KR102532025B1 - HVDC power cable accelerated aging monitoring system - Google Patents

Abstract

The present invention relates to a system for monitoring the accelerated deterioration of an HVDC power cable, comprising: a cable fixing module formed by winding a cable deterioration part of a test cable around an insulating cylinder formed on the secondary side of an iron core and winding a primary-side coil around the primary side of the iron core; a direct-current high-voltage application module for applying electrical stress to the test cable; a thermal power supply part for generating induced current for applying thermal stress to the test cable; a first ground line connected to an insulator of the test cable to ground the same; a second ground line connected to an outer semiconductive layer of the test cable to ground the same; an amperemeter for measuring conduction current, which is formed on the second ground line to measure current; a control module for controlling the entire device; and an accelerated deterioration monitoring module for calculating and outputting conduction current by collecting, processing, and operating the information of the amperemeter for measuring conduction current and the direct-current high-voltage application module. According to the present invention, provided is a system for monitoring the accelerated deterioration of an HVDC power cable, wherein whether a cable has deteriorated is determined by measuring the conduction current of a test cable while allowing the test cable to deteriorate under specific conditions, thereby finding the production time of a test sample, and equipment costs and efforts are saved by simplifying equipment necessary for the production of the sample.

Description

HVDC power cable accelerated aging monitoring system {HVDC power cable accelerated aging monitoring system}

The present invention relates to a system for monitoring accelerated deterioration of HVDC power cables, and more particularly, by monitoring and calculating operation information and cable deterioration information by means of an accelerated deterioration device for HVDC power cables, which are plastic power cables such as XLPE power cables, to provide meaningful results. It is about the technology of outputting information.

HVDC (high-voltage direct current) is one of the power grid systems. In contrast to the existing grid using alternating current, a direct current large-capacity long-distance transmission system has been studied recently, and the application of XLPE cables or Thermoplastic insulation cables is being considered. there is.

In order to use such a plastic insulated cable for direct current rather than alternating current, it is necessary to verify the effect of space charge characteristics due to crosslinking by-products and conductivity change due to deterioration on electric field distribution and cable life.

especially. XLPE is a very good material and has been verified for a long time in alternating current and is widely used in direct current, but recyclable and eco-friendly thermoplastic cables have recently begun to be applied and require more verification than XLPE.

Therefore, in order to verify such a cable, a test apparatus capable of accelerating deterioration of the cable in an electrical stress, mechanical stress, and thermal stress environment, shortening a characteristic test period and performing reliable verification is required.

In order to meet the above needs, the present applicant applied for Korean Patent Publication No. 10-2022-0062747 'Accelerated deterioration device for HVDC power cable' to reduce electrical stress, mechanical stress and thermal stress on plastic power cables such as XLPE power cables. There is a bar that provides an accelerated deterioration device for an HVDC power cable that can quickly check the deterioration of a plastic power cable by simultaneously applying the same.

Hereinafter, for the explanation of the present invention, the prior application invention 'accelerated deterioration device for HVDC power cable' will be first examined.

1 is a block diagram of the accelerated deterioration device of the prior application invention 'accelerated deterioration device for HVDC power cable', FIG. 2 is a cross-sectional view and an external view of the test cable shown in FIG. 1, and FIG. 3 is a diagram shown in FIG. It is a configuration diagram of a cable fixing module, and FIG. 4 is a configuration diagram of a temperature sensing module shown in FIG. 1 .

The prior application invention 'HVDC power cable acceleration deterioration device 100' is a device for producing a test sample to examine the deterioration process of the power cable, and as shown in FIG. 1, the test cable 10, the cable fixing module (20), a DC high voltage applying module 40 for applying a high voltage DC to the test cable 10 mounted on the cable fixing module 20, a temperature sensing module 60, and a control module for controlling the entire device ( 90).

As shown in FIG. 2A, the internal structure of the test cable 10 includes a copper wire 11 with a circular cross section made of copper located in the center, and an inner semiconducting layer 12 surrounding the copper wire 11 and the inner It includes an insulator 13 surrounding the semiconducting layer 12 and an outer semiconducting layer 14 surrounding the insulator 13 .

Although the embodiment of FIG. 2 describes an XLPE insulated power cable, it will be apparent that the present invention can also be applied to other plastic insulated power cables including XLPE insulated power cables.

The test cable 10 may further include a metal sheath surrounding the outer semiconductive layer 14 and an anticorrosive layer made of synthetic resin surrounding the metal sheath.

