KR102632113B1 - Hermetic sealed beam projector module and method for manufacturing the same - Google Patents

Abstract

One embodiment includes a light source that outputs light; a substrate supporting the light source; an optical device that reduces the intensity of the light output to a certain space with respect to the light; a frame that separates the optical device from the light source by a predetermined distance; an optical substrate to which the optical device is attached and forms a closed space together with the substrate and the frame - the pressure of the closed space is lower than that of the outside; A sensor that measures the condition of the enclosed space; and a processor that changes the operating mode of the light source according to the measured value of the sensor.

Description

Hermetic sealed beam projector module and manufacturing method thereof {HERMETIC SEALED BEAM PROJECTOR MODULE AND METHOD FOR MANUFACTURING THE SAME}

The present invention relates to a beam projector module.

LASER stands for "Light Amplification by Stimulated Emission of Radiation" and can output light intensively and condensedly. Additionally, lasers can be monochromatic and directional, and due to these characteristics, lasers are used in a variety of ways in the field of optical sensor technology.

For example, a laser can be used as a light source for a distance measuring device or as a light source for a 3D depth camera. ToF (Time of Flight) type distance measuring device measures the distance traveled by a pulse-shaped light wave output from a light source as it reflects off an object and returns through the phase difference, and determines the distance through this phase difference and frequency information. Structure light (SL) or hybrid stereo type can extract distance information by using a laser light source as a source and forming a regular or irregular pattern through a diffuser.

Lasers are used as a light source for distance measurement and 3D depth cameras due to their high output and directivity characteristics.

Meanwhile, the high output characteristics of a laser can be perceived as an advantage in that it increases the flight distance of light and can maintain the output of returned light above a certain level, but it can be perceived as a disadvantage in terms of safety. When high-output light is irradiated directly into a person's eyes, it can cause damage to the eyes and, in extreme cases, cause blindness. Accordingly, safety issues must always be considered when using a laser as a light source.

In general, each country has eye-safety standards, and the intensity of light output from the device is adjusted to below the standard value.

One way to control the intensity of output light is to place a diffuser that can reduce the intensity of light in the light output path. Since the diffuser uses the properties of light to disperse the concentrated light to a certain field of view (FOV) required by the system through effects such as refraction and diffraction, the intensity per unit area of the light passing through the diffuser is reduced.

However, in a device that adjusts the intensity of light using a diffuser, if the diffuser is detached, high-output light is output as is, which can be a safety issue.

Against this background, the purpose of this embodiment is to provide technology for a beam projector module that provides an eye-safety function.

In order to achieve the above-described object, one embodiment includes a light source that outputs light; a substrate supporting the light source; an optical device that reduces the intensity of the light output to a certain space with respect to the light; a frame that separates the optical device from the light source by a predetermined distance; an optical substrate to which the optical device is attached and forms a closed space together with the substrate and the frame - the pressure of the closed space is lower than that of the outside; A sensor that measures the condition of the enclosed space; and a processor that changes the operating mode of the light source according to the measured value of the sensor.

In the beam projector module, the sealed space is filled with an inert gas, and the air pressure of the inert gas may be lower than the air pressure outside the frame.

In the beam projector module, the sensor is a pressure sensor, and the processor can operate the light source in an eye-safety mode when the measured value of the pressure sensor is higher than the reference pressure.

In the beam projector module, the pressure sensor can measure the atmospheric pressure in the closed space.

In the beam projector module, the sensor is a pressure sensor, the pressure sensor is located at a joint of two of the substrate, the frame, and the optical substrate and measures the bonding force of the joint, and the processor measures the measured value of the pressure sensor. If the pressure is lower than this reference pressure, the light source can be operated in eye-safety mode.

In the beam projector module, the pressure sensor may be disposed on the substrate and a portion of the frame may be coupled to the substrate while pressing the pressure sensor.

In the beam projector module, the pressure sensor is located at a joint between the frame and the optical board, and a wire connecting the pressure sensor and the board may be formed inside or outside the frame.

In the beam projector module, the optical substrate includes a first cover and a second cover forming a space spaced apart within the optical board, and the sealed space is a space spaced apart between the first cover and the second cover. It includes, and the sensor may be arranged to measure the state of the spaced apart space.

In the beam projector module, the optical substrate may include an air gap having a pressure different from that of the sealed space, and may further include an air gap sensor that measures the state of the air gap.

