KR102575114B1 - 구조화된 광 시스템에서의 심도 맵 생성 - Google Patents

구조화된 광 시스템에서의 심도 맵 생성 Download PDF

Info

Publication number
KR102575114B1
KR102575114B1 KR1020187018320A KR20187018320A KR102575114B1 KR 102575114 B1 KR102575114 B1 KR 102575114B1 KR 1020187018320 A KR1020187018320 A KR 1020187018320A KR 20187018320 A KR20187018320 A KR 20187018320A KR 102575114 B1 KR102575114 B1 KR 102575114B1
Authority
KR
South Korea
Prior art keywords
optical
receiver
transmitter
structured light
optical receiver
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020187018320A
Other languages
English (en)
Korean (ko)
Other versions
KR20180100121A (ko
Inventor
제임스 윌슨 내쉬
칼린 미트코브 아타나소브
Original Assignee
퀄컴 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 퀄컴 인코포레이티드 filed Critical 퀄컴 인코포레이티드
Publication of KR20180100121A publication Critical patent/KR20180100121A/ko
Application granted granted Critical
Publication of KR102575114B1 publication Critical patent/KR102575114B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20—Image signal generators
    • H04N13/271—Image signal generators wherein the generated image signals comprise depth maps or disparity maps
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20—Image signal generators
    • H04N13/204—Image signal generators using stereoscopic image cameras
    • H04N13/254—Image signal generators using stereoscopic image cameras in combination with electromagnetic radiation sources for illuminating objects
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N2013/0074—Stereoscopic image analysis
    • H04N2013/0081—Depth or disparity estimation from stereoscopic image signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Electromagnetism (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Communication System (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
KR1020187018320A 2016-01-04 2016-10-31 구조화된 광 시스템에서의 심도 맵 생성 Active KR102575114B1 (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201662274600P 2016-01-04 2016-01-04
US62/274,600 2016-01-04
US15/147,736 US11057608B2 (en) 2016-01-04 2016-05-05 Depth map generation in structured light system
US15/147,736 2016-05-05
PCT/US2016/059703 WO2017119941A1 (en) 2016-01-04 2016-10-31 Depth map generation in structured light system

Publications (2)

Publication Number Publication Date
KR20180100121A KR20180100121A (ko) 2018-09-07
KR102575114B1 true KR102575114B1 (ko) 2023-09-05

Family

ID=59227332

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020187018320A Active KR102575114B1 (ko) 2016-01-04 2016-10-31 구조화된 광 시스템에서의 심도 맵 생성

Country Status (9)

Country Link
US (1) US11057608B2 (enExample)
EP (1) EP3400414B1 (enExample)
JP (1) JP6824990B2 (enExample)
KR (1) KR102575114B1 (enExample)
CN (1) CN108474652B (enExample)
BR (1) BR112018013552A2 (enExample)
CA (1) CA3006583A1 (enExample)
TW (1) TWI732796B (enExample)
WO (1) WO2017119941A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10909373B1 (en) * 2018-08-24 2021-02-02 Snap Inc. Augmented reality system using structured light
CN109470166B (zh) * 2018-11-09 2020-12-08 业成科技（成都）有限公司 结构光深度感测器及感测方法
CN109974611B (zh) * 2019-03-23 2023-07-21 柳州阜民科技有限公司 深度检测系统及其支架和电子装置
EP4348587A1 (en) * 2021-06-02 2024-04-10 Dolby Laboratories Licensing Corporation Method, encoder, and display device for representing a three-dimensional scene and depth-plane data thereof
CN115616003B (zh) * 2022-10-17 2024-06-11 四川长虹电器股份有限公司 菲涅尔光学膜片检查设备及其检查方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070023716A1 (en) 2005-07-26 2007-02-01 Icos Vision Systems N.V. Apparatus for three dimensional measuring on an electronic component
JP2010538269A (ja) 2007-08-28 2010-12-09 アーテック・グループ・インコーポレーテッド 有形物の形状の３次元測定のためのシステム及び方法
JP2011128117A (ja) * 2009-12-21 2011-06-30 Canon Inc 情報処理装置、情報処理方法及びプログラム
US20130329942A1 (en) 2012-06-11 2013-12-12 Canon Kabushiki Kaisha Information processing apparatus, information processing method, and a computer-readable storage medium