On the other hand, the test cable 10 has a unit test length as shown in FIG. 2B, and the outer semiconductive layer 14, the insulator 13 and the inner semiconductive layer 12 are separated from both ends at a certain distance for the test. It is formed by removing only the copper wire 11 to form a spiral copper wire portion 11a.

In addition, an insulator portion 13a exposing the insulator 13 by removing the external semiconductive layer 14 at a certain distance from the end of the copper wire portion 11a is included.

And the rest includes a cable deterioration part 14a maintaining the shape of the general test cable 10 .

The copper wire part 11a and the insulator part 13a are configured symmetrically on the left and right sides around the cable deterioration part 14a, and the insulator parts 13a on both sides prevent charges from gathering in the insulator 13. After electrically connecting them to each other, they are grounded, and the cable deterioration part 14a is also grounded.

On the other hand, as shown in FIG. 3, the cable fixing module 20 includes a transformer part 21 for applying thermal stress to the test cable 10 and an insulation disposed on a secondary side of the transformer part 21. It is configured to include a cylinder (22).

The transformer 21 includes an iron core 23 and a primary coil 24 wound on a primary side of the iron core 23, the insulation cylinder 22 is disposed on the secondary side, and the insulation cylinder ( 22), the cable deterioration part 14a of the test cable 10 is wound several times to serve as a secondary coil of the transformer part 21.

The insulating cylinder 22 is made of an insulating material such as synthetic resin or FRP, has a diameter 10 to 20 times the diameter of the test cable 10, and has a reaction force against the force winding the cable deterioration part 14a. is transferred to the test cable 10 so that mechanical stress is applied.

If necessary, the insulating cylinders 22 may have different diameters to apply different mechanical stresses to each other.

Meanwhile, as shown in FIG. 1 , power is applied to the primary coil 24 through the heat power supply unit 30 in order to apply heat to the cable deterioration unit 14a, which is the secondary coil.

When power is applied to the primary coil 24 through the thermal power supply unit 30, an induced current is generated in the secondary coil, which is the cable deterioration unit 14a, and self-Joule heat is generated by the induced current. Thermal stress is applied to the test cable 10.

On the other hand, as shown in FIG. 1, the direct current high voltage application module 40 is a component that performs a function of applying a high voltage direct current to the copper wire portion 11a of the test cable 10, to the test cable 10 Apply electrical stress.

Meanwhile, since a high voltage is applied to the test cable 10, it is impossible to attach a sensor for temperature measurement, making it difficult to directly measure the application of thermal stress.

In order to solve this problem, a temperature sensing module 60 is added as shown in FIG. 1 to measure the amount of thermal stress applied through the thermal power supply unit 30 and to control the amount of applied thermal stress.

As shown in FIG. 4, the temperature sensing module 60 is configured in the same shape as the transformer 21 of the cable fixing module 20, and the primary side coil 64 is provided on the primary side of the electric core 63. is wound, an insulating cylinder 62 is disposed on the secondary side, and a secondary coil 65 is wound on the insulating cylinder 62.

The secondary side coil 65 is the same winding of the cable deterioration part 14a of the test cable having the same shape as the test cable 10 of the cable fixing module 20 .

That is, the primary coil 64 of the temperature sensing module 60 is the same as the primary coil 24 of the cable fixing module 20, and the secondary coil 65 is wound around the insulating cylinder 22. It has the same size and characteristics as the tested cable 10, is configured to be wound the same number of times, and the insulated cylinder 62 is also configured the same.

In the prior art, a temperature sensor 66 for sensing the temperature of the secondary coil 65 is installed on or near the surface of the secondary coil 65.

Since the temperature sensing module 60 has the same voltage conversion characteristics as the cable fixing module 20, the temperature sensing module 60 checks the current that reaches the set temperature and mounts the same current to the cable fixing module 20. It is used to control the temperature by flowing in the tested cable (10).

Since power is also supplied to the primary coil 65 by the power supply unit 30 for heat, if necessary, the power supply unit 30 for heat transfers power to the primary coil 65 based on the temperature of the temperature sensor 66. The supplied power can be controlled.

According to this configuration, the amount of thermal stress applied to the cable fixing module 20 can be controlled using the temperature value relative to the input obtained from the temperature sensing module 60 .

Meanwhile, as shown in FIG. 1 , the control module 90 may control the power supply 30 for heat, and also, by using the information of the temperature sensor 66, the secondary coil 65 An input amount can be calculated, and additionally, power supplied to the thermal power supply unit 30 can be controlled using information of the temperature sensor 66 .

