KR19990079962A - Chemical Line Temperature Controller of Semiconductor Photo Equipment - Google Patents

Chemical Line Temperature Controller of Semiconductor Photo Equipment Download PDF

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KR19990079962A
KR19990079962A KR1019980012878A KR19980012878A KR19990079962A KR 19990079962 A KR19990079962 A KR 19990079962A KR 1019980012878 A KR1019980012878 A KR 1019980012878A KR 19980012878 A KR19980012878 A KR 19980012878A KR 19990079962 A KR19990079962 A KR 19990079962A
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South Korea
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constant temperature
temperature water
chemical
chemical line
line
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KR1019980012878A
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Korean (ko)
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류재환
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김영환
현대반도체 주식회사
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Priority to KR1019980012878A priority Critical patent/KR19990079962A/en
Publication of KR19990079962A publication Critical patent/KR19990079962A/en

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Abstract

본 발명은 반도체 포토장비의 케미컬라인 온도조절장치에 관한 것으로, 제1/제2 쿨링자켓(3)(8)에서 회수되는 항온수의 플로우 레이트를 일정하게 유지시키기 위한 플로우 미터(20)(20')를 제1/제2 순환라인(4)(4') 상에 각각 설치하여, 종래와 같이 항온수의 흐름을 조절하기 위하여 설치된 감축관형태인 오리피스의 유로에 이물질이 막혀서 온도콘트롤의 불안정으로 제품불량이 발생되는 것을 방지하게 되는 효과가 있다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a chemical line temperature control apparatus for semiconductor photo equipment, and includes a flow meter (20) (20) for maintaining a constant flow rate of constant temperature water recovered from the first and second cooling jackets (3) (8). ') Is installed on the first and second circulation lines 4 and 4', respectively, and foreign matter is blocked in the flow path of the orifice in the form of a reducing tube installed to regulate the flow of constant temperature water as in the prior art, resulting in unstable temperature control. This has the effect of preventing product defects from occurring.

Description

반도체 포토장비의 케미컬라인 온도조절장치Chemical Line Temperature Controller of Semiconductor Photo Equipment

본 발명은 반도체 포토장비의 케미컬라인 온도조절장치에 관한 것으로, 특히 플로우 미터(FLOW METER)를 설치하여 항온수의 플로우 레이트(FLOW RATE)를 조절할 수 있도록 하는데 적합한 반도체 포토장비의 케미컬라인 온도조절장치에 관한 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a chemical line temperature control device for semiconductor photo equipment, and more particularly, to a chemical line temperature control device for semiconductor photo equipment suitable for controlling flow rate of constant temperature water by installing a flow meter. It is about.

일반적으로 "폴라리스(POLARIS)"라도 불리우는 반도체 웨이퍼 제조용 포토(PHOTO)장비에서는 감광제의 도포와 현상에 사용되는 케미컬들의 온도를 일정하게 유지하는 것이 미세선폭을 형성하기 위하여 필수적이며, 이와 같은 온도조절장치가 설치된 부분을 간단히 설명하면 다음과 같다.Generally, in photolithography equipment for semiconductor wafer manufacturing, also called "POLARIS", it is essential to maintain a constant temperature of chemicals used for the application and development of photoresist to form a fine line width. A brief description of the installed part is as follows.

도 1은 종래 케미컬라인 온도조절장치가 설치된 상태를 보인 사시도로서, 도시된 바와 같이, 종래에는 포토공정에 사용되는 케미컬이 유입되는 케미컬 공급용 컨넥터(CONNECTOR)(1)들과 그 공급된 케미컬을 분사하기 위한 노즐(NOZZLE)(2) 사이에 케미컬라인(미도시)이 연결되어 있다.1 is a perspective view showing a state in which a conventional chemical line temperature control device is installed, and as shown in the related art, a connector for supplying chemicals (CONNECTOR) 1 into which a chemical used in a photo process is introduced and a chemical supplied therein are conventionally shown. A chemical line (not shown) is connected between the nozzles NOZZLE 2 for spraying.

그리고, 상기 케미컬라인(미도시)의 외측에 일정공간을 두고 감싸도록 제1 쿨링 자켓(1'st COOLING JACKET)(3)이 설치되어 있고, 그 제1 쿨링 자켓(3)의 일단부와 타단부에 항온수를 순환시키기 위한 제1 순환라인(4)이 연결되어 있고, 그 제1 순환라인(4) 상에는 제1 히터 챔버(1'st HEATER CHAMBER)(5), 온도감지센서(6)가 설치되어 있다.In addition, a first cooling jacket (1'st COOLING JACKET) (3) is installed to surround the chemical line (not shown) with a predetermined space, and one end of the first cooling jacket (3) and the other. A first circulation line 4 for circulating constant temperature water is connected at an end thereof, and on the first circulation line 4, a first heater chamber 1 and a temperature sensor 6 are provided. Is installed.

