KR102602431B1 - Apparatus for detecting nano particle having monitoring pd and method using same - Google Patents

Abstract

A nanoparticle detection device equipped with a monitoring PD according to the present invention and a nanoparticle detection method using the same include a chamber casing supporting a heterogeneous chamber in which a part of a circular mirror and a part of an elliptical mirror are coupled to each other; an air inlet/outlet unit coupled to the chamber casing and injecting air into the first focus of the elliptical mirror; a light source unit connected to one side of the chamber casing and transmitting an input light source to the heterogeneous chamber; a light receiving unit coupled to an upper portion of the chamber casing and including a light receiving element disposed at a second focus of the heterogeneous chamber to detect scattered light scattered from the heterogeneous chamber; a recovery dump unit provided on the opposite side of the light source unit with the heterogeneous chamber in between, and including a monitoring PD (photo diode) that detects the amount of light according to the concentration of nanoparticles in the air; And it may include an MCU that controls the air input and output portion according to the sensing signal of the monitoring PD.
The nanoparticle detection device equipped with monitoring PD and the nanoparticle detection method using the same according to the present invention can precisely measure nanoparticles and monitor pollution levels in real time, and in particular, respond to changes in the concentration of nanoparticles in the air by By controlling the amount of air entering the inlet and outlet, overlap between particles can be prevented, improving detection accuracy and securing detection yield.

Description

Nanoparticle detection device equipped with monitoring PD and nanoparticle detection method using the same {APPARATUS FOR DETECTING NANO PARTICLE HAVING MONITORING PD AND METHOD USING SAME}

The present invention relates to a nanoparticle detection device equipped with a monitoring PD and a nanoparticle detection method using the same. More specifically, a monitoring PD in which the detection yield can be improved by adjusting the air input according to the concentration of nanoparticles in the atmosphere. It relates to a nanoparticle detection device equipped with a nanoparticle detection method using the same.

As industry develops, the environment is polluted, and numerous particulate matter (PM, particulate matter, such as fine dust) emitted from various pollutants such as vehicles and industrial facilities are threatening human health, and the severity is increasing. What is is reality

In particular, fine dust refers to dust of particles so fine that they are invisible to the eye, with a diameter of 10㎛ or less. Depending on the size, it is classified into PM10 fine dust, PM2.5 ultrafine dust, and PM1.0 ultrafine dust. do.

Among them, PM2.5 includes dust with a diameter of 2.5㎛ or less, and PM1.0 includes dust with a diameter of 1.0㎛ or less. In the case of ultrafine dust and ultrafine dust (hereinafter referred to as nanoparticles), the penetration rate into the human body, such as alveoli and blood vessels, is enormous. It is becoming a serious problem.

Accordingly, there is an urgent need to develop a device that can monitor pollution levels in real time by precisely measuring nanoparticles in indoor or outdoor air quality.

However, although various air quality monitoring devices are currently being developed, most devices have a fixed preset air intake amount, so when the concentration of nanoparticles in the air changes to a high concentration, the detection accuracy is lowered and the detection yield is lowered due to overlap between particles. there is.

The present invention was proposed to solve the above problems. It can monitor pollution levels in real time by precisely measuring nanoparticles, and in particular, adjusts the amount of air inlet and outlet in response to changes in the concentration of nanoparticles in the air. By doing so, we provide a nanoparticle detection device equipped with a monitoring PD that can improve detection accuracy and secure detection yield by preventing overlap between particles, and a nanoparticle detection method using the same.

The nanoparticle detection device according to the present invention for achieving the above object includes a chamber casing supporting a heterogeneous chamber in which a part of the circular mirror and a part of the elliptical mirror are coupled to each other; an air inlet/outlet unit coupled to the chamber casing and injecting air into the first focus of the elliptical mirror; a light source unit connected to one side of the chamber casing and transmitting an input light source to the heterogeneous chamber; a light receiving unit coupled to an upper portion of the chamber casing and including a light receiving element disposed at a second focus of the heterogeneous chamber to detect scattered light scattered from the heterogeneous chamber; a recovery dump unit provided on the opposite side of the light source unit with the heterogeneous chamber in between, and including a monitoring PD (photo diode) that detects the amount of light according to the concentration of nanoparticles in the air; And it may include an MCU that controls the air input/output unit according to the sensing signal of the monitoring PD.

The MCU may adjust the air flow rate introduced into the heterogeneous chamber when the output voltage value of the monitoring PD is below or above a preset reference voltage value.

