KR102563797B1 - Quality measuring device, measuring method thereof and recording medium thereof - Google Patents

Abstract

The present invention relates to a device quality inspection apparatus. In particular, the present invention relates to an apparatus for measuring parameters for automatically quality testing a device including multi-ports or multi-terminals, a measuring method, and a recording medium. The parameter measurement device for testing a device to be measured including a plurality of terminals according to the present invention includes a plurality of ports configured to be selectively connected to ports including first and second ports, and to first and second ports, respectively. Select two switches among the switch and the plurality of switches, control the plurality of switches to cross-connect the two switches to the first port and the second port, respectively, and send a test signal to the device under test through one of the two switches and a processor for controlling the first port to input , and measuring the S parameter based on the reflection signal and the response signal obtained through the port.

Description

Quality measuring device, measuring method thereof and recording medium thereof {Quality measuring device, measuring method thereof and recording medium thereof}

The present invention relates to a device quality inspection apparatus. In particular, the present invention relates to an apparatus for measuring parameters for automatically quality testing a device including multi-ports or multi-terminals, a measuring method, and a recording medium.

To analyze the characteristics of a frequency device such as an RF device, a device quality inspection device is often used. A device quality inspection apparatus obtains various test parameters of a device under test (DUT), namely a transfer function, reflection characteristics, and phase characteristics (hereinafter referred to as “scattering parameter S” or “S parameter”). The S-parameter is a well-known technique in the art and is determined by observing the frequency response (voltage and phase) of the device under test according to the response of the test signal from the device quality tester.

On the other hand, there are cases in which a DUT or a device under measurement, which is an object of S-parameter measurement, is formed to include not only two terminals (ports) but also three or more terminals. In order to measure the S-parameter of the device to be measured, time and labor for connecting and disconnecting the screw-type SMA port increases, and the damage rate of the cable increases due to connection and disconnection.

In particular, as the number of terminals increases, such as a device under test with more than 8 terminals such as 3-phase 4-wire, the number of times of changing the connection between the port and the terminal increases rapidly. For example, _N C for an N terminal device under test. ₂ disconnection and connection must be performed.

Japanese Unexamined Patent Publication No. 2000-329808 (November 30, 2000) US Patent Application Publication No. US2009/0102491 (2009.04.23.)

SUMMARY OF THE INVENTION The present invention has been made in accordance with the above-described needs, and an object of the present invention is to provide a measuring device, a measuring method, and a recording medium for measuring the quality of a multi-channel device to be measured with only one connection to a port.

Another object of the present invention is to provide a method for automatically measuring the quality of a device to be measured after connecting a port.

However, these tasks are illustrative, and the scope of the present invention is not limited thereby.

According to an embodiment of the present invention, an apparatus for measuring a parameter for testing a device to be measured including a plurality of terminals includes a port including a first port and a second port; selectively to the first port and the second port, respectively. A plurality of switches configured to be connected to; and selecting two switches from among the plurality of switches, controlling the plurality of switches to cross-connect the two switches to the first port and the second port, respectively, through one of the two switches. a processor for controlling the first port to input a test signal to a device under test, and measuring an S parameter based on a reflection signal and a response signal obtained through the port; can include

In addition, the processor controls the second port to input a test signal to the device under test through one of the two switches, and measures an S parameter based on a reflection signal and a response signal obtained through the port. can do.

Also, the number of the plurality of switches may be equal to the number of terminals of the device under test.

In addition, each of the plurality of switches is a single pole triple throw (SPTT), each of the plurality of switches may be selectively connected to an internal resistor including the first port, the second port, and a normalized impedance, and the processor may control the plurality of switches so that the remaining switches except for two switches among the plurality of switches are connected to the internal resistor.

Meanwhile, a method of measuring a parameter measuring device for testing a device under test including a plurality of terminals includes selecting two switches among a plurality of switches by a processor; cross-connecting, by the processor, the two switches to a first port and a second port of each port; inputting, by the processor, a test signal to the device under test through one of the two switches; and measuring, by the processor, an S parameter based on a reflection signal and a response signal obtained through the port. can include

Meanwhile, the recording medium according to an embodiment of the present invention may be a computer-readable recording medium on which a program for executing the parameter measuring method is recorded.

Other aspects, features, and advantages other than those described above will become clear from the detailed description, claims, and drawings for carrying out the invention below.