In the beam projector module, the processor specifies the crack occurrence location by comparing the measured values of the sensor and the air gap sensor when a crack occurs, and the processor determines that the crack occurrence location is a crack of the optical device. The light source can be operated in eye-safety mode.

In the beam projector module, the sensor is a concentration sensor, and the pro sensor can operate the light source in an eye-safety mode when the measured value of the concentration sensor is lower than the reference concentration.

In the beam projector module, a specific gas is filled in the sealed space, and the concentration sensor can measure the concentration of the specific gas.

In the beam projector module, the processor operates the light source in an eye-safety mode according to the measured value of the sensor, and in the eye-safety mode, the light output from the light source is in the eye-safety free band. It can have a wavelength.

In the beam projector module, the light source includes a first sub-light source and a second sub-light source, and the processor outputs light using the first sub-light source in the normal mode and the second sub-light source in the eye protection mode. Light can be output using a light source.

In the beam projector module, the optical substrate includes a first cover and a second cover, the first cover is hermetic sealed to the frame through a metal material formed on the outside, and the optical device is attached to the second cover. Attached, the second cover may be attached to the first cover so that the optical device is disposed between the first cover and the second cover.

In the beam projector module, a pillar is formed on the outside of the second cover to be higher than the optical device, and the second cover can be attached to the first cover through an adhesive applied to the outside.

In the beam projector module, a side fill may be filled between the sides of the first cover and the second cover and the frame.

Another embodiment is a method of manufacturing a beam projector module, comprising: preparing a substrate to which a light source is attached; attaching a frame to the substrate; Forming a metal material on the outside of the first cover; Compressing the portion where the metal material is formed to the frame; forming an optical device inward from the pillar in a second cover having a pillar formed on the outside; attaching the second cover to the first cover using an adhesive so that the optical device is disposed between the first cover and the second cover; and filling a side fill between the sides of the first cover and the second cover and the frame.

As described above, according to this embodiment, the user's eyes can be safely protected even if an abnormality occurs in the beam projector module.

1 is a cross-sectional view of a beam projector module according to a first embodiment.
Figure 2 is a diagram showing a state in which a crack occurs in the beam projector module of Figure 1 and the seal is destroyed.
Figure 3 is a cross-sectional view of the beam projector module according to the second embodiment.
Figure 4 is a cross-sectional view of the beam projector module according to the third embodiment.
Figure 5 is a cross-sectional view of the beam projector module according to the fourth embodiment.
Figure 6 is a diagram showing a case where a crack occurs in the beam projector module according to the fourth embodiment.
Figure 7 is a diagram showing a case where a crack occurs in the beam projector module according to the fifth embodiment.
Figure 8 is a flowchart of a processor changing an operating mode according to a pressure value according to an embodiment of the specification.
Figure 9 is a flowchart of a processor changing an operation mode according to a concentration value according to an embodiment of the specification.
Figure 10 is a flowchart showing driving light in the eye protection free band in a beam projector module according to an embodiment of the specification.
Figure 11 is a diagram showing a portion where hermetic sealing is performed in the beam projector module according to an embodiment of the specification.
FIG. 12 is an enlarged view of the hermetic sealing portion shown in FIG. 11.
13 to 17 are diagrams showing each step of a method of hermetic sealing a beam projector module according to an embodiment.
Figure 18 is a diagram for explaining the effect when the optical substrate according to an embodiment of the specification is formed with a double cover.
Figure 19 is a diagram showing that the metal material of the optical substrate according to an embodiment of the specification is utilized as a discharge path for ESD.

Hereinafter, some embodiments of the present invention will be described in detail through illustrative drawings. When adding reference numerals to components in each drawing, it should be noted that identical components are given the same reference numerals as much as possible even if they are shown in different drawings. Additionally, in describing the present invention, if it is determined that a detailed description of a related known configuration or function may obscure the gist of the present invention, the detailed description will be omitted.

Additionally, when describing the components of the present invention, terms such as first, second, A, B, (a), and (b) may be used. These terms are only used to distinguish the component from other components, and the nature, sequence, or order of the component is not limited by the term. When a component is described as being “connected,” “coupled,” or “connected” to another component, that component may be directly connected or connected to that other component, but there is another component between each component. It will be understood that elements may be “connected,” “combined,” or “connected.”

1 is a cross-sectional view of a beam projector module according to a first embodiment.

