KR20000051127A - Multifunctional Spectrophotometer with CCD detector and Integrating Sphere - Google Patents

Multifunctional Spectrophotometer with CCD detector and Integrating Sphere Download PDF

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KR20000051127A
KR20000051127A KR1019990001404A KR19990001404A KR20000051127A KR 20000051127 A KR20000051127 A KR 20000051127A KR 1019990001404 A KR1019990001404 A KR 1019990001404A KR 19990001404 A KR19990001404 A KR 19990001404A KR 20000051127 A KR20000051127 A KR 20000051127A
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light
ccd detector
sample
spectrometer
integrating sphere
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KR1019990001404A
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Korean (ko)
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KR100302547B1 (en
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전병혁
정세채
김동호
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정명세
한국표준과학연구원
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0251Colorimeters making use of an integrating sphere
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0425Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using optical fibers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2803Investigating the spectrum using photoelectric array detector
    • G01J2003/282Modified CCD or like

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE: A multi functional spectrograph adopting a CCD detector and an integrator is provided to improve productivity and precision of detection of light property such as absorption, permeability, reflectivity, light emitting distribution and the like without using any additional equipments such as spectrophotometer, reflect meter, spectrum analyzer, etc. CONSTITUTION: A multi functional spectrograph adopting a CCD detector and an integrator includes a light source(11) formed with a tungsten lamp(1), a laser(2) and a spectrum(10), an integrator(4) fixed with a light cover inside for preventing reflection of light directly on a part to detect when radiating light beams on a sample(13) laid on a lower part, and a detecting part(12) including a spectrum(6), a CCD detector(5) and a high speed data obtaining element(7) respectively connected with each other by optical fibers(3) and optical fiber probes(9).

Description

씨·씨·디 검출기와 적분구를 채택한 다기능 분광분석기{Multifunctional Spectrophotometer with CCD detector and Integrating Sphere}Multifunctional Spectrophotometer with CCD detector and Integrating Sphere}

본 발명은 시료의 흡수율, 투과율, 반사율, 발광분포 등을 한 번의 시료 로딩으로써 간편하고 정밀하게 측정할 수 있는 다기능 분광분석기에 관한 것으로서, 더욱 상세하게는 CCD 및 적분구를 채택함으로써 미세광량을 측정 가능하도록 하고 이를 통하여 다양한 형태의 시료의 각기 다른 광학적 특성을 한 번의 시료 로딩(Loading)으로써 짧은 시간 동안 측정 가능하도록 한 CCD 검출기와 적분구를 채택한 다기능 분광분석기에 관한 것이다.The present invention relates to a multifunctional spectrometer that can measure the absorbance, transmittance, reflectance, emission distribution, etc. of a sample easily and precisely with a single sample loading. More particularly, the micro light quantity is measured by adopting a CCD and an integrating sphere. The present invention relates to a multi-function spectrometer employing a CCD detector and an integrating sphere, which enable the measurement of a short time by loading a single sample of different optical characteristics of various types of samples.

일반적으로, 분광분석은 흔히 어떤 물질에 의한 복사에너지의(흡수,반사) 세기 변화를 파장에 대하여 측정함으로써 그 물질의 정성 및 정량분석에 이용하는 방법이다. 또한, 분광 분석법은 어느 특정 파장의 빛과 물질의 상호작용에 근거를 두고 있으며 각 물질에 따른 독특한 분광 스펙트럼을 나타낸다. 자외선-가시광선 분광분석기(UV-Vis spectrophotometer)를 이용한 시료의 분석은 모든 정밀분석의 가장 기본적이면서 또한 범용적으로 사용되는 분석기기이다.In general, spectroscopic analysis is a method used for qualitative and quantitative analysis of a material by measuring a change in intensity (absorption, reflection) of radiation by a material over a wavelength. In addition, spectroscopy is based on the interaction of materials with light at any particular wavelength and reveals a unique spectral spectrum for each material. Analysis of samples using UV-Vis spectrophotometers is the most basic and universally used analyzer for all precision analysis.

종래의 분광분석기는 흡수율이나 투과율만을 측정하는 것과 반사율까지 측정할 수 있도록 한 분광분석기가 있다. 반사율까지 측정할 수 있다고는 하지만 시료를 측정하고자 하는 목적에 따라 시료 측정부를 변경하여야 하는 번거로움이 있다.Conventional spectrometers include spectrometers capable of measuring only absorptivity and transmittance, and even reflectance. Although it is possible to measure the reflectance, it is cumbersome to change the sample measuring part according to the purpose of measuring the sample.