According to one embodiment of the present invention made as described above, the parameter measurement device can automatically sequentially measure S-parameters after connecting the port to the device to be measured through the switch unit.

Accordingly, there is an effect that time and cable damage can be saved in that it is not necessary to change the connection between the port of the parameter measurement device and the DUT port (or DUT terminal) several times.

Of course, the scope of the present invention is not limited by these effects.

1 is a system diagram for explaining a quality inspection system according to an embodiment of the present invention.
2 is a diagram for explaining an active EMI filter as a device under measurement.
3 is a block diagram for explaining the components of a parameter measuring device according to an embodiment of the present invention.
4 is a flowchart illustrating a switch selection method for measuring an S parameter according to an embodiment of the present invention.
5 to 7 are diagrams sequentially illustrating a method of operating a switch and a method of measuring parameters of a parameter measurement device according to an embodiment of the present invention.

Hereinafter, various embodiments of the present disclosure will be described in conjunction with the accompanying drawings. Various embodiments of the present disclosure may make various changes and have various embodiments, and specific embodiments are illustrated in the drawings and related detailed descriptions are described. However, this is not intended to limit the various embodiments of the present disclosure to specific embodiments, and should be understood to include all changes and/or equivalents or substitutes included in the spirit and technical scope of the various embodiments of the present disclosure. In connection with the description of the drawings, like reference numerals have been used for like elements.

In various embodiments of the present disclosure, “comprises.” or "to have." The terms such as are intended to specify that there is a feature, number, step, operation, component, part, or combination thereof described in the specification, but one or more other features or numbers, steps, operations, components, parts, or It should be understood that it does not preclude the possibility of existence or addition of combinations thereof.

In various embodiments of this disclosure, expressions such as “or” include any and all combinations of the words listed together. For example, "A or B" may include A, may include B, or may include both A and B.

Expressions such as "first", "second", "first", or "second" used in various embodiments of the present disclosure may modify various components of various embodiments, but do not limit the components. don't For example, the above expressions do not limit the order and/or importance of corresponding components, and may be used to distinguish one component from another.

When an element is referred to as being "connected" or "connected" to another element, the element may be directly connected or connected to the other element, but with the other element. It should be understood that other new components may exist between the other components.

In the embodiments of the present disclosure, terms such as “module,” “unit,” and “part” are terms used to refer to components that perform at least one function or operation, and these components are hardware or software. It may be implemented or implemented as a combination of hardware and software. In addition, a plurality of "modules", "units", "parts", etc. are integrated into at least one module or chip, except for cases where each of them needs to be implemented with separate specific hardware, so that at least one processor can be implemented as

Terms such as those defined in commonly used dictionaries should be interpreted as having a meaning consistent with the meaning in the context of the related art, and unless explicitly defined in various embodiments of the present disclosure, ideal or excessively formal. not interpreted as meaning

Hereinafter, various embodiments of the present invention will be described in detail using the accompanying drawings.

1 is a system diagram for explaining a quality inspection system according to an embodiment of the present invention.

Referring to FIG. 1 , the quality inspection system of the present invention may include a quality inspection device or parameter measurement device 10 (hereinafter referred to as parameter measurement device) and a device to be measured 20 .

At this time, the parameter measurement device 10 is a component for acquiring test parameters, that is, transfer function, reflection characteristics, and phase characteristics (hereinafter referred to as “S parameters”). S-parameters are a well-known technique in the art and are determined by observing the frequency response (voltage and phase) of the device under test according to the response of the test signal from the network analyzer.

In particular, the parameter measuring device 10 of the present invention can automatically measure the S-parameter with only one connection to a multi-channel DUT (Device Under Test) or the device under test 20.

A device under test (DUT) or a device under test 20 may be a device to be measured for S-parameters (or scattering coefficients). According to an embodiment, the device under test 20 may be an EMI filter (in particular, an active EMI filter). In this case, the active EMI filter may be an active current compensation device that reduces common mode (CM) noise.