Referring to FIG. 1, the beam projector module 100 includes a light source 110, a substrate 120, an optical device 130, a frame 140, an optical substrate 150, a sensor 160, and a processor 170. It may include etc.

Wiring may be patterned on the substrate 120. Additionally, the substrate 120 can receive power from the outside, and supply power to the light source 110, sensor 160, processor 170, etc. through each wiring.

The light source 110 may be disposed on a substrate, the anode electrode of the light source 110 may be connected to the anode wiring of the substrate 120, and the cathode electrode may be connected to the cathode wiring of the substrate 120. The power supply to the light source 110 can be controlled by the processor 170, and the processor 170 can control the power supplied to the light source 110 differently in the normal mode and eye protection mode. For example, the processor 170 may supply power to the light source 110 only in the normal mode and may not supply power to the light source 110 in the eye protection mode. As another example, the processor 170 may supply relatively less power to the light source 110 in the eye protection mode than in the normal mode.

The light source 110 may be connected to the substrate 120 in the form of wire bonding. Alternatively, the light source 110 may be placed on the substrate 120 without wires through flip chip bonding. When the light source 110 is connected to the substrate 120 through flip chip bonding, a smaller beam projector module can be constructed because there are no wires.

The light source 110 may include a vertical-cavity surface-emitting laser (VCSEL).

The sensor 160 can receive power through wiring on the substrate 120 and transmit and receive signals. The sensor 160 may be a pressure sensor, a concentration sensor, etc., and the values measured by the sensor 160 will be described later.

The frame 140 may be disposed on the substrate 120 while surrounding the light source 110 so that a certain space is formed around the light source 110 . Frame 140 may be thermally conductive and thus capable of transferring heat. An optical substrate 150 may be coupled to the upper side of the frame 140.

An optical device 130 - for example, a diffuser - may be attached to the optical substrate 150, and the optical device 130 may perform a function of reducing the intensity of light output from the light source 110. there is. The optical device 130 may be placed at a certain distance from the light source 110, and the frame 140 may space the optical device 130 at a certain distance from the light source 110.

A closed space 10 may be formed by the substrate 120, the frame 140, and the optical substrate 150. A light source 110, a sensor 160, etc. may be placed in the closed space 10. The pressure of the closed space 10 may be lower than the external pressure. According to this pressure difference, the substrate 120, frame 140, and optical substrate 150 can receive strong pressure (high pressure) from the outside toward the sealed space 10, and the substrate 120, frame 140 and the optical substrate 150 may increase. A sealing technique that forms a closed space and makes the pressure inside it lower than the outside pressure can be called hermetic sealing. Hereinafter, for convenience of explanation, the term hermetic ceiling will be used.

The closed space 10 may be filled with an inert gas. And, the air pressure of this inert gas may be lower than the air pressure outside the frame.

The sensor 160 may be a pressure sensor, and the pressure sensor may measure the air pressure of the closed space 10. If the measured value of the pressure sensor measuring the pressure of the closed space 10 is higher than the reference pressure, the processor 170 may operate the light source 110 in an eye protection mode.

The closed space 10 may be filled with a specific gas. And, the air pressure of this particular gas may be lower than the air pressure outside the frame.

The sensor 160 may be a concentration sensor, and the concentration sensor may sense the concentration of a specific gas filled in the closed space 10. If the measured value of the concentration sensor is lower than the reference concentration, the processor 170 may operate the light source 110 in an eye protection mode.

The processor 170 may operate the light source 110 in an eye protection mode according to the measured value of the sensor. In the eye protection mode, the light output from the light source 110 may have a wavelength in the eye protection free band. For example, the wavelength of the eye protection free band may be 1050 nm. The wavelength of the eye protection free band can be defined in advance, and through experiments, the band may not have any effect on human eyes or may have an effect below the standard value.

The light source 110 may include a first sub-light source and a second sub-light source. The processor 170 may output light using the first sub-light source in the normal mode, and may output light using the second sub-light source in the eye protection mode. Here, the second sub light source can output light with a wavelength in the eye protection free band described above.

Figure 2 is a diagram showing a state in which a crack occurs in the beam projector module of Figure 1 and the seal is destroyed.

Referring to FIG. 2, when a crack 70 occurs in a part of the beam projector module 100, air circulation occurs due to a pressure difference between the inside and the outside, and the air pressure in the internal space 10 increases. In particular, cracks 70 may occur in the optical device 130 or the optical substrate 150, and through these cracks 70, external air flows into the internal space and the gas filled inside flows out. . Then, the air pressure of the internal space 10 increases and the concentration of the filling gas decreases.