또한, 상기 제1 순환라인(4)과 병열로 모터(MOTOR)(7)에 설치된 제2 쿨링자켓(8)에 항온수를 공급하기 위한 제2 히터 챔버(5')가 제2 순환라인(4')에 의하여 항온수가 순환할 수 있도록 되어 있다.In addition, a second heater chamber 5 ′ for supplying constant temperature water to the second cooling jacket 8 installed in the motor 7 in parallel with the first circulation line 4 includes a second circulation line ( 4 ') allows the constant temperature water to circulate.

그리고, 상기 제1/제2 순환라인(4)(4')에는 회수되는 항온수의 흐름을 제어하기 위한 오리피스(ORIFICE)(9,9')가 각각 설치되어 있다.The first and second circulation lines 4 and 4 'are provided with orifices 9 and 9' for controlling the flow of the constant temperature water recovered.

도면중 미설명 부호 10,10'는 상,하측열교환기 헤드(UPPER/LOWER HEAT EXCHANGER HEAD)이다.In the drawings, reference numerals 10 and 10 'denote upper and lower heat exchanger heads (UPPER / LOWER HEAT EXCHANGER HEAD).

상기와 같이 구성되어 있는 종래 케미컬라인 온도조절장치는 케미컬 공급용 컨넥터(1)를 통하여 공급된 케미컬이 케미컬라인(미도시)을 통과하여 노즐(2)로 분사되게 되는데, 이때 제1/제2 히터챔버(5)(5')에서 제1/제2 쿨링자켓(3)(8)로 각각 일정온도로 조절된 항온수를 공급하게 되며, 상기 제1/제2 쿨링자켓(3)(8)에서 제1/제2 순환라인(4)(4')을 통하여 회수되는 항온수는 오리피스(9)(9')에 의하여 적정한 흐름으로 제어되며 제1/제2 히터챔버(5)(5)로 공급되게 된다.In the conventional chemical line temperature control device configured as described above, the chemical supplied through the chemical supply connector 1 is injected into the nozzle 2 through the chemical line (not shown), wherein the first / second The constant temperature water, which is adjusted to a predetermined temperature, is supplied from the heater chambers 5 and 5 'to the first and second cooling jackets 3 and 8, respectively, and the first and second cooling jackets 3 and 8 are provided. ), The constant temperature water recovered through the first / second circulation line (4) (4 ') is controlled by the proper flow by the orifice (9) (9') and the first / second heater chamber (5) (5). ) Will be supplied.

그러나, 상기와 같이 회수되는 항온수의 흐름을 조절하기 위하여 설치된 오리피스(9)(9')들은 직경이 감소된 감축관형태이기 때문에 제1/제2 순환라인(4)(4')으로 회수되는 항온수에 존재하는 이물질에 의하여 유로가 막히는 경우가 종종 발생되어 온도콘트롤의 불안정에 따른 제품불량을 유발하게 되는 문제점이 있었다.However, the orifices 9 and 9 'installed to regulate the flow of the constant temperature water recovered as described above are recovered in the first and second circulation lines 4 and 4' because they are in the form of reduced tube diameters. The flow path is often clogged by foreign substances present in the constant temperature water, which causes a product defect due to instability of the temperature control.

상기와 같은 문제점을 감안하여 안출한 본 발명의 목적은 순환라인으로 항온수가 원할이 순환되지 못하여 제품불량이 발생되는 것을 방지하도록 하는데 적합한 반도체 포토장비의 케미컬라인 온도조절장치를 제공함에 있다.SUMMARY OF THE INVENTION An object of the present invention devised in view of the above problems is to provide a chemical line temperature control device of a semiconductor photo equipment suitable for preventing product defects from occurring because circulating water is not circulated in a circulation line.

도 1은 종래 케미컬라인 온도조절장치가 설치된 상태를 보인 사시도.1 is a perspective view showing a state in which a conventional chemical line temperature control device is installed.

도 2는 본 발명 반도체 포토장비의 케미컬라인 온도조절장치가 설치된 상태를 보인 사시도.Figure 2 is a perspective view showing a state in which the chemical line temperature control apparatus of the present invention semiconductor photo equipment is installed.