Specifically, the active EMI filter may be a current compensation device that actively compensates for a first current input in a common mode to each of at least two high current paths connected to the first device. The active EMI filter includes a sensing unit generating an output signal corresponding to the first current by sensing a first current on at least two or more high current paths that transfer a second current supplied by a second device to the first device; A current comprising an amplification unit that amplifies a signal to generate an amplified output signal, a compensation unit that generates a compensation current based on the amplified output signal, and a compensation capacitor unit that provides a path through which the compensation current flows into at least two or more large current paths, respectively. It may be a compensating device. Details regarding this will be described with reference to FIG. 2 .

2 is a diagram for explaining an active EMI filter as a device under measurement.

The second device 2 may be various types of devices for supplying power to the first device 3 in the form of current and/or voltage. For example, the second device 2 may be a device that generates and supplies power or may be a device that supplies power generated by another device (eg, an electric vehicle charging device). Of course, the second device 2 may also be a device for supplying stored energy. However, this is illustrative and the spirit of the present invention is not limited thereto.

In this specification, the first device 3 may be various types of devices using the power supplied by the second device 2 described above. For example, the first device 3 may be a load driven by using power supplied by the second device 2 . In addition, the first device 3 may be a load (eg, an electric vehicle) that stores energy using power supplied by the second device 2 and is driven using the stored energy. However, this is illustrative and the spirit of the present invention is not limited thereto.

As described above, each of the two or more high current paths 111 and 112 may be a path for transferring the power supplied by the second device 2, that is, the second currents I21 and I22 to the first device 3. However, according to one embodiment, the second currents I21 and I22 may be alternating currents having a frequency of the second frequency band. In this case, the second frequency band may be, for example, a band having a range of 50 Hz to 60 Hz.

In addition, each of the two or more high current paths 111 and 112 may be a path through which at least a part of noise generated in the first device 3, that is, the first currents I11 and I12 is transmitted to the second device 2. At this time, the first currents I11 and I12 may be input in a common mode to each of the two or more high current paths 111 and 112 .

The first currents I11 and I12 may be currents unintentionally generated in the first device 3 for various reasons. For example, the first currents I11 and I12 may be noise currents generated by virtual capacitance between the first device 3 and the surrounding environment.

The first currents I11 and I12 may be currents having a frequency of the first frequency band. In this case, the first frequency band may have a higher frequency band than the aforementioned second frequency band, and may be, for example, a band having a range of 150 KHz to 30 MHz.

Meanwhile, the two or more high current paths 111 and 112 may include two paths, three paths, or four paths, as shown in FIG. 2 . The number of high current paths 111 and 112 may vary depending on the type and/or form of power used by the first device 3 and/or the second device 2 .

Meanwhile, the sensing unit 120 is electrically connected to the high current paths 111 and 112 to sense the first currents I11 and I12 on the two or more high current paths 111 and 112, and to generate the first currents I11 and I12. An output signal corresponding to can be generated. In other words, the sensing unit 120 may mean a means for sensing the first currents I11 and I12 on the high current paths 111 and 112 .

According to an embodiment, the sensing unit 120 may be implemented as a sensing transformer. In this case, the sensing transformer may be a means for sensing the first currents I11 and I12 on the high current paths 111 and 112 while being insulated from the high current paths 111 and 112 .

According to an embodiment, the sensing unit 120 may be differentially connected to an input terminal of the amplifying unit 130 . The amplifier 130 may be electrically connected to the sensing unit 120 to amplify an output signal output by the sensing unit 120 and generate an amplified output signal. In the present invention, 'amplification' by the amplifier 130 may mean adjusting the size and/or phase of an amplification target.

By the amplification of the amplification unit 130, the current compensation device 100 generates compensation currents IC1 and IC2 having the same magnitude as the first currents I11 and I12 and opposite phases to the large current paths 111 and 112 ) may compensate for the first currents I11 and I12.

The amplifier 130 may be implemented in various means. In one embodiment, the amplifier 130 may include an OP-AMP. In another embodiment, the amplifier 130 may include a plurality of passive elements such as resistors and capacitors in addition to the OP-AMP. In another embodiment, the amplifier 130 may include a bipolar junction transistor (BJT). In another embodiment, the amplifier 130 may include a plurality of passive elements such as resistors and capacitors in addition to the BJT. However, the above implementation method of the amplification unit 130 is exemplary and the spirit of the present invention is not limited thereto, and the means for 'amplification' described in the present invention can be used without limitation as the amplification unit 130 of the present invention. can

The amplification unit 130 receives power from the third device 4 that is distinct from the first device 3 and/or the second device 2 and amplifies the output signal output by the sensing unit to generate an amplified current. can In this case, the third device 4 may be a device that generates input power of the amplifying unit 130 by receiving power from a power source independent of the first device 3 and the second device 2 . Optionally, the third device 4 may be a device that generates input power of the amplifier 130 by receiving power from any one of the first device 3 and the second device 2 .