The apparatus 100 for accelerated deterioration of the previously filed HVDC power cable configured as described above proceeds with the deterioration process of the test cable 10, stops the deterioration test when a predetermined test time is reached, and separates the test cable 10. let it

As shown in FIG. 5, in the separated test cable 10, the cable deterioration portion 14a is cut to produce a test sample for observing the accelerated deterioration state according to the test purpose by methods such as insulator peeling or slicing.

The test sample is stored as a separate test device according to each test purpose, and electrical, mechanical, and chemical properties are measured to inspect the deterioration state of the power cable.

That is, the accelerated deterioration device 100 of the HVDC power cable of FIG. 1 of the prior application substantially accelerates the deterioration of the test cable 10 and then becomes a device that produces the test sample.

However, according to the prior art method as described above, since a test sample is produced at every predetermined test time regardless of the degree of deterioration of the test cable 10, time and cost are reduced due to the production of meaningless test samples for a certain number of times. There is a problem that causes enemy losses.

On the other hand, as described above, since the test sample must be produced at each 'predetermined test time', in order to continuously examine the accumulated deterioration state, a plurality of devices 20 are formed as one set as shown in FIG. 6, and each A test sample must be produced by separating the test cables 10 one by one every test time.

By the way, in the case of such a prior art method, as shown in FIG. 6, a thermal power supply unit 30 is installed for each accelerating deterioration device of a plurality of HVDC power cables in a set of thrgksms.

That is, in the case of the prior art, as many heat power supply units 30 as required for the number of test samples are required, the equipment in the test site is complicated, the space required for the test is increased, and the equipment cost is increased. there is.

In addition, when a test sample is produced by dividing a plurality of devices into one set and separating each device at every test time, the power supply for heat that was coupled to the test cable 10 that was removed while the accelerated deterioration was in progress. Since there is a problem that (30) is wasted as disused equipment, in the prior art method, in order to solve this problem, if one device is separated and removed, an HVDC power cable acceleration deterioration device for a new test is assembled, added to the corresponding group, and accelerated deterioration is in progress.

Accordingly, in the prior art method, in order to assemble a new cable fixing module 20 to be added every test time, efforts such as spiraling the copper wire portion 11a of the test cable and peeling the outer semiconductive layer 14, and the like, There are problems that require preparation.

[0001] Republic of Korea Patent Publication 10-2022-0062747 Accelerated deterioration device for HVDC power cable

The present invention further improves the accelerated deterioration device for HVDC power cables disclosed in Patent Publication No. 10-2022-0062747, and guides the collection of test samples for meaningful analysis while observing the degradation progress of the cable during accelerated deterioration of the test cable, An object of the present invention is to provide an accelerated deterioration monitoring system for an HVDC power cable that reduces time and cost loss due to the production of meaningless test samples for a certain period of time.

In addition, an object of the present invention is to provide an accelerated deterioration monitoring system for HVDC power cables that solves the problems of space required for testing and equipment cost by simplifying equipment in a test site.

In addition, HVDC power cable solves the problem of wasting effort and preparation time, such as twisting the test cable and peeling the outer semiconductive layer to insert a new cable fixing module into the empty space generated by taking the test sample at every test time. It is an object of the present invention to provide an accelerated deterioration monitoring system.

In order to achieve the above object, the present invention has a cross-sectional structure of a copper wire formed at a certain length and formed in the center, an inner conductive layer surrounding the copper wire, an insulator surrounding the inner conductive layer, and an outer semiconductive layer surrounding the insulator. , Cable deterioration part having an overall cross-sectional structure; an insulator portion formed by exposing an insulator by removing the external semiconductive layer from both ends of the cable deterioration portion; and a test cable having a copper wire portion formed at both ends of the insulator portion to expose only the copper wire. a cable fixing module formed by winding a cable deterioration part of the test cable on an insulating cylinder formed on a secondary side of an iron core and winding a primary side coil on the primary side of the iron core; a direct current high voltage application module connected to the copper wire portion of the test cable to apply electrical stress; a thermal power supply unit supplying current to the primary side coil to generate an induced current for applying thermal stress to the test cable; A first ground line connected to the insulator of the test cable and grounded; a second ground line connected to the outer semiconductive layer of the test cable and grounded; an ammeter for measuring conduction current formed on the second ground line and measuring a current passing through an external semiconductive layer in the copper wire part; A control module that controls the entire device; an acceleration deterioration monitoring module for calculating and outputting a conduction current by collecting, processing, and calculating information of the ammeter for measuring the conduction current and the direct current high voltage application module; And it is installed independently in the cable fixing module, and winds the cable deterioration part of the test cable on an insulating cylinder formed on the secondary side of the iron core, winding the primary side coil on the primary side of the iron core, and measuring the temperature state of the cable deterioration part. and a temperature sensing module including a temperature sensor for transmitting to the control module; acceleration of HVDC power cable, characterized in that it can monitor conduction current information of the test cable during accelerated deterioration of the test cable. The deterioration monitoring system is the technical point.