* 도면의 주요 부분에 대한 부호의 설명 *Explanation of symbols on the main parts of the drawings

3 : 제1 쿨링자켓 4 : 제1 순환라인3: first cooling jacket 4: first circulation line

5 : 제1 히터챔버 4' : 제2 순환라인5: 1st heater chamber 4 ': 2nd circulation line

5' : 제2 히터챔버 7 : 모터5 ': second heater chamber 7: motor

8 : 제2 쿨링자켓 20,20' : 플로우 미터8: 2nd cooling jacket 20,20 ': flow meter

상기와 같은 본 발명의 목적을 달성하기 위하여 케미컬 라인이 구비된 포토장비에 있어서, 항온수의 온도를 조절하기 위한 제1/제2 히터챔버에 케미컬 라인과 모터에 설치된 제1/제2 쿨링자켓이 제1/제2 순환라인으로 연결설치되고, 상기 제1/제2 쿨링자켓으로 공급된 항온수가 회수되는 제1/제2 순환라인 상에 플로우 레이트를 조절하기 위한 플로우 미터가 각각 설치되어서 구성되는 것을 특징으로 하는 반도체 포토장비의 케미컬라인 온도조절장치가 제공된다.In the photo equipment equipped with a chemical line in order to achieve the object of the present invention as described above, the first / second cooling jacket installed in the chemical line and the motor in the first / second heater chamber for controlling the temperature of the constant temperature water Flow meters for adjusting the flow rate are installed on the first and second circulation lines connected to the first and second circulation lines, and the constant temperature water supplied to the first and second cooling jackets is recovered. Provided is a chemical line temperature control apparatus for semiconductor photo equipment.

이하, 상기와 같이 구성되는 본 발명 반도체 포토장비의 케미컬라인 온도조절장치를 첨부된 도면의 실시예를 참고하여 보다 상세히 설명하면 다음과 같다.Hereinafter, with reference to the embodiment of the accompanying drawings the chemical line temperature control device of the semiconductor photo equipment of the present invention configured as described above in detail as follows.

도 2는 본 발명 반도체 포토장비의 케미컬라인 온도조절장치가 설치된 상태를 보인 사시도로서, 도시된 바와 같이, 포토공정에 사용되는 케미컬이 유입되는 케미컬 공급용 컨넥터(1)들과 그 공급된 케미컬을 분사하기 위한 노즐(2) 사이에 케미컬라인(미도시)이 연결되어 있고, 그 케미컬라인(미도시)의 외측에 일정공간을 두고 감싸도록 제1 쿨링 자켓(3)이 설치되어 있으며, 그 제1 쿨링 자켓(3)의 일단부와 타단부에 항온수를 순환시키기 위한 제1 순환라인(4)이 연결되어 있고, 그 제1 순환라인(4) 상에는 제1 히터 챔버(5), 온도감지센서(6)가 설치되어 있으며, 상기 제1 순환라인(4)과 병열로 모터(7)에 설치된 제2 쿨링자켓(8)에 항온수를 공급하기 위한 제2 히터 챔버(5')가 제2 순환라인(4')에 의하여 항온수가 순환할 수 있도록 되어 있다.Figure 2 is a perspective view showing a state in which the chemical line temperature control device of the semiconductor photo equipment is installed, as shown, the chemical supply connector (1) to which the chemical used in the photo process flows and the supplied chemical A chemical line (not shown) is connected between the nozzles 2 for spraying, and a first cooling jacket 3 is installed to wrap a certain space outside the chemical line (not shown). 1 A first circulation line 4 for circulating constant temperature water is connected to one end and the other end of the cooling jacket 3, and on the first circulation line 4, the first heater chamber 5 and the temperature sensing. The sensor 6 is installed, and the second heater chamber 5 'for supplying constant temperature water to the second cooling jacket 8 installed in the motor 7 in parallel with the first circulation line 4 is provided. 2 Constant temperature water is circulated by the circulation line 4 '.

그리고, 상기 제1/제2 쿨링자켓(3)(8)에서 회수되는 제1/제2 순환라인(4)(4') 상에는 회수되는 항온수의 플로우 레이트를 조절하기 위한 플로우 미터(20)(20')가 각각 설치되어 있고, 그 플로우 미터(20)(20')의 내측에는 각각 플로우 레이트를 감지할 수 있는 포토센서(PHOTO SENSOR)(미도시)가 설치되어 있다.Then, the flow meter 20 for adjusting the flow rate of the constant temperature water recovered on the first / second circulation line (4) (4 ') recovered from the first / second cooling jacket (3) (8). 20 'are provided, respectively, and inside the flow meter 20, 20', the photo sensor (PHOTO SENSOR) (not shown) which can sense a flow rate is provided, respectively.