그러므로, 종래의 분광분석기로 시료의 흡수율, 투과율 또는 반사율을 측정하기 위해서는 흡수율, 투과율을 측정하기 위한 모듈과 반사율을 측정할 수 있는 모듈을 교체하면서 측정해야만 한다. 그리고, 현재까지의 분광분석기들은 측정방법에 있어 모듈교체에 따른 번거로움, 측정 시간이 길거나 미세한 광량을 측정하기에 어려운 문제점이 있었다.Therefore, in order to measure the absorbance, transmittance, or reflectance of a sample by a conventional spectroscopic analyzer, it is necessary to replace the module for measuring the absorbance, transmittance, and the module capable of measuring the reflectance. In addition, the spectroscopic analyzers up to now have a problem in that it is difficult to measure the cumbersome, long measuring time or fine amount of light due to module replacement.

본 발명은 상기한 문제점을 해결하기 위하여 안출한 것으로서, 그 목적은 기존의 분광분석기와는 달리 본 발명의 분광분석기는 적분기 하나만을 가지고 시료의 흡수율, 투과율 그리고 반사율 및 발광분포(Emission) 등을 한꺼번에 측정할 수 있는 CCD 검출기와 적분구를 채택한 다기능 분광분석기를 제공하는 것이다.The present invention has been made to solve the above problems, and the object of the present invention, unlike the existing spectrometer, the spectrometer of the present invention has only one integrator, the absorption rate, transmittance and reflectance and emission of the sample (Emission), etc. It is to provide a multifunctional spectrometer with a CCD detector and an integrating sphere that can measure.

본 발명은 상기한 목적을 달성하기 위하여 분광분석기의 본래 기능과 반사율의 측정값으로 색좌표를 구하는 Colormeter의 기능을 통합된 하나의 장치로 구성할 수 있게 되었다. 적분기를 사용하게 되면 기존의 모듈교체에 따른 번거로움이 없고 CCD 검출기를 이용하기 때문에 측정파장 영역을 단 한 번에 측정할 수 있어 측정시간이 매우 빠르며, CCD 검출기는 매우 미세한 광량을 측정하는데 뛰어난 광센서로 광량의 세기문제를 해결할 수 있는 다기능 분광분석기를 제공함에 의해 달성된다.In order to achieve the above object, the present invention can be configured as a single device integrating the function of the spectrometer and the function of the colormeter to obtain the color coordinates from the measured values of the reflectance. Using an integrator eliminates the hassle of replacing existing modules and uses a CCD detector, so the measurement wavelength range can be measured at once, so the measurement time is very fast, and the CCD detector is excellent for measuring very small amounts of light. This is achieved by providing a multifunctional spectrometer that can solve the intensity problem with the sensor.

도 1 은 본 발명의 분광분석기를 나타낸 구조도1 is a structural diagram showing a spectrometer of the present invention

도 2 는 본 발명의 적분구를 나타낸 예시도2 is an exemplary view showing an integrating sphere of the present invention.

도 3 은 본 발명의 투과율(흡수율) 측정 방법 예시도3 is an exemplary view illustrating a method of measuring transmittance (absorption rate) of the present invention.

도 4 는 본 발명의 반사율 측정 방법 예시도4 is an exemplary view illustrating a method of measuring reflectance according to the present invention.

<도면의 주요부분에 대한 부호의 설명><Description of the symbols for the main parts of the drawings>

(1) : 텅스텐 램프 (2) : 레이저(1): tungsten lamp (2): laser

(3) : 광파이버 (4) : 적분구(3): optical fiber (4): integrating sphere

(5) : CCD 검출기 (6) : 분광기(Spectrograph)(5): CCD detector (6): Spectrograph

(7) : 데이터 취득기 (8) : 컴퓨터(7): data acquirer (8): computer

(9) : 광파이버 탐침 (10) : 분광기(Monochromator)(9): Optical fiber probe (10): Monochromator

(11) : 광원부 (12) : 측정부(11): light source unit 12: measuring unit

(13) : 시료 (14) : 빛 가리개(13): Sample 14: light shield

이하, 첨부된 도면을 참조하여 본 발명의 구성 및 작용을 설명하면 다음과 같다.Hereinafter, the configuration and operation of the present invention with reference to the accompanying drawings.

도 1 은 본 발명의 분광분석기 구조도를,1 is a structural diagram of a spectrometer of the present invention,

도 2 는 본 발명의 적분구를 나타낸 예시도를,2 is an exemplary view showing an integrating sphere of the present invention,

도 3 은 본 발명의 투과율(흡수율) 측정 방법 예시도를,3 is an exemplary view illustrating a method of measuring transmittance (absorption rate) of the present invention;

도 4 는 본 발명의 반사율 측정 방법 예시도를 도시한 것으로서, 분광분석기는 크게 광원부(11)와 시료(13)를 로딩(Loading)할 수 있는 적분구(4), 그리고 컴퓨터(8)를 포함한 측정부(12)로 나누어져 있다.4 is a diagram illustrating an example of a method for measuring reflectance of the present invention, wherein a spectrometer includes an integrating sphere 4 capable of loading a light source unit 11 and a sample 13, and a computer 8. It is divided into the measuring part 12.