The pressure between the joints also changes. For example, when the interior space becomes a closed space and there is a difference between the inside and outside air pressure, the joint between the two plates is subjected to pressure according to the difference in air pressure between the inside and outside. do. The joint 30 between the substrate and the frame, as explained with reference to FIG. 1, and the joint 20 between the frame and the optical substrate are subjected to pressure due to this air pressure difference. The pressure between these joints gradually decreases as the air pressure in the internal space increases due to cracks, etc.

The processor 170 can detect this change in pressure or concentration through the sensor 160 and determine whether an abnormality has occurred in the beam projector module 100 - for example, whether a crack has occurred. Additionally, if the processor 170 determines that an abnormality has occurred in the beam projector module 100, it can change the operating mode of the light source 110 to prevent damage to the user.

Figure 3 is a cross-sectional view of the beam projector module according to the second embodiment.

Referring to FIG. 3 , the sensor 260 may be placed on the substrate 120 . Additionally, a portion of the frame 140 may be coupled to the substrate 120 while pressing the sensor 260 . In this combination structure, when an air pressure difference occurs between the internal space and the outside of the frame, the sensor 260 can receive a pressure that changes according to the air pressure difference and measure the pressure.

On the other hand, when a crack occurs in the beam projector module 200, external air flows into the beam projector, and the pressure in the sealed space 10, that is, the internal space, increases, thereby reducing the pressure difference between the inside and outside of the beam projector. . As a result, the pressure applied to the coupling portions 20 and 30 of the frame 140 and the substrate 120 may be reduced, thereby reducing the pressure on the sensor 260. Accordingly, the sensor 260 measures a pressure that is smaller than the reference pressure, and the processor 170 checks the measured value - pressure value - of the sensor 260, and when the measured value is lower than the reference value, the beam projector module (200 ) can be judged to be abnormal. Additionally, the processor 170 may operate the light source 110 in eye-safety mode.

In this way, the sensor 260 can indirectly measure the state - pressure - of the closed space by measuring the air pressure difference between the inside and outside of the beam projector module at the joint between the frame 140 and the substrate 120.

Meanwhile, when the sensor 260 is arranged in this way, the wiring connected to the sensor 260 can be easily arranged and the electrical connection between the sensor 260 and the processor 170 can be facilitated.

Figure 4 is a cross-sectional view of the beam projector module according to the third embodiment.

Referring to FIG. 4 , the sensor 360 may be placed on a portion of the upper part of the frame 140 . Additionally, a portion of the optical substrate 150 may be coupled to the frame 140 while pressing the sensor 360 . In this combination structure, when an air pressure difference occurs between the internal space and the outside of the frame, the sensor 360 can receive a pressure proportional to the air pressure difference and measure the pressure.

On the other hand, when a crack occurs in the beam projector module 300, external air flows into the beam projector and the pressure in the sealed space 10, that is, the internal space, increases, thereby reducing the pressure difference between the inside and outside of the beam projector. . As a result, the pressure applied to the coupling portion 20 of the frame 140 and the optical substrate 150 may be reduced, thereby reducing the pressure on the sensor 360. Accordingly, the sensor 360 measures a pressure that is smaller than the reference pressure, and the processor 170 checks the measured value - pressure value - of the sensor 360, and when the measured value is lower than the reference value, the beam projector module (300 ) can be judged to be abnormal.

In this way, the sensor 360 measures the air pressure difference between the inside and outside of the beam projector module at the coupling portion 20 of the frame 140 and the optical board 150 to determine the state - pressure - of the closed space 10. It can be measured indirectly.

Meanwhile, when the sensor 360 is arranged in this way, the processor 170 can accurately determine whether the optical substrate 150 is properly attached to the frame 140. For example, if the coupling between the optical substrate 150 and the frame 140 is inadequate, there is a problem that the light output from the light source 110 is not scattered by the optical substrate 150 and is transmitted directly to the human eye. (170) can accurately identify this problem through the above-described arrangement structure.

Figure 5 is a cross-sectional view of the beam projector module according to the fourth embodiment.

And, Figure 6 is a diagram showing a case where a crack occurs in the beam projector module according to the fourth embodiment.