The compensation unit 140 may be electrically connected to the amplification unit 130 and generate a compensation current based on the output signal amplified by the amplification unit 130 described above.

The compensation unit 140 may be electrically connected to a path connecting an output terminal of the amplification unit 130 and a reference potential (reference potential 2) of the amplification unit 130 to generate a compensation current. The compensation unit 140 may be electrically connected to a path connecting the compensation capacitor unit 150 and the reference potential (reference potential 1) of the current compensation device 100 . The reference potential (reference potential 2) of the amplifier 130 and the reference potential (reference potential 1) of the current compensation device 100 may be distinct potentials.

The compensation capacitor unit 150 may provide a path through which the compensation current generated by the compensation unit 140 flows to each of two or more high current paths.

According to an embodiment, the compensation capacitor unit 150 may be implemented as a compensation capacitor unit 150 providing a path through which the current generated by the compensation unit 140 flows to two or more high current paths 111 and 112, respectively. there is. In this case, the compensation capacitor unit 150 may include at least two or more compensation capacitors connecting the reference potential (reference potential 1) of the active EMI filter 1 and the two or more high current paths 111 and 112, respectively.

The active EMI filter 1 configured as described above can detect current under a specific condition on two or more high current paths 111 and 112 and actively compensate for it, and despite the miniaturization of the active EMI filter 1, high current and high voltage and/or high power systems.

Meanwhile, the above-described active EMI filter is just one example of the device under measurement 20, and may refer to all types of devices including various analog circuits (or RF) that process signals using frequencies.

The device under test 20 may be formed of not only two terminals (ports) but also three or more terminals. In order to measure the S-parameter of the device under test 20, the parameter measuring device 10 having two ports may combine two intersections for three or more terminals and measure them. This will be described in detail later.

3 is a block diagram for explaining the components of a parameter measuring device according to an embodiment of the present invention.

Referring to FIG. 3 , the parameter measurement device 10 may include a signal generator 100 , a port 200 , a switch unit 300 and a processor 400 . At this time, the port 200 may include a first port P1 and a second port P2, and the switch unit 300 may include a first switch SW1 to an n-th switch SWn. .

The signal generator 100 is a component for generating a test signal whose frequency is linearly variable within a predetermined range in response to a control signal from the processor 400 .

The port 200 may be electrically connected to a terminal (or DUT port) of the device under test 20 through the switch unit 300 . As described above, the port 200 may include two input-output ports (test ports P1 and P2). The port 200 may be connected to the device under test 20 through a switch selected according to the control signal of the processor 400, and may supply the test signal generated by the signal generator 100 to the device under test 20. there is.

The switch unit 300 may include a first switch SW1 to an nth switch SWn. Each of the first switch SW1 to the nth switch SWn may be configured to selectively determine the first port P1 and the second port P2.

For example, each of the first switch (SW1) to the nth switch (SWn) may be a single pole double throw (SPDT) type switch such as EPX36MA8 or a single pole 3 throw (0SP3T) type switch such as TS5A3359DCUT However, this is only an example and can be implemented through various optional switches.

Each of the first switch SW1 to the nth switch SWn may include a switching circuit connecting a circuit with an external signal path or an internal resistor corresponding to each terminal. Each internal resistor in the switch may be set to the normalized characteristic impedance of the measurement device 10, which is typically 50 ohms.

The processor 400 may be a control unit for overall control of the parameter measurement device 10 . In particular, the processor 400 controls the overall operation of the parameter measurement device 10 using various programs stored in a memory (not shown).

Specifically, the processor 400 may control the switch unit 300 to select two terminals among a plurality of terminals of the device under measurement 20 .

The processor 400 may control the signal generator 100 to generate a test signal to be supplied to the device under test 20 through the selected two switches. The processor 400 may control the port 200 to supply the test signal generated by the signal generator 100 to the device under test 20 . Specifically, the processor 400 controls the plurality of switches to cross-connect the two switches to the first port and the second port, respectively, and transmits the device under test 20 through any one of the two switches. It is possible to control the first port (P1) to input a test signal to, and measure the S-parameter based on the reflection signal and the response signal obtained through the port.