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6389144A (ja) * 1986-09-30 1988-04-20 株式会社東芝 擬似３次元表示装置
JPH05145496A (ja) 1991-11-15 1993-06-11 Canon Inc 双方向光伝送装置
US6700669B1 (en) 2000-01-28 2004-03-02 Zheng J. Geng Method and system for three-dimensional imaging using light pattern having multiple sub-patterns
US20030001960A9 (en) 2000-04-24 2003-01-02 Olympus Optical Co., Ltd. Electronic camera
DE10049382A1 (de) 2000-10-05 2002-04-25 Microsystems Gmbh Optoelektronische Messanordnung zur Messung der Randparameter von Brillengläsern
DE10214817B4 (de) 2002-03-28 2004-12-23 Göpel electronic GmbH Anordnung zur Höhenmessung des Lotpastenauftrages
KR101331543B1 (ko) 2006-03-14 2013-11-20 프라임센스 엘티디. 스페클 패턴을 이용한 3차원 센싱
CN101403606B (zh) 2008-10-20 2011-05-18 中国海洋大学 基于线结构光的大视场两轴测量装置
CN101697233B (zh) 2009-10-16 2012-06-06 长春理工大学 一种基于结构光的三维物体表面重建方法
CN102687050B (zh) 2010-01-06 2015-09-02 株式会社藤仓 光耦合结构以及光收发模块
CN201828247U (zh) 2010-05-24 2011-05-11 天津工业大学 一种激光再制造零件三维形貌在线检测装置
CN102760234B (zh) 2011-04-14 2014-08-20 财团法人工业技术研究院 深度图像采集装置、系统及其方法
JP5986364B2 (ja) 2011-10-17 2016-09-06 キヤノン株式会社 三次元形状計測装置、三次元形状計測装置の制御方法、およびプログラム
US8886449B2 (en) * 2012-01-13 2014-11-11 Qualcomm Incorporated Calibrated hardware sensors for estimating real-world distances
US9696146B2 (en) 2012-03-30 2017-07-04 Nikon Metrology Nv Optical scanning probe
US9188433B2 (en) 2012-05-24 2015-11-17 Qualcomm Incorporated Code in affine-invariant spatial mask
US20140043610A1 (en) * 2012-08-07 2014-02-13 Carl Zeiss Industrielle Messtechnik Gmbh Apparatus for inspecting a measurement object with triangulation sensor
CN102999910B (zh) 2012-11-27 2015-07-22 宁波盈芯信息科技有限公司 一种图像深度计算方法
US20140152769A1 (en) 2012-12-05 2014-06-05 Paul Atwell Three-dimensional scanner and method of operation
CN105324688B (zh) 2013-06-17 2018-03-06 苹果公司 用于扫描引擎的模块化光学器件
EP3167311B1 (en) 2014-07-08 2019-11-13 Facebook Technologies, LLC Method and system for adjusting light pattern for structured light imaging
CN104165596B (zh) 2014-09-02 2017-01-25 南京中科神光科技有限公司 一种测定离焦量的方法及系统
JP6516453B2 (ja) 2014-11-26 2019-05-22 株式会社ミツトヨ 画像測定装置及び測定装置
CN104793784B (zh) 2015-03-23 2018-11-20 中国科学技术大学先进技术研究院 一种基于深度数据的模拟触摸操作系统及操作方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070023716A1 (en) 2005-07-26 2007-02-01 Icos Vision Systems N.V. Apparatus for three dimensional measuring on an electronic component
JP2010538269A (ja) 2007-08-28 2010-12-09 アーテック・グループ・インコーポレーテッド 有形物の形状の３次元測定のためのシステム及び方法
JP2011128117A (ja) * 2009-12-21 2011-06-30 Canon Inc 情報処理装置、情報処理方法及びプログラム
US20130329942A1 (en) 2012-06-11 2013-12-12 Canon Kabushiki Kaisha Information processing apparatus, information processing method, and a computer-readable storage medium

Also Published As

Publication number Publication date
TWI732796B (zh) 2021-07-11
US20170195656A1 (en) 2017-07-06
CN108474652B (zh) 2020-06-19
CA3006583A1 (en) 2017-07-13
TW201734956A (zh) 2017-10-01
JP2019500606A (ja) 2019-01-10
WO2017119941A1 (en) 2017-07-13
BR112018013552A2 (pt) 2018-12-04
JP6824990B2 (ja) 2021-02-03
KR20180100121A (ko) 2018-09-07
CN108474652A (zh) 2018-08-31
EP3400414B1 (en) 2023-03-29
US11057608B2 (en) 2021-07-06
EP3400414A1 (en) 2018-11-14

Similar Documents

Publication Publication Date Title
KR102575114B1 (ko) 구조화된 광 시스템에서의 심도 맵 생성
US10027950B2 (en) Calibration of a three-dimensional acquisition system
KR102194658B1 (ko) 비대칭 수차 보정 렌즈
JPWO2017138291A1 (ja) 距離画像取得装置及びその応用
CN108200416B (zh) 投影设备中投影图像的坐标映射方法、装置及投影设备
CN116629287A (zh) 一种条码解析方法及装置
CN114286068A (zh) 对焦方法、装置、存储介质以及投影设备
CN112995622A (zh) 投影控制方法、装置、终端及存储介质
CN112017133B (zh) 一种图像展示方法、装置及电子设备
US11924587B2 (en) Display method, projector, and projection system
US11010865B2 (en) Imaging method, imaging apparatus, and virtual reality device involves distortion
JP7423750B2 (ja) ３ｄライトフィールドディスプレイのクロストーク補償
KR20220085834A (ko) 전자 기기 및 포커싱 방법
US10922829B2 (en) Zero order light removal in active sensing systems
KR101580056B1 (ko) 영상 왜곡 보정 장치 및 그 방법
US20160217559A1 (en) Two-dimensional image processing based on third dimension data
WO2022016331A1 (en) Method of compensating tof depth map and electronic device
CN112835062A (zh) 水下测距方法、装置、设备及存储介质
CN104980684B (zh) 一种远程指示方法及控制设备
US20250193336A1 (en) Image projection device and method for operating the same
JP7582460B2 (ja) 撮影条件決定方法、撮影条件決定システム、撮影条件決定装置、及びプログラム
US8462157B2 (en) Computing the irradiance from a disk light source at a receiver point
KR20250089700A (ko) 영상 투사 장치 및 그 동작 방법
CN119963653A (zh) 相机参数的标定方法及相关设备
HK40015731A (en) Bar code analysis method and device

Legal Events

Date Code Title Description
E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

A201 Request for examination
PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

D13-X000 Search requested

St.27 status event code: A-1-2-D10-D13-srh-X000

D14-X000 Search report completed

St.27 status event code: A-1-2-D10-D14-srh-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

E601 Decision to refuse application
PE0601 Decision on rejection of patent

St.27 status event code: N-2-6-B10-B15-exm-PE0601

AMND Amendment
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PX0901 Re-examination

St.27 status event code: A-2-3-E10-E12-rex-PX0901

PX0701 Decision of registration after re-examination

St.27 status event code: A-3-4-F10-F13-rex-PX0701

X701 Decision to grant (after re-examination)
GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U12-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601