The recovery dump unit further includes a conical dump member, and the monitoring PD may be arranged to be accommodated within the conical dump member.

The light source unit includes an element; First and second light transmitting lenses; And it may include a light transmission filter interposed between the first light transmission lens and the second light transmission lens.

The input light source of the light source unit is a UV light source, and the wavelength band of the input light source may be a short wavelength of 275 nm to 850 nm.

The light source unit may be either a Laser Diode or an LED.

The nanoparticle detection method according to the present invention to achieve the above object is coupled to a chamber casing that supports a heterogeneous chamber in which a part of the circular mirror and a part of the elliptical mirror are coupled to each other, and directs air in the air to the first focus of the elliptical mirror. A step of introducing air through an air inlet/outlet unit; It is connected to one side of the chamber casing to transmit an input light source to the heterogeneous chamber, and the amount of light according to the concentration of nanoparticles in the air by a monitoring PD (photo diode) provided on the opposite side of the light source unit with the heterogeneous chamber in between. detecting; And when the output voltage value of the monitoring PD is less than/above a preset reference voltage value, the MCU may include controlling the air input/output unit.

The controlling step may be a step in which the MCU adjusts the air flow rate introduced into the heterogeneous chamber.

The nanoparticle detection device equipped with monitoring PD according to the present invention and the nanoparticle detection method using the same can monitor pollution levels in real time by precisely measuring nanoparticles, and in particular, respond to changes in the concentration of nanoparticles in the air by By controlling the amount of air entering the inlet and outlet, overlap between particles can be prevented, improving detection accuracy and securing detection yield.

Figure 1 is a perspective view of a nanoparticle detection device according to an embodiment of the present invention.
Figure 2 is a schematic conceptual diagram of a nanoparticle detection device and monitoring PD according to an embodiment of the present invention.
Figure 3 is a diagram schematically showing the circular diameter and elliptical mirror of the heterogeneous chamber in Figure 2.
Figure 4 is a block diagram of a nanoparticle detection device according to an embodiment of the present invention.
Figure 5 is a diagram showing an example of air flow rate control of the nanoparticle detection device according to an embodiment of the present invention.
Figures 6 and 7 are flow charts of a detection method using a nanoparticle detection device according to an embodiment of the present invention.

Hereinafter, an embodiment of a nanoparticle detection device equipped with a monitoring PD according to the present invention and a nanoparticle detection method using the same will be described in detail with reference to the attached drawings. The same reference numerals in each drawing indicate the same member.

Figure 1 is a perspective view of a nanoparticle detection device according to an embodiment of the present invention.

Figure 2 is a schematic conceptual diagram of a nanoparticle detection device and monitoring PD according to an embodiment of the present invention.

Figure 3 is a diagram schematically showing the circular diameter and elliptical mirror of the heterogeneous chamber in Figure 2.

Figure 4 is a block diagram of a nanoparticle detection device according to an embodiment of the present invention.

Figure 5 is a diagram showing an example of air flow rate control of the nanoparticle detection device according to an embodiment of the present invention.

Referring to Figures 1 to 4, the nanoparticle detection device equipped with a monitoring PD according to an embodiment of the present invention includes a heterogeneous chamber 210 in which a part of the circular mirror 7 and a part of the elliptical mirror 6 are coupled to each other. Supporting chamber casing 200; An air input/output unit 150 coupled to the chamber casing 200 and injecting air into the first focus 12 of the elliptical mirror 6; a light source unit 100 connected to one side of the chamber casing 200 and transmitting an input light source to the heterogeneous chamber 210; and a light receiving element (1) coupled to the upper part of the chamber casing (200) and disposed at the second focus of the heterogeneous chamber (210) to detect scattered light scattered from the heterogeneous chamber (210). 300); a recovery dump unit provided on the opposite side of the light source unit with the heterogeneous chamber in between, and including a monitoring PD (photo diode) that detects the amount of light according to the concentration of nanoparticles in the air; And it may include an MCU that controls the air input/output unit according to the sensing signal of the monitoring PD.

The heterogeneous chamber 210 may be mainly provided inside the chamber casing 200 as shown in FIGS. 1 and 2.

Referring mainly to FIGS. 2 and 3, the heterogeneous chamber 210 may be configured by combining a portion of the circular mirror 7 and a portion of the elliptical mirror 6. That is, the right part of the heterogeneous chamber 210 can be provided with an ellipsoid mirror 6, which is an ellipse with two foci F1 and F2, so that the input light source incident from the light source unit 100 is substantially the ellipsoid mirror 6. ) may converge to the first focus (12, F1).