The processor 400 controls the input port to transmit a sweep frequency signal (test signal) to the device under test 20, and the output port to receive a response output signal of the device under test 20. can control. At this time, the input port and the output port may be changed according to a sweep direction among the ports 200 .

Specifically, the processor 400 controls the second port P2 to input a test signal to the device under test 20 through one of the two switches, and obtains a test signal through the port 200. Based on the reflected signal and the response signal, the S-parameter can be measured.

That is, the processor 400 measures a reflection or response signal of the device under test 20 corresponding to the test signal input to the port 200, and obtains an S-parameter for the device under test 20 based on the measured reflection signal. can Specifically, the frequency-converted input signal and the reference signal may be converted into digital signals by an AD converter (not shown), and the digital signals are processed by a digital signal processor (DSP, 65), so that the processor 400 The S-parameter of the device under test 20 may be determined. The processor 400 may extract a Z parameter based on the obtained S parameter, and then calculate a circuit parameter.

The processor 400 may include a CPU, RAM, ROM, and a system bus. Here, the ROM is a configuration in which a command set for system booting is stored, and the CPU copies the operating system stored in the memory of the parameter measurement device 100 to the RAM according to the command stored in the ROM, and executes the O / S to boot the system let it When booting is completed, the CPU may copy various applications stored in a memory (not shown) to RAM and execute them to perform various operations. In the above, the processor 400 has been described as including only one CPU, but may be implemented with a plurality of CPUs (or DSPs, SoCs, etc.).

According to an embodiment of the present invention, the processor 400 may be implemented as a digital signal processor (DSP), a microprocessor, or a time controller (TCON) that processes digital signals. However, this It is not limited to, a central processing unit (CPU), a micro controller unit (MCU), a micro processing unit (MPU), a controller, an application processor (AP), or a communication processor ( communication processor (CP)), an ARM processor, or one or more of them, or may be defined in terms of the corresponding term. In addition, the processor 400 may include a system on chip (SoC) with a built-in processing algorithm, a large scale integration (LSI) ), or may be implemented in the form of a Field Programmable Gate Array (FPGA).

4 is a flowchart illustrating a switch selection method for measuring an S parameter according to an embodiment of the present invention.

The parameter measuring device 10 may select two switches to be connected to the port 200 among the switches 300 . In this case, the number of switches 300 may be the same as the number corresponding to the number of ports or terminals of the device under test 20 . For example, if the number of terminals of the device under test 20 is 4, the switch unit 300 may include switches SW1 to SW4, and if the number of terminals of the device under test 20 is n, the switch unit 300 may include switches. Unit 300 may include switches SW1 to SWn.

Meanwhile, the parameter measuring device 10 may select two switches SWi and SWj for connecting to the first port P1 and the second port P2, respectively, among the switches SW1 to SWn. The parameter measurement device 10 may set switch numbers (i, j) for connection to the port 200 to i=1 and j=2 (S400).

The parameter measurement device 10 may connect the selected SWi and SWj (eg, SW1 and SW2) to the port 200 (S410). For example, the parameter measuring device 10 may connect the first switch SWi to the input port P1 and connect the second switch SWj to the output port P2.

The parameter measurement device 10 may apply a test signal through the input port P1 to which the first switch SWi is connected (S420), and obtain the obtained signal through the output port P2 to which the second switch SWj is connected. Based on the response output signal, the S-parameter of the device under test 20 may be measured (S430).

Meanwhile, the parameter measurement device 10 may check whether the terminal corresponding to the second switch SWj is the final terminal that has not been measured among the plurality of terminals of the device under measurement 20 (j=n) (S440). .

If the terminal corresponding to the second switch SWj is not the final terminal (S440-N), the parameter measuring device 10 increases the terminal number of the device under test 20 corresponding to the second switch SWj ( j = j + 1) (S450). Thereafter, the parameter measuring device 10 may connect the selected SWi and SWj (eg, SW1 and SW3) with the port 200 (S410), and the terminal corresponding to the second switch SWj is the device under test ( S-parameter measurement is repeated until the final unmeasured terminal (j=n) among the plurality of terminals in 20) is reached.