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In addition, the test cable is formed to a length that can be cut n (n is a natural number) times as a unit test length to accelerate the deterioration of the test cable, and is cut by the unit test length when each deterioration determination point is reached, thereby reducing the deterioration of the power cable. It is preferable to become an accelerated deterioration monitoring system for an HVDC power cable, characterized in that while producing samples for condition observation, the remaining test cables continue to progress with accelerated deterioration.

In addition, the cable fixing module is a unit cable fixing module m in which a test cable is wound around an insulated cylinder formed on one side of an iron core and a primary coil for a heat source is wound on the other side of the iron core, and the test cable has a unit test length. (m is a natural number of 2 or more), and the test cables of each unit cable fixing module are formed by serial connection in a closed loop type, and the primary side coils of the entire unit cable fixing module are connected in series with one line, It is formed to supply power to the primary coil of the entire unit cable fixing module by the thermal power supply unit to accelerate the deterioration of the test cable, and to separate the unit cable fixing modules one by one when each deterioration determination point is reached, It is preferable to become an accelerated deterioration monitoring system for an HVDC power cable, characterized in that the remaining unit cable fixing module continues to progress the accelerated deterioration while producing a sample for observing the deterioration state.

In addition, the accelerated deterioration monitoring system of the HVDC power cable is wound only on an insulating cylinder without an iron core and a primary coil, and has a simple unit cable fixing module formed with a test winding connected in series with a test cable of another unit cable fixing module in a closed loop; It is preferable to be an accelerated deterioration monitoring system for an HVDC power cable, characterized in that it is configured to receive an induced current generated from a test cable of another unit cable fixing module and apply thermal stress to the test cable.

According to the present invention described above, during the accelerated deterioration of the test cable, while observing the progress of cable deterioration, it is guided to collect meaningful test samples for analysis, thereby reducing time and cost losses due to the production of meaningless test samples for a certain period of time. There is an advantage in that an accelerated deterioration monitoring system for HVDC power cables that saves money is provided.

In addition, there is an advantage of providing an accelerated deterioration monitoring system for HVDC power cables that solves the problems of space required for testing and equipment cost by simplifying the equipment in the test site.

In addition, HVDC power cable solves the problem of wasting effort and preparation time, such as twisting the test cable and peeling the outer semiconductive layer to insert a new cable fixing module into the empty space generated by taking the test sample at every test time. There is an advantage in that an accelerated deterioration monitoring system is provided.

1 is a block diagram of the accelerated deterioration device of the prior application invention 'accelerated deterioration device for HVDC power cable'
Figure 2 is a cross-sectional view and external view of the test cable shown in Figure 1
Figure 3 is a configuration diagram of the cable fixing module shown in Figure 1
Figure 4 is a configuration diagram of the temperature sensing module shown in Figure 1
Figure 5 is an explanatory view of the production and use of the test sample in the test cable
6 is a state diagram of use in the prior art method
7 is a basic configuration diagram of the present invention
8 is a configuration diagram of a temperature sensing module of the present invention
9 is a configuration diagram of an embodiment extended from FIG. 7
10 and 11 are explanatory diagrams of the implementation according to FIG. 7
12 is a configuration diagram of another embodiment extended from FIG. 7

Hereinafter, the present invention will be reviewed with reference to the drawings, and in the description of the present invention, if it is determined that a detailed description of a related known technology or configuration may unnecessarily obscure the subject matter of the present invention, the detailed description will be omitted. will be.

In addition, the terms to be described below are terms defined in consideration of functions in the present invention, which may vary according to the intention or custom of the user or operator, so the definitions should be made based on the content throughout this specification describing the present invention.