Referring to Figures 5 and 6, the optical substrate 150 may include a first cover 151 and a second cover 152. Also, the space spaced apart between the first cover 151 and the second cover 152 may be a closed space like the internal space. Additionally, the sensor 460 may be placed in contact with a joint between the frame 140 and the first cover 151 and a joint between the frame 140 and the second cover 152. The sensor 460 can measure the state of the space between the first cover 151 and the second cover 152.

The sensor 460 may be a pressure sensor and may measure the pressure of the space spaced apart from the first cover 151 and the second cover 152. The processor 170 may check the pressure value of the sensor 460 and determine that there is a problem with the beam projector module 400 if the pressure in the spaced apart space is higher than the reference value.

For example, if a crack 71 occurs in the first cover 151 and the second cover 152 as shown in Figure 6, the air outside the beam projector may flow into the spaced space and the air pressure in the spaced space may increase. there is. At this time, the sensor 460 can measure the increased pressure in the spaced space, and the processor 170 can operate the light source 110 in eye-safety mode when the measured pressure value is higher than the reference value. there is.

A specific gas may be filled in the spaced apart space, and the sensor 460 may be a concentration sensor. The sensor can measure a specific gas concentration in the space spaced apart between the first cover 151 and the second cover 152. The processor 170 may check the concentration value of a specific gas in the sensor and determine that there is a problem with the beam projector module 400 if the concentration value in the spaced space is lower than the reference concentration.

For example, when a crack 71 occurs in the first cover 151 and the second cover 152 as shown in FIG. 6, gas outside the beam projector flows into the spaced space and specific gas flows out of the spaced space. This can lower the concentration of specific gases in separated spaces. At this time, the sensor 460 can measure the lowered concentration of a specific gas, and the processor 170 can operate the light source 110 in eye-safety mode when the measured concentration value is lower than the reference value. there is.

Meanwhile, when the sensor 460 is arranged in this way, the sensor 460 can more directly measure whether cracks occur in the optical device 130 and the optical substrate 150.

Figure 7 is a diagram showing a case where a crack occurs in the beam projector module according to the fifth embodiment.

The beam projector module 500 may include a light source 110, a substrate 120, an optical device 130, a frame 140, an optical substrate 150, a sensor, and a processor 170. The sensor may be placed on a substrate or at a junction between the frame 140 and the optical substrate 150 or the frame 140 and the substrate 130. Figure 7 is an enlarged portion of the beam projector module 500. Referring to Figure 7, the optical substrate 150 may include an air gap 90. Alternatively, the optical substrate 150 may include a first cover and a second cover, and include an optical device 130 in at least one of the first cover and the second cover, and the cover including the optical device 130. An air gap 90 may be disposed in .

The air gap 90 can be sealed through the optical device 130 and the optical substrate 150. Also, the pressure within the sealed air gap 90 may be different from the pressure in the sealed space of the beam projector module.

In addition, the beam projector module 500 includes an air gap sensor 565 that measures the state of the air gap 90 in addition to the sensors 160, 260, 360, and 460 described above with reference to FIGS. 1 to 6. More may be included.

The air gap sensor 565 may be a pressure sensor. The air gap sensor 565 can measure the pressure within the air gap 90. If the measured pressure value is higher than the reference pressure, the processor 170 may operate the light source 110 in an eye-safety mode.

Meanwhile, if an abnormality such as a crack 72 occurs in the optical device 130, air outside the air gap 90 may flow into the air gap 90. Accordingly, the pressure inside the air gap 90 may increase. At this time, the processor 170 may compare the pressure value measured by the air gap sensor 565 with the pressure value measured by the sensors 160, 260, 360, and 460 to specify the crack occurrence location.

For example, if an abnormality such as a crack 72 occurs in the optical device 130, the pressure inside the air gap 90 may increase and the pressure value measured by the air gap sensor 565 may increase. At this time, the processor 170 may determine that a crack has occurred in the optical device 150 and operate the light source 110 in an eye-safety mode.

Meanwhile, if an abnormality such as a crack occurs in the substrate 120 or the frame 140, the pressure or concentration measured by the sensors 110, 260, 360, and 460 may vary by a certain range or more with respect to the reference value. However, since no problem occurred in the optical device 130, the pressure value measured by the air gap sensor 565 may be the same as when no crack occurred. In this case, the processor 170 may determine that the crack occurred somewhere other than the optical device 130, and at this time, the light source 110 may operate in normal mode.