In addition, the left portion of the heterogeneous chamber 210 is provided with a circular mirror 7, and the elliptical mirror 6 and the circular mirror 7 may be configured to be coupled to each other. Here, the center of the circular mirror 7 may be the first focus 12 of the elliptical mirror 6.

Accordingly, the nanoparticles in the air are drawn into the first focus 12, which is the optical focus, and collide with the input light source irradiated to the first focus 12 to be scattered and refracted, and the scattered and refracted light source is directed to the garden mirror 7. The light can be condensed back into the elliptical mirror (6) and emitted toward the second focus (F2) of the elliptical mirror (6) through the opening of the circular mirror (7).

The air inlet/outlet unit 150 is coupled to the chamber casing 200 as shown in FIG. 1, and air in the air can be introduced into the chamber casing 200 through the air inlet/outlet unit 150.

The light source unit 100 may be connected to one side of the chamber casing 200. Referring mainly to FIG. 2, the light source unit 100 includes an optical element 1; A first light transmitting lens (2) disposed adjacent to the optical element (1); Second light transmitting lens (4); And it may include a light transmission filter (3) interposed between the first light transmission lens (2) and the second light transmission lens (4).

The optical device 1 may transmit an input light source to the heterogeneous chamber 210. The optical element 1 of the light source unit 100 may have a short wavelength range of 275 nm to 430 nm.

This optical device 1 may be either a Laser Diode or an LED.

A first light transmission lens 2 may be provided adjacent to the optical element 1. The first light transmitting lens 2 serves to converge the light source emitted from the optical element 1.

The numerical aperture (NA) of the first light transmission lens 2 in this embodiment may be 0.15 to 0.25.

And the second light transmission lens 4 may be provided in succession to the first light transmission lens 2. The second light transmission lens 4 serves to converge the light source that has passed through the first light transmission lens 2 to the first focus 12 in the heterogeneous chamber 210. In this embodiment, the second light transmission lens 4 is also preferably provided with substantially the same numerical aperture (0.15 to 0.25) as the first light transmission lens 2.

The light transmission filter 3 may be interposed between the first light transmission lens 2 and the second light transmission lens 4.

Through this configuration, the input light source from the optical element 1 can be condensed to the first focus F1 and 12 of the heterogeneous chamber 210.

The light receiving unit 300 is a part that detects the number of nanoparticles by receiving scattered light from the nanoparticles. For this purpose, the light receiving unit 300 includes a light receiving gate 8 connected to the heterogeneous chamber 210, a light receiving apeture 9, a light receiving element 1 disposed at the second focus of the heterogeneous chamber 210, and a light receiving element 1. It may include a light receiving PCB board (11) coupled to the device (1).

Here, the light receiving element 1 may be placed at the position of the second focus of the ellipsoid 6 within the heterogeneous chamber 210. Accordingly, the device can be simplified by eliminating the need for a separate condensing lens or condensing configuration.

Additionally, by concentrating scattered light on the light receiving unit 300 without additional device configuration, light loss can be minimized and detection yield can be improved.

In this way, the size of the light receiving unit 300 can be dramatically reduced, so the equipment size can be compact, and the scattered light can be collected directly, resulting in excellent detection accuracy.

Meanwhile, the nanoparticle detection device equipped with the monitoring PD may further include a recovery dump unit 14 provided on the opposite side of the light source unit 100 with the heterogeneous chamber 210 in between.

The recovery dump unit 14 is a part that recovers the light source that is diffusely reflected and transmitted without passing the first focus among the main rays incident on the heterogeneous chamber 210.

That is, the recovery dump unit 14 serves to stop the light sources that did not collide with the particles of the measurement sample among the input light sources incident on the heterogeneous chamber 210, thereby preventing ambient light other than scattered light from being transmitted within the heterogeneous chamber 210. Inflow into the second focus can be minimized.

The recovery dump unit 14 may include a conical dump member 13, and the dump member 13 may be arranged so that its apex faces the path of the emitted light, so that the light hitting the conical member 13 is directly Reflections can be prevented. Additionally, a member that absorbs light, such as a sponge, may be disposed on the inner wall of the recovery dump unit 14, and may be implemented in a concavo-convex structure.

Meanwhile, in most conventional devices, the preset air intake amount is fixed, so when the concentration of nanoparticles in the air changes to a high concentration, the particles are explosively drawn into the device, causing a problem that detection accuracy is lowered and detection yield is lowered due to overlap between particles. there was.