1 is a block diagram of the accelerated deterioration device of the prior application invention 'accelerated deterioration device for HVDC power cable', FIG. 2 is a cross-sectional view and external view of the test cable shown in FIG. 1, and FIG. 3 is the cable shown in FIG. Figure 4 is a configuration diagram of a fixed module, Figure 4 is a configuration diagram of the temperature sensing module shown in Figure 1, Figure 5 is an explanatory view of the production and use of the test sample in the test cable, Figure 6 is used in the prior art method 7 is a basic configuration diagram of the present invention, FIG. 8 is a configuration diagram of a temperature sensing module of the present invention, FIG. 9 is a configuration diagram of an embodiment extended from FIG. 7, and FIGS. 10 and 11 are diagrams 7, and FIG. 12 is a configuration diagram of another embodiment extended from FIG.

As shown in the drawings, the present invention relates to a system for monitoring accelerated deterioration of HVDC power cables. As described above, the technical problems of Korean Patent Publication No. 10-2022-0062747 'Accelerated deterioration device for HVDC power cables' are improved and progressed. it was done

Therefore, in the following description, as described in 'Technology Behind the Invention', the description of Korean Patent Publication No. 10-2022-0062747 'Accelerated Deterioration Device for HVDC Power Cable' is replaced and described with the same drawing It enables technical contents to be unifiedly explained.

As shown in the drawing, the present invention includes an iron core 23, an insulating cylinder 22, a test cable 10, and a cable fixing module 20 formed of a primary coil 24 and a heat power supply unit 30; It is configured to include a first ground line 130, a second ground line 140, an ammeter 200 for measuring conduction current, a control module 90, and an acceleration deterioration monitoring module 900.

The cable fixing module 20 winds the test cable 10 around the insulating cylinder 22 formed on the secondary side of the iron core 23, and attaches the primary coil 24 for the heat source to the primary side of the iron core 23. formed by winding

The cable fixing module is the same device as the cable fixing module 20 described in Korean Patent Publication No. 10-2022-0062747 'Accelerated Deterioration Device for HVDC Power Cable', and a detailed description thereof is described in 'Technology Background of the Invention'. As described above, it is replaced with the description of Korean Patent Publication No. 10-2022-0062747 'Accelerated deterioration device for HVDC power cable', and will be described with the same drawing number.

Therefore, as shown in FIG. 3, the cable fixing module 20 includes a transformer part 21 for applying thermal stress to the test cable 10 and an insulation disposed on the secondary side of the transformer part 21. It is configured to include a cylinder (22).

The transformer 21 includes an iron core 23 and a primary coil 24 wound on a primary side of the iron core 23, the insulation cylinder 22 is disposed on the secondary side, and the insulation cylinder ( 22), the cable deterioration part 14a of the test cable 10 is wound several times to serve as a secondary coil of the transformer part 21.

The test cable 10 is also the same as the test cable 10 described in Korean Patent Publication 10-2022-0062747 'Accelerated Deterioration Device for HVDC Power Cable', and detailed description thereof is described in 'Technology Background of the Invention'. As described above, it is replaced with the description of Korean Patent Publication No. 10-2022-0062747 'Accelerated deterioration device for HVDC power cable', and will be described with the same drawing number.

According to this, the internal structure of the test cable 10, as shown in FIG. 2A, has a copper wire 11 of circular cross section located in the center, and an inner semi-conductive layer 12 surrounding the copper wire 11. and an insulator 13 surrounding the inner semiconducting layer 12 and an outer semiconducting layer 14 surrounding the insulator 13 .

It will be apparent that the test cable 10 can be applied to all plastic insulated power cables including XLPE insulated power cables.

The test cable 10 may further include a metal sheath surrounding the outer semiconductive layer 14 and an anticorrosive layer made of synthetic resin surrounding the metal sheath.

In addition, the direct current high voltage application module 40 and the thermal power supply unit 30 for supplying power to the primary side coil 24 are also described in detail in the 'Technology Background of the Invention', as described in the Republic of Korea Patent Publication. 10-2022-0062747 It will be replaced with the description of 'Accelerated deterioration device of HVDC power cable' and will be described with the same drawing number.

According to this, as shown in FIG. 7 , power is applied to the primary coil 24 through the thermal power supply unit 30 to apply heat to the cable deterioration unit 14a, which is the secondary coil.

When power is applied to the primary side coil 24 through the heat power supply unit 30, an induced current is generated in the cable deterioration portion 14a wound with a coil on the secondary side, so that heat is generated by Joule heat due to conductor resistance. generated so that thermal stress is applied to the test cable 10.