Also, a specific gas may be filled in the air gap 90. When a specific gas is filled in the air gap 90, the air gap sensor 565 can measure a change in the concentration of the specific gas within the air gap 90. When the air gap sensor 565 measures a change in concentration of a specific gas, when a crack occurs, the processor 170 specifies the location of the crack and sends it to the optical device 130 in the same way as when measuring the pressure change described above. If a crack occurs, the light source 110 can be operated in eye-safety mode.

If the beam projector module 500 includes an air gap sensor 565, it may be possible to directly determine whether the optical device 130 is cracked. Since the optical device 130 scatters light and reduces the intensity of light, if a problem occurs in the optical device 130, it may cause fatal damage to the user's eyes, unlike when a problem occurs in the frame 140 or the substrate 120. I can give it. Therefore, when the processor 170 changes the operating mode of the light source 110 according to the location of the crack, the eye-safety mode is operated only when damage to the user's eyes may be caused. The operating efficiency of the beam projector module 500 can be increased.

Figure 8 is a flowchart of a processor changing an operating mode according to a pressure value according to an embodiment of the specification.

Referring to FIG. 8, the processor may obtain a pressure value from the sensor (S102). Here, the pressure value may be the atmospheric pressure of the internal space - a closed space.

The processor may determine whether the measured pressure value is smaller than the reference pressure (S104).

The processor can drive the light source in normal mode when the pressure value is lower than the reference pressure. (S106) And, if the pressure value is higher than the reference pressure, the processor can drive the light source in eye-safness mode (S108). In eye protection mode, the processor can turn off the light source or reduce the power supply to the light source.

Meanwhile, the pressure value may be the bonding force of a joint - for example, a joint between a substrate and a frame, or a joint between a frame and an optical substrate. In this case, the processor compares the pressure value and the reference pressure, and if the pressure value is higher than the reference pressure, the processor may drive the light source in normal mode. Additionally, the processor may drive the light source in eye protection mode if the pressure value is lower than the reference pressure.

Figure 9 is a flowchart of a processor changing an operating mode according to a concentration value according to an embodiment of the specification.

Referring to FIG. 9, the processor may obtain a concentration value from the sensor (S202). Here, the concentration value may be the concentration of gas filled in the internal space.

The processor may determine whether the measured pressure value is smaller than the reference pressure (S204).

The processor may drive the light source in normal mode if the concentration value is higher than the reference concentration (206). Additionally, the processor may drive the light source in eye-safety mode if the concentration value is lower than the reference concentration (S208).

The concentration value may be the concentration value of an inert gas or a specific gas filled in the internal space. The processor may drive the light source in normal mode when the concentration value of the inert gas or specific gas is higher than the reference concentration. Additionally, the processor may drive the light source in an eye protection mode when the concentration value of the inert gas or specific gas is lower than the standard concentration.

Figure 10 is a flowchart showing driving light in the eye protection free band in a beam projector module according to an embodiment of the specification.

Referring to FIG. 10, the processor can drive the light source in normal mode (S302). In normal mode, light may have wavelengths in the commonly used normal band.

And, the processor can detect an abnormality in eye protection (S304).

If the processor detects an eye protection abnormality, the light source can be controlled to output light having a wavelength in the eye protection free band (S306).

If an abnormality in eye protection is not detected, the light source can be controlled to continuously output light having a wavelength in the normal band (S308).

The eye protection free band refers to a wavelength band that does not cause deterioration of vision or has a small effect on vision deterioration. For example, a wavelength of 1050 nm may fall under the eye protection free band.

The light source 110 may further include an optical converter that changes the wavelength, and the processor 170 may enable light to be output through the optical converter in the eye protection mode.

The light source 110 may include a first sub-light source that outputs a wavelength in a normal band and a second sub-light source that outputs a wavelength in an eye-protection free band. Additionally, the processor 170 may output light using the first sub-light source in the normal mode and output light using the second sub-light source in the eye protection mode.

FIG. 11 is a view showing a portion where hermetic sealing is performed in the beam projector module according to an embodiment of the specification, and FIG. 12 is an enlarged view of the hermetic sealing portion shown in FIG. 11.

13 to 17 are diagrams showing each step of a method of hermetic sealing a beam projector module according to an embodiment.

Referring to FIG. 11, the joint between the optical substrate 150 and the frame 140 in the beam projector module may be hermetic sealed.