Meanwhile, the parameter measuring device 10 may check whether the terminal corresponding to the first switch SWi is the final terminal that has not been measured among a plurality of terminals of the device under measurement 20 (i=n) (S460). .

If the terminal corresponding to the first switch SWi is not the final terminal (S460-N), the parameter measuring device 10 increases the terminal number of the device under test 20 corresponding to the first switch SWi ( i = i+1), and the terminal number of the device under test 20 corresponding to the second switch SWj can be changed (j = i+1) (S470). Thereafter, the parameter measurement device 10 may connect the selected SWi and SWj (eg, SW2 and SW3) with the port 200 (S410), and the terminal corresponding to the second switch SWj is the device under test ( S-parameter measurement may be repeated until the final unmeasured terminal (j=n) among the plurality of terminals of 20) is reached.

The parameter measurement device 10 may repeat the S parameter measurement until the terminal corresponding to the first switch SWi becomes the final unmeasured terminal (i=n) among the plurality of terminals of the device under measurement 20. there is.

5 to 7 are diagrams sequentially illustrating a method of operating a switch and a method of measuring parameters of a parameter measurement device according to an embodiment of the present invention.

5 to 7 show an embodiment in which the device under test 20 includes a total of six DUT ports or terminals T1 to T6. Each of the switches SW1 to SW6 of the switch unit 300 may correspond to the terminals T1 to T6 of the device under test 20, respectively.

Each of the switches SW1 to SW6 of the switch unit 300 of FIGS. 5 to 7 is implemented as a single pole three throw (SP3T) or single pole triple throw (SPTT) type switch. Specifically, each of the switches SW1 to SW6 may be an SP3T switch selectively connectable to an internal resistor including a first port P1, a second port P2, and normalized impedance corresponding to each terminal.

The parameter measurement device 10 may select two switches to be connected to the port 200 from among the switches SW1 to SW6. 5 shows that the first switch SW1 and the second switch SW2 are selected as two switches for connection with the port 200 .

In the embodiment of FIG. 5 , SW3 to SW6 excluding SW1 and SW2 may be connected to an internal resistor including a normalized impedance. Upon receiving the test signal from the first port P1 connected to the first switch SW1, the device under test 20 receives the S test signal based on the reflected signal corresponding to the test signal and the response signal output through the second port P2. Parameters S11 and S21 can be measured.

The parameter measuring device 10 may measure the S-parameter by changing the second switch from SW2 to SW6 while maintaining the first switch SW1. 6 is a diagram showing that the parameter measurement device 10 changes the second switch to SW6. Referring to FIG. 6 , the remaining switches SW2 to SW5 excluding the first switch SW1 and the second switch SW6 are connected to an internal resistor including a normalized impedance.

Referring to FIG. 7 , the parameter measurement device 10 measures the S parameter by changing the second switch from SW2 to SW6 while maintaining the first switch at SW1, and then changing the first switch from SW1 to SW2. show

The parameter measuring device 10 connects the first switch SW2 and the second switch SW3 to the port 200 to measure the S parameter, and then switches the second switch SW4 while maintaining the first switch SW2. to SW6, the S parameter can be measured.

According to the present invention, the parameter measuring device 10 can automatically sequentially measure the S parameters of the device under test 20 after connecting the port 200 to the switch unit 300 .

That is, the parameter measuring device 10 according to the present invention measures the S parameter of the device under measurement 20 including a plurality of terminals, between the port of the parameter measuring device 10 and the DUT port (or DUT terminal). This has the effect of saving time and cable damage by not having to change connections multiple times.

Meanwhile, the methods according to various embodiments of the present disclosure described above may be implemented in the form of an application that can be installed in an existing electronic device.

In addition, the methods according to various embodiments of the present disclosure described above may be implemented only by upgrading software or hardware of an existing electronic device.

In addition, various embodiments of the present invention described above may be performed through an embedded server included in the electronic device or an external server of the electronic device.

On the other hand, according to one embodiment of the present invention, the various embodiments described above use software, hardware, or a combination thereof to record a medium readable by a computer or similar device ( It may be implemented as software including instructions stored in a computer readable recording medium). In some cases, the embodiments described herein may be implemented in a processor itself. According to software implementation, embodiments such as procedures and functions described in this specification may be implemented as separate software modules. Each of the software modules may perform one or more functions and operations described herein.