On the other hand, as shown in FIG. 7, the DC high voltage applying module 40 is a component that performs a function of applying a high voltage DC to the copper wire portion 11a of the test cable 10, Apply electrical stress.

As shown in FIG. 7, the first ground line 130 of the present invention is a line connected to the insulator portion 13a of the test cable 10 and grounded, and the second ground line 140 is the test cable ( 10) is a line connected to the external semiconducting layer 14 and grounded.

The present invention is configured to further include an ammeter 200 for measuring conduction current formed on the second ground line 140 and measuring the conduction current of the test cable, whereby the test cable 10 is accelerated and deteriorated. It is characterized in that current information flowing through the second ground line 140 can be monitored.

The accelerated deterioration monitoring module 900 of the present invention collects, processes, and calculates the measurement information of the ammeter 200 for measuring the conduction current and the output information of the DC high voltage application module 40 to determine the deterioration information of the test cable. It is a circuit part that calculates and outputs the conduction current.

That is, since the information obtained from the ammeter 200 for measuring the conduction current becomes the conduction current flowing from the inner copper wire to the insulator 13 or the outer semiconductive layer 14, the accelerated deterioration monitoring module 900 Changes in direct current high voltage and conduction current can be observed, which is to observe the deterioration state of the test cable 10 over time, so it can be used as information indicating the point in time when a test sample should be produced with the test cable 10 be able to

Therefore, the amount of conduction current or deterioration state information required to produce the test sample is stored in the accelerated deterioration monitoring module 900 in advance, and when the deterioration state of the test cable 10 reaches this value, the information is output at the time of production of the test sample. It is desirable to do

As such, the present invention, unlike Korean Patent Publication 10-2022-0062747 'Accelerated Deterioration Device for HVDC Power Cable', conduction current information can be directly monitored while electrical, physical, and thermal stresses are applied to the test cable. It has a characteristic.

That is, the present invention has the advantage of being a device for observing the degree of deterioration of the test cable 10 and guiding the production point of each test sample in conjunction therewith.

Looking at this in more detail, in the case of the 'accelerated deterioration device 100 of HVDC power cable' of FIG. Nevertheless, there was a problem in that the test cable 10 had to be separated to produce a test sample for observing the accelerated deterioration state.

Accordingly, at the actual initial test time, there was a problem in that a test sample in which deterioration did not progress sufficiently was produced, resulting in a waste of cost and effort due to meaningless testing. Since the test sample can be manufactured while doing so, there is an advantage in solving these problems.

In the test cable 10 of the present invention, it may be considered that a metal coating for a ground electrode is formed outside the outer semiconductive layer 14 for connection of the second ground line 140 .

Of course, the metal sheath surrounding the outer semiconductive layer 14 of the test cable 10 can be used as the metal sheath.

Meanwhile, in the case of the previously filed HVDC power cable accelerated deterioration device 100, the temperature sensing module 60 as a reference test module for estimating the temperature of the test cable 10 and obtaining input information of the primary side coil 65. ) is added.

In the present invention, as shown in FIG. 8 , a temperature sensing module 60 including a temperature sensor 660 is installed side by side and performs the same function.

The structure of the temperature sensing module 60 is also mostly the same as the temperature sensing module 60 described in Korean Patent Publication No. 10-2022-0062747 'Accelerated deterioration device for HVDC power cable'. As described in 'Technology', it will be replaced with the description of 'Accelerated Deterioration Device for HVDC Power Cable' of Korean Patent Publication 10-2022-0062747, and will be described with the same reference number.

According to this, as shown in FIG. 8, the temperature sensing module 60 winds the cable deterioration part 14a of the test cable 10 around the insulating cylinder 62 formed on the secondary side of the iron core 63, and The primary side coil 64 is wound on the primary side of the iron core 23.

However, unlike the prior art, the temperature sensor 660 of the present invention perforates the insulation from the cable deterioration portion 14a to the copper wire 11 in order to measure the temperature of the conductor in the cable deterioration portion 14a. There is a difference in measuring the temperature of the copper wire 11 by contacting the copper wire 11.

The temperature information measured by the temperature sensor 660 is transmitted to the control module 90 .

The control module 90 of the present invention is a device that controls the entire device, controls the output of the DC high voltage application module 40, receives temperature information from the temperature sensor 66, and outputs the power supply unit 30 for heat. will control

However, in the case of the present invention, since the conduction current is monitored through the ammeter 200 for measuring the conduction current as described above, the temperature information measured at the same time has a very significant feature, so that the accelerated deterioration monitoring module 900 It is desirable to have it delivered to .

