960003115U (en) 1996-01-22

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