Referring to FIG. 12, the optical substrate 150 may include a first cover 151 and a second cover 152. The first cover 151 may be hermetic sealed to the frame 140 through a metal material 771 formed on the outside. The optical device 130 may be attached to the second cover 152. Also, the second cover 152 may be attached to the first cover 151 so that the optical device 130 is disposed between the first cover 151 and the second cover 152. A pillar may be formed on the outside of the second cover 152 to be higher than the optical device 150, and the second cover 152 may be connected to the first cover through an adhesive 772 (for example, epoxy) applied to the outside of the second cover 152. It can be attached to (151). Additionally, a side fill 774 may be filled between the sides of the first cover 151 and the second cover 152 and the frame 140.

Referring to FIG. 13, after preparing the substrate 120 to which the light source 110 is attached and attaching the frame 140 to the substrate 120, a metal material 771 is placed on the outside of the first cover 151. It can be attached. The metal material 771 may be, for example, silver (Au).

Referring to FIG. 14, the portion of the first cover 151 to which the metal material 771 is attached may be pressed to the frame 140. At this time, hermetic sealing is performed between the optical substrate 150 and the frame 140. In order to lower the air pressure in the internal space between the optical substrate 150, the frame 140, and the substrate 120, a hermetic sealing process can be performed between the optical substrate 150 and the frame 140 in a vacuum chamber or low pressure chamber. . Alternatively, after the optical substrate 150 and the frame 140 are hermetic sealed, the air in the internal space can be exhausted using a vacuum exhaust device.

Referring to FIG. 15, an optical device 130 - for example, a diffuser - may be formed on one surface of the second cover 152. Additionally, a pillar 773 having a thickness higher than that of the optical device 130 may be formed on the outer edge of the same side of the second cover 152.

Referring to FIG. 16, the second cover 152 may be attached to the first cover 151 using an adhesive 772. For example, epoxy 772 may be applied to the pillar 773 of the second cover 152 and the second cover 152 may be attached to the first cover 151 using this epoxy.

When the second cover 152 is attached to the first cover 151, the optical device 130 is surrounded by the first cover 151 and the second cover 152 and the space around the optical device 130 is sealed. It can be a space.

Referring to FIG. 17, a side fill 774 may be filled between the sides of the first cover 151 and the second cover 152 and the frame 140.

In this way, when the optical substrate 150 is composed of a double cover, various additional effects may occur.

Figure 18 is a diagram for explaining the effect when the optical substrate according to an embodiment of the specification is formed with a double cover.

Referring to FIG. 18, the first cover 151 and the second cover 152 are attached at regular intervals, forming a space 90 spaced apart between the first cover 151 and the second cover 152. . And, the optical device 130 may be placed in this space 90 spaced apart from each other.

The light source 110 may generate high temperature heat, and this heat may be transferred to surrounding components through convection or radiation. At this time, because the first cover 151 primarily absorbs the heat output from the light source 110 and radiates it to the outside through the frame 140, the optical device 130 located in the spaced space 90 is relatively As a result, less heat from the light source 110 is transmitted.

Meanwhile, the optical device 130 can be blocked from contact with external air and from the filling gas in the internal space through the spaced apart space. There is a high possibility that the optical device 130 will be oxidized when contact with surrounding air increases. However, the optical device 130 according to one embodiment can reduce the risk of such oxidation by being located in a space 90 that is spaced apart from each other.

Figure 19 is a diagram showing that the metal material of the optical substrate according to an embodiment of the specification is utilized as a discharge path for ESD.

Referring to FIG. 19, the metal material 771 disposed on the outside of the optical substrate 150 is not only used for hermetic sealing, but can also be used as a discharge path for ESD (electro-static discharge) input to the beam projector module. .

The metal material 771 may be connected to the ESD discharge circuit 775 - for example, a circuit including a zener diode - through wiring disposed outside or inside the frame 140. In addition, the metal material 771 can transfer the ESD charge to the ESD discharge circuit when ESD is input to the beam projector module.

As described above, according to this embodiment, the user's eyes can be safely protected even if an abnormality occurs in the beam projector module.

Terms such as “include,” “comprise,” or “have” as used above mean that the corresponding component may be included, unless specifically stated to the contrary, and do not exclude other components. It should be interpreted that it may further include other components. All terms, including technical or scientific terms, unless otherwise defined, have the same meaning as generally understood by a person of ordinary skill in the technical field to which the present invention pertains. Commonly used terms, such as terms defined in a dictionary, should be interpreted as consistent with the contextual meaning of the related technology, and should not be interpreted in an idealized or overly formal sense unless explicitly defined in the present invention.