도면중 미설명 부호 10,10'는 상,하측열교환기 헤드이다.In the drawings, reference numerals 10 and 10 'denote upper and lower heat exchanger heads.

상기와 같이 구성되어 있는 본 발명 반도체 포토장비의 케미컬라인 온도조절장치는 케미컬 공급용 컨넥터(1)를 통하여 공급된 케미컬이 케미컬라인(미도시)을 통과하여 노즐(2)로 분사되게 되는데, 이때 제1/제2 히터챔버(5)(5')에서 제1/제2 쿨링자켓(3)(8)로 각각 일정온도로 조절된 항온수를 공급하게 되며, 상기 제1/제2 쿨링자켓(3)(8)에서 제1/제2 순환라인(4)(4')을 통하여 회수되는 항온수는 플로우 미터(20)(20')에 의하여 플로우 레이트가 조절되면서 제1/제2 히터챔버(5)(5)로 공급되게 된다. 그리고, 이와 같이 순환되는 항온수의 플로우 레이트가 변하면 플로우 미터(20)(20')의 내측에 설치된 포토센서(미도시)에서 감지하여 에러를 발생시켜서 장비를 멈추도록 하여, 플로우 레이트가 항상 일정하게 유지되도록 한다.The chemical line temperature control device of the semiconductor photo equipment of the present invention configured as described above is sprayed to the nozzle 2 through the chemical line (not shown) supplied through the chemical supply connector 1, wherein The constant temperature water controlled to a predetermined temperature is supplied from the first / second heater chambers 5, 5 'to the first / second cooling jackets 3, 8, and the first / second cooling jacket The constant temperature water recovered through the first and second circulation lines 4 and 4 'in (3) (8) is controlled by the flow meters 20 and 20', so that the first and second heaters It is supplied to the chamber (5) (5). In addition, when the flow rate of the circulating constant temperature water is changed, a photo sensor (not shown) installed inside the flow meter 20 (20 ') is detected to generate an error to stop the equipment so that the flow rate is always constant. To be maintained.

이상에서 상세히 설명한 바와 같이, 본 발명 반도체 포토장비의 케미컬라인 온도조절장치는 제1/제2 쿨링자켓에서 회수되는 항온수의 플로우 레이트를 일정하게 유지시키기 위한 플로우 미터를 제1/제2 순환라인 상에 각각 설치하여, 종래와 같이 항온수의 흐름을 조절하기 위하여 설치된 감축관형태인 오리피스의 유로에 이물질이 막혀서 온도콘트롤의 불안정으로 제품불량이 발생되는 것을 방지하게 되는 효과가 있다.As described above in detail, the chemical line temperature control apparatus of the semiconductor photo equipment of the present invention includes a flow meter for maintaining a constant flow rate of the constant temperature water recovered from the first and second cooling jackets. It is installed on each of the phases, there is an effect to prevent the occurrence of product defects due to the instability of the temperature control by clogging foreign matters in the flow path of the orifice in the form of a reducing tube installed to control the flow of constant temperature water as in the prior art.

Claims (1)

케미컬 라인이 구비된 포토장비에 있어서, 항온수의 온도를 조절하기 위한 제1/제2 히터챔버에 케미컬 라인과 모터에 설치된 제1/제2 쿨링자켓이 제1/제2 순환라인으로 연결설치되고, 상기 제1/제2 쿨링자켓으로 공급된 항온수가 회수되는 제1/제2 순환라인 상에 플로우 레이트를 조절하기 위한 플로우 미터가 각각 설치되어서 구성되는 것을 특징으로 하는 반도체 포토장비의 케미컬라인 온도조절장치.In the photo equipment equipped with the chemical line, the first and second cooling jackets installed in the chemical line and the motor are connected to the first and second circulation lines in the first and second heater chambers for controlling the temperature of the constant temperature water. And a flow meter for adjusting the flow rate on the first / second circulation line where the constant temperature water supplied to the first / second cooling jacket is recovered. Thermostat.
KR1019980012878A 1998-04-10 1998-04-10 Chemical Line Temperature Controller of Semiconductor Photo Equipment KR19990079962A (en)

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KR1019980012878A KR19990079962A (en) 1998-04-10 1998-04-10 Chemical Line Temperature Controller of Semiconductor Photo Equipment

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