That is, in the present invention, the temperature information collected by the control module 90 is not only utilized as the primary coil input information, but also as electrical and physical information in which DC high voltage input information, conduction current amount, time, and temperature data are correlated together. Since it can be utilized, it is preferable to transmit it to the accelerated deterioration monitoring module 900.

In addition, although the control module 90 and the accelerated deterioration monitoring module 900 are distinguished for the purpose of explanation of the present invention, it is needless to say that they can be formed as one device in practice.

Meanwhile, in the present invention, as shown in FIGS. 9 to 11 , the test cable 10 can be formed as a test cable having a length that can be cut n (n is a natural number) times as a unit test length.

10 and 11, 10(n) is a test cable with a length that can be cut n (n is a natural number) times as a unit test length, 10(x) is a test cable with a unit test length, and 10(n−x) is 10 ( It is a test cable with a length obtained by cutting 10(x) from n).

According to the present invention configured as described above, as shown in FIG. 9, while accelerating the deterioration of the test cable 10, as shown in FIG. 11 at each deterioration determination point, as shown in FIG. While producing a test sample for observing the deterioration state of the cable, the copper wire portion 11a and the insulator portion 13a are formed at the cut portion of the remaining test cable (n-x), and the accelerated deterioration continues to accumulate the deterioration history. do.

In the case of the accelerated deterioration device 100 of the previously filed HVDC power cable of FIG. 1, as shown in FIG. , The number of accelerated deterioration devices of each HVDC power cable, that is, the number of independent thermal power supply units 30 is additionally required, which complicates the equipment in the test site, increases the required space for the test, and increases the cost of the equipment There was a growing problem with this.

However, as in the present invention, when the test cable 10 is formed into a test cable 10 having a length that can be cut n (n is a natural number) times as a unit test length as shown in FIG. 10, test samples can be produced n times. However, as shown in FIG. 9, there is an advantage in that only one thermal power supply unit 30 is used.

In addition, by this advantage, there is an advantage in that the equipment in the test site is simplified, the space required for the test is saved, and the cost of the equipment is remarkably lowered.

This advantage is also a new cable fixing module (20 ) does not need to be assembled and added, bringing about the advantage of being able to significantly reduce test time and effort.

In the present invention, as shown in FIG. 12, the test cable 10 is formed of m unit cable fixing modules having a unit test length (m is a natural number of 2 or more), and each unit cable fixing module 20 is used for testing. The cables may also be formed by connecting them in series in a closed loop.

At this time, as shown in FIG. 12, in the present invention, the primary coils of all unit cable fixing modules are connected in series with one line, and power is supplied to the primary coils of all unit cable fixing modules by one heat power supply unit. There are characteristics that make it possible to form.

Similarly, in this case, m+1 test samples can be produced, but only one DC high voltage application module 40 and the thermal power supply unit 30 are used, so the equipment in the test site is simplified and the space required for the test is saved. It has the advantage of significantly lowering equipment costs.

In addition, according to this, even if each test sample is produced, since the power supply unit 20 for heat remaining as disused equipment is not generated, there is no need to assemble and add a new cable fixing module 20, which can greatly reduce test time and effort. there will be

On the other hand, as shown in FIG. 12, the present invention is a simple unit cable fixing module (20 -1) is included.

Since the test cable 10-1 of the compact unit cable fixing module 20-1 is serially connected to the test cable 10 of the other unit cable fixing module, the test cable 10 of the other unit cable fixing module generates The induced current is transmitted as it is, so that thermal stress can be applied to the test cable 10-1 of the compact unit cable fixing module 20-1.

Therefore, the compact unit cable fixing module 20-1 has the advantage of simplifying the device.

According to the present invention described above, while solving the technical problems found during the development of the accelerated deterioration device 100 of the previously filed HVDC power cable, the test sample production environment is newly evolved by the solution principle, and the power cable deterioration is more accurate. A synergistic effect that enables the acquisition of physical information about the present invention is generated, and a device that significantly reduces time, space, effort, and cost is provided.

The drawings shown for the purpose of explanation of the present invention above are one embodiment in which the present invention is embodied, and as shown in the drawings, it can be seen that various types of combinations are possible in order to realize the gist of the present invention.