The above description is merely an illustrative explanation of the technical idea of the present invention, and various modifications and variations will be possible to those skilled in the art without departing from the essential characteristics of the present invention. Accordingly, the embodiments disclosed in the present invention are not intended to limit the technical idea of the present invention, but are for illustrative purposes, and the scope of the technical idea of the present invention is not limited by these embodiments. The scope of protection of the present invention should be interpreted in accordance with the claims below, and all technical ideas within the equivalent scope should be construed as being included in the scope of rights of the present invention.

Claims (18)

A light source that outputs light;
a substrate supporting the light source;
an optical device that reduces the intensity of the light output to a certain space with respect to the light;
a frame that separates the optical device from the light source by a predetermined distance;
an optical substrate to which the optical device is attached and forms a closed space together with the substrate and the frame - the pressure of the closed space is lower than that of the outside;
A sensor that measures the condition of the enclosed space; and
Processor that changes the operating mode of the light source to eye protection mode according to the measured value of the sensor
Beam projector module including. According to paragraph 1,
A beam projector module in which the sealed space is filled with an inert gas and the air pressure of the inert gas is lower than the air pressure outside the frame. According to paragraph 1,
The sensor is a pressure sensor,
The processor is a beam projector module that operates the light source in an eye-safety mode when the measured value of the pressure sensor is higher than the reference pressure. According to paragraph 3,
The pressure sensor is a beam projector module that measures the atmospheric pressure in the enclosed space. According to paragraph 1,
The sensor is a pressure sensor,
The pressure sensor is located at a joint between two of the substrate, the frame, and the optical substrate and measures the bonding force of the joint,
A beam projector module in which the processor operates the light source in an eye-safety mode when the measured value of the pressure sensor is lower than the reference pressure. According to clause 5,
A beam projector module in which the pressure sensor is disposed on the substrate and a part of the frame is coupled to the substrate while pressing the pressure sensor. According to clause 5,
The pressure sensor is located at a junction between the frame and the optical board, and a wiring connecting the pressure sensor and the board is formed inside or outside the frame. According to paragraph 1,
The optical substrate includes a first cover and a second cover forming a space spaced apart within the optical substrate,
The sealed space includes a spaced space between the first cover and the second cover,
The sensor is arranged to measure the state of the spaced space,
Beam projector module. According to paragraph 1,
The optical substrate includes an air gap having a pressure different from that of the sealed space,
A beam projector module further comprising an air gap sensor that measures the state of the air gap. According to clause 9,
When a crack occurs, the processor compares the measured values of the sensor and the air gap sensor to specify the location of the crack,
The processor operates the light source in an eye-safety mode when the crack occurrence location is determined to be a crack in the optical device. According to paragraph 1,
The sealed space is filled with a specific gas,
The sensor is a concentration sensor that senses the concentration of the specific gas,
The processor is a beam projector module that operates the light source in an eye-safety mode when the measured value of the concentration sensor is lower than the reference concentration. delete According to paragraph 1,
The processor operates the light source in an eye-safety mode according to the measured value of the sensor,
In the eye protection mode, the light output from the light source has a wavelength in the eye protection free band. According to clause 13,
The light source includes a first sub light source and a second sub light source,
The beam projector module wherein the processor outputs light using the first sub light source in the normal mode and outputs light using the second sub light source in the eye protection mode. According to paragraph 1,
The optical substrate includes a first cover and a second cover,
The first cover is hermetic sealed to the frame through a metal material formed on the outside, the optical device is attached to the second cover, and the optical device is disposed between the first cover and the second cover. A beam projector module in which a second cover is attached to the first cover. According to clause 15,
A beam projector module in which a pillar is formed on the outside of the second cover to be higher than the optical device, and the second cover is attached to the first cover through an adhesive applied to the outside. According to clause 15,
A beam projector module in which a side fill is filled between the sides of the first cover and the second cover and the frame. In the method of manufacturing a beam projector module,
Preparing a substrate to which a light source is attached;
attaching a frame to the substrate;
Forming a metal material on the outside of the first cover;
Compressing the portion where the metal material is formed to the frame;
forming an optical device inward from the pillar in a second cover having a pillar formed on the outside;
attaching the second cover to the first cover using an adhesive so that the optical device is disposed between the first cover and the second cover; and
Filling the side fill between the sides of the first cover and the second cover and the frame
A beam projector module manufacturing method comprising.