상기, 광원부(11)는 텅스텐 램프(1)와 레이저(2) 및 분광기(Monochromator) (10)로 형성되어 있으나 그 외에 UV Lamp 또는 후레쉬 램프 등 다양한 종류의 광원을 사용할 수 있으며 광원의 경로는 모두 광파이버(Optical fiber)(3)와 광파이버 탐침(Optical fiber Probe)(9)을 사용하고 있다.The light source unit 11 is formed of a tungsten lamp (1), a laser (2) and a spectrometer (Monochromator) 10, but can be used in addition to various types of light sources, such as UV lamp or flash lamp, the path of the light source An optical fiber 3 and an optical fiber probe 9 are used.

상기, 적분구(4)의 내부는 도 2 에 나타낸 바와같이 PTFE로 코팅이 되어 있고 광원을 시료(Sample)(13)에 주사하였을 때 직접적으로 검출(Detection)하는 부분으로 반사되지 않게 빛 가리개(14)를 고정시켰으며 또한 시료(13)는 적분구(4) 하부의 측정부위에 맞대 놓고 측정하게 된다.As shown in FIG. 2, the interior of the integrating sphere 4 is coated with PTFE, and the light shield is not reflected to the portion that is directly detected when the light source is scanned into the sample 13. 14) is fixed, and the sample 13 is measured against the measuring area under the integrating sphere 4.

상기, 측정부(12)는 빛을 분광시키는 분광기(Spectrograph)(6)와 분광된 파장을 CCD 검출기(detector)(5)로 측정하게 되며 Data 취득기(Acquisition)(7)를 거쳐 컴퓨터(8)에서 소프트웨어로 흡수율, 투과율, 반사율, 발광분포 등 기타 여러 가지를 한 번에 측정할 수 있다.The measuring unit 12 measures a spectrograph 6 for spectroscopy of light and a spectroscopic wavelength with a CCD detector 5, and passes through a computer Acquisition 7. In software, absorption, transmittance, reflectance, emission distribution, and many others can be measured at once.

상기와 같은 구성을 참조하여 본 발명의 실시예를 살펴보면 다음과 같다.Looking at the embodiment of the present invention with reference to the configuration as described above are as follows.

실시예1Example 1

식1 : Equation 1:

식2 : Abs = -log(T)Equation 2: Abs = -log (T)

상기, 투과율(흡수율)의 측정은 도 4 에서와 같이 시료(13)의 하부면에 백색 표지(White Reference)를 붙여놓으면 광원이 시료를 거쳐 White Reference에서 100% 반사되어 다시 시료(13)를 거치게 되므로 시료(13)에서의 투과율 값은 2배가 된다.The transmittance (absorption rate) is measured by attaching a white label on the lower surface of the sample 13 as shown in FIG. 4 so that the light source is 100% reflected from the white reference through the sample and passes through the sample 13 again. Therefore, the transmittance value in the sample 13 is doubled.

따라서, 투과율은 들어온 빛의 세기에서 나가는 빛 세기의 비를 구하는 것으로 상기 식1과 같으며 또한, 흡수율 값은 식2와 같이 투과율 값에 log를 취하면 구하여 진다.Therefore, the transmittance is obtained by calculating the ratio of the intensity of the light emitted from the intensity of the incoming light, as shown in Equation 1 above, and the absorbance value is obtained by taking the logarithm of the transmittance as shown in Equation 2.

그리고, 도 1 의 "A"에서 보는 바와같이 투과율(흡수율) 측정시 필요한 백색광원은 광원부(11)에 있는 분광기(Monochromator)(10)의 0차 회절각에서 얻을 수 있으며 광발광 스펙트럼 측정시에는 광원부(11) 구성 광학부품의 변동없이 회절각을 적절한 곳에 위치시킴으로써 간단히 얻을 수 있다.As shown in "A" of FIG. 1, a white light source required for measuring transmittance (absorption) may be obtained at a zero-order diffraction angle of a monochromator 10 in the light source unit 11. The diffraction angle can be obtained simply by placing the diffraction angle at an appropriate position without fluctuation of the optical component of the light source unit 11.