On the other hand, a computer (computer) or a device similar thereto, as a device capable of calling a command stored in a storage medium and operating according to the called command, may include a device according to the disclosed embodiments. When the command is executed by a processor, the processor may perform a function corresponding to the command directly or by using other components under the control of the processor. An instruction may include code generated or executed by a compiler or interpreter.

The device-readable recording medium may be provided in the form of a non-transitory computer readable recording medium. Here, 'non-temporary' only means that the storage medium does not contain a signal and is tangible, but does not distinguish whether data is stored semi-permanently or temporarily in the storage medium. In this case, the non-transitory computer-readable medium is not a medium that stores data for a short moment, such as a register, cache, or memory, but a medium that stores data semi-permanently and is readable by a device. Specific examples of the non-transitory computer readable medium may include a CD, DVD, hard disk, Blu-ray disk, USB, memory card, ROM, and the like.

As such, the present invention has been described with reference to the embodiments shown in the drawings, but this is only exemplary, and those skilled in the art will understand that various modifications and equivalent other embodiments are possible therefrom. . Therefore, the true technical scope of protection of the present invention should be determined by the technical spirit of the appended claims.

10: Parameter measuring device
20: device under test
100: signal generator
200: port
300: switch unit
400: processor

Claims (9)

A parameter measuring device for testing a device to be measured including three or more terminals, comprising:
a signal generating unit generating a test signal;
A port consisting of only an input port and an output port;
a plurality of switches configured to correspond to the three or more terminals of the device under test on a one-to-one basis, to be connected to the three or more terminals on a one-to-one basis, and to be selectively connected to the input port and the output port, respectively; and
Selecting two switches among the plurality of switches, controlling the plurality of switches to cross-connect the two switches to the input port and the output port, respectively, and the device under test through one of the two switches a processor for controlling the input port to input the test signal to and measuring an S parameter based on a reflection signal and a response signal obtained through the port; Parameter measuring device comprising a. According to claim 1,
The processor controls the output port to input a test signal to the device under test through one of the two switches, and measures an S parameter based on a reflection signal and a response signal obtained through the port. Device. According to claim 1,
The number of the plurality of switches is equal to the number of terminals of the device under measurement. According to claim 1,
Each of the plurality of switches is a single pole triple throw (SPTT),
Each of the plurality of switches may be selectively connected to the input port, the output port, and an internal resistor including a normalized impedance,
The processor controls the plurality of switches such that the remaining switches except for two switches among the plurality of switches are connected to the internal resistor. A measuring method of a parameter measuring device for testing a device to be measured including n terminals (where n is a natural number of 3 or more), the method comprising:
selecting, by a processor, an ith switch and a jth switch (where i and j are natural numbers) among the plurality of switches;
cross-connecting, by the processor, the two switches to a first port and a second port of each port;
inputting, by the processor, a test signal to the device under test through one of the two switches;
measuring, by the processor, an S parameter based on a reflection signal and a response signal obtained through the port; and
confirming, by the processor, whether a terminal corresponding to a jth switch is a final unmeasured terminal among the n terminals of the device under test;
Including,
The port is composed of only the first port and the second port,
The plurality of switches correspond one-to-one to the n terminals of the device under test and are connected to the n terminals one-to-one. According to claim 5,
The method of measuring a parameter, wherein the frequency of the test signal is linearly varied within a predetermined range. According to claim 5,
increasing, by the processor, a terminal number of the device under test corresponding to the jth switch (j = j+1) when the terminal corresponding to the jth switch is not a final terminal; and
selecting, by the processor, an i-th switch and a j-th switch among a plurality of switches;
Further comprising a, parameter measurement method. According to claim 5,
After checking whether the terminal corresponding to the jth switch is the final terminal,
confirming, by the processor, whether a terminal corresponding to the i-th switch is a final unmeasured terminal among the n terminals of the device under test;
Further comprising a, parameter measurement method. According to claim 8,
When the terminal corresponding to the ith switch is not the final terminal, the processor increments the terminal number of the device under test corresponding to the ith switch (i = i+1), and changing the corresponding terminal number of the measured device (j=i+1); and
selecting, by the processor, an i-th switch and a j-th switch among a plurality of switches;
Further comprising a, parameter measurement method.