Accordingly, in this embodiment, a monitoring PD (400, photo diode) may be provided. In addition, the monitoring PD may be provided to be accommodated within the conical dump member 13.

To explain in detail how the monitoring PD (400) operates, the amount of light exposed to the Monitoring PD (400) decreases depending on the concentration of nanoparticles in the air, and as the particle concentration of the incoming air increases, the Monitoring PD ( 400) has a structure in which the output voltage value gradually decreases.

Additionally, an MCU that adjusts air input depending on the concentration of nanoparticles can be provided.

Referring mainly to FIG. 4, the MCU may reduce the air flow rate introduced into the heterogeneous chamber 210 when the output voltage value of the monitoring PD 400 is below a preset reference voltage value.

5, VPD refers to the output voltage value of the monitoring PD 400, V0 refers to the initial voltage value in the steady state, and V1, V2, and V3 refer to the voltage values when the concentration of particles increases, respectively. .

And A(0) refers to 100% of the maximum air flow rate introduced by the air inlet/outlet unit 150, A(1) refers to 50% of the air flow rate, and A(2) refers to 25% of the air flow rate.

For example, when the V2 voltage value is detected at time t12, the MCU controls the air input/output unit 150 to reduce the incoming air flow rate by half (A(1)).

Additionally, when the V2 voltage value is re-detected at time t13, the MCU controls the air input/output unit 150 to reduce the incoming air flow rate by half from the existing A(1) (A(2)).

On the other hand, the MCU may increase the air flow rate introduced into the heterogeneous chamber 210 when the output voltage value of the monitoring PD is higher than a preset reference voltage value.

For example, when the V1 voltage value is detected at time t14, the MCU controls the air input/output unit 150 to increase the incoming air flow rate to the maximum air inlet amount (A(0)).

With this configuration of monitoring PD and MCU, it is possible to precisely measure nanoparticles and monitor pollution levels in real time. In particular, by adjusting the air intake amount of the air inlet/outlet unit 150 in response to changes in the concentration of nanoparticles in the air. By preventing overlap between particles, detection accuracy can be improved and detection yield can be secured.

In addition, contamination levels can be monitored in real time by precisely measuring nanoparticles, and in particular, the size of the light receiving unit 300 can be dramatically reduced by placing the light receiving element 1 at the second focus position of the ellipsoid 6. The equipment size can be compact, and the scattered light can be collected directly, resulting in excellent detection accuracy.

Figures 6 and 7 are flow charts of a detection method using a nanoparticle detection device according to an embodiment of the present invention.

Hereinafter, the nanoparticle detection method according to this embodiment will be described in detail with reference to FIGS. 1 to 7.

First, as shown in FIG. 6, a part of the circular mirror 7 and a part of the elliptical mirror 6 are coupled to the chamber casing 200 that supports the heterogeneous chamber 210 in which the circular mirror 7 and the elliptical mirror 6 are coupled to each other, thereby allowing air in the air to flow into the elliptical mirror. The step of introducing air into the first focus 12 of the mirror 6 through the air input/output unit 150 is performed (S100).

Air is introduced into the heterogeneous chamber 210 through the air inlet/outlet unit 150. At this time, the air flow may be arranged to pass through the first focus point 12 (F1).

Next, a step of transmitting an input light source to the heterogeneous chamber and detecting the amount of light according to the concentration of nanoparticles in the air by a monitoring PD (photo diode) may be performed (S200).

First, an input light source is irradiated through the light source unit 100.

Then, the scattered light scattered through the elliptical mirror 6 and the circular mirror 7 of the heterogeneous chamber 210 is directed to the second focus.

Next, the light receiving element 1 disposed at the second focus can easily detect nanoparticles by detecting scattered light, and the detection resolution is capable of detecting nanoparticles of 100 nm level.

Meanwhile, the MCU checks the concentration of nanoparticles in the air in real time. In other words, the amount of light exposed to the Monitoring PD (400) decreases depending on the concentration of nanoparticles in the air, and as the particle concentration of the incoming air increases, the output voltage value of the Monitoring PD (400) gradually decreases.

That is, if the output voltage value of the monitoring PD is less than/or more than a preset reference voltage value, the step of controlling the air input/output unit 150 by the MCU may be performed (S300).

Here, the controlling step may be a step in which the MCU adjusts the air flow rate introduced into the heterogeneous chamber 210.

Referring mainly to FIG. 7, it is determined whether the VPD value is greater than V1 and V2 (S310, S320). If the VPD value is greater than V1 and V2, the air flow rate (A(0)) of the air inlet/outlet unit 150 is maintained (S360).

