KR102261226B9 - 자동 아크시험장치 - Google Patents

자동 아크시험장치

Info

Publication number
KR102261226B9
KR102261226B9 KR1020200179023A KR20200179023A KR102261226B9 KR 102261226 B9 KR102261226 B9 KR 102261226B9 KR 1020200179023 A KR1020200179023 A KR 1020200179023A KR 20200179023 A KR20200179023 A KR 20200179023A KR 102261226 B9 KR102261226 B9 KR 102261226B9
Authority
KR
South Korea
Prior art keywords
test device
automatic arc
arc test
automatic
test
Prior art date
Application number
KR1020200179023A
Other languages
English (en)
Other versions
KR102261226B1 (ko
Inventor
이규찬
Original Assignee
주식회사 스마트파워서플라이
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 스마트파워서플라이 filed Critical 주식회사 스마트파워서플라이
Priority to KR1020200179023A priority Critical patent/KR102261226B1/ko
Application granted granted Critical
Publication of KR102261226B1 publication Critical patent/KR102261226B1/ko
Publication of KR102261226B9 publication Critical patent/KR102261226B9/ko
Priority to PCT/KR2021/019276 priority patent/WO2022131849A1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/14—Circuits therefor, e.g. for generating test voltages, sensing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
KR1020200179023A 2020-12-18 2020-12-18 자동 아크시험장치 KR102261226B1 (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1020200179023A KR102261226B1 (ko) 2020-12-18 2020-12-18 자동 아크시험장치
PCT/KR2021/019276 WO2022131849A1 (ko) 2020-12-18 2021-12-17 자동 아크시험장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020200179023A KR102261226B1 (ko) 2020-12-18 2020-12-18 자동 아크시험장치

Publications (2)

Publication Number Publication Date
KR102261226B1 KR102261226B1 (ko) 2021-06-07
KR102261226B9 true KR102261226B9 (ko) 2021-07-26

Family

ID=76374091

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020200179023A KR102261226B1 (ko) 2020-12-18 2020-12-18 자동 아크시험장치

Country Status (2)

Country Link
KR (1) KR102261226B1 (ko)
WO (1) WO2022131849A1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102261226B1 (ko) * 2020-12-18 2021-06-07 주식회사 스마트파워서플라이 자동 아크시험장치

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0155299B1 (ko) * 1994-11-07 1998-11-16 이종훈 아크고장 발생장치
US7439744B2 (en) * 2006-11-01 2008-10-21 Eaton Corporation Automated arc generator and method to repeatably generate electrical arcs for AFCI testing
KR101152278B1 (ko) * 2010-10-26 2012-06-08 한국 전기안전공사 아크 모의발생장치
JP6116495B2 (ja) * 2014-02-04 2017-04-19 三菱電機株式会社 直流アーク検出装置及び方法
KR20170080873A (ko) * 2015-12-30 2017-07-11 한국 전기안전공사 분전반 전기사고 모의 발생장치
KR102261226B1 (ko) * 2020-12-18 2021-06-07 주식회사 스마트파워서플라이 자동 아크시험장치

Also Published As

Publication number Publication date
KR102261226B1 (ko) 2021-06-07
WO2022131849A1 (ko) 2022-06-23

Similar Documents

Publication Publication Date Title
EP4071486A4 (en) AUTOMATIC ANALYSIS DEVICE
EP4109105A4 (en) AUTOMATIC ANALYSIS DEVICE
EP4130726A4 (en) INSPECTION DEVICE
KR102261226B9 (ko) 자동 아크시험장치
EP4060349A4 (en) AUTOMATIC ANALYZER
EP3951067C0 (de) Schnellwechsler
EP4062823C0 (fr) Dispositif de détermination de brillance
EP4160218A4 (en) AUTOMATIC ANALYSER
EP4134678A4 (en) AUTOMATIC ANALYSIS DEVICE
ZA202101166B (en) Automatic analysis device
EP4119950A4 (en) AUTOMATIC ANALYZER
EP4109107A4 (en) AUTOMATIC ANALYSIS DEVICE
SG11202110914XA (en) Test device
GB202002208D0 (en) Test Apparatus
GB202311450D0 (en) Test device
GB202300079D0 (en) Test device
GB202208268D0 (en) Test device
EP4129174A4 (en) AUTOMATIC INVASIVE DEVICE FOR THE BODY
GB202210848D0 (en) Test device
GB202007121D0 (en) Test device
GB202005103D0 (en) Test device
GB202316473D0 (en) Device testing
EP3984481C0 (de) Testeinrichtung
EP4160216A4 (en) AUTOMATIC ANALYZER
EP4113123A4 (en) AUTOMATIC ANALYZER

Legal Events

Date Code Title Description
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
G170 Re-publication after modification of scope of protection [patent]