실시예2Example 2

상기, 반사율 측정은 White Reference를 먼저 측정한 다음, White Reference 없이 시료를 측정함으로써 시료의 순수 반사율을 측정하게 되고 반사율값은 또한 시료의 Color를 측정하는데도 사용되며, 본 개발장비를 이용하면 의료업계 및 병원이나 보건소에서 스트립을 이용해 사람의 건강상태를 체크하는데 유용하게 쓰여질 수 있다.The reflectance is measured by measuring the white reference first, and then measuring the sample by measuring the sample without the white reference, and the reflectance value is also used to measure the color of the sample. This can be useful for checking a person's health using strips in hospitals or health centers.

본 발명은 최근 각광받고 있는 다기능 유기 고분자 및 단분자 필름을 위시한 차세대 광소자의 연구개발에 있어서 가장 기본적으로 필요한 광특성(흡수율, 투과율, 반사율, 발광분포 등)을 측정시 본 발명의 다기능 분광분석기를 이용하는 경우 고가의 각기 다른 여러 장비(Spectrophotometer, Reflect meter, Spectrum Analyzer 등)를 이용하는 경우에 비교하여 연구개발의 생산성 향상 및 정밀도를 향상시킬 수 있도록 한 매우 유용한 발명인 것이다.The present invention is a multifunctional spectrometer of the present invention for measuring the optical properties (absorption rate, transmittance, reflectance, light emission distribution, etc.) most fundamentally required for the research and development of next-generation optical devices including multifunctional organic polymers and monomolecular films, which are in the spotlight recently. When used, it is a very useful invention that can improve productivity and precision of R & D, compared to the case of using various expensive equipment (Spectrophotometer, Reflect meter, Spectrum Analyzer, etc.).

Claims (1)

시료의 흡수율, 투과율, 반사율, 발광분포를 한 번의 시료 로딩으로 측정하는 분광분석기에 있어서,In the spectrometer which measures the absorbance, transmittance, reflectance, and luminescence distribution of a sample by one sample loading, 상기, 분광분석기는 텅스텐 램프(1)와 레이저(2) 및 분광기(10)로 형성되어 있는 광원부(11)와,The spectrometer includes: a light source unit 11 formed of a tungsten lamp 1, a laser 2, and a spectrometer 10; 광원을 시료에 주사하였을 때 직접적으로 검출하는 부분으로 반사되지 않게 내부에 빛 가리개(14)를 고정하고 하부에 시료(13)를 맞대 놓은 적분구(4)와,An integrating sphere 4 having the light shield 14 fixed therein and the sample 13 abutted thereon so that the light source 14 is not reflected to the portion directly detected when the light source is scanned onto the sample, 빛을 분광시키는 분광기(6)와 CCD 검출기(5), 초고속 데이터 취득기(7)로 이루어진 측정부(12)를 각각 광파이버(3)와 광파이버 탐침(9)으로 서로 연결 설치한 것을 특징으로 하는 CCD 검출기와 적분구를 채택한 다기능 분광분석기.It is characterized in that the measuring unit 12 consisting of a spectroscope 6 for spectroscopy light, a CCD detector 5, and an ultrafast data acquirer 7 are connected to each other by an optical fiber 3 and an optical fiber probe 9, respectively. Multifunctional spectrometer with CCD detector and integrating sphere.
KR1019990001404A 1999-01-19 1999-01-19 Multifunctional Spectrophotometer with CCD detector and Integrating Sphere KR100302547B1 (en)

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KR100970244B1 (en) * 2008-06-24 2010-07-16 주식회사 신코 Spectrophotometer incorporating integrating sphere
KR101683465B1 (en) 2015-11-26 2016-12-07 한국기초과학지원연구원 In-situ calibration method of spectroscopy using multiple emission sources
CN107490432A (en) * 2017-04-27 2017-12-19 安徽华脉科技发展有限公司 A kind of Feebleness Light Signal Examining system
CN110261324A (en) * 2019-07-08 2019-09-20 无锡迅杰光远科技有限公司 A kind of multifunctional spectrum analyzer

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KR101365995B1 (en) * 2012-08-31 2014-02-25 한국광기술원 Apparatus and method for measuring absorption of led chip

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100970244B1 (en) * 2008-06-24 2010-07-16 주식회사 신코 Spectrophotometer incorporating integrating sphere
KR101683465B1 (en) 2015-11-26 2016-12-07 한국기초과학지원연구원 In-situ calibration method of spectroscopy using multiple emission sources
CN107490432A (en) * 2017-04-27 2017-12-19 安徽华脉科技发展有限公司 A kind of Feebleness Light Signal Examining system
CN110261324A (en) * 2019-07-08 2019-09-20 无锡迅杰光远科技有限公司 A kind of multifunctional spectrum analyzer

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