KR19980067194U - VSI system with test signal generation function by OSD - Google Patents

Abstract

The present invention relates to a VSI system having a function of generating a test signal by an OSD. In the past, when a test operation of a set is performed in such a system, a test switch and a test signal generating circuit installed near the rear modulator of the set are used. The operation of the test switch was inconvenient because the position of the test switch was operated from the rear of the set, and the problem was that the circuits for the test function had to be provided.

The present invention provides a key input unit 11, such as a remote control transmitter provided with a test key, and the OSD unit 13 when a test key is pressed from the key input unit 11 so as to improve such a conventional problem. Test by OSD including a microcomputer 12 for driving and generating a test signal, and an OSD 13 for generating a test signal under the control of the microcomputer 12 and providing the test signal to a rear end. It is to provide a VSI system having a signal generating function.

Description

VSI system with test signal generation function by OSD

The present invention relates to a VSI system having a function of generating a test signal by OSD, and in particular, a video signal using the OSD unit provided in the system directly without using a generator for a test signal in such a VSI system. By doing so, you can test the signals in your system to provide convenience when testing video signals.

The VSI system is a general-purpose electronic device used with a TV receiver. In such a system, a test operation is performed to determine whether the video output is properly performed after the set production is completed. It was to check whether the TV modulator was able to output normally by generating the signal of TV through the TV receiver screen.

In one example, the conventional circuit of such a system shows this as in FIG.

Here, the oscillation signal is transmitted to the test switch 21 provided on the rear wall frame side near the modulator of the VSI set, the test signal oscillator 23 connected to the test switch 21, and the test signal oscillator 23. An oscillator 22 to be provided, a test signal generator 24 connected to the output of the test signal oscillator 23, a microcomputer 24 connected to the output of the test signal generator 24, and The video output unit 26 generates a test video signal under the control of the microcomputer 24.

In the conventional system circuit, when the test switch 21 is turned on, the oscillation output is provided from the basic frequency oscillator 22 to the test signal oscillator 23, and the test signal oscillator 23 generates a square wave oscillation to be generated in the television receiver. By generating an output, a test bar signal as shown in FIG. 2 is displayed on the TV receiver screen.

However, in such a prior art, the test switch 21 is installed in the rear modulator portion of the V-Sial set, which makes it inconvenient for the operator who tests the set to confirm the position of the test switch 21 and its use. .

In addition, in the above-described technology, the test switch 21, the oscillator 22 for generating the test bar signal, the test signal oscillator 23, etc. are provided on the set side to perform such a test operation as described above. This is undesirable because of the complexity of the system circuit and the cost of the circuit.

An object of the present invention is to conveniently test the video signal of the system by generating a test signal directly through the key unit such as a remote control transmitter using the OS unit provided in the system to improve the above problems. It is intended to be implemented.

In particular, the present invention provides a key input unit such as a remote control transmitter equipped with a test key for realizing the object of the above example, and a microcomputer for controlling a test signal to be generated by driving an OSD unit when a test key is pressed from the key input unit. It is characterized by a VSI system having a function of generating a test signal by an OSD including an OSD unit which generates a test signal under the control of a microcomputer and provides it to the rear stage.

Hereinafter, more specific features of the present invention will be understood by describing the same in detail with the accompanying drawings.

1 is a system circuit block diagram of a conventional test signal generation circuit.

2 is an example of a test signal associated with FIG.

3 is a system circuit block diagram of the present invention.

4 is an embodiment of a test processing program according to the present invention

** Explanation of symbols on the main parts of the drawing **

11.Key Input 12.Microcomputer

13. OSDIVE

100. Test signal generation processing program

That is, Figure 3 shows an excerpt of the circuit block of the VSI system having a test signal generation function by the OSD of the present invention.

Here, a key input unit 11, such as a remote control transmitter provided with a test key, and the microcomputer 12 which controls the OSD unit 13 to generate a test signal when a test key is pressed from the key input unit 11. And an OSD unit 13 for generating a test signal under the control of the microcomputer 12 and providing the test signal to the rear stage.

In addition, the OS 13 connected to the output port of the microcomputer 12 may provide the clock signal CK, the display data signal DT, and the strobe signal ST from the microcomputer 12. It is connected.

According to the present invention of FIG. 3, when a user tests a video signal of a VSI set, the user can press a test key provided in the key input unit 11 and the TV receiver through the RF modulator at the rear end of the OSD unit 13. The test bar signal is output on the screen.

At this time, when the user presses the test key, the microcomputer 12 recognizes this and provides the OS unit 13 with a clock signal CK, a test bar display data signal DT, and a strobe signal ST. The OS unit 13 generates the test bar RF signal of the NTS NT according to the clock signal CK, the test bar display data signal DT, and the strobe signal ST provided from the microcomputer 12. It is to be provided to the RF modulator and TV receiver side of the rear stage.

The TV receiver receives the test bar RF signal from the OS 13 to drive the TV receiver to output a test bar signal.

Meanwhile, the above operation is performed by the microcomputer 12 together with the test signal generation processing program 100 as shown in FIG. 4, which is a test key input state of the key input unit 11 while the system is powered on. The microcomputer 12 supplies the test data, the clock, and the strobe signal to the OS 13, and then generates a test signal from the modulator. It is to be provided to (steps 101 to 105).

The present invention is a test signal generating function used for the operation test of the set in the VSI system can perform the test work directly through the OS portion of the system without requiring a separate test bar signal generator, etc. Convenience and cost savings from circuit simplification can also be expected.

Claims (1)

1. A VSI system having a test switch or the like, wherein the system includes a key input unit 11, such as a remote control transmitter equipped with a test key, and an OSD unit 13 when a test key is pressed from the key input unit 11. Microcomputer 12 for controlling the generation of the test signal by driving the < RTI ID = 0.0 >), < / RTI > doing VSI system with test signal generation function by OSD