If the VPD value is less than V2, that is, when the V2 voltage value is detected, the MCU controls the air input/output unit 150 to reduce the incoming air flow rate by half (A(1)) (S330).

Next, determine whether the VPD value is the minimum inflow amount (Liter per Minute) (S340). If not, an operation to detect nanoparticles is performed (S350).

Again, when the V2 voltage value is re-detected at any time (in the case of NO in S320), the MCU controls the air input and output unit 150 to reduce the incoming air flow rate by half from the existing A (1) (A ( 2)). On the other hand, when the V1 voltage value is re-detected at any time, it is increased to the air flow rate (A(0)) of the air input/output unit 150 (S360).

Following these steps, it is possible to precisely measure nanoparticles and monitor pollution levels in real time. In particular, the air inlet and flow rate of the air inlet/outlet unit 150 are adjusted in response to changes in the concentration of nanoparticles in the air, thereby creating an overlap phenomenon between particles. By preventing this, detection accuracy can be improved and detection yield can be secured.

In addition, the device can be simplified by eliminating the need for a separate condenser lens or light-concentrating configuration, and by concentrating scattered light on the light receiving unit 300 without additional device configuration, light loss can be minimized and detection yield can be improved.

Above, the present invention has been described in detail using preferred embodiments, but the scope of the present invention is not limited to the specific embodiments and should be interpreted in accordance with the appended claims. Additionally, those skilled in the art should understand that many modifications and variations are possible without departing from the scope of the present invention.

100: light source unit 1: optical element
2: First light transmitting lens 3: Light transmitting filter
4: Second light transmission lens
150: Air inlet/outlet 200: Chamber casing
6: Elliptical mirror 7: Garden mirror
12: optical focus, first focus
300: light receiving unit 8: light receiving gate
9: Light collecting aperture 10: Light receiving element
11: Light receiving pcb board
13: Recovery dump unit
400: Monitoring PD

Claims (8)

A chamber casing that supports a heterogeneous chamber in which a part of the circular mirror and a part of the elliptical mirror are coupled to each other;
an air inlet/outlet unit coupled to the chamber casing and injecting atmospheric air into the first focus of the ellipsoid;
a light source unit connected to one side of the chamber casing and transmitting an input light source to the heterogeneous chamber;
a light receiving unit coupled to an upper portion of the chamber casing and including a light receiving element disposed at a second focus of the heterogeneous chamber to detect scattered light scattered from the heterogeneous chamber;
a recovery dump unit provided on the opposite side of the light source unit with the heterogeneous chamber in between, and including a monitoring PD (photo diode) that detects the amount of light according to the concentration of nanoparticles in the air; and
Nanoparticle detection device comprising an MCU that controls the air input and output according to the sensing signal of the monitoring PD. According to paragraph 1,
The MCU is a nanoparticle detection device characterized in that it adjusts the air flow rate introduced into the heterogeneous chamber when the output voltage value of the monitoring PD is below or above a preset reference voltage value. According to paragraph 1,
The recovery dump unit further includes a conical dump member,
The monitoring PD is a nanoparticle detection device, characterized in that it is provided to be accommodated in the conical dump member. According to paragraph 1,
The light source unit,
optical device;
First and second light transmitting lenses; and
Nanoparticle detection device comprising a light transmission filter interposed between the first light transmission lens and the second light transmission lens. According to paragraph 1,
The input light source of the light source unit is a UV light source,
A nanoparticle detection device, characterized in that the wavelength band of the input light source is a short wavelength of 275 nm to 430 nm. According to paragraph 1,
A nanoparticle detection device wherein the light source unit is either a Laser Diode or an LED. A step of injecting air through an air inlet/outlet unit that is coupled to a chamber casing supporting a heterogeneous chamber in which a part of the circular mirror and a part of the elliptical mirror are coupled to each other and injects air in the atmosphere into the first focus of the elliptical mirror;
It is connected to one side of the chamber casing to transmit an input light source to the heterogeneous chamber, and the amount of light is adjusted according to the concentration of nanoparticles in the air by a monitoring PD (photo diode) provided on the opposite side of the light source unit with the heterogeneous chamber in between. detecting;
Nanoparticle detection method comprising the step of controlling the air input/output unit by an MCU when the output voltage value of the monitoring PD is less than or equal to a preset reference voltage value. In clause 7,
The controlling step is a nanoparticle detection method characterized in that the MCU adjusts the air flow rate introduced into the heterogeneous chamber.