Therefore, the present invention is not limited to the above-described embodiments, and as claimed in the following claims, anyone with ordinary knowledge in the field to which the present invention belongs can make various changes without departing from the gist of the present invention. It will be said that there is a technical spirit of the present invention to the extent possible.

1: test sample 10: cable
10(n): Test cable with a length that can be cut n (n is a natural number) times as a unit test length
10(x): test cable of unit test length
10(nx): Test cable with a length obtained by cutting 10(x) from 10(n)
11: copper wire
12: inner semiconducting layer 13: insulator
14: external semiconducting layer 11a: copper wire
13a: insulator part 14a: cable deterioration part
20: cable fixing module
20-1: Compact unit cable fixing module
21: transformer unit
22: insulating cylinder 23: electric iron core
24: primary side coil 30: power supply for heat
40: DC high voltage application module 41: generator
42: switch unit 43: connection unit
60: temperature sensing module 62: insulating cylinder
63: electric iron core 64: primary side coil
65: secondary side coil 66: temperature sensor
90: control module 100: accelerated deterioration device for HVDC power cable
130: first ground line 140: second ground line
200: ammeter for measuring conduction current
900: accelerated deterioration monitoring module

Claims (6)

A cable deterioration unit formed of a certain length and having a cross-sectional structure of a copper wire formed in the center, an inner conductive layer surrounding the copper wire, an insulator surrounding the inner conductive layer, and an outer semiconductive layer surrounding the insulator, and having an overall cross-sectional structure; an insulator portion formed by exposing an insulator by removing the external semiconductive layer from both ends of the cable deterioration portion; and a test cable having a copper wire portion formed at both ends of the insulator portion to expose only the copper wire.
a cable fixing module formed by winding a cable deterioration part of the test cable on an insulating cylinder formed on a secondary side of an iron core and winding a primary side coil on the primary side of the iron core;
a direct current high voltage application module connected to the copper wire portion of the test cable to apply electrical stress;
a thermal power supply unit supplying current to the primary side coil to generate an induced current for applying thermal stress to the test cable;
A first ground line connected to the insulator of the test cable and grounded;
a second ground line connected to the outer semiconductive layer of the test cable and grounded;
an ammeter for measuring conduction current formed on the second ground line and measuring a current passing through an external semiconductive layer in the copper wire part;
A control module that controls the entire device;
an acceleration deterioration monitoring module for calculating and outputting a conduction current by collecting, processing, and calculating information of the ammeter for measuring the conduction current and the direct current high voltage application module; and
It is installed independently in the cable fixing module, and the cable deterioration part of the test cable is wound around the insulation cylinder formed on the secondary side of the iron core, the primary side coil is wound on the primary side of the iron core, and the temperature state of the cable deterioration part is measured. A temperature sensing module including a temperature sensor transmitted to the control module;
consists of
The accelerated deterioration monitoring system of the HVDC power cable, characterized in that the conduction current information of the test cable can be monitored during the accelerated deterioration of the test cable.
delete delete According to claim 1
The test cable is formed with a length that can be cut n (n is a natural number) times as a unit test length.
While accelerating the deterioration of the test cable, cutting it by the unit test length at each deterioration judgment point, producing a sample for observing the deterioration state of the power cable, while the remaining test cable continues to accelerate deterioration. Accelerated deterioration monitoring system for cables.
According to claim 1
The cable fixing module
A test cable is wound on an insulated cylinder formed on one side of the iron core, and a primary coil for a heat source is wound on the other side of the iron core, and the test cable has a unit test length unit cable fixing module m (m is a natural number of 2 or more) formed by dogs,
The test cable of each unit cable fixing module is formed by serial connection in a closed loop type,
The primary coils of the entire unit cable fixing module are connected in series with one line, and are formed to supply power to the primary coils of the entire unit cable fixing module by one power supply for heat.
Accelerating the deterioration of the test cable, separating the unit cable fixing modules one by one when each deterioration determination point is reached, producing samples for observing the deterioration state of the power cable, while continuing the accelerated deterioration of the remaining unit cable fixing modules. An accelerated deterioration monitoring system for HVDC power cables.
The system for monitoring the accelerated deterioration of the HVDC power cable according to claim 5
A simple unit cable fixing module in which a test winding is wound only on an insulated cylinder without an iron core and a primary side coil and is connected in series with a test cable of another unit cable fixing module in a closed loop;
consists of
An accelerated deterioration monitoring system for an HVDC power cable, characterized in that it receives an induced current generated from a test cable of another unit cable fixing module and applies thermal stress to the test cable.

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